WO2007142175A1 - 接合方法 - Google Patents
接合方法 Download PDFInfo
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- WO2007142175A1 WO2007142175A1 PCT/JP2007/061266 JP2007061266W WO2007142175A1 WO 2007142175 A1 WO2007142175 A1 WO 2007142175A1 JP 2007061266 W JP2007061266 W JP 2007061266W WO 2007142175 A1 WO2007142175 A1 WO 2007142175A1
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- WIPO (PCT)
- Prior art keywords
- joining
- powder
- metal
- bonding
- metal powder
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- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01223—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in liquid form, e.g. by dispensing droplets or by screen printing
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- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01231—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition
- H10W72/01233—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition in liquid form, e.g. spin coating, spray coating or immersion coating
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- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01261—Chemical or physical modification, e.g. by sintering or anodisation
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- H10W72/013—Manufacture or treatment of die-attach connectors
- H10W72/01365—Thermally treating
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- H10W72/0711—Apparatus therefor
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- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07232—Compression bonding, e.g. thermocompression bonding
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- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07232—Compression bonding, e.g. thermocompression bonding
- H10W72/07233—Ultrasonic bonding, e.g. thermosonic bonding
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- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07311—Treating the bonding area before connecting, e.g. by applying flux or cleaning
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- H10W72/07331—Connecting techniques
- H10W72/07332—Compression bonding, e.g. thermocompression bonding
- H10W72/07333—Ultrasonic bonding, e.g. thermosonic bonding
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/225—Bumps having a filler embedded in a matrix
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
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- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/253—Materials not comprising solid metals or solid metalloids, e.g. polymers or ceramics
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- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
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- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/325—Die-attach connectors having a filler embedded in a matrix
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- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
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- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
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- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/726—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked lead frame, conducting package substrate or heat sink
Definitions
- the present invention relates to a method for joining a pair of joining members at a relatively low temperature. Specifically, the present invention relates to a method for performing die bonding and flip chip bonding of a chip to a substrate at a low temperature.
- brazing method power using brazing material Widely used as a joining method for various members.
- flux-less brazing material is used to prevent component contamination in order to die-bond to semiconductor chip substrates used in high-frequency and optical modules, and AuSn brazing material is used as such brazing material.
- Patent Document 1 For example, Patent Document 1,
- Patent Document 1 JP 2004-006521 A
- the brazing material is fused to one joining member (for example, a semiconductor chip) and then placed on the other joining member (for example, a substrate).
- the brazing filler metal is melted and solidified by heating to a temperature above the melting point of the brazing material.
- the bonding temperature is often set to a temperature of 300 ° C or higher in consideration of the melting point of the brazing material used (the melting point of the AuSn brazing material is about 280 ° C).
- the bonding temperature is set high, the thermal stress generated when cooling to room temperature after bonding increases, and there is a concern about the influence on the bonding member.
- the electrical characteristics of the semiconductor chip may vary due to thermal stress. Therefore, depending on the joining member, a method is desired in which the joining temperature is as low as possible in order to reduce thermal stress.
- the present invention has been made based on the background as described above, and an object thereof is to provide a bonding method having sufficient bonding strength at a relatively low temperature. Specifically, it provides a method that enables bonding even at temperatures below 300 ° C.
- the inventors of the present invention have studied a joining method that replaces the conventional brazing that can solve the above-described problems. As a result of the investigation, a bonding method using a metal paste having a predetermined configuration was found.
- the present invention is a method for joining a pair of joining members, including the following steps.
- the joining method according to the present invention is a joining method using a metal paste instead of the brazing material.
- the metal paste applied to the joining member is pressurized while being heated, and thereby the metal powder in the paste is joined while being plastically deformed to form a dense joint and joining is performed.
- the paste is sintered before pressing to obtain a metal powder sintered body.
- the metal paste used in the present invention is a gold powder, silver powder, platinum powder, or palladium having a purity of 99.9% by weight or more and an average particle diameter of 0.005 / ⁇ ⁇ to 1.0 m.
- a mixture of one or more metal powders selected from powder and an organic solvent is used.
- the purity of the metal powder is required to be as high as 99.9% by weight because if the purity is low, the hardness of the powder increases and plastic deformation becomes difficult.
- the average particle size of the metal powder 1.
- a metal powder having a particle size exceeding O 2 / zm is difficult to express a preferable proximity state during sintering described later.
- the lower limit of 0.005 m is to consider that when the particle size is less than this particle size, it aggregates and becomes difficult to handle immediately when made into a paste.
- the powder power of any of gold, silver, platinum or palladium is When used for bonding semiconductor chips, such as soldering, the metal paste is also required to have electrical conductivity. These metals have excellent electrical conductivity.
- ester alcohol As the organic solvent constituting the metal paste, ester alcohol, tervineol, pine oil, butyl carbitol acetate, butyl carbitol and carbitol are preferable.
