WO2004064162A1 - 配線基板、及びそれを用いた放射線検出器 - Google Patents
配線基板、及びそれを用いた放射線検出器 Download PDFInfo
- Publication number
- WO2004064162A1 WO2004064162A1 PCT/JP2004/000077 JP2004000077W WO2004064162A1 WO 2004064162 A1 WO2004064162 A1 WO 2004064162A1 JP 2004000077 W JP2004000077 W JP 2004000077W WO 2004064162 A1 WO2004064162 A1 WO 2004064162A1
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- WO
- WIPO (PCT)
- Prior art keywords
- radiation
- wiring board
- hole
- signal
- conductive
- Prior art date
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- Ceased
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/809—Constructional details of image sensors of hybrid image sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/496—Luminescent members, e.g. fluorescent sheets
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/115—Via connections; Lands around holes or via connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- the present invention relates to a wiring board provided with a conductive path for guiding an electric signal, and a radiation detector using the same.
- a radiation detector used for a CT sensor or the like there is a detector having a configuration in which a scintillator is provided on a light incident surface of a semiconductor photodetector array such as a photodiode array.
- a radiation detector when radiation such as X-rays, ⁇ -rays, and charged particle beams to be detected enters the scintillator, scintillation light is generated by the radiation in the scintillator. Then, radiation is detected by detecting the scintillation light with a semiconductor photodetector.
- a signal processing element is provided for performing signal processing of a detection signal output from each of the photodetection elements on the photodetection element array.
- a configuration for electrically connecting the photodetection element and the signal processing element a configuration using various wirings or a configuration using a conductive path provided on a wiring board may be used. (For example, see Japanese Patent Application Laid-Open No. 8-330469).
- the present invention has been made to solve the above problems, and has as its object to provide a wiring board in which transmission of radiation is suppressed, and a radiation detector using the same. I do.
- a power supply board is a wiring board provided with a conductive path for guiding an electric signal between a signal input surface and a signal output surface.
- a glass substrate formed of a predetermined glass material having a radiation shielding function and provided with a through-hole, and a conductive path provided in the through-hole to electrically conduct between an input surface and an output surface.
- the through-hole in the glass substrate has an opening of the through-hole in a predetermined plane orthogonal to the conductive direction from the signal input surface to the signal output surface.
- the signal input surface is formed so as to be in a region excluding a region on the extension of the opening of the through hole in the conductive direction in the signal input surface.
- a wiring board used for electrical connection between the radiation detection means and the signal processing means in the radiation detector is used as a wiring board made of a predetermined glass material. It is composed. And, regarding the through hole of the conductive path provided on the glass substrate, the opening in the predetermined plane is not on the extension of the opening in the signal input surface, and therefore, when viewed from the conductive direction orthogonal to the signal input surface, the signal input surface The structure is such that the through-hole cannot be seen through to the signal output surface.
- the wiring board for example, there is a configuration in which the center line of the through hole in the glass substrate is inclined at a predetermined angle with respect to the conductive direction. In such a configuration, when the signal output surface is the above-mentioned predetermined plane, at least the opening on that surface can be configured to be an extension of the opening on the signal input surface. [0109] Alternatively, there is a configuration in which the center line of the through hole in the glass substrate is curved in the conductive direction. In such a configuration, when the surface between the signal input surface and the signal output surface is the above-mentioned predetermined plane, at least the opening on that surface is not on the extension of the opening on the signal input surface. can do.
- the glass substrate is preferably formed from a glass material containing lead. This makes it possible to effectively suppress the transmission of radiation through the wiring board. Further, a substrate made of another glass material having a radiation shielding function may be used.
- the conductive member may be formed and provided on the inner wall of the through hole provided in the glass substrate.
- the conductive member may be provided so as to fill the inside of the through hole provided in the glass substrate.
- the glass substrate as the wiring substrate is a glass substrate provided with a plurality of through-holes by integrally forming a plurality of hollow glass members having open ends at the both ends. It is preferable that Further, a substrate having another configuration may be used.
- the radiation detector includes: (1) radiation detection means for detecting incident radiation and outputting a detection signal; and (2) signal processing for processing a detection signal from the radiation detection means.
- the radiation detecting means, the wiring board part, and the signal processing means are arranged along a predetermined arrangement direction substantially coincident with the conductive direction on the wiring board. It is characterized by being arranged in this order.
