WO2022022717A1 - 一种测试方法及设备 - Google Patents

一种测试方法及设备 Download PDF

Info

Publication number
WO2022022717A1
WO2022022717A1 PCT/CN2021/109851 CN2021109851W WO2022022717A1 WO 2022022717 A1 WO2022022717 A1 WO 2022022717A1 CN 2021109851 W CN2021109851 W CN 2021109851W WO 2022022717 A1 WO2022022717 A1 WO 2022022717A1
Authority
WO
WIPO (PCT)
Prior art keywords
test
testing
performance index
round
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2021/109851
Other languages
English (en)
French (fr)
Inventor
宋丹
孔露婷
李男
陆松鹤
宋骁雄
刘军
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
China Mobile Communications Group Co Ltd
Research Institute of China Mobile Communication Co Ltd
Original Assignee
China Mobile Communications Group Co Ltd
Research Institute of China Mobile Communication Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by China Mobile Communications Group Co Ltd, Research Institute of China Mobile Communication Co Ltd filed Critical China Mobile Communications Group Co Ltd
Priority to US18/006,768 priority Critical patent/US12019529B2/en
Priority to EP21848961.5A priority patent/EP4191905A4/en
Priority to JP2023506553A priority patent/JP7515005B2/ja
Publication of WO2022022717A1 publication Critical patent/WO2022022717A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/50—Testing arrangements
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3409—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment for performance assessment
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/201—Monitoring; Testing of receivers for measurement of specific parameters of the receiver or components thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/25—Monitoring; Testing of receivers taking multiple measurements
    • H04B17/254—Monitoring; Testing of receivers taking multiple measurements measuring at different reception times
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/04—Processing captured monitoring data, e.g. for logfile generation
    • H04L43/045—Processing captured monitoring data, e.g. for logfile generation for graphical visualisation of monitoring data
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/16—Threshold monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
    • G06F11/3062—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations where the monitored property is the power consumption
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3065—Monitoring arrangements determined by the means or processing involved in reporting the monitored data
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/81—Threshold
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
    • H04L43/0852—Delays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
    • H04L43/0876—Network utilisation, e.g. volume of load or congestion level
    • H04L43/0888—Throughput
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
    • H04L43/0876—Network utilisation, e.g. volume of load or congestion level
    • H04L43/0894—Packet rate

Definitions

  • the present application relates to the technical field of equipment testing, and in particular, to a testing method and equipment.
  • Figure 1 shows a “single-input-single-output” test system in the prior art. All the way to “test output 1" to judge whether the test has passed. Generally speaking, this "single input-single output” judgment is based on a fixed threshold, and the test result can be judged as “pass (PASS)” or “fail (FAIL)” if the test result is less than/larger than the threshold value. For example: voltage test, resistance test, etc.
  • FIG. 2 shows a "multiple input-single output” test system in the prior art, with multiple inputs, such as “test input 1", “test input 2", ..., “test input M”, and output all the way “test output 1", that is, input-single output.
  • this "multiple input-single output” test method is judged based on a fixed threshold, and the test result can be judged as “pass (PASS)” or “fail (FAIL)” if the test result is less than/larger than the threshold value.
  • PASS pass
  • FAIL field fail
  • the test result "test output quantity” is a preset fixed value, higher than this value, the test can be judged as “failed” (FAIL)", below which the test is deemed “FAIL”.
  • FIG 3 shows an example of the testing process in the prior art, where T represents sending, and R represents receiving.
  • T represents sending
  • R represents receiving.
  • Figure 3 shows that T1 and T2 are sent twice, and R1 and R2 are received twice, and the test result is finally obtained.
  • At least one embodiment of the present application provides a testing method and apparatus, which can realize multi-dimensional testing.
  • At least one embodiment provides a test method, comprising:
  • Configure test parameters for the object under test execute at least two test processes, and obtain the test values of the performance indicators of each test process, wherein each test process is used to test different performance indicators of the object under test;
  • the test result of the tested object is generated.
  • the performing test parameter configuration on the object under test, executing at least two test procedures, and obtaining the test value of the performance index of each test procedure in the test procedure includes: performing at least one round of tests, Among them, in each round of testing, test parameters are configured to the tested object and performance index thresholds are set.
  • the at least two test procedures are executed sequentially in each round of testing, or the at least two test procedures are executed in parallel in each round of testing.
  • each test procedure is executed in sequence according to the test sequence of the preset test procedures. During the process, including:
  • test value of the first performance index and the threshold of the first performance index it is determined whether the current test process passes the test.
  • the value of the first test parameter is an initial value or an adjusted value based on the previous round of test results;
  • the value of the first test parameter needs to be such that the second performance index meets the second performance index threshold after the previous test process ends, and the first test parameter
  • the second performance indicator is a collection of performance indicators of all test processes before the current test process in this round of testing.
  • the test of the next test process of the current test process is executed.
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process includes:
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process further includes:
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process further includes:
  • test parameter configuration to the tested object and set performance index thresholds corresponding to each test process; execute the at least two test processes in parallel, and obtain the test value of the performance index of each test process; wherein, the second test process
  • the value of the test parameter is the initial value or the adjusted value after the previous round of testing
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process includes:
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process includes:
  • generating the test result of the tested object according to the test value of the performance index obtained by each test process further includes:
  • the at least two test procedures include a first test procedure and a second test procedure, wherein the performance index measured by the first test procedure and the performance measured by the second test procedure indicator related;
  • the correlation includes at least one of the following:
  • the performance index measured by the first test process and the performance index measured by the second test process are mutual results.
  • the at least two test procedures for measuring target performance indicators based on the target test parameters are generated.
