WO2008120552A1 - 診断システム - Google Patents

診断システム Download PDF

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Publication number
WO2008120552A1
WO2008120552A1 PCT/JP2008/054667 JP2008054667W WO2008120552A1 WO 2008120552 A1 WO2008120552 A1 WO 2008120552A1 JP 2008054667 W JP2008054667 W JP 2008054667W WO 2008120552 A1 WO2008120552 A1 WO 2008120552A1
Authority
WO
WIPO (PCT)
Prior art keywords
diagnostic
rule
subject
generation device
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/054667
Other languages
English (en)
French (fr)
Inventor
Ryohei Fujimaki
Hidenori Tsukahara
Akinori Satou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to CN2008800102440A priority Critical patent/CN101652754B/zh
Priority to EP08738655A priority patent/EP2144166A4/en
Priority to JP2009507447A priority patent/JP5278310B2/ja
Priority to US12/593,491 priority patent/US8275735B2/en
Publication of WO2008120552A1 publication Critical patent/WO2008120552A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0297—Reconfiguration of monitoring system, e.g. use of virtual sensors; change monitoring method as a response to monitoring results
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Human Computer Interaction (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

　本発明は、被診断対象から測定されたデータに診断ルールを適用して被診断対象の診断を行う診断システムにおいて、多種多様な診断事例データに基づいて診断ルールを更新し得るようにすることを目的とする。複数の診断装置１０１のそれぞれは、被診断対象１０４から測定された診断対象データに診断ルールを適用して診断を行い、診断対象データとその診断結果とを含む診断事例データをネットワーク１０３経由で診断ルール生成装置１０２へ送信する。診断ルール生成装置１０２は、複数の診断装置１０１から受信した診断事例データに基づいて診断ルールを生成し、ネットワーク１０３経由で各診断装置１０１へ送信する。各診断装置１０１は、診断ルール生成装置１０２から受信した診断ルールで自装置の診断ルールを更新する（図１）。
PCT/JP2008/054667 2007-03-29 2008-03-13 診断システム Ceased WO2008120552A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN2008800102440A CN101652754B (zh) 2007-03-29 2008-03-13 诊断系统
EP08738655A EP2144166A4 (en) 2007-03-29 2008-03-13 DIAGNOSTIC SYSTEM
JP2009507447A JP5278310B2 (ja) 2007-03-29 2008-03-13 診断システム
US12/593,491 US8275735B2 (en) 2007-03-29 2008-03-13 Diagnostic system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-086898 2007-03-29
JP2007086898 2007-03-29

Publications (1)

Publication Number Publication Date
WO2008120552A1 true WO2008120552A1 (ja) 2008-10-09

Family

ID=39808135

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/054667 Ceased WO2008120552A1 (ja) 2007-03-29 2008-03-13 診断システム

Country Status (5)

Country Link
US (1) US8275735B2 (ja)
EP (1) EP2144166A4 (ja)
JP (1) JP5278310B2 (ja)
CN (1) CN101652754B (ja)
WO (1) WO2008120552A1 (ja)

Cited By (8)

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JP2013080454A (ja) * 2011-09-21 2013-05-02 Toshiba Tec Corp 保守装置、保守方法および保守プログラム
JP2016173782A (ja) * 2015-03-18 2016-09-29 エヌ・ティ・ティ・コミュニケーションズ株式会社 故障予測システム、故障予測方法、故障予測装置、学習装置、故障予測プログラム及び学習プログラム
JPWO2019168167A1 (ja) * 2018-03-02 2020-04-16 学校法人立命館 検証方法、検証装置、コンピュータプログラム、及び、検証システム
JP2021002398A (ja) * 2015-07-31 2021-01-07 ファナック株式会社 故障予知装置、故障予知システム及び故障予知方法
JP2021077307A (ja) * 2019-11-11 2021-05-20 財團法人資訊工業策進會 テストデータ作成システムおよびテストデータ作成方法
JP2022001309A (ja) * 2020-12-09 2022-01-06 株式会社トプコン 眼科装置及び眼科測定方法
US11275345B2 (en) 2015-07-31 2022-03-15 Fanuc Corporation Machine learning Method and machine learning device for learning fault conditions, and fault prediction device and fault prediction system including the machine learning device
JP2022536048A (ja) * 2019-05-27 2022-08-12 ブランコ テクノロジー グループ アイピー オイ 蓄積された診断レポートに基づく診断テストの優先順位付け