- the radiation detection means and the signal processing means As the wiring board part for electrically connecting the steps and transmitting the detection signal, which is an electric signal, the wiring board having the above-described configuration in which a through hole cannot be seen from the signal input surface to the signal output surface is used. According to such a configuration, a glass material having a radiation shielding function exists in at least a part from the signal input surface to the signal output surface in any part of the wiring board portion. This makes it possible to realize a radiation detector in which radiation does not enter the signal processing element and deterioration in reliability and life due to radiation damage is suppressed.
- the radiation detection means uses a configuration having a scintillator that generates scintillation light upon incidence of radiation, and a semiconductor light detection element that detects scintillation light from the scintillator. be able to.
- the radiation detection means may use a configuration having a semiconductor detection element for detecting incident radiation.
- At least one of the wiring board and the radiation detecting means and the wiring board and the signal processing means are electrically connected via bump electrodes.
- a metal bump electrode as an electrical connection means, each part can be suitably electrically connected.
- FIG. 1 is a side cross-sectional view showing a cross-sectional structure of an embodiment of a wiring board and a radiation detector using the same.
- FIG. 2 is an exploded perspective view showing the configuration of the radiation detector shown in FIG.
- FIGS. 3A and 3B are plan views showing the configurations of the (A) signal input surface and the (B) signal output surface of the wiring board.
- FIGS. 4A to 4C are diagrams illustrating an example of a glass substrate provided with a plurality of through holes.
- FIGS. 5A and 5B are diagrams illustrating an example of a configuration of a conductive member provided in a through hole of a wiring board.
- FIGS. 6A and 6B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIGS. 7A and 7B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIGS. 8A and 8B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 1 is a side sectional view showing a sectional structure of an embodiment of a wiring board and a radiation detector according to the present invention.
- FIG. 2 is a perspective view showing the configuration of the wiring board and the radiation detector shown in FIG. 1 with each component disassembled.
- the axis along the direction in which radiation enters is the z-axis, and two axes orthogonal to the z-axis are the X-axis. , Y axis.
- the negative direction of the Z axis is the conductive direction from the signal input surface to the signal output surface on the wiring board, and the arrangement direction of each component on the radiation detector.
- the radiation detector shown in FIG. 1 includes a radiation detection unit 1, a wiring board unit 2, and a signal processing unit 3. These are arranged in this order from the upstream side (upper side in the figure) to the downstream side (lower side) along a predetermined arrangement direction, as shown in FIG.
- the radiation detection unit 1 detects radiation such as X-rays, y-rays, and charged particle beams incident on the radiation detector as a detection target, and outputs a detection signal, which is an electric signal corresponding to the radiation. Detection means.
- the radiation detector 1 is configured to include a scintillator 10 and a photodiode array 15.
- the scintillator 10 constitutes an upstream portion of the radiation detecting section 1, and its upper surface 10a is a radiation incident surface in the present radiation detector.
- the scintillator 10 generates scintillation light having a predetermined wavelength when radiation is incident from the incident surface 10a.
- the photodiode array (PD array) 15 constitutes a downstream portion of the radiation detecting section 1.
- the PD array 15 is a photodetector array in which a plurality of photodiodes (PD), which are semiconductor photodetectors for detecting scintillation light from the scintillator 10, are arranged.
- the light exit surface 10b, which is the lower surface of the scintillator 10, and the light incident surface 15a, which is the upper surface of the PD array 15, are optically connected via an optical adhesive 11 through which scintillation light passes. It is connected to the.
- PD photodiode array
- 3 shows a PD array formed as described above.
- the lower surface 15b of the PD array 15 is a signal output surface for outputting a detection signal from each photodiode 16.
- 16 bump electrodes 17, which are electrodes for detection signal output, are arranged in 4 ⁇ 4 so as to correspond to the respective photodiodes 16.
- a bump electrode for a common electrode of the photodiode is also provided.
- the wiring board unit 2 is installed downstream of the radiation detection unit 1.
- the wiring board unit 2 includes a wiring board 20 provided with a conductive path for guiding an electric signal between the signal input surface and the signal output surface.
- a glass substrate formed of a predetermined glass material having a radiation shielding function is used as the substrate.
- lead glass containing lead is used as the substrate.
- FIGS. 3A and 3B are plan views showing the configuration of the wiring board 20, respectively.
- FIG. 3A shows the signal input surface 20a as the upper surface thereof, and FIG. Is on the bottom The signal output surfaces 20b are shown respectively.
- a plurality of through holes 20c are formed between the input surface 20a and the output surface 2Ob in the glass substrate constituting the wiring substrate 20.
- a conductive member 21 that electrically connects the input surface 20a and the output surface 20b to each through hole 20c and functions as a conductive path is provided.
