WO2021138916A1 - 一种样本分析系统及其样本调度方法 - Google Patents

一种样本分析系统及其样本调度方法 Download PDF

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Publication number
WO2021138916A1
WO2021138916A1 PCT/CN2020/071533 CN2020071533W WO2021138916A1 WO 2021138916 A1 WO2021138916 A1 WO 2021138916A1 CN 2020071533 W CN2020071533 W CN 2020071533W WO 2021138916 A1 WO2021138916 A1 WO 2021138916A1
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WIPO (PCT)
Prior art keywords
sample
analysis device
analysis
scheduling
area
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Ceased
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PCT/CN2020/071533
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English (en)
French (fr)
Inventor
黄立新
李积新
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Shenzhen Mindray Bio Medical Electronics Co Ltd
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Shenzhen Mindray Bio Medical Electronics Co Ltd
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Application filed by Shenzhen Mindray Bio Medical Electronics Co Ltd filed Critical Shenzhen Mindray Bio Medical Electronics Co Ltd
Priority to CN202080087779.9A priority Critical patent/CN114829946B/zh
Priority to PCT/CN2020/071533 priority patent/WO2021138916A1/zh
Priority to EP20912346.2A priority patent/EP4089420A4/en
Publication of WO2021138916A1 publication Critical patent/WO2021138916A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0462—Buffers [FIFO] or stacks [LIFO] for holding carriers between operations

Definitions

  • the invention relates to a sample analysis system and a sample scheduling method thereof.
  • the samples to be tested are unified at the front end of the system (for example, the input module of the system front end) for input, and then the system distributes the samples to be tested to the corresponding one or more analysis devices in turn To test.
  • the system generally introduces a track, and connects the input module and each analysis device through the track, so that the sample can pass through the track from the input module to any analysis device for testing.
  • the system usually plans and dispatches the samples to be tested to the corresponding analysis devices for testing according to the principle of load balancing.
  • both analysis equipment 1 and analysis equipment 2 need to be tested. Therefore, part of this batch of samples can be planned to go to analysis equipment 1 first, and then to analyze equipment 2 test, the remaining part of the sample is planned to first go to the analysis equipment 2 test, and then to the analysis equipment 1 test, so neither the analysis equipment 1 nor the analysis equipment 2 are idled. From this point of view, the test efficiency is relatively improved .
  • the system plans and dispatches the samples to be tested to the corresponding analysis equipment according to the principle of load balancing. Sometimes it is not flexible enough. Some new planning and dispatching principles need to be invented and proposed.
  • the present invention mainly provides a sample analysis system and a sample scheduling method thereof.
  • an embodiment provides a sample scheduling method of a sample analysis system, the sample analysis system having a buffer area and including a plurality of analysis devices, and the sample scheduling method includes:
  • the control will wait in the buffer area for samples that currently need to enter the front-end track area of the analysis device.
  • the sample scheduling method further includes: obtaining and determining the scheduling plan of the sample to be tested based on the item information of the sample to be tested; wherein the scheduling plan includes at least the target analysis equipment and the target analysis equipment required to perform the item detection of the sample to be tested. The path of the sample to be tested to its target analysis device.
  • the obtaining and determining the scheduling plan of the sample to be tested according to the item information of the sample to be tested includes:
  • the scheduling plan of each sample to be tested in the buffer area is determined.
  • the determining the scheduling plan of each sample to be tested in the buffer area according to the item information of the sample to be tested includes: after obtaining the item information of the sample to be tested, based on the principle of analyzing equipment load balance, determining each sample to be tested The scheduling plan of the test sample.
  • the scheduling threshold After controlling to wait in the buffer for a sample that currently needs to enter the front-end track area of the analysis device, it is also determined whether the load of the front-end track area of other target analysis devices of the sample is less than or equal to the scheduling threshold, If so, control to dispatch the sample to the front track area of the corresponding other target analysis equipment to be aspirated.
  • the front-end track area of other target analysis devices of the sample is not fully loaded and the load is less than or equal to the scheduled load. Threshold, if yes, control to dispatch the sample to the front track area of the corresponding other target analysis equipment to be aspirated.
  • the sample scheduling method further includes: further determining whether the front-end track area of the analysis device is fully loaded, and when it is determined that the front-end track area of the analysis device is fully loaded, directly controlling the sample that currently needs to enter the front-end track area of the analysis device to be aspirated Wait in the buffer area.
  • the front-end track area of the analysis device to be aspirated in the buffer area after directly controlling the sample that currently needs to enter the front-end track area of the analysis device to be aspirated in the buffer area, it is also determined whether the front-end track area of other target analysis devices of the sample is not fully loaded and The load is less than or equal to the scheduling threshold, and if so, control to schedule the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • the scheduling threshold of the analysis device is determined by the analysis speed of each item configured by the analysis device.
  • the scheduling threshold of the analysis device is determined by the analysis speed of each item configured by the analysis device, including: multiplying the analysis speed of each item configured by the analysis device by a corresponding weight After the summation, the scheduling threshold of the analysis device is determined by the sum obtained.
  • the weight of the item of the analysis device is negatively correlated with the analysis speed of the item by the analysis device.
  • an embodiment provides a sample analysis system, including:
  • Input components for receiving samples to be tested
  • a plurality of analysis devices are used to test samples; each analysis device has a front-end track area, and the front-end track area is provided with a sample suction position;
  • Rails used to connect input components and various analysis equipment
  • a dispatching device for dispatching samples from the input component to the front-end track area of the corresponding analysis equipment through the track;
  • the processor is used to obtain the scheduling threshold of the analysis device and the load condition of the front-end track area of the analysis device; the processor controls the current need to enter the analysis according to the relationship between the scheduling threshold of the analysis device and the load of the front-end track area of the analysis device
  • the front-end track area of the equipment is used for the scheduling of aspirated samples.
  • the processor controls the scheduling of samples that currently need to enter the front-end track area of the analysis device to be aspirated according to the relationship between the scheduling threshold of the analysis device and the load in the front-end track area of the analysis device, including:
  • the processor controls the samples that currently need to enter the front-end track area of the analysis device to be aspirated to be dispatched to the analysis device.
  • Front track area
  • the processor controls the samples that currently need to enter the front-end track area of the analysis device to wait in the buffer area.
  • the buffer area is provided in the input component; the processor obtains item information of the sample to be tested, and controls the input component to schedule the sample to be tested to the buffer area for temporary storage; the processor According to the item information of the sample to be tested, a scheduling plan for each sample to be tested in the buffer area is determined, where the scheduling plan includes at least the target analysis equipment that needs to be tested for the test sample and the path of the sample to be tested to the target analysis equipment.
  • the processor controls the sample that currently needs to enter the front-end track area of the analysis device to wait in the buffer area, and then determines whether the load of the front-end track area of other target analysis devices of the sample is less than or equal to The scheduling threshold, if yes, the processor controls to schedule the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • the processor also judges whether the front-end track area of the analysis device is full, and when it is judged to be full, it directly controls the sample that needs to enter the front-end track area of the analysis device to be aspirated in the buffer area. wait.
  • the processor directly controls the sample that currently needs to enter the front-end track area of the analysis device to be aspirated in the buffer area, and then determines whether the front-end track area of other target analysis devices of the sample is The load is not full and the load is less than or equal to the scheduling threshold. If so, the processor controls to schedule the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • the scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured by the analysis device; the analysis speed of the analysis device for each item configured by the analysis device is multiplied by the corresponding weight and then summed, The obtained sum determines the scheduling threshold of the analysis equipment; the weight of the analysis equipment item is negatively related to the analysis speed of the analysis equipment for the item.
  • an embodiment provides a computer-readable storage medium including a program that can be executed by a processor to implement the method described in any of the embodiments herein.
  • Fig. 1 is a schematic structural diagram of a sample analysis system according to an embodiment
  • Figure 2(a) is a schematic diagram of the structure of an input component and a schematic diagram of its sample scheduling path in an embodiment
  • Figure 2(b) is a schematic diagram of the structure of an input component and a schematic diagram of its sample scheduling path in an embodiment
  • Figure 3 is a schematic structural diagram of an input component of another embodiment
  • FIG. 4 is a schematic diagram of the structure of an input component of another embodiment
  • FIG. 5 is a schematic structural diagram of a sample analysis system of another embodiment, which includes analysis equipment M1, M2, ..., Mn;
  • FIG. 6 is a schematic structural diagram of a sample analysis system according to another embodiment
  • FIG. 7 is a flowchart of a sample scheduling method according to an embodiment
  • FIG. 8 is a flowchart of a sample scheduling method according to another embodiment
  • FIG. 9 is a flowchart of a sample scheduling method according to another embodiment.
