WO2017155117A1 - 半導体センサチップ実装用接着剤及び半導体センサ - Google Patents
半導体センサチップ実装用接着剤及び半導体センサ Download PDFInfo
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- WO2017155117A1 WO2017155117A1 PCT/JP2017/009816 JP2017009816W WO2017155117A1 WO 2017155117 A1 WO2017155117 A1 WO 2017155117A1 JP 2017009816 W JP2017009816 W JP 2017009816W WO 2017155117 A1 WO2017155117 A1 WO 2017155117A1
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- spacer
- adhesive
- semiconductor sensor
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- sensor chip
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L25/00—Compositions of, homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Compositions of derivatives of such polymers
- C08L25/02—Homopolymers or copolymers of hydrocarbons
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J11/00—Features of adhesives not provided for in group C09J9/00, e.g. additives
- C09J11/08—Macromolecular additives
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J171/00—Adhesives based on polyethers obtained by reactions forming an ether link in the main chain; Adhesives based on derivatives of such polymers
- C09J171/02—Polyalkylene oxides
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J183/00—Adhesives based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Adhesives based on derivatives of such polymers
- C09J183/04—Polysiloxanes
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J9/00—Adhesives characterised by their physical nature or the effects produced, e.g. glue sticks
- C09J9/02—Electrically-conducting adhesives
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/50—Devices controlled by mechanical forces, e.g. pressure
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/129—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP]
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G65/00—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
- C08G65/02—Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from cyclic ethers by opening of the heterocyclic ring
- C08G65/32—Polymers modified by chemical after-treatment
- C08G65/329—Polymers modified by chemical after-treatment with organic compounds
- C08G65/336—Polymers modified by chemical after-treatment with organic compounds containing silicon
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- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07321—Aligning
- H10W72/07327—Aligning involving guiding structures, e.g. spacers or supporting members
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07337—Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
- H10W72/07338—Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy hardening the adhesive by curing, e.g. thermosetting
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/325—Die-attach connectors having a filler embedded in a matrix
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- H—ELECTRICITY
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/381—Auxiliary members
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/951—Materials of bond pads
- H10W72/952—Materials of bond pads comprising metals or metalloids, e.g. PbSn, Ag or Cu
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
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- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
Definitions
- the present invention relates to an adhesive for mounting a semiconductor sensor chip used for mounting a semiconductor sensor chip.
- the present invention also relates to a semiconductor sensor using the above adhesive.
- Patent Document 1 a second adhesive that is formed of a silicone-based resin and maintains a constant distance between the package and the circuit chip and a silicone-based resin that bonds the package and the circuit chip.
- a sensor device comprising an adhesive is disclosed.
- the first adhesive functions as a spacer.
- Patent Document 2 discloses that in a three-axis acceleration sensor, a silicon rubber resin kneaded with a spherical spacer is used as an adhesive.
- the spherical spacer is a hard plastic.
- the adhesive described in Patent Document 1 may have low heat resistance. Furthermore, in the adhesive described in Patent Document 1, cracks and peeling may occur due to thermal shock, and the cold-heat cycle characteristics may be low.
- an adhesive used for mounting a semiconductor sensor chip includes a silicone resin and a spacer, and the spacer has a 10% compression elastic modulus of 10 N / mm 2 or more, 2000 N / and mm 2 or less, the compression recovery rate of the spacer is not more than 20%, wherein the average particle diameter of the spacers, 10 [mu] m or more and 200 ⁇ m or less, the semiconductor sensor chip mounting adhesive (hereinafter as adhesive May be provided).
- the ratio of the 10% compression modulus of the spacer after heating to the 10% compression modulus of the spacer before heating is 0.95 or more and 1.05 or less.
- the spacer included in the adhesive is there a spacer having an average particle diameter of 1.5 times or more with respect to the average particle diameter of the spacer?
- the number of spacers having an average particle diameter of 1.5 times or more with respect to the average particle diameter of the spacers is 0.1% or less.
- the spacer is a silicone spacer.
- the spacer is a polymer of a (meth) acrylic compound having an isobornyl group.
- the semiconductor device includes a first member, a semiconductor sensor chip that is a second member, and an adhesive layer that bonds the first member and the second member, A semiconductor sensor is provided in which the adhesive layer is a cured product of the above-described adhesive for mounting a semiconductor sensor chip.
- the adhesive for mounting a semiconductor sensor chip according to the present invention includes a silicone resin and a spacer, wherein the spacer has a 10% compression elastic modulus of 10 N / mm 2 or more and 2000 N / mm 2 or less, and the compression of the spacer Since the recovery rate is 20% or less and the average particle size of the spacer is 10 ⁇ m or more and 200 ⁇ m or less, noise perception can be reduced and the heat resistance and the thermal cycle resistance can be improved.
- FIG. 1 is a sectional view showing an example of a semiconductor sensor using an adhesive for mounting a semiconductor sensor chip according to the present invention.
- the adhesive for mounting a semiconductor sensor chip according to the present invention (hereinafter sometimes referred to as an adhesive) is an adhesive used for mounting a semiconductor sensor chip.
- the adhesive according to the present invention includes a silicone resin and a spacer.
- the spacer has a 10% compression modulus of 10 N / mm 2 or more and 2000 N / mm 2 or less.
- the compression recovery rate of the spacer is 20% or less.
- the spacer has an average particle size of 10 ⁇ m or more and 200 ⁇ m or less.
