WO2014005521A1 - 一种天线反射面相位校正贴膜及反射面天线 - Google Patents

一种天线反射面相位校正贴膜及反射面天线 Download PDF

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Publication number
WO2014005521A1
WO2014005521A1 PCT/CN2013/078758 CN2013078758W WO2014005521A1 WO 2014005521 A1 WO2014005521 A1 WO 2014005521A1 CN 2013078758 W CN2013078758 W CN 2013078758W WO 2014005521 A1 WO2014005521 A1 WO 2014005521A1
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WIPO (PCT)
Prior art keywords
antenna
reflection surface
phase correction
correction film
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2013/078758
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English (en)
French (fr)
Inventor
刘若鹏
季春霖
岳玉涛
刘豫青
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Kuang Chi Innovative Technology Ltd
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Kuang Chi Innovative Technology Ltd
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Application filed by Kuang Chi Innovative Technology Ltd filed Critical Kuang Chi Innovative Technology Ltd
Priority to EP13813305.3A priority Critical patent/EP2871716B1/en
Publication of WO2014005521A1 publication Critical patent/WO2014005521A1/zh
Priority to US14/588,375 priority patent/US9825370B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/14—Reflecting surfaces; Equivalent structures
    • H01Q15/148—Reflecting surfaces; Equivalent structures with means for varying the reflecting properties
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/0006—Devices acting selectively as reflecting surface, as diffracting or as refracting device, e.g. frequency filtering or angular spatial filtering devices
    • H01Q15/0053—Selective devices used as spatial filter or angular sidelobe filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/14—Reflecting surfaces; Equivalent structures
    • H01Q15/145—Reflecting surfaces; Equivalent structures comprising a plurality of reflecting particles, e.g. radar chaff
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/14—Reflecting surfaces; Equivalent structures
    • H01Q15/16—Reflecting surfaces; Equivalent structures curved in two dimensions [2D], e.g. paraboloidal
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q19/00—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic
    • H01Q19/10—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces
    • H01Q19/12—Combinations of primary active antenna elements and units with secondary devices, e.g. with quasi-optical devices, for giving the antenna a desired directional characteristic using reflecting surfaces wherein the surfaces are concave

Definitions

  • the present invention relates to the field of metamaterials, and more particularly to an antenna reflection surface phase correction film and a reflection surface antenna.
  • Parabolic reflector antennas are an important component of electronic devices such as radar and communication.
  • the surface accuracy of the antenna reflection surface is a major factor affecting the electrical performance of the antenna gain.
  • the reflective surface of a large parabolic antenna is often assembled by dozens or even hundreds of reflective surfaces. Therefore, the installation and adjustment level of the antenna panel becomes one of the main factors affecting the accuracy of the antenna reflection surface.
  • the traditional method was to adjust the position of the antenna panel by the assembler based on the actual measured data of the panel. In this way, when the antenna panel is installed and positioned, the number of adjustments is large, and the efficiency and accuracy are low. Especially when there are many antenna panels and high precision requirements, the above problems are more prominent.
  • the antenna paraboloid design is often in accordance with the ideal paraboloid, and the feed non-point source will also cause the phase error of the electromagnetic wave exit surface.
  • the technical problem to be solved by the present invention is to provide an antenna reflection surface phase correction film capable of correcting an exit phase of a surface of a reflecting surface, in view of the defect that a conventional reflecting surface antenna easily causes a phase error of an electromagnetic wave exiting surface.
  • an antenna reflection surface phase correction film the antenna reflection surface phase correction film comprises a first substrate, a second substrate and a plurality of disposed between the first substrate and the second substrate
  • the individual micro-structure, the artificial microstructure is a wire made of a conductive material
  • the first substrate and the second substrate are flexible substrates
  • the refractive index distribution of the phase-correcting film of the antenna reflective surface is reasonably designed, so that the electromagnetic wave is reflected by the antenna After the reflection surface of the antenna of the surface phase correction film is reflected, the emitted electromagnetic wave has a flat iso-phase surface.
  • the isophase plane obtained by directly reflecting the reflection surface of the antenna is defined as the original isophase plane, and the vertical distance from any point on the original isophase plane to the ideal isophase plane is defined as ⁇ , and the emitted electromagnetic wave is at this distance.
  • the phase that passes through is, then, When the point on the original isophase plane is on the left side of the ideal isophase plane, take a positive value; when the point on the original isophase plane is on the right side of the ideal isophase plane, take a negative value;
  • the size is equivalent to the size of a single artificial microstructure; where is the angular frequency of the electromagnetic wave; c is the speed of light.
  • the antenna reflection surface phase correction film corresponds to a portion where m is equal to zero, and the refractive index thereof is a certain value "i, and the antenna reflection surface phase correction film corresponds to a portion not equal to zero, and its refractive index is "TM", and
  • the artificial microstructure has intersecting first main lines and second main lines, the first main line and the second main line are vertically halved, and the first main line and the second main line have the same length. Further, the artificial microstructures have an axisymmetric structure with the first main line and the second main line as axes of symmetry, respectively. Further, two first corner lines are connected to both ends of the first main line, the corners of the two first corner lines are 90 degrees, and the angles of the corners of the first main line and the first corner line are equally divided Lines coincide.
  • two second corner lines are connected to both ends of the second main line, the corners of the two second corner lines are 90 degrees, and the angles of the corners of the second main line and the second corner line are equally divided Lines coincide.
  • the first corner line has a first corner point, and the two ends of the first main line are respectively connected to two first corner points of the two first corner lines, and the first corner line has the same First level of length Corner edge and first vertical corner.
  • the second corner line has a second corner point, and the two ends of the second main line are respectively connected to two second corner points of the two second corner lines, and the second corner line has the same a second horizontal corner of the length and a second vertical corner.
  • first main line is connected at a midpoint of two first leg lines of the same length
  • second main line is connected at a midpoint of two second leg lines of the same length
  • two ends of each of the first branch lines are bent inwardly to extend two first fold lines
  • two ends of each of the second branch lines are bent inward to extend two second fold lines.
  • the artificial microstructure has intersecting first main lines and second main lines, two first chamfer lines are connected at two ends of the first main line, and two second chamfer lines are connected at two ends of the second main line, the first main line and the second main line
  • the two main lines are vertically halved, the first main line and the second main line have the same length, the first corner line has a first corner point, and the two ends of the first main line are respectively connected to the two first corner points of the two first chamfer lines.
