WO2004064163A1 - 配線基板、及びそれを用いた放射線検出器 - Google Patents
配線基板、及びそれを用いた放射線検出器 Download PDFInfo
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- WO2004064163A1 WO2004064163A1 PCT/JP2004/000079 JP2004000079W WO2004064163A1 WO 2004064163 A1 WO2004064163 A1 WO 2004064163A1 JP 2004000079 W JP2004000079 W JP 2004000079W WO 2004064163 A1 WO2004064163 A1 WO 2004064163A1
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- WIPO (PCT)
- Prior art keywords
- wiring board
- radiation
- signal
- hole
- conductive
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/496—Luminescent members, e.g. fluorescent sheets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/115—Via connections; Lands around holes or via connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/144—Stacked arrangements of planar printed circuit boards
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- the present invention relates to a wiring board provided with a conductive path for guiding an electric signal, and a radiation detector using the same.
- a radiation detector used for a CT sensor or the like there is a detector having a configuration in which a scintillator is provided on a light incident surface of a semiconductor photodetector array such as a photodiode array.
- a radiation detector when radiation such as an X-ray, a y-ray, or a charged particle beam to be detected enters the scintillator, scintillation light is generated by the radiation in the scintillator. Then, radiation is detected by detecting the scintillation light with a semiconductor photodetector.
- a signal processing element is provided for performing signal processing of a detection signal output from each of the photodetection elements on the photodetection element array.
- a configuration for electrically connecting the photodetection element and the signal processing element a configuration using various wirings or a configuration using a conductive path provided on a wiring board may be used. (For example, see Japanese Patent Application Laid-Open No. 8-330469).
- the present invention has been made to solve the above problems, and has as its object to provide a wiring board in which transmission of radiation is suppressed, and a radiation detector using the same. I do.
- a wiring board according to the present invention is a wiring board provided with a conductive path for guiding an electric signal between a signal input surface and a signal output surface.
- a glass substrate formed of a predetermined glass material having a radiation shielding function and provided with a through hole, and electrically connected between an input surface and an output surface provided in the through hole to function as a conductive path.
- the wiring board used for the electrical connection between the radiation detection means and the signal processing means in the radiation detector is replaced with two wiring boards having a predetermined glass substrate. It consists of.
- the through-holes of the conductive paths provided on the first and second wiring boards are different from each other.
- the radiation is transmitted from the signal input surface to the signal output surface by the glass material. Is suppressed.
- the other has no through hole. That is, at any part of the wiring board, a glass material having a radiation shielding function exists in at least one of the two wiring boards. Thereby, a wiring board in which transmission of radiation is suppressed as a whole is realized.
- each of the first wiring substrate and the second wiring substrate may be formed of a glass material containing lead. preferable. As a result, transmission of radiation through the wiring board can be effectively suppressed. Further, a substrate made of another glass material having a radiation shielding function may be used.
- the conductive members in each of the first wiring board and the second fl-line board are formed on the inner wall of the through hole provided in the glass substrate. It may be formed and provided. Alternatively, the conductive member may be provided so as to be filled in a through hole provided in the glass substrate.
- the glass substrates in each of the first wiring board and the second wiring board are formed by a plurality of hollow glass members having both ends opened by being fused and integrally formed to form a plurality of penetrating glass members.
- a glass substrate provided with holes is preferable.
- a substrate having another configuration may be used.
- the radiation detector includes: (1) radiation detection means for detecting incident radiation and outputting a detection signal; and (2) signal processing for processing a detection signal from the radiation detection means. And (3) the above-mentioned wiring board provided with a conductive path for guiding a detection signal between the signal input surface and the signal output surface, and the radiation I detection means and the signal processing means are each provided with a signal input means. (4) the radiation detecting means, the wiring board part, and the signal processing means are arranged along a predetermined arrangement direction substantially coincident with the conductive direction on the wiring board. It is characterized by being arranged in the order of leverage.
- the radiation detection means and the signal processing means are electrically connected to each other, and the first and second wirings are used as a wiring board unit for transmitting a detection signal as an electric signal.
- the wiring board having the above configuration having a board is used. According to such a configuration, a glass material having a radiation shielding function exists in at least one of the two wiring boards in any part of the wiring board portion. As a result, radiation does not enter the signal processing element, and deterioration in reliability and life due to radiation damage is suppressed. A radiation detector is realized.
- the radiation detecting means includes a scintillator that generates scintillation light upon incidence of radiation, and a semiconductor light detection element that detects scintillation light from the scintillator. Can be used. Alternatively, the radiation f spring detecting means may use a configuration having a semiconductor detection element for detecting incident radiation.