- These through holes 20 c and conductive members 21 are formed at the same pitch as the bump electrodes 17 in the PD array 15.
- a through hole for the common electrode of the photodiode and a conductive member are also provided.
- the conductive member 21 includes a conductive portion 21c formed inside the through hole 20c and an outer periphery of the through hole 20c on the input surface 20a.
- the input part 21a formed so as to be continuous with the conductive part 21c, and the outer part of the through hole 20c formed on the output surface 20b so as to be continuous with the conductive part 21c And an output unit 21b.
- the through hole 20c in the glass substrate of the wiring board 20 is formed on a predetermined plane orthogonal to the conductive direction from the signal input surface 20a to the signal output surface 20b.
- the opening of the through hole 20c in the plane is formed so as to be within a region excluding a region on the signal input surface 20a which is an extension of the opening of the through hole 20c in the conductive direction.
- the cross-sectional opening of the through hole 20 c on that surface is the signal output surface 20 b.
- the structure is not on the extension of the opening on the input surface 20a.
- the conductive direction of the wiring board 20 substantially matches the arrangement direction of each component in the radiation detector.
- an electrode pad 22 is formed in addition to the input portion 21a of the conductive member 21. I have.
- This electrode The pad 22 is provided at a position corresponding to the bump electrode 17 on the output surface 15 b of the PD array 15. Further, the electrode pad 22 is electrically connected to the corresponding input portion 21 a of the conductive member 21 via the wiring 23.
- the photodiode 16 that outputs the detection signal at 15 is electrically connected to the conductive member 21 that is a conductive path on the wiring board 20 via the bump electrode 17 and the electrode pad 22. .
- an electrode pad for a common electrode of the photodiode is also provided.
- an electrode pad 24 is formed in addition to the output portion 21 b of the conductive member 21. Have been.
- the electrode pad 24 is provided at a position corresponding to a bump electrode 31 of a signal processing element 30 described later.
- the electrode pad 24 is electrically connected to the corresponding output section 21 b of the conductive member 21 via the wiring 25.
- an electrode pad 29 is formed on the output surface 2 Ob.
- the electrode pad 29 is used for connection with a housing 40 described later.
- an electrode pad for a common electrode of the photodiode is also provided.
- a signal processing unit 3 and a housing (package) 40 are provided downstream of the wiring board unit 2.
- the signal processing unit 3 includes a signal processing element 30 provided with a signal processing circuit for processing a detection signal from the PD array 15 of the radiation detection unit 1.
- a bump electrode 31 is formed on the upper surface of the signal processing element 30.
- the bump electrode 31 is provided at a position corresponding to the electrode pad 24 on the output surface 20b of the wiring board 20.
- the conductive member 21, which is a conductive path for transmitting the detection signal on the wiring board 20 is connected via the output portion 21 b, the wiring 25, the electrode pad 24, and the bump electrode 31. It is electrically connected to a signal processing circuit provided in the signal processing element 30.
- the housing 40 includes a radiation detecting section 1, a wiring board section 2, and This is a holding member that holds the signal processing unit 3 integrally.
- the housing 40 is provided on the upper surface thereof as four parts, an element housing 41 for housing the signal processing element 30 therein, and an outer periphery of the element housing 41, and the bump electrode 44 is provided. It has a radiation detecting unit 1, a wiring substrate unit 2, and a support unit 42 that supports the signal processing unit 3, while being connected to the electrode pads 29 of the wiring substrate 20 via the wiring board 20. Further, on the lower surface of the housing 40, a lead 43 used for inputting / outputting an electric signal to / from the outside is provided.
- a detection signal which is an electric signal corresponding to the detection of radiation, is output.
- the detection signals output from the photodiodes 16 of the PD array 15 correspond to the corresponding bump electrodes 17, the conductive members 21 of the wiring board 20, and the bump electrodes 31.
- the signals are sequentially input to the signal processing element 30. Then, the signal processing circuit of the signal processing element 30 performs necessary signal processing on the detection signal.
- the wiring board used for the wiring board unit 2 in the radiation detector shown in FIGS. 1 to 3A and 3B includes a radiation detection unit and a signal processing unit in the radiation detector.
- the wiring substrate 20 used for electrical connection with the substrate is configured using a glass substrate made of a predetermined glass material.
- the through hole 20c of the conductive path provided on the glass substrate is configured such that the opening in a predetermined plane perpendicular to the conductive direction does not extend from the opening in the signal input surface 20a. That is, the through hole 20c cannot be seen from the signal input surface 20a to the signal output surface 20 when viewed from the conductive direction orthogonal to the signal input surface 20a.