  • FIG. 10 is a flowchart of a sample scheduling method according to another embodiment
  • FIG. 11 is a flowchart of a sample scheduling method according to still another embodiment.
  • FIG. 12 is a flowchart of a sample scheduling method according to still another embodiment
  • FIG. 13 is a flowchart of a sample scheduling method according to still another embodiment.
  • connection and “connection” mentioned in this application include direct and indirect connection (connection) unless otherwise specified.
  • the sample analysis system has a variety of structures. 1, the sample analysis system of an embodiment may include an input component 10, multiple analysis devices 30, a track 50, a scheduling device 70, and a processor 90, which will be described in detail below.
  • the input part 10 is used to receive a sample to be tested.
  • the input component 10 is generally the area where the user puts the sample. When the sample analysis system is working, the input component 10 can automatically scan the sample put into it to obtain the identification information of the sample. The sample identification information can be used to obtain the sample number and Information about items to be tested.
  • the input component 10 may have a putting area and a recovery area. The putting area is used to carry the sample rack to be injected, and the recovery area is used to receive the sample rack to be recovered. The operator can retrieve the sample rack from the recovery area.
  • the input component 10 may be provided with multiple input areas and multiple recovery areas.
  • these put-in areas can share a transport channel, and these recycling areas can also share a transport channel, and even these put-in areas and recovery areas share the same transport channel.
  • an explanation may be given by taking the input components 10 of two input areas and two recovery areas as an example.
  • the input component 10 includes a number of put-in areas and a number of recycle areas, as well as a dispatching mechanism (not shown in the figure).
  • Figure 2 shows an example of two put-in areas and two recovery areas.
  • the two put-in areas P1 and P2 share a transport channel, which may be named the first channel; the two recovery areas R1 and R2 also share a transport channel, may be named the second channel.
  • Figure 2(a) it is a schematic diagram of the sample injection scheduling transmission route of the sample rack in the input unit 10.
  • the sample rack in the loading area is pushed up to the first channel by the scheduling mechanism, and the loading area Whether the sample rack in P1 or P2 is being scheduled depends on the current process.
  • the input component 10 schedules and transmits all the sample racks in a storage area before scheduling and transmitting the next storage area.
  • Sample rack-the picture shows that the sample rack placed in area P2 is injecting samples; then the sample rack is pushed by the scheduling mechanism to pass left in the first channel.
  • the sample rack is scheduled to be transported to position 1, It continues to be dispatched and transported to position 2 by the dispatching agency, and then to the left to be dispatched to the sample suction position corresponding to each analysis device 10.
  • the sample tube on the sample rack is sucked into the sample at the sample rack, and the sample on the sample rack After the tubes are all aspirated, the sample rack needs to be dispatched to the recovery area.
  • FIG. 2(b) it is a schematic diagram of the recycling and dispatching transmission route of the sample rack in the input component 10.
  • the sample rack after the sample suction is completed is dispatched by the dispatching mechanism from the sample suction position to the right to return to position 2, and then Upward dispatch from position 2 to position 3, and then to the right to be dispatched to the second channel to subsequently enter the recovery area.
  • the recovery area R1 or the recovery area R2 it depends on the current process.
  • the input component 10 All the sample racks that have been aspirated are first dispatched and sent back to a recovery area. When the recovery area is full of sample racks, the dispatching agency will dispatch the sample racks that have completed sample absorption to the next recovery area.
  • the recovery area R2 is the recovery area that currently receives the sample racks to be recovered. Therefore, the dispatching agency will dispatch the sample racks from position 3 to the right to position 4, and then push the sample racks down to the recovery area R2. , Complete the recovery of the sample rack.
  • a scanner (not shown in the figure) can be set on the first channel to scan the passing sample rack and/or each sample on the sample rack to obtain corresponding information, such as sample rack information, sample information Identification information, etc.
  • the up, down, left, and right directions involved in the scheduling and transmission of the sample rack are the directions described with reference to the drawings, and do not necessarily mean the real up, down, left, and right.
  • FIG. 3 is a schematic diagram of the structure of the input component 10 according to another embodiment.
  • the input component 10 of FIG. 3 adds a buffer area.
  • the buffer area can be set on the same layer as the put-in area and the recycle area, or it can be a different layer, for example, to make the structure of the input component 10 more compact. , The floor area is smaller. If the layer where the put-in area and the recovery area are named as the first layer, the cache area can be set on the negative layer, that is, the layer below the first layer.
  • the buffer area can have one or more of the following functions. Function one, the buffer area can buffer samples before the sample test; specifically, the scheduling organization first dispatches the sample racks placed in the area to the buffer area in turn.
  • the input component 10 can scan and obtain each scheduled
  • the label information of the samples temporarily stored in the buffer area, etc. can then be uniformly scheduled for each sample to be tested, and the scheduling plan includes at least the target analysis equipment that the sample to be tested needs to go to.
  • Function 2 The buffer area can buffer the sample after the sample is sucked by the analysis device. The sample waits for the test result in the buffer area to determine whether it needs to be re-tested. If it needs to be re-tested, the sample will be dispatched to the corresponding analysis device for re-testing. Otherwise, the samples will be dispatched to the recovery area for users to recover.
  • the input component 10 of some embodiments may also be provided with an emergency channel, and the user can directly place samples that need to be urgently placed in the emergency channel for priority testing .
  • the normal sample rack (or non-emergency sample rack) and the emergency sample rack can also be identified by scanning the input component 10, so as to determine the priority of scheduling and testing.
  • the analysis device 30 is used to test the sample.
  • a sample analysis system has multiple analysis equipment 30, such as biochemical analysis equipment, immunoassay equipment, coagulation analysis equipment, and the like.
  • analysis devices 30 can be analysis devices of the same type or different models, which can be configured according to the needs of users and departments.
  • the rail 50 is used to connect the input component 10 and each analysis device 30.
  • FIG. 5 is an example in which the rail 50 connects the input part 10 and each analysis device 30.
  • each analysis device 30 has a front end track area, and the front end track area is provided with a sample suction position.
  • the above-mentioned rail 50 is set in the front-end rail area of each analysis device 30.
  • the front-end track area of each analysis device 30 is provided with a plurality of parallel sub-tracks, and the track 50 is mainly composed of these sub-tracks.
  • the front-end rail area may be provided with two parallel sub-tracks, namely, the sampling rail 31 and the return rail 33.
  • the analysis device 30 adjacent to the input component 10 for example, the analysis device M1 in FIG. 5, whose front-end track area is used to receive samples dispatched by the input component 10; the front-end track area of the adjacent analysis device 30 corresponds to
  • the sampling track 31 of the analysis device M1 and the analysis device M2 in FIG. 5 are connected with each other, and the return track 33 of the analysis device M1 and the analysis device M2 are connected with each other.
  • the sample passes through the sample introduction track 31 to reach the sample suction position of the corresponding analysis device 30 to be aspirated; and then returns through the return track 33, for example, finally returns to the recovery area of the input component 10.
  • each front-end rail area is provided with at least two sample aspiration positions, one for aspirating emergency samples on the emergency rail 32 and one for aspirating conventional samples on the sampling rail 31.
  • the emergency tracks 32 in the front-end track area of the adjacent analysis devices 30 are connected to each other.
  • the emergency tracks 32 of the analysis device M1 and the analysis device M2 in FIG. 5 are connected to each other.
  • the emergency sample passes through the emergency track 32 to the suction position of the corresponding analysis device 30 to be aspirated; and then returns through the return track 33, for example, finally returns to the recovery area of the input component 10.
  • the dispatching device 70 is used to dispatch the sample from the input unit 10 to the front-end track area of the corresponding analysis equipment through the track 50.
  • the scheduling device 70 further includes a rail changing mechanism 71, which can change the rails of the sample racks of the sampling rail 31 and/or the emergency rail 32 in the front-end rail area of the analysis device 30 to the return rail 33.
  • the orbit changing mechanism 71 can also change the orbit of the sample rack of the sampling track 31 of the analysis device 30 to enter the emergency track 32 of the adjacent analysis device 30, for example, the sample rack on the sampling track 31 of the analysis device M1 The sample rack changes track to enter the emergency track 32 of the analysis device M2.