  • the second angle line has a second corner point, and the two ends of the second main line are respectively connected to the two second corner points of the two second angle lines.
  • the corners of the two first chamfer lines are 90 degrees
  • the first main line coincides with the angle bisector of the corner of the first chamfer line
  • the corners of the two second chamfer lines are 90 degrees
  • the second main line and the second chamfer The corner bisector of the corner of the line coincides
  • the first angle line has a first horizontal corner and a first vertical corner of the same length
  • the second corner has a second horizontal corner and a second vertical corner of the same length
  • the first chamfer line has the same size as the second chamfer line.
  • the thickness of the artificial microstructure is the same everywhere, and the thickness thereof is
  • the line widths of the artificial microstructures are the same, and the line width is 0.08 ⁇ ⁇ W ⁇ 0.3 mm.
  • the distance between the first angle line and the adjacent second angle line is ⁇ , 0.08 mm ⁇ d ⁇ l mm;
  • the interval between two adjacent artificial microstructures is ⁇ , .08 mm ⁇ WL ⁇ l mm .
  • the distance between two adjacent artificial microstructures is further, the thickness of the first substrate and the second substrate are the same, Its thickness is 0 A mm ⁇ H ⁇ l mm.
  • the first substrate and the second substrate have the same dielectric constant, and the dielectric constant ranges from 2.5 to 2.8.
  • the first substrate and the second substrate are made of a ceramic material, an F4B composite material, an FR-4 composite material, or polystyrene.
  • the artificial microstructure is made of copper wire or silver wire, and a plurality of artificial microstructures on the first substrate are obtained by etching, electroplating, drilling, photolithography, electron engraving or ion etching.
  • the flexible substrate is a polyimide or a mylar film.
  • the antenna reflection surface phase correction film is provided with a slit.
  • the antenna reflective surface phase correcting film further includes a protective layer and/or an edge seal. Step-by-step, the antenna reflecting surface phase correcting film partially or completely covers the surface of the object to be attached.
  • the antenna reflective surface phase correcting film is connected to the surface of the object to be attached by one or more of bonding, fastener fixing, snapping and snapping.
  • the antenna reflection surface phase correction film of the invention has a specific refractive index distribution inside, so that the phase of the reflection surface can be corrected by attaching to the conventional reflection surface, and the phase error caused by the installation or the processing can be improved, thereby A flat out-of-plane phase plane is obtained, which in turn improves the far-field performance of the antenna (eg, higher gain).
  • the present invention provides a reflecting surface antenna to which the antenna reflection surface phase correcting film described above is attached.
  • FIG. 1 is a reflective surface antenna to which an antenna reflection surface phase correction film of the present invention is attached
  • FIG. 2 is an antenna of the present invention.
  • FIG. 3 is a front view of the phase-correcting film of the antenna reflecting surface shown in FIG. 2 after removing the second substrate
  • FIG. 4 is a schematic structural view of a single artificial microstructure
  • a schematic structural view of another form of artificial microstructure
  • FIG. 6 is a schematic structural view of another form of artificial microstructure according to the present invention
  • 7 is a schematic diagram showing a simulation curve of the electromagnetic response of the refractive index of the antenna reflection surface phase correcting film of the embodiment shown in FIG.
  • FIG. 8 is a schematic view showing a design method of the phase reflection film of the antenna reflection surface of the present invention.
  • the antenna reflective surface phase correction film of the present invention comprises a first substrate, a second substrate, and at least one conductive geometry disposed between the first substrate and the second substrate, wherein the first substrate and the second substrate are flexible substrates.
  • the electromagnetic wave is reflected by the antenna reflecting surface to which the antenna reflection surface phase correcting film is attached, and the emitted electromagnetic wave has an equal phase surface.
  • the conductive geometry is preferably an artificial microstructure.
  • the artificial microstructure preferably has intersecting first and second main lines, and two first auxiliary line structures respectively symmetrically disposed at opposite ends of the first main line and two second auxiliary lines respectively symmetrically disposed at opposite ends of the second main line structure.
  • first auxiliary line structure and the second auxiliary line structure are the same in size and structure.
  • first main line and the second main line are the same size and structure, and the first main line and the second main line intersect perpendicularly to the respective midpoints. It is also preferred that the artificial microstructure is axisymmetric with respect to both the first main line and the second main line.
  • the antenna reflection surface phase correction film of the invention has a specific refractive index distribution due to the conductive geometry, so that the reflection surface of the reflective surface can be corrected by attaching to the conventional antenna reflection surface, which can be improved by installation or processing.
  • the resulting phase error results in a flat out-of-plane phase plane, which in turn improves the far-field performance of the antenna (eg, higher gain).
  • the edge has a certain gap, so that the coated surface is a curved surface or an irregular shape of the antenna reflection surface waiting for the attached object, and the gap can be combined with the antenna reflection surface.
  • the antenna reflective surface phase correcting film may further include a protective layer and/or an edge seal.
  • the antenna reflective surface phase correction film further includes at least one third substrate disposed on one side of the second substrate, and at least one conductive layer is disposed between the second substrate and the third substrate and between each two adjacent third substrates geometry structure. That is to say, the conductive geometry represented by the artificial microstructure of the antenna reflection surface phase correcting film may be multi-layered.
  • the present invention also provides a reflecting surface antenna on which an antenna reflecting surface phase correcting film of the present invention is attached. An antenna reflection surface phase correction film may be completely attached to the surface of the object to be attached, for example, the entire surface of the antenna reflection surface of the reflector antenna.
  • two or more antenna reflection surface phase correction films may be attached to some or all of the surfaces of the antenna reflection surface of the reflection surface antenna.
  • the antenna reflective surface phase correcting film is connected to the surface of the object to be attached by one or more of bonding, fastener fixing, snapping and snapping.
  • the bonding method may be an adhesive
  • the fastener may be a bolt, a screw, a pin, etc.
  • the snapping may be a manner of inserting after slitting
  • the snapping may involve realizing elastic deformation of plastic or metal. Preferred embodiments of the present invention will be specifically described below with reference to FIGS. 1 through 8. As shown in FIGS.
  • an antenna reflection surface phase correction film TM includes a first substrate 1, a second substrate 2, and a plurality of artificial micrometers disposed between the first substrate 1 and the second substrate 2.
