WO2020073822A1 - 三苯基硫鎓盐化合物及其应用 - Google Patents
三苯基硫鎓盐化合物及其应用 Download PDFInfo
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- WO2020073822A1 WO2020073822A1 PCT/CN2019/108369 CN2019108369W WO2020073822A1 WO 2020073822 A1 WO2020073822 A1 WO 2020073822A1 CN 2019108369 W CN2019108369 W CN 2019108369W WO 2020073822 A1 WO2020073822 A1 WO 2020073822A1
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- OPJBJUYQAZNYTJ-UHFFFAOYSA-N Cc(c(F)c1)ccc1S(c1cc(F)c(C)cc1)=O Chemical compound Cc(c(F)c1)ccc1S(c1cc(F)c(C)cc1)=O OPJBJUYQAZNYTJ-UHFFFAOYSA-N 0.000 description 1
- GJJHFNKDBFNTJL-UHFFFAOYSA-N Cc(ccc([S+](c(cc1)ccc1OC)c1ccc(C)c(F)c1)c1)c1F Chemical compound Cc(ccc([S+](c(cc1)ccc1OC)c1ccc(C)c(F)c1)c1)c1F GJJHFNKDBFNTJL-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/03—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton
- C07C309/06—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing halogen atoms, or nitro or nitroso groups bound to the carbon skeleton
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- C07D209/56—Ring systems containing three or more rings
- C07D209/80—[b, c]- or [b, d]-condensed
- C07D209/82—Carbazoles; Hydrogenated carbazoles
- C07D209/88—Carbazoles; Hydrogenated carbazoles with hetero atoms or with carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals, directly attached to carbon atoms of the ring system
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- C07D307/77—Heterocyclic compounds containing five-membered rings having one oxygen atom as the only ring hetero atom ortho- or peri-condensed with carbocyclic rings or ring systems
- C07D307/91—Dibenzofurans; Hydrogenated dibenzofurans
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- C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
- C07D333/50—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom condensed with carbocyclic rings or ring systems
- C07D333/76—Dibenzothiophenes
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- C07D335/00—Heterocyclic compounds containing six-membered rings having one sulfur atom as the only ring hetero atom
- C07D335/04—Heterocyclic compounds containing six-membered rings having one sulfur atom as the only ring hetero atom condensed with carbocyclic rings or ring systems
- C07D335/10—Dibenzothiopyrans; Hydrogenated dibenzothiopyrans
- C07D335/12—Thioxanthenes
- C07D335/14—Thioxanthenes with hetero atoms or with carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals, directly attached in position 9
- C07D335/16—Oxygen atoms, e.g. thioxanthones
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- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic Table
- C07F5/02—Boron compounds
- C07F5/027—Organoboranes and organoborohydrides
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- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic Table
- C07F9/02—Phosphorus compounds
- C07F9/06—Phosphorus compounds without P—C bonds
- C07F9/16—Esters of thiophosphoric acids or thiophosphorous acids
- C07F9/165—Esters of thiophosphoric acids
- C07F9/20—Esters of thiophosphoric acids containing P-halide groups
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
Definitions
- the invention belongs to the technical field of functional organic compounds, and particularly relates to a novel triphenylsulfonium salt compound and its application.
- the cationic photocuring system Compared with the free radical type, the cationic photocuring system has the advantages of small polymerization inhibition by oxygen, small volume shrinkage during curing, and wider selection of resin types. It is widely used in the manufacture of electronic parts and semiconductor components. Triphenylsulfonium salt has high sensitivity to exposure light sources such as KrF or ArF excimer lasers, and is generally used as a photoacid generator / photoinitiator for chemically amplified resists for mass production of semiconductor devices. However, the cationic structure of triphenylsulfonium salt is symmetrical and has high crystallinity. It has poor solubility in monomers and conventional organic solvents in the photocuring system, resulting in limited addition amount, and it is prone to uneven dispersion in the composition and precipitation during use. And other issues.
- JP2005091976A and JP2002193925A introduce alkyl, fluoroalkyl and other substituent groups at the para position of the benzene ring group
- WO2005037778A introduces alkyl groups at the meta position of the benzene ring group. Compared with the unsubstituted ones, they The solubility in the solvent is improved, but the photosensitive activity is greatly reduced.
- TW201444790A introduces an electron-withdrawing group in the meta position of the benzene ring group. Compared with the unsubstituted one, it can improve the solubility while maintaining the photosensitive activity at the same level.
- the main object of the present invention is to provide a triphenylsulfonium salt compound and its application to solve the problem that the structure of the triphenylsulfonium salt in the prior art cannot have both high solubility and high sensitivity.
- the present invention aims to provide a new triphenylsulfonium salt compound through structural improvement based on the existing technology, which has excellent solubility and photosensitive activity and can be used as a resist acid generator A good alternative to photoinitiators for cationic polymerization.
- triphenylsulfonium salt compound having a structure represented by the following general formula (I) or general formula (III):
- R 1 represents an electron-withdrawing group
- R 2 represents an amplifier group
- Each R 3 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aryl , Any one of substituted or unsubstituted aralkyl, optionally, means that -CH 2 -in the group of R 3 may be substituted by -O-, -S-, and the R 3 group May be connected to each other to form a ring; each R 4 and R 5 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy Any one of a group, a substituted or unsubstituted aryl group, a substituted or unsubstituted aralkyl group, and optionally,
- the provided triphenylsulfonium salt compound may also be a bis-triphenylsulfonium salt compound, which has a structure represented by the general formula (II):
- R 1 represents an electron-withdrawing group
- R 2 represents an amplifier group
- each R 3 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted alkyl , A substituted or unsubstituted alkoxy group, a substituted or unsubstituted aryl group, a substituted or unsubstituted aralkyl group, optionally, the carbon-carbon bond in the group representing R 3 may be- O-, -S- interrupted, and R 3 groups can be connected to each other to form a ring; n represents an integer of 0-5; each R 4 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy , Sulfonyl, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aryl, substituted or unsubstit
- a photosensitive composition containing any of the triphenylsulfonium salt compounds described above.
- the application shows that by configuring the electron-withdrawing group and the amplifying group at the meta and para positions of the phenyl ring group of the triphenylsulfonium salt, compared to the unsubstituted Phenylsulfonium salts can have significantly improved solubility and photosensitive activity, and also have obvious performance advantages over existing improved alternatives described in the background art.