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EP2365456B1 (en) * 2010-03-11 2016-07-20 CompuGroup Medical SE Data structure, method and system for predicting medical conditions
US11568331B2 (en) * 2011-09-26 2023-01-31 Open Text Corporation Methods and systems for providing automated predictive analysis
WO2013113379A1 (en) * 2012-02-01 2013-08-08 Abb Research Ltd Monitoring of primary devices in a power system
US20140336984A1 (en) * 2013-05-13 2014-11-13 Abb Technology Ag. Conditional monitoring of industrial systems
US10116619B2 (en) 2014-03-19 2018-10-30 Connectwise, Inc. Systems and methods for provisioning, configuring, diagnosing, and maintaining out-of band management of computing devices
US10140576B2 (en) * 2014-08-10 2018-11-27 Palo Alto Research Center Incorporated Computer-implemented system and method for detecting anomalies using sample-based rule identification
JP6438124B2 (ja) * 2015-04-20 2018-12-12 株式会社日立製作所 運用管理システム及び運用管理方法
JP6500663B2 (ja) * 2015-07-16 2019-04-17 株式会社リコー 情報処理システム、情報処理装置、プログラム及び故障予測ロジック組込方法
WO2017135947A1 (en) 2016-02-04 2017-08-10 Hewlett Packard Enterprise Development Lp Real-time alerts and transmission of selected signal samples under a dynamic capacity limitation
CN110168461B (zh) * 2017-02-24 2022-01-11 株式会社日立制作所 异常诊断系统
US20190035266A1 (en) * 2017-07-26 2019-01-31 GM Global Technology Operations LLC Systems and methods for road user classification, position, and kinematic parameter measuring and reporting via a digital telecommunication network
KR102936953B1 (ko) * 2019-09-10 2026-03-10 삼성전자주식회사 디스플레이 장치 및 그 제어 방법
JP7305588B2 (ja) * 2020-03-19 2023-07-10 エヌ・ティ・ティ・コミュニケーションズ株式会社 データ流通制御装置、方法およびプログラム
JP7254739B2 (ja) 2020-03-19 2023-04-10 エヌ・ティ・ティ・コミュニケーションズ株式会社 データ流通制御装置、方法およびプログラム
CN117280291A (zh) * 2021-03-17 2023-12-22 江森自控泰科知识产权控股有限责任合伙公司 用于确定设备能量浪费的系统和方法
CN113359665B (zh) * 2021-05-31 2022-11-18 上海工程技术大学 一种基于加权关键主元的工业过程故障检测方法及系统

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JPH05307484A (ja) 1992-03-03 1993-11-19 Mitsubishi Electric Corp 診断装置及び診断装置における処理方法
JPH0830152A (ja) * 1994-07-14 1996-02-02 Fuji Xerox Co Ltd 遠隔故障診断システム
JPH11338729A (ja) * 1998-03-25 1999-12-10 Nec Corp 故障予測システム、故障予測方法および故障予測プログラムを記録した記録媒体
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JPH05307484A (ja) 1992-03-03 1993-11-19 Mitsubishi Electric Corp 診断装置及び診断装置における処理方法
JPH0830152A (ja) * 1994-07-14 1996-02-02 Fuji Xerox Co Ltd 遠隔故障診断システム
JPH11338729A (ja) * 1998-03-25 1999-12-10 Nec Corp 故障予測システム、故障予測方法および故障予測プログラムを記録した記録媒体
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See also references of EP2144166A4

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013080454A (ja) * 2011-09-21 2013-05-02 Toshiba Tec Corp 保守装置、保守方法および保守プログラム
JP2016173782A (ja) * 2015-03-18 2016-09-29 エヌ・ティ・ティ・コミュニケーションズ株式会社 故障予測システム、故障予測方法、故障予測装置、学習装置、故障予測プログラム及び学習プログラム
JP2022125288A (ja) * 2015-07-31 2022-08-26 ファナック株式会社 異常予知装置、異常予知システム、異常予知方法及び異常予知プログラム
JP7104121B2 (ja) 2015-07-31 2022-07-20 ファナック株式会社 故障予知装置、故障予知システム及び故障予知方法
US12066797B2 (en) 2015-07-31 2024-08-20 Fanuc Corporation Fault prediction method and fault prediction system for predecting a fault of a machine
JP7504163B2 (ja) 2015-07-31 2024-06-21 ファナック株式会社 異常予知装置、異常予知システム、異常予知方法及び異常予知プログラム
JP2021002398A (ja) * 2015-07-31 2021-01-07 ファナック株式会社 故障予知装置、故障予知システム及び故障予知方法
US11275345B2 (en) 2015-07-31 2022-03-15 Fanuc Corporation Machine learning Method and machine learning device for learning fault conditions, and fault prediction device and fault prediction system including the machine learning device
JPWO2019168167A1 (ja) * 2018-03-02 2020-04-16 学校法人立命館 検証方法、検証装置、コンピュータプログラム、及び、検証システム
JP2022536048A (ja) * 2019-05-27 2022-08-12 ブランコ テクノロジー グループ アイピー オイ 蓄積された診断レポートに基づく診断テストの優先順位付け
JP7553175B2 (ja) 2019-05-27 2024-09-18 ブランコ テクノロジー グループ アイピー オイ 蓄積された診断レポートに基づく診断テストの優先順位付け
US12228998B2 (en) 2019-05-27 2025-02-18 Blancco Technology Group IP Oy Diagnostic test prioritization based on accumulated diagnostic reports
US11397664B2 (en) 2019-11-11 2022-07-26 Institute For Information Industry System and method for producing test data
JP6992039B2 (ja) 2019-11-11 2022-01-13 財團法人資訊工業策進會 テストデータ作成システムおよびテストデータ作成方法
JP2021077307A (ja) * 2019-11-11 2021-05-20 財團法人資訊工業策進會 テストデータ作成システムおよびテストデータ作成方法
JP2022001308A (ja) * 2020-12-09 2022-01-06 株式会社トプコン 眼科装置及び眼科測定方法
JP7252296B2 (ja) 2020-12-09 2023-04-04 株式会社トプコン 眼科装置及び眼科測定方法
JP7252295B2 (ja) 2020-12-09 2023-04-04 株式会社トプコン 眼科装置及び眼科測定方法
JP2022001309A (ja) * 2020-12-09 2022-01-06 株式会社トプコン 眼科装置及び眼科測定方法

Also Published As

Publication number Publication date
JPWO2008120552A1 (ja) 2010-07-15
EP2144166A4 (en) 2011-01-12
US20100100521A1 (en) 2010-04-22
US8275735B2 (en) 2012-09-25
CN101652754B (zh) 2012-07-18
CN101652754A (zh) 2010-02-17
JP5278310B2 (ja) 2013-09-04
EP2144166A1 (en) 2010-01-13

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