- the glass substrate 20 A glass material having a radiation shielding function at any position from the signal input surface 20a to the signal output surface 20b when viewed from the conductive direction even in a portion where the through hole 20c is provided. Will exist. This realizes a wiring board in which transmission of radiation is suppressed as a whole.
- such a wiring board is used as a radiation board used for a wiring board section 2 that electrically connects the radiation detection section 1 and the signal processing section 3 and transmits a detection signal as an electrical signal.
- the detector when viewed from the arrangement direction of each component in the radiation detector, which substantially coincides with the conduction direction of the detection signal, that is, from the direction of incidence of radiation on the radiation detector, the wiring board 2
- a glass material having a radiation shielding function exists in at least a part from the signal input surface 20a to the signal output surface 20b of the wiring board 20.
- the glass material used for the glass substrate in the spring board 20 of the wiring board section 2 it is preferable to use a glass material containing lead.
- lead glass By using lead glass, it is possible to effectively suppress the transmission of radiation in the wiring board portion 2.
- a conductive path is formed between the input surface 20a on the radiation detection unit 1 side and the output surface 20b on the signal processing unit 3 side.
- a glass substrate provided with a through hole 20c for forming the conductive member 21 is used. Examples of such a glass substrate include, for example, a glass having a plurality of through-holes formed by integrally forming a plurality of hollow glass members having both ends opened and being fused together. A substrate can be used.
- FIGS. 4A to 4C are diagrams showing an example of the above glass substrate provided with a plurality of through holes.
- a general configuration example of a glass substrate having a plurality of through holes is shown.
- the glass substrates shown in FIGS. 4A to 4C have different shapes and configurations from the wiring substrates used in the radiation detector shown in FIG.
- FIG. 4A is a plan view showing a configuration of a glass substrate
- FIG. 4B is a plan view showing a configuration of a multi-channel member included in the glass substrate
- FIG. 4C is a multi-channel member. It is a perspective view which shows the structure of the glass member contained in (1). 4A to 4C show the glass substrate in a state where a conductive member serving as a conductive path in the wiring substrate is not formed.
- the glass substrate 9 has a cavity substrate 90.
- the cavity substrate 90 includes a plurality of multi-channel members 92 having a plurality of through holes 93.
- the multi-channel members 92 are integrally formed inside the edge member 91 made of a glass material by being fused to each other in a two-dimensional arrangement.
- the multi-channel member 92 is formed by integrally forming a plurality of hollow glass members 95 each having an opening at both ends by fusing them together.
- the substrate 90 When viewed from a direction perpendicular to the upper and lower surfaces of one substrate 90, the substrate 90 has a quadrangular shape (for example, about 100 mx 100 / m).
- the opening of the through hole 93 has a circular shape.
- the inner diameter of the through hole 93 is, for example, about 6 / m.
- the glass material of the edge member 91 and the glass member 95 constituting the substrate 90 has a radiation shielding function as described above with respect to the radiation detector.
- a glass material for example, a lead glass material is used.
- the wiring board 20 in the radiation detector shown in FIG. For example, it is possible to use a glass substrate having the configuration shown in FIGS. 4A to 4C in which a conductive member serving as a conductive path is formed in a through hole. That is, in a glass substrate having such a configuration, the shape of the substrate and the number and arrangement of through holes are set according to the configuration of the radiation detector. Then, a conductive member serving as a conductive path is formed in a through hole provided in the glass substrate, and further, an electric wiring pattern including necessary electrodes and wirings is formed on each surface thereof, thereby obtaining the electric wiring pattern shown in FIG. A wiring board having a configuration as shown in FIG. 3B is obtained.
- FIGS. 5A and 5B are diagrams showing an example of the configuration of a conductive member provided in a through hole of a wiring board.
- FIG. 5A is a top view, and FIG. An arrow cross section is shown.
- the configuration of the conductive member 21 which is a conductive path in the wiring board 20 is shown.
- the through-hole 20 c has a center line with respect to the conductive direction perpendicular to the input surface 20 a and the output surface 20 b of the wiring board 20. It is formed to be inclined at a predetermined angle.
- the through hole 20 c is formed such that, on the output surface 20 b orthogonal to the conductive direction, the cross-sectional opening 5 b of the through hole 20 c on that plane is the same as the opening 5 a on the input surface 20 a. It is formed so as not to extend.
- the through hole 20c has a configuration that cannot be seen from the signal input surface 20a to the signal output surface 20b.
