WO2014193750A1 - Automatic detection of regular patterns of features - Google Patents
Automatic detection of regular patterns of features Download PDFInfo
- Publication number
- WO2014193750A1 WO2014193750A1 PCT/US2014/039315 US2014039315W WO2014193750A1 WO 2014193750 A1 WO2014193750 A1 WO 2014193750A1 US 2014039315 W US2014039315 W US 2014039315W WO 2014193750 A1 WO2014193750 A1 WO 2014193750A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- pattern
- points
- data processing
- processing system
- indicated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—Two-dimensional [2D] image generation
- G06T11/20—Drawing from basic elements
Definitions
- Figure 2 illustrates a flowchart of a process in accordance with disclosed embodiments
- Figure 3B illustrates the projection of the assigned points of features into a plane, in accordance with disclosed embodiments
- Figure 4 illustrates an example of a set of 2D points corresponding to a geometric model that can be processed in accordance with disclosed embodiments
- Figures 5A-5D illustrate examples of pattern indicators in accordance with disclosed embodiment
- Figure 6 illustrates one technique for calculating the center for the circular indicator, in accordance with disclosed embodiments.
- FIGS 7A-7J illustrate an example of the results and advantages of an iterative process as described herein.
- FIGURES 1 through 7J discussed below, and the various embodiments used to describe the principles of the present disclosure in this patent document are by way of illustration only and should not be construed in any way to limit the scope of the disclosure. Those skilled in the art will understand that the principles of the present disclosure may be implemented in any suitably arranged device. The numerous innovative teachings of the present application will be described with reference to exemplary non-limiting embodiments.
- CAD and other systems can maintain grids or patterns of features, which will be referred to generically as "patterns" herein.
- patterns refer to a structured organization of features of a geometric model with respect to each other. These features can be any elements of a geometric model maintained in a PDM or other system.
- Various systems include methods for patterns of features to be created and explicitly labeled and so function as part of the system.
- models may contain implicit patterns, not explicitly labeled, and which cannot, therefore, function properly in the system. These may arise in many ways including but not limited to data imported from a different system, features within models generated in earlier versions of the system, models created via un-conventional, indirect or obscure methods, and others.
- Disclosed embodiments include systems and methods for automatically recognizing rectangular, circular, and linear patterns between features of geometric models.
- FIG. 1 illustrates a block diagram of a data processing system in which an embodiment can be implemented, for example as a CAD system particularly configured by software or otherwise to perform the processes as described herein, and in particular as each one of a plurality of interconnected and communicating systems as described herein.
- the data processing system depicted includes a processor 102 connected to a level two cache/bridge 104, which is connected in turn to a local system bus 106.
- Local system bus 106 may be, for example, a peripheral component interconnect (PCI) architecture bus.
- PCI peripheral component interconnect
- main memory 108 Also connected to local system bus in the depicted example are a main memory 108 and a graphics adapter 1 10.
- the graphics adapter 1 10 may be connected to display 1 1 1.
- Peripherals such as local area network (LAN) / Wide Area Network / Wireless (e.g. WiFi) adapter 1 12, may also be connected to local system bus 106.
- Expansion bus interface 1 14 connects local system bus 106 to input/output (I/O) bus 1 16.
- I/O bus 1 16 is connected to keyboard/mouse adapter 1 18, disk controller 120, and I/O adapter 122.
- Disk controller 120 can be connected to a storage 126, which can be any suitable machine usable or machine readable storage medium, including but not limited to nonvolatile, hard-coded type mediums such as read only memories (ROMs) or erasable, electrically programmable read only memories (EEPROMs), magnetic tape storage, and user-recordable type mediums such as floppy disks, hard disk drives and compact disk read only memories (CD-ROMs) or digital versatile disks (DVDs), and other known optical, electrical, or magnetic storage devices.
- ROMs read only memories
- EEPROMs electrically programmable read only memories
- CD-ROMs compact disk read only memories
- DVDs digital versatile disks
- a data processing system in accordance with an embodiment of the present disclosure includes an operating system employing a graphical user interface.
- the operating system permits multiple display windows to be presented in the graphical user interface simultaneously, with each display window providing an interface to a different application or to a different instance of the same application.
- a cursor in the graphical user interface may be manipulated by a user through the pointing device. The position of the cursor may be changed and/or an event, such as clicking a mouse button, generated to actuate a desired response.
- One of various commercial operating systems such as a version of Microsoft WindowsTM, a product of Microsoft Corporation located in Redmond, Wash, may be employed if suitably modified.
