WO2015160359A1 - High-temperature cycling bga packaging - Google Patents
High-temperature cycling bga packaging Download PDFInfo
- Publication number
- WO2015160359A1 WO2015160359A1 PCT/US2014/034609 US2014034609W WO2015160359A1 WO 2015160359 A1 WO2015160359 A1 WO 2015160359A1 US 2014034609 W US2014034609 W US 2014034609W WO 2015160359 A1 WO2015160359 A1 WO 2015160359A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- adapter
- substrate
- chip
- circuit board
- lead wires
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/141—One or more single auxiliary printed circuits mounted on a main printed circuit, e.g. modules, adapters
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/479—Leadframes on or in insulating or insulated package substrates, interposers, or redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
- H10W70/657—Shapes or dispositions of interconnections on sidewalls or bottom surfaces of the package substrates, interposers or redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W78/00—Detachable holders for supporting packaged chips in operation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/401—Package configurations characterised by multiple insulating or insulated package substrates, interposers or RDLs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/04—Assemblies of printed circuits
- H05K2201/049—PCB for one component, e.g. for mounting onto mother PCB
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10007—Types of components
- H05K2201/10015—Non-printed capacitor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10734—Ball grid array [BGA]; Bump grid array
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
- H05K3/3426—Leaded components characterised by the leads
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07253—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
- H10W72/232—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
- H10W72/234—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- the embodiments disclosed herein relate generally to methods and systems for using integrated circuit chips in BGA packaging in high-temperature cycling conditions.
- Ball grid array (“BGA”) packaging is becoming increasingly popular for integrated circuit chips, such as processors (“CPUs,” “MCUs”), field-programmable arrays (“FPGA”) and memory chips.
- BGA packaging provides integrated circuits with efficient packaging and excellent high-temperature survivability.
- BGA packaging has drawbacks with respect to its use in downhole electronics in the oil and gas industry. Downhole electronics experience repeated temperature cycles between high temperatures, close to 400° F, and room temperature. These temperature cycles may quickly ruin the electronic connections between the ball grid array package and the printed circuit board (“PCB”) onto which it is mounted.
- PCB printed circuit board
- FIG. 1 is a diagram illustrating a ball grid array chip according to an embodiment.
- FIG. 2A is a diagram illustrating an adapter according to an embodiment.
- FIG. 2B is a diagram illustrating an adapter according to an embodiment.
- FIG. 3 is a diagram illustrating a circuit board with an adapter having a QFP footprint mounted on it according to an embodiment.
- FIG. 4 is a diagram illustrating an adapter with an BGA chip attached according to an embodiment.
- Integrated circuits are typically put into protective packages that allow them to be assembled onto circuit boards.
- One type of package is a quad flat package (“QFP”), which is a surface- mounted integrated circuit package with electrical connecting leads extending from each of the four sides of the package.
- QFP packaging provides excellent protection from thermal expansion effects. This is because the flexibility in the connecting leads allows them to compensate for differences between the coefficient of thermal expansion (“CTE”) between the QFP package and the printed circuit board to which it is mounted.
- CTE coefficient of thermal expansion
- Ball grid array (“BGA”) packaging is based on an array of solder balls distributed on the "bottom" of a substrate having an integrated circuit chip mounted on the opposite surface. BGA packaging, however, suffers from drawbacks when used in oilfield Downhole tool applications that experience high temperature cycling. In a BGA package, the solder balls are tightly attached, both to the circuit board surface and the chip surface. During thermal expansion, the solder balls are increasingly placed under mechanical stress caused by the difference between thermal expansion coefficients of the circuit board and the BGA chip substrate. This results in cracks and critical damage to the ball grid array chip.
- Embodiments of this disclosure provide an apparatus and method for integrated circuit packaging using the QFP footprint.
- an adapter is provided that matches the coefficient of thermal expansion between a BGA chip and a QFP chip adapter so that chips using BGA packaging may be successfully and reliably deployed in downhole operations that demand repeated temperature cycling of the onboard electronics.
- the disclosure provides a ball grid array to the QFP adapter built of the same material as the chip body.
- FIG. 1 is a cross-sectional view of a BGA chip useful in an embodiment.
- the BGA chip 10 includes an integrated circuit 12 mounted to a substrate 14.
- Example substrates include laminated plastic material, though ceramic or other materials may be used as well.
- the integrated circuit 12 is sealed with an mold compound material 16 to protect the integrated circuit 12 from damage.