- a conductive member 21 that electrically connects between the input surface 20a and the output surface 20b passes through the through hole 20c. It is provided as a member formed on the inner wall of the hole 20c. That is, in the through hole 20c, a conductive portion 21c is formed on the inner wall thereof. Further, on the input surface 20a, at an outer peripheral portion of the through hole 20c, an input portion 21a continuous with the conducting portion 21c is formed. Further, on the output surface 20b, on the outer peripheral portion of the through hole 20c, an output portion 21b continuous with the conduction portion 21c is formed. These conductive parts 21 c, input part 21 a, and output part 2 lb Thus, a conductive member 21 serving as a conductive path in the wiring board 20 is configured.
- FIGS. 6A and 6B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 6A is a top view, and FIG. One II arrow cross-sectional view is shown.
- the configuration of the conductive member 21 which is a conductive path in the wiring board 20 is shown.
- the center line of the through hole 20 c is curved with respect to the conductive direction perpendicular to the input surface 20 a and the output surface 20 b of the wiring board 20. It is formed.
- the through-hole 20c is formed in a predetermined plane 20d perpendicular to the conductive direction and at a predetermined position between the input surface 20a and the output surface 20b.
- the opening 5d of the cross section L20c is formed so as not to extend on the extension 5a of the input surface 20a.
- the through hole 20c has a configuration that cannot be seen from the signal input surface 20a to the signal output surface 20b.
- the conductive member 21 that electrically connects the input surface 20a and the output surface 20b is inserted through the through hole 20c. It is provided as a member formed on the inner wall of the hole 20c. That is, in the through hole 20c, a conductive portion 21c is formed on the inner wall thereof. Further, on the input surface 20a, on the outer peripheral portion of the through hole 20c, an input portion 21a continuous with the conducting portion 21c is formed. Further, on the output surface 20b, on the outer peripheral portion of the through hole 20c, an output portion 21 continuous with the conducting portion 21c is formed.
- the conductive member 21 serving as a conductive path in the wiring board 20 is configured by the conductive portion 21c, the input portion 21a, and the output portion 21b.
- FIGS. 7A and 7B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 7A is a top view, and FIG. One III arrow cross-sectional view is shown.
- the configuration of the conductive member 21 which is a conductive path in the wiring board 20 is shown.
- the configuration of the through hole 20c in this configuration example is shown in FIGS. This is the same as the configuration shown in B.
- a conductive member 21 that electrically connects between the input surface 20a and the output surface 20b passes through the through hole 20c. It is provided as a member filled inside the hole 20c. That is, the conductive portion 21c is filled in the through hole 20c. Further, on the input surface 20a, on the outer peripheral portion of the through hole 20c, an input portion 21a continuous with the conducting portion 21c is formed. Further, on the output surface 20b, on the outer peripheral portion of the through hole 20c, an output portion 21 continuous with the conducting portion 21c is formed.
- the conductive portion 21 c, the input portion 21 a, and the output portion 21 b constitute a conductive member 21 serving as a conductive path in the wiring board 20.
- FIGS. 8A and 8B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 8A is a top view, and FIG. — Shows the IV arrow cross section.
- the configuration of the conductive member 21 which is a conductive path in the wiring board 20 is shown.
- the configuration of the through hole 20c in this configuration example is the same as the configuration shown in FIGS. 6A and 6B.
- a conductive member 21 that electrically connects between the input surface 20a and the output surface 20b passes through the through hole 20c. It is provided as a member filled inside the hole 20c. That is, the inside of the through hole 20c is filled with the conductive portion 21c. Further, on the input surface 20a, an input portion 21a continuous with the conducting portion 21c is formed at an outer peripheral portion of the through hole 20c. Further, on the output surface 20b, on the outer peripheral portion of the through hole 20c, an output portion 21b continuous with the conduction portion 21c is formed.
- the conductive member 21 serving as a conductive path in the wiring board 20 is configured by the conductive portion 21c, the input portion 21a, and the output portion 21b.
- the conductive member formed as a conductive path on a glass substrate having a plurality of through holes includes, for example, the structure shown in FIGS. 5A, 5B to 8A, and 8B. Can be used.
- the arrangement of the conductive paths on the glass substrate serving as the wiring substrate is preferably set according to the configuration of the radiation detector.
- a conductive member is formed by selecting a through hole at a position where a conductive path is required from a plurality of through holes using a mask or the like.
- a configuration in which a through hole is selectively provided only at a position where a conductive path is necessary may be adopted.
- the glass substrate used for the wiring substrate is not limited to the configuration illustrated in FIGS. 4A to 4C, and another configuration may be used.
