WO2009090341A3 - Systeme d ' illuminations structuree d ' un echantillon en microscopie tridimensionelle - Google Patents

Systeme d ' illuminations structuree d ' un echantillon en microscopie tridimensionelle Download PDF

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Publication number
WO2009090341A3
WO2009090341A3 PCT/FR2008/001469 FR2008001469W WO2009090341A3 WO 2009090341 A3 WO2009090341 A3 WO 2009090341A3 FR 2008001469 W FR2008001469 W FR 2008001469W WO 2009090341 A3 WO2009090341 A3 WO 2009090341A3
Authority
WO
WIPO (PCT)
Prior art keywords
beams
lens
sample
focalisation
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR2008/001469
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English (en)
Other versions
WO2009090341A2 (fr
Inventor
Vincent Liorette
Benoit Dubertret
Pedro Felipe Gardeazalbal Rodriguez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique
Original Assignee
Centre National de la Recherche Scientifique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique filed Critical Centre National de la Recherche Scientifique
Priority to EP08870802A priority Critical patent/EP2201420A2/fr
Priority to US12/738,573 priority patent/US8289622B2/en
Priority to JP2010529427A priority patent/JP2011501214A/ja
Publication of WO2009090341A2 publication Critical patent/WO2009090341A2/fr
Publication of WO2009090341A3 publication Critical patent/WO2009090341A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

L'invention se rapporte à un système d'illumination structurée (8) pour la microscopie tridimensionnelle d'un échantillon ( 14) comprenant : - des moyens de génération de faisceaux (9, 10) agencés pour générer des faisceaux lumineux cohérents ( I N, I-N, I O); - un objectif (12) ayant un plan focal arrière (PFA), l'objectif étant agencé de sorte que l'échantillon (14) soit susceptible d'être positionné dans le plan de mise au point (PMP) de l'objectif; - des moyens de focalisation (19) agencés pour focaliser les faisceaux lumineux dans le plan focal arrière (PFA) de sorte que les faisceaux interfèrent de façon collimatée dans le plan de mise au point (PMP) de l'objectif (12), caractérisé en ce que les moyens de génération de faisceaux (9, 10) comprennent un modulateur spatial de lumière (10) programmé pour diffracter un signal lumineux (22) de sorte à générer au moins deux faisceaux diffractés cohérents (( I N, I O), ( I-N, IO)) non symétriques par rapport à l'axe optique de l'objectif, le modulateur spatial de lumière comprenant un calculateur agencé pour appliquer un terme de phase constant à chacun desdits au moins deux faisceaux cohérents.
PCT/FR2008/001469 2007-10-18 2008-10-17 Systeme d ' illuminations structuree d ' un echantillon en microscopie tridimensionelle Ceased WO2009090341A2 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP08870802A EP2201420A2 (fr) 2007-10-18 2008-10-17 Système d'illumination structurée d'un échantillon
US12/738,573 US8289622B2 (en) 2007-10-18 2008-10-17 System for the structured illumination of a sample
JP2010529427A JP2011501214A (ja) 2007-10-18 2008-10-17 サンプルの構造化照明システム

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0707299 2007-10-18
FR0707299A FR2922658B1 (fr) 2007-10-18 2007-10-18 Systeme d'illuminations structuree d'un echantillon

Publications (2)

Publication Number Publication Date
WO2009090341A2 WO2009090341A2 (fr) 2009-07-23
WO2009090341A3 true WO2009090341A3 (fr) 2009-09-11

Family

ID=39432831

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2008/001469 Ceased WO2009090341A2 (fr) 2007-10-18 2008-10-17 Systeme d ' illuminations structuree d ' un echantillon en microscopie tridimensionelle

Country Status (5)

Country Link
US (1) US8289622B2 (fr)
EP (1) EP2201420A2 (fr)
JP (1) JP2011501214A (fr)
FR (1) FR2922658B1 (fr)
WO (1) WO2009090341A2 (fr)

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FR2922658B1 (fr) * 2007-10-18 2011-02-04 Centre Nat Rech Scient Systeme d'illuminations structuree d'un echantillon
JP5900515B2 (ja) * 2012-01-18 2016-04-06 株式会社ニコン 構造化照明装置、構造化照明顕微鏡装置、構造化照明方法
JP2014063151A (ja) * 2012-08-29 2014-04-10 Canon Inc 顕微鏡用照明光学系およびこれを用いた顕微鏡
DE102012017922B4 (de) * 2012-09-11 2024-03-14 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
CN106680271A (zh) * 2015-11-05 2017-05-17 南京理工大学 基于空间光调制器的裸眼立体显微成像装置及方法
US11287627B2 (en) 2017-06-30 2022-03-29 Chrysanthe Preza Multi-focal light-sheet structured illumination fluorescence microscopy system
US20230384574A1 (en) * 2020-10-28 2023-11-30 Georgia Tech Research Corporation Cell imaging systems and methods

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DE19827139C2 (de) * 1998-06-18 2002-01-31 Zeiss Carl Jena Gmbh Mikroskop mit einem über eine Lichtleitfaser eingekoppelten Kurzpulslaser
US7274446B2 (en) * 2001-04-07 2007-09-25 Carl Zeiss Jena Gmbh Method and arrangement for the deep resolved optical recording of a sample
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ATE539345T1 (de) * 2001-10-09 2012-01-15 Univ Ruprecht Karls Heidelberg Mikroskopisches weitfeldlichtverfahren
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
US7312432B2 (en) * 2002-07-08 2007-12-25 Dmetrix, Inc. Single axis illumination for multi-axis imaging system
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DE10332073A1 (de) * 2003-07-11 2005-02-10 Carl Zeiss Jena Gmbh Anordnung zur optischen Erfassung von in einer Probe angeregter und / oder rückgestreuter Lichtstrahlung mit Doppelobjektivanordnung
JP4512180B2 (ja) * 2004-01-09 2010-07-28 独立行政法人理化学研究所 干渉装置
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EP1865355B1 (fr) * 2005-03-30 2013-03-06 Nikon Corporation Procede de formation d image et dispositif de microscope
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Also Published As

Publication number Publication date
FR2922658B1 (fr) 2011-02-04
JP2011501214A (ja) 2011-01-06
US8289622B2 (en) 2012-10-16
WO2009090341A2 (fr) 2009-07-23
FR2922658A1 (fr) 2009-04-24
US20110116163A1 (en) 2011-05-19
EP2201420A2 (fr) 2010-06-30

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