- At least one of the wiring board and the radiation detecting means and the wiring board and the signal processing means are electrically connected via bump electrodes.
- a metal bump electrode as an electrical connection means, each part can be suitably electrically connected.
- FIG. 1 is a side cross-sectional view showing a cross-sectional structure of an embodiment of a wiring board and a radiation detector using the same.
- FIG. 2 is an exploded perspective view showing the configuration of the radiation detector shown in FIG.
- FIGS. 3A and 3B are plan views showing the configuration of the (A) signal input surface and (B) the signal output surface of the first wiring board.
- FIGS. 4A and 4B are plan views showing the configuration of the (A) signal input surface and (B) the signal output surface of the second wiring board.
- FIGS. 5A to 5C are diagrams illustrating an example of a glass substrate provided with a plurality of through holes.
- FIGS. 6A and 6B are diagrams showing an example of a configuration of a conductive member provided in a through hole of a wiring board.
- FIGS. 7A and 7B are diagrams showing another example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 1 is a side cross-sectional view showing a cross-sectional structure of an embodiment of a wiring board and a radiation detector according to the present invention.
- FIG. 2 is a perspective view showing the configuration of the wiring board and the radiation detector shown in FIG.
- the axis along the direction in which radiation enters is the z-axis
- the two axes orthogonal to the Z- axis are the X-axis.
- Y axis the negative direction of the z-axis is the conductive direction from the signal input surface to the signal output surface on the wiring board, and the arrangement direction of each component on the radiation detector.
- the radiation detector shown in FIG. 1 includes a radiation detection unit 1, a wiring board unit 2, and a signal processing unit 3. These are arranged in this order from the upstream side (upper side in the figure) to the downstream side (lower side) along a predetermined arrangement direction, as shown in FIG.
- the radiation detector 1 detects radiation such as X-rays, y-rays, and charged particle beams incident on the radiation detector as a detection target, and outputs a detection signal that is an electric signal corresponding to the radiation. Detection means.
- the radiation detector 1 is configured to include a scintillator 10 and a photodiode array 15.
- the scintillator 10 constitutes the upstream portion of the radiation detecting section 1, and the upper surface 10a thereof is a radiation incident surface in the present radiation detector.
- the scintillator 10 generates scintillation light having a predetermined wavelength when radiation is incident from the incident surface 10a.
- the photodiode array (PD array) 15 forms a downstream portion of the radiation detection unit 1.
- the PD array 15 includes a photodiode (PD) which is a semiconductor photodetector that detects scintillation light from the scintillator 10. ) Is a photodetector array in which a plurality of arrays are arranged.
- the light emitting surface 10b, which is the lower surface of the scintillator 10, and the light incident surface 15a, which is the upper surface of the PD array 15, are optically connected through an optical adhesive 11 through which scintillation light passes. Connected.
- the PD array thus formed is shown.
- the lower surface 15b of the PD array 15 is a signal output surface for outputting a detection signal from each photodiode 16.
- 16 bump electrodes 17, which are electrodes for detection signal output, are arranged in 4 ⁇ 4 so as to correspond to the respective photodiodes 16.
- a bump electrode for a common electrode of the photodiode is also provided.
- a wiring board section 2 On the downstream side of the radiation detecting section 1, a wiring board section 2 is provided.
- the wiring board unit 2 is configured by laminating two wiring boards of a first wiring board 20 and a second wiring board 25, and a power supply is provided between a signal input surface and a signal output surface. It is configured to have a wiring board provided with a conductive path for guiding an air signal.
- a glass substrate formed from a predetermined glass material having a radiation shielding function is used as a substrate. As such a glass material, for example, it is preferable to use lead glass containing lead.
- the first wiring board 20 constitutes an upstream portion of the wiring board used for the wiring board unit 2.
- FIG. 3A and FIG. 3B are plan views each showing the configuration of the first wiring board 20.
- FIG. 3A shows the input surface 20a which is the upper surface thereof, and FIG. Indicates an output surface 20b as a lower surface.
- the input surface 20 a is a signal input surface of the entire wiring board unit 2.
- a plurality of through holes 20c are formed between the input surface 20a and the output surface 20b in the glass substrate constituting the first wiring substrate 20. Also, each A conductive member 21 that electrically connects the input surface 20a and the output surface 20b to the through hole 20c and functions as a conductive path is provided.
- 4 ⁇ 4 16 through holes 20 c and conductive members 21 are provided corresponding to the configuration of the PD array 15. The through holes 20c and the conductive members 21 are formed at the same pitch S i as the bump electrodes 17 in the PD array 15 as shown in FIG. 3B.