- triphenylsulfonium salt compound having the structure represented by the following general formula (I):
- R 1 represents an electron-withdrawing group
- R 2 represents an amplifier group
- each R 3 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted alkyl , A substituted or unsubstituted alkoxy group, a substituted or unsubstituted aryl group, a substituted or unsubstituted aralkyl group, optionally, represents -CH 2 -in the group of R 3 May be substituted by -O-, -S-, and R 3 groups may be connected to each other to form a ring; each R 4 and R 5 independently represent halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfo Any one of acyl, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aryl, substituted or unsub
- the application shows that by arranging the electron-withdrawing group and the amplifying group in the meta and para positions of the phenyl ring group of the triphenylsulfonium salt, compared with the unsubstituted triphenylsulfonium salt, it can have a significant improvement
- C 1 -C x includes all integer values of carbon numbers between 1 and x in addition to 1 and x, for example, C 1 -C 8 alkyl Include all straight or branched chain alkyl groups of C 1 , C 2 , C 3 , C 4 , C 5 , C 6 , C 7 and C 8 . Due to space limitations, the descriptions are not expanded one by one, but their meanings are clear and unambiguously determined by those skilled in the art. It should be understood that the included numerical values can be used as the basis for further modification / limitation.
- Suitable electron-withdrawing groups R 1 include halogen, cyano, nitro, alkoxy, haloalkyl, acyl, acyloxy, and sulfonyl.
- Halogen may be fluorine, chlorine, bromine or iodine. In consideration of cost and environmental performance, fluorine is preferred.
- the alkoxy group may be a C 1 -C 8 linear or branched alkoxy group such as methoxy, ethoxy, or propoxy, preferably a C 1 -C 4 linear or branched alkoxy group.
- Haloalkyl refers to an alkyl group in which at least one hydrogen atom is substituted with halogen, and the alkyl group may be a linear C 1 -C 8 chain such as methyl, ethyl, n-propyl, n-butyl, n-pentyl, and n-hexyl.
- Alkyl, or C 3 -C 8 branched alkyl such as isopropyl, isobutyl, sec-butyl, and tert-butyl, or C such as cyclopropyl, cyclobutyl, cyclopentyl, and cyclohexyl 3 -C 8 cycloalkyl.
- the halogenated alkyl group is selected from a fluorine-substituted alkyl group, it is advantageous for the photosensitive activity of the compound, and a C 1 -C 4 perfluoroalkyl group is more preferred.
- Acyl may have or The structure shown, wherein R 6 represents hydrogen, halogen, substituted or unsubstituted alkyl, substituted or unsubstituted aryl.
- R 6 represents hydrogen, fluorine, chlorine, C 1 -C 7 linear or branched alkyl group, or C 1 -C 7 linear or branched fluoroalkyl group (more preferably, C 1 -C 7 linear or branched perfluoroalkyl).
- the acyl group in the acyloxy group has the same meaning as the acyl group in the above paragraph.
- the sulfonyl group may be mesyl, difluoromethanesulfonyl, trifluoromethanesulfonyl, benzenesulfonyl, tosyl, and the like.
- the electron-withdrawing group R 1 is preferably a halogen, a cyano group, a nitro group, a halogenated alkyl group, or an acyl group, and particularly those specific groups are exemplified among the above groups.
- the so-called amplifier group refers to a group that has an amplifier effect on the solubility and / or photosensitive activity of the compound.
- R 2 is selected from halogen, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aralkyl.
- Halogen is preferably fluorine.
- the alkyl group is preferably an unsubstituted alkyl group, which may be a C 1 -C 8 linear alkyl group such as methyl, ethyl, n-propyl, n-butyl, n-pentyl, n-hexyl, or isopropyl, C 3 -C 8 branched alkyl groups such as isobutyl, sec-butyl, and tert-butyl. More preferably, the alkyl group as amplifying group is a C 1 -C 4 linear or branched alkyl group, including methyl, ethyl, n-propyl, isopropyl, n-butyl or isobutyl.
- the alkoxy group is preferably unsubstituted, wherein the alkyl group has the same meaning as the alkyl group in the above paragraph.
- the aralkyl group is an aryl-terminated alkyl group. From the point of view of the amplification effect, a phenyl-terminated C 1 -C 8 alkyl group is preferred, and a phenyl-terminated C 1 -C 4 linear alkyl group is more preferred. Radicals, including benzyl, phenethyl, phenylpropyl or phenylbutyl.
- the combination of the amplifier group and the electron-withdrawing group has a synergistic effect on the microelectronic structure of the triphenylsulfonium salt, improving the performance of the compound. More specifically, the present invention can further improve the solubility of triphenylsulfonium salt by using the above-mentioned amplification group, without negatively affecting the photosensitive activity, and even some compounds show relatively better photosensitive activity.
- the structure of general formula (I) may optionally contain R 3 substituent groups, provided that it does not negatively affect the photocuring application performance of the compound.
- R 3 independently represents hydrogen, halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted Alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aryl, substituted or unsubstituted aralkyl, optionally, -CH 2 -in the group may be -O-, -S - substituted, and R 3 groups may be attached to each other to form a ring, wherein the R 3 groups may be attached to each other to form a ring preferably two adjacent R 3 represents a benzene ring to form a ring.
- n represents the number of R 3 groups, and may be an integer of 0-5.
- n is 0, at this time, side reactions that may occur in the subsequent photocuring process caused by the substitution group or unknown negative effects on the effect may be avoided.
- n is 2 and two R 3 represent R 1 and R 2, with the top of the benzene ring, R 1 and R 2 are vertically symmetric, i.e. a triphenyl sulfonium salt of the present invention is represented by the following general formula (IV) Structure shown:
- R 1 and R 2 have the same meaning as described above, the electron-withdrawing group R 1 is preferably halogen, cyano, nitro, haloalkyl, acyl, R 2 is preferably fluorine, methyl, ethyl, n- Propyl, n-butyl, n-pentyl, n-hexyl, isopropyl, isobutyl, sec-butyl, tert-butyl, methoxy, ethoxy, n-propoxy, n-butoxy, n-pentyl Oxygen, n-hexyloxy, isopropoxy, isobutoxy, sec-butoxy, tert-butoxy, benzyl, phenethyl, phenylpropyl or phenylbutyl.
- m represents 0, 1 or 2, more preferably 0 or 1.
