WO2004097363A2 - Lecksuchgerät - Google Patents
Lecksuchgerät Download PDFInfo
- Publication number
- WO2004097363A2 WO2004097363A2 PCT/EP2004/003789 EP2004003789W WO2004097363A2 WO 2004097363 A2 WO2004097363 A2 WO 2004097363A2 EP 2004003789 W EP2004003789 W EP 2004003789W WO 2004097363 A2 WO2004097363 A2 WO 2004097363A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- vacuum pump
- high vacuum
- valve
- inlet
- pump
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
Definitions
- the invention relates to a leak detector on the countercurrent principle, with a first high vacuum pump, the inlet side of which is connected to the inlet of the leak detector, a second high vacuum pump, the inlet side of which is connected to an ace spectrometer, a fore vacuum pump, the inlet side of which is connected to the outlet sides of the two high vacuum pumps and a bypass line connecting the inlet of the leak detector to the backing pump and containing a first valve.
- a leak detector of this type is described in EP 0 283 543 AI. It is used to detect leaks in a vacuum-tight device. For this purpose, a light test gas is introduced into the device under test and this device is placed in a vacuum sealed space from which the existing gas is extracted. Alternatively, test gas can be sprayed from the outside onto a test object, the internal volume of which is connected to the inlet of the leak detector. In the extracted gas, components of the test gas can be recognized and evaluated with a mass spectrometer. If there are test gas components, a leak in the device is concluded.
- the leak detector according to the countercurrent principle has a fore-vacuum pump and a first high-vacuum pump, which are operated in series.
- a second high vacuum pump connects the mass spectrometer to the inlet side of the forevacuum pump.
- the path via the first high-vacuum pump is blocked by closing a valve upstream of this pump, and the container containing the test object is emptied by a bypass line which contains a valve.
- a throttle valve in the line leading to the first high vacuum pump is opened so that test gas can flow through the first high vacuum pump. If test gas (helium) penetrates the line system, it flows into the second high-vacuum pump in countercurrent and through it into the mass spectrometer.
- the invention has for its object to provide a leak detector according to the countercurrent principle, which has an increased suction capacity for helium at the inlet and thus has short response times, so that the leak detection is shortened.
- the first high-vacuum pump is connected directly and without a valve to the inlet of the leak detector.
- a second valve - apart from the first valve contained in the bypass line - is provided between the outlet side of the first high-vacuum pump and the fore-vacuum pump.
- the invention provides a number of advantages. There is no valve before the inlet of the first high vacuum pump. Consequently, this pump stops at the beginning of a pump cycle and is started either simultaneously with the opening of the first valve contained in the bypass line or somewhat later when the pressure has already dropped.
- the full suction capacity of the first high vacuum pump is available unrestricted as soon as the pressure falls below the maximum suction pressure of this pump.
- full helium suction is available to achieve minimal response times. The detection sensitivity is not affected, since it is independent of the pumping speed and the inlet pressure of the first high vacuum pump.
- the helium leak gas flow is always the same as the current emerging from the leak. •
- the second valve There are two operating modes with the second valve mentioned.
- the first mode of operation the first and the second valve are opened simultaneously with the start of the first high vacuum pump.
- the first high vacuum pump and the bypass line running parallel to it result in a maximum pumping speed of the forevacuum pump, with the result that the pumping time is minimal.
- the second operating mode the second valve initially remains closed until the pressure has left the viscous flow area, which is the case at approximately 0.1 to 1 mbar. Only then is the first high vacuum pump started and the second valve opened at the same time.
- This operating mode offers optimal protection against dirt from the test object, since it is pumped through the bypass line and does not get into the first high-vacuum pump.
- the first high vacuum pump is preferably arranged in a horizontal mode of operation so that no particles can fall straight into its inlet side. If the backing pump is an oil-sealed pump, for example a rotary vane pump, the test connection is optimally protected against backflow of oil in the end pressure range.
- An exemplary embodiment of the invention is explained in more detail below with reference to the single figure of the drawing.
- test specimen 10 to be tested for leaks is filled with a test gas, generally helium, and inserted into a vacuum-tight test chamber 11.
- a vacuum is generated in the test chamber 11 by suction and the gas leaving the test chamber is examined for helium components.
- a high vacuum pump is a molecular pump in the context of the present description and the claims.
- a molecular pump exerts impulses on gas molecules and accelerates them. The molecular pump therefore only works at • low pressures, with the outlet pressure on the pressure side being only a few mbar.