- ester alcohol-based organic solvent 2,2,4-trimethyl-1-hydroxypentaisobutyrate (C 3 H 2 O 3) can be mentioned.
- the metal paste may contain one or more selected from acrylic resin, cellulose resin, and alkyd resin. If these fats and the like are further added, the metal powder in the metal paste is prevented from agglomerating and becomes more homogeneous.
- acrylic resin include methyl methacrylate polymer
- examples of the cellulose resin include ethyl cellulose
- examples of the alkyd resin include phthalic anhydride resin. Of these, ethylcellulose is particularly preferred.
- a method of applying the metal paste to the bonding member various methods can be used depending on the size of the bonding portion, such as a spin coating method, a screen printing method, an ink jet method, and a method of spreading the paste with a spatula after dropping. Can be used.
- the reason for drying the applied metal paste is to remove the organic solvent in the paste. This drying is preferably performed at -20 ° C or higher and 5 ° C or lower.
- the atmosphere in the drying process may be a reduced pressure atmosphere. This prevents moisture in the atmosphere from condensing on the metal powder surface during the drying process.
- the force is preferably 1 OOPa or less, more preferably lOPa or less.
- the degree of vacuum in this atmosphere is set according to the volatility of the organic solvent in the metal paste.
- the metal particles in the paste and the bonding surface (paste application surface) of the bonding member and the metal particles are in close contact with each other, and the metal paste becomes a metal powder sintered body.
- This metal powder sintered body is heated and pressed at the time of joining, which will be described later, so that plastic deformation occurs at the contact portion, and bonds between metal atoms occur at the deformation interface, and the sintered body is densely joined. Part. In this regard, even if the paste is pressed without sintering, the particle gaps are expanded. , Bonding between particles does not occur and bonding is not possible.
- the sintering temperature is 80 to 300 ° C. This is because the above point contact does not occur below 80 ° C. On the other hand, if sintering at a temperature exceeding 300 ° C, sintering proceeds excessively, necking between the metal powders proceeds and bonds firmly, and even if pressed after that, it does not become a dense joint. In particular, the strain tends to remain during pressurization. In the first place, the present invention aims at joining at 300 ° C. or lower from the viewpoint of protecting the joining member.
- the heating time during sintering is preferably 30 to 120 minutes.
- this sintering is preferably performed in a state where no pressure is applied.
- the joining member to which the metal paste is applied and the other joining member are stacked and pressed.
- the pressurizing pressure is preferably larger than the yield strength of the metal powder sintered body for densification of the joint. Further, this pressurization may be performed in one direction from any of the joining members, or a bidirectional force may be performed.
- the joining step it is necessary to pressurize the metal powder sintered body while heating it. Without heating, the joint is not sufficiently densified and the strength of the joint is insufficient.
- the heating temperature at this time is preferably 80 to 300 ° C. This is because bonding is not possible at temperatures below 80 ° C, and thermal strain at the time of cooling increases at temperatures above 300 ° C.
- the bonding step it is preferable to apply ultrasonic waves in addition to heating.
- ultrasonic waves By heating or a combination of heating and ultrasonic waves, plastic deformation and bonding of the metal powder can be promoted and a stronger joint can be formed.
- the conditions are preferably an amplitude of 0.5 to 5 / ⁇ ⁇ and an application time of 0.5 to 3 seconds. This is because application of excessive ultrasonic waves damages the joining member.
- the heating and the application of ultrasonic waves in the joining step may be performed on the sintered power of at least the metal powder, but may be performed on the entire joining member.
- a heating method it is easy to use heat transfer with a tool force when pressurizing the joining member.
- ultrasonic waves it is easy to apply ultrasonic waves to oscillate the tool force for pressurizing the joining member.
- FIG. 1 is a diagram schematically illustrating a bonding process in the present embodiment.
- FIG. 2 Structure observation results of sintered metal powder sintered body and joint after joining.
- FIG. 3 is a diagram showing the structure of a sintered metal powder when sintering is performed at 400 ° C.
- FIG. 4 is a diagram showing a test method for bonding strength.
- FIG. 1 schematically shows a bonding process of a semiconductor chip (GaAs chip) to a substrate performed in this embodiment.
- GaAs chip semiconductor chip
- Example 1 First, a metal paste 20 was applied to a semiconductor chip 10.
- the surface of the semiconductor chip 10 is pre-fixed with Ti (0.5 / ⁇ ⁇ ), Ni d / z m ⁇ (1 / ⁇ ⁇ ), Pd d / z m).
- the metal paste used is gold powder (average particle size: 0.3 m) with a purity of 99.99% by weight produced by a wet reduction method, and ester alcohol (2, 2, 4-trimethyl 3-hydroxy) as an organic solvent. It is prepared by mixing pentaisobutyrate (CHO))
- the metal paste had an area of 0.0033 mm 2 and was applied at 100 locations on the chip.
