WO2007145712A3 - Slider bearing for use with an apparatus comprising a vacuum chamber - Google Patents
Slider bearing for use with an apparatus comprising a vacuum chamber Download PDFInfo
- Publication number
- WO2007145712A3 WO2007145712A3 PCT/US2007/010006 US2007010006W WO2007145712A3 WO 2007145712 A3 WO2007145712 A3 WO 2007145712A3 US 2007010006 W US2007010006 W US 2007010006W WO 2007145712 A3 WO2007145712 A3 WO 2007145712A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plate
- base plate
- hole
- vacuum chamber
- flexible
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
- H01J37/185—Means for transferring objects between different enclosures of different pressure or atmosphere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/16—Vessels
- H01J2237/166—Sealing means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/18—Vacuum control means
- H01J2237/184—Vacuum locks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2005—Seal mechanisms
- H01J2237/2006—Vacuum seals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/204—Means for introducing and/or outputting objects
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Sliding-Contact Bearings (AREA)
- Sliding Valves (AREA)
- Bearings For Parts Moving Linearly (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Magnetic Bearings And Hydrostatic Bearings (AREA)
Abstract
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP07756002A EP2033206B1 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with an apparatus comprising a vacuum chamber |
| AT07756002T ATE512457T1 (en) | 2006-06-07 | 2007-04-26 | PLAIN BEARING FOR USE WITH A DEVICE COMPRISING A VACUUM CHAMBER |
| CN200780020701XA CN101461026B (en) | 2006-06-07 | 2007-04-26 | Plain bearings for use with devices containing vacuum chambers |
| JP2009514260A JP5033873B2 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with equipment having a vacuum chamber |
| PCT/US2007/010006 WO2007145712A2 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with an apparatus comprising a vacuum chamber |
| US12/303,715 US8598524B2 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with an apparatus comprising a vacuum chamber |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US81162106P | 2006-06-07 | 2006-06-07 | |
| US60/811,621 | 2006-06-07 | ||
| PCT/US2007/010006 WO2007145712A2 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with an apparatus comprising a vacuum chamber |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2007145712A2 WO2007145712A2 (en) | 2007-12-21 |
| WO2007145712A3 true WO2007145712A3 (en) | 2008-04-17 |
Family
ID=40343642
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2007/010006 Ceased WO2007145712A2 (en) | 2006-06-07 | 2007-04-26 | Slider bearing for use with an apparatus comprising a vacuum chamber |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8598524B2 (en) |
| EP (1) | EP2033206B1 (en) |
| JP (1) | JP5033873B2 (en) |
| AT (1) | ATE512457T1 (en) |
| WO (1) | WO2007145712A2 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1816668A2 (en) | 2006-02-01 | 2007-08-08 | FEI Company | Particle-optical apparatus with a predetermined final vacuum pressure |
| JP5033873B2 (en) | 2006-06-07 | 2012-09-26 | エフ イー アイ カンパニ | Slider bearing for use with equipment having a vacuum chamber |
| CN101461026B (en) | 2006-06-07 | 2012-01-18 | Fei公司 | Plain bearings for use with devices containing vacuum chambers |
| WO2009074803A1 (en) | 2007-12-11 | 2009-06-18 | Isentropic Limited | Valve |
| EP2292953A1 (en) | 2009-09-07 | 2011-03-09 | Fei Company | High-vacuum seal |
| FR2979684B1 (en) * | 2011-09-07 | 2014-08-08 | Commissariat Energie Atomique | DEVICE FOR RELATIVE MOVEMENT OF TWO PIECES UNDER DIFFERENTIAL PRESSURE |
| JP5989471B2 (en) * | 2012-09-14 | 2016-09-07 | 日本発條株式会社 | Piezoelectric element supply method |