- the present invention since the above-described configuration is provided, noise perception can be reduced and heat resistance can be increased. Moreover, as heat resistance, the adhesive strength at high temperature can be increased. Furthermore, in this invention, since the structure mentioned above is provided, a cold-heat-resistant cycling characteristic can also be improved. In the present invention, not only one of the heat resistance and the heat / cool cycle characteristics but also both can be enhanced.
- the 10% compression elastic modulus is a compression elastic modulus when the spacer is compressed 10%.
- the 10% compression modulus of the spacer is 10 N / mm 2 or more and 2000 N / mm 2 or less.
- the 10% compression modulus of the spacer is preferably 500 N / mm 2 or less, more preferably 100 N / mm 2 or less.
- the 10% compression modulus of the spacer can be measured as follows.
- the spacer is compressed with a smooth indenter end face of a cylinder (diameter 50 ⁇ m, made of diamond) under conditions where a maximum test load of 20 mN is applied for 60 seconds.
- the load value (N) and compression displacement (mm) at this time are measured. From the measured value obtained, the compression elastic modulus can be obtained by the following formula.
- the micro compression tester for example, “Fischer Scope H-100” manufactured by Fischer is used.
- the compression recovery rate of the spacer is 20% or less. From the viewpoint of further enhancing the gap control effect, the compression recovery rate of the spacer is preferably 15% or less, more preferably 10% or less.
- the lower limit of the compression recovery rate of the spacer is not particularly limited, but is usually 1% or more.
- the compression recovery rate of the spacer can be measured as follows.
- ⁇ Spray the spacer on the sample table With respect to one dispersed spacer, a load (reverse load value) is applied in the center direction of the spacer until the spacer is compressed and deformed by 30% using a micro compression tester. Thereafter, unloading is performed up to the origin load value (0.40 mN). The load-compression displacement during this period is measured, and the compression recovery rate can be obtained from the following equation.
- the load speed is 0.33 mN / sec.
- the micro compression tester for example, “Fischer Scope H-100” manufactured by Fischer is used.
- Compression recovery rate (%) [(L1-L2) / L1] ⁇ 100
- L1 Compressive displacement from the origin load value to the reverse load value when applying a load
- L2 Unloading displacement from the reverse load value to the origin load value when releasing the load
- the average particle diameter of the spacer is 10 ⁇ m or more and 200 ⁇ m or less. From the viewpoint of further enhancing the gap control effect, the average particle diameter of the spacer is preferably 20 ⁇ m or more, more preferably 30 ⁇ m or more, preferably 150 ⁇ m or less, more preferably 110 ⁇ m or less, and even more preferably 100 ⁇ m or less. .
- the average particle diameter is obtained by observing the spacers with a scanning electron microscope and arithmetically averaging the maximum diameters of 50 arbitrarily selected spacers in the observed image.
- the content of the spacer is preferably 0.1% by weight or more, more preferably 1% by weight or more, preferably 10% by weight, in 100% by weight of the adhesive. Hereinafter, it is more preferably 5% by weight or less.
- the spacer before heating has a 10% compression modulus of the spacer after heating.
- 10% compression modulus (10% compression modulus after heating / 10% compression modulus before heating) is preferably 0.95 or more, more preferably 0.98 or more, and preferably 1. 05 or less, more preferably 1.02 or less.
- the spacer included in the adhesive there is no spacer having an average particle diameter of 1.5 times or more with respect to the average particle diameter of the spacer. .
- the spacer contained in the adhesive The total number of the spacers is preferably 100%, and the number of spacers having an average particle size of 1.5 times or more with respect to the average particle size of the spacers is preferably 0.1% or less. More preferably, it is present in a number of 05% or less.
- the spacer is preferably a silicone resin, and is preferably a silicone spacer.
- the spacer is preferably silicone particles.
- the spacer does not contain a platinum catalyst or contains a platinum catalyst at 100 ppm or less.
- a platinum catalyst the lower the platinum catalyst content, the better.
- the platinum catalyst content is more preferably 80 ppm or less, still more preferably 60 ppm or less, still more preferably 50 ppm or less, still more preferably 40 ppm or less, particularly preferably 30 ppm or less, and particularly preferably 20 ppm or less, most preferably 10 ppm or less. It is.
- silicone particles are often obtained by polymerizing monomers using a platinum catalyst.
- the platinum catalyst is contained inside, and the platinum catalyst content exceeds 100 ppm.
- silicone particles obtained without using a platinum catalyst generally do not contain a platinum catalyst.
- the material of the silicone particles is preferably organopolysiloxane, more preferably silane alkoxide.
- organopolysiloxane and the silane alkoxide may be used alone or in combination of two or more.
- the silane alkoxide is a silane alkoxide A represented by the following formula (1A) or a silane alkoxide B represented by the following formula (1B). It is preferable to contain.
- the silane alkoxide may contain a silane alkoxide A represented by the following formula (1A) or may contain a silane alkoxide B represented by the following formula (1B).
- R1 represents a hydrogen atom, a phenyl group or an alkyl group having 1 to 30 carbon atoms
- R2 represents an alkyl group having 1 to 6 carbon atoms
- n represents an integer of 0 to 2.
- the plurality of R1s may be the same or different.
- Several R2 may be the same and may differ.
- R1 in the formula (1A) is an alkyl group having 1 to 30 carbon atoms
- specific examples of R1 include a methyl group, an ethyl group, a propyl group, an isopropyl group, an isobutyl group, an n-hexyl group, and a cyclohexyl group.