  • the orbit changing mechanism 34 may also orbit the sample rack of the emergency track 32 of the analysis device 30 to enter the sample injection track 31 of the adjacent analysis device 30.
  • the load balancing principle is used to allocate samples to each analysis device 30, so as to avoid the occurrence of some analysis devices 30 being too idle and some analysis devices 30 being too busy.
  • the scheduling of sample racks based on the principle of load balancing has played a certain role in improving test efficiency.
  • the analysis speed or digestion speed of different analysis equipment is different.
  • the analysis speed of general immunoassay equipment is relatively slow, and the analysis speed of biochemical analysis equipment is relatively fast. It is very likely that immunoassay equipment After completing a project analysis (that is, from sampling the project to getting the test results), the biochemical analysis equipment has completed multiple project analysis, so it is necessary to take this factor into consideration when formulating the scheduling strategy of the sample rack.
  • the scheduling threshold of the analysis equipment is used to characterize the speed of the analysis, testing, or digestion of the project. The larger the scheduling threshold of the analysis equipment, the faster the analysis and testing can be completed. In other words, it has digested the test items assigned to it.
  • the scheduling threshold of the analysis device is determined by the analysis speed of the analysis device for each item configured. In some specific embodiments, the analysis speed of each item configured by the analysis device is multiplied by the corresponding weight and then the sum is summed, and then the scheduling threshold of the analysis device is determined by the obtained sum. In some embodiments, the weight of the item of the analysis device is negatively correlated with the analysis speed of the item by the analysis device.
  • the sum of the weights of the items configured by the analysis equipment is 1, that is, the weights of the items of the analysis equipment are normalized weights.
  • the analysis equipment has the largest item type that it can support, but the actual process In, it is possible that the department only uses some of these items, so the analysis equipment will be configured to test which items, this is the meaning of the items configured by the analysis equipment above.
  • the analysis speed of the project by the analysis equipment can be obtained through the statistics of its calendar data, and can be updated regularly, such as once a week, a month, or two months.
  • the weight corresponding to the item of the analysis device may be preset. The following uses an example to illustrate how to determine the scheduling threshold of the analysis device.
  • an analysis device M1 capable of supporting up to 25 items of testing A1 to A10, B1 to B5, and C1 to C10, but only A1 to A3 are used in the department, so the analysis device M1 can be configured to test A1 to A1.
  • the three items of A3; might as well let the analysis equipment M1 analyze the items A1, A2, and A3 at V1, V2, and V3, respectively, and V1 is greater than V2, V2 is greater than V3, then set the weights of items A1, A2, and A3 as a1, a2, and a3, and satisfy that a1 is less than a2, and a2 is less than a3—for example, a1, a2, and a3 are 20%, 30%, and 50%, respectively; the scheduling threshold of the analysis device M1 can be calculated by the following formula and V To decide: V V1*a1+V2*a2+V3*a3.
  • the scheduling threshold device of the analysis device M1 can be set to 3, that is, a maximum of 3 sample racks are allowed in the front track area of the analysis device M1; when the value of V is 20 ⁇ 25 items per hour, you can set the scheduling threshold device of the analysis equipment M1 to 2, that is, allow up to 2 sample racks in the front track area of the analysis equipment M1; when the value of V is 5-15 items per hour, Then, the scheduling threshold device of the analysis device M1 can be set to 1, that is, a maximum of 1 sample is allowed to be racked in the front track area of the analysis device M1.
  • the scheduling threshold is introduced to characterize the speed of analysis, testing, or digestion of the project by the analysis equipment. The faster the overall analysis equipment analyzes, tests, or digests the project, the more samples are allowed to exist in its front-end
  • the processor 90 will obtain and determine the scheduling plan of the sample to be tested according to the item information of the sample to be tested, where the scheduling plan includes at least The target analysis equipment for the item to be tested on the sample to be tested and the path for the sample to be tested to reach the target analysis device are required.
  • the processor 90 needs to perform which items according to the samples on the sample rack, and then see which analytical equipment these items can be tested on.
  • the processor 90 may determine the scheduling plan of each sample to be tested in the buffer area based on the principle of load balancing of the analysis device.
  • a specific process can be as follows: the user puts the sample into the input unit 10, the input unit 10 schedules each sample to be tested to the buffer area for temporary storage, the processor 90 receives and obtains the project information of the sample to be tested, and then according to the sample to be tested
  • the project information of the test sample determines the scheduling plan of each sample to be tested in the buffer area—for example, after the project information of the sample to be tested is obtained, the scheduling plan of each sample to be tested is determined based on the principle of analyzing equipment load balance.
  • the processor 90 schedules each sample according to the scheduling plan.
  • the processor 90 obtains the scheduling threshold of the analysis device 30 and the load condition of the front-end track area of the analysis device; the processor 90 controls the relationship between the scheduling threshold of the analysis device 30 and the load of the front-end track area of the analysis device 30 Currently, it is necessary to schedule the samples that enter the front track area of the analysis equipment to be aspirated. In some specific embodiments, if the load of the front-end track area of the analysis device 30 is less than or equal to the scheduling threshold of the analysis device 30, the processor 90 controls the current need to enter the front-end track area of the analysis device 30 to be aspirated.
  • the sample is dispatched to the front-end track area of the analysis device 30; conversely, if the load of the front-end track area of the analysis device 30 is greater than the dispatch threshold of the analysis device 30, the processor 90 controls the front end of the analysis device 30 that needs to be entered.
  • the samples in the track area are waiting in the buffer area.
  • the processor 90 controls the samples that currently need to enter the front-end track area of the analysis device 30 to wait in the buffer area.
  • the processor 90 also determines whether the load of the front-end track area of the other target analysis equipment of the sample is less than or equal to the scheduling threshold. If so, the processor 90 controls the sample to be dispatched to the front-end track area of the corresponding other target analysis equipment to be Suck the sample.
  • the front-end track area of the analysis device 30 is less than or equal to the scheduling threshold of the analysis device 30, then the front-end track area is not fully loaded. It is understandable that the front-end rail area of the analysis device 30 has a certain range and can carry one or more sample racks, for example, three sample racks, then if the front-end rail area of the current analysis device 30 has already carried three sample racks and is moving If the sample is to be sampled or to be injected, the front track area of the analysis device 30 is fully loaded, otherwise, it is not fully loaded. Take the sample analysis system of Fig. 5 or Fig. 6 as an example.
  • the sampling rail 31 and emergency rail 32 of the front-end rail area of each analysis device can carry three sample racks.
  • the analysis device For the sample S1 injected on the track 31, when the sample injection track 31 of the analysis device carries three sample racks that are or waiting for the analysis device to suck samples, then for the sample S1, the analysis device’s The front track area is fully loaded, otherwise, it is not fully loaded; similarly, for the sample S2 that needs to be injected on the emergency track 32 of an analysis device, when the emergency track 32 of the analysis device carries three current or When waiting for the sample rack of the analysis device to absorb the sample, then for the sample S2, the front track area of the analysis device is fully loaded, otherwise, it is not fully loaded.
  • the processor 90 also judges whether the front-end track area of the analysis device is fully loaded, and when it is judged to be full, it directly controls the sample that needs to enter the front-end track area of the analysis device to be aspirated in the buffer area.
  • the processor 90 calculates according to the analysis device 30
  • the relationship between the scheduling threshold and the load of the front-end track area of the analysis device 30 controls the scheduling of samples that currently need to enter the front-end track area of the analysis device to be aspirated.
  • the processor 90 controls the sample that currently needs to enter the front-end track area of the analysis device 30 to wait in the buffer area. After this, the processor 90 can also determine whether the front-end track area of other target analysis devices of the sample is not full and The load is less than or equal to the scheduling threshold. If it is, the processor 90 controls to schedule the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • sample analysis system Some embodiments of the present invention also disclose a sample scheduling method of the sample analysis system.
  • the structure of the sample analysis system involved here can be the sample analysis system disclosed in any of the embodiments herein.
  • the sample analysis system has a buffer area and Including multiple analysis equipment.
  • the sample scheduling method of some embodiments includes the following steps:
  • Step 100 Obtain project information of the sample to be tested.
  • Step 110 Determine a scheduling plan for the sample to be tested according to the item information of the sample to be tested, where the scheduling plan includes at least the target analysis equipment that needs to be tested for the test sample and the path for the sample to be tested to reach the target analysis equipment.