- a through hole for a common electrode of the photodiode and a conductive member are also provided.
- the conductive member 21 includes a conductive portion 21c formed inside the through hole 20c and an outer periphery of the through hole 20c on the input surface 20a.
- the input part 21a formed so as to be continuous with the conductive part 21c, and the outer part of the through hole 20c formed on the output surface 20b so as to be continuous with the conductive part 21c And an output unit 21.
- an electrode pad 22 is formed in addition to the input portion 21a of the conductive member 21. Have been.
- the electrode pad 22 is provided at a position corresponding to the bump electrode 17 on the output surface 15 b of the PD array 15. Further, the electrode pad 22 is electrically connected to the corresponding input portion 21 a of the conductive member 21 via the wiring 23.
- the photodiode 16 that outputs the detection signal in the PD array 15 is connected to the conductive member that is a conductive path in the first wiring board 20 via the bump electrode 17 and the electrode pad 22. 2 Electrically connected to 1.
- an electrode pad for a common electrode of the photodiode is also provided.
- the second wiring board 25 constitutes a downstream portion of the wiring board used for the wiring board unit 2.
- FIGS. 4A and 4B are plan views showing the configuration of the second wiring board 25, respectively.
- FIG. 4A shows the input surface 25a which is the upper surface
- FIG. 4B shows the lower surface.
- the output surface 25 b force S, the signal output surface of the wiring board 2 as a whole It has become.
- a plurality of through holes 25c are formed between the input surface 25a and the output surface 25b in the glass substrate constituting the second wiring substrate 25.
- a conductive member 26 that electrically conducts between the input surface 25a and the output surface 25b and functions as a conductive path is provided for each through hole 25c.
- a through hole for a common electrode of one photodiode (not shown) and a conductive member are also provided.
- the through holes 25c and the conductive members 26 are connected to the bump electrodes 17 in the PD array 15 and the first wiring board 20.
- the pitch S 2 is smaller than the pitch S.
- the wiring board composed of the first wiring board 20 and the second wiring board 25 in the wiring board unit 2 goes from the signal input surface to the signal output surface in a conductive direction perpendicular to those surfaces.
- the position of the through hole 20c in the first wiring board 20 and the position of the through hole 25c in the second wiring board 25 are different from each other.
- the conductive direction in the wiring board substantially matches the arrangement direction of each component in the radiation detector.
- the conductive member 26 includes a conductive portion 26c formed inside the through hole 25c and an outer periphery of the through hole 25c on the input surface 25a.
- the input part 26a formed so as to be continuous with the conductive part 26c, and the outer part of the through hole 25c on the output surface 25b is formed so as to be continuous with the conductive part 26c.
- Output section 26b is formed so as to be continuous with the conductive part 26c.
- a bump electrode 27 On the input surface 25a of the second wiring board 25, as shown in FIG. 4A, in addition to the input portion 26a of the conductive 1 "raw member 26, a bump electrode 27 The bump electrode 27 is provided at a position corresponding to the output section 21 b on the output surface 20 b of the first wiring board 20.
- the bump electrode 27 is Corresponding via wiring 28 It is electrically connected to the input part 26 a of the conductive member 26.
- the conductive member 21, which is a conductive path for transmitting the detection signal in the first wiring board 20 is connected to the second wiring board 25 through the output section 21 b and the bump electrode 27. It is electrically connected to the conductive individual member 26 which is a conductive path in the above.
- a bump electrode for a common electrode of the photodiode is also provided.
- the electrode pad 29 is formed on the output surface 25 b of the second wiring board 25, in addition to the output portion 26 b of the conductive member 26, the electrode pad 29 Is formed.
- the electrode pad 29 is used for connection with a housing 40 described later.
- an electrode pad for a common electrode of the photodiode is also provided.
- the signal processing unit 3 includes a signal processing element 30 provided with a signal processing circuit for processing a detection signal from the PD array 15 of the radiation detection unit 1.
- a bump electrode 31 is formed on the upper surface of the signal processing element 30, a bump electrode 31 is formed.
- the bump electrode 31 is provided at a position corresponding to the output portion 26 b on the output surface 25 b of the second wiring board 25.
- the conductive member 26, which is a conductive path for transmitting the detection signal in the second wiring board 25 is provided on the signal processing element 30 via the output portion 26b and the bump electrode 31. Electrically connected to the signal processing circuit.
- the housing 40 is a holding member that integrally holds the radiation detection unit 1, the wiring board unit 2, and the signal processing unit 3.