- the operating system is modified or created in accordance with the present disclosure as described.
- Disclosed embodiments can analyze a geometric model including a plurality of features and automatically recognize patterns between the features.
- Figure 2 illustrates a flowchart of a process in accordance with disclosed embodiments that may be performed, for example, by one or more CAD systems (referred to generically below as the "system"); other figures are used in the description below to illustrate aspects or examples of such a process.
- CAD systems referred to generically below as the "system”
- the system receives a set of two-dimensional 2D points representing at least a portion of a geometric model (205).
- Receiving can include loading from storage, receiving from another device or process, receiving via an interaction with a user, preprocessing other data to produce the received data, or otherwise.
- Figure 3B illustrates the projection of the assigned points of features 320 into a plane 322. Projected points 324 correspond to the location of the points on each of the features 320.
- the system can then find rectangular, linear, circular, or other patterns within the points.
- the system identifies the nearest "neighbor” points for each point in the set (210).
- the term "neighbor,” as used herein, refers to one or more points closest to one or more points comprising a set of points.
- the number of nearest neighbors identified for each point can depend on the "indicators” selected, as described below, or can include any number of neighbors.
- Indicators, such as pattern indicators recognized by the system include but are not limited to, rectangular pattern indicators, linear pattern indicators, circular pattern indicators, and skew pattern indicators; other pattern indicators are contemplated.
- the identification process 210 can include determining the distance and direction (together, the vector) from each point to its neighbor points.
- the system finds indicated patterns among the set of points (215). For each point in the set, the system determines whether it and its nearest neighbors indicate any patterns. Note that a single point can indicate multiple pattern types. The system can receive a user selection of pattern indicators to apply so that only certain types of patterns are identified or can apply any or all pattern indicators. [0040] The pattern indicators indicate a pattern among the points. Each point is checked against its nearest neighbors to see if it indicates a pattern. If it does then the information about this pattern (e.g. type, spacing, directions) can be stored together with an identification of the point that first indicated it (origin), as described below.
- This pattern e.g. type, spacing, directions
- Figures 5A-5D illustrate examples of pattern indicators in accordance with disclosed embodiment. These indicators are not limiting, and other indicators of patterns between points can be used.
- Fig. 5A illustrates an example of a rectangular pattern indicator.
- point P is the point being processed.
- the vectors A and B from P to its nearest neighbors are found.
- Vectors A and B are orthogonal (90 degrees) to each other, and form an example of a rectangular pattern indicator.
- regular distances can include multiples of a regular distance without a point at each interval. For example, this is intended to include the case where a first neighboring point is at a distance X, and the next point in the pattern, in the same direction, is at distance 4X, even if there were no points in the set at distances 2X or 3X.
- Fig. 5B illustrates an example of a linear pattern indicator.
- point P is the point being processed.
- the vectors A and B from P to its nearest neighbors are found.
- Vectors A and B are linear (180 degrees, in line) to each other and of equal magnitude, and form an example of a linear pattern indicator.
- the linear pattern can therefore be identified by a plurality of points in the set at regular distances from and in line with the given point P within a 2D plane.
- Fig. 5C illustrates an example of a circular pattern indicator.
- point P is the point being processed.
- the vectors A and B from P to its nearest neighbors are found.
- Vectors A and B are the same magnitude as each other; that is, the neighbor points to P are of equal distance from P.
- the system can calculate the center C, radius r, and angle ⁇ between successive pattern elements with respect to the center of an indicated pattern from the points A, B, and P.
- a circular pattern can therefore be identified by a plurality of points in the set at regular distances from each other and that each lie along an arc of a circle with a common center C (though the circle and its center are not part of the points or the model).
- Fig. 5D illustrates an example of a "skew" pattern indicator.
- Skew patterns are a natural extension of rectangular patterns where the angle between the directions is varied from 90 degrees, so the vectors are not orthogonal to each other.
- a skew pattern can be identified by a plurality of points in the set at regular distances from and in line with a given point in two directions within the 2D plane.
- point P is the point being processed.
- the vectors A and B from P to its nearest neighbors are found.
- Vectors A and B are not orthogonal to each other, and form an example of a skew pattern indicator.
- a skew pattern can be identified by a plurality of points in the set at regular distances from and in line with a given point in two directions within the 2D plane..
- Figure 6 illustrates one technique for calculating the center C for the circular indicator, given point P, vector A from point P to neighboring point P2, and vector B from point P to neighboring point PI .
- the system can define a line PLl as the bisector of vector B at midpoint ml , orthogonal to vector B.