  • Structure 3 the artificial microstructure 3 is a wire made of a conductive material
  • the first substrate 1 and the second substrate 2 are flexible substrates
  • the refractive index distribution of the antenna reflection surface phase correction film TM is rationally designed, so that the electromagnetic wave passes through After the antenna reflection surface FS to which the antenna reflection surface phase correction film TM is attached is reflected, the emitted electromagnetic wave has a flat iso-phase surface.
  • the flexible substrate of the embodiment of the present invention is a polyimide or polyester film used in a conventional flexible wiring board (FPC).
  • the artificial microstructure can be a metal microstructure that can be printed in a manner similar to conventional FPC processes.
  • the artificial microstructure of the present invention is designed based on the distribution of the refractive index only with respect to the metal wiring.
  • the antenna reflection surface FS in FIG. 1 is a parabolic reflection surface, because the antenna reflection surface phase correction film TM of the embodiment of the present invention is flexible, so that the parabolic reflection surface can be well adhered, and of course, the phase reflection of the antenna reflection surface produced is obtained.
  • the film TM is planar and can be better adhered to the surface of the antenna reflecting surface FS by appropriate cutting.
  • the artificial microstructure of the embodiment of the present invention may be an artificial microstructure as shown in FIG. 4. As shown in FIG.
  • the artificial microstructure 3 has a first main line 31 and a second main line 32 which are vertically bisected with each other.
  • a main line 31 has the same length as the second main line 32.
  • the first corner line ZJX1 has a first corner point J1, and the two ends of the first main line 31 are respectively connected to the two first corners of the two first chamfer lines ZJX1.
  • the second corner line ZJX2 has a second corner point J2, and the two ends of the second main line 32 are respectively connected to the two second corner points J2 of the two second corner lines ZJX2.
  • the corners of the two first corner lines ZJX1 are 90 degrees
  • the first main line 31 coincides with the angle bisector of the corner of the first corner line ZJX1
  • the corners of the two second corner lines ZJX2 are 90 degrees
  • the second The main line 32 coincides with an angle bisector of a corner of the second corner line ZJX2
  • the first angle line ZJX1 having a first horizontal corner SP1 and a first vertical corner SZ1 of the same length
  • the angle formed by a vertical corner SZ1 is the corner of the first angle line ZJX1
  • the second corner The line ZJX2 has a second horizontal corner SP2 and a second vertical corner SZ2 of the same length
  • an angle formed by the second horizontal corner SP2 and the second vertical corner SZ2 is a corner of the second corner line ZJX2.
  • FIG. 5 shows a planar snowflake-shaped artificial microstructure having a first metal line J1 and a second metal line J2 that are vertically bisected, the first metal line J1 and the second metal.
  • the length of the line J2 is the same, the two ends of the first metal line J1 are connected with two first metal branches F1 of the same length, and the two ends of the first metal line J1 are connected at the midpoint of the two first metal branches F1.
  • Two second metal branches F2 of the same length are connected to the two ends of the second metal wire J2, and the two ends of the second metal wire J2 are connected at a midpoint of the two second metal branches F2, the first The length of the metal branch F1 and the second metal branch F2 are equal.
  • 6 is a modification of FIG. 5, the artificial microstructure 3 has a first main line 31 and a second main line 32 that are vertically bisected, and the first main line 31 and the second main line 32 have the same length, the A first leg line Z1 of the same length is connected to the two ends of the main line 31.
  • the two ends of the first main line 31 are connected at the midpoint of the two first leg lines Z1, and the two ends of the second main line 32 are connected to the same length.
  • Two second branch lines Z2 the two ends of the second main line 32 are connected at the midpoint of the two second branch lines Z2, and the lengths of the first branch line Z1 and the second branch line Z2 are equal, each of the first The two ends of the branch line Z1 are bent inwardly to extend two first fold lines ZX1, and the two ends of each of the second branch lines Z2 are bent inward to extend two second fold lines ZX2.
  • the angle formed by the first fold line ZX1 and the first branch line Z1 is ⁇
  • an angle formed by the first fold line ZX1 and the first branch line Z1 and an angle formed by the second fold line ZX2 and the second branch line Z2 are both 45 degrees. That is, the adjacent first fold line ZX1 is parallel to the second fold line ZX2.
  • 2 is a perspective view, that is, the first substrate 1 and the second substrate 2 are assumed to be transparent, and the artificial microstructure 3 is opaque.
  • the artificial microstructures 3 have the same thickness and a thickness of H 2 0. 01 mm ⁇ H 2 ⁇ 0.5 mm.
  • the artificial microstructures 3 are everywhere.
  • the line width is the same, and the line width is 0. 08 ⁇ W ⁇ 0.3 mm .
  • the distance between the first chamfer line ZJX1 and its adjacent second chamfer line ZJX2 is ⁇ .
  • the interval between two adjacent artificial microstructures 3 is ⁇ , 0.08 mm ⁇ WL ⁇ l mm .
  • WL is the distance between the first corner point J1 of one of the artificial microstructures 3 and the second corner point J2 of the other artificial microstructure 3 adjacent to the first corner point J1.
  • the distance between two adjacent artificial microstructures 3 is as shown in FIG. 3
  • L is the distance between the center points of two adjacent artificial microstructures 3, where the center point is the first main line 31 and the first The intersection of the two main lines 32.
  • the length of L is related to the incident electromagnetic wave. The usual length is less than the wavelength of the incident electromagnetic wave. For example, it can be one-fifth or one-tenth of the incident electromagnetic wave, which can produce a continuous response to the incident electromagnetic wave.
  • the artificial microstructure 3 is a wire made of a conductive material.
  • the artificial microstructure 3 made of a metal material can be obtained by etching, electroplating, drilling, photolithography, electron engraving or ion engraving.
  • a first film 1 may be coated with a copper film or a silver film of a certain thickness, and a part of the copper film or the silver film other than the plurality of artificial microstructures 3 may be removed by etching (using a chemical solution to dissolve and corrode), that is, A plurality of artificial microstructures 3 attached to the first substrate 1 are obtained.
  • the artificial microstructure 3 may also be made of other non-metallic conductive materials, such as indium tin oxide, carbon nanotubes or graphite.
  • the first substrate 1 and the second substrate 2 have the same thickness and a thickness of 1 , ⁇ ⁇ mm ⁇ H ⁇ l mm. Moreover, the first substrate i and the second substrate 2 have the same dielectric constant, and the dielectric constant ranges from 2.5 to 2.8.