- the housing 40 is provided as a concave portion on the upper surface thereof, and has an element accommodating portion 41 for accommodating the signal processing element 30 therein, and is provided on an outer periphery of the element accommodating portion 41, and has a bump electrode 44. It has a radiation detecting section 1, a wiring board section 2, and a support section 42 for supporting the signal processing section 3, which are connected to the electrode pads 29 of the second wiring board 25 via the second wiring board 25.
- housing 40 On the lower surface, there are provided leads 43 used for input / output of electric signals to / from the outside.
- the detection signals output from the photodiodes 16 of the PD array 15 correspond to the corresponding bump electrodes 17, the conductive members 21 of the first wiring board 20, and the second wiring boards 2.
- the signal is input to the signal processing element 30 via the conductive member 26 and the bump electrode 31 in this order. Then, the signal processing circuit of the signal processing element 30 performs necessary signal processing on the detection signal.
- the wiring board used in the wiring board unit 2 of the radiation detector shown in FIGS. 1 to 4A and 4B includes a radiation detection unit and a signal processing unit in the radiation detector.
- a wiring board used for electrical connection with the like is composed of two wiring boards 20 and 25 each having a predetermined glass substrate. Then, with respect to the through holes of the conductive paths provided in the first and second wiring boards 20 and 25, respectively, the through holes in the wiring boards 20 and 25 are arranged so that the through holes are located at mutually different positions.
- the holes 20 c and 25 c and the conductive members 21 and 26 are formed.
- a portion of the wiring boards 20 and 25 where there is no through hole is made of lead glass or the like.
- a glass material having a radiation shielding function is present. This suppresses the radiation passing through the scintillator 10 and the like from passing through the wiring board.
- the first wiring Since the positions of the through holes are different between the substrate 20 and the second wiring substrate 25, the other wiring substrate has no through hole.
- At any part of the wiring board part 2 at least one of the two wiring boards 20 and 25 is made of a glass material having a radiation shielding function. Will exist. This realizes a wiring board in which the transmission of radiation is suppressed as a whole when viewed from the conductive direction.
- such a wiring board is used as a wiring board 2 for electrically connecting the radiation detecting section 1 and the signal processing section 3 and transmitting a detection signal as an electrical signal.
- the wiring board 2 when viewed from the arrangement direction of each component in the radiation detector, which substantially coincides with the conduction direction of the detection signal, that is, from the direction of incidence of radiation on the radiation detector, the wiring board 2
- a glass material having a radiation shielding function exists in at least one of the two wiring boards 20 and 25.
- a glass material used for the glass substrates of the wiring boards 20 and 25 of the wiring board section 2 as described above, it is preferable to use a glass material containing lead.
- lead glass By using lead glass, it is possible to effectively suppress the transmission of radiation in the wiring board portion 2.
- the conductive paths serving as conductive paths are provided between the input surface on the radiation detection unit 1 side and the output surface on the signal processing unit 3 side.
- a glass substrate provided with a through hole for forming a member is used.
- a glass substrate for example, a plurality of hollow glass members having open ends are provided.
- a glass substrate provided with a plurality of through holes by being integrally formed by fusion can be used.
- FIGS. 5A to 5C are diagrams showing an example of the above glass substrate provided with a plurality of through holes.
- a general configuration example of a glass substrate having a plurality of through holes is shown.
- the glass substrate shown in FIGS. 5A to 5C has a different shape and configuration from the wiring substrate used in the radiation detector shown in FIG.
- FIG. 5A is a plan view showing a configuration of a glass substrate
- FIG. 5B is a plan view showing a configuration of a multi-channel member included in the glass substrate
- FIG. 5C is a multi-channel member. It is a perspective view which shows the structure of the glass member contained in (1).
- 5A to 5C show the glass substrate in a state where a conductive member serving as a conductive path in the wiring board is not formed.
- the glass substrate 9 has a cavities single substrate 90.
- the cavity substrate 90 includes a plurality of multi-channel members 92 having a plurality of through holes 93.
- the multi-channel members 92 are integrally formed inside the edge member 91 made of a glass material by being fused to each other in a two-dimensionally arranged state.
- a plurality of hollow glass members 95 each having an open end are integrally formed by fusing a plurality of hollow glass members 95 with each other. It has a quadrangular shape (for example, about 100 000 ⁇ ) when viewed from a direction perpendicular to the upper and lower surfaces of the substrate 90.
- the opening of the through hole 93 has a circular shape.
- the inner diameter of the through hole 93 is, for example, about 6 / zm.
- the glass material of the edge member 91 and the glass member 95 constituting the substrate 90 has a radiation shielding function as described above with respect to the radiation detector.
- a glass material for example, a lead glass material is used.