- a plurality of glass members each having a through hole are formed integrally to form a multi-channel member, and further, a plurality of multi-channel members are formed integrally to form a capillary substrate.
- the cavities may be integrally formed directly from a plurality of glass members.
- the cross-sectional shape may be a polygonal shape other than the circular shape, for example, a quadrangular shape.
- a glass substrate made of a glass material having a radiation shielding function, such as lead glass, and having a through hole formed at a predetermined position and having a configuration invisible from the input surface to the output surface as described above is used.
- a conductive member serving as a conductive path is formed in the through hole, and further, an electric wiring pattern having necessary electrodes and wirings is formed on both surfaces serving as an input surface and an output surface, respectively, and is used for the wiring board unit 2.
- the wiring substrate 20 to be manufactured are examples of the wiring substrate 20 to be manufactured.
- the conduction unit 21c, the input unit 21a, and the output In addition to forming the conductive member 21 consisting of the portion 21b, the electrode pad 22 and the wiring 23 are formed on the input surface 20a, and the electrode pad 24 is formed on the output surface 20b. 29 and the wiring 25 are formed to form a wiring board 20.
- the above-mentioned conductive member and electric wiring pattern formed on a glass substrate examples include titanium nitride (T i N), eckenole (N i), aluminum (A 1), chromium (Cr), copper (Cu), silver (Ag), gold (Au), or alloys thereof.
- Can be formed by a conductive metal layer made of Such a metal layer may be a single metal layer, or may be a composite film or a laminated film.
- a mask having a desired pattern is provided on a glass substrate, and a metal (metal vapor deposition (PVD) method, a chemical vapor deposition (CVD) method), metal plating, or a sputtering method is used.
- PVD metal vapor deposition
- CVD chemical vapor deposition
- a method of removing the mask can be used. If necessary, a bump electrode may be further formed on the wiring board 20.
- the IC of the signal processing element 30 on which the bump electrode 31 is formed is formed. The chip is aligned with the electrode pads 24 provided on the output surface 20b of the wiring board 20, and they are physically and electrically connected. Further, the PD array 15 on which the bump electrodes 17 are formed is aligned with the electrode pads 22 provided on the input surface 20a of the wiring board 20, and these are physically and electrically connected. .
- Examples of the bump material for forming the bump electrodes 31 and 17 include Eckel (Ni), copper (Cu), silver (Ag), gold (Au), solder, resin containing conductive filler, Alternatively, a composite material thereof can be used. Further, an under bump metal (UBM) may be interposed between the bump electrode and the electrode pad thereunder.
- Eckel Ni
- Cu copper
- Cu silver
- Au gold
- solder resin containing conductive filler
- UBM under bump metal
- the housing 40 on which the bump electrodes 44 are formed is aligned with the electrode pads 29 provided on the output surface 20b of the wiring board 20, and they are physically and electrically connected. I do.
- signals can be input / output to / from an external circuit via the leads 43 provided on the housing 40.
- the scintillator 10 mounted on the light incident surface 15a of the PD array 15 via the optical adhesive 11, the radiation detector shown in FIG. 1 is obtained.
- the PD array 15 provided as a semiconductor light detection element array in the radiation detection unit 1
- the surface incident light where the photodiode is formed on the light incident surface (surface) 15a A back-illuminated type in which a photodiode is formed on the signal output surface (back surface) 15b may be used.
- the number, arrangement, and the like of the photodiodes serving as photodetectors may be set as appropriate.
- the configuration in which the detection signal from the photodiode is output from the output surface 15b is, for example, formed on the output surface 15b according to the specific configuration of the PD array.
- a configuration using a wiring pattern or a configuration using a penetrating electrode formed in the PD array 15 can be used.
- the radiation detection unit 1 has a configuration in which a scintillator 10 that generates scintillation light upon incidence of radiation and a scintillation from the scintillator 10
- a configuration including a PD array 15 provided with a photodiode 16 which is a semiconductor light detection element for detecting light is used.
- Such a configuration is an indirect detection type in which incident X-rays and other radiation are converted into light of a predetermined wavelength (for example, visible light) by a scintillator 10 and then detected by a semiconductor photodetector such as an Si-PD array. It is a structure of.
- a configuration in which a scintillator is not provided and a semiconductor detection element that detects incident radiation is used as the radiation detection unit is used as the radiation detection unit.
- Such a configuration is a direct detection type configuration in which incident radiation such as X-rays is detected by a semiconductor detection element made of CdTe or the like. This corresponds to, for example, a configuration in which the scintillator 10 is removed from the configuration in FIG. 1 and the PD array 15 is replaced with a semiconductor detection element array.