  • the first substrate 1 and the second substrate 2 may be made of any dielectric material, such as a ceramic material, a polymer material, a ferroelectric material, a ferrite material or a ferromagnetic material.
  • the polymer material may be, for example, an F4B composite material, an FR-4 composite material, or a polystyrene (PS).
  • the antenna reflection surface phase correction film having the following parameters is used for simulation, and the simulation software is CST; the thickness of the first substrate 1 and the second substrate 2 is 1 mm; the first substrate 1 and the second substrate 2 are interposed A PS plastic plate with a constant electric constant of 2.7 has a loss tangent of 0.0002.
  • the distance L between two adjacent artificial microstructures 3 is 2.7 mm; the thickness H 2 of the artificial microstructures 3 is 0.018 mm;
  • the line width of the artificial microstructure 3 is 0.14 mm; the distance between the first angle line Z1 and the second angle line Z2 is 0.14 mm ; the interval WL between two adjacent artificial microstructures 3 is 0.14 mm ; for the above parameters
  • the antenna reflection surface phase correction film TM is simulated, that is, the refractive index of the antenna reflection surface phase correction film TM at different frequencies is tested, and the electromagnetic response curve of the refractive index with respect to the frequency is obtained as shown in FIG. 7 . As can be seen from Fig.
  • the antenna reflection surface phase correction film TM can have a very good low dispersion performance (i.e., stable refractive change) at a very wide frequency (0 to 10 GHz). At the same time, the antenna reflection surface phase correction film TM also has a low electromagnetic loss, and does not affect the radiation performance of the original reflection surface antenna.
  • the antenna reflection surface phase correction film according to the embodiment of the present invention is designed as needed, for example, by the following method, as shown in FIG. 8, first, the isophase plane obtained by directly reflecting the antenna reflection surface FS is defined as the original isophase plane XM.
  • ⁇ is the angular frequency of the electromagnetic wave
  • c is the speed of light.
  • the phase passed is .
  • « ; for example, point b in the figure, which is on the right side of the ideal iso-phase plane PZ, there is a phase at which the point passes at a distance of 3 ⁇ 4; where, - - ⁇ ;
  • the ideal iso-phase plane PZ is the above-mentioned flat iso-phase plane.
  • the size of the points on the isophase plane is comparable to the size of a single artificial microstructure.
  • Rate is "TM, and yes, Where ⁇ is the angular frequency of the electromagnetic wave; d is the thickness of the phase of the antenna reflective surface correction film; c is the speed of light.
  • the point on the left side of the original equal phase plane has a refractive index of less than "1" at the projection point on the antenna reflection surface phase correction film TM, and the design value of the refractive index of the points is only at any point on the original equal phase plane.