- the system can define a line PL2 as the bisector of vector A at midpoint m2, orthogonal to vector A.
- the center C of the circle pattern is the intersection of PLl and PL2.
- the system can store x and y spacing, and x and y directions.
- the first point that indicated this pattern can be used as the origin (which is stored as origin for the first point).
- Rectangular patterns indicate the same pattern as a previous pattern when their respective patterns fall on one another, so x and y spacing is equal, x and y directions parallel respectively (and orthogonal to each other), and the origin of each lies on the pattern of the other.
- the system can store spacing, direction and origin.
- the first point that indicated this pattern can be used as the origin (which is stored as origin for the first point).
- Linear patterns indicate the same pattern as a previous pattern when their respective patterns fall on one another, so the spacing between points is equal, the vector directions are parallel, and the origin of each lies on the pattern of the other.
- the system can store center, angular spacing, direction, and origin.
- the first point that indicated this pattern can be used as the origin (which is stored as origin for the first point).
- Circular patterns indicate the same pattern as a previous pattern when their respective patterns fall on one another, so the angle spacings ⁇ are equal, the centers C are equal, the radii r (center to origin distance) are equal, and the origin of each lies on the pattern of the other.
- the circular pattern does not require a full "set" of points to complete a circle.
- the system can consolidate found linear patterns into rectangular patterns (220).
- the pattern-finding process can occasionally generate what would ideally be rectangular patterns as individual linear patterns. In such cases, the system can correct this and combine such cases into rectangular patterns.
- the system can select a primary pattern (225). From all indicated patterns, at this stage, the system can select a primary pattern.
- the primary pattern can be selected from the indicated patterns in various ways to meet particular demands. For example, one criterion for selecting the primary pattern can be the pattern containing the largest number of points. In many cases, when selecting a primary pattern, any indicated patterns with three points or less are ignored.
- Figure 7C illustrates an example of the remaining set of points after the rectangular pattern identified in the first iteration (as illustrated in Fig. 7B) are removed from the input set of points after the first iteration. These remaining points 704 are input to the second iteration. Note that, for illustrative purposes, the features or points for the pattern are actually removed from the illustrated model; in a typical implementation, however, these features or points only removed from consideration in the data, and are not included in the set of points passed to the next iteration of the process.
- Figure 7E illustrates an example of the remaining set of points after the rectangular pattern identified in the second iteration (as illustrated in Fig. 7D) are also removed from the set of points being processed. These remaining points are input to the third iteration.
- Figure 7J illustrates an example of a circular pattern identified in the fifth iteration of a process as described herein, such as illustrated at 712. Note that this pattern may not have been identified in the first iteration because the now-removed points obscured the pattern when processed as neighboring points.
- the system can first find rectangular and circular patterns, remove them from the input set of points, and then search for linear pattern in remaining data in a subsequent iteration.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- Evolutionary Computation (AREA)
- Computer Hardware Design (AREA)
- Processing Or Creating Images (AREA)
- Image Analysis (AREA)
- User Interface Of Digital Computer (AREA)
- Image Processing (AREA)
- Architecture (AREA)
- Software Systems (AREA)
Abstract
Description
Claims
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111523212.4A CN114186294A (en) | 2013-05-31 | 2014-05-23 | Automatic detection of regular patterns of features |
| EP14804913.3A EP3005237B1 (en) | 2013-05-31 | 2014-05-23 | Automatic detection of regular patterns of features |
| CN201480031126.3A CN105229672A (en) | 2013-05-31 | 2014-05-23 | Automatic detection of regular patterns of features |
| RU2015156064A RU2633167C2 (en) | 2013-05-31 | 2014-05-23 | Automatic detection of regular figures from elements |