- a typical high vacuum pump is a turbomolecular pump that has numerous stator disks and rotor disks, the rotor disks rotating at a high speed.
- a molecular pump produces high compression for heavy molecules only, but low compression for light molecules.
- a molecular pump has a different pumping speed for each gas.
- the pumping speed is particularly low for the light gas helium.
- the outlet side 17 of the high-vacuum pump 16 is connected to the inlet side 19 of a forevacuum pump 20 via a valve 18 to be explained.
- the outlet side 21 of the forevacuum pump leads into the atmosphere.
- the fore-vacuum pump 20 is, for example, a displacement pump that generates the low pressure required for the operation of the high-vacuum pump 16.
- a second high-vacuum pump 22 is connected to its inlet side 23 with a mass spectrometer 24, which 'is suitable for the detection of the test gas helium.
- the outlet side 25 of the second high-vacuum pump 22 is connected to the inlet side of the fore-vacuum pump 20 via a valve 26.
- the test gas is a light gas, which passes through the high vacuum pump 22 in counterflow, that is, counter to the direction of conveyance, and reaches the mass spectrometer 24.
- the leak detector also has a bypass line 30, which connects the inlet 13 to the inlet side 19 of the forevacuum pump 20 and contains a first valve 31, so that it can optionally be opened and blocked.
- a controller 32 controls the first valve 31 and the second valve 18 connected to the outlet side 17 of the high vacuum pump 16 as a function of the pressure at the inlet 13, which is measured by a pressure measuring device 33.
- the inlet 13 is also connected to the atmosphere via a ventilation valve 34.
- the inlet side 19 of the forevacuum pump 20 is connected to the atmosphere via a ventilation valve 35.
- the pressure on the outlet side 25 of the second high vacuum pump 22 is measured by a pressure measuring device 36.
- Another pressure measuring device 37 is connected to the outlet side 17 of the first high-vacuum pump 16. Depending on the measured pressure, the valve 26 is opened when the pressure falls below a predetermined value.
- the essential feature of the invention is that the line 40, which connects the inlet 13 to the inlet side 15 of the first high-vacuum pump 16, is completely unthrottled and contains neither a throttle point nor a valve.
- the full suction capacity of the high vacuum pump 16 is thus available at the inlet 13 as soon as the pressure has fallen below the maximum suction pressure of the high vacuum pump. This ensures the shortest response times for the test gas helium.
- the line branch which contains the first high-vacuum pump 16, is shut off by the second valve 18.
- valves 31 and 18 are opened simultaneously with the start of the high vacuum pump 16. This results in a minimum pump-down time due to a maximum pumping speed of the fore-vacuum pump 20, both through the high-vacuum pump 16 and through the bypass line 30.
- the valve 18 In the second mode of operation, the valve 18 initially remains closed until the pressure at the inlet 13 has dropped below a limit value of approximately 0.1 to 1 mbar, which represents the limit of the viscous flow area. Only when the signal from the pressure measuring device 33 indicates that the limit value has been undershot is the high vacuum pump 16 started and at the same time the second valve 18 opened. In this mode of operation, the high vacuum pump 16 is protected from dirt from the test specimen during the pumping off of gas, since the gas is only passed through the bypass line 30.
- the second high vacuum pump 22 has two intermediate inlets 41 and 42, each of which is connected to the outlet side 17 of the first high vacuum pump 16 via a switchable valve 43 or 44.