  • the vertical distance of the ideal isophase plane PZ is related to the thickness of the antenna reflection surface phase correction film.
  • the original isophase plane can be obtained by laser scanning.
  • the point on the original isophase plane is on the right side of the ideal isophase plane PZ
  • the present invention provides a reflecting surface antenna to which the antenna reflection surface phase correction film TM described above is attached.
  • the antenna may also include a feed disposed at a focus of the reflector antenna.

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Description

一种天线反射面相位校正贴膜及反射面天线 技术领域 本发明涉及超材料领域， 更具体地说， 涉及一种天线反射面相位校正贴膜及反 射面天线。 背景技术 抛物反射面天线是雷达、 通信等电子设备的重要组成部分， 天线反射面表面精 度是影响天线增益等电性能的主要因素。 目前， 随着天线口径的增大， 工作频率的 提高， 对天线反射面精度要求也越来越高。 大型抛物面天线的反射面往往由几十、 甚至几百个反射面拼装而成， 故天线面板的安装调整水平成为影响天线反射面精度 的主要因素之一。 过去传统的方法是装配人员根据面板实测数据凭经验对天线面板 的位置进行调整。 这种方式导致天线面板安装定位时， 调整次数较多， 效率和精度 较低。 特别当天线面板较多， 精度要求较高的情况下， 上述问题更加突出。 其次， 天线抛物面设计往往按照理想抛物面来， 馈源非点源也会造成电磁波出 射表面相位误差。 发明内容 本发明要解决的技术问题是， 针对现有的反射面天线容易造成电磁波出射表面 相位误差的缺陷， 提供一种能够校正反射面表面出射相位的天线反射面相位校正贴 膜。 本发明解决其技术问题所采用的技术方案是： 一种天线反射面相位校正贴膜， 天线反射面相位校正贴膜包括第一基板、 第二基板及设置在第一基板与第二基板之 间的多个人造微结构， 人造微结构为由导电材料制成的丝线， 第一基板及第二基板 为柔性基板， 合理设计天线反射面相位校正贴膜的折射率分布， 使得电磁波经过贴 附有该天线反射面相位校正贴膜的天线反射面反射后， 出射的电磁波具有平整的等 相位面。 进一步地， 定义由天线反射面直接反射后得到的等相位面为原始等相位面， 定 义原始等相位面上任一点到理想的等相位面的垂直距离为 ^ ， 出射的电磁波在 这一距离上所经过的相位为 ， 则有， 当原始等相位面上的点处于理想等相位面的左侧时， 取正值； 当原始等相位面上的点处于理想等相位面的右侧时， 取负值； 等相位面上的点的大小与单个人造微结构大小相当； 其中， 为电磁波的角频率； c为光速。 进一步地， 天线反射面相位校正贴膜对应于 m等于零的部分其折射率为一定 值" i， 天线反射面相位校正贴膜对应于 不等于零的部分其折射率为"™ ， 且有
X c
其中， ω为电磁波的角频率； d为天线反射面相位校正贴膜的厚度； c为光速。 进一步地， 所述人造微结构具有相交的第一主线和第二主线， 所述第一主线及 所述第二主线相互垂直平分， 所述第一主线与所述第二主线的长度相同。 进一步地， 所述人造微结构分别以所述第一主线和所述第二主线为对称轴成轴 对称结构。 进一步地， 所述第一主线两端连接有两个第一折角线， 所述两个第一折角线的 拐角为 90度， 所述第一主线与所述第一折角线的拐角的角平分线重合。 进一步地， 所述第二主线两端连接有两个第二折角线， 所述两个第二折角线的 拐角为 90度， 所述第二主线与所述第二折角线的拐角的角平分线重合。 进一步地， 所述第一折角线具有第一拐角点， 所述第一主线两端分别连接在两 个所述第一折角线的两个第一拐角点上， 所述第一折角线具有相同长度的第一水平 角边及第一竖直角边。 进一步地， 所述第二折角线具有第二拐角点， 所述第二主线两端分别连接在两 个所述第二折角线的两个第二拐角点上， 所述第二折角线具有相同长度的第二水平 角边及第二竖直角边。 进一步地， 所述第一主线两端连接在相同长度的两个第一支线的中点上， 所述 第二主线两端连接在相同长度的两个第二支线的中点上。 进一步地， 每一所述第一支线的两端向里弯折延伸出两个第一折线， 每一所述 第二支线的两端向里弯折延伸出两个第二折线。 进一步地， 人造微结构具有相交的第一主线及第二主线， 第一主线两端连接有 两个第一折角线， 第二主线两端连接有两个第二折角线， 第一主线及第二主线相互 垂直平分， 第一主线与第二主线的长度相同， 第一折角线具有第一拐角点， 第一主 线两端分别连接在两个第一折角线的两个第一拐角点上， 第二折角线具有第二拐角 点， 第二主线两端分别连接在两个第二折角线的两个第二拐角点上。 进一步地，两个第一折角线的拐角为 90度，第一主线与第一折角线的拐角的角 平分线重合，两个第二折角线的拐角为 90度，第二主线与第二折角线的拐角的角平 分线重合， 第一折角线具有相同长度的第一水平角边及第一竖直角边， 第二折角线 具有相同长度的第二水平角边及第二竖直角边， 第一折角线与第二折角线具有相同 的尺寸。
H 0 .01 mm≤ H < 0 .5 mm 进一步地，人造微结构各处的厚度相同，其厚度为
人造微结构各处的线宽相同， 其线宽为 ， 0.08 ^< W≤ 0.3 mm . 第一折角线与其相邻的第二折角线的距离为 ^ ， 0 .08 mm≤ d < l mm ； 并且， 相邻两个人造微结构之间的间隔为 ^ ， .08 mm≤ WL≤ l mm . 相邻两个人造微结构之间的距离为 进一步地，第一基板与第二基板厚度相同，其厚度为 ， 0 A mm≤H < l mm 。 进一步地， 第一基板与第二基板的介电常数相同， 其介电常数取值范围为 2.5-2.8。 进—步地， 第一基板及第二基板由陶瓷材料、 F4B复合材料、 FR-4复合材料或 聚苯乙烯制成。 进 -步地， 人造微结构由铜线或者银线制成， 第一基板上的多个人造微结构通 过蚀刻、 电镀、 钻刻、 光刻、 电子刻或离子刻的方法得到。 进—步地， 柔性基板为聚酰亚胺或聚脂薄膜。 进—步地， 所述天线反射面相位校正贴膜设有缝隙。 进—步地， 所述天线反射面相位校正贴膜还包括保护层和 /或封边。 进— -步地， 所述天线反射面相位校正贴膜局部或全部地覆盖待贴附的物体表面 上。 进一步地， 所述天线反射面相位校正贴膜通过粘接、 紧固件固定、 扣合和卡接 方式中的一种或多种而连接到待贴附的物体表面上。 本发明的天线反射面相位校正贴膜， 内部具有特定的折射率分布， 使得贴附在 传统的反射面上即可校正反射面表面出射相位， 可以改善由安装或者是加工带来的 相位误差， 从而得到一个平整的出射等相位面， 进而可以改进天线的远场性能 （例 如更高的增益）。 另外本发明还提供一种贴附有上述的天线反射面相位校正贴膜的反射面天线。 