  • the test result of the tested object is generated according to the test value of the performance index obtained by each test process, including:
  • the line connecting the center point and the vertex of the polygon is used as a scale line, and the numerical value of the corresponding performance index is marked on the scale line;
  • the corresponding threshold point is determined on the scale line, and the threshold points on adjacent scale lines are connected in sequence to generate the threshold area corresponding to the performance indicator threshold;
  • the corresponding test value point is determined on the scale line, and the test value points on the adjacent scale lines are connected in turn to generate the test value corresponding to the test value of the performance index area;
  • a test result of whether the tested object passes the test is obtained.
  • obtaining a test result of whether the tested object passes the test according to whether the threshold region is included in the test value region includes:
  • At least one embodiment provides a test apparatus including a transceiver and a processor, wherein,
  • the transceiver is configured to perform test parameter configuration on the tested object
  • the processor is configured to execute at least two test procedures, and obtain test values of performance indicators of each test procedure, wherein each test procedure is used to test different performance indicators of the object under test; according to each test procedure, obtain The test value of the performance index is generated, and the test result of the tested object is generated.
  • the processor is further configured to perform at least one round of testing, wherein, in each round of testing, the test object is configured with test parameters and a performance indicator threshold is set.
  • the processor is further configured to execute the at least two test procedures sequentially in each round of testing, or execute the at least two test procedures in parallel in each round of testing .
  • the processor is further configured to execute each test in sequence according to the test sequence of the preset test procedures when the at least two test procedures are sequentially executed in each round of testing.
  • process which, during the execution of the current test process, includes:
  • test value of the first performance index and the threshold of the first performance index it is determined whether the current test process passes the test.
  • the value of the first test parameter is an initial value or an adjusted value based on the previous round of test results;
  • the value of the first test parameter needs to be such that the second performance index meets the second performance index threshold after the previous test process ends, and the first test parameter
  • the second performance indicator is a collection of performance indicators of all test processes before the current test process in this round of testing.
  • the processor is further configured to execute the at least two test procedures in parallel in each round of testing,
  • test parameter configuration to the tested object and set performance index thresholds corresponding to each test process; execute the at least two test processes in parallel, and obtain the test value of the performance index of each test process; wherein, the second test process
  • the value of the test parameter is the initial value or the adjusted value after the previous round of testing
  • test value of the performance index and the threshold value of the performance index measured by each test process determine whether each test process passes the test.
  • the at least two test procedures include a first test procedure and a second test procedure, wherein the performance index measured by the first test procedure and the performance measured by the second test procedure indicator related;
  • the correlation includes at least one of the following:
  • the performance index measured by the first test process and the performance index measured by the second test process are mutual results.
  • the processor is further configured to determine the target performance indicator under the target application scenario according to the first mapping relationship between the application scenario of the tested object and the performance indicator;
  • the second mapping relationship between the performance index of the object and the test parameter determines the target test parameter corresponding to the target performance index; and generates the at least two test procedures for measuring the target performance index based on the target test parameter.
  • the processor is further configured to use the performance index tested by each test process as the vertex of the polygon to construct a polygon; and use the line connecting the center point and the vertex of the polygon as the vertex of the polygon.
  • a scale line marking the numerical value of the corresponding performance index on the scale line; according to the performance index threshold value of each performance index, determine the corresponding threshold value point on the scale line, and connect the thresholds on the adjacent scale lines in turn point, generate the threshold area corresponding to the performance index threshold; according to the test value of the performance index obtained by each test process, determine the corresponding test value point on the scale line, and connect the test value points on the adjacent scale lines in turn , generating a test value area corresponding to the test value of the performance index; and obtaining a test result of whether the tested object passes the test according to whether the threshold area is included in the test value area.
  • At least one embodiment provides a testing apparatus, comprising: a processor, a memory, and a program stored on the memory and executable on the processor, the program being The processor implements the steps of the test method as described above when executed.
  • At least one embodiment provides a computer-readable storage medium, where a program is stored on the computer-readable storage medium, and when the program is executed by a processor, the above-mentioned method is implemented. step.
  • the testing method and device provided by the embodiments of the present application can realize multi-dimensional testing, meet the testing requirements for performance indicators in different application scenarios, improve testing efficiency, and improve the ability of testing results to reflect the real performance of the terminal. credibility.
  • Fig. 1 is the schematic diagram of a kind of testing system of the prior art
  • Fig. 2 is the schematic diagram of another kind of testing system of the prior art
  • FIG. 3 is a schematic flowchart of a testing method in the prior art
  • FIG. 4 is a schematic diagram of a multi-dimensional industrial application scenario provided by an embodiment of the present application.
  • FIG. 5 is a schematic diagram of another multi-dimensional industry application scenario provided by an embodiment of the present application.
  • FIG. 6 is a schematic diagram of a multi-dimensional testing system provided by an embodiment of the present application.
  • FIG. 7 is a schematic diagram of another multi-dimensional testing system provided by an embodiment of the present application.
  • FIG. 8 is a flowchart of a testing method provided by an embodiment of the present application.
  • FIG. 9 is an example diagram when the test method provided by the embodiment of the present application performs sequential testing
  • FIG. 10 is an example diagram when the test method provided by the embodiment of the present application performs parallel testing
  • FIG. 11 is an example diagram of a criterion polygon provided by an embodiment of the present application.
  • FIG. 12 is a schematic structural diagram of a test device provided by an embodiment of the application.
  • FIG. 13 is another schematic structural diagram of the testing device provided by the embodiment of the present application.
  • the embodiments of the present application provide a test method, which can realize multi-dimensional test evaluation.
