WO2002075335A3 - Test system formatters - Google Patents

Test system formatters Download PDF

Info

Publication number
WO2002075335A3
WO2002075335A3 PCT/US2002/008427 US0208427W WO02075335A3 WO 2002075335 A3 WO2002075335 A3 WO 2002075335A3 US 0208427 W US0208427 W US 0208427W WO 02075335 A3 WO02075335 A3 WO 02075335A3
Authority
WO
WIPO (PCT)
Prior art keywords
drive
signals
response
channels
configurable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2002/008427
Other languages
French (fr)
Other versions
WO2002075335A2 (en
Inventor
Burnell G West
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NPTest Inc
Original Assignee
NPTest Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NPTest Inc filed Critical NPTest Inc
Priority to EP02725245A priority Critical patent/EP1370882A2/en
Priority to AU2002255823A priority patent/AU2002255823A1/en
Publication of WO2002075335A2 publication Critical patent/WO2002075335A2/en
Publication of WO2002075335A3 publication Critical patent/WO2002075335A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A test system formatter (110) may include a programmable drive circuit (140) configurable to operate in any of a plurality of drive modes, each mode corresponding to a different combination of drive signals or drive timing markers or both, and a programmable response circuit (160) configurable to operate in any of a plurality of strobe modes, each strobe mode corresponding to a different combination of strobe signals. The formatter (110) may also include multiple drive channels and/or multiple response channels, each channel being formed, e.g., of an event logic interface (316) and a corresponding linear delay element (318). The drive channels provide signals to the drive circuit to be used to generate drive signals or drive timing markers or both. The response channels receive from one or more pin-electronics (120) comparators response signals used to generate fail outputs. The programmable drive and response circuits are configurable to route signals through multiple channels in parallel.
PCT/US2002/008427 2001-03-19 2002-03-18 Test system formatters Ceased WO2002075335A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP02725245A EP1370882A2 (en) 2001-03-19 2002-03-18 Test system formatters
AU2002255823A AU2002255823A1 (en) 2001-03-19 2002-03-18 Test system formatters

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US27718501P 2001-03-19 2001-03-19
US60/277,185 2001-03-19

Publications (2)

Publication Number Publication Date
WO2002075335A2 WO2002075335A2 (en) 2002-09-26
WO2002075335A3 true WO2002075335A3 (en) 2003-09-18

Family

ID=23059769

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/008427 Ceased WO2002075335A2 (en) 2001-03-19 2002-03-18 Test system formatters

Country Status (5)

Country Link
US (1) US7017091B2 (en)
EP (1) EP1370882A2 (en)
AU (1) AU2002255823A1 (en)
TW (1) TW569019B (en)
WO (1) WO2002075335A2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3005250B2 (en) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド Bus monitor integrated circuit
US7765443B1 (en) 2001-03-19 2010-07-27 Credence Systems Corporation Test systems and methods for integrated circuit devices
WO2004102216A2 (en) * 2003-05-07 2004-11-25 Credence Systems Corporation Test systems and methods
KR100590204B1 (en) * 2003-11-04 2006-06-15 삼성전자주식회사 Integrated circuit device with on-chip setup / hold measurement circuit
CN100526891C (en) * 2005-12-07 2009-08-12 比亚迪股份有限公司 Testing device of multi-drive-mode LCD drive circuit and testing method
US8838406B2 (en) * 2008-11-11 2014-09-16 Advantest (Singapore) Pte Ltd Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
US8918569B2 (en) * 2011-08-10 2014-12-23 Intel Corporation Streaming audio visual content simultaneously to different topologies on a wireless adapter
US8856406B2 (en) * 2011-09-14 2014-10-07 Microchip Technology Incorporated Peripheral trigger generator
US9279857B2 (en) 2013-11-19 2016-03-08 Teradyne, Inc. Automated test system with edge steering
US10996272B2 (en) * 2014-08-27 2021-05-04 Teradyne, Inc. One-shot circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5381421A (en) * 1990-01-12 1995-01-10 International Business Machines Corporation Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing
US5919270A (en) * 1997-08-29 1999-07-06 Credence Systems Corporation Programmable formatter circuit for integrated circuit tester
US6032282A (en) * 1994-09-19 2000-02-29 Advantest Corp. Timing edge forming circuit for IC test system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4594544A (en) 1983-03-07 1986-06-10 Fairchild Camera And Instrument Corporation Participate register for parallel loading pin-oriented registers in test equipment
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5673275A (en) * 1995-09-12 1997-09-30 Schlumberger Technology, Inc. Accelerated mode tester timing
US6128754A (en) * 1997-11-24 2000-10-03 Schlumberger Technologies, Inc. Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program
US6532561B1 (en) * 1999-09-25 2003-03-11 Advantest Corp. Event based semiconductor test system
US6609077B1 (en) * 2000-05-31 2003-08-19 Teradyne, Inc. ATE timing measurement unit and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5381421A (en) * 1990-01-12 1995-01-10 International Business Machines Corporation Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing
US6032282A (en) * 1994-09-19 2000-02-29 Advantest Corp. Timing edge forming circuit for IC test system
US5919270A (en) * 1997-08-29 1999-07-06 Credence Systems Corporation Programmable formatter circuit for integrated circuit tester

Also Published As

Publication number Publication date
EP1370882A2 (en) 2003-12-17
US7017091B2 (en) 2006-03-21
TW569019B (en) 2004-01-01
AU2002255823A1 (en) 2002-10-03
US20030033556A1 (en) 2003-02-13
WO2002075335A2 (en) 2002-09-26

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