  • step 110 which items need to be performed according to the samples on the sample rack, and then see which analytical equipment these items can be tested on. If some items in sample S can only be tested on a specific analytical device, other analysis If the equipment does not support the testing of these items, then this analysis device must be the target analysis device of the sample S; if some items of the sample S can be tested on multiple analysis devices, for example, both the analysis devices M1 and M2 can be tested. To support the testing of these items, one or both of the analysis equipment M1 and M2 can be selected as the target analysis equipment for the sample S.
  • step 110 may determine the scheduling plan of each sample to be tested in the buffer area based on the principle of analyzing device load balancing.
  • a specific process can be as follows: the user puts the sample into the input component, the input component dispatches each sample to be tested to the buffer area for temporary storage, step 100 receives and obtains the project letter of the sample to be tested, and then step 110 according to the sample to be tested.
  • the project information of the sample determines the scheduling plan of each sample to be tested in the buffer area-for example, after obtaining the project information of the sample to be tested, based on the principle of analyzing equipment load balance, the scheduling plan of each sample to be tested is determined.
  • the sample scheduling method in some embodiments includes the following steps:
  • Step 200 Obtain the scheduling threshold of the analysis device.
  • the scheduling threshold of the analysis device is used to characterize the speed of the analysis, testing, or digestion of the project by the analysis device.
  • Step 210 Obtain the load condition of the front-end track area of the analysis device.
  • Step 220 According to the relationship between the scheduling threshold of the analysis device and the load of the front-end track area of the analysis device, control the scheduling of samples that currently need to enter the front-end track area of the analysis device to be aspirated.
  • step 220 in some embodiments may specifically include the following steps:
  • Step 222 If the load of the front-end track area of the analysis device is less than or equal to the scheduling threshold of the analysis device, control to dispatch the samples that currently need to enter the front-end track area of the analysis device to be aspirated to the front-end track of the analysis device area.
  • Step 224 If the load of the front-end track area of the analysis device is greater than the scheduling threshold of the analysis device, control the samples that currently need to enter the front-end track area of the analysis device to wait in the buffer area.
  • sample scheduling method in some embodiments may further include the following steps:
  • step 224 controls to wait in the buffer area for samples that currently need to enter the front-end track area of the analysis device.
  • step 226 also determines whether the load of the front-end track area of other target analysis devices of the sample is less than or equal to the scheduling threshold. If the load of the front-end track area of the other target analysis device of the sample is less than or equal to the dispatch threshold (referring to the dispatch threshold of the other target analysis device), step 228 controls to dispatch the sample to the front-end track area of the corresponding other target analysis device To be sucked sample.
  • step 225 also determines whether the front-end track area of other target analysis equipment of the sample is not fully loaded and the load is less than or equal to the dispatch threshold (referring to the other target analysis equipment If it is, step 227 controls to schedule the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • sample scheduling method in some embodiments may further include the following steps:
  • Step 230 Determine whether the front-end track area of the analysis device is fully loaded. It is understandable that step 230 may be before step 220, or in step 222, the sample that currently needs to enter the front-end track area of the analysis device to be aspirated is scheduled to be before the front-end track area of the analysis device.
  • Step 231 When it is judged that it is full, directly control the samples that currently need to enter the front-end track area of the analysis device to be aspirated to wait in the buffer area.
  • sample scheduling method in some embodiments may further include the following steps:
  • step 231 directly controls the samples that currently need to enter the front-end track area of the analysis device to be aspirated in the buffer area.
  • step 233 also determines whether the front-end track area of the other target analysis equipment of the sample is not fully loaded and the load is less than or equal to the scheduling threshold. If yes, step 235 controls to dispatch the sample to the front track area of the corresponding other target analysis device to be aspirated.