  • Figures 4 and 5 show the multi-dimensional testing requirements in different application scenarios, respectively.
  • Fig. 4 is an application scenario of a smart port, and it is necessary to test multiple performance indicators (ie, multiple dimensions) of the terminal including transmission rate, air interface delay, and decoding accuracy.
  • FIG. 5 shows the application scenario of intelligent monitoring, and it is necessary to test multiple performance indicators (ie, multiple dimensions) of the terminal including transmission rate, air interface delay, and decoding accuracy.
  • the target performance index in the target application scenario may be determined in advance according to the first mapping relationship between the application scenario of the tested object (such as a terminal) and the performance index; then, according to the performance of the tested object (such as the terminal)
  • the second mapping relationship between the indicators and the test parameters determines the target test parameters corresponding to the target performance indicators; and then generates at least two test procedures for measuring the target performance indicators based on the target test parameters. Subsequent embodiments of the present application will perform multi-dimensional tests based on the above at least two test procedures.
  • Table 1 provides an example of the above-mentioned first mapping relationship. By dividing the industry dimension and filtering the key performance requirements according to the divided application scenarios, a mapping table of application scenarios and key performances is formed.
  • Table 2 provides an example of the above-mentioned second mapping relationship.
  • a mapping table between application scenarios and key test parameters can be finally formed, and then for the target application scenarios that need to be measured, the target performance indicators to be measured and the target test parameters corresponding to each performance indicator are determined, and then generated Perform at least two test procedures for measuring target performance indicators based on the target test parameters, and use the test procedures to measure one or more target performance indicators.
  • FIG. 6 and FIG. 7 are schematic structural diagrams of the multi-dimensional test system according to the embodiment of the present application, wherein, in FIG. 6 , by configuring a test input 1 to the tested object, multiple test outputs of the tested object are tested. 1 to N. In FIG. 7 , by disposing a plurality of test input quantities 1 to M on the tested object, a plurality of test output quantities 1 to N of the tested object are tested, where N and M may be equal or unequal.
  • the multi-dimensional test method Compared with the "single-input-single-output" or “multiple-input-single-output” test methods in the prior art, the multi-dimensional test method provided in the embodiment of the present application introduces multiple test procedures, and passes through one of the multiple test procedures. The method of mutual influence and multiple iterations is used to simulate the mutual influence of multiple dimensions. The output of one test process is used as the input of another test process. After several iterations and traversal tests, a comprehensive test conclusion is finally output.
  • test method provided by the embodiment of the present application includes:
  • Step 81 configure the test parameters to the tested object, execute at least two test procedures, and obtain the test value of the performance index of each test procedure, wherein each test procedure is used to test different performance indicators of the tested object.
  • the measured object may specifically be a terminal, a base station or some kind of system.
  • Each test process is used to test different performance indicators of the object under test.
  • one performance indicator can be tested per test flow.
  • the at least two test procedures may include a first test procedure and a second test procedure, wherein the performance index measured by the first test procedure is related to the performance index measured by the second test procedure.
  • the correlation includes at least one of the following: positive correlation; negative correlation; the performance index measured by the first test process and the performance index measured by the second test process are mutual results.
  • the positive correlation means that the performance index measured by the first test process increases as the performance index measured by the second test process increases, or decreases as the performance index measured by the second test process decreases.
  • the negative correlation means that the performance index measured by the first test process decreases as the performance index measured by the second test process increases, or increases as the performance index measured by the second test process decreases.
  • the mutual result means that the test result of the first test process (such as the measured performance index) can be used as the test parameter configuration or test condition of the second test process, and the test result of the second test process can also be used as the first test process. Test parameter configuration or test conditions.
  • Step 82 Generate a test result of the tested object according to the test value of the performance index obtained in each test process.
  • the embodiment of the present application implements a multi-dimensional test method, which can comprehensively describe and evaluate the tested object from multiple dimensions according to the test result.
  • the embodiment of the present application may perform at least one round of testing, wherein, in each round of testing, test parameter configuration is performed on the tested object and performance index thresholds are set.
  • the at least two test procedures may be sequentially executed in each round of testing, or the at least two test procedures may be executed in parallel in each round of testing.
  • the following will respectively describe the sequential execution of the at least two test procedures and the parallel execution of the at least two test procedures.
  • each test procedure is executed in sequence according to the test sequence of the preset test procedures, wherein the process of executing the current test procedure includes:
  • the value of the first test parameter is an initial value or an adjusted value based on the previous round of test results; when the current test process is not in the current round of testing In the first test process, the value of the first test parameter needs to make the second performance index meet the second performance index threshold after the previous test process is finished, and the second performance index is the current current in this round of testing.
  • the adjustment value based on the previous round of test results is determined according to specific test parameters and application scenarios, and the adjustment direction is that, compared with the parameter value before adjustment, the first performance index is higher under the adjusted parameter value. It is easy to meet the requirements of the first performance index threshold.
  • the first test parameter may specifically be a set of test parameters that need to be configured for all test procedures of each round of testing.
  • the current test process passes the test and the current test process is not the last test process in the current round of testing, the next test process of the current test process is executed. All testing processes, or end the current round of testing processes early.
  • step 82 at the end of the current round of testing (sometimes referred to as the current round), if all the test procedures pass the tests, it is judged that this round of tests has passed; at the end of the current round of tests, if there is any failure The test process of the test is judged that the round of test has not passed.
  • test of the current round ends, if all the test procedures pass the test, then output the test result that the tested object passes the test; when the test of the current round ends, if there is a test procedure that fails the test, Then output the test result that the tested object fails the current round of testing.
