WO2008152845A1 - 乱数発生器 - Google Patents
乱数発生器 Download PDFInfo
- Publication number
- WO2008152845A1 WO2008152845A1 PCT/JP2008/055368 JP2008055368W WO2008152845A1 WO 2008152845 A1 WO2008152845 A1 WO 2008152845A1 JP 2008055368 W JP2008055368 W JP 2008055368W WO 2008152845 A1 WO2008152845 A1 WO 2008152845A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- random number
- magnetizing
- layer
- number generator
- unfixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
- G06F7/58—Random or pseudo-random number generators
- G06F7/588—Random number generators, i.e. based on natural stochastic processes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Mathematical Optimization (AREA)
- Pure & Applied Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
乱数発生器を、乱数発生速度を早くすると供に、回路構成をコンパクト且つ容易に構成する。 乱数発生器は、磁化自由層、中間層、磁化固定層の3層からなり、磁化自由層と磁化固定層の磁化の配列に応じて少なくとも二値以上の抵抗値を有する磁気抵抗素子を備え、該磁気抵抗素子にその磁化自由層の反転確率が0から1の間の任意の値になる磁化電流を流し、前記磁気抵抗素子の抵抗値を乱数として取り出す。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/452,012 US8521795B2 (en) | 2007-06-12 | 2008-03-24 | Random number generating device |
| EP08722684A EP2163984B1 (en) | 2007-06-12 | 2008-03-24 | Random number generating device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007155008A JP4625936B2 (ja) | 2007-06-12 | 2007-06-12 | 乱数発生器 |
| JP2007-155008 | 2007-06-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008152845A1 true WO2008152845A1 (ja) | 2008-12-18 |
Family
ID=40129458
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/055368 Ceased WO2008152845A1 (ja) | 2007-06-12 | 2008-03-24 | 乱数発生器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8521795B2 (ja) |
| EP (1) | EP2163984B1 (ja) |
| JP (1) | JP4625936B2 (ja) |
| WO (1) | WO2008152845A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010090328A1 (ja) * | 2009-02-09 | 2010-08-12 | 株式会社 東芝 | 乱数発生器 |
| JP2014531669A (ja) * | 2011-09-20 | 2014-11-27 | クアルコム,インコーポレイテッド | 乱数生成器のための磁気抵抗素子を伴うエントロピー源 |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4625936B2 (ja) * | 2007-06-12 | 2011-02-02 | 独立行政法人産業技術総合研究所 | 乱数発生器 |
| JP2011113136A (ja) | 2009-11-24 | 2011-06-09 | Sony Corp | 乱数発生装置、乱数発生方法及びセキュリティチップ |
| JP5725735B2 (ja) * | 2010-06-04 | 2015-05-27 | 株式会社日立製作所 | 磁気抵抗効果素子及び磁気メモリ |
| KR101348503B1 (ko) * | 2012-06-29 | 2014-01-07 | 리켄 | 난수 발생기 및 이의 제조방법 |
| US9466030B2 (en) | 2012-08-30 | 2016-10-11 | International Business Machines Corporation | Implementing stochastic networks using magnetic tunnel junctions |
| US9110746B2 (en) * | 2012-09-04 | 2015-08-18 | Qualcomm Incorporated | Magnetic tunnel junction based random number generator |
| US9164729B2 (en) | 2013-02-05 | 2015-10-20 | Qualcomm Incorporated | Method and apparatus for generating random numbers using a physical entropy source |
| US9633715B2 (en) * | 2013-05-31 | 2017-04-25 | Hitachi, Ltd. | Semiconductor device capable of attaining ground state in an ising model |
| WO2014203466A1 (ja) | 2013-06-18 | 2014-12-24 | パナソニックIpマネジメント株式会社 | 乱数発生装置 |
| US9459835B2 (en) | 2014-01-15 | 2016-10-04 | HGST Netherlands B.V. | Random number generator by superparamagnetism |
| US9916884B2 (en) * | 2014-03-07 | 2018-03-13 | Intel Corporation | Physically unclonable function circuit using resistive memory device |
| US9442695B2 (en) * | 2014-05-02 | 2016-09-13 | International Business Machines Corporation | Random bit generator based on nanomaterials |
| US10042609B2 (en) | 2014-05-09 | 2018-08-07 | Quantum Numbers Corp. | Method for generating random numbers and associated random number generator |
| US9846569B1 (en) | 2014-11-17 | 2017-12-19 | Seagate Technology Llc | Random values based on a random components of noise |
| EP3062215B1 (en) * | 2015-02-24 | 2018-04-04 | Crocus Technology S.A. | Mram-based programmable magnetic device for generating random numbers |
| US9813049B2 (en) | 2015-08-12 | 2017-11-07 | Qualcomm Incorporated | Comparator including a magnetic tunnel junction (MTJ) device and a transistor |
| DE102016207451A1 (de) * | 2016-04-29 | 2017-11-02 | Siemens Aktiengesellschaft | Verfahren und Vorrichtung zum Erzeugen von Zufallsbits |
| US10340901B2 (en) | 2017-03-01 | 2019-07-02 | Tdk Corporation | Random number generator, random number generation device, neuromorphic computer, and quantum computer |