- R 4 is preferably located at the para position of the benzene ring group.
- the triphenylsulfonium salt contains the symmetric electron-withdrawing group and the amplifying group as shown in the structure above in the upper and lower benzene ring groups under the same anionic part, Compared with the improved triphenylsulfonium salt in the art, the compound exhibits significantly further improved solubility and photosensitive activity.
- the structure of general formula (I) may optionally contain R 4 substituents, provided that it does not negatively affect the photocuring performance of the compound.
- Halogen may be fluorine, chlorine, bromine or iodine. In consideration of cost and environmental performance, fluorine is preferred.
- the acyl group can be selected from: C 2 -C 8 aliphatic acyl groups, such as acetyl, propionyl, butyryl, valeryl, isovaleryl, hexanoyl, octanoyl, heptanoyl, etc .; C 7 -C 12 aromatic Acyl groups such as benzoyl, methylbenzoyl, trimethylbenzoyl, ⁇ -phenylpropionyl, naphthoyl and the like.
- the acyl group in the acyloxy group may have the same meaning as shown in the above paragraph.
- the sulfonyl group may be mesyl, difluoromethanesulfonyl, trifluoromethanesulfonyl, benzenesulfonyl, tosyl, and the like.
- the alkyl group may be substituted or unsubstituted.
- the alkyl group may be selected from C 1 -C 8 straight chain, C 3 -C 8 branched chain or C 3 -C 8 cyclic alkyl group, for example: methyl, ethyl, n-propyl, iso Propyl, n-butyl, isobutyl, sec-butyl, tert-butyl, n-pentyl, isopentyl, sec-pentyl, tert-pentyl, neopentyl, n-hexyl, isohexyl, 3-methylpentyl Group, 2-methylpentyl, 1,2-dimethylbutyl, cyclopropyl, cyclopentyl, cyclohexyl, etc.
- the alkyl group is selected from C 1 -C 4 linear or branched chain alkyl groups, or C 3 -C 6 cyclic alkyl groups.
- Substituents in substituted alkyl groups include, but are not limited to: halogen (fluorine, chlorine, bromine, iodine), amine groups, hydroxyl groups, and the like.
- the alkoxy group may be substituted or unsubstituted, and the alkyl group and the substituent may have the same meaning as shown in the above paragraph.
- the aryl group may be substituted or unsubstituted.
- the aryl group may be phenyl, naphthyl, anthracenyl, pyrenyl, or the like.
- a substituent it may be: C 1 -C 4 alkyl such as methyl, ethyl, propyl, butyl, etc., halogen such as fluorine, chlorine, bromine, iodine, C 1 -C 3 alkoxy such as methyl Oxygen, ethoxy, propoxy, acyl, sulfonyl, hydroxyl, amine, nitro, phenyl, etc.
- Aralkyl is an aryl-terminated alkyl group, which may be substituted or unsubstituted. Among them, the aryl moiety and the substituent may have the same meaning as shown in the above paragraph.
- the alkyl portion thereof C 1 -C 6 alkylene groups are preferred, including methylene, ethylene and the like.
- the aralkyl group is benzyl, phenethyl, or phenylpropyl, and optionally, at least one hydrogen on the phenyl is substituted with the substituent shown in the above paragraph.
- n represents the number of R 4 groups, and may be an integer of 0-5. Preferably, m represents 0, 1 or 2, more preferably 0 or 1. When m is 1, R 4 is preferably located at the para position of the benzene ring group.
- X - represents a non-nucleophilic anion, including (but not limited to): M -, ClO 4 - , CN -, HSO 4 -, NO 3 -, CF 3 COO -, (BM 4) -, (SbM 6) - , (AsM 6) -, ( PM 6) -, Al [OC (CF 3) 3] 4 -, R 7 SO 3 -, (R 7 SO 2) 3 C -, (R 7 SO 2) 2 N - , B (C 6 M 5) 4 -, Ga (C 6 M 5) 4 - , or [(Rf) b PF 6 - b] -.
- M represents halogen, such as fluorine, chlorine, bromine, iodine, preferably fluorine.
- R 7 represents a C 1 -C 20 alkyl group, a C 1 -C 20 perfluoroalkyl group, or a C 6 -C 20 aryl group or substituted aryl group.
- the alkyl group and the perfluoroalkyl group may be linear or branched Either chain or loop.
- Rf represents an alkyl group in which ⁇ 80% of hydrogen atoms are replaced by fluorine atoms
- the alkyl group may include linear alkyl groups such as methyl, ethyl, propyl, butyl, pentyl, hexyl, octyl, etc.
- Alkyl groups such as isopropyl, isobutyl, sec-butyl, tert-butyl, etc., cycloalkyl groups such as cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, etc.
- Rf based on the number of moles of hydrogen atoms existing in the alkyl group, the ratio of substitution with fluorine atoms is preferably 80% or more, preferably 90% or more, and more preferably 100%. When the substitution ratio of fluorine atoms is within these ranges, the photosensitivity of the compound becomes better.
- Rf may include: CF 3 -, CF 3 CF 2 -, (CF 3) 2 CF -, CF 3 CF 2 CF 2 -, CF 3 CF 2 CF 2 CF 2 -, (CF 3) 2 CFCF 2 -, CF 3 CF 2 ( CF 3) CF - and (CF 3) 3 C -.
- b represents an integer of 1-5
- b Rf groups may be the same as or different from each other.
- M - anion represented can include: Cl -, Br -, F -.
- BM 4 -, (SbM 6) -, (AsM 6) -, (PM 6) - anion represented, include: BF 4 -, SbF 6 - , AsF 6 -, PF -.
- R 7 SO 3 - anion represented may include: CF 3 SO 3 -, C 2 F 5 SO 3 -, C 3 F 7 SO 3 -, C 4 F 9 SO 3 -, C 6 F 5 SO 3 - , C 3 F 7 SO 3 - , p-toluenesulfonate anion, benzenesulfonic acid anion, camphorsulfonic acid anion, methanesulfonic acid anion, ethanesulfonic acid anion, sulfonic acid anion and a sulfonate anion butoxy.
- (R 7 SO 2) 3 C - anion represented include: (CF 3 SO 2) 3 C -, (C 2 F 5 SO 2) 3 C -, (C 3 F 7 SO 2) 3 C - and (C 4 F 9 SO 2) 3 C -.