附图说明 下面将结合附图及实施例对本发明作进一步说明， 附图中： 图 1是贴附有本发明的天线反射面相位校正贴膜的一种反射面天线； 图 2是本发明的天线反射面相位校正贴膜的结构示意图 （透视）； 图 3是图 2所示的天线反射面相位校正贴膜去掉第二基板后的正视图； 图 4是单个人造微结构的结构示意图； 图 5是本发明另一种形式的人造微结构的结构示意图； 图 6是本发明另一种形式的人造微结构的结构示意图； 图 7是图 2所示实施例的天线反射面相位校正贴膜的折射率相对于频率的电磁 响应仿真曲线示意图； 图 8是本发明的天线反射面相位校正贴膜的设计方法示意图。 具体实施方式 本发明的天线反射面相位校正贴膜包括第一基板、 第二基板及设置在第一基板 与第二基板之间的至少一个导电几何结构， 第一基板及第二基板为柔性基板， 电磁 波经过贴附有该天线反射面相位校正贴膜的天线反射面反射后， 出射的电磁波具有 等相位面。 其中， 导电几何结构优选地为人造微结构。 人造微结构优选地具有相交的第一 主线和第二主线， 以及具有分别对称设置于第一主线两端的两个第一辅助线结构和 分别对称设置于第二主线两端的两个第二辅助线结构。 进一步优选地是， 第一辅助 线结构和第二辅助线结构的大小和结构相同。 另外优选地是， 第一主线和第二主线 的大小和结构相同， 第一主线和第二主线垂直相交于各自的中点。 还优选地是， 人 造微结构相对于第一主线和第二主线均为轴对称结构。 本发明的天线反射面相位校正贴膜， 内部由于具有导电几何结构而具有特定的 折射率分布， 使得贴附在传统的天线反射面上即可校正反射面表面出射相位， 可以 改善由安装或者是加工带来的相位误差， 从而得到一个平整的出射等相位面， 进而 可以改进天线的远场性能 （例如更高的增益）。 其中， 天线反射面相位校正贴膜摊平时， 优选其边缘具有一定的缝隙， 使得其 包覆表面为曲面或不规则形状的天线反射面等待贴附物体时， 能够通过缝隙的拼合 从而与天线反射面的表面刚好吻合。 另外， 天线反射面相位校正贴膜还可以包括保护层和 /或封边。 设置保护层和 / 或封边， 有利于天线反射面相位校正贴膜抵御外界环境的压力。 而且， 天线反射面相位校正贴膜还包括设置于第二基板一侧的至少一个第三基 板， 第二基板和第三基板之间以及每两个相邻的第三基板之间均设置至少一个导电 几何结构。 也就是说， 天线反射面相位校正贴膜的以人造微结构为代表的导电几何 结构可以是多层的。 本发明还提供反射面天线， 反射面天线的天线反射面上贴附有本发明的天线反 射面相位校正贴膜。 在待贴附的物体表面例如反射面天线的天线反射面的整个表面上可以完整地贴 附有一块的天线反射面相位校正贴膜。 但是， 也可以是两层以上的天线反射面相位 校正贴膜贴附于反射面天线的天线反射面上的局部或全部表面上。 进一步地， 所述天线反射面相位校正贴膜通过粘接、 紧固件固定、 扣合和卡接 方式中的一种或多种而连接到待贴附的物体表面上。 粘接方式可以是粘接剂， 紧固 件可以是螺栓、 螺钉、 销钉等， 卡接可以是开缝后插入的方式， 扣合则可能涉及利 用塑料或金属的弹性变形来实现。 以下将结合图 1至图 8对本发明的优选实施例进行具体说明。 如图 1至 2所示， 根据本发明实施例的天线反射面相位校正贴膜 TM包括第一 基板 1、第二基板 2及设置在第一基板 1与第二基板 2之间的多个人造微结构 3，所 述人造微结构 3为由导电材料制成的丝线， 所述第一基板 1及第二基板 2为柔性基 板， 合理设计天线反射面相位校正贴膜 TM的折射率分布， 使得电磁波经过贴附有 该天线反射面相位校正贴膜 TM的天线反射面 FS反射后， 出射的电磁波具有平整 的等相位面。 本发明实施例的柔性基板即为传统的柔性线路板 （FPC ) 所使用的聚酰亚胺或 聚酯薄膜。人造微结构可以是金属微结构，其印刷方式可以与传统的 FPC工艺类似。 只是相对于金属线路， 本发明的人造微结构是根据折射率的分布设计出来的。 图 1 中的天线反射面 FS为抛物面反射面， 因为本发明实施例的天线反射面相 位校正贴膜 TM是柔性的， 所以可以很好的贴合抛物面反射面， 当然生产得到的天 线反射面相位校正贴膜 TM则是平面的， 可以通过适当的剪裁使得更好地紧密贴附 在天线反射面 FS的表面。 本发明实施例的人造微结构可以是如图 4所示的人造微结构， 如图 4所示， 所 述人造微结构 3具有相互垂直平分的第一主线 31及第二主线 32， 所述第一主线 31 与第二主线 32的长度相同， 所述第一折角线 ZJX1具有第一拐角点 Jl， 所述第一主 线 31两端分别连接在两个第一折角线 ZJX1 的两个第一拐角点 J1上， 所述第二折 角线 ZJX2具有第二拐角点 J2， 所述第二主线 32两端分别连接在两个第二折角线 ZJX2的两个第二拐角点 J2上。 所述两个第一折角线 ZJX1的拐角为 90度， 第一主 线 31与第一折角线 ZJX1的拐角的角平分线重合， 所述两个第二折角线 ZJX2的拐 角为 90度， 第二主线 32与第二折角线 ZJX2的拐角的角平分线重合， 所述第一折 角线 ZJX1具有相同长度的第一水平角边 SP1及第一竖直角边 SZ1， 第一水平角边 SP1及第一竖直角边 SZ1所成的夹角即为第一折角线 ZJX1的拐角， 所述第二折角 线 ZJX2具有相同长度的第二水平角边 SP2及第二竖直角边 SZ2，第二水平角边 SP2 及第二竖直角边 SZ2所成的夹角即为第二折角线 ZJX2的拐角。 另外， 所述第一折 角线 ZJX1与第二折角线 ZJX2具有相同的尺寸。 当然本发明的人造微结构还可以是图 5及图 6所示形态的人造微结构。 图 5所示为平面雪花状的人造微结构， 所述的雪花状的人造微结构具有相互垂 直平分的第一金属线 J1及第二金属线 J2，所述第一金属线 J1与第二金属线 J2的长 度相同， 所述第一金属线 J1两端连接有相同长度的两个第一金属分支 Fl， 所述第 一金属线 J1两端连接在两个第一金属分支 F1的中点上，所述第二金属线 J2两端连 接有相同长度的两个第二金属分支 F2， 所述第二金属线 J2两端连接在两个第二金 属分支 F2的中点上， 所述第一金属分支 F1与第二金属分支 F2的长度相等。 图 6为图 5的一种变形形式， 所述人造微结构 3具有相互垂直平分的第一主线 31及第二主线 32， 所述第一主线 31与第二主线 32的长度相同， 所述第一主线 31 两端连接有相同长度的两个第一支线 Zl， 所述第一主线 31两端连接在两个第一支 线 Z1的中点上，所述第二主线 32两端连接有相同长度的两个第二支线 Z2， 所述第 二主线 32两端连接在两个第二支线 Z2的中点上， 所述第一支线 Z1与第二支线 Z2 的长度相等， 每一所述第一支线 Z1 的两端向里弯折延伸出两个第一折线 ZX1 , 每 一所述第二支线 Z2的两端向里弯折延伸出两个第二折线 ZX2。 本实施例中， 所述 第一折线 ZX1与第一支线 Z1所成的夹角为 ^ ， 所述第二折线 ZX2与第二支线 Z2 所成的夹角为 ， 且有， θ ι= θ2 ； ≤45。 。 优选地，所述第一折线 ZX1与第一支线 Z1所成的夹角 及所述第二折线 ZX2 与第二支线 Z2所成的夹角 均为 45度。 即相邻的第一折线 ZX1与第二折线 ZX2 平行。 图 2为透视图， 即假定第一基板 1与第二基板 2透明， 人造微结构 3不透明。 本发明例中， 如图 3及图 4所示， 所述人造微结构 3各处的厚度相同， 其厚度 为 H 2 0 . 01 mm≤ H 2≤ 0.5 mm . 所述人造微结构 3各处的线宽相同， 其线宽为 ， 0. 08 ^< W≤ 0.3 mm . 所述第一折角线 ZJX1 与其相邻的第二折角线 ZJX2 的距离为 ^ ，