  • test values of each performance index measured in the current round may also be output.
  • test output of the first test process will be used as the test input of the second test process, and the test output of the second test process will also be used as the first test process to iterate again. Test input when testing.
  • FIG. 9 takes two test procedures, that is, instrument test procedures 1 to 2, as an example for testing the terminal, and shows an example of executing at least two test procedures in sequence.
  • T and R represent sending and receiving, respectively.
  • "Instrument Test Process 1" and “Instrument Test Process 2” correspond to the outputs of "Test Output 1" and “Test Output 2" respectively, and the tests of "Test Output 1” and “Test Output 2" need to be comprehensively considered The result is the overall "conclusion".
  • the test output refers to the performance index of the test process test.
  • “Instrument test process 1” and “Instrument test process 2” are two mutually restrictive and interrelated test processes, which need to be tested in order to draw meaningful test conclusions: the test of "Instrument test process 1" The output is the test input of "Instrument Test Process 2", and the test output of "Instrument Test Process 2" is also the test input of "Instrument Test Process 1". These two test processes are closely related, influence and restrict each other.
  • each round of testing perform instrument test procedure 1 first and then perform instrument test procedure 2.
  • S01 send the test parameter 1 to the terminal through the instrument, configure the test parameter 1 for the terminal, and execute the instrument test process 1
  • S02 receive or measure the performance index 1 of the terminal, and determine whether the instrument test process 1 passes; If it does not pass, you can continue the subsequent S03, send the adjusted test parameter 1 to the terminal through the instrument, and execute the instrument test process 1 again
  • S04 receive or measure the performance index 1 of the terminal, and judge the instrument test process 1 Whether it passed; if passed, the performance index 1 can be substituted into the instrument test process 2, and the instrument test process 2 can be executed.
  • the "throughput-power consumption" requirement of a certain service requirement scenario is: the TCP throughput of the uplink static channel is not lower than 500Mbps, and the power consumption is not higher than 200mA.
  • Step 2 After iterative controller (-S10-S11->), reduce Pmax_out to 25dBm, and perform "test process 1" again (T 11 -S01-S02->R 11 , T 12 -S03-S04->R 12 ), it is again concluded that the TCP throughput of the upstream static channel is 650Mbps—meeting the test requirement of "the TCP throughput of the upstream static channel is not less than 500Mbps";
  • Step 3 After iterative controller (-S10-S11->), reduce Pmax_out to 24dBm, and perform "test process 1" again (T 11 -S01-S02->R 11 , T 12 -S03-S04->R 12 ), once again it is concluded that the TCP throughput of the upstream static channel is 550Mbps—meeting the test requirement of "the TCP throughput of the upstream static channel is not less than 500Mbps";
  • the "throughput-power consumption" requirement of a certain service requirement scenario is: the TCP throughput of the uplink static channel is not lower than 500Mbps, and the power consumption is not higher than 200mA.
  • Step 2 After iterative controller (-S10-S11->), reduce Pmax_out to 25dBm, and perform "test process 1" again (T 11 -S01-S02->R 11 , T 12 -S03-S04->R 12 ), once again it is concluded that the TCP throughput of the upstream static channel is 550Mbps—meeting the test requirement of "the TCP throughput of the upstream static channel is not less than 500Mbps";
  • Step 3 After iterative controller (-S10-S11->), reduce Pmax_out to 24dBm, and perform "test process 1" again (T 11 -S01-S02->R 11 , T 12 -S03-S04->R 12 ), it is again concluded that the TCP throughput of the upstream static channel is 450Mbps—the test requirement of "the TCP throughput of the upstream static channel is not less than 500Mbps" is not met;
  • the second test parameter may specifically be a set of test parameters that need to be configured for all test procedures of each round of testing.
  • test of the current round is ended; and when all the test processes in the current round pass the test, the test of the current round is ended.
  • test of this round if all the test procedures pass the test, it is judged that the test of this round has passed; and when the test of the current round ends, if there is a test procedure that fails the test, then it is judged that the test of this round has not passed the test. pass through.
  • test values of each performance index measured in the current round can also be output.
  • test flows are performed simultaneously. Only when the test outputs of multiple test processes meet the requirements of the test indicators, the test can be judged as "passed the test (PASS)"; if after multiple iterative tests, it is still impossible to achieve that the test outputs of multiple test processes all meet the test requirements. If the index requirements are met, the test is judged as "FAIL".
  • PASS passed the test
  • the parallel test time required is shorter, but the parallel processing capability of the test system is required to be higher.
  • FIG. 10 takes two test procedures, that is, instrument test procedures 1 to 2, as an example for testing the terminal, and shows an example of executing at least two test procedures in parallel.
  • T and R represent sending and receiving, respectively.
  • "Instrument Test Process 1" and “Instrument Test Process 2” correspond to the outputs of "Test Output 1" and “Test Output 2" respectively, and the tests of "Test Output 1" and “Test Output 2" need to be comprehensively considered The result is the overall "conclusion”.
  • instrument test flow 1 and instrument test flow 2 are executed in parallel.
  • the test parameters are sent to the terminal through the instrument, and test parameter 1 is configured for the terminal;
  • test parameter 1 is configured for the terminal;
  • the instrument test procedures 1 and 2 are executed in parallel, and it is judged whether the instrument test procedures 1 and 2 pass; If all the test procedures are passed, the iterative controller can determine whether to continue the next round of testing and configure or update the test parameters in the next round of testing in S25.
  • next round of testing is continued, enter S21 and repeat the above similar procedures; If it does not pass, it is judged whether the preset number of test rounds has been reached, and if so, the test can be ended, otherwise, the test parameters in the next round of testing can be adjusted and the next round of testing can be continued.