- the wiring boards 20 and 25 in the radiation detector shown in FIG. 1 include, for example, through holes in a glass substrate having the configuration shown in FIGS. 5A to 5C.
- a member formed with a conductive member serving as a conductive path can be used. That is, in the glass substrate having such a configuration, the shape of the substrate and the number and arrangement of the through holes are set according to the configuration of the radiation detector.
- a conductive member to be a conductive path is formed in a through hole provided in the glass substrate, and further, an electric wiring pattern including necessary electrodes and wirings is formed on each surface thereof, thereby obtaining a structure shown in FIG. 3B and a wiring board having a configuration as shown in FIGS. 4A and 4B are obtained.
- FIGS. 6A and 6B are diagrams showing an example of the configuration of the conductive member provided in the through hole of the wiring board.
- FIG. 6A is a top view, and FIG. An arrow cross section is shown.
- the configuration of the conductive member 21 which is a conductive path is shown by taking the first wiring board 20 (see FIGS. 3A and 3B) as an example.
- the conductive member 21 is provided as a member formed on the inner wall of the through hole 20c. That is, in the through hole 20c, a conductive portion 21c is formed on the inner wall thereof. Further, on the input surface 20a, an input portion 21a continuous with the conduction portion 21c is formed at an outer peripheral portion of the through hole 20c. Further, on the output surface 20b, an output portion 21b continuous with the conduction portion 21c is formed at an outer peripheral portion of the through hole 20c.
- the conductive part 21 c, the input part 21 a, and the output part 21 b constitute a conductive member 21 serving as a conductive path in the first wiring board 20.
- FIG. 7A and FIG. 7B show the conductive member provided in the through hole of the wiring board.
- FIG. 7A is a diagram showing another example of the configuration, where FIG. 7A is a top view and FIG. 7B is a cross-sectional view taken along the line II-II.
- FIGS. 6A and 6B the configuration of the conductive member 21 that is a conductive path is shown by taking the first wiring board 20 as an example.
- the first wiring board 20 is formed with a plurality of through holes 20c arranged in a two-dimensional manner. As shown in FIG. 7B, each of the through holes 20c has a circular cross-section centered on an axis perpendicular to the input surface 20a and the output surface 20b of the wiring board 20. Is formed.
- the conductive member 21 is provided as a member filled in the through hole 20c. That is, the inside of the through hole 20c is filled with the conducting portion 21c. Further, on the input surface 20a, an input portion 21a continuous with the conduction portion 21c is formed at an outer peripheral portion of the through hole 20c. Further, on the output surface 20b, on the outer peripheral portion of the through hole 20c, an output portion 21b continuous with the conduction portion 21c is formed.
- the conductive member 21 serving as a conductive path in the first wiring board 20 is configured by the conductive portion 21 c, the input portion 21 a, and the output portion 21b.
- the conductive member formed as a conductive path on a glass substrate having a plurality of through holes includes, for example, those shown in FIGS. 6A, 6B, 7A, and 7B. Configurations can be used. Note that the arrangement of the conductive paths on the glass substrate serving as the wiring substrate is preferably set according to the configuration of the radiation detector. As such a configuration, for example, there is a configuration in which a conductive member is formed by selecting a through hole at a position where a conductive path is required from a plurality of through holes using a mask or the like. Alternatively, a configuration in which a through hole is selectively provided only at a position where a conductive path is necessary may be adopted.
- the glass substrate used for the wiring substrate is not limited to the configuration illustrated in FIGS. 5A to 5C, and another configuration may be used.
- a plurality of glass members each having a through hole are integrally formed to form a multi-chip.
- the multi-channel member is integrally formed with a channel member to form a capillary substrate.
- the cavities may be integrally formed directly from a plurality of glass members.
- the cross-sectional shape may be a polygonal shape other than the circular shape, for example, a quadrangular shape.
- a glass substrate made of a glass material having a radiation shielding function such as lead glass and having a through hole formed at a predetermined position is prepared. Then, a conductive member serving as a conductive path is formed in the winning hole, and an electric wiring pattern having necessary electrodes and wirings is formed on both surfaces serving as an input surface and an output surface, respectively.
- the wiring boards 20 and 25 to be the laminated wiring boards used in the part 2 are manufactured.
- the conducting portion 21c and the input portion 21a correspond to the through hole 20c provided in the glass substrate.
- a conductive member 21 composed of an output part 21b, and an electrode pad 22 and a spring 23 formed on an input surface 20a thereof to form a first wiring board 20.
- the second wiring board on the signal output surface side includes a conducting part 26c, an input part 26a, and an output part 26b with respect to the through hole 25c provided in the glass substrate.