Figure imgf000010_0001
并且， 相邻两个人造微结构 3之间的间隔为 ^ ， 0 .08 mm≤ WL≤ l mm . 如图
3所示， WL 即为其中一个人造微结构 3的第一拐角点 J1与另一个人造微结构 3的 与该第一拐角点 J1相邻的第二拐角点 J2的距离。 相邻两个人造微结构 3之间的距离为 如图 3所示， L即 为相邻两个人造微结构 3中心点之间的距离，此处的中心点即为第一主线 31与第二 主线 32的交点。 L的长度与入射电磁波有关， 通常 的长度小于入射电磁波的波 长， 例如 可以是入射电磁波的五分之一或十分之一， 这样可以对入射电磁波产生 连续的响应。 本发明实施例中， 所述人造微结构 3为由导电材料制成的丝线。 例如铜线、 银 线及其它金属线， 采用金属材料制成的人造微结构 3， 可以通过蚀刻、 电镀、 钻刻、 光刻、 电子刻或离子刻的方法得到。 例如， 可以在第一基板 1上覆上一定厚度的铜 膜或银膜， 再利用蚀刻的方法去掉多个人造微结构 3以外的部分铜膜或银膜 （利用 化学溶液溶解腐蚀）， 即能得到附着在第一基板 1上的多个人造微结构 3。 另外， 人造微结构 3还可以由其它非金属的导电材料制成， 例如， 铟锡氧化物、 碳纳米管或者石墨等。 本发明实施例中， 所述第一基板 1 与第二基板 2 厚度相同， 其厚度为 1 ， ^ ^ mm≤H < l mm 。 并且， 所述第一基板 i与第二基板 2的介电常数相同， 其介 电常数取值范围为 2.5-2.8。 本发明实施例中， 第一基板 1及第二基板 2可以由任意的介电材料制成， 例如 陶瓷材料、 高分子材料、 铁电材料、 铁氧材料或铁磁材料。 高分子材料， 例如可以 有 F4B复合材料、 FR-4复合材料或聚苯乙烯 （PS) 等。 本发明实施例中， 采用具有如下参数的天线反射面相位校正贴膜进行仿真， 仿 真软件为 CST; 第一基板 1与第二基板 2的厚度为 1mm; 第一基板 1与第二基板 2为介电常数 为 2.7的 PS塑料板， 损耗正切为 0.0002。 相邻两个人造微结构 3之间的距离 L为 2.7mm; 人造微结构 3的厚度 H2 为 0.018mm; 人造微结构 3的线宽 为 0.14mm; 第一折角线 Z1与第二折角线 Z2的距离 为 0.14mm; 相邻两个人造微结构 3之间的间隔 WL为 0.14mm; 对具有上述参数的天线反射面相位校正贴膜 TM进行仿真， 即测试该天线反射 面相位校正贴膜 TM在不同频率下的折射率， 得到折射率相对于频率的电磁响应曲 线如图 7所示。 由图 7可知， 所述天线反射面相位校正贴膜 TM能在非常宽的一段 频率上 （0~10GHz)有很好的低色散性能（即折射变化稳定）。 同时， 该天线反射面 相位校正贴膜 TM还具有很低的电磁损耗， 不会对原来的反射面天线的辐射性能产 生影响。 本发明实施例的天线反射面相位校正贴膜根据需要设计， 例如可通过以下方法 设计， 如图 8所示， 首先， 定义由天线反射面 FS直接反射后得到的等相位面为原始 等相位面 XM， 定义原始等相位面 XM上任一点 （例如图中的 a点及 b点） 到理想 的等相位面 PZ的垂直距离为 D m，出射的电磁波在 D m这一距离上所经过的相位为 X- ， 则有，
其中， ω为电磁波的角频率； c为光速。 当原始等相位面上的点处于理想等相位面 ΡΖ的左侧时， 取正值， 当原始等相位面上的点处于理想等相位面 PZ的右侧时， 取负值； 例如图中的 a点， 其在理想等相位面 PZ的左侧， 则有该点在 ^。这一距离上所 coD
经过的相位为 。 ； 其中， «= ； 再例如图中的 b点， 其在理想等相位面 PZ的右侧， 则有该点在 ¾这一距离上 所经过的相位为 ; 其中， = -^ ; 本发明实施例中， 理想等相位面 PZ 即为上述的平整的等相位面。 等相位面上 的点的大小与单个人造微结构大小相当。 其次， 设计所述天线反射面相位校正贴膜对应于 等于零的部分其折射率为 一定值 "ι， 即 ^ »=() ; 设计所述天线反射面相位校正贴膜对应于 m不等于零的 部分其折射率为"™ ， 且有，
Figure imgf000012_0001
其中， ω为电磁波的角频率； d为天线反射面相位校正贴膜的厚度； c为光速。 当原始等相位面上的点处于理想等相位面 PZ 的左侧时，
式 （1) 代入公式 （2) 中， 简化公式， 得到： n, (3)；
Figure imgf000012_0002
即处于原始等相位面上左侧的点其在天线反射面相位校正贴膜 TM上的投影点 的折射率小于 "1。且该些点的折射率的设计值只与原始等相位面上任一点到理想的 等相位面 PZ的垂直距离为 以及天线反射面相位校正贴膜的厚度 相关。 原始 等相位面可通过激光扫描的方式获得。 当原始等相位面上的点处于理想等相位面 PZ 的右侧时， 取负值， 将公式 式 （1) 代入公式 （2) 中， 简化公式， 得到：
D
(4); 即处于原始等相位面上左侧的点其在天线反射面相位校正贴膜 TM上的投影点 的折射率大于 "1 。 以 a点及 b点为例， 对应于 a点， 则有: n = η ,— 对应于 b点， 则有:
Figure imgf000013_0001
因此， 知道了 a 、 Db (通过激光扫描获得）， 以及确定了" 1及 值， 就可 以设计出"。、 nb， 以使得 a点及 b点通过校正后的两个点会处于理想等相位面 PZ 上。 依此类推， 可以校正整个原始等相位面， 使得最终的等相位面与理想的等相位 面 PZ重合， 即完成了对特定反射面天线的相位校正。 另外本发明还提供一种贴附有上述的天线反射面相位校正贴膜 TM的反射面天 线。 所述天线还可以包括馈源， 馈源设置在反射面天线的焦点上。 上面结合附图对本发明的实施例进行了描述， 但是本发明并不局限于上述的具 体实施方式， 上述的具体实施方式仅仅是示意性的， 而不是限制性的， 本领域的普 通技术人员在本发明的启示下， 在不脱离本发明宗旨和权利要求所保护的范围情况 下， 还可做出很多形式， 这些均属于本发明的保护之内。

Claims

权 利 要 求 书 一种天线反射面相位校正贴膜， 其特征在于， 所述天线反射面相位校正贴膜 包括第一基板、 第二基板及设置在所述第一基板与所述第二基板之间的至少 一个导电几何结构， 电磁波经过贴附有该天线反射面相位校正贴膜的天线反 射面反射后， 出射的电磁波具有等相位面。 根据权利要求 1所述的天线反射面相位校正贴膜， 其特征在于， 所述导电几 何结构为人造微结构。 一种天线反射面相位校正贴膜， 其特征在于， 所述天线反射面相位校正贴膜 包括第一基板、 第二基板及设置在所述第一基板与所述第二基板之间的多个 人造微结构， 所述人造微结构为由导电材料制成的丝线， 所述第一基板及所 述第二基板为柔性基板， 合理设计天线反射面相位校正贴膜的折射率分布， 使得电磁波经过贴附有该天线反射面相位校正贴膜的天线反射面反射后， 出 射的电磁波具有平整的等相位面。 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 定义由天线 反射面直接反射后得到的等相位面为原始等相位面， 定义所述原始等相位面 上任一点到理想的等相位面的垂直距离为 β«， 出射的电磁波在 ^这一距 离上所经过的相位为 ， 则有，
coD
X = ± ~ .