| US20150097485A1 (en) * | 2013-10-08 | 2015-04-09 | XEI Scientific Inc. | Method and apparatus for plasma ignition in high vacuum chambers |
| TWI674392B (en) * | 2014-03-27 | 2019-10-11 | 日商荏原製作所股份有限公司 | Ceiling plate opening and closing mechanism, and inspection device |
| NL2013432B1 (en) | 2014-09-05 | 2016-09-28 | Delmic B V | Compact inspection apparatus comprising a combination of a Scanning Electron Microscope and an Optical microscope. |
| CN108984933B (en) * | 2018-07-25 | 2022-05-20 | 太原科技大学 | Boundary element method for calculating load and pressure of rolling bearing under elastohydrodynamic lubrication condition |
| KR102198707B1 (en) * | 2019-03-25 | 2021-01-05 | (주)코셈 | Scanning electron microscope having a removable column and, image acquisition methods using the same |
| US12205807B2 (en) * | 2020-04-01 | 2025-01-21 | Mstm, Llc | Multi-mode ionization apparatus and uses thereof |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4229655A (en) * | 1979-05-23 | 1980-10-21 | Nova Associates, Inc. | Vacuum chamber for treating workpieces with beams |
| EP1622185A1 (en) * | 2004-07-01 | 2006-02-01 | FEI Company | Apparatus for evacuating a sample |
Family Cites Families (70)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3602686A (en) | 1967-04-11 | 1971-08-31 | Westinghouse Electric Corp | Electron-beam apparatus and method of welding with this apparatus |
| US3981546A (en) * | 1969-09-29 | 1976-09-21 | Sperman Jacob H | Air bearing construction |
| US3971546A (en) * | 1975-04-21 | 1976-07-27 | Bruner A J | Animal crossing guard |
| JPS5523746Y2 (en) | 1976-02-05 | 1980-06-06 | ||
| US4165881A (en) * | 1976-07-15 | 1979-08-28 | Morgan Construction Company | Flexible seal and seal assembly |
| US4162391A (en) * | 1977-12-19 | 1979-07-24 | Sciaky Bros., Inc. | Sliding vacuum seal means |
| DE2819165A1 (en) | 1978-05-02 | 1979-11-15 | Siemens Ag | SCANNING ELECTRON MICROSCOPE |
| EP0017472A1 (en) * | 1979-04-06 | 1980-10-15 | Lintott Engineering Limited | Evacuable equipment containing a device for heat transfer and process for the manufacture of semi-conductor components using this equipment |
| FR2499314A1 (en) | 1981-02-04 | 1982-08-06 | Centre Nat Rech Scient | ELECTRONIC SCAN MICROSCOPE ASSEMBLY WITH IN SITU OPERATION |
| US4607167A (en) | 1982-10-19 | 1986-08-19 | Varian Associates, Inc. | Charged particle beam lithography machine incorporating localized vacuum envelope |
| US4584479A (en) | 1982-10-19 | 1986-04-22 | Varian Associates, Inc. | Envelope apparatus for localized vacuum processing |
| DE3332248A1 (en) | 1983-09-07 | 1985-03-21 | Lutz-Achim Dipl.-Ing. 7000 Stuttgart Gäng | System for discharging charges on test specimens in scanning electron microscope investigations |
| US4705949A (en) | 1985-11-25 | 1987-11-10 | The United States Of America As Represented By The Secretary Of Commerce | Method and apparatus relating to specimen cells for scanning electron microscopes |
| DE3618283A1 (en) | 1986-05-30 | 1987-12-03 | Messer Griesheim Gmbh | Device for processing workpieces with an electron beam |
| US4818838A (en) | 1988-01-11 | 1989-04-04 | The Perkin-Elmer Corporation | Apparatus for preselecting and maintaining a fixed gap between a workpiece and a vacuum seal apparatus in particle beam lithography systems |
| JPH01296549A (en) | 1988-05-25 | 1989-11-29 | Hitachi Ltd | Charged particle optics |
| US5103102A (en) | 1989-02-24 | 1992-04-07 | Micrion Corporation | Localized vacuum apparatus and method |
| JPH03194838A (en) | 1989-12-22 | 1991-08-26 | Sumitomo Metal Ind Ltd | Antistatic method and antistatic device used in same method |
| EP0462554B1 (en) | 1990-06-20 | 2000-10-11 | Hitachi, Ltd. | Charged particle beam apparatus |
| JPH04363849A (en) | 1991-06-10 | 1992-12-16 | Mitsubishi Electric Corp | Electron beam device |