- a conductive member 26 is formed, a wiring 28 is formed on the input surface 25a, and an electrode pad 29 is formed on the output surface 25b, thereby forming a second wiring substrate 25.
- the above-mentioned conductive members and electric wiring patterns formed on the glass substrate include, for example, titanium nitride (T i N;), -kock (N i), aluminum (A 1), chromium (C r), copper (Cu), silver (Ag), gold (Au), or a conductive metal layer made of an alloy thereof.
- a metal layer may be a single metal layer, or may be a composite film or a laminated film.
- a mask with a desired pattern is provided on a glass substrate, and a metal film is formed by a method such as vapor deposition (physical vapor deposition (PVD) or chemical vapor deposition (CVD)), plating, or sputtering.
- a method of removing the mask can be used.
- a bump electrode is formed on the wiring substrate on which the conductive member and the electric wiring pattern are formed, if necessary.
- the bump electrode 27 is formed on the electrode pad formed at the end of the wiring 28 on the input surface 25a of the second wiring board 25. Then, the first wiring board 20 and the second wiring board 25 are aligned with each other, and mounted via the bump electrodes 27 to form a multilayer wiring board that becomes the wiring board unit 2.
- the bump material for forming the bump electrode 27 includes, for example, nickel (Ni), copper (Cu), silver (Ag), gold (Au), solder, and conductive filler. , Or a composite material thereof. Further, an under bump metal (UBM) may be interposed between the bump electrode 27 and the electrode pad on the input surface 25a of the wiring board 25.
- UBM under bump metal
- the IC chip of the signal processing element 30 on which the bump electrodes 31 are formed is output to the output of the second wiring board 25.
- the output part 26 b of the conductive member 26 provided on the surface 25 b is aligned and physically and electrically connected.
- the PD array 15 on which the bump electrodes 17 are formed is connected to an electrode pad provided on the input surface 20a of the first wiring board 20.
- the bump materials of the bump electrodes 31 and 17 are the same as those of the bump electrode 27 described above.
- the housing 40 on which the bump electrodes 44 are formed is aligned with the electrode pads 29 provided on the output surface 25b of the second wiring board 25. , Connect them physically and electrically. As described above, provided in the housing 40 The input / output operation of a signal to / from an external circuit via the connected lead 43 becomes possible. Further, by mounting the scintillator 10 via the optical adhesive 11 on the light incident surface 15a of the PD array 15, the radiation detector shown in FIG. 1 is obtained.
- the photodiode formed on the light incident surface (surface) 15a has a photodiode.
- a back-illuminated type in which a photodiode is formed on the signal output surface (back surface) 15b may be used. Further, the number, arrangement, and the like of the photodiodes serving as the light detection elements may be appropriately set.
- the configuration in which the detection signal from the photodiode is output from the output surface 15b is, for example, formed on the output surface 15b according to the specific configuration of the PD array.
- a configuration using a wiring pattern or a configuration using a penetrating electrode formed in the PD array 15 can be used.
- the configuration of the radiation detection unit 1 includes a scintillator 10 that generates scintillation light upon incidence of radiation, and a scintillator from the scintillator 10.
- a configuration including a PD array 15 provided with a photodiode 16 which is a semiconductor light detection element for detecting light is used.
- Such a configuration is an indirect detection type in which incident X-rays and other radiation are converted into light of a predetermined wavelength (for example, visible light) by a scintillator 10 and then detected by a semiconductor photodetector such as an Si-PD array. It is a structure of.
- a configuration having a semiconductor detection element that detects incident radiation without providing a scintillator may be used as the radiation detection unit.
- Such a configuration is a direct detection type configuration in which incident radiation such as X-rays is detected by a semiconductor detection element made of CdTe or the like. This corresponds to, for example, a configuration in which the scintillator 10 is removed from the configuration in FIG. 1 and the PD array 15 is replaced with a semiconductor detection element array.
- ACF anisotropic conductive film
- ACP conductive paste
- NCP non-conductive paste
- a passivation film made of an insulating material may be formed with the electrode pad opened.
- the wiring board and the radiation detector using the same according to the present invention can be used as a wiring board and a radiation detector in which transmission of radiation is suppressed. That is, the wiring board used for the electrical connection between the radiation detection means and the signal processing means in the radiation detector is changed from the first and second wiring boards made of a predetermined glass material having a radiation shielding function. According to the configuration, the through-holes of the conductive paths are different from each other with respect to the conductive paths provided in the first and second wiring boards. However, the transmission of radiation from the signal input surface to the signal output surface is suppressed by the glass material.
