WO2004079299A3 - Procede et systeme pour mesurer un debit d’absorption specifique das - Google Patents

Procede et systeme pour mesurer un debit d’absorption specifique das Download PDF

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Publication number
WO2004079299A3
WO2004079299A3 PCT/FR2004/000409 FR2004000409W WO2004079299A3 WO 2004079299 A3 WO2004079299 A3 WO 2004079299A3 FR 2004000409 W FR2004000409 W FR 2004000409W WO 2004079299 A3 WO2004079299 A3 WO 2004079299A3
Authority
WO
WIPO (PCT)
Prior art keywords
sar
measuring
phantom
field
absorption rate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR2004/000409
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English (en)
Other versions
WO2004079299A2 (fr
Inventor
Olivier Merckel
Jean-Charles Bolomey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ecole Superieure dElectricite SUPELEC
Original Assignee
Ecole Superieure dElectricite SUPELEC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ecole Superieure dElectricite SUPELEC filed Critical Ecole Superieure dElectricite SUPELEC
Priority to DE602004006840T priority Critical patent/DE602004006840D1/de
Priority to EP04713926A priority patent/EP1597601B1/fr
Publication of WO2004079299A2 publication Critical patent/WO2004079299A2/fr
Publication of WO2004079299A3 publication Critical patent/WO2004079299A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0857—Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)

Abstract

L'invention concerne un procédé pour mesurer très rapidement un Débit d'Absorption Spécifique DAS (SAR) dans un fantôme rempli d'un liquide reconstituant les propriétés diélectriques d'un tissu biologique, ce fantôme étant exposé à une émission micro-onde provenant d'une antenne; ce procédé est caractérisé en ce que : on mesure le champ électrique en amplitude et en phase à l'intérieur du fantôme, pour une pluralité de points s'inscrivant sur une surface donnée définie dans une zone de champ proche de concentration dudit champ électrique; on réalise une transformation champ proche-champ proche à partir des données mesurées sur cette surface de façon à déterminer le champ électrique dans le volume à l'intérieur du fantôme; et on calcule la valeur du DAS.
PCT/FR2004/000409 2003-02-27 2004-02-24 Procede et systeme pour mesurer un debit d’absorption specifique das Ceased WO2004079299A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE602004006840T DE602004006840D1 (de) 2003-02-27 2004-02-24 Methode und system zur messung der spezifischen absorbtionsrate
EP04713926A EP1597601B1 (fr) 2003-02-27 2004-02-24 Procede et systeme pour mesurer un debit d'absorption specifique (das)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0302441A FR2851823B1 (fr) 2003-02-27 2003-02-27 Procede et systeme pour mesurer un debit d'absorption specifique das
FR03/02441 2003-02-27

Publications (2)

Publication Number Publication Date
WO2004079299A2 WO2004079299A2 (fr) 2004-09-16
WO2004079299A3 true WO2004079299A3 (fr) 2005-01-20

Family

ID=32843052

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2004/000409 Ceased WO2004079299A2 (fr) 2003-02-27 2004-02-24 Procede et systeme pour mesurer un debit d’absorption specifique das

Country Status (5)

Country Link
EP (1) EP1597601B1 (fr)
AT (1) ATE364181T1 (fr)
DE (1) DE602004006840D1 (fr)
FR (1) FR2851823B1 (fr)
WO (1) WO2004079299A2 (fr)

Cited By (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7321233B2 (en) 1995-04-14 2008-01-22 Cascade Microtech, Inc. System for evaluating probing networks
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7550984B2 (en) 2002-11-08 2009-06-23 Cascade Microtech, Inc. Probe station with low noise characteristics
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100365420C (zh) * 2003-02-26 2008-01-30 松下电器产业株式会社 无线电通信装置用比吸收率测定装置
JP5554463B2 (ja) * 2004-07-05 2014-07-23 株式会社Ｎｔｔドコモ 比吸収率測定装置
FR2954829B1 (fr) 2009-12-31 2012-03-02 Art Fi Systeme pour mesurer un champ electromagnetique
EP2610628B1 (fr) * 2011-12-30 2018-05-16 Art-Fi Mesure d'un champ électromagnétique
FR3039282B1 (fr) 2015-07-24 2020-12-25 Univ Rennes Dispositif pour la dosimetrie electromagnetique et methode associee

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1070966A1 (fr) * 1999-07-22 2001-01-24 Siemens Aktiengesellschaft Procédé et appareil pour déterminer l'intensité du champ électrique agissant sur un modèle anatomique
WO2001086311A1 (fr) * 2000-05-05 2001-11-15 Integra Antennas Ltd Ensemble tete fantome et procede pour mesurer l'incidence d'ondes electromagnetiques au moyen de cette tete fantome
US6525657B1 (en) * 2000-04-25 2003-02-25 Aprel, Inc. Apparatus and method for production testing of the RF performance of wireless communications devices

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912554A (en) * 1995-10-30 1999-06-15 Matsushita Electric Industrial Co., Ltd. Electromagnetic radiation measuring apparatus for high frequency analysis of radiation produced by a circuit board
JP2790103B2 (ja) * 1995-12-15 1998-08-27 日本電気株式会社 比吸収率測定装置及び比吸収率測定方法
JP3147100B2 (ja) * 1998-09-18 2001-03-19 日本電気株式会社 Ｓａｒ測定センサ及びｓａｒ測定装置
FR2797327B1 (fr) * 1999-08-03 2001-11-09 France Telecom Procede et dispositif de mesure en champ proche de rayonnements radioelectriques non controles

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1070966A1 (fr) * 1999-07-22 2001-01-24 Siemens Aktiengesellschaft Procédé et appareil pour déterminer l'intensité du champ électrique agissant sur un modèle anatomique
US6525657B1 (en) * 2000-04-25 2003-02-25 Aprel, Inc. Apparatus and method for production testing of the RF performance of wireless communications devices
WO2001086311A1 (fr) * 2000-05-05 2001-11-15 Integra Antennas Ltd Ensemble tete fantome et procede pour mesurer l'incidence d'ondes electromagnetiques au moyen de cette tete fantome

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
A. LAISNE, R. GILLARD, G. PITON: "Une Transformée Champ Proche - Champ Proche Multirésolution pour la MR / FDTD", 12ÈME JOURNÉES NATIONALES MICROONDES, 18 May 2001 (2001-05-18), POITIERS, XP002301520 *

Cited By (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7321233B2 (en) 1995-04-14 2008-01-22 Cascade Microtech, Inc. System for evaluating probing networks
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7492175B2 (en) 2001-08-21 2009-02-17 Cascade Microtech, Inc. Membrane probing system
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7550984B2 (en) 2002-11-08 2009-06-23 Cascade Microtech, Inc. Probe station with low noise characteristics
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7514944B2 (en) 2004-07-07 2009-04-07 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals

Also Published As

Publication number Publication date
ATE364181T1 (de) 2007-06-15
DE602004006840D1 (de) 2007-07-19
FR2851823B1 (fr) 2005-09-02
EP1597601A2 (fr) 2005-11-23
FR2851823A1 (fr) 2004-09-03
WO2004079299A2 (fr) 2004-09-16
EP1597601B1 (fr) 2007-06-06

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