| US5396067A (en) | 1992-06-11 | 1995-03-07 | Nikon Corporation | Scan type electron microscope |
| JP2851213B2 (en) | 1992-09-28 | 1999-01-27 | 株式会社東芝 | Scanning electron microscope |
| JPH06139984A (en) | 1992-10-23 | 1994-05-20 | Hitachi Ltd | Vacuum leak mechanism of electron microscope |
| JP3422045B2 (en) | 1993-06-21 | 2003-06-30 | 株式会社日立製作所 | Electron microscope for measuring composition and lattice strain and its observation method |
| JP3310136B2 (en) | 1994-09-17 | 2002-07-29 | 株式会社東芝 | Charged beam device |
| FR2747112B1 (en) | 1996-04-03 | 1998-05-07 | Commissariat Energie Atomique | DEVICE FOR TRANSPORTING FLAT OBJECTS AND METHOD FOR TRANSFERRING THESE OBJECTS BETWEEN SAID DEVICE AND A PROCESSING MACHINE |
| US5869833A (en) | 1997-01-16 | 1999-02-09 | Kla-Tencor Corporation | Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments |
| SG74599A1 (en) | 1997-09-27 | 2000-08-22 | Inst Of Material Res & Enginee | Portable high resolution scanning electron microscope column using permanent magnet electron lenses |
| US5989444A (en) * | 1998-02-13 | 1999-11-23 | Zywno; Marek | Fluid bearings and vacuum chucks and methods for producing same |
| EP0969494A1 (en) | 1998-07-03 | 2000-01-05 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Apparatus and method for examining specimen with a charged particle beam |
| US6476913B1 (en) | 1998-11-30 | 2002-11-05 | Hitachi, Ltd. | Inspection method, apparatus and system for circuit pattern |
| TWI233535B (en) * | 1999-04-19 | 2005-06-01 | Asml Netherlands Bv | Motion feed-through into a vacuum chamber and its application in lithographic projection apparatuses |
| TWI242111B (en) | 1999-04-19 | 2005-10-21 | Asml Netherlands Bv | Gas bearings for use in vacuum chambers and their application in lithographic projection apparatus |
| EP1122761B1 (en) | 2000-02-01 | 2004-05-26 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Optical column for charged particle beam device |
| US6515288B1 (en) * | 2000-03-16 | 2003-02-04 | Applied Materials, Inc. | Vacuum bearing structure and a method of supporting a movable member |
| US6559457B1 (en) | 2000-03-23 | 2003-05-06 | Advanced Micro Devices, Inc. | System and method for facilitating detection of defects on a wafer |
| US6582251B1 (en) * | 2000-04-28 | 2003-06-24 | Greene, Tweed Of Delaware, Inc. | Hermetic electrical connector and method of making the same |
| JP3619132B2 (en) | 2000-08-25 | 2005-02-09 | 株式会社日立製作所 | electronic microscope |
| US6507147B1 (en) * | 2000-08-31 | 2003-01-14 | Intevac, Inc. | Unitary vacuum tube incorporating high voltage isolation |
| US6683316B2 (en) | 2001-08-01 | 2004-01-27 | Aspex, Llc | Apparatus for correlating an optical image and a SEM image and method of use thereof |
| JP2003086355A (en) * | 2001-09-05 | 2003-03-20 | Kiko Kenji Kagi Kofun Yugenkoshi | Sealing structure of organic EL element, sealing method and sealing device |
| JP3886777B2 (en) | 2001-11-02 | 2007-02-28 | 日本電子株式会社 | Electron beam irradiation apparatus and method |
| US6710354B1 (en) | 2001-12-11 | 2004-03-23 | Kla-Tencor Corporation | Scanning electron microscope architecture and related material handling system |
| JP4014916B2 (en) | 2002-04-11 | 2007-11-28 | 株式会社キーエンス | Electron microscope, electron microscope operation method, electron microscope operation program, and computer-readable recording medium |
| US6891170B1 (en) | 2002-06-17 | 2005-05-10 | Zyvex Corporation | Modular manipulation system for manipulating a sample under study with a microscope |
| JP2004031207A (en) | 2002-06-27 | 2004-01-29 | Canon Inc | Electron beam irradiation device and scanning electron microscope device |
| US6667475B1 (en) | 2003-01-08 | 2003-12-23 | Applied Materials, Inc. | Method and apparatus for cleaning an analytical instrument while operating the analytical instrument |