- This alkyl group preferably has 10 or less carbon atoms, more preferably 6 or less.
- the alkyl group includes a cycloalkyl group.
- R2 examples include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, and an isobutyl group.
- silane alkoxide A examples include tetramethoxysilane, tetraethoxysilane, methyltrimethoxysilane, methyltriethoxysilane, ethyltrimethoxysilane, ethyltriethoxysilane, isopropyltrimethoxysilane, isobutyltrimethoxysilane, cyclohexyltri Examples include methoxysilane, n-hexyltrimethoxysilane, n-octyltriethoxysilane, n-decyltrimethoxysilane, phenyltrimethoxysilane, dimethyldimethoxysilane, dimethyldiethoxysilane, diisopropyldimethoxysilane, and diphenyldimethoxysilane. . Silane alkoxides other than these may be used.
- R1 represents a hydrogen atom, a phenyl group, an alkyl group having 1 to 30 carbon atoms, or an organic group having 1 to 30 carbon atoms having a polymerizable double bond
- R2 represents 1 to 6 carbon atoms
- n represents an integer of 0-2.
- the plurality of R1s may be the same or different.
- Several R2 may be the same and may differ.
- at least one R1 is an organic group having 1 to 30 carbon atoms having a polymerizable double bond.
- At least one R1 is preferably a vinyl group, a styryl group or a (meth) acryloxy group, more preferably a vinyl group or a (meth) acryloxy group, and even more preferably a vinyl group.
- R1 in the formula (1B) is an alkyl group having 1 to 30 carbon atoms
- specific examples of R1 include a methyl group, an ethyl group, a propyl group, an isopropyl group, an isobutyl group, an n-hexyl group, and a cyclohexyl group.
- This alkyl group preferably has 10 or less carbon atoms, more preferably 6 or less.
- the alkyl group includes a cycloalkyl group.
- Examples of the polymerizable double bond include a carbon-carbon double bond.
- R1 is an organic group having 1 to 30 carbon atoms having a polymerizable double bond
- specific examples of R1 include vinyl group, styryl group, allyl group, isopropenyl group, and 3- (meth) acrylic group.
- Examples include a loxyalkyl group.
- Examples of the styryl group include p-styryl group, o-styryl group, and m-styryl group.
- Examples of the (meth) acryloxyalkyl group include a (meth) acryloxymethyl group, a (meth) acryloxyethyl group, and a (meth) acryloxypropyl group.
- the number of carbon atoms of the organic group having 1 to 30 carbon atoms having a polymerizable double bond is preferably 2 or more, preferably 30 or less, more preferably 10 or less.
- (meth) acryloxy refers to acryloxy and methacryloxy.
- R2 examples include a methyl group, an ethyl group, an n-propyl group, an isopropyl group, an n-butyl group, and an isobutyl group.
- the silane alkoxide preferably contains dialkoxysilane.
- the hydrolyzed condensate of the silane alkoxide is not less than 0% by weight (unused) of monoalkoxysilane in 100% by weight of silane alkoxide, 20 Hydrolysis of a silane alkoxide containing not more than 10% by weight, dialkoxysilane not less than 70% by weight and not more than 99.9% by weight, and trialkoxysilane and tetraalkoxysilane in total of not less than 0.1% by weight and not more than 30% by weight Condensate is preferable, and in 100% by weight of silane alkoxide, 0% by weight (unused) of monoalkoxysilane, 15% by weight or less, 75% by weight or more of dialkoxysilane, 99% by weight or less, and trialkoxysilane And tetraalkoxysilane in total containing 1% by weight or more and 25% by weight or less And more preferably the hydrolysis-condensation product.
- the silane alkoxide preferably includes a silane alkoxide having a polymerizable functional group, and more preferably includes a silane alkoxide having a polymerizable double bond.
- the silane alkoxide having a polymerizable double bond include vinyltrimethoxysilane, vinyltriethoxysilane, dimethoxymethylvinylsilane, dimethoxyethylvinylsilane, diethoxymethylvinylsilane, diethoxyethylvinylsilane, ethylmethyldivinylsilane, methylvinyl.
- cyclic siloxane may be used, and modified (reactive) silicone oil may be used.
- modified silicone oil include one-end modified silicone oil, both-end silicone oil, and side chain type silicone oil.
- an oligomer is obtained by condensing the silane alkoxide in advance, and then a polymerization reaction is performed by a suspension polymerization method, a dispersion polymerization method, a miniemulsion polymerization method, an emulsion polymerization method, or the like. And a method for producing substrate particles.
- the spacer is preferably a polymer containing a polymerizable monomer having an ethylenically unsaturated group.
- Examples of the polymerizable monomer having an ethylenically unsaturated group include non-crosslinkable monomers and crosslinkable monomers.
- non-crosslinkable monomer examples include, as vinyl compounds, styrene monomers such as styrene, ⁇ -methyl styrene, chlorostyrene; methyl vinyl ether, ethyl vinyl ether, propyl vinyl ether, 1,4-butanediol diester.
