WO2012170994A3 - Low droop light emitting diode structure on gallium nitride semipolar substrates - Google Patents

Low droop light emitting diode structure on gallium nitride semipolar substrates Download PDF

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Publication number
WO2012170994A3
WO2012170994A3 PCT/US2012/041872 US2012041872W WO2012170994A3 WO 2012170994 A3 WO2012170994 A3 WO 2012170994A3 US 2012041872 W US2012041872 W US 2012041872W WO 2012170994 A3 WO2012170994 A3 WO 2012170994A3
Authority
WO
WIPO (PCT)
Prior art keywords
light emitting
emitting diode
gallium nitride
diode structure
active region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2012/041872
Other languages
French (fr)
Other versions
WO2012170994A2 (en
Inventor
Shuji Nakamura
Steven P. Denbaars
Shinichi Tanaka
Daniel F. Feezell
Yuji Zhao
Chih-Chien Pan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of California Berkeley
University of California, San Diego
Original Assignee
University of California Berkeley
University of California, San Diego
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of California Berkeley, University of California, San Diego filed Critical University of California Berkeley
Priority to EP12796707.3A priority Critical patent/EP2718988A2/en
Priority to JP2014514922A priority patent/JP2014518448A/en
Priority to KR1020147000277A priority patent/KR20140039032A/en
Publication of WO2012170994A2 publication Critical patent/WO2012170994A2/en
Anticipated expiration legal-status Critical
Publication of WO2012170994A3 publication Critical patent/WO2012170994A3/en
Ceased legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/811—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
    • H10H20/812—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01—Manufacture or treatment
    • H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01—Manufacture or treatment
    • H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/817—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/822—Materials of the light-emitting regions
    • H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901—Materials
    • H10P14/2907—Materials being Group IIIA-VA materials
    • H10P14/2908—Nitrides
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3202—Materials thereof
    • H10P14/3214—Materials thereof being Group IIIA-VA semiconductors
    • H10P14/3216—Nitrides
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
    • H10P14/3242—Structure
    • H10P14/3244—Layer structure
    • H10P14/3251—Layer structure consisting of three or more layers
    • H10P14/3252—Alternating layers, e.g. superlattice
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34—Deposited materials, e.g. layers
    • H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
    • H10P14/3416—Nitrides

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  • Led Devices (AREA)

Abstract

A light emitting diode structure of (Al,Ga,In)N thin films grown on a gallium nitride (GaN) semipolar substrate by metal organic chemical vapor deposition (MOCVD) that exhibits reduced droop. The device structure includes a quantum well (QW) active region of two or more periods, n-type superlattice layers (n-SLs) located below the QW active region, and p-type superlattice layers (p-SLs) above the QW active region. The present invention also encompasses a method of fabricating such a device.
PCT/US2012/041872 2011-06-10 2012-06-11 Low droop light emitting diode structure on gallium nitride semipolar substrates Ceased WO2012170994A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP12796707.3A EP2718988A2 (en) 2011-06-10 2012-06-11 Low droop light emitting diode structure on gallium nitride semipolar substrates
JP2014514922A JP2014518448A (en) 2011-06-10 2012-06-11 Low droop light emitting diode structure on gallium nitride semipolar substrate
KR1020147000277A KR20140039032A (en) 2011-06-10 2012-06-11 Low droop light emitting diode structure on gallium nitride semipolar substrates

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161495829P 2011-06-10 2011-06-10
US61/495,829 2011-06-10

Publications (2)

Publication Number Publication Date
WO2012170994A2 WO2012170994A2 (en) 2012-12-13
WO2012170994A3 true WO2012170994A3 (en) 2014-05-01

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2012/041872 Ceased WO2012170994A2 (en) 2011-06-10 2012-06-11 Low droop light emitting diode structure on gallium nitride semipolar substrates

Country Status (5)

Country Link
US (2) US8686397B2 (en)
EP (1) EP2718988A2 (en)
JP (1) JP2014518448A (en)
KR (1) KR20140039032A (en)
WO (1) WO2012170994A2 (en)

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WO2015181656A1 (en) 2014-05-27 2015-12-03 The Silanna Group Pty Limited Electronic devices comprising n-type and p-type superlattices
JP6817072B2 (en) 2014-05-27 2021-01-20 シランナ・ユー・ブイ・テクノロジーズ・プライベート・リミテッドSilanna Uv Technologies Pte Ltd Optoelectronic device
KR102212561B1 (en) 2014-08-11 2021-02-08 삼성전자주식회사 Semiconductor light emitting device and semiconductor light emitting device package
CN104868025B (en) * 2015-05-18 2017-09-15 聚灿光电科技股份有限公司 GaN base LED epitaxial structure with asymmetric superlattice layer and preparation method thereof
EP3329563A1 (en) 2015-06-05 2018-06-06 Ostendo Technologies, Inc. Light emitting structures with selective carrier injection into multiple active layers
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KR102419593B1 (en) 2017-10-23 2022-07-12 삼성전자주식회사 Light emitting diode apparatus and manufacturing method thereof
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CN110277420B (en) * 2018-03-16 2021-11-02 京东方科技集团股份有限公司 Array substrate, method for manufacturing the same, and display device
KR102474953B1 (en) * 2018-03-22 2022-12-06 엘지이노텍 주식회사 Semiconductor device
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CN110518101B (en) * 2019-09-09 2023-10-13 扬州中科半导体照明有限公司 UV LED epitaxial structure and growth method thereof
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Also Published As

Publication number Publication date
WO2012170994A2 (en) 2012-12-13
JP2014518448A (en) 2014-07-28
US20140151634A1 (en) 2014-06-05
US8686397B2 (en) 2014-04-01
US20120313076A1 (en) 2012-12-13
KR20140039032A (en) 2014-03-31
EP2718988A2 (en) 2014-04-16

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