- the measuring range can be changed by switching these valves'. Examples of pressures at characteristic locations of the high vacuum pump 22 are given below:
- Outlet side 25 15 mbar intermediate inlet 42: 1 mbar
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE502004003887T DE502004003887D1 (de) | 2003-05-02 | 2004-04-08 | Lecksuchgerät |
| EP04726475A EP1620706B1 (de) | 2003-05-02 | 2004-04-08 | Lecksuchgerät |
| US10/553,457 US7717681B2 (en) | 2003-05-02 | 2004-04-08 | Leak detector comprising a vacuum apparatus |
| JP2006505077A JP4357528B2 (ja) | 2003-05-02 | 2004-04-08 | リークディテクタ |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10319633.1 | 2003-05-02 | ||
| DE10319633A DE10319633A1 (de) | 2003-05-02 | 2003-05-02 | Lecksuchgerät |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2004097363A2 true WO2004097363A2 (de) | 2004-11-11 |
| WO2004097363A3 WO2004097363A3 (de) | 2005-05-19 |
Family
ID=33305104
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2004/003789 Ceased WO2004097363A2 (de) | 2003-05-02 | 2004-04-08 | Lecksuchgerät |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7717681B2 (de) |
| EP (1) | EP1620706B1 (de) |
| JP (1) | JP4357528B2 (de) |
| CN (1) | CN100533091C (de) |
| DE (2) | DE10319633A1 (de) |
| WO (1) | WO2004097363A2 (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2910964A1 (fr) * | 2007-01-03 | 2008-07-04 | Alcatel Lucent Sa | Dispositif et procede de detection rapide de fuites. |
| WO2023247132A1 (de) * | 2022-06-22 | 2023-12-28 | Inficon Gmbh | Verfahren zur messung der umgebungskonzentration eines leichten gases mit einer massenspektrometrischen gegenstrom-lecksuchvorrichtung |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008061807A1 (de) | 2008-12-11 | 2010-06-17 | Inficon Gmbh | Verfahren zur Dichtheitsprüfung eines Stacks von Brennstoffzellen |
| ES2818976T3 (es) * | 2009-12-24 | 2021-04-14 | Sumitomo Seika Chemicals | Dispositivo de supresión de vibraciones del gas de escape en un aparato con doble bomba de vacío |
| EP2572109B1 (de) * | 2010-05-21 | 2020-09-02 | Exxonmobil Upstream Research Company | Parallele dynamische kompressorvorrichtung und entsprechendes verfahren |
| DE102010033373A1 (de) * | 2010-08-04 | 2012-02-09 | Inficon Gmbh | Lecksuchgerät |
| DE102010048982B4 (de) | 2010-09-03 | 2022-06-09 | Inficon Gmbh | Lecksuchgerät |
| FR2969287B1 (fr) * | 2010-12-17 | 2013-10-25 | Alcatel Lucent | Dispositif de detection de fuite utilisant l'hydrogene comme gaz traceur |
| DE102013218506A1 (de) * | 2013-09-16 | 2015-03-19 | Inficon Gmbh | Schnüffellecksucher mit mehrstufiger Membranpumpe |
| DE102014223841A1 (de) | 2014-11-21 | 2016-05-25 | Inficon Gmbh | Vorrichtung und Verfahren zur Gegenstrom-Leckdetektion |
| DE102016210701A1 (de) | 2016-06-15 | 2017-12-21 | Inficon Gmbh | Massenspektrometrischer Lecksucher mit Turbomolekularpumpe und Boosterpumpe auf gemeinsamer Welle |
| FR3070489B1 (fr) * | 2017-08-29 | 2020-10-23 | Pfeiffer Vacuum | Detecteur de fuites et procede de detection de fuites pour le controle de l'etancheite d'objets a tester |
| FR3072774B1 (fr) * | 2017-10-19 | 2019-11-15 | Pfeiffer Vacuum | Detecteur de fuites pour le controle de l'etancheite d'un objet a tester |
| CN109390204B (zh) * | 2018-12-10 | 2024-03-12 | 合肥中科离子医学技术装备有限公司 | 一种大量程可调节移动式真空质谱测量设备 |
| DE102020132896A1 (de) | 2020-12-10 | 2022-06-15 | Inficon Gmbh | Vorrichtung zur massenspektrometrischen Leckdetektion mit dreistufiger Turbomolekularpumpe und Boosterpumpe |
| DE102020134370A1 (de) * | 2020-12-21 | 2022-06-23 | Inficon Gmbh | Gaslecksuchvorrichtung und Gaslecksuchverfahren zur Erkennung eines Gaslecks in einem Prüfling |
| DE102021119256A1 (de) * | 2021-07-26 | 2023-01-26 | Inficon Gmbh | Leckdetektoren |
| CN114411110B (zh) * | 2022-01-24 | 2023-04-14 | 苏州中科科仪技术发展有限公司 | 镀膜设备和镀膜设备的控制方法 |