  • the "throughput-power consumption" requirement of a certain service requirement scenario is: the TCP throughput of the uplink static channel is not lower than 500Mbps, and the power consumption is not higher than 200mA.
  • the power consumption is 250mA - does not meet the test requirements of "power consumption not higher than 200mA";
  • Upstream static channel TCP throughput is 750Mbps—meet the test requirement of "upstream static channel TCP throughput not less than 500Mbps";
  • Step 2 after iterative controller (-S25->), reduce Pmax_out to 25dBm,
  • the power consumption is 220mA - does not meet the test requirements of "power consumption not higher than 200mA";
  • Upstream static channel TCP throughput is 650Mbps—meet the test requirement of "upstream static channel TCP throughput not less than 500Mbps";
  • Step 3 After iterative controller (-S25->), reduce Pmax_out to 24dBm,
  • the power consumption is 190mA—meet the test requirement of "power consumption not higher than 200mA";
  • Upstream static channel TCP throughput is 550Mbps—meet the test requirement of "upstream static channel TCP throughput not less than 500Mbps";
  • the "throughput-power consumption" requirement of a certain service requirement scenario is: the TCP throughput of the uplink static channel is not lower than 500Mbps, and the power consumption is not higher than 200mA.
  • the power consumption is 250mA - does not meet the test requirements of "power consumption not higher than 200mA";
  • Upstream static channel TCP throughput is 750Mbps—meet the test requirement of "upstream static channel TCP throughput not less than 500Mbps";
  • the power consumption is 220mA - does not meet the test requirements of "power consumption not higher than 200mA";
  • Upstream static channel TCP throughput is 550Mbps—meet the test requirement of "upstream static channel TCP throughput not less than 500Mbps";
  • the power consumption is 190mA—meet the test requirement of "power consumption not higher than 200mA";
  • the TCP throughput of the upstream static channel is 450Mbps—it does not meet the test requirement of "the TCP throughput of the upstream static channel is not less than 500Mbps";
  • the test process of the existing terminal conformance test case can also be optimized, and the test efficiency and the reliability of the test result reflecting the real performance of the terminal can be improved.
  • Test cases such as ACLR (Adjacent Channel Leakage Ratio) and SEM (Frequency Radiation Mask), etc., all need to confirm the MPR (Maximum Power Backoff) test point during the test process.
  • Test cases such as ACLR and SEM are carried out on the premise that the test points meet the requirements - there is a close correlation between the test cases such as ACLR and SEM and the MPR test cases.
  • the parallel test method in the above-mentioned multi-dimensional test method is adopted, under the same test conditions, for each test point of the MPR, the test of the MPR and the test of the ACLR or SEM under the corresponding MPR test point can be completed at the same time , not only can avoid the phenomenon that the MPR test points need to be repeatedly tested by MPR and ACLR/SEM in the existing test, but also can greatly reduce the test time; however, since the test system needs to process MPR and ACLR/SEM at the same time, the parallel test system Higher processing power is required.
  • test loopholes due to the close correlation between multiple test indicators of the terminal, in order to optimize the second indicator, the terminal leads to the deterioration of the first indicator.
  • Test method 2 which can ensure that multiple related indicators pass the test using the same terminal under the same test conditions, and avoid the "test” that uses different terminals or passes individual test cases under different test conditions but fails to pass all test cases. Vulnerability" appears.
  • test process in this embodiment of the present application may include at least one test sub-process.
  • a test process nesting method may be adopted, and the above-mentioned more than two test processes may be nested. All the test processes are used as test sub-processes, so that more than 2 test sub-processes are obtained. Then, these test sub-processes are divided into 2 test processes, and each test process includes at least one test sub-process respectively.
  • the two obtained test procedures are tested in parallel or in sequence. For the specific test method, reference may be made to the above description, which will not be repeated here.
  • the performance index tested by each test process can be used as the vertex of the polygon to construct a polygon; the line connecting the center point and the vertex of the polygon is used as a scale line, and the numerical value of the corresponding performance index is marked on the scale line; according to the performance index threshold value of each performance index, determine on the scale line Corresponding threshold points, and connect the threshold points on adjacent scale lines in turn to generate the threshold area corresponding to the performance index threshold; according to the test value of the performance index obtained by each test process, determine the corresponding test on the scale line value points, and connect the test value points on adjacent scale lines in turn to generate the test value area corresponding to the test value of the performance index; according to whether the threshold value area is included in the test value area, obtain whether the measured object is Test results that pass the
  • a test result that the tested object passes the test is obtained, otherwise, a test result that the tested object fails the test is obtained.
  • a "criterion polygon” is formed. If the test output falls within the "criterion polygon” area, it can be judged as “PASS”; if the test output falls outside the “criterion polygon” area, it can be judged as “FAIL”. )”.
  • Figure 11 shows an example of the above "criterion polygon", which includes three performance indicators, namely rate, delay and reliability. For other metrics like volume, radiation, etc., the example doesn't care. Taking the area 1100 corresponding to "eMBB requirements" in Fig. 11 as an example, according to the test results in Fig. 11, it can be seen that:
  • the area 1102 corresponding to "Device 2 Capability” can completely cover the area 1100 of "eMBB Requirement” in Fig. 11, therefore, "Device 2" will be judged as "PASS”.
  • test methods provided by the embodiments of the present application can implement multi-dimensional test methods for different application scenarios.
  • the methods of the embodiments of the present application can also be implemented for the test process of existing terminal consistency test cases Optimization to improve test efficiency and the reliability of test results reflecting the real performance of the terminal.