- Vinyl ether compounds such as vinyl ether, cyclohexanedimethanol divinyl ether, diethylene glycol divinyl ether; acid vinyl ester compounds such as vinyl acetate, vinyl butyrate, vinyl laurate, vinyl stearate; halogen-containing monomers such as vinyl chloride, vinyl fluoride;
- (Meth) acrylic compounds include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, lauric Alkyl (meth) acrylate compounds such as (meth) acrylate, cetyl (meth) acrylate, stearyl (meth) acrylate, cyclohexyl (meth) acrylate, isobornyl (meth) acrylate; 2-hydroxyethyl (meth) acrylate, glycerol (meth) Oxygen
- crosslinkable monomer examples include vinyl monomers such as vinyl compounds such as divinylbenzene, 1,4-divinyloxybutane and divinylsulfone; (meth) acrylic compounds such as tetramethylolmethanetetra ( (Meth) acrylate, tetramethylolmethane tri (meth) acrylate, tetramethylolmethane di (meth) acrylate, trimethylolpropane tri (meth) acrylate, dipentaerythritol hexa (meth) acrylate, dipentaerythritol penta (meth) acrylate, glycerol Tri (meth) acrylate, glycerol di (meth) acrylate, (poly) ethylene glycol di (meth) acrylate, (poly) propylene glycol di (meth) acrylate, (poly) tetramethyleneglycol Polyfunctional (meth) acrylate
- (meth) acrylate indicates acrylate and methacrylate.
- (meth) acryl refers to acrylic and methacrylic.
- the spacer is preferably a polymer of a (meth) acrylic compound, and is a polymer of a (meth) acrylic compound having an isobornyl group. More preferably.
- the (meth) acrylic compound having an isobornyl group include isobornyl (meth) acrylate and isobornyl di (meth) acrylate.
- the adhesive includes the above-described spacer and silicone resin.
- the spacer is preferably dispersed in a silicone resin and used as an adhesive.
- the silicone resin preferably has fluidity.
- the silicone resin is preferably pasty.
- the paste form includes liquid.
- the adhesive may be a one-component type in which a main agent and a curing agent are mixed in advance, or a two-component type in which a main agent and a curing agent are separated.
- the adhesive may be a condensation curable type or an addition curable type.
- the adhesive may be cured using a catalyst such as platinum, or may be cured by heating or moisture.
- the silicone resin is not particularly limited.
- the silicone resin may be an organopolysiloxane compound, and the organopolysiloxane may have a hydroxyl group at a terminal or a vinyl group at a terminal.
- the silicone resin may be a polypropylene oxide having a methyldimethoxysilyl group.
- the adhesive may contain a vinyl resin, a thermoplastic resin, a curable resin, a thermoplastic block copolymer, an elastomer and a solvent in addition to the silicone resin and the spacer.
- a vinyl resin a thermoplastic resin
- a curable resin a thermoplastic block copolymer
- an elastomer a solvent in addition to the silicone resin and the spacer.
- Examples of the vinyl resin include vinyl acetate resin, acrylic resin, and styrene resin.
- examples of the thermoplastic resin include polyolefin resin, ethylene-vinyl acetate copolymer, and polyamide resin.
- examples of the curable resin include an epoxy resin, a urethane resin, a polyimide resin, and an unsaturated polyester resin.
- the curable resin may be a room temperature curable resin, a thermosetting resin, a photocurable resin, or a moisture curable resin.
- the curable resin may be used in combination with a curing agent.
- thermoplastic block copolymer examples include a styrene-butadiene-styrene block copolymer, a styrene-isoprene-styrene block copolymer, a hydrogenated product of a styrene-butadiene-styrene block copolymer, and a styrene-isoprene. -Hydrogenated products of styrene block copolymers.
- the elastomer examples include styrene-butadiene copolymer rubber and acrylonitrile-styrene block copolymer rubber.
- Examples of the solvent include water and organic solvents.
- An organic solvent is preferred because it can be easily removed.
- Examples of the organic solvent include alcohol compounds such as ethanol, ketone compounds such as acetone, methyl ethyl ketone, and cyclohexanone, aromatic hydrocarbon compounds such as toluene, xylene, and tetramethylbenzene, cellosolve, methyl cellosolve, butyl cellosolve, carbitol, and methylcarbitol.
- the adhesive includes, for example, a filler, an extender, a softener, a plasticizer, a polymerization catalyst, a curing catalyst, a colorant, an antioxidant, a heat stabilizer, a light stabilizer, Various additives such as ultraviolet absorbers, lubricants, antistatic agents and flame retardants may be included.
- the method for dispersing the spacer in the silicone resin may be any conventionally known dispersion method and is not particularly limited.
- Examples of a method for dispersing the spacer in the silicone resin include a method in which the spacer is added to the silicone resin and then kneaded and dispersed with a planetary mixer or the like, and the spacer is homogenized in water or an organic solvent. Etc., and then added to the silicone resin, kneaded with a planetary mixer, etc. and dispersed, and after the silicone resin is diluted with water or an organic solvent, the spacer is added. And a method of kneading and dispersing with a planetary mixer or the like.
- the content of the silicone resin is preferably 70% by weight or more, more preferably 80% by weight in 100% by weight of the adhesive. It is above, Preferably it is 99 weight% or less, More preferably, it is 95 weight% or less.
- a semiconductor sensor according to the present invention includes a first member, a semiconductor sensor chip that is a second member, and an adhesive layer that bonds the first and second members.
- the adhesive layer is formed of a cured product of the adhesive.
- FIG. 1 is a cross-sectional view showing an example of a semiconductor sensor using an adhesive for mounting a semiconductor sensor chip according to the present invention.
- a semiconductor sensor 1 shown in FIG. 1 includes a first member 3, a semiconductor sensor chip that is a second member 4, and an adhesive layer 5 that bonds the first member 3 and the second member 4.