- (R 7 SO 2) 2 N - anion represented include: (CF 3 SO 2) 2 N -, (C 2 F 5 SO 2) 2 N -, (C 3 F 7 SO 2) 2 N - and (C 4 F 9 SO 2) 2 N -.
- B (C 6 M 5) 4 -, Ga (C 6 M 5) 4 - anions represented include: B (C 6 F 5) 4 -, Ga (C 6 F 5) 4 -.
- [(Rf) b PF 6- b] - anion represented include: (CF 3 CF 2) 2 PF 4 -, (CF 3 CF 2) 3 PF 3 -, [(CF 3) 2 CF] 2 PF 4 -, [(CF 3 ) 2 CF] 3 PF 3 -, (CF 3 CF 2 CF 2) 2 PF 4 -, (CF 3 CF 2 CF 2) 3 PF 3 -, [(CF 3) 2 CFCF 2] 2 PF 4 -, [ (CF 3) 2 CFCF 2] 3 PF 3 -, (CF 3 CF 2 CF 2 CF 2) 2 PF 4 - , and (CF 3 CF 2 CF 2 CF 2) 3 PF 3 - Wait.
- the method for preparing the triphenylsulfonium salt compound of the present invention is not particularly limited, and a well-known organic synthesis process can be used.
- a sulfonium salt can be obtained by performing a sulfonation reaction between a commercially available diaryl sulfoxide and an aryl compound, and then, if necessary The anion is introduced through the salt exchange reaction, thereby obtaining the triphenylsulfonium salt compound of the present invention.
- the triphenylsulfonium salt compound of the present invention has the property of releasing Lewis acid by irradiation of energy rays, and can be used as a resist acid generator and a photoinitiator for cationic polymerization.
- high-energy radiation such as electron beams or X-rays can also be used.
- the triphenylsulfonium salt compound of the present invention is mixed with a photosensitive active monomer (such as a cationic polymerizable compound) to form a photosensitive composition, and can be applied to the production of lithography, letterpress printing plates, printed boards, and IC and LSI light In resists, photocurable inks, coatings, adhesives and other fields.
- a photosensitive active monomer such as a cationic polymerizable compound
- the triphenylsulfonium salt compound represented by the general formula (I) of the present invention has excellent solubility, high light generation efficiency and photosensitive activity, and has good market application value.
- the present invention also provides a thioxanthone sulfonium salt having the structure represented by the following general formula (III):
- R 1 , R 2 , R 3 , R 4 and X - have the same meaning as described above, and n and m each independently represent an integer of 1-5.
- the above thioxanthone sulfonium salt can be regarded as a structure formed by connecting one R 3 and one R 4 in the general formula (I) to form a keto group, and it is also considered to be able to obtain triphenylsulfide represented by the general formula (I) Similar benefits with onium salt compounds.
- the preparation method of the compound can be synthesized by referring to the process described in the patent document WO2003072567, the entire content of which is hereby incorporated by reference.
- triphenylsulfonium salt compound which is a bis-triphenylsulfonium salt compound, and has a structure shown by the general formula (II):
- R 1 represents an electron-withdrawing group
- R 2 represents an amplifier group
- each R 3 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted alkyl , A substituted or unsubstituted alkoxy group, a substituted or unsubstituted aryl group, a substituted or unsubstituted aralkyl group, optionally, the carbon-carbon bond in the group representing R 3 may be- O-, -S- interrupted, and R 3 groups can be connected to each other to form a ring; n represents an integer of 0-5; each R 4 independently represents halogen, nitro, cyano, hydroxy, acyl, acyloxy , Sulfonyl, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted aryl, substituted or unsubstit
- the application shows that by arranging the electron-withdrawing group and the amplifying group at the meta and para positions of the benzene ring group of the bis-triphenylsulfonium salt, compared to the unsubstituted triphenylsulfonium salt Significantly improved solubility and photosensitive activity, and also has a clear performance advantage over existing improved alternatives described in the background.
- C 1 -C x includes all integer values of carbon numbers between 1 and x in addition to 1 and x, for example, C 1 -C 8 alkyl Include all straight or branched chain alkyl groups of C 1 , C 2 , C 3 , C 4 , C 5 , C 6 , C 7 and C 8 . Due to space limitations, the descriptions are not expanded one by one, but their meanings are clear and unambiguously determined by those skilled in the art. It should be understood that the included numerical values can be used as the basis for further modification / limitation.
- Suitable electron-withdrawing groups R 1 are selected from halogen, cyano, nitro, haloalkyl, acyl, acyloxy, and sulfonyl.
- Halogen may be fluorine, chlorine, bromine or iodine. From the viewpoint of environmental performance, fluorine is preferred.
- Haloalkyl refers to an alkyl group in which at least one hydrogen atom is substituted with halogen, and the alkyl group may be a linear C 1 -C 8 chain such as methyl, ethyl, n-propyl, n-butyl, n-pentyl, and n-hexyl.
- Alkyl, or C 3 -C 8 branched alkyl such as isopropyl, isobutyl, sec-butyl, and tert-butyl, or C such as cyclopropyl, cyclobutyl, cyclopentyl, and cyclohexyl 3 -C 8 cycloalkyl.
- the halogenated alkyl group is selected from a fluorine-substituted alkyl group, it is advantageous for the photosensitive activity of the compound, and a C 1 -C 4 perfluoroalkyl group is more preferred.
- Acyl may have or The structure shown, wherein R 6 represents hydrogen, halogen, substituted or unsubstituted alkyl, substituted or unsubstituted aryl, substituted or unsubstituted aralkyl.
- R 6 represents hydrogen, fluorine, chlorine, C 1 -C 7 linear or branched alkyl group, C 1 -C 7 linear or branched haloalkyl group (more preferably, C 1 -C 7 linear or branched perfluoroalkyl), C 6 -C 12 aryl, or C 7 -C 16 aralkyl.
- the acyl group in the acyloxy group has the same meaning as the acyl group in the above paragraph.
- the sulfonyl group may be mesyl, difluoromethanesulfonyl, trifluoromethanesulfonyl, benzenesulfonyl, tosyl, and the like.
- the electron-withdrawing group R 1 is preferably halogen, cyano, nitro, haloalkyl, especially those preferred above.
- the so-called amplifier group refers to a group that has an amplifier effect on the solubility and / or photosensitive activity of the compound.
