WO2003075408A1 - Anisotropic conductive connector and its production method, and circuit device test instrument - Google Patents

Anisotropic conductive connector and its production method, and circuit device test instrument Download PDF

Info

Publication number
WO2003075408A1
WO2003075408A1 PCT/JP2003/002205 JP0302205W WO03075408A1 WO 2003075408 A1 WO2003075408 A1 WO 2003075408A1 JP 0302205 W JP0302205 W JP 0302205W WO 03075408 A1 WO03075408 A1 WO 03075408A1
Authority
WO
WIPO (PCT)
Prior art keywords
anisotropic conductive
elastic
conductive connector
production method
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2003/002205
Other languages
English (en)
French (fr)
Inventor
Daisuke Yamada
Kazuaki Mayumi
Kiyoshi Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JSR Corp
Original Assignee
JSR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JSR Corp filed Critical JSR Corp
Priority to US10/504,421 priority Critical patent/US7160123B2/en
Priority to AU2003211368A priority patent/AU2003211368A1/en
Priority to EP03743513.8A priority patent/EP1482593B1/en
Priority to KR1020047011290A priority patent/KR100588029B1/ko
Publication of WO2003075408A1 publication Critical patent/WO2003075408A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/04—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation using electrically conductive adhesives
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/923—Separation or disconnection aid

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Non-Insulated Conductors (AREA)
PCT/JP2003/002205 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument Ceased WO2003075408A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US10/504,421 US7160123B2 (en) 2002-03-07 2003-02-27 Plural layer anisotropic conductive connector and its production method
AU2003211368A AU2003211368A1 (en) 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument
EP03743513.8A EP1482593B1 (en) 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument
KR1020047011290A KR100588029B1 (ko) 2002-03-07 2003-02-27 이방 도전성 커넥터 및 그 제조 방법 및 회로 장치의 검사장치

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2002062666 2002-03-07
JP2002/62666 2002-03-07
JP2002152316 2002-05-27
JP2002/152316 2002-05-27

Publications (1)

Publication Number Publication Date
WO2003075408A1 true WO2003075408A1 (en) 2003-09-12

Family

ID=27791004

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2003/002205 Ceased WO2003075408A1 (en) 2002-03-07 2003-02-27 Anisotropic conductive connector and its production method, and circuit device test instrument

Country Status (7)

Country Link
US (1) US7160123B2 (ja)
EP (1) EP1482593B1 (ja)
KR (1) KR100588029B1 (ja)
CN (1) CN100539304C (ja)
AU (1) AU2003211368A1 (ja)
TW (1) TWI281546B (ja)
WO (1) WO2003075408A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005050782A (ja) * 2003-06-12 2005-02-24 Jsr Corp 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
EP1696241A4 (en) * 2003-12-18 2012-04-04 Jsr Corp ANISOTROPIC CONDUCTIVE CONNECTOR AND SWITCHING DEVICE STUDYING METHOD
CN105891558A (zh) * 2016-06-18 2016-08-24 国网辽宁省电力有限公司盘锦供电公司 绝缘杆批量试验接地极
US11136597B2 (en) 2016-02-16 2021-10-05 Yale University Compositions for enhancing targeted gene editing and methods of use thereof