- Conductive bond wires 11 connect the operative circuits on the integrated circuit 12 to conductive traces on the on the substrate 14.
- On the opposite side of substrate 14 are a plurality of solder balls 18a - 18d. Only four solder balls are shown for clarity, but the chip 10 is not limited to only four solder balls.
- Each of the solder balls 18a - 18d is arranged on a conductive pad on the substrate 14 and electrically connected to corresponding conductive bond wires 11 to allow electrical communication between the solder balls 18a - 18d and the integrated circuit 12.
- the BGA chip may be placed on a circuit board having conductive pads arranged in a pattern matching the pattern of solder balls on the "bottom," or mounting side of the BGA package.
- the BGA chip / circuit board assembly may then be heated, for example, in a reflow oven or by an infrared heater, which melts the solder balls and creates a soldered connection between the BGA chip and the circuit board.
- the solder balls cannot flex like the longer leads of a QFP package. Because they are not as mechanically compliant, bending due to a difference in coefficient of thermal expansion between the BGA chip and the circuit board can cause the solder joints to fail. This problem is exacerbated in downhole tool applications where the circuit board may experience repeated temperature cycles over a range of 200° F, or more.
- FIGS 2A - 2B depict an adapter according to an embodiment of the disclosure.
- FIG. 2A is a top view of the embodiment
- FIG. 2B is a plan view of the embodiment depicted in FIG. 2A.
- the adapter 20 comprises a substrate 22 made from a material having substantially the same coefficient of thermal expansion as the substrate used in the BGA chip. Using the same material, or, alternatively, a material with substantially the same coefficient of thermal expansion, will reduce or eliminate undesired bending between the BGA chip and the adapter 20 as the assembly experiences thermal cycles during use.
- the conductive leads 24a - 24n of the adapter 20, may be constructed and arranged according to a standard QFP footprint, in which conductive leads 24a - 24n extend outwardly from each of the four sides of the adapter 20, and have a conventional "gull wing" profile shown in FIG. 2B.
- the "top" surface of the adapter 20, i.e., the surface that the BGA chip is mounted to, has a plurality of conductive pads 26a - 26n that provide electrical attachment sites for the solder balls of the BGA chip. Conductive pads 26a - 26n are electrically connected to conductive leads 24a - 24n through wire traces or vias in the substrate 22 of adapter 20.
- the wiring layout that determines which of the conductive leads 24a - 24n are electrically connected to which of the conductive pads 26a - 26n is a matter of design choice.
- the number of pins present in the BGA chip does necessarily match the number of conductive leads available in the QFP adapter 20.
- the pin density in a BGA package may exceed the pin density in a QFP package, and some pins in the BGA chip will be unused or intentionally shorted or grounded.
- a typical BGA package may have from 256 to 1152 pins.
- QFP packaging is typically limited to a range from 16 to 208 pins, though some versions can support a somewhat higher pin count.
- the adapter traces must be configured to compensate for the reduced pin set.
- up to 240 pins may be used as functional input/output (“IO") pins. The remaining pins will be multiple ground pins, 1.2V pins, 3.3V pins, and so forth.
- the adapter may be provided with conductive traces to electrically connect these ground pins and pins having the same power lever to reduce the pin count.
- some pins may be provided with decoupling capacitors on a one pin per capacitor basis.
- the adapter may be provided with capacitors installed on the adapter, allowing the adapter to have a small footprint, or may be incorporated into the adapter substrate directly.
- power pins with similar voltages may be combined into groups, particularly if they are physically close to each other, and provided with a single capacitor.
- FIG. 4 shows an embodiment of the disclosure having a BGA chip 40 mounted to an adapter 42 having a QFP footprint.
- the adapter 42 includes a plurality of conductive leads that electrically couple to the solder balls on the BGA chip 40 through conductive traces, such as traces 48, in the adapter 42.
- the BGA chip has a plurality of power pins, in which circular icons represent 3.3V pins and triangular icons represent 1.2V pins. These pins are coupled through traces 48 to leads 44a and 44b, respectively.
- the 1.2V pins are coupled together and the 3.3V pins are coupled together through traces 48 so that the number of conductive leads required by the QFP adapter is reduced to one for each voltage level, and only a single coupling capacitor 46 is also used for each voltage level.
- the BGA chip may then be soldered to the top surface of the BGA-to-QFP adapter 20 using conventional BGA soldering techniques which will be known to those of skill in the art.