m c ' 当所述原始等相位面上的点处于所述理想等相位面的左侧时， 取正 值； 当所述原始等相位面上的点处于所述理想等相位面的右侧时， 取负 值；
等相位面上的点的大小与单个人造微结构大小相当； 其中， ω为电磁波的角频率； c为光速。 根据权利要求 4所述的天线反射面相位校正贴膜， 其特征在于， 所述天线反 射面相位校正贴膜对应于 等于零的部分其折射率为一定值" 1，所述天线 反射面相位校正贴膜对应于 A 不等于零的部分其折射率为" m ， 且有， n _― n , .
m 1 c« 2d ' 其中， ω为电磁波的角频率； d为天线反射面相位校正贴膜的厚度；
c为光速。
6、 根据权利要求 4或 5所述的天线反射面相位校正贴膜， 其特征在于， 所述人 造微结构具有相交的第一主线和第二主线， 所述第一主线及所述第二主线相 互垂直平分， 所述第一主线与所述第二主线的长度相同。
7、 根据权利要求 6所述的天线反射面相位校正贴膜， 其特征在于， 所述人造微 结构分别以所述第一主线和所述第二主线为对称轴成轴对称结构。
8、 根据权利要求 6所述的天线反射面相位校正贴膜， 其特征在于， 所述第一主 线两端连接有两个第一折角线，所述两个第一折角线的拐角为 90度，所述第 一主线与所述第一折角线的拐角的角平分线重合。
9、 根据权利要求 8所述的天线反射面相位校正贴膜， 其特征在于， 所述第二主 线两端连接有两个第二折角线，所述两个第二折角线的拐角为 90度，所述第 二主线与所述第二折角线的拐角的角平分线重合。
10、 根据权利要求 9所述的天线反射面相位校正贴膜， 其特征在于， 所述第一折 角线具有第一拐角点， 所述第一主线两端分别连接在两个所述第一折角线的 两个第一拐角点上， 所述第一折角线具有相同长度的第一水平角边及第一竖 直角边。
11、 根据权利要求 10所述的天线反射面相位校正贴膜，其特征在于，所述第二折 角线具有第二拐角点， 所述第二主线两端分别连接在两个所述第二折角线的 两个第二拐角点上， 所述第二折角线具有相同长度的第二水平角边及第二竖 直角边。 12、 根据权利要求 6所述的天线反射面相位校正贴膜， 其特征在于， 所述第一主 线两端连接在具有相同长度的两个第一支线的中点上， 所述第二主线两端连 接在具有相同长度的两个第二支线的中点上。 、 根据权利要求 12所述的天线反射面相位校正贴膜，其特征在于，每一所述第 一支线的两端向里弯折延伸出两个第一折线， 每一所述第二支线的两端向里 弯折延伸出两个第二折线。 、 根据权利要求 11所述的天线反射面相位校正贴膜，其特征在于，所述人造微 结构各处的厚度相同， 其厚度为 ^ ， .0lmm≤ H2≤ 0.5mm； 所述人造微结构各处的线宽相同，其线宽为 ， 0.08^≤ W≤ 0.3mm
所述第一折角线与其相邻的第二折角线的距离为 ^ ， 0.08 d-< 1 mm ， 并且， 相邻两个人造微结构之间的间隔为 ^ ， 0.08mm≤ WL≤ lmm . 相邻两个人造微结构之间的距离为 L， lmm≤ L≤ 30 mm。 、 根据权利要求 11所述的天线反射面相位校正贴膜，其特征在于，所述第一基 板与所述第二基板厚度相同， 其厚度为 ， 0A mm≤ H < lmm 。 、 根据权利要求 14所述的天线反射面相位校正贴膜，其特征在于，所述第一基 板与所述第二基板的介电常数相同， 其介电常数取值范围为 2.5-2.8。 、 根据权利要求 16所述的天线反射面相位校正贴膜，其特征在于，所述第一基 板及所述第二基板由陶瓷材料、 F4B复合材料、 FR-4复合材料或聚苯乙烯制 成。 、 根据权利要求 13所述的天线反射面相位校正贴膜，其特征在于，所述第一折 线与第一支线所成的夹角为 ^ ，所述第二折线与第二支线所成的夹角为 ， 且有， θ = θ2 . θ < 45° 。 、 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述人造微 结构由铜线或者银线制成， 所述第一基板上的多个人造微结构通过蚀刻、 电 镀、 钻刻、 光刻、 电子刻或离子刻的方法得到。 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述柔性基 板为聚酰亚胺或聚脂薄膜。 、 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述天线反 射面相位校正贴膜设有缝隙。
、 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述天线反 射面相位校正贴膜还包括保护层和 /或封边。
、 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述天线反 射面相位校正贴膜局部或全部地覆盖待贴附的物体表面上。 、 根据权利要求 3所述的天线反射面相位校正贴膜， 其特征在于， 所述天线反 射面相位校正贴膜通过粘接、 紧固件固定、 扣合和卡接方式中的一种或多种 而连接到待贴附的物体表面上。 、 一种反射面天线， 其特征在于， 所述反射面天线的天线反射面上贴附有权利 要求 1至 24中任意一项所述的天线反射面相位校正贴膜。
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US9825370B2 (en) 2017-11-21
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US20150155635A1 (en) 2015-06-04
EP2871716B1 (en) 2021-09-22
CN102820544A (zh) 2012-12-12

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