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EP1482593B1 (en) 2002-03-07 2014-01-08 JSR Corporation Anisotropic conductive connector and its production method, and circuit device test instrument
WO2004066449A1 (ja) * 2003-01-17 2004-08-05 Jsr Corporation 異方導電性コネクターおよびその製造方法並びに回路装置の検査装置
EP1608040A4 (en) * 2003-03-26 2007-11-14 Jsr Corp ANISOTROPER CONDUCTIVE CONNECTOR, CONDUCTIVE PASTE COMPOSITION, SONDER, WAFER INSPECTION DEVICE AND WAFER SEARCH METHOD
US8518304B1 (en) 2003-03-31 2013-08-27 The Research Foundation Of State University Of New York Nano-structure enhancements for anisotropic conductive material and thermal interposers
TWI239684B (en) * 2003-04-16 2005-09-11 Jsr Corp Anisotropic conductive connector and electric inspection device for circuit device
JP2005019393A (ja) * 2003-06-05 2005-01-20 Sharp Corp 異方性導電物、表示装置、表示装置の製造方法および導電部材
US7309244B2 (en) * 2003-06-12 2007-12-18 Jsr Corporation Anisotropic conductive connector device and production method therefor and circuit device inspection device
JP3999759B2 (ja) * 2004-04-02 2007-10-31 富士通株式会社 基板及び電子機器
JP2006194620A (ja) * 2005-01-11 2006-07-27 Tokyo Electron Ltd プローブカード及び検査用接触構造体
JP4179620B2 (ja) * 2005-04-28 2008-11-12 日本航空電子工業株式会社 コネクタ
JP2007005246A (ja) * 2005-06-27 2007-01-11 Sumitomo Electric Ind Ltd 多孔質樹脂基材及び多層基板
JPWO2007043350A1 (ja) * 2005-10-11 2009-04-16 Jsr株式会社 異方導電性コネクター装置および回路装置の検査装置
DE102005059375A1 (de) * 2005-12-09 2007-06-14 Biotronik Crm Patent Ag Vorrichtung und Verfahren zur Herstellung von Elektroden für Batterien
TWI403723B (zh) * 2005-12-21 2013-08-01 Jsr股份有限公司 Manufacturing method of foreign - shaped conductive connector
WO2007116826A1 (ja) 2006-04-11 2007-10-18 Jsr Corporation 異方導電性コネクターおよび異方導電性コネクター装置
KR100882735B1 (ko) * 2007-03-19 2009-02-06 도레이새한 주식회사 이방성 전도필름 및 이의 접착방법
JP5081533B2 (ja) * 2007-08-21 2012-11-28 ポリマテック株式会社 異方導電性コネクタおよび異方導電性コネクタの接続構造
JP4472783B2 (ja) * 2008-09-16 2010-06-02 富士高分子工業株式会社 導電ゴム部品とその使用方法及び携帯電話機
KR101054251B1 (ko) * 2009-05-18 2011-08-08 두성산업 주식회사 기판 표면 실장용 도전성 접촉 단자
JP2011086880A (ja) * 2009-10-19 2011-04-28 Advantest Corp 電子部品実装装置および電子部品の実装方法
EP2567257B1 (en) 2010-05-06 2021-03-24 Immunolight, Llc. Adhesive bonding composition and method of use
JP2012078222A (ja) * 2010-10-01 2012-04-19 Fujifilm Corp 回路基板接続構造体および回路基板の接続方法
CN103094737A (zh) * 2011-11-05 2013-05-08 宝宸（厦门）光学科技有限公司 引脚结构与引脚连接结构
KR101266124B1 (ko) * 2012-04-03 2013-05-27 주식회사 아이에스시 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법
CN103454794B (zh) * 2013-09-06 2016-06-08 深圳市华星光电技术有限公司 点灯测试治具以及液晶面板测试方法
CN104153192A (zh) * 2014-08-06 2014-11-19 江南大学 一种织物磁化学镀铁镍合金的制备方法
JP6506653B2 (ja) * 2015-07-30 2019-04-24 日本メクトロン株式会社 伸縮性配線基板
JP6405334B2 (ja) 2016-04-18 2018-10-17 日本メクトロン株式会社 伸縮性配線基板、及び、伸縮性配線基板の製造方法
JP2018073577A (ja) * 2016-10-27 2018-05-10 株式会社エンプラス 異方導電性シート及びその製造方法
JP6670276B2 (ja) * 2016-11-30 2020-03-18 富士高分子工業株式会社 積層タイプコネクタ及びその製造方法
WO2018106485A1 (en) * 2016-12-07 2018-06-14 Wafer Llc Low loss electrical transmission mechanism and antenna using same
US10283476B2 (en) 2017-03-15 2019-05-07 Immunolight, Llc. Adhesive bonding composition and electronic components prepared from the same
JP7080879B2 (ja) * 2017-05-18 2022-06-06 信越ポリマー株式会社 電気コネクターおよびその製造方法
CN109341909B (zh) * 2018-11-20 2020-11-10 郑州大学 一种多功能柔性应力传感器
KR102193528B1 (ko) * 2019-04-17 2020-12-23 주식회사 아이에스시 극저온에서 적용 가능한 검사용 커넥터
KR102220172B1 (ko) * 2020-03-03 2021-02-25 (주)티에스이 신호 전송 커넥터
CN112666450B (zh) * 2021-01-13 2022-11-01 深圳市兔拉检测科技有限公司 一种智能芯片检测仪及其检测方法
KR102796224B1 (ko) 2024-01-02 2025-04-14 신종천 조립 구조의 러버 소켓