- the adapter 20 may then be attached to a QFP footprint on the circuit board according to conventional surface mount techniques.
- the adapter 20 may be socket mounted to the circuit board.
- the adapter 20 may first be attached to the circuit board and then the BGA chip may be soldered to the adapter 20.
- the QFP-style leads 24a - 24n on adapter 20 will take the mechanical stress coming from the difference in thermal expansion coefficients while the ball grid array will remain unstressed.
- FIG. 3 shows a plan view of a circuit board 30 having an adapter 20 with a QFP foot print surface mounted to it.
- the adapter leads are electrically connected, for example by soldering, to conductive pads on the circuit board 30.
- the BGA chip 10 is mounted to the "top" or mounting surface of the adapter 20 through the solder balls on the BGA chip (not shown in FIG. 3.)
- Another embodiment provides an adapter for attaching a ball grid array chip to a circuit board.
- the adapter includes an adapter substrate having substantially the same coefficient of thermal expansion as the substrate used in in the ball grid array chip. Any differences in the coefficient of thermal expansion between the substrate materials should be small enough that no damage will occur to the BGA / adapter connection over the temperature range that the combined assembly is expected to cycle through. In general, the higher the temperature at which the adapter is to be used, the more significant the effects of any CTE mismatch between the adapter and the chip will be. Nevertheless, even with CTE differences between the adapter and the chip, the adapter will survive some number of cycles before the damage becomes critical.
- the CTEs of the substrates for the adapter and the chip may be considered substantially the same if the CTE difference does not result in significant damage over the maximum allowed number of thermal cycles within the expected temperature range of operation.
- electronics using BGA chips are often certified for operation between 0 and +70C.
- a chip housing may use a molding compound with a CTE of about 3 ppm.
- the desired CTE for a silicon chip able to safely thermocycle in the range -40C to +175C may be determined as follows.
- the adapter substrate is made from the same material as the BGA substrate.
- the coefficient of thermal expansions may be matched in various ways.
- the substrate material for the adapter may be obtained directly from the supplier of the BGA chip or substrate, or the same brand and model of material may be used.
- the thermal expansion coefficient may be measured by heating the desired BGA chip through various temperatures and measuring the dimensional changes. Normally, the coefficient is an isotropic linear value.
- the adapter also has least one electrical contact site on the "top" or BGA mounting surface of the adapter substrate for engaging a solder ball on the ball grid array chip to provide electrical communication to an integrated circuit packaged in the ball grid array chip.
- a plurality of lead wires extends from each side of the adapter substrate in a QFP arrangement, wherein at least one of the lead wires is electrically connected to at least one electrical contact site on the adapter substrate.
- the lead wires may be provided with the conventional "gull-wing" shape for QFP leads.
- One or more methods for attaching a ball grid array chip to a circuit board may include providing an adapter for attaching a ball grid array chip to a circuit board, the adapter having an adapter substrate made from a material having substantially the same coefficient of thermal expansion as the substrate used in in the ball grid array chip and having at least one electrical contact site on a mounting surface of the adapter substrate for engaging a solder ball on the ball grid array chip to provide electrical communication to an integrated circuit packaged in the ball grid array chip, and a plurality of lead wires extending from each side of the adapter substrate in a QFP arrangement, wherein at least one of the lead wires is electrically connected to at least one electrical contact site on the adapter substrate.
- the method also includes attaching the ball grid array chip to the adapter, and attaching the adapter to the circuit board. Attaching the BGA chip to the adapter and attaching the adapter to the circuit board may be performed according to conventional soldering and surface mount techniques.
- a circuit board may be provided having a ball grid array that includes an integrated circuit and a substrate with a plurality of solder balls electrically connected to the integrated circuit.
- An adapter is provided for attaching the ball grid array chip to the circuit board, the adapter includes an adapter substrate made from a material having substantially the same coefficient of thermal expansion as the ball grid array chip substrate, wherein the adapter includes at least one electrical contact site on a mounting surface of the adapter substrate electrically coupled to a solder ball on the ball grid array chip substrate.
- the adapter also includes a plurality of lead wires extending from each side of the adapter substrate in a QFP arrangement, wherein at least one of the lead wires is electrically connected to at least one electrical contact site on the adapter substrate.