| JP2016516703A JP6049944B2 (en) | 2013-05-31 | 2014-05-23 | Automatic detection of feature patterns |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/907,034 | 2013-05-31 | ||
| US13/907,034 US20140355888A1 (en) | 2013-05-31 | 2013-05-31 | Automatic detection of regular patterns of features |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2014193750A1 true WO2014193750A1 (en) | 2014-12-04 |
Family
ID=51985181
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2014/039315 Ceased WO2014193750A1 (en) | 2013-05-31 | 2014-05-23 | Automatic detection of regular patterns of features |
| PCT/US2015/018427 Ceased WO2015142510A1 (en) | 2013-05-31 | 2015-03-03 | Multi-level structures in cad models |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2015/018427 Ceased WO2015142510A1 (en) | 2013-05-31 | 2015-03-03 | Multi-level structures in cad models |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20140355888A1 (en) |
| EP (1) | EP3005237B1 (en) |
| JP (1) | JP6049944B2 (en) |
| CN (2) | CN105229672A (en) |
| RU (1) | RU2633167C2 (en) |
| WO (2) | WO2014193750A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20240095226A1 (en) * | 2022-09-15 | 2024-03-21 | Rodney Kuhn Haffnerson King | Methods and related devices for storing and accessing data using multi-level fractal grids |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002013137A2 (en) | 2000-08-07 | 2002-02-14 | Electro Scientific Industries, Inc. | Polygon finder and pruned tree geometric match method |
| US20040070800A1 (en) * | 2002-10-15 | 2004-04-15 | Dai Nippon Printing Co., Ltd. | Holographic fine-line Pattern |
| US20070196017A1 (en) * | 2006-02-17 | 2007-08-23 | Sharp Kabushiki Kaisha | Management information adding method and image forming apparatus |
| US20080219565A1 (en) * | 2007-03-06 | 2008-09-11 | Kabushiki Kaisha Toshiba | Training device and pattern recognizing device |
| US20090220142A1 (en) * | 2008-02-29 | 2009-09-03 | Hiroshi Matsushita | Linear pattern detection method and apparatus |
| US20130058574A1 (en) * | 2010-01-21 | 2013-03-07 | Universite Paris 13 | Method for segmenting images, computer program, and corresponding computer system |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH077448B2 (en) * | 1987-10-08 | 1995-01-30 | 日立ソフトウェアエンジニアリング株式会社 | Arc part recognition method |
| JPH01180680A (en) * | 1988-01-13 | 1989-07-18 | Ricoh Co Ltd | Line figure approximation method |
| JPH01282684A (en) * | 1988-05-10 | 1989-11-14 | Ricoh Co Ltd | Approximation error correction method for line figures |
| KR950013127B1 (en) * | 1993-03-15 | 1995-10-25 | 김진형 | English Character Recognition Method and System |
| US6122628A (en) * | 1997-10-31 | 2000-09-19 | International Business Machines Corporation | Multidimensional data clustering and dimension reduction for indexing and searching |
| US7643968B1 (en) * | 2002-02-25 | 2010-01-05 | Autodesk, Inc. | Method and apparatus for simplified patterning of features in a computer aided design (CAD) model |
| RU2406136C2 (en) * | 2006-06-09 | 2010-12-10 | Кейденс Дизайн Системс, Инк. | Method and mechanism of extracting and identifying polygons when designing integrated circuits |
| US8041120B2 (en) * | 2007-06-26 | 2011-10-18 | Microsoft Corporation | Unified digital ink recognition |
| US8457405B2 (en) * | 2007-08-31 | 2013-06-04 | Adobe Systems Incorporated | Example-based procedural synthesis of element arrangements |
| US8116553B2 (en) * | 2007-10-03 | 2012-02-14 | Siemens Product Lifecycle Management Software Inc. | Rotation invariant 2D sketch descriptor |
| US9400853B2 (en) * | 2010-05-05 | 2016-07-26 | Siemens Product Lifecycle Management Software Inc. | System and method for identifying under-defined geometries due to singular constraint schemes |
| US8605093B2 (en) * | 2010-06-10 | 2013-12-10 | Autodesk, Inc. | Pipe reconstruction from unorganized point cloud data |
| US9058687B2 (en) * | 2011-06-08 | 2015-06-16 | Empire Technology Development Llc | Two-dimensional image capture for an augmented reality representation |
| US9122818B2 (en) * | 2012-06-21 | 2015-09-01 | Siemens Product Lifecycle Management Software Inc. | Representation and discovery of geometric relationships in a three dimensional model |
| US9141731B2 (en) * | 2012-06-21 | 2015-09-22 | Siemens Product Lifecycle Management Software Inc. | Symmetry of discovered geometric relationships in a three dimensional model |
| US10176291B2 (en) * | 2012-07-06 | 2019-01-08 | Siemens Product Lifecycle Management Software Inc. | Ordering optional constraints in a variational system |
-
2013
- 2013-05-31 US US13/907,034 patent/US20140355888A1/en not_active Abandoned
-
2014
- 2014-03-17 US US14/216,073 patent/US20150261890A1/en not_active Abandoned
- 2014-05-23 EP EP14804913.3A patent/EP3005237B1/en active Active