Citations (9)

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Publication number Priority date Publication date Assignee Title
US4571542A (en) 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4729809A (en) 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
JPH06215633A (ja) * 1993-01-14 1994-08-05 Hitachi Chem Co Ltd 接続部材
JPH0730019A (ja) * 1993-07-13 1995-01-31 Seiko Epson Corp Ｉｃソケット
EP0641038A2 (en) 1993-08-27 1995-03-01 Nitto Denko Corporation Methods for connecting flexible circuit substrates to contact objects and structures thereof
JP2001067942A (ja) * 1999-08-31 2001-03-16 Jsr Corp 異方導電性シート
JP3256175B2 (ja) * 1997-12-22 2002-02-12 株式会社ヨコオ Ｉｃパッケージ測定用ソケット
JP2002279830A (ja) * 2001-03-19 2002-09-27 Nitto Denko Corp 異方導電性フィルム
JP7073067B2 (ja) * 2016-10-03 2022-05-23 リンカーン グローバル，インコーポレイテッド パラメータ設定のリアルタイム絵文字表現を備えたユーザインターフェース

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JPS5740874A (en) * 1980-08-22 1982-03-06 Shinetsu Polymer Co Pressure contact holding type connector
JP2643789B2 (ja) 1993-09-01 1997-08-20 日本電気株式会社 スキャンパス回路
JPH1140224A (ja) 1997-07-11 1999-02-12 Jsr Corp 異方導電性シート
JP3865019B2 (ja) * 1998-03-23 2007-01-10 Ｊｓｒ株式会社 異方導電性シートおよびその製造方法
JP4240724B2 (ja) 2000-01-26 2009-03-18 Ｊｓｒ株式会社 異方導電性シートおよびコネクター
EP1482593B1 (en) 2002-03-07 2014-01-08 JSR Corporation Anisotropic conductive connector and its production method, and circuit device test instrument

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4571542A (en) 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4729809A (en) 1985-03-14 1988-03-08 Amp Incorporated Anisotropically conductive adhesive composition
JPH06215633A (ja) * 1993-01-14 1994-08-05 Hitachi Chem Co Ltd 接続部材
JPH0730019A (ja) * 1993-07-13 1995-01-31 Seiko Epson Corp Ｉｃソケット
EP0641038A2 (en) 1993-08-27 1995-03-01 Nitto Denko Corporation Methods for connecting flexible circuit substrates to contact objects and structures thereof
JP3256175B2 (ja) * 1997-12-22 2002-02-12 株式会社ヨコオ Ｉｃパッケージ測定用ソケット
JP2001067942A (ja) * 1999-08-31 2001-03-16 Jsr Corp 異方導電性シート
JP2002279830A (ja) * 2001-03-19 2002-09-27 Nitto Denko Corp 異方導電性フィルム
JP7073067B2 (ja) * 2016-10-03 2022-05-23 リンカーン グローバル，インコーポレイテッド パラメータ設定のリアルタイム絵文字表現を備えたユーザインターフェース

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005050782A (ja) * 2003-06-12 2005-02-24 Jsr Corp 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
EP1696241A4 (en) * 2003-12-18 2012-04-04 Jsr Corp ANISOTROPIC CONDUCTIVE CONNECTOR AND SWITCHING DEVICE STUDYING METHOD
US11136597B2 (en) 2016-02-16 2021-10-05 Yale University Compositions for enhancing targeted gene editing and methods of use thereof
CN105891558A (zh) * 2016-06-18 2016-08-24 国网辽宁省电力有限公司盘锦供电公司 绝缘杆批量试验接地极

Also Published As

Publication number Publication date
CN100539304C (zh) 2009-09-09
EP1482593A1 (en) 2004-12-01
US20050106907A1 (en) 2005-05-19
AU2003211368A1 (en) 2003-09-16
KR20040087316A (ko) 2004-10-13
US7160123B2 (en) 2007-01-09
TW200303989A (en) 2003-09-16
EP1482593B1 (en) 2014-01-08
EP1482593A4 (en) 2010-11-03
CN1639919A (zh) 2005-07-13
TWI281546B (en) 2007-05-21
KR100588029B1 (ko) 2006-06-12

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