WO2002065146A3 - APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system - Google Patents

APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system Download PDF

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Publication number
WO2002065146A3
WO2002065146A3 PCT/US2002/000798 US0200798W WO02065146A3 WO 2002065146 A3 WO2002065146 A3 WO 2002065146A3 US 0200798 W US0200798 W US 0200798W WO 02065146 A3 WO02065146 A3 WO 02065146A3
Authority
WO
WIPO (PCT)
Prior art keywords
circuit
under test
driver
circuit under
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2002/000798
Other languages
French (fr)
Other versions
WO2002065146A2 (en
Inventor
Douglas W Babcock
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Priority to EP02720781A priority Critical patent/EP1352256A2/en
Publication of WO2002065146A2 publication Critical patent/WO2002065146A2/en
Publication of WO2002065146A3 publication Critical patent/WO2002065146A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A circuit testing apparatus includes a controlling processor for controlling stimulus signals to be applied to a circuit under test and for processing and storing response signals generated by the circuit under test in response to the stimulus signals. The stimulus signals are generated by a driver portion of a receiver/driver circuit coupled to a pin on the circuit under test. The driver (134) includes an output stage circuit coupled to the pin on the circuit under test. The output stage circuit includes a linear amplifier circuit which receives a control signal (VIL, VIH) via the controlling processor and generates from the control signal a drive signal to be applied to the circuit under test. The linear amplifier allows the driver to produce a drive signal with a high level of voltage and timing accuracy and, in the case of digital square pulse signals, a high level of pulse symmetry.
PCT/US2002/000798 2001-01-10 2002-01-10 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system Ceased WO2002065146A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP02720781A EP1352256A2 (en) 2001-01-10 2002-01-10 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/757,746 2001-01-10
US09/757,746 US6677775B2 (en) 2001-01-10 2001-01-10 Circuit testing device using a driver to perform electronics testing

Publications (2)

Publication Number Publication Date
WO2002065146A2 WO2002065146A2 (en) 2002-08-22
WO2002065146A3 true WO2002065146A3 (en) 2003-02-27

Family

ID=25049053

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/000798 Ceased WO2002065146A2 (en) 2001-01-10 2002-01-10 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system

Country Status (3)

Country Link
US (1) US6677775B2 (en)
EP (1) EP1352256A2 (en)
WO (1) WO2002065146A2 (en)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6940271B2 (en) * 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit
EP1353189B1 (en) * 2002-04-12 2006-06-14 Broadcom Corporation Systems and methods utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
US7278079B2 (en) 2002-04-12 2007-10-02 Broadcom Corporation Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices
US7502326B2 (en) * 2002-04-12 2009-03-10 Broadcom Corporation Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
US7174490B2 (en) * 2002-04-12 2007-02-06 Broadcom Corporation Test system rider utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
US7363557B2 (en) * 2002-04-12 2008-04-22 Broadcom Corporation System for at-speed automated testing of high serial pin count multiple gigabit per second devices
US6879175B2 (en) * 2003-03-31 2005-04-12 Teradyne, Inc. Hybrid AC/DC-coupled channel for automatic test equipment
US7279953B2 (en) * 2004-09-21 2007-10-09 Analog Devices, Inc. Current switch and method of driving the same
US20060173641A1 (en) * 2004-12-15 2006-08-03 Geoffrey Haigh Current mode waveform generator followed by a voltage mode buffer
US7403030B2 (en) * 2004-12-17 2008-07-22 Teradyne, Inc. Using parametric measurement units as a source of power for a device under test
US7271610B2 (en) * 2004-12-17 2007-09-18 Teradyne, Inc. Using a parametric measurement unit to sense a voltage at a device under test
US7135881B2 (en) * 2004-12-21 2006-11-14 Teradyne, Inc. Method and system for producing signals to test semiconductor devices
US7256600B2 (en) * 2004-12-21 2007-08-14 Teradyne, Inc. Method and system for testing semiconductor devices
US7508228B2 (en) * 2004-12-21 2009-03-24 Teradyne, Inc. Method and system for monitoring test signals for semiconductor devices
US7102375B2 (en) 2004-12-23 2006-09-05 Teradyne, Inc. Pin electronics with high voltage functionality
US7560947B2 (en) * 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
US8896332B2 (en) * 2011-12-09 2014-11-25 Advantest Corporation Test apparatus with voltage margin test
US11300608B2 (en) * 2016-03-18 2022-04-12 Analog Devices, Inc. Segmented pin driver system
US11125817B2 (en) 2019-10-14 2021-09-21 Analog Devices, Inc. Compound pin driver
US11264906B2 (en) 2019-12-13 2022-03-01 Analog Devices, Inc. Compound pin driver controller
WO2021173635A1 (en) 2020-02-24 2021-09-02 Analog Devices, Inc. Output voltage glitch reduction in test systems
DE112021006392T5 (en) 2020-12-09 2023-09-21 Analog Devices International Unlimited Company GLITCH MITIGATION FOR RANGE SWITCHING INATE SYSTEMS

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5146159A (en) * 1991-02-01 1992-09-08 Schlumberger Technologies, Inc. Pin driver for in-circuit test apparatus
US5377202A (en) * 1993-05-03 1994-12-27 Raytheon Company Method and apparatus for limiting pin driver offset voltages
US5842155A (en) * 1993-05-03 1998-11-24 Fairchild Semiconductor Corp. Method and apparatus for adjusting pin driver charging and discharging current
WO1999052203A1 (en) * 1998-04-07 1999-10-14 Credence Systems Corporation Inhibitable, continuously-terminated, differential drive circuit for an integrated circuit tester
WO2000039928A1 (en) * 1998-12-23 2000-07-06 Raytheon Company High speed pin driver integrated circuit architecture for commercial automatic test equipment applications
US6166569A (en) * 1999-04-23 2000-12-26 Analog Devices, Inc. Test interface circuits with waveform synthesizers having reduced spurious signals

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1956692A1 (en) * 1969-11-11 1971-05-19 Schlumberger Overseas Amplifier stage circuit for a logarithmic amplifier
US4223275A (en) * 1978-10-06 1980-09-16 Texas Instruments Incorporated Linear amplifiers
US4876654A (en) * 1988-04-01 1989-10-24 Wavetek Microwave, Inc. True RMS power demodulation system and method for a modulated RF signal
JP2688941B2 (en) * 1988-08-29 1997-12-10 株式会社アドバンテスト Phase correction device
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US6377065B1 (en) * 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5146159A (en) * 1991-02-01 1992-09-08 Schlumberger Technologies, Inc. Pin driver for in-circuit test apparatus
US5377202A (en) * 1993-05-03 1994-12-27 Raytheon Company Method and apparatus for limiting pin driver offset voltages
US5842155A (en) * 1993-05-03 1998-11-24 Fairchild Semiconductor Corp. Method and apparatus for adjusting pin driver charging and discharging current
WO1999052203A1 (en) * 1998-04-07 1999-10-14 Credence Systems Corporation Inhibitable, continuously-terminated, differential drive circuit for an integrated circuit tester
WO2000039928A1 (en) * 1998-12-23 2000-07-06 Raytheon Company High speed pin driver integrated circuit architecture for commercial automatic test equipment applications
US6166569A (en) * 1999-04-23 2000-12-26 Analog Devices, Inc. Test interface circuits with waveform synthesizers having reduced spurious signals

Also Published As

Publication number Publication date
EP1352256A2 (en) 2003-10-15
WO2002065146A2 (en) 2002-08-22
US20020105350A1 (en) 2002-08-08
US6677775B2 (en) 2004-01-13

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