- the adhesive layer 5 is a cured product of an adhesive including the spacer 2 and the silicone resin.
- the spacer 2 exists between the first member 3 and the second member 4, and the first member 3 and the second member 4 are horizontally bonded at a constant interval (gap). .
- the manufacturing method of the semiconductor sensor is not particularly limited.
- An example of a method for manufacturing a semiconductor sensor includes a method in which the adhesive is disposed between a first member and a second member to obtain a laminate, and then the laminate is heated and pressurized.
- the first member include electronic components such as semiconductor chips, capacitors and diodes, and electronic components such as printed circuit boards, flexible printed circuit boards, glass epoxy substrates, and glass substrates.
- the first member is preferably an electronic component.
- the adhesive is preferably an adhesive for bonding electronic components.
- the semiconductor sensor chip is preferably a pressure sensor.
- the first member may have a first electrode on the surface.
- the second member may have a second electrode on the surface.
- the electrode provided on the member include metal electrodes such as a gold electrode, a nickel electrode, a tin electrode, an aluminum electrode, a copper electrode, a silver electrode, a titanium electrode, a molybdenum electrode, and a tungsten electrode.
- the electrode is preferably a gold electrode, a nickel electrode, a titanium electrode, a tin electrode, or a copper electrode.
- the electrode is preferably an aluminum electrode, a titanium electrode, a copper electrode, a molybdenum electrode, or a tungsten electrode.
- the electrode formed only with aluminum may be sufficient and the electrode by which the aluminum layer was laminated
- the material for the metal oxide layer include indium oxide doped with a trivalent metal element and zinc oxide doped with a trivalent metal element.
- the trivalent metal element include Sn, Al, and Ga.
- a solution A was prepared by dissolving 0.5 parts by weight of tert-butyl-2-ethylperoxyhexanoate (polymerization initiator, “Perbutyl O” manufactured by NOF Corporation) in 30 parts by weight of the obtained silicone oligomer. .
- aqueous solution B was prepared by mixing 80 parts by weight of a 5 wt% aqueous solution of “GOHSENOL GH-20” manufactured by Nippon Synthetic Chemical Co., Ltd. After the said solution A was put into the separable flask installed in the warm bath, the said aqueous solution B was added.
- spacer 1 In a 500 ml separable flask placed in a hot tub, 6.5 parts by weight of the obtained silicone particles, 0.6 parts by weight of hexadecyltrimethylammonium bromide, 240 parts by weight of distilled water, and 120 parts by weight of methanol are added. I put it in. After stirring at 40 ° C. for 1 hour, 3.0 parts by weight of divinylbenzene and 0.5 part by weight of styrene were added, the temperature was raised to 75 ° C., and the mixture was stirred for 0.5 hours. Thereafter, 0.4 part by weight of 2,2′-azobis (isobutyric acid) dimethyl was added, and the reaction was carried out with stirring for 8 hours. The whole amount of the polymerized particles was washed with water by centrifugation to obtain a spacer 1. In the obtained spacer 1, the average particle diameter was 20.5 ⁇ m, and the CV value of the particle diameter was 3.5%.
- spacer 2 was obtained in the same manner as in the preparation of the spacer 1 except that both-end acrylic silicone oil (“X-22-2445” manufactured by Shin-Etsu Chemical Co., Ltd.) was used instead of the silicone oligomer.
- the average particle diameter was 20.3 ⁇ m, and the CV value of the particle diameter was 3.6%.
- Example 1 Preparation of silicone adhesive
- One-component thermosetting silicone adhesive TSE322 manufactured by Momentive Performance Materials
- spacer 1 spacer 1 as gap control particles so that the content in the resulting adhesive would be 2% by weight.
- the mixture was stirred with a stirrer and dispersed uniformly to prepare a silicone adhesive.
- Example 2 A pressure sensor structure was obtained in the same manner as in Example 1 except that the spacer 2 was used instead of the spacer 1 when preparing the silicone adhesive.
- Example 3 A pressure sensor structure was obtained in the same manner as in Example 1 except that the spacer 3 was used instead of the spacer 1 when preparing the silicone adhesive.
- Example 1 A pressure sensor structure was obtained in the same manner as in Example 1 except that the spacer A was used instead of the spacer 1 when preparing the silicone adhesive.
- Example 2 A pressure sensor structure was obtained in the same manner as in Example 1 except that the spacer B was used in place of the spacer 1 when preparing the silicone adhesive.
- Example 3 A pressure sensor structure was obtained in the same manner as in Example 1 except that the spacer C was used instead of the spacer 1 when preparing the silicone adhesive.
- connection strength The shear strength at 260 ° C of the obtained pressure sensor structure was measured. From the shear strength, heat resistance: connection strength was determined.
- Shear strength is 150 N / cm 2 or more ⁇ : Shear strength is 100 N / cm 2 or more and less than 150 N / cm 2 ⁇ : Shear strength is less than 100 N / cm 2
- the sample was observed with a stereomicroscope ("SMZ-10" manufactured by Nikon Corporation). It was observed whether or not the adhesive layer was cracked or whether or not the adhesive layer was peeled off from the substrate.
- the cold / heat resistance cycle characteristics were determined according to the following criteria.
- the 10% compression modulus of the spacer contained in the adhesive is 2000 N / mm 2 or less, and the spacer is relatively soft. Therefore, noise detection can be reduced in the pressure sensor structure. confirmed.