- 2014-05-23 CN CN201480031126.3A patent/CN105229672A/en active Pending
- 2014-05-23 CN CN202111523212.4A patent/CN114186294A/en active Pending
- 2014-05-23 WO PCT/US2014/039315 patent/WO2014193750A1/en not_active Ceased
- 2014-05-23 JP JP2016516703A patent/JP6049944B2/en not_active Expired - Fee Related
- 2014-05-23 RU RU2015156064A patent/RU2633167C2/en active
-
2015
- 2015-03-03 WO PCT/US2015/018427 patent/WO2015142510A1/en not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002013137A2 (en) | 2000-08-07 | 2002-02-14 | Electro Scientific Industries, Inc. | Polygon finder and pruned tree geometric match method |
| US20040070800A1 (en) * | 2002-10-15 | 2004-04-15 | Dai Nippon Printing Co., Ltd. | Holographic fine-line Pattern |
| US20070196017A1 (en) * | 2006-02-17 | 2007-08-23 | Sharp Kabushiki Kaisha | Management information adding method and image forming apparatus |
| US20080219565A1 (en) * | 2007-03-06 | 2008-09-11 | Kabushiki Kaisha Toshiba | Training device and pattern recognizing device |
| US20090220142A1 (en) * | 2008-02-29 | 2009-09-03 | Hiroshi Matsushita | Linear pattern detection method and apparatus |
| US20130058574A1 (en) * | 2010-01-21 | 2013-03-07 | Universite Paris 13 | Method for segmenting images, computer program, and corresponding computer system |
Non-Patent Citations (1)
| Title |
|---|
| See also references of EP3005237A4 |
Also Published As
| Publication number | Publication date |
|---|---|
| RU2633167C2 (en) | 2017-10-11 |
| CN114186294A (en) | 2022-03-15 |
| US20140355888A1 (en) | 2014-12-04 |
| WO2015142510A1 (en) | 2015-09-24 |
| US20150261890A1 (en) | 2015-09-17 |
| CN105229672A (en) | 2016-01-06 |
| EP3005237A1 (en) | 2016-04-13 |
| JP6049944B2 (en) | 2016-12-21 |
| JP2016520934A (en) | 2016-07-14 |
| EP3005237B1 (en) | 2022-12-28 |
| RU2015156064A (en) | 2017-07-06 |
| EP3005237A4 (en) | 2017-05-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9844917B2 (en) | Support structures for additive manufacturing of solid models | |
| JP6198824B2 (en) | A method for ordering additional constraints in a variational system. | |
| US20130132424A1 (en) | Massive model visualization with spatial indexing | |
| US9779292B2 (en) | System and method for interactive sketch recognition based on geometric contraints | |
| US20150269284A1 (en) | Intelligent chamfer recognition in cad models | |
| WO2021014557A1 (en) | Mesh structure facility detection device, mesh structure facility detection method, and program | |
| US9400853B2 (en) | System and method for identifying under-defined geometries due to singular constraint schemes | |
| WO2015164052A1 (en) | Duplicate pattern of assembly components in cad models | |
| EP3005237B1 (en) | Automatic detection of regular patterns of features | |
| CN116229116A (en) | Process reuse processing method, system and electronic equipment based on similar parts | |
| WO2014051949A1 (en) | Systems and methods for computing solutions of geometric constraint equations of computer-implemented virtual models | |
| JP2009168525A (en) | Link matching system, method, and program | |
| US11398074B1 (en) | Method and apparatus for identifying planes of objects in 3D scenes | |
| EP3425593A1 (en) | Highly parallelizable algorithm for detecting intersections of shapes | |
| JP6827906B2 (en) | 3D data processing device and 3D data processing method | |
| EP4430490A1 (en) | Method and system for creating 3d model for digital twin from point cloud | |
| WO2013033534A1 (en) | Tolerant intersections in graphical models | |
| CN105719310B (en) | Collision detection method and device | |
| EP3152689A1 (en) | Aerospace joggle on multiple adjacent web faces with intersecting runouts | |
| US9122818B2 (en) | Representation and discovery of geometric relationships in a three dimensional model | |
| JP2019012427A (en) | Image collation program, image collation method, and image collation apparatus | |
| US20150278401A1 (en) | Intelligent offset recognition in cad models | |
| JP6086017B2 (en) | Data processing apparatus and data processing program |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WWE | Wipo information: entry into national phase |
Ref document number: 201480031126.3 Country of ref document: CN |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 14804913 Country of ref document: EP Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 2014804913 Country of ref document: EP |
|
| ENP | Entry into the national phase |
Ref document number: 2016516703 Country of ref document: JP Kind code of ref document: A |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| ENP | Entry into the national phase |
Ref document number: 2015156064 Country of ref document: RU Kind code of ref document: A |