  • any tangible, non-transitory computer-readable storage medium can be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD to ROM, DVD, Blu Ray disks, etc.), flash memory and/or the like .
  • These computer program instructions can be loaded on a general-purpose computer, a special-purpose computer, or other programmable data processing equipment to form a machine, so that these instructions executed on the computer or other programmable data processing device can generate a device that realizes the specified function.
  • These computer program instructions can also be stored in a computer-readable memory, which can instruct a computer or other programmable data processing equipment to operate in a specific manner, so that the instructions stored in the computer-readable memory can form a piece of Manufactured products, including realizing devices that realize designated functions.
  • Computer program instructions can also be loaded on a computer or other programmable data processing equipment, thereby executing a series of operation steps on the computer or other programmable equipment to produce a computer-implemented process, so that the execution of the computer or other programmable equipment Instructions can provide steps for implementing specified functions.
  • Coupled refers to physical connection, electrical connection, magnetic connection, optical connection, communication connection, functional connection and/or any other connection.

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Abstract

一种样本分析系统及其样本调度方法，该样本调度方法包括获取分析设备（30）的调度阈值；获取分析设备（30）的前端轨道区域的负载情况；如果分析设备（30）的前端轨道区域的负载小于或等于该分析设备（30）的调度阈值，则控制将当前需要进入该分析设备（30）的前端轨道区域以被吸样的样本，调度到该分析设备（30）的前端轨道区域；如果该分析设备（30）的前端轨道区域的负载大于该分析设备（30）的调度阈值，则控制将当前需要进入该分析设备（30）的前端轨道区域的样本在缓存区等待。

Description

一种样本分析系统及其样本调度方法 技术领域
本发明涉及一种样本分析系统及其样本调度方法。
背景技术
随着大量测定样本的需求，为了满足高通量和减少时间，出现了由多个样分析设备组成的样本分析系统。对于这种包括多个分析设备的系统，一般地，待测样本统一在系统前端(例如系统前端的输入模块)进行输入，然后系统将待测样本依次分配到相应的一个或多个分析设备中去测试。具体地，系统一般会引入轨道，通过轨道将输入模块和各分析设备连接起来，从而使得样本可以通过轨道从输入模块到达任意一分析设备以进行测试。
为了不使得一些分析设备太忙碌，另一些分析设备太空闲，通常系统会根据负载均衡的原则来将待测试的样本规划并调度到相应的分析设备去测试。举个简单的例子，在当前待测试的一批样本中，都需要去分析设备1和分析设备2测试，因此可以将这批样本中的一部分规划为先去分析设备1测试，再去分析设备2测试，将剩下的一部分样本规划为先去分析设备2测试，再去分析设备1测试，因此分析设备1和分析设备2都没有被空闲下来，从这个角度来看，测试效率相对提高了。
系统根据负载均衡的原则来将待测试样本进行规划和调度到各相应分析设备，有时候会显得不够灵活，一些新的规划和调度的原则需要被发明和提出。
发明概述
技术问题
本发明主要提供一种样本分析系统及其样本调度方法。
问题的解决方案
技术解决方案
根据第一方面，一种实施例中提供一种样本分析系统的样本调度方法，所述样本分析系统具有缓存区并包括多个分析设备，所述样本调度方法包括：
获取分析设备的调度阈值；
获取分析设备的前端轨道区域的负载情况；
如果分析设备的前端轨道区域的负载小于或等于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本，调度到该分析设备的前端轨道区域；
如果该分析设备的前端轨道区域的负载大于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待。
一实施例中，所述的样本调度方法还包括：获取并根据待测试样本的项目信息，确定待测试样本的调度规划；其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样本到达其目标分析设备的路径。
一实施例中，所述获取并根据待测试样本的项目信息，确定待测试样本的调度规划，包括：
接收并获取待测试样本的项目信息；
控制将待测试样本调度到所述缓存区暂存；
根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划。
一实施例中，所述根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划，包括：在获取待测试样本的项目信息后，基于分析设备负载均衡的原则，确定各待测试样本的调度规划。
一实施例中，在控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域的负载是否小于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一实施例中，在控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一实施例中，所述的样本调度方法还包括：还判断分析设备的前端轨道区域是否满载，当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区 域以被吸样的样本在所述缓存区等待。
一实施例中，在直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一实施例中，分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定。
一实施例中，所述分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定，包括：将该分析设备对其所配置的各项目的分析速度与相应权重相乘后求和，再由所求得的和来决定该分析设备的调度阈值。
一实施例中，分析设备的项目的权重与分析设备对该项目的分析速度呈负相关。
根据第二方面，一种实施例中提供一种样本分析系统，包括：
输入部件，用于接收待测试的样本；
多个分析设备，所述分析设备用于对样本进行测试；各分析设备都具有前端轨道区域，所述前端轨道区域设置有吸样位；
轨道，用于连接输入部件和各分析设备；
调度装置，用于通过所述轨道将样本从输入部件调度到相应分析设备的前端轨道区域；
缓存区，用于缓存样本；以及
处理器，用于获取分析设备的调度阈值及分析设备的前端轨道区域的负载情况；所述处理器根据分析设备的调度阈值及分析设备的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度。
一实施例中，所述处理器根据分析设备的调度阈值及分析设备的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度，包括：
当该分析设备的前端轨道区域的负载小于或等于该分析设备的调度阈值时，所述处理器控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本，调 度到该分析设备的前端轨道区域；
当该分析设备的前端轨道区域的负载大于该分析设备的调度阈值时，则所述处理器控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待。
一实施例中，所述缓存区设置于所述输入部件内；所述处理器获取待测试样本的项目信息，并控制输入部件将待测试样本调度到所述缓存区暂存；所述处理器根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划，其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样本到达其目标分析设备的路径。
一实施例中，所述处理器控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域的负载是否小于或等于调度阈值，若是，则所述处理器控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一实施例中，所述处理器还判断分析设备的前端轨道区域是否满载，当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待。
一实施例中，所述处理器直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则所述处理器控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一实施例中，分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定；将该分析设备对其所配置的各项目的分析速度与相应权重相乘后求和，再由所求得的和来决定该分析设备的调度阈值；分析设备的项目的权重与分析设备对该项目的分析速度呈负相关。
根据第三方面，一种实施例提供一种计算机可读存储介质，包括程序，所述程序能够被处理器执行以实现本文任一实施例所述的的方法。
发明的有益效果
对附图的简要说明
附图说明
图1为一种实施例的样本分析系统的结构示意图；
图2(a)为一种实施例的输入部件的结构示意图及其样本调度路径的一种示意图；图2(b)为一种实施例的输入部件的结构示意图及其样本调度路径的一种示意图；
图3为另一种实施例的输入部件的结构示意图；
图4为又一种实施例的输入部件的结构示意图；
图5为另一种实施例的样本分析系统的结构示意图，其包括分析设备M1、M2、…、Mn；
图6为又一种实施例的样本分析系统的结构示意图；
图7为一种实施例的样本调度方法的流程图；
图8为另一种实施例的样本调度方法的流程图；
图9为又一种实施例的样本调度方法的流程图；
图10为还一种实施例的样本调度方法的流程图；
图11为再一种实施例的样本调度方法的流程图；
图12为又另一种实施例的样本调度方法的流程图；
图13为又再一种实施例的样本调度方法的流程图。
发明实施例
本发明的实施方式
