WO2012170994A3 - Low droop light emitting diode structure on gallium nitride semipolar substrates - Google Patents
Low droop light emitting diode structure on gallium nitride semipolar substrates Download PDFInfo
- Publication number
- WO2012170994A3 WO2012170994A3 PCT/US2012/041872 US2012041872W WO2012170994A3 WO 2012170994 A3 WO2012170994 A3 WO 2012170994A3 US 2012041872 W US2012041872 W US 2012041872W WO 2012170994 A3 WO2012170994 A3 WO 2012170994A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light emitting
- emitting diode
- gallium nitride
- diode structure
- active region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/811—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
- H10H20/812—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/817—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
- H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
- H10P14/2907—Materials being Group IIIA-VA materials
- H10P14/2908—Nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3202—Materials thereof
- H10P14/3214—Materials thereof being Group IIIA-VA semiconductors
- H10P14/3216—Nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3242—Structure
- H10P14/3244—Layer structure
- H10P14/3251—Layer structure consisting of three or more layers
- H10P14/3252—Alternating layers, e.g. superlattice
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
- H10P14/3416—Nitrides
Landscapes
- Led Devices (AREA)
Abstract
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP12796707.3A EP2718988A2 (en) | 2011-06-10 | 2012-06-11 | Low droop light emitting diode structure on gallium nitride semipolar substrates |
| JP2014514922A JP2014518448A (en) | 2011-06-10 | 2012-06-11 | Low droop light emitting diode structure on gallium nitride semipolar substrate |
| KR1020147000277A KR20140039032A (en) | 2011-06-10 | 2012-06-11 | Low droop light emitting diode structure on gallium nitride semipolar substrates |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161495829P | 2011-06-10 | 2011-06-10 | |
| US61/495,829 | 2011-06-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2012170994A2 WO2012170994A2 (en) | 2012-12-13 |
| WO2012170994A3 true WO2012170994A3 (en) | 2014-05-01 |
Family
ID=47292380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2012/041872 Ceased WO2012170994A2 (en) | 2011-06-10 | 2012-06-11 | Low droop light emitting diode structure on gallium nitride semipolar substrates |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US8686397B2 (en) |
| EP (1) | EP2718988A2 (en) |
| JP (1) | JP2014518448A (en) |
| KR (1) | KR20140039032A (en) |
| WO (1) | WO2012170994A2 (en) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5426007B2 (en) | 2010-02-19 | 2014-02-26 | シャープ株式会社 | Nitride semiconductor light emitting device and method for manufacturing nitride semiconductor light emitting device |
| FR3001334B1 (en) * | 2013-01-24 | 2016-05-06 | Centre Nat De La Rech Scient (Cnrs) | PROCESS FOR PRODUCING MONOLITHIC WHITE DIODES |
| KR20140100115A (en) * | 2013-02-05 | 2014-08-14 | 삼성전자주식회사 | Semiconductor light emitting device |
| CN103236477B (en) * | 2013-04-19 | 2015-08-12 | 安徽三安光电有限公司 | A kind of LED epitaxial structure and preparation method thereof |
| WO2015089379A1 (en) * | 2013-12-13 | 2015-06-18 | The Regents Of The University Of California | High power semipolar {30-3-1} light-emitting diodes with low current droop and low thermal droop |
| US9159788B2 (en) | 2013-12-31 | 2015-10-13 | Industrial Technology Research Institute | Nitride semiconductor structure |
| US9799793B2 (en) | 2014-04-15 | 2017-10-24 | Sensor Electronics Technology, Inc. | Semiconductor heterostructure with stress management |
| US9537054B2 (en) * | 2014-04-15 | 2017-01-03 | Sensor Electronic Technology, Inc. | Semiconductor heterostructure with stress management |
| US11322643B2 (en) | 2014-05-27 | 2022-05-03 | Silanna UV Technologies Pte Ltd | Optoelectronic device |