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Abstract
Description
本発明に係る半導体センサチップ実装用接着剤(以下、接着剤と記載することがある)は、半導体センサチップの実装に用いられる接着剤である。本発明に係る接着剤は、シリコーン樹脂とスペーサとを含む。
F:スペーサが10%圧縮変形したときの荷重値(N)
S:スペーサが10%圧縮変形したときの圧縮変位(mm)
R:スペーサの半径(mm)
L1:負荷を与えるときの原点用荷重値から反転荷重値に至るまでの圧縮変位
L2:負荷を解放するときの反転荷重値から原点用荷重値に至るまでの除荷変位
本発明に係る半導体センサは、第1の部材と、第2の部材である半導体センサチップと、第1,第2の部材を接着している接着層とを備える。本発明に係る半導体センサでは、上記接着層が、上記接着剤の硬化物により形成されている。
シリコーンオリゴマーの作製:
温浴槽内に設置した100mlのセパラブルフラスコに、1,3-ジビニルテトラメチルジシロキサン1重量部と、0.5重量%p-トルエンスルホン酸水溶液20重量部とを入れた。40℃で1時間撹拌した後、炭酸水素ナトリウム0.05重量部を添加した。その後、ジメトキシメチルフェニルシラン10重量部、ジメチルジメトキシシラン49重量部、トリメチルメトキシシラン0.6重量部、及びメチルトリメトキシシラン3.6重量部を添加し、1時間撹拌を行った。その後、10重量%水酸化カリウム水溶液1.9重量部を添加して、85℃まで昇温してアスピレーターで減圧しながら、10時間撹拌、反応を行った。反応終了後、常圧に戻し40℃まで冷却して、酢酸0.2重量部を添加し、12時間以上分液漏斗内で静置した。二層分離後の下層を取り出して、エバポレーターにて精製することでシリコーンオリゴマーを得た。
得られたシリコーンオリゴマー30重量部に、tert-ブチル-2-エチルペルオキシヘキサノアート(重合開始剤、日油社製「パーブチルO」)0.5重量部を溶解させた溶解液Aを用意した。また、イオン交換水150重量部に、ラウリル硫酸トリエタノールアミン塩の40重量%水溶液(乳化剤)0.8重量部と、ポリビニルアルコール(重合度:約2000、けん化度:86.5~89モル%、日本合成化学社製「ゴーセノールGH-20」)の5重量%水溶液80重量部とを混合して、水溶液Bを用意した。温浴槽中に設置したセパラブルフラスコに、上記溶解液Aを入れた後、上記水溶液Bを添加した。その後、Shirasu Porous Glass(SPG)膜(細孔平均径約20μm)を用いることで、乳化を行った。その後、85℃に昇温して、9時間重合を行った。重合後の粒子の全量を遠心分離により水洗浄した後、分級操作を行ってシリコーン粒子を得た。
温浴槽内に設置した500mlのセパラブルフラスコに、得られたシリコーン粒子6.5重量部と、ヘキサデシルトリメチルアンモニウムブロミド0.6重量部と、蒸留水240重量部と、メタノール120重量部とを入れた。40℃で1時間攪拌した後、ジビニルベンゼン3.0重量部とスチレン0.5重量部とを添加して、75℃まで昇温して0.5時間攪拌を行った。その後、2,2’-アゾビス(イソ酪酸)ジメチル0.4重量部を入れて8時間攪拌、反応を行った。重合後の粒子の全量を遠心分離により水洗浄して、スペーサ1を得た。得られたスペーサ1では、平均粒子径は20.5μm、粒子径のCV値は3.5%であった。
シリコーンオリゴマーの代わりに両末端アクリルシリコーンオイル(信越化学工業社製「X-22-2445」)を用いたこと以外はスペーサ1の作製と同様にして、スペーサ2を得た。得られたスペーサ2では、平均粒子径は20.3μm、粒子径のCV値は3.6%であった。
エチレングリコールジメタクリレート100gと、イソボルニルアクリレート800gと、シクロヘキシルメタクリレート100gと、過酸化ベンゾイル35gとを混合し、均一に溶解させて、モノマー混合液を得た。1重量%ポリビニルアルコール水溶液5kgを作製し、反応釜に入れた。この反応釜の中に上記モノマー混合液を更に入れ、2~4時間攪拌することで、モノマー混合液の液滴が所定の粒子径になるように、粒子径を調整した。この後90℃の窒素雰囲気下で9時間反応を行い、スペーサ3を得た。得られたスペーサ3を熱水にて数回洗浄した後、分級操作を行った。得られたスペーサ3では、平均粒子径は20.1μm、粒子径のCV値は3.1%であった。
市販の20μmのシリカ粒子「ミクロパールSI」(積水化学工業社製)
テトラメチロールメタン500gと、ジビニルベンゼン500gと、過酸化ベンゾイル20gとを混合し、均一に溶解させてモノマー混合液を得た。1重量%ポリビニルアルコール水溶液5kgを作製し、反応釜に入れた。この反応釜の中に上記モノマー混合液を更に入れ、2~4時間攪拌することで、モノマー混合液の液滴が所定の粒子径になるように、粒子径を調整した。この後85℃の窒素雰囲気下で10時間反応を行い、スペーサBを得た。得られたスペーサBを熱水にて数回洗浄した後、分級操作を行った。得られたスペーサBでは、平均粒子径は19.8μm、粒子径のCV値は3.5%であった。
ポリテトラメチレングリコールジアクリレート970gと、テトラメチロールメタンテトラアクリレート30gと、過酸化ベンゾイル39gとを混合し、均一に溶解させてモノマー混合液を得た。1重量%ポリビニルアルコール水溶液5kgを作製し、反応釜に入れた。この反応釜の中に上記モノマー混合液を更に入れ、2~4時間攪拌することで、モノマー混合液の液滴が所定の粒子径になるように、粒子径を調整した。この後85℃の窒素雰囲気下で9時間反応を行い、スペーサCを得た。得られたスペーサC熱水にて数回洗浄した後、分級操作を行った。得られたスペーサCでは、平均粒子径は20.1μm、粒子径のCV値は3.2%であった。
(シリコーン接着剤の調製)
1成分加熱硬化型シリコーン接着剤 TSE322(モメンティブパフォーマンスマテリアルズ社製)に対して、得られる接着剤中での含有量が2重量%になるようにギャップ制御粒子としてスペーサ1を添加し、遊星式攪拌機にて攪拌し、均一に分散させて、シリコーン接着剤を調製した。
上記シリコーン接着剤をシリンジに充填し、ディスペンサを用いてプリント基板上に厚さが20μmとなるように塗布した後、塗布した接着剤上に圧力センサチップを配し、150℃で10分加熱して硬化、接着し、圧力センサ構造体を得た。