- connection between the wiring board unit 2 and the radiation detection unit 1 and the connection between the wiring board unit 2 and the signal processing unit 3 are performed via bump electrodes as in the above embodiment. It is preferable to use a direct bonding method by electrical connection . By using such a metal bump electrode as an electrical connection means, each part can be suitably electrically connected.
- an anisotropic conductive film (ACF) method A configuration in which an underfill resin is filled after connection by the bump electrodes, an anisotropic conductive film (ACF) method, A configuration using a conductive paste (ACP) method or a non-conductive paste (NCP) method may be used.
- ACF anisotropic conductive film
- ACP conductive paste
- NCP non-conductive paste
- a passivation film made of an insulating material may be formed in a state where the electrode pads are opened, if necessary.
- the wiring board and the radiation detector using the same according to the present invention can be used as a wiring board and a radiation detector in which transmission of radiation is suppressed. That is, the wiring board used for the electrical connection between the radiation detecting means and the signal processing means in the radiation detector is formed using a glass substrate made of a predetermined glass material, and is provided on the glass substrate.
- the through-hole of the conductive path that is provided has a through hole from the signal input surface to the signal output surface when viewed from the conductive direction orthogonal to the signal input surface because the opening in the predetermined plane is not on the extension of the opening in the signal input surface.
- the radiation is generated at any position from the signal input surface to the signal output surface.
- a glass material having a shielding function will be present. This realizes a wiring board in which transmission of radiation is suppressed as a whole.
- the radiation detector in which the wiring board having such a configuration is applied to the wiring board portion, at least one portion from the signal input surface to the signal output surface is provided at any part of the wiring board portion.
- a glass material having a radiation shielding function in the part.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/541,616 US7326907B2 (en) | 2003-01-08 | 2004-01-08 | Wiring substrate and radiation detector using same |
| EP04700761A EP1589581A4 (en) | 2003-01-08 | 2004-01-08 | WIRING SUBSTRATE AND RADIATION DETECTOR THEREWITH |
| IL169585A IL169585A (en) | 2003-01-08 | 2005-07-07 | Wiring substrate and radiation detector using same |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003002504A JP4365108B2 (ja) | 2003-01-08 | 2003-01-08 | 配線基板、及びそれを用いた放射線検出器 |
| JP2003-002504 | 2003-01-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2004064162A1 true WO2004064162A1 (ja) | 2004-07-29 |
Family
ID=32708867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2004/000077 Ceased WO2004064162A1 (ja) | 2003-01-08 | 2004-01-08 | 配線基板、及びそれを用いた放射線検出器 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7326907B2 (ja) |
| EP (1) | EP1589581A4 (ja) |
| JP (1) | JP4365108B2 (ja) |
| KR (1) | KR20050090124A (ja) |
| CN (1) | CN100401523C (ja) |
| IL (1) | IL169585A (ja) |
| TW (1) | TWI307557B (ja) |
| WO (1) | WO2004064162A1 (ja) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7230247B2 (en) | 2002-03-08 | 2007-06-12 | Hamamatsu Photonics K.K. | Detector |
| JP4237966B2 (ja) * | 2002-03-08 | 2009-03-11 | 浜松ホトニクス株式会社 | 検出器 |
| JP4364514B2 (ja) * | 2003-01-08 | 2009-11-18 | 浜松ホトニクス株式会社 | 配線基板、及びそれを用いた放射線検出器 |
| JP4133429B2 (ja) | 2003-02-24 | 2008-08-13 | 浜松ホトニクス株式会社 | 半導体装置 |
| JP3935091B2 (ja) * | 2003-02-27 | 2007-06-20 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4138529B2 (ja) * | 2003-02-24 | 2008-08-27 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4421209B2 (ja) * | 2003-04-11 | 2010-02-24 | 浜松ホトニクス株式会社 | 放射線検出器 |