- the circuit board includes a plurality of conductive traces on the circuit board that are electrically connected to the plurality of lead wires on the adapter.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Manufacturing & Machinery (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2014/034609 WO2015160359A1 (en) | 2014-04-18 | 2014-04-18 | High-temperature cycling bga packaging |
| MX2016012249A MX365128B (en) | 2014-04-18 | 2014-04-18 | BALL MESH MATRIX (BGA) PACKAGE FOR HIGH TEMPERATURE CYCLES. |
| EP14889592.3A EP3100302A4 (en) | 2014-04-18 | 2014-04-18 | High-temperature cycling bga packaging |
| US14/781,572 US9847286B2 (en) | 2014-04-18 | 2014-04-18 | High-temperature cycling BGA packaging |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2014/034609 WO2015160359A1 (en) | 2014-04-18 | 2014-04-18 | High-temperature cycling bga packaging |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2015160359A1 true WO2015160359A1 (en) | 2015-10-22 |
Family
ID=54324402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2014/034609 Ceased WO2015160359A1 (en) | 2014-04-18 | 2014-04-18 | High-temperature cycling bga packaging |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9847286B2 (en) |
| EP (1) | EP3100302A4 (en) |
| MX (1) | MX365128B (en) |
| WO (1) | WO2015160359A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12588150B2 (en) * | 2021-12-10 | 2026-03-24 | Infineon Technologies Ag | Package, method for forming a package, chip card, and method for forming a chip card |
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| US20090152547A1 (en) * | 2007-12-17 | 2009-06-18 | Dongsam Park | Integrated circuit packaging system with leadframe interposer and method of manufacture thereof |
| US20110080717A1 (en) * | 2009-10-02 | 2011-04-07 | Fujitsu Limited | Interconnect board, printed circuit board unit, and method |
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| US20020145207A1 (en) | 1999-03-05 | 2002-10-10 | Anderson Sidney Larry | Method and structure for integrated circuit package |
| US6261869B1 (en) | 1999-07-30 | 2001-07-17 | Hewlett-Packard Company | Hybrid BGA and QFP chip package assembly and process for same |
| US6830460B1 (en) | 1999-08-02 | 2004-12-14 | Gryphics, Inc. | Controlled compliance fine pitch interconnect |
| US7161239B2 (en) | 2000-12-22 | 2007-01-09 | Broadcom Corporation | Ball grid array package enhanced with a thermal and electrical connector |
| US7081373B2 (en) * | 2001-12-14 | 2006-07-25 | Staktek Group, L.P. | CSP chip stack with flex circuit |
| US6869290B2 (en) | 2003-06-11 | 2005-03-22 | Neoconix, Inc. | Circuitized connector for land grid array |
| US7297003B2 (en) | 2003-07-16 | 2007-11-20 | Gryphics, Inc. | Fine pitch electrical interconnect assembly |
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| US7180171B1 (en) * | 2004-01-08 | 2007-02-20 | Smart Modular Technologies, Inc. | Single IC packaging solution for multi chip modules |
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2014
- 2014-04-18 EP EP14889592.3A patent/EP3100302A4/en not_active Withdrawn
- 2014-04-18 US US14/781,572 patent/US9847286B2/en not_active Expired - Fee Related
- 2014-04-18 WO PCT/US2014/034609 patent/WO2015160359A1/en not_active Ceased
- 2014-04-18 MX MX2016012249A patent/MX365128B/en active IP Right Grant
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| JP2003258154A (en) * | 2002-03-05 | 2003-09-12 | Fujitsu Ltd | Semiconductor element mounting structure |
| US20050047106A1 (en) * | 2003-08-29 | 2005-03-03 | Martino Peter Miguel | Substrate reinforcing in an LGA package |
| JP2006066755A (en) * | 2004-08-30 | 2006-03-09 | Sumitomo Metal Electronics Devices Inc | Ceramic package, and manufacturing method thereof |
| US20090152547A1 (en) * | 2007-12-17 | 2009-06-18 | Dongsam Park | Integrated circuit packaging system with leadframe interposer and method of manufacture thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12588150B2 (en) * | 2021-12-10 | 2026-03-24 | Infineon Technologies Ag | Package, method for forming a package, chip card, and method for forming a chip card |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3100302A1 (en) | 2016-12-07 |
| US9847286B2 (en) | 2017-12-19 |
| MX2016012249A (en) | 2017-01-09 |
| EP3100302A4 (en) | 2017-09-13 |
| US20160181192A1 (en) | 2016-06-23 |
| MX365128B (en) | 2019-05-24 |
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