- R 2 is selected from a substituted or unsubstituted alkyl group, a substituted or unsubstituted alkoxy group, a substituted or unsubstituted aralkyl group.
- the alkyl group is preferably an unsubstituted alkyl group, which may be a C 1 -C 8 linear alkyl group such as methyl, ethyl, n-propyl, n-butyl, n-pentyl, n-hexyl, or isopropyl, C 3 -C 8 branched alkyl groups such as isobutyl, sec-butyl, and tert-butyl. More preferably, the alkyl group as amplifying group is a C 1 -C 4 linear or branched alkyl group, including methyl, ethyl, n-propyl, isopropyl, n-butyl or isobutyl.
- the alkoxy group is preferably unsubstituted, wherein the alkyl group has the same meaning as shown in the above paragraph.
- the aralkyl group is an aryl-terminated alkyl group. From the point of view of the amplification effect, a phenyl-terminated C 1 -C 8 alkyl group is preferred, and a phenyl-terminated C 1 -C 4 linear alkyl group is more preferred. Radicals, including benzyl, phenethyl, phenylpropyl or phenylbutyl. Optionally, at least one hydrogen atom in the aralkyl group is substituted with halogen (especially fluorine).
- the structure of the general formula (II) may optionally contain a R 3 substituent group, provided that it does not adversely affect the photocuring application performance of the compound.
- R 3 independently represents hydrogen, halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted Alkyl groups, substituted or unsubstituted alkoxy groups, substituted or unsubstituted aryl groups, substituted or unsubstituted aralkyl groups, optionally, the carbon-carbon bond in the group may be replaced by -O-, -S- Interrupted, and R 3 groups can be connected to each other to form a ring.
- n represents the number of R 3 groups, and may be an integer of 0-5.
- n is 0, at this time, side reactions that may occur in the subsequent photocuring process caused by the substitution group or unknown negative effects on the effect may be avoided.
- n is 2 and two R 3 represent the same aromatic ring R 1 and R 2, with the top of the benzene ring, R 1 and R 2 are vertically symmetric, i.e. double the present invention - triphenylsulfonium
- the onium salt has the structure represented by the following general formula (V):
- each substituent group has the same meaning as described above.
- the bis-triphenylsulfonium salt contains symmetric electron-withdrawing groups and amplification groups as shown in the above structure in the upper and lower four benzene ring groups, it is the same as the improvement in the prior art Compared with triphenylsulfonium salt, this compound exhibits significantly further improved solubility and photosensitive activity.
- the structure of the general formula (II) may optionally contain a R 4 substituent group, provided that it does not negatively affect the photocuring performance of the compound.
- R 4 independently represents hydrogen, halogen, nitro, cyano, hydroxy, acyl, acyloxy, sulfonyl, substituted or unsubstituted Alkyl groups, substituted or unsubstituted alkoxy groups, substituted or unsubstituted aryl groups, substituted or unsubstituted aralkyl groups, optionally, the carbon-carbon bond in the group may be replaced by -O-, -S- Interrupted, and R 4 groups can be connected to each other to form a ring.
- Halogen may be fluorine, chlorine, bromine or iodine. In consideration of cost and environmental performance, fluorine is preferred.
- the acyl group can be selected from: C 2 -C 8 aliphatic acyl groups, such as acetyl, propionyl, butyryl, valeryl, isovaleryl, hexanoyl, octanoyl, heptanoyl, etc .; C 7 -C 12 aromatic Acyl groups such as benzoyl, methylbenzoyl, trimethylbenzoyl, ⁇ -phenylpropionyl, naphthoyl and the like.
- the acyl group in the acyloxy group may have the same meaning as the acyl group in the above paragraph.
- the sulfonyl group may be mesyl, difluoromethanesulfonyl, trifluoromethanesulfonyl, benzenesulfonyl, tosyl, and the like.
- the alkyl group may be substituted or unsubstituted.
- the alkyl group may be selected from C 1 -C 8 linear, branched or cyclic alkyl groups, for example: methyl, ethyl, n-propyl, isopropyl, n-butyl, isobutyl, secondary Butyl, tert-butyl, n-pentyl, isopentyl, sec-pentyl, tert-pentyl, neopentyl, n-hexyl, isohexyl, 3-methylpentyl, 2-methylpentyl, 1,2 -Dimethylbutyl, cyclopropyl, cyclopentyl, cyclohexyl, etc.
- the alkyl group is selected from C 1 -C 4 linear or branched chain alkyl groups, or C 3 -C 6 cyclic alkyl groups.
- Substituents in substituted alkyl groups include, but are not limited to: halogen (fluorine, chlorine, bromine, iodine), amine groups, hydroxyl groups, and the like.
- the alkoxy group may be substituted or unsubstituted, and the alkyl group and the substituent may have the same meaning as shown in the above paragraph.
- the aryl group may be substituted or unsubstituted.
- the aryl group may be phenyl, naphthyl, anthracenyl, pyrenyl, or the like.
- a substituent it may be: C 1 -C 4 alkyl such as methyl, ethyl, propyl, butyl, etc., halogen such as fluorine, chlorine, bromine, iodine, C 1 -C 3 alkoxy such as methyl Oxygen, ethoxy, propoxy, acyl, sulfonyl, hydroxyl, amine, nitro, phenyl, etc.
- Aralkyl is an aryl-terminated alkyl group, which may be substituted or unsubstituted. Among them, the aryl moiety and the substituent may have the same meaning as shown in the above paragraph.
- the alkyl portion thereof C 1 -C 6 alkylene groups are preferred, including methylene, ethylene and the like.
- the aralkyl group is benzyl, phenethyl, or phenylpropyl, and optionally, at least one hydrogen on the phenyl is substituted with the substituent shown in the above paragraph.
- R 4 is preferably hydrogen, nitro, cyano, substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, especially those preferred above.
- n represents the number of R 4 groups and can be an integer from 0-4. Preferably, m represents 0, 1 or 2, more preferably 0 or 1. When m is 1, R 4 is preferably ortho to the side of the A group.
- the structure of general formula (II) may optionally contain R 5 substituents, provided that it does not negatively affect the photocuring performance of the compound.
- R 5 may have the same meaning as the R 4 substituent group described above.
- R 4 and each R 5 may form a ring with the phenyl and A groups connected to each.