| US7535033B2 (en) * | 2004-09-14 | 2009-05-19 | Banpil Photonics, Inc. | Multicolor photodiode array and method of manufacturing |
| JP4379295B2 (ja) | 2004-10-26 | 2009-12-09 | ソニー株式会社 | 半導体イメージセンサー・モジュール及びその製造方法 |
| KR100618892B1 (ko) * | 2005-04-13 | 2006-09-01 | 삼성전자주식회사 | 와이어 본딩을 통해 팬 아웃 구조를 달성하는 반도체패키지 |
| US7633167B2 (en) * | 2005-09-29 | 2009-12-15 | Nec Electronics Corporation | Semiconductor device and method for manufacturing same |
| TWI320237B (en) * | 2006-07-24 | 2010-02-01 | Si-substrate and structure of opto-electronic package having the same | |
| US20090273005A1 (en) * | 2006-07-24 | 2009-11-05 | Hung-Yi Lin | Opto-electronic package structure having silicon-substrate and method of forming the same |
| US7732233B2 (en) * | 2006-07-24 | 2010-06-08 | Touch Micro-System Technology Corp. | Method for making light emitting diode chip package |
| US20090273004A1 (en) * | 2006-07-24 | 2009-11-05 | Hung-Yi Lin | Chip package structure and method of making the same |
| GB2449853B (en) * | 2007-06-04 | 2012-02-08 | Detection Technology Oy | Photodetector for imaging system |
| JP4722104B2 (ja) * | 2007-09-21 | 2011-07-13 | 京セラ株式会社 | X線検出素子搭載用配線基板およびx線検出装置 |
| JP4722103B2 (ja) * | 2007-09-21 | 2011-07-13 | 京セラ株式会社 | X線検出素子搭載用配線基板およびx線検出装置 |
| DE102008012604B4 (de) * | 2008-03-05 | 2017-10-12 | Siemens Healthcare Gmbh | Detektormodul, Röntgendetektor und Verfahren zum Aufbau eines Röntgendetektors |
| JP5281484B2 (ja) * | 2009-05-28 | 2013-09-04 | 浜松ホトニクス株式会社 | 放射線検出ユニット |
| JP6554554B2 (ja) | 2015-04-07 | 2019-07-31 | シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド | 半導体x線検出器 |
| JP6798871B2 (ja) * | 2016-12-21 | 2020-12-09 | 京セラ株式会社 | 検出素子搭載用基板および検出装置 |
| JP7059089B2 (ja) * | 2018-04-23 | 2022-04-25 | 株式会社日立製作所 | X線検出器およびそれを用いたx線計測装置 |
| JP7550227B2 (ja) * | 2020-07-29 | 2024-09-12 | 京セラ株式会社 | 回路基板及びプローブカード |
| US11594477B2 (en) * | 2021-04-15 | 2023-02-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor package and method of manufacturing semiconductor package |
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| JP4364514B2 (ja) * | 2003-01-08 | 2009-11-18 | 浜松ホトニクス株式会社 | 配線基板、及びそれを用いた放射線検出器 |
-
2003
- 2003-01-08 JP JP2003002504A patent/JP4365108B2/ja not_active Expired - Fee Related
-
2004
- 2004-01-08 TW TW093100398A patent/TWI307557B/zh not_active IP Right Cessation
- 2004-01-08 CN CNB2004800020300A patent/CN100401523C/zh not_active Expired - Fee Related
- 2004-01-08 WO PCT/JP2004/000077 patent/WO2004064162A1/ja not_active Ceased
- 2004-01-08 EP EP04700761A patent/EP1589581A4/en not_active Withdrawn
- 2004-01-08 KR KR1020057009167A patent/KR20050090124A/ko not_active Ceased
- 2004-01-08 US US10/541,616 patent/US7326907B2/en not_active Expired - Fee Related
-
2005
- 2005-07-07 IL IL169585A patent/IL169585A/en not_active IP Right Cessation
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| JPH06347480A (ja) * | 1993-06-04 | 1994-12-22 | Nitto Denko Corp | プローブ構造 |
| JPH08330469A (ja) * | 1995-05-30 | 1996-12-13 | Hitachi Ltd | 半導体装置用配線基板およびその製造方法 |
| US20020038851A1 (en) * | 2000-08-10 | 2002-04-04 | Kenji Kajiwara | Large-area fiber plate, radiation image pickup apparatus utilizing the same and producing method therefor |
| JP2002359446A (ja) * | 2001-05-31 | 2002-12-13 | Hitachi Ltd | 配線基板およびその製造方法 |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN100401523C (zh) | 2008-07-09 |
| KR20050090124A (ko) | 2005-09-12 |
| EP1589581A1 (en) | 2005-10-26 |
| EP1589581A4 (en) | 2006-08-23 |
| TW200418196A (en) | 2004-09-16 |
| CN1723566A (zh) | 2006-01-18 |
| IL169585A0 (en) | 2007-07-04 |
| TWI307557B (en) | 2009-03-11 |
| JP2004265883A (ja) | 2004-09-24 |
| US20060267195A1 (en) | 2006-11-30 |
| US7326907B2 (en) | 2008-02-05 |
| IL169585A (en) | 2010-02-17 |
| JP4365108B2 (ja) | 2009-11-18 |
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