WO2007079269A3 - Atomic force microscope tip arrays and methods of manufacturing same - Google Patents

Atomic force microscope tip arrays and methods of manufacturing same Download PDF

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Publication number
WO2007079269A3
WO2007079269A3 PCT/US2006/049701 US2006049701W WO2007079269A3 WO 2007079269 A3 WO2007079269 A3 WO 2007079269A3 US 2006049701 W US2006049701 W US 2006049701W WO 2007079269 A3 WO2007079269 A3 WO 2007079269A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
atomic force
force microscope
manufacturing same
microscope tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/049701
Other languages
French (fr)
Other versions
WO2007079269A2 (en
Inventor
Brian Ruby
Randen Patterson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CARBON NANOPROBES Inc
Original Assignee
CARBON NANOPROBES Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CARBON NANOPROBES Inc filed Critical CARBON NANOPROBES Inc
Priority to EP06848402A priority Critical patent/EP2013609A2/en
Publication of WO2007079269A2 publication Critical patent/WO2007079269A2/en
Publication of WO2007079269A3 publication Critical patent/WO2007079269A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06—Probe tip arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Inorganic Fibers (AREA)

Abstract

The present invention provides methods and apparatus for forming an array of multiple nanotube tips that can be utilized with AFM technology. The multiprobe tips may be independently modified or specifically left unmodified. Software can generate a composite image of data collected from two or more of the independently modified and unmodified tips.
PCT/US2006/049701 2005-12-31 2006-12-30 Atomic force microscope tip arrays and methods of manufacturing same Ceased WO2007079269A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP06848402A EP2013609A2 (en) 2005-12-31 2006-12-30 Atomic force microscope tip arrays and methods of manufacturing same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US75549505P 2005-12-31 2005-12-31
US60/755,495 2005-12-31

Publications (2)

Publication Number Publication Date
WO2007079269A2 WO2007079269A2 (en) 2007-07-12
WO2007079269A3 true WO2007079269A3 (en) 2008-06-05

Family

ID=38228896

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/049701 Ceased WO2007079269A2 (en) 2005-12-31 2006-12-30 Atomic force microscope tip arrays and methods of manufacturing same

Country Status (3)

Country Link
US (1) US7775088B2 (en)
EP (1) EP2013609A2 (en)
WO (1) WO2007079269A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8495760B2 (en) * 2010-11-30 2013-07-23 The Board Of Trustees Of The Leland Stanford Junior University Atomic force microscope manipulation of living cells
WO2013181506A1 (en) 2012-05-31 2013-12-05 The University Of North Carolina At Chapel Hill Dissolution guided wetting of structured surfaces
WO2017079374A1 (en) 2015-11-03 2017-05-11 Board Of Regents, The University Of Texas System Metrology devices for rapid specimen setup
BR102021017175A2 (en) * 2021-08-30 2023-03-14 Camillo De Vasconcellos Machado NANO CHECK VALVES AND CONSTRUCTION METHODS

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
US5619139A (en) * 1995-02-10 1997-04-08 Bruker Analytische Messtechnik Gmbh Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof
US5874668A (en) * 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
US5939709A (en) * 1997-06-19 1999-08-17 Ghislain; Lucien P. Scanning probe optical microscope using a solid immersion lens
US5992226A (en) * 1998-05-08 1999-11-30 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for measuring intermolecular interactions by atomic force microscopy
US6159742A (en) * 1998-06-05 2000-12-12 President And Fellows Of Harvard College Nanometer-scale microscopy probes
US20050081608A1 (en) * 2003-10-17 2005-04-21 National Institutes Of Health System and method for the analysis of atomic force microscopy data

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4916002A (en) * 1989-01-13 1990-04-10 The Board Of Trustees Of The Leland Jr. University Microcasting of microminiature tips
US5372930A (en) * 1992-09-16 1994-12-13 The United States Of America As Represented By The Secretary Of The Navy Sensor for ultra-low concentration molecular recognition
US7281419B2 (en) * 2005-09-21 2007-10-16 The Board Of Trustees Of The University Of Illinois Multifunctional probe array system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
US5619139A (en) * 1995-02-10 1997-04-08 Bruker Analytische Messtechnik Gmbh Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof
US5874668A (en) * 1995-10-24 1999-02-23 Arch Development Corporation Atomic force microscope for biological specimens
US5939709A (en) * 1997-06-19 1999-08-17 Ghislain; Lucien P. Scanning probe optical microscope using a solid immersion lens
US5992226A (en) * 1998-05-08 1999-11-30 The United States Of America As Represented By The Secretary Of The Navy Apparatus and method for measuring intermolecular interactions by atomic force microscopy
US6159742A (en) * 1998-06-05 2000-12-12 President And Fellows Of Harvard College Nanometer-scale microscopy probes
US20050081608A1 (en) * 2003-10-17 2005-04-21 National Institutes Of Health System and method for the analysis of atomic force microscopy data

Also Published As

Publication number Publication date
US7775088B2 (en) 2010-08-17
EP2013609A2 (en) 2009-01-14
WO2007079269A2 (en) 2007-07-12
US20070261480A1 (en) 2007-11-15

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