WO2004070329A3 - Kompakt-spektrometer - Google Patents

Kompakt-spektrometer Download PDF

Info

Publication number
WO2004070329A3
WO2004070329A3 PCT/EP2003/014588 EP0314588W WO2004070329A3 WO 2004070329 A3 WO2004070329 A3 WO 2004070329A3 EP 0314588 W EP0314588 W EP 0314588W WO 2004070329 A3 WO2004070329 A3 WO 2004070329A3
Authority
WO
WIPO (PCT)
Prior art keywords
spectrometer
elements
detector elements
entry slit
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2003/014588
Other languages
English (en)
French (fr)
Other versions
WO2004070329A2 (de
Inventor
Felix Kerstan
Ullrich Klarner
Nico Correns
Gregor Tumpach
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Carl Zeiss Jena GmbH
Original Assignee
VEB Carl Zeiss Jena GmbH
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH
Priority to EP03795935A priority Critical patent/EP1590640B1/de
Priority to JP2004567763A priority patent/JP4494980B2/ja
Priority to DE50309048T priority patent/DE50309048D1/de
Priority to US10/544,555 priority patent/US7369228B2/en
Publication of WO2004070329A2 publication Critical patent/WO2004070329A2/de
Publication of WO2004070329A3 publication Critical patent/WO2004070329A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

Die vorliegende Erfindung betrifft ein Spektrometer, bei dem die elektrischen und optischen Komponenten in einer kompakten Bauform mit einander verbunden sind. Durch eine geringe Anzahl von Einzelteilen wird ein minimaler Montage- und Justieraufwand erreicht. Das Kompakt-Spektrometer besteht aus einem Eintrittsspalt, einem abbildenden Gitter, ein oder mehreren zeilen­oder matrixförmig angeordneten Detektorelementen und Elementen einer Ansteuer- und Auswerteeinheit. Die Detektorelemente und der Eintrittsspalt befinden sich auf einem gemeinsamen Träger, auf dessen freien Flächen die Elemente der Ansteuer- und Auswerteeinheit angeordnet sind. Sowohl der Eintrittsspalt und die Detektorelemente, als auch das im Spektrometergehäuse eingelassene abbildende sphärische Gitter sind symmetrisch zu einer gedachten Mittelachse des Trägers angeordnet. Das erfinderische Spektrometer findet aufgrund seiner kompakten Baugrösse und des minimierten Justier- und Montageaufwandes zu dessen Fertigung, Anwendung von der Routineanalytik im Labor bis hin zu speziellen Aufgaben in der Prozess-Messtechnik und der Qualitätsüberwachung im Fertigungsprozess.
PCT/EP2003/014588 2003-02-04 2003-12-19 Kompakt-spektrometer Ceased WO2004070329A2 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP03795935A EP1590640B1 (de) 2003-02-04 2003-12-19 Kompakt-spektrometer
JP2004567763A JP4494980B2 (ja) 2003-02-04 2003-12-19 コンパクト型分光計
DE50309048T DE50309048D1 (de) 2003-02-04 2003-12-19 Kompakt-spektrometer
US10/544,555 US7369228B2 (en) 2003-02-04 2003-12-19 Compact spectrometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10304312.8 2003-02-04
DE10304312A DE10304312A1 (de) 2003-02-04 2003-02-04 Kompakt-Spektrometer

Publications (2)

Publication Number Publication Date
WO2004070329A2 WO2004070329A2 (de) 2004-08-19
WO2004070329A3 true WO2004070329A3 (de) 2004-10-14

Family

ID=32695164

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2003/014588 Ceased WO2004070329A2 (de) 2003-02-04 2003-12-19 Kompakt-spektrometer

Country Status (6)