- p represents the number of R 5 groups and can be an integer from 0-4. Preferably, p represents 0, 1 or 2, more preferably 0 or 1. When p is 1, R 5 is preferably located in the ortho position on the side of the A group.
- A represents a connecting bond (ie a single bond), * O *, * S *, alkylene or alkenylene, and M represents an empty, * O * ⁇ * S * or Group, wherein, * represents a connecting position, R 8 , R 9 , and R 10 each independently represent hydrogen, a C 1 -C 20 linear or branched alkyl group, a C 3 -C 20 cycloalkyl group, C 4 -C 20 cycloalkylalkyl or C 4 -C 20 alkylcycloalkyl.
- the alkylene group is a C 1 -C 4 linear alkylene group
- M represents vacancy, it means that the two benzene rings are connected only through the linking group A.
- A represents a bond.
- the S atoms on the left and right sides are respectively connected to three benzene rings.
- the connection position of the S atom is preferably the para position of the group A.
- X - represents a non-nucleophilic anion, including (but not limited to): Q -, ClO 4 - , CN -, HSO 4 -, NO 3 -, CF 3 COO -, (BQ 4) -, (SbQ 6) - , (AsQ 6) -, ( PQ 6) -, Al [OC (CF 3) 3] 4 -, R 6 SO 3 -, (R 6 SO 2) 3 C -, (R 6 SO 2) 2 N - , B (C 6 Q 5) 4 -, Ga (C 6 Q 5) 4 - , or [(Rf) b PF 6- b] -.
- Q represents halogen, such as fluorine, chlorine, bromine, and iodine, preferably fluorine.
- R 6 represents a C 1 -C 20 alkyl group, a C 1 -C 20 perfluoroalkyl group, or a C 6 -C 20 aryl group or substituted aryl group, and the alkyl group and the perfluoroalkyl group may be linear or branched Either chain or loop.
- Rf represents an alkyl group in which ⁇ 80% of hydrogen atoms are replaced by fluorine atoms
- the alkyl group may include linear alkyl groups such as methyl, ethyl, propyl, butyl, pentyl, hexyl, octyl, etc.
- Alkyl groups such as isopropyl, isobutyl, sec-butyl, tert-butyl, etc., cycloalkyl groups such as cyclopropyl, cyclobutyl, cyclopentyl, cyclohexyl, etc.
- Rf based on the number of moles of hydrogen atoms existing in the alkyl group, the ratio of substitution with fluorine atoms is preferably 80% or more, preferably 90% or more, and more preferably 100%. When the substitution ratio of fluorine atoms is within these ranges, the photosensitivity of the compound becomes better.
- Rf may include: CF 3 -, CF 3 CF 2 -, (CF 3) 2 CF -, CF 3 CF 2 CF 2 -, CF 3 CF 2 CF 2 CF 2 -, (CF 3) 2 CFCF 2 -, CF 3 CF 2 ( CF 3) CF - and (CF 3) 3 C -.
- b represents an integer of 1-5
- b Rf groups may be the same as or different from each other.
- Q - represents the anion, include: Cl -, Br -, F -.
- (BQ 4) -, (SbQ 6) -, (AsQ 6) -, (PQ 6) - anion represented, include: BF 4 -, SbF 6 - , AsF 6 -, PF -.
- R 6 SO 3 - anion represented may include: CF 3 SO 3 -, C 2 F 5 SO 3 -, C 3 F 7 SO 3 -, C 4 F 9 SO 3 -, C 6 F 5 SO 3 - , C 3 F 7 SO 3 - , p-toluenesulfonate anion, benzenesulfonic acid anion, camphorsulfonic acid anion, methanesulfonic acid anion, ethanesulfonic acid anion, sulfonic acid anion and a sulfonate anion butoxy.
- (R 6 SO 2) 3 C - anion represented include: (CF 3 SO 2) 3 C -, (C 2 F 5 SO 2) 3 C -, (C 3 F 7 SO 2) 3 C - and (C 4 F 9 SO 2) 3 C -.
- (R 6 SO 2) 2 N - represents an anion, include: (CF 3 SO 2) 2 N -, (C 2 F 5 SO 2) 2 N -, (C 3 F 7 SO 2) 2 N - and (C 4 F 9 SO 2) 2 N -.
- B (C 6 Q 5) 4 -, Ga (C 6 Q 5) 4 - anions represented include: B (C 6 F 5) 4 -, Ga (C 6 F 5) 4 -.
- [(Rf) b PF 6- b] - anion represented include: (CF 3 CF 2) 2 PF 4 -, (CF 3 CF 2) 3 PF 3 -, [(CF 3) 2 CF] 2 PF 4 -, [(CF 3 ) 2 CF] 3 PF 3 -, (CF 3 CF 2 CF 2) 2 PF 4 -, (CF 3 CF 2 CF 2) 3 PF 3 -, [(CF 3) 2 CFCF 2] 2 PF 4 -, [ (CF 3) 2 CFCF 2] 3 PF 3 -, (CF 3 CF 2 CF 2 CF 2) 2 PF 4 - , and (CF 3 CF 2 CF 2 CF 2) 3 PF 3 - Wait.
- the method for preparing the bis-triphenylsulfonium salt compound of the present invention is not particularly limited, and a well-known organic synthesis process can be used.
- a sulfonium salt is obtained by a sulfonation reaction of a diaryl sulfoxide and a diaryl compound, and then anion is introduced through a salt exchange reaction as needed, thereby obtaining the present invention Bis-triphenylsulfonium salt compound.
- the bis-triphenylsulfonium salt compound of the present invention has the property of emitting Lewis acid by irradiation of active energy rays, and can act on acid-reactive organic substances to decompose or polymerize, so it can be used as a photoresist for light Used as acid generator or as a cationic polymerization photoinitiator.
- high-energy radiation such as electron beams or X-rays can also be used.
- the bis-triphenylsulfonium salt compound of the present invention is mixed with a photosensitive active monomer (such as a cationic polymerizable compound) to form a photosensitive composition, and can be applied to the production of printing plates for planographic and relief printing, printed circuit boards, ICs, and LSIs In the fields of photoresist, photocurable ink, coating, adhesive and so on.
- a photosensitive active monomer such as a cationic polymerizable compound
- the bis-triphenylsulfonium salt compound represented by the general formula (II) of the present invention has excellent solubility, high light generation efficiency and photosensitive activity, and has good market application value.