| WO2015181657A1 (en) | 2014-05-27 | 2015-12-03 | The Silanna Group Pty Limited | Advanced electronic device structures using semiconductor structures and superlattices |
| WO2015181656A1 (en) | 2014-05-27 | 2015-12-03 | The Silanna Group Pty Limited | Electronic devices comprising n-type and p-type superlattices |
| JP6817072B2 (en) | 2014-05-27 | 2021-01-20 | シランナ・ユー・ブイ・テクノロジーズ・プライベート・リミテッドSilanna Uv Technologies Pte Ltd | Optoelectronic device |
| KR102212561B1 (en) | 2014-08-11 | 2021-02-08 | 삼성전자주식회사 | Semiconductor light emitting device and semiconductor light emitting device package |
| CN104868025B (en) * | 2015-05-18 | 2017-09-15 | 聚灿光电科技股份有限公司 | GaN base LED epitaxial structure with asymmetric superlattice layer and preparation method thereof |
| EP3329563A1 (en) | 2015-06-05 | 2018-06-06 | Ostendo Technologies, Inc. | Light emitting structures with selective carrier injection into multiple active layers |
| US10396240B2 (en) | 2015-10-08 | 2019-08-27 | Ostendo Technologies, Inc. | III-nitride semiconductor light emitting device having amber-to-red light emission (>600 nm) and a method for making same |
| KR102037225B1 (en) * | 2016-09-15 | 2019-10-30 | 일룩스 아이엔씨. | Display with surface mount emissive elements |
| KR102419593B1 (en) | 2017-10-23 | 2022-07-12 | 삼성전자주식회사 | Light emitting diode apparatus and manufacturing method thereof |
| FR3078442B1 (en) * | 2018-02-26 | 2023-02-10 | Valeo Vision | ELECTRO-LUMINESCENT LIGHT SOURCE INTENDED TO BE POWERED BY A VOLTAGE SOURCE |
| CN110277420B (en) * | 2018-03-16 | 2021-11-02 | 京东方科技集团股份有限公司 | Array substrate, method for manufacturing the same, and display device |
| KR102474953B1 (en) * | 2018-03-22 | 2022-12-06 | 엘지이노텍 주식회사 | Semiconductor device |
| US11139342B2 (en) * | 2018-09-26 | 2021-10-05 | Nitride Semiconductors Co., Ltd. | UV-LED and display |
| GB2586862B (en) * | 2019-09-06 | 2021-12-15 | Plessey Semiconductors Ltd | LED precursor incorporating strain relaxing structure |
| CN110518101B (en) * | 2019-09-09 | 2023-10-13 | 扬州中科半导体照明有限公司 | UV LED epitaxial structure and growth method thereof |
| US20240079524A1 (en) * | 2022-09-07 | 2024-03-07 | Epistar Corporation | Semiconductor device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070093073A1 (en) * | 2005-06-01 | 2007-04-26 | Farrell Robert M Jr | Technique for the growth and fabrication of semipolar (Ga,A1,In,B)N thin films, heterostructures, and devices |
| US20090212277A1 (en) * | 2008-02-22 | 2009-08-27 | Sumitomo Electric Industries, Ltd. | Group-iii nitride light-emitting device and method for manufacturing group-iii nitride based semiconductor light-emitting device |
| US20110064103A1 (en) * | 2009-08-21 | 2011-03-17 | The Regents Of The University Of California | Semipolar nitride-based devices on partially or fully relaxed alloys with misfit dislocations at the heterointerface |
| US20110073888A1 (en) * | 2009-09-30 | 2011-03-31 | Sumitomo Electric Industries, Ltd. | Group iii nitride semiconductor optical device, epitaxial substrate, and method of making group iii nitride semiconductor light-emitting device |
Family Cites Families (19)
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| US6570179B1 (en) * | 1998-01-14 | 2003-05-27 | Mp Technologies, Llc | III-V semiconductors separate confinement superlattice optoelectronic devices |
| US6906352B2 (en) | 2001-01-16 | 2005-06-14 | Cree, Inc. | Group III nitride LED with undoped cladding layer and multiple quantum well |
| US7842527B2 (en) | 2006-12-11 | 2010-11-30 | The Regents Of The University Of California | Metalorganic chemical vapor deposition (MOCVD) growth of high performance non-polar III-nitride optical devices |
| US7323721B2 (en) | 2004-09-09 | 2008-01-29 | Blue Photonics Inc. | Monolithic multi-color, multi-quantum well semiconductor LED |
| KR100752007B1 (en) | 2005-01-28 | 2007-08-28 | 도요다 고세이 가부시키가이샤 | Group ? nitride compound semiconductor light-emitting diode and method for manufacturing thereof |
| US7462884B2 (en) | 2005-10-31 | 2008-12-09 | Nichia Corporation | Nitride semiconductor device |