シリコーン接着剤の調製の際、スペーサ2をスペーサ1の代わりに用いたこと以外は実施例1と同様にして、圧力センサ構造体を得た。
シリコーン接着剤の調製の際、スペーサ3をスペーサ1の代わりに用いたこと以外は実施例1と同様にして、圧力センサ構造体を得た。
シリコーン接着剤の調製の際、スペーサAをスペーサ1の代わりに用いたこと以外は実施例1と同様にして、圧力センサ構造体を得た。
シリコーン接着剤の調製の際、スペーサBをスペーサ1の代わりに用いたこと以外は実施例1と同様にして、圧力センサ構造体を得た。
シリコーン接着剤の調製の際、スペーサCをスペーサ1の代わりに用いたこと以外は実施例1と同様にして、圧力センサ構造体を得た。
(1)10%圧縮弾性率
フィッシャー社製「フィッシャースコープH-100」を用いて、上述した方法で、スペーサの10%圧縮弾性率を測定した。
スペーサを走査型電子顕微鏡で観察し、観察された画像における任意に選択した50個の各スペーサの最大粒子径を算術平均することにより求めた。
フィッシャー社製「フィッシャースコープH-100」を用いて、上述した方法で、スペーサの圧縮回復率を測定した。
フィッシャー社製「フィッシャースコープH-100」を用いて、スペーサを150℃、大気中で1000時間加熱した後の10%圧縮弾性率を測定した。スペーサの熱経時変化を以下の基準で判定した。
○:加熱後の10%圧縮弾性率の加熱前の10%圧縮弾性率に対する比が、0.95以上、1.05以下
△:加熱後の10%圧縮弾性率の加熱前の10%圧縮弾性率に対する比が、0.9以上、0.95未満、又は、1.05より大きく、1.10以下
×:加熱後の10%圧縮弾性率の加熱前の10%圧縮弾性率に対する比が、0.9未満、又は、1.10より大きい
得られた圧力センサ構造体の260℃でのシェア強度を測定した。シェア強度から、耐熱性:接続強度を判定した。
○○:シェア強度が150N/cm2以上
○:シェア強度が100N/cm2以上、150N/cm2未満
×:シェア強度が100N/cm2未満
得られた圧力センサ構造体を用いて、液槽式熱衝撃試験機(ESPEC社製「TSB-51」)を用いて、-40℃で5分間保持した後、120℃まで昇温し、120℃で5分間保持した後-40℃まで降温する過程を1サイクルとする冷熱サイクル試験を実施した。500サイクル後にサンプルを取り出した。
○○:接着層にクラックが生じておらず、かつ接着層が基板から剥離していない
○:接着層にわずかなクラックが生じているか、又は接着層が基板からわずかに剥離している
×:接着層に大きなクラックが生じているか、又は接着層が基板から大きく剥離している
2…スペーサ
3…第1の部材
4…第2の部材(半導体センサチップ)
5…接着層
Claims (6)
- 半導体センサチップの実装に用いられる接着剤であって、
シリコーン樹脂と、スペーサとを含み、
前記スペーサの10%圧縮弾性率が、10N/mm2以上、2000N/mm2以下であり、
前記スペーサの圧縮回復率が、20%以下であり、
前記スペーサの平均粒子径が、10μm以上、200μm以下である、半導体センサチップ実装用接着剤。 - 前記スペーサを150℃で1000時間加熱したときに、加熱後のスペーサの10%圧縮弾性率の加熱前のスペーサの10%圧縮弾性率に対する比が、0.95以上、1.05以下である、請求項1に記載の半導体センサチップ実装用接着剤。
- 前記接着剤中に含まれる前記スペーサにおいて、前記スペーサの平均粒子径に対して、平均粒子径が1.5倍以上であるスペーサが存在しないか、又は、前記スペーサの全個数100%中、前記スペーサの平均粒子径に対して、平均粒子径が1.5倍以上であるスペーサが0.1%以下の個数で存在する、請求項1又は2に記載の半導体センサチップ実装用接着剤。
- 前記スペーサが、シリコーンスペーサである、請求項1~3のいずれか1項に記載の半導体センサチップ実装用接着剤。
- 前記スペーサが、イソボルニル基を有する(メタ)アクリル化合物の重合体である、請求項1~3のいずれか1項に記載の半導体センサチップ実装用接着剤。
- 第1の部材と、
第2の部材である半導体センサチップと、
前記第1の部材と前記第2の部材とを接着している接着層とを備え、
前記接着層が、請求項1~5のいずれか1項に記載の半導体センサチップ実装用接着剤の硬化物である、半導体センサ。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/082,491 US10790217B2 (en) | 2016-03-10 | 2017-03-10 | Adhesive for semiconductor sensor chip mounting, and semiconductor sensor |
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| CN201780003503.6A CN108139285B (zh) | 2016-03-10 | 2017-03-10 | 半导体传感器芯片安装用粘结剂以及半导体传感器 |
| KR1020187006709A KR102331523B1 (ko) | 2016-03-10 | 2017-03-10 | 반도체 센서 칩 실장용 접착제 및 반도체 센서 |
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| US20230140786A1 (en) * | 2019-10-15 | 2023-05-04 | Sekisui Chemical Co., Ltd. | Gap material, adhesive, and display device |
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| WO2017082353A1 (ja) * | 2015-11-11 | 2017-05-18 | 積水化学工業株式会社 | 粒子、粒子材料、接続材料及び接続構造体 |
