WO2003016922A3 - Electronic circuit and method for testing - Google Patents

Electronic circuit and method for testing Download PDF

Info

Publication number
WO2003016922A3
WO2003016922A3 PCT/IB2002/002916 IB0202916W WO03016922A3 WO 2003016922 A3 WO2003016922 A3 WO 2003016922A3 IB 0202916 W IB0202916 W IB 0202916W WO 03016922 A3 WO03016922 A3 WO 03016922A3
Authority
WO
WIPO (PCT)
Prior art keywords
contacts
input
contact
output
redefinable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/IB2002/002916
Other languages
French (fr)
Other versions
WO2003016922A2 (en
Inventor
Alexander S Biewenga
De Logt Leon M A Van
Jong Franciscus G M De
Guillaume E A Lousberg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Priority to KR1020047002151A priority Critical patent/KR100906513B1/en
Priority to DE60223043T priority patent/DE60223043T2/en
Priority to JP2003521376A priority patent/JP3992683B2/en
Priority to EP02749176A priority patent/EP1417502B1/en
Publication of WO2003016922A2 publication Critical patent/WO2003016922A2/en
Publication of WO2003016922A3 publication Critical patent/WO2003016922A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G11C2029/3602—Pattern generator

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Filters And Equalizers (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Electric Clocks (AREA)

Abstract

An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.
PCT/IB2002/002916 2001-08-16 2002-07-09 Electronic circuit and method for testing Ceased WO2003016922A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020047002151A KR100906513B1 (en) 2001-08-16 2002-07-09 Integrated circuits, electronic circuits comprising them and test methods thereof
DE60223043T DE60223043T2 (en) 2001-08-16 2002-07-09 ELECTRONIC CIRCUIT AND TEST METHODS
JP2003521376A JP3992683B2 (en) 2001-08-16 2002-07-09 Electronic circuit and method for performing tests
EP02749176A EP1417502B1 (en) 2001-08-16 2002-07-09 Electronic circuit and method for testing

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01203126.6 2001-08-16
EP01203126 2001-08-16

Publications (2)

Publication Number Publication Date
WO2003016922A2 WO2003016922A2 (en) 2003-02-27
WO2003016922A3 true WO2003016922A3 (en) 2003-05-30

Family

ID=8180805

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2002/002916 Ceased WO2003016922A2 (en) 2001-08-16 2002-07-09 Electronic circuit and method for testing

Country Status (9)

Country Link
US (1) US6883129B2 (en)
EP (1) EP1417502B1 (en)
JP (1) JP3992683B2 (en)
KR (1) KR100906513B1 (en)
CN (1) CN100371727C (en)
AT (1) ATE376189T1 (en)
DE (1) DE60223043T2 (en)
TW (1) TWI223094B (en)
WO (1) WO2003016922A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6971045B1 (en) * 2002-05-20 2005-11-29 Cyress Semiconductor Corp. Reducing tester channels for high pinout integrated circuits
JP3901151B2 (en) * 2003-12-25 2007-04-04 セイコーエプソン株式会社 Driver IC and driver IC and output device inspection method
US7685483B1 (en) * 2005-06-20 2010-03-23 Lattice Semiconductor Corporation Design features for testing integrated circuits
CN100417098C (en) * 2005-08-04 2008-09-03 上海华为技术有限公司 E1/T1 Connection Error Detection Method
DE102010002460A1 (en) * 2010-03-01 2011-09-01 Robert Bosch Gmbh Method for testing an integrated circuit
FR3051285B1 (en) * 2016-05-13 2018-05-18 Zodiac Aerotechnics ELECTRONIC CIRCUIT WITH ADJUSTABLE FUNCTIONS

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0828257A2 (en) * 1996-09-05 1998-03-11 Oki Electric Industry Co., Ltd. Method and device for testing a memory circuit in a semiconductor device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4658225A (en) 1984-07-05 1987-04-14 Hewlett-Packard Company Amplitude insensitive delay lines in a transversal filter
US4703484A (en) * 1985-12-19 1987-10-27 Harris Corporation Programmable integrated circuit fault detection apparatus
EP0628831B1 (en) 1988-09-07 1998-03-18 Texas Instruments Incorporated Bidirectional boundary scan test cell
US5392297A (en) * 1989-04-18 1995-02-21 Vlsi Technology, Inc. Method for automatic isolation of functional blocks within integrated circuits
US5155733A (en) * 1990-12-26 1992-10-13 Ag Communication Systems Corporation Arrangement for testing digital circuit devices having bidirectional outputs
US5481471A (en) * 1992-12-18 1996-01-02 Hughes Aircraft Company Mixed signal integrated circuit architecture and test methodology
TW307927B (en) * 1994-08-29 1997-06-11 Matsushita Electric Industrial Co Ltd
JPH08147110A (en) * 1994-11-18 1996-06-07 Sony Corp Data recording medium management method, data recording medium management device, and data recording medium
US6087968A (en) 1997-04-16 2000-07-11 U.S. Philips Corporation Analog to digital converter comprising an asynchronous sigma delta modulator and decimating digital filter
WO1999039218A2 (en) 1998-02-02 1999-08-05 Koninklijke Philips Electronics N.V. Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit
US6378090B1 (en) 1998-04-24 2002-04-23 Texas Instruments Incorporated Hierarchical test access port architecture for electronic circuits including embedded core having built-in test access port
US6499125B1 (en) * 1998-11-24 2002-12-24 Matsushita Electric Industrial Co., Ltd. Method for inserting test circuit and method for converting test data
DE10005161A1 (en) 1999-04-30 2000-11-02 Fujitsu Ltd Semiconductor circuit with test function activated according to state of specific connection when supply switched on
US6456961B1 (en) * 1999-04-30 2002-09-24 Srinivas Patil Method and apparatus for creating testable circuit designs having embedded cores
JP3483130B2 (en) * 1999-11-29 2004-01-06 松下電器産業株式会社 Inspection method for integrated circuits

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0828257A2 (en) * 1996-09-05 1998-03-11 Oki Electric Industry Co., Ltd. Method and device for testing a memory circuit in a semiconductor device

Also Published As

Publication number Publication date
DE60223043T2 (en) 2008-07-24
EP1417502A2 (en) 2004-05-12
TWI223094B (en) 2004-11-01
JP2005500536A (en) 2005-01-06
EP1417502B1 (en) 2007-10-17
CN100371727C (en) 2008-02-27
CN1541336A (en) 2004-10-27
DE60223043D1 (en) 2007-11-29
ATE376189T1 (en) 2007-11-15
US20030051198A1 (en) 2003-03-13
WO2003016922A2 (en) 2003-02-27
KR100906513B1 (en) 2009-07-07
US6883129B2 (en) 2005-04-19
JP3992683B2 (en) 2007-10-17
KR20040027889A (en) 2004-04-01

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