Country Link
US (1) US7369228B2 (de)
EP (1) EP1590640B1 (de)
JP (1) JP4494980B2 (de)
AT (1) ATE384251T1 (de)
DE (2) DE10304312A1 (de)
WO (1) WO2004070329A2 (de)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4409860B2 (ja) * 2003-05-28 2010-02-03 浜松ホトニクス株式会社 光検出器を用いた分光器
US7321428B2 (en) * 2004-12-22 2008-01-22 Bayer Materialscience Llc Process photometer
US7330258B2 (en) * 2005-05-27 2008-02-12 Innovative Technical Solutions, Inc. Spectrometer designs
US7609963B2 (en) * 2005-07-12 2009-10-27 Roger Wayne Brown Apparatus to produce spectrums
US7697137B2 (en) * 2006-04-28 2010-04-13 Corning Incorporated Monolithic Offner spectrometer
EP2063238B1 (de) * 2007-06-08 2018-08-22 Hamamatsu Photonics K.K. Spektroskop
JP4887221B2 (ja) * 2007-06-08 2012-02-29 浜松ホトニクス株式会社 分光モジュール
WO2008149940A1 (ja) * 2007-06-08 2008-12-11 Hamamatsu Photonics K.K. 分光モジュール
JP4891841B2 (ja) 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
JP4891840B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
US8068223B2 (en) * 2007-06-08 2011-11-29 Hamamatsu Photonics K.K. Spectroscopic module
US8049887B2 (en) * 2007-06-08 2011-11-01 Hamamatsu Photonics K.K. Spectroscopic module
DE102007045668A1 (de) 2007-09-25 2009-04-02 Binder-Kontakte Gmbh Spektrometer mit Eintrittsspalt und die Herstellung des Eintrittsspaltes
US7817274B2 (en) 2007-10-05 2010-10-19 Jingyun Zhang Compact spectrometer
WO2009070459A1 (en) 2007-11-30 2009-06-04 Jingyun Zhang Miniature spectrometers working with cellular phones and other portable electronic devices
JP5111163B2 (ja) * 2008-03-04 2012-12-26 浜松ホトニクス株式会社 分光器
JP5205239B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器
JP5205242B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器の製造方法
JP5207938B2 (ja) 2008-05-15 2013-06-12 浜松ホトニクス株式会社 分光モジュール及び分光モジュールの製造方法
JP5205241B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP2010256670A (ja) * 2009-04-27 2010-11-11 Konica Minolta Sensing Inc 回折格子およびそれを用いる分光ユニット、分光計ならびに回折格子の作成方法
US10026030B2 (en) * 2012-01-13 2018-07-17 Empire Technology Development Llc Simple diffraction gratings for product identification
JP6068039B2 (ja) 2012-08-06 2017-01-25 浜松ホトニクス株式会社 分光器
DE102013209104A1 (de) 2013-05-16 2014-11-20 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur spektroskopischen Analyse
EP2857810A1 (de) * 2013-10-02 2015-04-08 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Monolithisches Spektrometer
JP6251073B2 (ja) * 2014-02-05 2017-12-20 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
JP6180954B2 (ja) 2014-02-05 2017-08-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
US9933411B2 (en) 2016-02-04 2018-04-03 Nova Biomedical Corporation Analyte system and method for determining hemoglobin parameters in whole blood
US10151630B2 (en) 2016-02-04 2018-12-11 Nova Biomedical Corporation Analyte system and method for determining hemoglobin parameters in whole blood
US10088468B2 (en) 2016-02-04 2018-10-02 Nova Biomedical Corporation Analyte system and method for determining hemoglobin parameters in whole blood
US10088360B2 (en) * 2016-02-04 2018-10-02 Nova Biomedical Corporation Spectroscopic analyte system and method for determining hemoglobin parameters in whole blood
JP6104451B1 (ja) * 2016-12-22 2017-03-29 浜松ホトニクス株式会社 分光器
JP6328303B2 (ja) * 2017-07-19 2018-05-23 浜松ホトニクス株式会社 分光器
DE102020118822B4 (de) 2020-07-16 2022-05-12 Carl Zeiss Jena Gmbh Spektrometer mit einer Trägerplatte und mit einem Gehäuse