  • an embodiment of the present application provides a testing device 120, including a transceiver 122 and a processor 121, wherein,
  • the transceiver 122 is configured to perform test parameter configuration on the tested object
  • the processor 121 is configured to execute at least two test procedures, and obtain test values of performance indicators of each test procedure, wherein each test procedure is used to test different performance indicators of the object under test; according to each test procedure The obtained test value of the performance index generates the test result of the tested object.
  • the processor 121 is further configured to perform at least one round of testing, wherein, in each round of testing, test parameter configuration is performed on the object under test and performance indicator thresholds are set.
  • the processor 121 is further configured to execute the at least two test procedures in sequence in each round of testing, and execute each test procedure in sequence according to the test sequence of the preset test procedures.
  • the current testing process including:
  • test value of the first performance index and the threshold of the first performance index it is determined whether the current test process passes the test.
  • the value of the first test parameter is an initial value or an adjusted value based on the previous round of test results; when the current test process is not the current round In the first test process in the test, the value of the first test parameter needs to make the second performance index meet the second performance index threshold after the test of the previous test process is completed, and the second performance index is this round of testing.
  • the processor 121 is further configured to end the test of the current round when the current test process fails the test; when the current test process passes the test, and the current test process is the last test process in this round of tests , end the test of the current round; when the current test process passes the test and the current test process is not the last test process in the current round of testing, the test of the next test process of the current test process is executed.
  • the processor 121 is further configured to, when the current round of testing ends, if all the test procedures pass the tests, then determine that the round of testing has passed; test process, it is judged that the round of test has not passed.
  • the processor 121 is further configured to output the test result of the tested object passing the test if all the test procedures pass the test when the current round of testing ends; when the current round of testing ends, If there is a test flow that fails the test, output the test result that the tested object fails the current round of tests.
  • the processor 121 is further configured to output the test value of each performance index measured in the current round when the test of the current round ends.
  • the processor 121 is further configured to configure the second test parameters for the tested object and set the performance index threshold corresponding to each test process when the at least two test processes are executed in parallel in each round of testing. ; Execute the described at least two test procedures in parallel, and obtain the test value of the performance index of each test procedure; Wherein, the value of the second test parameter is the initial value or the adjustment value after the previous round of testing ends; According to each The test value and performance index threshold value of the performance indicators measured by the test process are used to determine whether each test process passes the test.
  • the processor 121 is further configured to end the test of the current round when any test procedure in the current round fails the test; when all the test procedures in the current round pass the test, end the test of the current round. test.
  • the processor 121 is further configured to, when the current round of testing ends, if all the test procedures pass the tests, then determine that the round of testing has passed; test process, it is judged that the round of test has not passed.
  • the processor 121 is further configured to output the test value of each performance index measured in the current round when the test of the current round ends.
  • the at least two test procedures include a first test procedure and a second test procedure, wherein the performance index measured by the first test procedure is related to the performance index measured by the second test procedure;
  • the correlation includes at least one of the following:
  • the performance index measured by the first test process and the performance index measured by the second test process are mutual results.
  • the processor 121 is further configured to determine the target performance indicator under the target application scenario according to the first mapping relationship between the application scenario of the tested object and the performance indicator; The second mapping relationship between the parameters determines the target test parameters corresponding to the target performance indicators; and generates the at least two test procedures for measuring the target performance indicators based on the target test parameters.
  • the processor 121 is further configured to use the performance index tested by each test process as the vertex of the polygon to construct a polygon; use the connection line between the center point and the vertex of the polygon as the scale line, in the The value of the corresponding performance index is marked on the scale line; according to the performance index threshold value of each performance index, the corresponding threshold value point is determined on the scale line, and the threshold value points on the adjacent scale lines are connected in turn to generate the performance index threshold value Corresponding threshold area; according to the test value of the performance index obtained by each test process, determine the corresponding test value point on the scale line, and connect the test value points on the adjacent scale lines in turn to generate the test of the performance index The test value area corresponding to the value; according to whether the threshold value area is included in the test value area, the test result of whether the tested object passes the test is obtained.
  • the device in this embodiment is a device corresponding to the method shown in FIG. 8 above, and the implementation manners in each of the above embodiments are applicable to the embodiments of the device, and the same technical effect can also be achieved.
  • the above-mentioned device provided by the embodiment of the present application can realize all the method steps realized by the above-mentioned method embodiment, and can achieve the same technical effect, and the parts and beneficial effects that are the same as the method embodiment in this embodiment will not be described in detail here. Repeat.
  • an embodiment of the present application provides a schematic structural diagram of a testing device 1300, including: a processor 1301, a transceiver 1302, a memory 1303, and a bus interface, wherein:
  • the testing apparatus 1300 further includes: a program stored on the memory 1303 and executable on the processor 1301, and the program implements the following steps when executed by the processor 1301:
  • Configure test parameters for the object under test execute at least two test processes, and obtain the test values of the performance indicators of each test process, wherein each test process is used to test different performance indicators of the object under test;
  • the test result of the tested object is generated.
  • the bus architecture may include any number of interconnected buses and bridges, specifically one or more processors represented by processor 1301 and various circuits of memory represented by memory 1303 linked together.
  • the bus architecture may also link together various other circuits, such as peripherals, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein.
  • the bus interface provides the interface.
  • Transceiver 1302 may be a number of elements, including a transmitter and a receiver, that provide a means for communicating with various other devices over a transmission medium.
  • the processor 1301 is responsible for managing the bus architecture and general processing, and the memory 1303 may store data used by the processor 1301 when performing operations.