| DE102023129743A1 (de) * | 2023-10-27 | 2025-04-30 | Inficon Gmbh | Vorrichtung und Verfahren zur massenspektrometrischen Hochvakuumlecksuche |
| CN117928845A (zh) * | 2023-12-12 | 2024-04-26 | 北京中科科仪股份有限公司 | 一种适于高效除氦的氦质谱检漏仪及其检漏方法 |
| CN118010261B (zh) * | 2023-12-27 | 2026-02-10 | 北京中科科仪股份有限公司 | 一种氦质谱检漏仪以及喷氦检漏方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1648648C3 (de) * | 1967-04-12 | 1980-01-24 | Arthur Pfeiffer-Hochvakuumtechnik Gmbh, 6330 Wetzlar | Anordnung zur Lecksuche nach dem Massenspektrometer-Prinzip |
| DE2430314C3 (de) * | 1974-06-24 | 1982-11-25 | Siemens AG, 1000 Berlin und 8000 München | Flüssigkeitsring-Vakuumpumpe mit vorgeschaltetem Verdichter |
| US4505647A (en) * | 1978-01-26 | 1985-03-19 | Grumman Allied Industries, Inc. | Vacuum pumping system |
| EP0283543B1 (de) * | 1987-03-27 | 1991-12-11 | Leybold Aktiengesellschaft | Lecksuchgerät und Betriebsverfahren dazu |
| EP0344345B1 (de) * | 1988-06-01 | 1991-09-18 | Leybold Aktiengesellschaft | Pumpsystem für ein Lecksuchgerät |
| DE4140366A1 (de) * | 1991-12-07 | 1993-06-09 | Leybold Ag, 6450 Hanau, De | Lecksucher fuer vakuumanlagen sowie verfahren zur durchfuehrung der lecksuche an vakuumanlagen |
| DE4228313A1 (de) * | 1992-08-26 | 1994-03-03 | Leybold Ag | Gegenstrom-Lecksucher mit Hochvakuumpumpe |
| DE19504278A1 (de) * | 1995-02-09 | 1996-08-14 | Leybold Ag | Testgas-Lecksuchgerät |
| DE19522466A1 (de) * | 1995-06-21 | 1997-01-02 | Leybold Ag | Lecksuchgerät mit Vorvakuumpumpe |
| US5703281A (en) * | 1996-05-08 | 1997-12-30 | Southeastern Univ. Research Assn. | Ultra high vacuum pumping system and high sensitivity helium leak detector |
| DE19638506A1 (de) * | 1996-09-20 | 1998-03-26 | Leybold Vakuum Gmbh | Verfahren zur Untersuchung einer Mehrzahl ähnlicher Prüflinge auf Lecks sowie für die Durchführung dieses Verfahrens geeigneter Lecksucher |
| US5944049A (en) * | 1997-07-15 | 1999-08-31 | Applied Materials, Inc. | Apparatus and method for regulating a pressure in a chamber |
| DE19735250A1 (de) * | 1997-08-14 | 1999-02-18 | Leybold Vakuum Gmbh | Verfahren zum Betrieb eines Heliumlecksuchers und für die Durchführung dieses Verfahrens geeigneter Heliumlecksucher |
-
2003
- 2003-05-02 DE DE10319633A patent/DE10319633A1/de not_active Withdrawn
-
2004
- 2004-04-08 CN CNB2004800106301A patent/CN100533091C/zh not_active Expired - Lifetime
- 2004-04-08 DE DE502004003887T patent/DE502004003887D1/de not_active Expired - Lifetime
- 2004-04-08 US US10/553,457 patent/US7717681B2/en not_active Expired - Lifetime
- 2004-04-08 JP JP2006505077A patent/JP4357528B2/ja not_active Expired - Fee Related
- 2004-04-08 EP EP04726475A patent/EP1620706B1/de not_active Expired - Lifetime
- 2004-04-08 WO PCT/EP2004/003789 patent/WO2004097363A2/de not_active Ceased
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2910964A1 (fr) * | 2007-01-03 | 2008-07-04 | Alcatel Lucent Sa | Dispositif et procede de detection rapide de fuites. |
| EP1942327A1 (de) * | 2007-01-03 | 2008-07-09 | Alcatel Lucent | Vorrichtung und Verfahren zur Schnellerkennung von Leckagen |
| WO2023247132A1 (de) * | 2022-06-22 | 2023-12-28 | Inficon Gmbh | Verfahren zur messung der umgebungskonzentration eines leichten gases mit einer massenspektrometrischen gegenstrom-lecksuchvorrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006525498A (ja) | 2006-11-09 |
| EP1620706B1 (de) | 2007-05-23 |
| CN100533091C (zh) | 2009-08-26 |
| DE10319633A1 (de) | 2004-11-18 |
| JP4357528B2 (ja) | 2009-11-04 |
| US7717681B2 (en) | 2010-05-18 |
| CN1777797A (zh) | 2006-05-24 |
| US20060280615A1 (en) | 2006-12-14 |
| DE502004003887D1 (de) | 2007-07-05 |
| EP1620706A2 (de) | 2006-02-01 |
| WO2004097363A3 (de) | 2005-05-19 |
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