下面通过具体实施方式结合附图对本发明作进一步详细说明。其中不同实施方式中类似元件采用了相关联的类似的元件标号。在以下的实施方式中，很多细节描述是为了使得本申请能被更好的理解。然而，本领域技术人员可以毫不费力的认识到，其中部分特征在不同情况下是可以省略的，或者可以由其他元件、材料、方法所替代。在某些情况下，本申请相关的一些操作并没有在说明书中显示或者描述，这是为了避免本申请的核心部分被过多的描述所淹没，而对于本领域技术人员而言，详细描述这些相关操作并不是必要的，他们根据说明书中的描述以及本领域的一般技术知识即可完整了解相关操作。
另外，说明书中所描述的特点、操作或者特征可以以任意适当的方式结合形成 各种实施方式。同时，方法描述中的各步骤或者动作也可以按照本领域技术人员所能显而易见的方式进行顺序调换或调整。因此，说明书和附图中的各种顺序只是为了清楚描述某一个实施例，并不意味着是必须的顺序，除非另有说明其中某个顺序是必须遵循的。
本文中为部件所编序号本身，例如“第一”、“第二”等，仅用于区分所描述的对象，不具有任何顺序或技术含义。而本申请所说“连接”、“联接”，如无特别说明，均包括直接和间接连接(联接)。
样本分析系统有多种结构。请参照图1，一种实施例的样本分析系统可以包括输入部件10、多台分析设备30、轨道50、调度装置70和处理器90，下面具体说明。
输入部件10用于接收待测试的样本。输入部件10一般是用户放入样本的区域，在样本分析系统工作时，输入部件10可以对放入其中的样本进行自动扫描来获取样本的标识信息，通过样本的标识信息可以得到样本的编号和待测试项目等信息。输入部件10有多种实现方案，例如输入部件10可以具有放入区和回收区，放入区用于用于承载待进样的样本架，而回收区则用于接收待回收的样本架，操作员可以从回收区中回收样本架。为了实现样本架的批量放入、转运、回收与取出，输入部件10可以设置多个放入区和多个回收区。为了节省空间和简化设计等，这些放入区可以共用一段运输通道，这些回收区也可以共用一段运输通道，甚至这些放入区和回收区都共用同一段运输通道。下面不妨以两个放入区和两个回收区的输入部件10为例进行一个说明。
请参照图2，输入部件10包括若干个放入区和若干个回收区，以及包括调度机构(图中未画出)。图2中显示的是两个放入区和两个回收区的例子。两个放入区P1和P2共用一段运输通道，不妨命名为第一通道；两个回收区R1和R2也共用一段运输通道，不妨命名为第二通道。如图2(a)所示，为输入部件10中样本架的进样调度传送路线的一种示意图，放入区中的样本架被调度机构向上推入到第一通道，至于是放入区P1还是P2中的样本架在被调度，这取决于当前的进程，一般地，输入部件10都是先调度传送完一个放入区的所有样本架后，才开始调度传送下一个放入区的样本架——图中显示的是放入区P2中的样本架正在 进样；接着该样本架被调度机构推送以在第一通道中向左通行，当样本架被调度运输到位置1时，又继续被调度机构向下调度运输到位置2，然后向左被调度运输到各分析设备10所对应的吸样位，样本架上的样本管在吸样位被吸取样本，样本架上的样本管都完成吸样后，样本架需要被调度传送到回收区。如图2(b)所示，为输入部件10中样本架的回收调度传送路线的一种示意图，吸样完成后的样本架被调度机构从吸样位向右调度传送回位置2，并接着向上从位置2调度传送到位置3，接着向右被调度传送到第二通道，以后续进入回收区，至于是回收区R1还是回收区R2，这取决于当前的进程，一般地，输入部件10都是将吸样完成的样本架先调度先传送回一个回收区，当该回收区承载满了样本架后，调度机构才将吸样完成的样本架再调度传送到下一个回收区——图中显示的是回收区R2为当前接收待回收的样本架的回收区，因此调度机构将样本架再从位置3向右调度传送到位置4，然后再将样本架向下推入到回收区R2，完成该样本架的回收。一般地，可以在第一通道上设置扫描器(图中未画出)，用来扫描经过的样本架和/或样本架上各样本，以获取相应的信息，例如样本架的信息，样本的标识信息等。需要说明的是，在涉及样本架调度传送中的上、下、左、右这些方向，是针对附图来说明的方向，并不一定意味着真实的上、下、左、右。
图3为另一种实施例的输入部件10的结构示意图。相比于图2，图3的输入部件10增加了缓存区，该缓存区可以是设置在与放入区、回收区同一层，也可以是不同层，例如为了使得输入部件10的结构更加紧凑、占地面积更小，若将放入区和回收区所在层命名为第一层，则可以将缓存区设置在负一层，即第一层的下面一层。缓存区可以有下面的一种或多种功能。功能一，缓存区可以在样本测试前先缓存样本；具体地，调度机构先将放入区中的样本架调度依次调度到缓存区，在这个过程中，输入部件10可以扫描并获取各被调度到缓存区暂存的样本的标签信息等，然后可以统一对各待测试的样本进行调度规划，调度规划至少包括待测试的样本需要去的目标分析设备。功能二，缓存区可以缓存被分析设备吸样后的样本，样本在缓存区等待测试结果，以便确定是否需要进行重测，如果需要重测，则样本会被调度到相应分析设备进行重测，否则，样本会被 调度到回收区，以供用户回收。
请参照图4，在图2或图3的输入部件10的基础上，一些实施例的输入部件10还可以设置有急诊通道，用户可以直接将需要加急的样本通过放置在急诊通道优先进行测试。当然一些实施例中，也可以通过输入部件10扫描来识别普通样本架(或者说是非急诊样本架)和急诊样本架，从而来确定调度和测试的优先顺序。
分析设备30用于对样本进行测试。为了提高效率和测试通量，一般地，样本分析系统具有多个分析设备30，如生化分析设备、免疫分析设备、凝血分析设备等。这些分析设备30可以是同种型号的分析设备，也可以是不同型号的分析设备，这可以根据用户和科室的需求来配置。
轨道50用于连接输入部件10和各分析设备30。图5就是轨道50将输入部件10和各分析设备30连接起来的一个例子。具体地，一些实施例中，各分析设备30都具有前端轨道区域，前端轨道区域设置有吸样位。上述轨道50即设置在各分析设备30的前端轨道区域内。具体地，各分析设备30的前端轨道区域都设置有多条平行的子轨道，轨道50主要由这些子轨道构成。一些实施例中，前端轨道区域可以设置有两条平行的子轨道，即进样轨道31和返回轨道33。与输入部件10相邻的分析设备30——例如图5中即指分析设备M1，其前端轨道区域用于接收由输入部件10调度过来的样本；相邻的分析设备30的前端轨道区域中相应的轨道互相连通，例如图5中分析设备M1和分析设备M2的进样轨道31是互相连通的，分析设备M1和分析设备M2的返回轨道33是互相连通的。样本通过进样轨道31到达相应分析设备30的吸样位，以被吸样；然后再通过返回轨道33返回，例如最终回到输入部件10的回收区。一些实施例中，请参照图6，前端轨道区域可以设置有三条平行的子轨道，即除了进样轨道31和返回轨道33，还可以设置一个急诊轨道32，用于供急诊样本进样，而进样轨道31则可以用于供常规样本进样。在这种情况下，各前端轨道区域至少设置有两个吸样位，一个用于供急诊轨道32上的急诊样本吸样，一个用于供进样轨道31上的常规样本吸样。可以理解地，这时候相邻的分析设备30的前端轨道区域中的急诊轨道32是互相连通的，例如图5中分析设备M1和分析设备M2的急诊轨道32是互相连通的。急诊样本通过急诊 轨道32到达相应分析设备30的吸样位，以被吸样；然后再通过返回轨道33返回，例如最终回到输入部件10的回收区。
调度装置70则用于通过轨道50将样本从输入部件10调度到相应分析设备的前端轨道区域。一些实施例中，调度装置70还包括变轨机构71，变轨机构71可以将分析设备30前端轨道区域中进样轨道31和/或急诊轨道32的样本架变轨到返回轨道33。一些实施例中，变轨机构71还可以将分析设备30的进样轨道31的样本架变轨以进入相邻分析设备30的急诊轨道32，例如将在分析设备M1的进样轨道31上的样本架变轨以进入分析设备M2的急诊轨道32。一些实施例中，变轨机构34还可以将分析设备30的急诊轨道32的样本架变轨以进入相邻分析设备30的进样轨道31。
下面对样本架的调度策略进行说明。
一些方案中，通过负载均衡原则来为各分析设备30分配样本，从而尽量避免出现一些分析设备30太空闲，一些分析设备30又太忙碌。基于负载均衡原则来对样本架进行调度，对提高测试效率等，起到了一定作用。发明人在研究发现，通常情况下不同分析设备对项目的分析速度或者说消化速度是不同的，例如一般地免疫分析设备分析速度比较慢，生化分析设备分析速度比较快，很有可能免疫分析设备在完成一个项目分析(即从对项目开始进行吸样到得到测试结果)后，生化分析设备已经完成了多个项目分析，因此有必在制定样本架的调度策略时考虑到这个因素。本申请提出分析设备的调度阈值这一概念，分析设备的调度阈值用于表征分析设备分析、测试或者说消化项目的速度，分析设备的调度阈值越大，说明其能够越快地分析、测试完或者说消化完被分配给它的测试项目。一些实施例中，分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定。具体的一些实施例中，将分析设备对其所配置的各项目的分析速度与相应权重相乘后求和，再由所求得的和来决定该分析设备的调度阈值。一些实施例中，分析设备的项目的权重与分析设备对该项目的分析速度呈负相关。一些实施例中，分析设备所配置的项目的权重的和为1，即分析设备的项目的权重是经过归一化的权重一般地，分析设备都有其最大能够支持的项目种类，但是实际过程中，有可能科室只常用到其中的一些项目，因此分析设 备会被配置来测试哪些项目，这就是上文中分析设备所配置的项目的含义。分析设备对项目的分析速度，可以通过其历数数据统计得到，并可以定时进行更新，例如每一周、一个月或两个月等更新一次。分析设备的项目所对应的权重可以是预先设置好的。下面通过一个例子来说明如何确定分析设备的调度阈值。不妨令一分析设备M1最大能够支持测试A1到A10，B1到B5，和C1到C10这25个项目，但是科室中只用到了其中的A1到A3，因此可以将分析设备M1配置为测试A1到A3这3个项目；不妨令分析设备M1对项目A1、A2和A3的分析速度分别为V1、V2和V3，且V1大于V2，V2大于V3，那么设置项目A1、A2和A3的权重分别为a1、a2和a3，且满足a1小于a2，a2小于a3——例如a1、a2和a3分别为20％、30％和50％；分析设备M1的调度阈值可以由下列式子计算得到的和V来决定：V＝V1*a1+V2*a2+V3*a3。
V越大，则说明分析设备M1的整体对项目分析、测试或者说消化的速度越快，相应地，分析设备M1的调度阈值越大。例如一些例子中，当V为30个项目每小时，则可以将分析设备M1的调度阈值设备为3，即允许最多有3个样本架在分析设备M1的前端轨道区域；当V的值为20～25个项目每小时，则可以将分析设备M1的调度阈值设备为2，即允许最多有2个样本架在分析设备M1的前端轨道区域；当V的值为5～15个项目每小时，则可以将分析设备M1的调度阈值设备为1，即允许最多有1个样本架在分析设备M1的前端轨道区域。通过引入调度阈值来表征分析设备分析、测试或者说消化项目的速度，分析设备整体对项目分析、测试或者说消化的速度越快，则允许越多的样本同时存在其前端轨道区域。
而在具体调度过程中，当用户将样本放入到输入部件10中后，一般地，处理器90会获取并根据待测试样本的项目信息，确定待测试样本的调度规划，其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样本到达其目标分析设备的路径。例如处理器90根据样本架上的样本需要进行哪些项目，然后看看这些项目是在哪些分析设备上可以进行测试，如果样本S中的一些项目只能在特定一台分析设备上进行测试，其他分析设备都不支持进行这些项目的测试，那么这台分析设备就一定是该样本S的目标分析设备；如果样本S的一些项目既可以在多台分析设备上测试，例如分析设备M1和M2都可以支持这 些项目的测试，那么可以将分析设备M1和M2中的一台或两台都选为该样本S的目标分析设备。具体地，一些实施例中，处理器90在获取待测试样本的项目信息后，可以基于分析设备负载均衡的原则，确定缓存区中各待测试样本的调度规划。一个具体的过程可以是这样的：用户将样本放入到输入部件10，输入部件10将各待测试样本调度到缓存区暂存，处理器90接收并获取待测试样本的项目信，然后根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划——例如在获取待测试样本的项目信息后，基于分析设备负载均衡的原则，确定各待测试样本的调度规划。