| US10168996B1 (en) | 2018-01-15 | 2019-01-01 | Quantum Numbers Corp. | Method and system for generating a random bit sample |
| US10719298B1 (en) * | 2019-02-25 | 2020-07-21 | Western Digital Technologies, Inc. | System for generating random noise with a magnetic device |
| JP7549891B2 (ja) * | 2019-07-03 | 2024-09-12 | 国立大学法人東北大学 | 乱数発生ユニット及びコンピューティングシステム |
| DE102020119273A1 (de) | 2019-08-30 | 2021-03-04 | Taiwan Semiconductor Manufacturing Co. Ltd. | Speichervorrichtung mit abstimmbarem probabilistischem Zustand |
| US11521664B2 (en) * | 2019-08-30 | 2022-12-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory device with tunable probabilistic state |
| JP7719445B2 (ja) * | 2021-04-21 | 2025-08-06 | 国立大学法人東北大学 | 電子デバイス、その製造方法及びその使用方法 |
| US20220398068A1 (en) * | 2021-06-09 | 2022-12-15 | International Business Machines Corporation | Magnetic-tunnel-junction-based random number generator |
| JP2023050897A (ja) * | 2021-09-30 | 2023-04-11 | ソニーセミコンダクタソリューションズ株式会社 | 磁気検出装置 |
| CN116187250B (zh) * | 2021-11-16 | 2026-06-30 | 香港科技大学 | 对包含磁性隧道结的器件或电路进行仿真的方法和系统 |
| WO2023199423A1 (ja) * | 2022-04-13 | 2023-10-19 | 三菱電機株式会社 | 量子乱数生成装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000284944A (ja) * | 1999-03-30 | 2000-10-13 | Ntt Data Corp | 乱数発生方法及び乱数発生装置 |
| JP2003015865A (ja) * | 2001-06-27 | 2003-01-17 | Le Tekku:Kk | 乱数発生方法 |
| JP2005085821A (ja) * | 2003-09-04 | 2005-03-31 | Toshiba Corp | 磁気抵抗効果素子及び磁気メモリ |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2817999B1 (fr) * | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a empilement(s) tri-couche(s) et memoire utilisant ce dispositif |
| JP2003108364A (ja) | 2001-09-26 | 2003-04-11 | Toshiba Corp | 乱数発生回路 |
| JP3641255B2 (ja) | 2002-06-24 | 2005-04-20 | 株式会社東芝 | 乱数生成装置 |
| JP4118754B2 (ja) | 2003-06-27 | 2008-07-16 | 日本電信電話株式会社 | 乱数発生回路 |
| JP4692807B2 (ja) * | 2004-12-21 | 2011-06-01 | ソニー株式会社 | 接触式データ通信装置、送受信装置、および送受信方法 |
| JP2008003438A (ja) * | 2006-06-26 | 2008-01-10 | Sony Corp | 乱数生成装置、乱数生成制御方法、メモリアクセス制御装置、および、通信装置 |
| JP4625936B2 (ja) * | 2007-06-12 | 2011-02-02 | 独立行政法人産業技術総合研究所 | 乱数発生器 |
| US7916524B2 (en) * | 2007-06-26 | 2011-03-29 | Qimonda Ag | Program method with locally optimized write parameters |
| US20090249081A1 (en) * | 2008-03-31 | 2009-10-01 | Kabushiki Kaisha Toshiba-1 Shibaura 1-Chomominatoku | Storage device encryption and method |
-
2007
- 2007-06-12 JP JP2007155008A patent/JP4625936B2/ja not_active Expired - Fee Related
-
2008
- 2008-03-24 WO PCT/JP2008/055368 patent/WO2008152845A1/ja not_active Ceased
- 2008-03-24 EP EP08722684A patent/EP2163984B1/en not_active Not-in-force
- 2008-03-24 US US12/452,012 patent/US8521795B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000284944A (ja) * | 1999-03-30 | 2000-10-13 | Ntt Data Corp | 乱数発生方法及び乱数発生装置 |
| JP2003015865A (ja) * | 2001-06-27 | 2003-01-17 | Le Tekku:Kk | 乱数発生方法 |
| JP2005085821A (ja) * | 2003-09-04 | 2005-03-31 | Toshiba Corp | 磁気抵抗効果素子及び磁気メモリ |
Non-Patent Citations (2)
| Title |
|---|
| FUKUSHIMA A. ET AL.: "Spin Chunyu Jika Hanten o Mochiita Ransu Hasseiki", 70TH (HEISEI 20 NEN) ZENKOKU TAIKAI KOEN RONBUNSHU (3), 13 March 2008 (2008-03-13), pages 3-359 - 3-360 * |
| See also references of EP2163984A4 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010090328A1 (ja) * | 2009-02-09 | 2010-08-12 | 株式会社 東芝 | 乱数発生器 |
| JP2010182258A (ja) * | 2009-02-09 | 2010-08-19 | Toshiba Corp | 乱数発生器および乱数発生方法 |
| US8374021B2 (en) | 2009-02-09 | 2013-02-12 | Kabushiki Kaisha Toshiba | Random number generator |
| JP2014531669A (ja) * | 2011-09-20 | 2014-11-27 | クアルコム,インコーポレイテッド | 乱数生成器のための磁気抵抗素子を伴うエントロピー源 |
| US9189201B2 (en) | 2011-09-20 | 2015-11-17 | Qualcomm Incorporated | Entropy source with magneto-resistive element for random number generator |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2163984B1 (en) | 2012-10-17 |
| JP2008310403A (ja) | 2008-12-25 |
| US8521795B2 (en) | 2013-08-27 |
| US20100131578A1 (en) | 2010-05-27 |
| EP2163984A4 (en) | 2011-09-07 |
| EP2163984A1 (en) | 2010-03-17 |
| JP4625936B2 (ja) | 2011-02-02 |
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