- the other wiring board has no through hole. That is, a glass material having a radiation shielding function exists in at least one of the first and second wiring boards in any part of the wiring board. This realizes a wiring board in which transmission of radiation is suppressed as a whole. Further, according to the radiation detector in which the wiring board having such a configuration is applied to the wiring board portion, any part of the wiring board portion has a radiation shielding function at least one of the two wiring boards. There are glass materials that have. This realizes a radiation detector in which radiation does not enter the signal processing element and deterioration in reliability and life due to radiation damage is suppressed.
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/541,618 US20060244153A1 (en) | 2003-01-08 | 2004-01-08 | Wiring substrate and radiation detector using the same |
| DE602004016956T DE602004016956D1 (de) | 2003-01-08 | 2004-01-08 | Verdrahtungssubstrat und strahlungsdetektor damit |
| EP04700774A EP1589582B1 (en) | 2003-01-08 | 2004-01-08 | Wiring substrate and radiation detector using same |
| IL169586A IL169586A0 (en) | 2003-01-08 | 2005-07-07 | Wiring substrate and radiation detector using same |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003-002541 | 2003-01-08 | ||
| JP2003002541A JP4364514B2 (ja) | 2003-01-08 | 2003-01-08 | 配線基板、及びそれを用いた放射線検出器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2004064163A1 true WO2004064163A1 (ja) | 2004-07-29 |
Family
ID=32708868
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2004/000079 Ceased WO2004064163A1 (ja) | 2003-01-08 | 2004-01-08 | 配線基板、及びそれを用いた放射線検出器 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US20060244153A1 (ja) |
| EP (1) | EP1589582B1 (ja) |
| JP (1) | JP4364514B2 (ja) |
| KR (1) | KR20050090133A (ja) |
| CN (1) | CN100407432C (ja) |
| DE (1) | DE602004016956D1 (ja) |
| IL (1) | IL169586A0 (ja) |
| TW (1) | TWI307556B (ja) |
| WO (1) | WO2004064163A1 (ja) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3935091B2 (ja) | 2003-02-27 | 2007-06-20 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4133429B2 (ja) | 2003-02-24 | 2008-08-13 | 浜松ホトニクス株式会社 | 半導体装置 |
| JP4138529B2 (ja) | 2003-02-24 | 2008-08-27 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4365108B2 (ja) * | 2003-01-08 | 2009-11-18 | 浜松ホトニクス株式会社 | 配線基板、及びそれを用いた放射線検出器 |
| JP4421209B2 (ja) * | 2003-04-11 | 2010-02-24 | 浜松ホトニクス株式会社 | 放射線検出器 |
| JP4379295B2 (ja) | 2004-10-26 | 2009-12-09 | ソニー株式会社 | 半導体イメージセンサー・モジュール及びその製造方法 |
| KR20080106453A (ko) * | 2006-03-30 | 2008-12-05 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 방사선 디텍터 어레이 |
| JP4451864B2 (ja) * | 2006-07-11 | 2010-04-14 | 浜松ホトニクス株式会社 | 配線基板及び固体撮像装置 |
| US7504637B2 (en) * | 2006-07-11 | 2009-03-17 | Aeroflex Colorado Springs Inc. | Two component photodiode detector |
| JP2010171307A (ja) * | 2009-01-26 | 2010-08-05 | Panasonic Corp | 撮像装置 |
| JP2010212481A (ja) * | 2009-03-11 | 2010-09-24 | Panasonic Corp | 撮像装置 |
| JP5358509B2 (ja) | 2010-04-15 | 2013-12-04 | 浜松ホトニクス株式会社 | 放射線検出器モジュール |
| US8659148B2 (en) * | 2010-11-30 | 2014-02-25 | General Electric Company | Tileable sensor array |
| JP5901169B2 (ja) * | 2011-07-26 | 2016-04-06 | キヤノン株式会社 | シンチレータ構造体および放射線検出器 |
| WO2016113647A1 (en) * | 2015-01-15 | 2016-07-21 | Koninklijke Philips N.V. | Imaging detector module assembly |
| JP2016206101A (ja) * | 2015-04-27 | 2016-12-08 | ソニー株式会社 | 放射線検出装置、撮像装置、および撮像システム |
| JP6712215B2 (ja) * | 2016-11-11 | 2020-06-17 | 浜松ホトニクス株式会社 | 光検出装置 |
| CN116250085A (zh) * | 2020-11-13 | 2023-06-09 | Ams-欧司朗有限公司 | 用于检测x射线辐射的模块组件 |
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| US20020038851A1 (en) * | 2000-08-10 | 2002-04-04 | Kenji Kajiwara | Large-area fiber plate, radiation image pickup apparatus utilizing the same and producing method therefor |