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5953118A (en) * 1996-10-04 1999-09-14 Equitech Int'l Corporation Multiplexed spectrophotometry system
US5995221A (en) * 1997-02-28 1999-11-30 Instruments S.A., Inc. Modified concentric spectrograph
EP1041372A1 (de) * 1999-04-01 2000-10-04 Gretag-Macbeth AG Spektrometer

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3211868A1 (de) * 1982-03-31 1983-05-26 Fa. Carl Zeiss, 7920 Heidenheim Chassis fuer optische geraete
DE3509131A1 (de) * 1985-03-14 1986-09-18 Fa. Carl Zeiss, 7920 Heidenheim Verfahren zur justierten montage der optischen bauteile eines optischen geraetes
US5026160A (en) * 1989-10-04 1991-06-25 The United States Of America As Represented By The Secretary Of The Navy Monolithic optical programmable spectrograph (MOPS)
DE4038638A1 (de) * 1990-12-04 1992-06-11 Zeiss Carl Fa Diodenzeilen-spektrometer
GB9416223D0 (en) * 1994-08-11 1994-10-05 Ridyard Andrew W Radiation detector
DE19504834C1 (de) * 1995-02-14 1996-06-13 Hewlett Packard Gmbh Diodenzeilen-Spektralphotometer
DE19504835C1 (de) * 1995-02-14 1996-03-21 Hewlett Packard Gmbh Diodenzeilen-Spektralphotometer
DE19609916A1 (de) * 1996-03-14 1997-09-18 Robert Prof Dr Ing Massen Preisgünstiger spektroskopischer Sensor für die Erkennung von Kunststoffen
EP0942267B1 (de) * 1998-03-11 2006-08-30 Gretag-Macbeth AG Spektrometer
US6181418B1 (en) * 1998-03-12 2001-01-30 Gretag Macbeth Llc Concentric spectrometer
DE19835595A1 (de) 1998-08-06 2000-02-10 Basf Ag Verfahren zur Herstellung von hochreinem LiBF¶4¶
DE19836595B4 (de) * 1998-08-13 2005-12-15 Jeti Technische Instrumente Gmbh Anordnung zur Messung von optischen Spektren
DE29906678U1 (de) * 1999-04-15 1999-07-29 Carl Zeiss Jena Gmbh, 07745 Jena Spektrometer
JP4372314B2 (ja) * 2000-06-21 2009-11-25 大塚電子株式会社 スペクトル測定装置
WO2002004901A1 (en) * 2000-07-11 2002-01-17 Adc Telecommunications, Inc. Monitoring apparatus for optical transmission systems
JP4409860B2 (ja) * 2003-05-28 2010-02-03 浜松ホトニクス株式会社 光検出器を用いた分光器
US7202949B2 (en) * 2003-09-30 2007-04-10 The Trustees Of Boston University Binocular spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5953118A (en) * 1996-10-04 1999-09-14 Equitech Int'l Corporation Multiplexed spectrophotometry system
US5995221A (en) * 1997-02-28 1999-11-30 Instruments S.A., Inc. Modified concentric spectrograph
EP1041372A1 (de) * 1999-04-01 2000-10-04 Gretag-Macbeth AG Spektrometer

Also Published As

Publication number Publication date
US7369228B2 (en) 2008-05-06
DE10304312A1 (de) 2004-08-12
JP4494980B2 (ja) 2010-06-30
JP2006514277A (ja) 2006-04-27
ATE384251T1 (de) 2008-02-15
EP1590640B1 (de) 2008-01-16
WO2004070329A2 (de) 2004-08-19
DE50309048D1 (de) 2008-03-06
US20060139636A1 (en) 2006-06-29
EP1590640A2 (de) 2005-11-02

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