| JP4879563B2 (en) | 2005-11-16 | 2012-02-22 | パナソニック株式会社 | Group III nitride semiconductor light emitting device |
| JP2010518625A (en) * | 2007-02-12 | 2010-05-27 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | Cleaved facet (Ga, Al, In) N edge emitting laser diode grown on semipolar {11-2n} bulk gallium nitride substrate |
| US20080296626A1 (en) | 2007-05-30 | 2008-12-04 | Benjamin Haskell | Nitride substrates, thin films, heterostructures and devices for enhanced performance, and methods of making the same |
| JP2010534943A (en) | 2007-07-26 | 2010-11-11 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | Light emitting diode with P-type surface |
| JP2010539731A (en) | 2007-09-19 | 2010-12-16 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | (Al, In, Ga, B) N device on patterned substrate |
| US7842939B2 (en) | 2008-02-25 | 2010-11-30 | Lightwave Photonics, Inc. | Current-injecting/tunneling light-emitting device and method |
| US7976630B2 (en) * | 2008-09-11 | 2011-07-12 | Soraa, Inc. | Large-area seed for ammonothermal growth of bulk gallium nitride and method of manufacture |
| CN101874309B (en) | 2008-09-11 | 2013-01-30 | 住友电气工业株式会社 | Nitride semiconductor optical device, epitaxial wafer for nitride semiconductor optical device, and method for manufacturing semiconductor light-emitting device |
| JP5136437B2 (en) | 2009-01-23 | 2013-02-06 | 住友電気工業株式会社 | Method for fabricating nitride-based semiconductor optical device |
| US8048225B2 (en) | 2009-01-29 | 2011-11-01 | Soraa, Inc. | Large-area bulk gallium nitride wafer and method of manufacture |
| US20100309943A1 (en) | 2009-06-05 | 2010-12-09 | The Regents Of The University Of California | LONG WAVELENGTH NONPOLAR AND SEMIPOLAR (Al,Ga,In)N BASED LASER DIODES |
| JP4475357B1 (en) | 2009-06-17 | 2010-06-09 | 住友電気工業株式会社 | Group III nitride semiconductor laser device and method of manufacturing group III nitride semiconductor laser device |
| WO2011083940A2 (en) * | 2010-01-05 | 2011-07-14 | 서울옵토디바이스주식회사 | Light-emitting diode and method for manufacturing same |
-
2012
- 2012-06-11 JP JP2014514922A patent/JP2014518448A/en active Pending
- 2012-06-11 WO PCT/US2012/041872 patent/WO2012170994A2/en not_active Ceased
- 2012-06-11 EP EP12796707.3A patent/EP2718988A2/en not_active Withdrawn
- 2012-06-11 US US13/493,430 patent/US8686397B2/en active Active
- 2012-06-11 KR KR1020147000277A patent/KR20140039032A/en not_active Withdrawn
-
2014
- 2014-02-06 US US14/174,581 patent/US20140151634A1/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070093073A1 (en) * | 2005-06-01 | 2007-04-26 | Farrell Robert M Jr | Technique for the growth and fabrication of semipolar (Ga,A1,In,B)N thin films, heterostructures, and devices |
| US20090212277A1 (en) * | 2008-02-22 | 2009-08-27 | Sumitomo Electric Industries, Ltd. | Group-iii nitride light-emitting device and method for manufacturing group-iii nitride based semiconductor light-emitting device |
| US20110064103A1 (en) * | 2009-08-21 | 2011-03-17 | The Regents Of The University Of California | Semipolar nitride-based devices on partially or fully relaxed alloys with misfit dislocations at the heterointerface |
| US20110073888A1 (en) * | 2009-09-30 | 2011-03-31 | Sumitomo Electric Industries, Ltd. | Group iii nitride semiconductor optical device, epitaxial substrate, and method of making group iii nitride semiconductor light-emitting device |
Non-Patent Citations (1)
| Title |
|---|
| NAKAMURA ET AL.: "High Brightness InGaN Blue, Green and Yellow Light-Emitting Diodes with Quantum Well Structures", JPN. J. APPL. PHYS., vol. 34, 1995, pages L797 - L799, XP000702022 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012170994A2 (en) | 2012-12-13 |
| JP2014518448A (en) | 2014-07-28 |
| US20140151634A1 (en) | 2014-06-05 |
| US8686397B2 (en) | 2014-04-01 |
| US20120313076A1 (en) | 2012-12-13 |
| KR20140039032A (en) | 2014-03-31 |
| EP2718988A2 (en) | 2014-04-16 |
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