接着处理器90就根据调度规划对各样本进行调度。一些实施例中，处理器90获取分析设备30的调度阈值以及分析设备的前端轨道区域的负载情况；处理器90根据分析设备30的调度阈值及分析设备30的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度。具体的一些实施例中，如果分析设备30的前端轨道区域的负载小于或等于该分析设备30的调度阈值，则处理器90控制将当前需要进入该分析设备30的前端轨道区域以被吸样的样本，调度到该分析设备30的前端轨道区域；反之，如果该分析设备30的前端轨道区域的负载大于该分析设备30的调度阈值，则处理器90控制将当前需要进入该分析设备30的前端轨道区域的样本在缓存区等待。
如上所述，如果分析设备30的前端轨道区域的负载大于该分析设备30的调度阈值，则处理器90控制将当前需要进入该分析设备30的前端轨道区域的样本在缓存区等待，在这之后，处理器90还判断该样本的其他目标分析设备的前端轨道区域的负载是否小于或等于调度阈值，若是，则处理器90控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
一般地，如果分析设备30的前端轨道区域的负载小于或等于该分析设备30的调度阈值，那么其前端轨道区域就没有满载。可以理解地，分析设备30的前端轨道区域有一定的范围，可以承载一个或多个样本架，例如3个样本架，那么如果当前分析设备30的前端轨道区域已经承载了三个样本架正在进样或待进样，那么该分析设备30的前端轨道区域就是满载的，反之，就没有满载。不妨以图5或图6的样本分析系统为例，不妨设各分析设备的前端轨道区域的进样轨道31和急 诊轨道32都可以承载三个样本架，那么对于需要在一分析设备的进样轨道31上进样的样本S1而言，当该分析设备的进样轨道31上承载了三个正在或等待该分析设备吸样的样本架时，那么对于该样本S1而言，该分析设备的前端轨道区域就是满载的，反之，则没有满载；类似地，对于需要在一分析设备的急诊轨道32上进样的样本S2而言，当该分析设备的急诊轨道32上承载了三个正在或等待该分析设备吸样的样本架时，那么对于该样本S2而言，该分析设备的前端轨道区域就是满载的，反之，则没有满载。
如上所述，如果分析设备30的前端轨道区域的负载小于或等于该分析设备30的调度阈值，那么一般而言，其前端轨道区域就没有满载。但是为了确保这点，也可以进行一个前端轨道区域负载情况的判断。例如一些实施例中，处理器90还判断分析设备的前端轨道区域是否满载，当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待，而不用再去比较该分析设备30的前端轨道区域的负载与该分析设备30的调度阈值的关系；当判断分析设备的前端轨道区域没有满载时，处理器90再根据该分析设备30的调度阈值及分析设备30的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度。
类似地，处理器90控制将当前需要进入分析设备30的前端轨道区域的样本在缓存区等待，在这之后，处理器90还可以判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则处理器90控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
以上就是样本分析系统的一些说明。本发明一些实施例中还公开了样本分析系统的样本调度方法，这里涉及到的样本分析系统的结构可以是本文中任一实施例中所公开的样本分析系统，例如样本分析系统具有缓存区并包括多个分析设备。
请参照图7，一些实施例的样本调度方法包括以下步骤：
步骤100：获取待测试样本的项目信息。
步骤110：根据待测试样本的项目信息，确定待测试样本的调度规划，其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样 本到达其目标分析设备的路径。
例如步骤110根据样本架上的样本需要进行哪些项目，然后看看这些项目是在哪些分析设备上可以进行测试，如果样本S中的一些项目只能在特定一台分析设备上进行测试，其他分析设备都不支持进行这些项目的测试，那么这台分析设备就一定是该样本S的目标分析设备；如果样本S的一些项目既可以在多台分析设备上测试，例如分析设备M1和M2都可以支持这些项目的测试，那么可以将分析设备M1和M2中的一台或两台都选为该样本S的目标分析设备。具体地，一些实施例中，步骤100在获取待测试样本的项目信息后，步骤110可以基于分析设备负载均衡的原则，确定缓存区中各待测试样本的调度规划。一个具体的过程可以是这样的：用户将样本放入到输入部件，输入部件将各待测试样本调度到缓存区暂存，步骤100接收并获取待测试样本的项目信，然后步骤110根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划——例如在获取待测试样本的项目信息后，基于分析设备负载均衡的原则，确定各待测试样本的调度规划。
下面对如何根据具体调度再进行说明。请参照图8，一些实施例中的样本调度方法包括以下步骤：
步骤200：获取分析设备的调度阈值。分析设备的调度阈值用于表征分析设备分析、测试或者说消化项目的速度，调度阈值的进一步解释和如何计算可以参考前文的记载，在此不再赘述。
步骤210：获取分析设备的前端轨道区域的负载情况。
步骤220：根据分析设备的调度阈值及分析设备的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度。
请参照图9，一些实施例中步骤220具体可以包括以下步骤：
步骤222：如果分析设备的前端轨道区域的负载小于或等于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本，调度到该分析设备的前端轨道区域。
步骤224：如果该分析设备的前端轨道区域的负载大于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待 。
请参照图10，一些实施例中样本调度方法还可以包括以下步骤：
如上所述，如果该分析设备的前端轨道区域的负载大于该分析设备的调度阈值，则步骤224控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待。
在步骤224之后，步骤226还判断该样本的其他目标分析设备的前端轨道区域的负载是否小于或等于调度阈值。如果该样本的其他目标分析设备的前端轨道区域的负载小于或等于调度阈值(指该其他目标分析设备的调度阈值)，则步骤228控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
或者，如图11所示，一些实施例中，在步骤224之后，步骤225还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值(指该其他目标分析设备的调度阈值)；若是，则步骤227控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
请参照图12，一些实施例中样本调度方法还可以包括以下步骤：
步骤230：判断分析设备的前端轨道区域是否满载。可以理解地，步骤230可以是在步骤220之前，也可以是在步骤222控制将当前需要进入分析设备的前端轨道区域以被吸样的样本，调度到该分析设备的前端轨道区域之前。
步骤231：当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待。
请参照图13，一些实施例中样本调度方法还可以包括以下步骤：
如上所述，判断满载时，则步骤231直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待。
在步骤231之后，步骤233还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值。若是，则步骤235控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
本文参照了各种示范实施例进行说明。然而，本领域的技术人员将认识到，在不脱离本文范围的情况下，可以对示范性实施例做出改变和修正。例如，各种操作步骤以及用于执行操作步骤的组件，可以根据特定的应用或考虑与系统的 操作相关联的任何数量的成本函数以不同的方式实现(例如一个或多个步骤可以被删除、修改或结合到其他步骤中)。
在上述实施例中，可以全部或部分地通过软件、硬件、固件或者其任意组合来实现。另外，如本领域技术人员所理解的，本文的原理可以反映在计算机可读存储介质上的计算机程序产品中，该可读存储介质预装有计算机可读程序代码。任何有形的、非暂时性的计算机可读存储介质皆可被使用，包括磁存储设备(硬盘、软盘等)、光学存储设备(CD至ROM、DVD、Blu Ray盘等)、闪存和/或诸如此类。这些计算机程序指令可被加载到通用计算机、专用计算机或其他可编程数据处理设备上以形成机器，使得这些在计算机上或其他可编程数据处理装置上执行的指令可以生成实现指定的功能的装置。这些计算机程序指令也可以存储在计算机可读存储器中，该计算机可读存储器可以指示计算机或其他可编程数据处理设备以特定的方式运行，这样存储在计算机可读存储器中的指令就可以形成一件制造品，包括实现指定功能的实现装置。计算机程序指令也可以加载到计算机或其他可编程数据处理设备上，从而在计算机或其他可编程设备上执行一系列操作步骤以产生一个计算机实现的进程，使得在计算机或其他可编程设备上执行的指令可以提供用于实现指定功能的步骤。
虽然在各种实施例中已经示出了本文的原理，但是许多特别适用于特定环境和操作要求的结构、布置、比例、元件、材料和部件的修改可以在不脱离本披露的原则和范围内使用。以上修改和其他改变或修正将被包含在本文的范围之内。
前述具体说明已参照各种实施例进行了描述。然而，本领域技术人员将认识到，可以在不脱离本披露的范围的情况下进行各种修正和改变。因此，对于本披露的考虑将是说明性的而非限制性的意义上的，并且所有这些修改都将被包含在其范围内。同样，有关于各种实施例的优点、其他优点和问题的解决方案已如上所述。然而，益处、优点、问题的解决方案以及任何能产生这些的要素，或使其变得更明确的解决方案都不应被解释为关键的、必需的或必要的。本文中所用的术语“包括”和其任何其他变体，皆属于非排他性包含，这样包括要素列表的过程、方法、文章或设备不仅包括这些要素，还包括未明确列出的或 不属于该过程、方法、系统、文章或设备的其他要素。此外，本文中所使用的术语“耦合”和其任何其他变体都是指物理连接、电连接、磁连接、光连接、通信连接、功能连接和/或任何其他连接。
具有本领域技术的人将认识到，在不脱离本发明的基本原理的情况下，可以对上述实施例的细节进行许多改变。因此，本发明的范围应仅由权利要求确定。

Claims (19)

  1. 一种样本分析系统的样本调度方法，所述样本分析系统具有缓存区并包括多个分析设备，其特征在于，所述样本调度方法包括：
    获取分析设备的调度阈值；
    获取分析设备的前端轨道区域的负载情况；
    如果分析设备的前端轨道区域的负载小于或等于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本，调度到该分析设备的前端轨道区域；
    如果该分析设备的前端轨道区域的负载大于该分析设备的调度阈值，则控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待。
  2. 如权利要求1所述的样本调度方法，其特征在于，还包括：获取并根据待测试样本的项目信息，确定待测试样本的调度规划；其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样本到达其目标分析设备的路径。
  3. 如权利要求2所述的样本调度方法，其特征在于，所述获取并根据待测试样本的项目信息，确定待测试样本的调度规划，包括：
    接收并获取待测试样本的项目信息；