| US10679925B2 (en) * | 2016-03-10 | 2020-06-09 | Sekisui Chemical Co., Ltd. | Adhesive for semiconductor mounting, and semiconductor sensor |
| EP3796373B1 (de) | 2019-09-20 | 2023-06-28 | BIOTRONIK SE & Co. KG | Platinenanordnung eines implantierbaren medizinischen geräts |
| KR102584513B1 (ko) * | 2020-12-31 | 2023-10-06 | 세메스 주식회사 | 온도 변화가 수반되는 분위기에 제공되는 기판 지지 부재의 수평 측정용 기판형 센서, 이를 이용한 수평 측정 방법 및 비일시적 컴퓨터 판독가능 매체 |
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- 2017-03-10 US US16/082,491 patent/US10790217B2/en active Active
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- 2017-03-10 WO PCT/JP2017/009815 patent/WO2017155116A1/ja not_active Ceased
- 2017-03-10 TW TW106108073A patent/TWI751142B/zh active
- 2017-03-10 KR KR1020227002671A patent/KR20220019061A/ko not_active Ceased
- 2017-03-10 KR KR1020187006708A patent/KR102356926B1/ko active Active
- 2017-03-10 CN CN201780003503.6A patent/CN108139285B/zh active Active
- 2017-03-10 EP EP17763448.2A patent/EP3428599B1/en active Active
- 2017-03-10 TW TW106108074A patent/TWI725131B/zh active
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20210015805A (ko) * | 2018-05-31 | 2021-02-10 | 세키스이가가쿠 고교가부시키가이샤 | 스페이서 입자, 접착제 및 접착 구조체 |
| KR102599329B1 (ko) | 2018-05-31 | 2023-11-07 | 세키스이가가쿠 고교가부시키가이샤 | 스페이서 입자, 접착제 및 접착 구조체 |
| KR20230156169A (ko) * | 2018-05-31 | 2023-11-13 | 세키스이가가쿠 고교가부시키가이샤 | 스페이서 입자, 접착제 및 접착 구조체 |
| KR102718610B1 (ko) | 2018-05-31 | 2024-10-18 | 세키스이가가쿠 고교가부시키가이샤 | 스페이서 입자, 접착제 및 접착 구조체 |
| US20230140786A1 (en) * | 2019-10-15 | 2023-05-04 | Sekisui Chemical Co., Ltd. | Gap material, adhesive, and display device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2017155117A1 (ja) | 2018-03-15 |
| EP3428599B1 (en) | 2023-06-07 |
| CN108139285B (zh) | 2021-06-04 |
| TWI725131B (zh) | 2021-04-21 |
| KR20180118102A (ko) | 2018-10-30 |
| CN108139285A (zh) | 2018-06-08 |
| EP3428600A1 (en) | 2019-01-16 |
| TW201800546A (zh) | 2018-01-01 |
| EP3428600A4 (en) | 2019-09-25 |
| EP3428599A4 (en) | 2019-09-25 |
| KR102331523B1 (ko) | 2021-11-26 |
| CN108139286A (zh) | 2018-06-08 |
| WO2017155116A1 (ja) | 2017-09-14 |
| JPWO2017155116A1 (ja) | 2018-03-15 |
| KR20220019061A (ko) | 2022-02-15 |
| JP6971192B2 (ja) | 2021-11-24 |
| CN108139286B (zh) | 2021-06-25 |
| EP3428599A1 (en) | 2019-01-16 |
| US20190088573A1 (en) | 2019-03-21 |
| US10790217B2 (en) | 2020-09-29 |
| JP2018135525A (ja) | 2018-08-30 |
| JP6322337B2 (ja) | 2018-05-09 |
| US20190078002A1 (en) | 2019-03-14 |
| EP3428600B1 (en) | 2023-05-24 |
| KR20180117589A (ko) | 2018-10-29 |
| TW201800545A (zh) | 2018-01-01 |
| JP2018142709A (ja) | 2018-09-13 |
| TWI751142B (zh) | 2022-01-01 |
| US10679925B2 (en) | 2020-06-09 |
| KR102356926B1 (ko) | 2022-01-28 |
| JP6322336B2 (ja) | 2018-05-09 |
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