- the metal paste 20 was applied, it was vacuum dried at -10 ° C with a dryer. Then, the chip was heated in an electric furnace at 230 ° C. for 30 minutes to sinter the metal paste to obtain a powder metal sintered body 21.
- a Ni plate 30 pre-plated with Au (: m), Pd (: m) was placed on the semiconductor chip 10 and joined by heating and pressing.
- the pressure condition at this time was 0.2 N per sintered body.
- the heating was set to 230 ° C due to the heat transfer of the tool.
- the heating and pressurizing time in this joining process was 10 minutes.
- Example 2 Here, joining was performed by applying ultrasonic waves simultaneously with pressurization and heating of the sintered bodies.
- a metal paste was applied to a semiconductor chip * dried, sintered, and then a Ni plate was placed thereon. Then, heating and pressurization were performed in the same manner as in Example 1 ( Pressurization pressure was 0.33 N per sintered body;).
- the ultrasonic wave was applied from a tool, the amplitude was 3.2 / ⁇ ⁇ , the output was 3.5 W, and the application time was 1 second.
- the bonding strength of each example exceeds lOOMPa. Considering the joining of electronic components, it can be said that the joint strength is sufficient. It can also be seen that the bonding strength is improved by using ultrasonic wave application at the time of bonding.
- various joining members can be joined at a relatively low temperature, and the joining members can be protected from thermal stress in the cooling process after joining.
- the present invention is useful when bonding a semiconductor chip or the like, which may be affected by thermal stress, to a substrate, and can be applied to die bonding, flip chip bonding, and the like. When applied to flip chip bonding, the present invention can be applied to form bumps on a semiconductor chip.
Landscapes
- Powder Metallurgy (AREA)
- Die Bonding (AREA)
- Wire Bonding (AREA)
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP07744651.6A EP1916709A4 (en) | 2006-06-05 | 2007-06-04 | METHOD OF BINDING |
| US12/063,264 US7789287B2 (en) | 2006-06-05 | 2007-06-04 | Method of bonding |
| CN2007800008088A CN101341585B (zh) | 2006-06-05 | 2007-06-04 | 接合方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006156085A JP4638382B2 (ja) | 2006-06-05 | 2006-06-05 | 接合方法 |
| JP2006-156085 | 2006-06-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2007142175A1 true WO2007142175A1 (ja) | 2007-12-13 |
Family
ID=38801426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2007/061266 Ceased WO2007142175A1 (ja) | 2006-06-05 | 2007-06-04 | 接合方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7789287B2 (ja) |
| EP (1) | EP1916709A4 (ja) |
| JP (1) | JP4638382B2 (ja) |
| KR (1) | KR100976026B1 (ja) |
| CN (1) | CN101341585B (ja) |
| WO (1) | WO2007142175A1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090309459A1 (en) * | 2007-03-22 | 2009-12-17 | Toshinori Ogashiwa | Metal paste for sealing, hermetic sealing method for piezoelectric element, and piezoelectric device |
| WO2014153405A1 (en) * | 2013-03-20 | 2014-09-25 | Texas Instruments Incorporated | Semiconductor device having reinforced wire bond to metal terminal |
| JP2016111083A (ja) * | 2014-12-03 | 2016-06-20 | 三菱電機株式会社 | パワーモジュール及びその製造方法 |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8968608B2 (en) | 2008-01-17 | 2015-03-03 | Nichia Corporation | Method for producing conductive material, conductive material obtained by the method, electronic device containing the conductive material, light-emitting device, and method for producing light-emitting device |
| FR2940521B1 (fr) * | 2008-12-19 | 2011-11-11 | 3D Plus | Procede de fabrication collective de modules electroniques pour montage en surface |
| DE102009000192A1 (de) * | 2009-01-14 | 2010-07-15 | Robert Bosch Gmbh | Sinterwerkstoff, Sinterverbindung sowie Verfahren zum Herstellen eines Sinterverbindung |
| DE102009008926B4 (de) * | 2009-02-13 | 2022-06-15 | Danfoss Silicon Power Gmbh | Verfahren zur Schaffung einer hochtemperatur- und temperaturwechselfesten Verbindung eines Halbleiterbausteins mit einem Verbindungspartner und einer Kontaktlasche unter Verwendung eines temperaturbeaufschlagenden Verfahrens |
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Also Published As
| Publication number | Publication date |
|---|---|
| EP1916709A1 (en) | 2008-04-30 |
| US20090230172A1 (en) | 2009-09-17 |
| JP4638382B2 (ja) | 2011-02-23 |
| EP1916709A4 (en) | 2014-07-09 |
| CN101341585B (zh) | 2010-06-02 |
| CN101341585A (zh) | 2009-01-07 |
| US7789287B2 (en) | 2010-09-07 |
| JP2007324523A (ja) | 2007-12-13 |
| KR20080027883A (ko) | 2008-03-28 |
| KR100976026B1 (ko) | 2010-08-17 |
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