  • the terminal in this embodiment is a terminal corresponding to the method shown in FIG. 8 , and the implementation manners in the above embodiments are all applicable to the embodiments of the terminal, and the same technical effect can also be achieved.
  • the transceiver 1302 and the memory 1303, as well as the transceiver 1302 and the processor 1301 can be communicated and connected through a bus interface, the function of the processor 1301 can also be realized by the transceiver 1302, and the function of the transceiver 1302 can also be realized by the processor 1301 realized.
  • a computer-readable storage medium on which a program is stored, and when the program is executed by a processor, the following steps are implemented:
  • Configure test parameters for the object under test execute at least two test processes, and obtain the test values of the performance indicators of each test process, wherein each test process is used to test different performance indicators of the object under test;
  • the test result of the tested object is generated.
  • the disclosed apparatus and method may be implemented in other manners.
  • the apparatus embodiments described above are only illustrative.
  • the division of the units is only a logical function division. In actual implementation, there may be other division methods.
  • multiple units or components may be combined or Can be integrated into another system, or some features can be ignored, or not implemented.
  • the shown or discussed mutual coupling or direct coupling or communication connection may be through some interfaces, indirect coupling or communication connection of devices or units, and may be in electrical, mechanical or other forms.
  • the units described as separate components may or may not be physically separated, and components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solutions of the embodiments of the present application.
  • each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically alone, or two or more units may be integrated into one unit.
  • the functions, if implemented in the form of software functional units and sold or used as independent products, may be stored in a computer-readable storage medium.
  • the technical solution of the present application can be embodied in the form of a software product in essence, or the part that contributes to the prior art or the part of the technical solution.
  • the computer software product is stored in a storage medium, including Several instructions are used to cause a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present application.
  • the aforementioned storage medium includes: U disk, mobile hard disk, ROM, RAM, magnetic disk or optical disk and other media that can store program codes.

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Data Mining & Analysis (AREA)
  • Environmental & Geological Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)

Abstract

一种测试方法及设备，该方法包括：向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。本申请能够实现多量纲的测试，满足不同应用场景对性能指标的测试需求，提高测试效率，并能提升测试结果反映终端真实性能的可信度。

Description

一种测试方法及设备
相关申请的交叉引用
本申请基于申请号为202010757937.9、申请日为2020年07月31日的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此引入本申请作为参考。
技术领域
本申请涉及设备测试技术领域，具体涉及一种测试方法及设备。
背景技术
现有技术的测试方法大多为“单输入-单输出”的测试方式，图1给出了现有技术的一种“单输入-单输出”测试系统，输入一路“测试输入量1”，通过一路“测试输出量1”即可判断该测试是否通过。一般来说，这种“单输入-单输出”的判断依据为一个固定阈值，测试结果小于/大于阈值即可判定为“通过(PASS)”或“未通过(FAIL)”。例如：电压测试、电阻测试等。
图2给出了现有技术的一种“多输入-单输出”的测试系统，输入多路输入量，如“测试输入量1”、“测试输入量2”、……、“测试输入量M”，输出一路“测试输出量1”，即输入-单输出。一般来说，这种“多输入-单输出”的测试方法判断依据为固定阈值，测试结果小于/大于阈值即可判定为“通过(PASS)”或“未通过(FAIL)”。例如：功耗测试，输入多路“测试输入量”：电压、DRX配置、温度等，测试结果“测试输出量”为一个预设的固定值，高于该值即可判定该测试“未通过(FAIL)”，低于该值即可判定该测试“通过(FAIL)”。
图3给出了现有技术的测试流程的一个示例，其中T表示发送，R表示接收，在仪表测试流程中，通过多次向被测终端发送数据以及测量并接 收被测终端的相关数据(图3为发送有T1和T2共两次，接收有R1和R2共两次)，最终得到测试结果。
然后，对于垂直行业应用测试来说，用单一维度来描述测试结果通常是不够的。一个典型的垂直行业场景往往需要多个维度的变量来综合描述和评估，因此需要引入多量纲的评估方法，现有技术目前尚未提供多量纲的测试系统或方法。
发明内容
本申请的至少一个实施例提供了一种测试方法及设备，能够实现多量纲的测试。
根据本申请的一个方面，至少一个实施例提供了一种测试方法，包括：
向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；
根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
此外，根据本申请的至少一个实施例，所述向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，包括：执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
此外，根据本申请的至少一个实施例，在每轮测试中依次执行所述至少两条测试流程，或者，在每轮测试中并行执行所述至少两条测试流程。
此外，根据本申请的至少一个实施例，在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值；