| JP2002359446A (ja) * | 2001-05-31 | 2002-12-13 | Hitachi Ltd | 配線基板およびその製造方法 |
| JP2003264280A (ja) * | 2002-03-08 | 2003-09-19 | Hamamatsu Photonics Kk | 検出器 |
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| US5043582A (en) * | 1985-12-11 | 1991-08-27 | General Imagining Corporation | X-ray imaging system and solid state detector therefor |
| FR2627923B1 (fr) * | 1988-02-26 | 1990-06-22 | Thomson Csf | Matrice d'elements photosensibles et detecteur de radiations comportant une telle matrice, notamment detecteur de rayons x a double energie |
| US5187380A (en) * | 1992-04-09 | 1993-02-16 | General Electric Company | Low capacitance X-ray radiation detector |
| US5477933A (en) * | 1994-10-24 | 1995-12-26 | At&T Corp. | Electronic device interconnection techniques |
| JPH1056040A (ja) * | 1996-08-08 | 1998-02-24 | Hitachi Ltd | 半導体装置およびその製造方法 |
| CN1267989C (zh) * | 1996-09-12 | 2006-08-02 | 揖斐电株式会社 | 电路部件搭载用基板 |
| US6620731B1 (en) * | 1997-12-18 | 2003-09-16 | Micron Technology, Inc. | Method for fabricating semiconductor components and interconnects with contacts on opposing sides |
| JP4693297B2 (ja) * | 2000-08-10 | 2011-06-01 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
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| US6510195B1 (en) * | 2001-07-18 | 2003-01-21 | Koninklijke Philips Electronics, N.V. | Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same |
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| WO2004061478A1 (en) * | 2003-01-06 | 2004-07-22 | Koninklijke Philips Electronics N.V. | Radiation detector with shielded electronics for computed tomography |
| JP4365108B2 (ja) * | 2003-01-08 | 2009-11-18 | 浜松ホトニクス株式会社 | 配線基板、及びそれを用いた放射線検出器 |
| JP4138529B2 (ja) * | 2003-02-24 | 2008-08-27 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
| JP4421209B2 (ja) * | 2003-04-11 | 2010-02-24 | 浜松ホトニクス株式会社 | 放射線検出器 |
-
2003
- 2003-01-08 JP JP2003002541A patent/JP4364514B2/ja not_active Expired - Fee Related
-
2004
- 2004-01-08 EP EP04700774A patent/EP1589582B1/en not_active Expired - Lifetime
- 2004-01-08 DE DE602004016956T patent/DE602004016956D1/de not_active Expired - Lifetime
- 2004-01-08 CN CN2004800020298A patent/CN100407432C/zh not_active Expired - Fee Related
- 2004-01-08 US US10/541,618 patent/US20060244153A1/en not_active Abandoned
- 2004-01-08 TW TW093100397A patent/TWI307556B/zh not_active IP Right Cessation
- 2004-01-08 KR KR1020057011684A patent/KR20050090133A/ko not_active Ceased
- 2004-01-08 WO PCT/JP2004/000079 patent/WO2004064163A1/ja not_active Ceased
-
2005
- 2005-07-07 IL IL169586A patent/IL169586A0/en not_active IP Right Cessation
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020038851A1 (en) * | 2000-08-10 | 2002-04-04 | Kenji Kajiwara | Large-area fiber plate, radiation image pickup apparatus utilizing the same and producing method therefor |
| JP2002359446A (ja) * | 2001-05-31 | 2002-12-13 | Hitachi Ltd | 配線基板およびその製造方法 |
| JP2003264280A (ja) * | 2002-03-08 | 2003-09-19 | Hamamatsu Photonics Kk | 検出器 |
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Also Published As
| Publication number | Publication date |
|---|---|
| TWI307556B (en) | 2009-03-11 |
| DE602004016956D1 (de) | 2008-11-20 |
| EP1589582B1 (en) | 2008-10-08 |
| JP4364514B2 (ja) | 2009-11-18 |
| TW200418195A (en) | 2004-09-16 |
| KR20050090133A (ko) | 2005-09-12 |
| EP1589582A4 (en) | 2007-02-14 |
| EP1589582A1 (en) | 2005-10-26 |
| JP2004265884A (ja) | 2004-09-24 |
| IL169586A0 (en) | 2007-07-04 |
| CN100407432C (zh) | 2008-07-30 |
| CN1723565A (zh) | 2006-01-18 |
| US20060244153A1 (en) | 2006-11-02 |
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