    控制将待测试样本调度到所述缓存区暂存；
    根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划。
  4. 如权利要求2所述的样本调度方法，其特征在于，所述根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划，包括：在获取待测试样本的项目信息后，基于分析设备负载均衡的原则，确定各待测试样本的调度规划。
  5. 如权利要求2所述的样本调度方法，其特征在于，在控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域的负载是否小 于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
  6. 如权利要求2所述的样本调度方法，其特征在于，在控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
  7. 如权利要求2所述的样本调度方法，其特征在于，还包括：还判断分析设备的前端轨道区域是否满载，当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待。
  8. 如权利要求7所述的样本调度方法，其特征在于，在直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
  9. 如权利要求1所述的样本调度方法，其特征在于，分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定。
  10. 如权利要求9所述的样本调度方法，其特征在于，所述分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定，包括：将该分析设备对其所配置的各项目的分析速度与相应权重相乘后求和，再由所求得的和来决定该分析设备的调度阈值。
  11. 如权利要求10所述的样本调度方法，其特征在于，分析设备的项目的权重与分析设备对该项目的分析速度呈负相关。
  12. 一种样本分析系统，其特征在于，包括：
    输入部件，用于接收待测试的样本；
    多个分析设备，所述分析设备用于对样本进行测试；各分析设备都具有前端轨道区域，所述前端轨道区域设置有吸样位；
    轨道，用于连接输入部件和各分析设备；
    调度装置，用于通过所述轨道将样本从输入部件调度到相应分析设备的前端轨道区域；
    缓存区，用于缓存样本；以及
    处理器，用于获取分析设备的调度阈值及分析设备的前端轨道区域的负载情况；所述处理器根据分析设备的调度阈值及分析设备的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度。
  13. 如权利要求12所述的样本分析系统，其特征在于，所述处理器根据分析设备的调度阈值及分析设备的前端轨道区域的负载的关系，控制当前需要进入该分析设备的前端轨道区域以被吸样的样本的调度，包括：
    当该分析设备的前端轨道区域的负载小于或等于该分析设备的调度阈值时，所述处理器控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本，调度到该分析设备的前端轨道区域；
    当该分析设备的前端轨道区域的负载大于该分析设备的调度阈值时，则所述处理器控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待。
  14. 如权利要求12所述的样本分析系统，其特征在于，所述缓存区设置于所述输入部件内；所述处理器获取待测试样本的项目信息，并控制输入部件将待测试样本调度到所述缓存区暂存；所述处理器根据待测试样本的项目信息，确定缓存区中各待测试样本的调度规划，其中调度规划至少包括需要对待测试样本进行其项目检测的目标分析设备和待测试样本到达其目标分析设备的路径。
  15. 如权利要求14所述的样本分析系统，其特征在于，所述处理器控制将当前需要进入该分析设备的前端轨道区域的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域的负载是否小于或等于调度阈值，若是，则所述处理器控制将该样 本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
  16. 如权利要求14所述的样本分析系统，其特征在于，所述处理器还判断分析设备的前端轨道区域是否满载，当判断满载时，则直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待。
  17. 如权利要求16所述的样本分析系统，其特征在于，所述处理器直接控制将当前需要进入该分析设备的前端轨道区域以被吸样的样本在所述缓存区等待后，还判断该样本的其他目标分析设备的前端轨道区域是否未满载且负载小于或等于调度阈值，若是，则所述处理器控制将该样本调度到对应的其他目标分析设备的前端轨道区域以被吸样。
  18. 如权利要求12所述的样本分析系统，其特征在于，分析设备的调度阈值由该分析设备对其所配置的各项目的分析速度所确定；将该分析设备对其所配置的各项目的分析速度与相应权重相乘后求和，再由所求得的和来决定该分析设备的调度阈值；分析设备的项目的权重与分析设备对该项目的分析速度呈负相关。
  19. 一种计算机可读存储介质，其特征在于，包括程序，所述程序能够被处理器执行以实现如权利要求1至11中任一项所述的方法。
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848334A (zh) * 2021-09-26 2021-12-28 中元汇吉生物技术股份有限公司 样本架的调度方法、装置、终端设备及存储介质
CN114383916A (zh) * 2021-12-31 2022-04-22 迈克医疗电子有限公司 样本玻片的传送方法及传送系统
CN119683255A (zh) * 2025-01-07 2025-03-25 深圳市新产业生物医学工程股份有限公司 样本运输装置以及样本运输装置的控制方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024141783A (ja) * 2023-03-29 2024-10-10 シスメックス株式会社 検体測定装置および検体測定方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000088860A (ja) * 1998-09-11 2000-03-31 Aloka Co Ltd 検体搬送システムおよび検体搬送方法
JP2003057251A (ja) * 2001-08-21 2003-02-26 Hitachi Ltd 生体サンプルの自動分析システム
JP2006038881A (ja) * 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム
CN102725641A (zh) * 2010-01-28 2012-10-10 株式会社日立高新技术 自动分析系统
CN104569461A (zh) * 2013-10-15 2015-04-29 深圳迈瑞生物医疗电子股份有限公司 样本架运送装置及流水线和运送方法
CN109508819A (zh) * 2018-10-26 2019-03-22 迈克医疗电子有限公司 一种轨道控制的方法和装置
CN110073223A (zh) * 2016-12-19 2019-07-30 株式会社日立高新技术 自动分析装置
CN110297096A (zh) * 2019-06-04 2019-10-01 迈克医疗电子有限公司 一种样本调度方法、装置、终端设备和介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8916097B2 (en) * 2004-03-31 2014-12-23 Siemens Healthcare Diagnostics Inc. Controller for automated immunoassay system
JP4919677B2 (ja) * 2006-03-07 2012-04-18 株式会社日立ハイテクノロジーズ 自動分析システム及び当該自動分析システムの制御方法
JP5586835B2 (ja) * 2007-06-15 2014-09-10 オーソ−クリニカル・ダイアグノスティックス・インコーポレイテッド 臨床診断分析器性能推定器
KR101912952B1 (ko) * 2010-05-05 2018-10-29 베크만 쿨터 바이오메디컬, 엘엘씨 진단 기기 및 유동 공정
KR20140092378A (ko) * 2011-11-07 2014-07-23 베크만 컬터, 인코포레이티드 샘플을 처리하기 위한 시스템 및 방법
JP6199378B2 (ja) * 2012-05-22 2017-09-20 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドＳｉｅｍｅｎｓ Ｈｅａｌｔｈｃａｒｅ Ｄｉａｇｎｏｓｔｉｃｓ Ｉｎｃ． 線形ランダムアクセス待ち行列
FR3061959B1 (fr) * 2017-01-19 2019-05-31 Horiba Abx Sas Systeme d'analyses biologiques

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000088860A (ja) * 1998-09-11 2000-03-31 Aloka Co Ltd 検体搬送システムおよび検体搬送方法
JP2003057251A (ja) * 2001-08-21 2003-02-26 Hitachi Ltd 生体サンプルの自動分析システム
JP2006038881A (ja) * 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム
CN102725641A (zh) * 2010-01-28 2012-10-10 株式会社日立高新技术 自动分析系统
CN104569461A (zh) * 2013-10-15 2015-04-29 深圳迈瑞生物医疗电子股份有限公司 样本架运送装置及流水线和运送方法
CN110073223A (zh) * 2016-12-19 2019-07-30 株式会社日立高新技术 自动分析装置
CN109508819A (zh) * 2018-10-26 2019-03-22 迈克医疗电子有限公司 一种轨道控制的方法和装置
CN110297096A (zh) * 2019-06-04 2019-10-01 迈克医疗电子有限公司 一种样本调度方法、装置、终端设备和介质

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP4089420A4 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848334A (zh) * 2021-09-26 2021-12-28 中元汇吉生物技术股份有限公司 样本架的调度方法、装置、终端设备及存储介质
CN113848334B (zh) * 2021-09-26 2025-01-17 中元汇吉生物技术股份有限公司 样本架的调度方法、装置、终端设备及存储介质
CN114383916A (zh) * 2021-12-31 2022-04-22 迈克医疗电子有限公司 样本玻片的传送方法及传送系统
CN114383916B (zh) * 2021-12-31 2023-10-13 迈克医疗电子有限公司 样本玻片的传送方法及传送系统
CN119683255A (zh) * 2025-01-07 2025-03-25 深圳市新产业生物医学工程股份有限公司 样本运输装置以及样本运输装置的控制方法

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