- the structure of the target product was confirmed by nuclear magnetic resonance hydrogen spectroscopy and mass spectrometry.
- the specific characterization results are as follows:
- the structure of the target product was confirmed by nuclear magnetic resonance hydrogen spectroscopy and mass spectrometry.
- the specific characterization results are as follows:
- Example II-1 Referring to the preparation method of Example II-1, using dichlorosulfoxide and the corresponding substituted benzene as starting materials, the compounds C2-C25 shown in Table 2 were prepared.
- the above compounds were prepared as 0.02 mmol / g acetonitrile solution.
- a 5.00 g prepared acetonitrile solution was added to a Petri dish with an inner diameter of 100 mm, and then under the irradiation of an ultraviolet lamp (model FL10BL), an energy of 200 mj / cm 2 was received at a light intensity of 0.8 mw / cm 2 .
- BTB was used as an indicator, and titration was performed with a 0.05N potassium hydroxide ethanol solution. Titrate the corresponding solution before light irradiation to obtain the blank value, subtract the blank value from the titration measurement value, and calculate the acid production rate by the following formula conversion:
- Acid production rate% (acid titration value-blank value) (mol) / theoretical molar number of compound (mol) ⁇ 100%.
- Resin B represents a novolak resin obtained by condensation of m-cresol and p-cresol at a molar ratio of 1: 1 under formaldehyde and acid catalysis, with a molecular weight of about 10,000;
- the photoinitiators are the above-mentioned compounds A-1 to A-38, C-1 to C-25 or the comparative compounds B-1 and B-2, D-1 and D-2.
- Each component was stirred uniformly at the above ratio and filtered through a membrane filter with a pore size of 1 ⁇ m to prepare a resist composition with a solid content of 40%.
- the resist composition was evenly coated on the silicon wafer substrate by a spin coater, and dried to obtain a 20 ⁇ m thick photoresist coating.
- a tetramethylammonium hydroxide solution with a mass fraction of 2.38% was used for development for 5 minutes, then washed with running water, and dried with nitrogen to obtain a 10 ⁇ m line pattern.
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Abstract
Description
Claims (25)
- 三苯基硫鎓盐化合物,具有如下通式(I)或通式(II)或通式(III)所示结构:其中,R 1表示吸电子基团;R 2表示增幅基团;各R 3各自独立地表示卤素、硝基、氰基、羟基、酰基、酰氧基、磺酰基、取代或未取代的烷基、取代或未取代的烷氧基、取代或未取代的芳基、取代或未取代的芳烷基中的任意一种,任选地,表示所述通式(I)中的R 3的基团中的-CH 2-可被-O-、-S-所取代,表示所述通式(II)中的R 3的基团中的碳碳键可被-O-、-S-所中断,且R 3基团可彼此相连成环;各R 4和R 5各自独立地表示卤素、硝基、氰基、羟基、酰基、酰氧基、磺酰基、取代或未取代的烷基、取代或未取代的烷氧基、取代或未取代的芳基、取代或未取代的芳烷 基中的任意一种,任选地,表示所述通式(I)中所述R 4的基团中的-CH 2-可被-O-、-S-、或-CH=CH-所取代,表示所述通式(II)中的R 4和所述R 5的基团中的碳碳键可被-O-、-S-所中断,且R 4基团可彼此相连成环,R 5基团可彼此相连成环;所述通式(I)中,n和m各自独立地表示0-5的任意一个整数;所述通式(II)中n表示0-5的任意一个整数,m和p各自独立地表示0-4的任意一个整数,所述通式(III)中n和m各自独立地表示1-5的整数,X -表示非亲核性阴离子,通式(II)中,A和M各自独立地表示连接基团。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述R 1选自卤素、氰基、硝基、烷氧基、卤代烷基、酰基、酰氧基、磺酰基中的任意一种,优选所述R 1选自卤素、氰基、硝基、卤代烷基、酰基中的任意一种。
- 根据权利要求2所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 1的所述卤素是氟、氯、溴或碘,优选氟。
- 根据权利要求2所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 1的所述烷氧基是C 1-C 8的直链或支链烷氧基中的任意一种,优选为C 1-C 4的直链或支链烷氧基中的任意一种。
- 根据权利要求2所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 1的所述卤代烷基中的烷基是C 1-C 8的直链烷基、或是C 3-C 8的支链烷基、或是C 3-C 8的环烷基,优选卤代烷基是C 1-C 4的全氟烷基中的任意一种。
- 根据权利要求2所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 1的所述磺酰基是甲磺酰基、二氟甲磺酰基、三氟甲磺酰基、苯磺酰基、甲苯磺酰基。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述R 2选自卤素、取代或未取代的烷基、取代或未取代的烷氧基、取代或未取代的芳烷基中的任意一种,优选所述通式(II)中的所述R 2选自取代或未取代的烷基、取代或未取代的烷氧基、取代或未取代的芳烷基中的任意一种,优选作为所述R 2的所述卤素为氟。
- 根据权利要求8所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 2的所述烷基是未取代的C 1-C 8的直链烷基或C 3-C 8的支链烷基,优选是C 1-C 4的直链或支链的烷基。
- 根据权利要求8所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 2的所述烷氧基是未取代的,其中所述烷氧基中的烷基是未取代的C 1-C 8的直链烷基或C 3-C 8的支链烷基,优选是C 1-C 4的直链或支链的烷基。