| JP4373104B2 (en) | 2003-02-18 | 2009-11-25 | 株式会社荏原製作所 | Charged particle beam equipment |
| NL1022886C2 (en) * | 2003-03-10 | 2004-09-14 | Fei Co | Particle optical device for irradiating an object. |
| JP4211473B2 (en) | 2003-04-25 | 2009-01-21 | ソニー株式会社 | electronic microscope |
| JP2004349515A (en) | 2003-05-23 | 2004-12-09 | Hitachi High-Technologies Corp | SEM appearance inspection device, review device, and alignment coordinate setting method |
| US6897443B2 (en) * | 2003-06-02 | 2005-05-24 | Harald Gross | Portable scanning electron microscope |
| US7060990B2 (en) | 2003-06-16 | 2006-06-13 | Sumitomo Heavy Industries, Ltd. | Stage base, substrate processing apparatus, and maintenance method for stage |
| US7100925B2 (en) * | 2003-07-31 | 2006-09-05 | Perkin Elmer, Inc. | Pressure energized metallic seal |
| KR100592242B1 (en) | 2003-08-12 | 2006-06-21 | 삼성에스디아이 주식회사 | Carrier and analysis device having same |
| JP4063201B2 (en) | 2003-11-18 | 2008-03-19 | ソニー株式会社 | Electron beam irradiation device |
| US7043848B2 (en) | 2003-11-26 | 2006-05-16 | The Micromanipulator Company | Method and apparatus for maintaining accurate positioning between a probe and a DUT |
| JP2005203123A (en) | 2004-01-13 | 2005-07-28 | Sony Corp | Charged particle beam device. |
| JP4528014B2 (en) | 2004-04-05 | 2010-08-18 | 株式会社日立ハイテクノロジーズ | Sample inspection method |
| JP4559137B2 (en) * | 2004-06-30 | 2010-10-06 | キヤノン株式会社 | Vacuum equipment manufacturing apparatus and manufacturing method |
| US20060249917A1 (en) * | 2005-04-07 | 2006-11-09 | Saint-Gobain Performance Plastics Corporation | Composite sealing device |
| US20070011300A1 (en) | 2005-07-11 | 2007-01-11 | Hollebeek Robert J | Monitoring method and system for monitoring operation of resources |
| US7301157B2 (en) | 2005-09-28 | 2007-11-27 | Fei Company | Cluster tool for microscopic processing of samples |
| NL1030295C2 (en) | 2005-10-28 | 2007-05-03 | Fei Co | Hermetically sealed housing with electrical lead-through. |
| EP1816668A2 (en) | 2006-02-01 | 2007-08-08 | FEI Company | Particle-optical apparatus with a predetermined final vacuum pressure |
| EP1863066A1 (en) | 2006-05-29 | 2007-12-05 | FEI Company | Sample carrier and sample holder |
| CN101461026B (en) | 2006-06-07 | 2012-01-18 | Fei公司 | Plain bearings for use with devices containing vacuum chambers |
| JP5033873B2 (en) | 2006-06-07 | 2012-09-26 | エフ イー アイ カンパニ | Slider bearing for use with equipment having a vacuum chamber |
| EP2105944A1 (en) | 2008-03-28 | 2009-09-30 | FEI Company | Environmental cell for a particle-optical apparatus |
| US8087309B2 (en) | 2009-05-22 | 2012-01-03 | Sion Power Corporation | Hermetic sample holder and method for performing microanalysis under controlled atmosphere environment |
-
2007
- 2007-04-26 JP JP2009514260A patent/JP5033873B2/en active Active
- 2007-04-26 EP EP07756002A patent/EP2033206B1/en active Active
- 2007-04-26 WO PCT/US2007/010006 patent/WO2007145712A2/en not_active Ceased
- 2007-04-26 US US12/303,715 patent/US8598524B2/en active Active
- 2007-04-26 AT AT07756002T patent/ATE512457T1/en not_active IP Right Cessation
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4229655A (en) * | 1979-05-23 | 1980-10-21 | Nova Associates, Inc. | Vacuum chamber for treating workpieces with beams |
| EP1622185A1 (en) * | 2004-07-01 | 2006-02-01 | FEI Company | Apparatus for evacuating a sample |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007145712A2 (en) | 2007-12-21 |
| EP2033206A2 (en) | 2009-03-11 |
| US8598524B2 (en) | 2013-12-03 |
| JP2009540499A (en) | 2009-11-19 |
| JP5033873B2 (en) | 2012-09-26 |
| US20100276592A1 (en) | 2010-11-04 |
| ATE512457T1 (en) | 2011-06-15 |
| EP2033206B1 (en) | 2011-06-08 |
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