- 根据权利要求8所述的三苯基硫鎓盐化合物,其特征在于:作为所述R 2的所述芳烷基是以苯基封端的C 1-C 8的烷基,优选是以苯基封端的C 1-C 4的直链烷基。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述通式(I)中和所述通式(II)中的n是0。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述m表示0、1或2,优选0或1;当m取1时,通式(I)中的R 4位于苯环基团的S的对位,通式(II)中的R 4位于苯环基团的A基团的邻位。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述X -表示M -、ClO 4 -、CN -、HSO 4 -、NO 3 -、CF 3COO -、(BM 4) -、(SbM 6) -、(AsM 6) -、(PM 6) -、Al[OC(CF 3) 3] 4 -、R 7SO 3 -、(R 7SO 2) 3C -、(R 7SO 2) 2N -、B(C 6M 5) 4 -、Ga(C 6M 5) 4 -或[(Rf) bPF 6-b] -,其中M表示卤素,R 7表示C 1-C 20的烷基、C 1-C 20的全氟烷基、C 6-C 20的芳基或取代芳基中的任意一种,Rf表示≥80%的氢原子被氟原子取代的烷基,b表示1-5的任意一个整数,且各个Rf基团彼此之间可以相同,也可以不同。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述通式(I)和所述通式(III)中,各所述R 4各自独立地选自酰基、酰氧基、磺酰基、取代或未取代的烷基、取代或未取代的烷氧基、取代或未取代的芳基、取代或未取代的芳烷基中的任意一种,形成所述R 4的各基团中的-CH 2-可被-O-、-S-、或-CH=CH-所取代,所述取代所用的取代基为C 1-C 4的烷基、卤素、C 1-C 3的烷氧基、酰基、磺酰基、羟基、胺基、硝基、苯基中的任意一种; 当R 4有多个时,相邻所述R 4与所述R 4相连的苯基可以成环,优选所述酰基和酰氧基中酰基为C 2-C 8的脂肪族酰基、C 7-C 12的芳香族酰基,优选所述磺酰基为苯磺酰基、甲苯磺酰基,所述烷基和所述烷氧基中的烷基优选为C 1-C 8的直链、C 3-C 8的支链、C 3-C 8的环烷基。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述通式(II)中,各所述R 4和各所述R 5各自独立地选自硝基、氰基、取代或未取代的烷基、取代或未取代的烷氧基中的任意一种,形成所述R 4和所述R 5的各基团中的-CH 2-可被-O-、-S-、或-CH=CH-所取代,所述R 4和各所述R 5与与各自相连的苯基、A可以成环。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述p表示0、1或2,优选0或1,所述p表示1时,所述R 5位于苯环基团的A基团的邻位。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述A表示连接键、*O*、*S*、亚烷基或亚链烯基,优选所述亚烷基是C 1-C 4的直链亚烷基,优选所述亚链烯基是-CH=CH-。
- 根据权利要求20所述的三苯基硫鎓盐化合物,其特征在于:M不为空,A为连接键。
- 根据权利要求1所述的三苯基硫鎓盐化合物,其特征在于:所述通式(II)中,在与A直接相连的两个苯环上,S原子的连接位是基团A的对位。
- 权利要求1-22中任一项所述的三苯基硫鎓盐化合物作为抗蚀剂产酸剂和/或阳离子聚合用光引发剂的用途。
- 包含权利要求1-22中任一项所述的三苯基硫鎓盐化合物的感光性组合物。
- 权利要求24所述的感光性组合物在制作平版、凸版用印刷版、印刷基板、光致抗蚀剂,光固化油墨、涂料和粘合剂中的应用。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/284,274 US11746085B2 (en) | 2018-10-09 | 2019-09-27 | Triphenylsulfonium salt compound, and uses thereof |
| KR1020217013626A KR102636084B1 (ko) | 2018-10-09 | 2019-09-27 | 트리페닐술포늄 염 화합물 및 이의 응용 |
| JP2021519803A JP7345544B2 (ja) | 2018-10-09 | 2019-09-27 | トリフェニルスルホニウム塩化合物及びその使用 |
| EP19871797.7A EP3865473A4 (en) | 2018-10-09 | 2019-09-27 | TRIPHENYLPHOSPHONIUM SALT COMPOUND AND ITS USES |
| EP23154959.3A EP4198019A1 (en) | 2018-10-09 | 2019-09-27 | Triphenylphosphonium salt compound, and uses thereof |
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| CN201811172185.9A CN111018764A (zh) | 2018-10-09 | 2018-10-09 | 三苯基硫鎓盐化合物及其应用 |
| CN201811171951.X | 2018-10-09 | ||
| CN201811172185.9 | 2018-10-09 | ||
| CN201811171951.XA CN111018763B (zh) | 2018-10-09 | 2018-10-09 | 一种双-三苯基硫鎓盐化合物及其应用 |
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| EP (2) | EP3865473A4 (zh) |
| JP (1) | JP7345544B2 (zh) |
| KR (1) | KR102636084B1 (zh) |
| WO (1) | WO2020073822A1 (zh) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019194178A (ja) * | 2018-04-25 | 2019-11-07 | 住友化学株式会社 | 塩、酸発生剤、レジスト組成物及びレジストパターンの製造方法 |
| WO2023106171A1 (ja) * | 2021-12-10 | 2023-06-15 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、レジスト膜、パターン形成方法及び電子デバイスの製造方法 |
| US11746085B2 (en) | 2018-10-09 | 2023-09-05 | Changzhou Tronly Advanced Electronic Materials Co., Ltd. | Triphenylsulfonium salt compound, and uses thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP7491173B2 (ja) * | 2020-10-01 | 2024-05-28 | 信越化学工業株式会社 | スルホニウム塩、化学増幅レジスト組成物及びパターン形成方法 |
| WO2025115477A1 (ja) * | 2023-11-28 | 2025-06-05 | サンアプロ株式会社 | スルホニウム塩及び酸発生剤 |
| WO2025187697A1 (ja) * | 2024-03-07 | 2025-09-12 | 東京応化工業株式会社 | レジスト組成物、レジストパターン形成方法、化合物、酸発生剤、酸拡散制御剤及び高分子化合物 |
| JP2025166423A (ja) * | 2024-04-24 | 2025-11-06 | 東京応化工業株式会社 | レジスト組成物、レジストパターン形成方法、化合物、酸発生剤、及び酸拡散制御剤 |
| WO2025249390A1 (ja) * | 2024-05-31 | 2025-12-04 | 富士フイルム株式会社 | 感活性光線性又は感放射線性樹脂組成物、レジスト膜、パターン形成方法、及び電子デバイスの製造方法 |
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| JP7284622B2 (ja) | 2018-04-25 | 2023-05-31 | 住友化学株式会社 | レジスト組成物及びレジストパターンの製造方法 |
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| JPWO2023106171A1 (zh) * | 2021-12-10 | 2023-06-15 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3865473A4 (en) | 2022-11-23 |
| EP3865473A1 (en) | 2021-08-18 |
| EP4198019A1 (en) | 2023-06-21 |
| US20210387948A1 (en) | 2021-12-16 |
| KR102636084B1 (ko) | 2024-02-14 |
| KR20210075123A (ko) | 2021-06-22 |
| JP7345544B2 (ja) | 2023-09-15 |
| JP2022504679A (ja) | 2022-01-13 |
| US11746085B2 (en) | 2023-09-05 |
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