根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前 测试流程是否通过测试。
此外，根据本申请的至少一个实施例，在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。
此外，根据本申请的至少一个实施例，还包括：
在当前测试流程未通过测试时，结束当前轮的测试；
在当前测试流程通过测试，且当前测试流程为本轮测试中的最后一个测试流程时，结束当前轮的测试；
在当前测试流程通过测试，且当前测试流程非本轮测试中的最后一个测试流程时，执行当前测试流程的下一个测试流程的测试。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；
在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
在当前轮的测试结束时，若所有测试流程都通过测试，则输出所述被测对象通过测试的测试结果；
在当前轮的测试结束时，若存在未通过测试的测试流程，则输出所述被测对象未通过当前轮测试的测试结果。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
此外，根据本申请的至少一个实施例，在每轮测试中并行执行所述至 少两条测试流程时，
向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后的调整值；
根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每条测试流程是否通过测试。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
在当前轮中的任一测试流程未通过测试时，结束当前轮的测试；
在当前轮中的所有测试流程都通过测试时，结束当前轮的测试。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；
在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
此外，根据本申请的至少一个实施例，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
此外，根据本申请的至少一个实施例，所述至少两条测试流程包括第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关；
其中，所述相关包括以下至少一种：
正相关；
负相关；
第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。
此外，根据本申请的至少一个实施例，还包括：
根据被测对象的应用场景与性能指标之间的第一映射关系，确定目标应用场景下的目标性能指标；
根据被测对象的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；
生成基于所述目标测试参数进行目标性能指标测量的所述至少两条测试流程。
此外，根据本申请的至少一个实施例，根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；
将所述多边形的中心点与顶点的连线作为刻度线，在所述刻度线上标记对应的性能指标的数值；
根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；
根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；
根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
此外，根据本申请的至少一个实施例，所述根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果，包括：
在所述阈值区域全部包含在所述测试值区域内时，获得所述被测对象通过测试的测试结果，否则，获得所述被测对象未通过测试的测试结果。
根据本申请的另一方面，至少一个实施例提供了一种测试装置，包括收发机和处理器，其中，
所述收发机，配置为向被测对象进行测试参数配置；
所述处理器，配置为执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能 指标；根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
此外，根据本申请的至少一个实施例，所述处理器，还配置为执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
此外，根据本申请的至少一个实施例，所述处理器，还配置为在每轮测试中依次执行所述至少两条测试流程，或者，在每轮测试中并行执行所述至少两条测试流程。
此外，根据本申请的至少一个实施例，所述处理器，还配置为在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值；
根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前测试流程是否通过测试。
此外，根据本申请的至少一个实施例，在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。
此外，根据本申请的至少一个实施例，所述处理器，还配置为在每轮测试中并行执行所述至少两条测试流程时，
向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后的调整值；
根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每 条测试流程是否通过测试。
此外，根据本申请的至少一个实施例，所述至少两条测试流程包括第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关；
其中，所述相关包括以下至少一种：
正相关；
负相关；
第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。
此外，根据本申请的至少一个实施例，所述处理器，还配置为根据被测对象的应用场景与性能指标之间的第一映射关系，确定目标应用场景下的目标性能指标；根据被测对象的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；生成基于所述目标测试参数进行目标性能指标测量的所述至少两条测试流程。
此外，根据本申请的至少一个实施例，所述处理器，还配置为将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；将所述多边形的中心点与顶点的连线作为刻度线，在所述刻度线上标记对应的性能指标的数值；根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
根据本申请的另一方面，至少一个实施例提供了一种测试装置，包括：处理器、存储器及存储在所述存储器上并可在所述处理器上运行的程序，所述程序被所述处理器执行时实现如上所述的测试方法的步骤。
根据本申请的另一方面，至少一个实施例提供了一种计算机可读存储介质，所述计算机可读存储介质上存储有程序，所述程序被处理器执行时，实现如上所述的方法的步骤。
与现有技术相比，本申请实施例提供的测试方法及设备，能够实现多量纲的测试，满足不同应用场景对性能指标的测试需求，提高测试效率，并能提升测试结果反映终端真实性能的可信度。
附图说明
通过阅读下文优选实施方式的详细描述，各种其他的优点和益处对于本领域普通技术人员将变得清楚明了。附图仅用于示出优选实施方式的目的，而并不认为是对本申请的限制。而且在整个附图中，用相同的参考符号表示相同的部件。在附图中：
图1为现有技术的一种测试系统的示意图；
图2为现有技术的另一种测试系统的示意图；
图3为现有技术的一种测试方法的流程示意图；
图4为本申请实施例提供的一种多量纲的行业应用场景示意图；
图5为本申请实施例提供的另一种多量纲的行业应用场景示意图；
图6为本申请实施例提供的一种多量纲的测试系统的示意图；
图7为本申请实施例提供的另一种多量纲的测试系统的示意图；
图8为本申请实施例提供的测试方法的流程图；
图9为本申请实施例提供的测试方法执行依次测试时的示例图；
图10为本申请实施例提供的测试方法执行并行测试时的示例图；
图11为本申请实施例提供的判据多边形的示例图；
图12为本申请实施例提供的测试装置的一种结构示意图；
图13为本申请实施例提供的测试装置的另一种结构示意图。
具体实施方式
下面将参照附图更详细地描述本申请的示例性实施例。虽然附图中显示了本申请的示例性实施例，然而应当理解，可以以各种形式实现本申请而不应被这里阐述的实施例所限制。相反，提供这些实施例是为了能够更透彻地理解本申请，并且能够将本申请的范围完整的传达给本领域的技术人员。
本申请的说明书和权利要求书中的术语“第一”、“第二”等是用于区别类似的对象，而不必用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换，以便这里描述的本申请的实施例例如能够以除了在这里图示或描述的那些以外的顺序实施。此外，术语“包括”和“具有”以及他们的任何变形，意图在于覆盖不排他的包含，例如，包含了一系列步骤或单元的过程、方法、系统、产品或设备不必限于清楚地列出的那些步骤或单元，而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。说明书以及权利要求中“和/或”表示所连接对象的至少其中之一。
以下描述提供示例而并非限定权利要求中阐述的范围、适用性或者配置。可以对所讨论的要素的功能和布置作出改变而不会脱离本公开的精神和范围。各种示例可恰适地省略、替代、或添加各种规程或组件。例如，可以按不同于所描述的次序来执行所描述的方法，并且可以添加、省去、或组合各种步骤。另外，参照某些示例所描述的特征可在其他示例中被组合。
如背景技术中所述的，现有技术的测试方法难以实现多量纲的测试，而对于垂直行业应用的测试场景来说，用单一维度来描述测试结果通常是不够的，一个典型的垂直行业场景往往需要多个维度的变量来综合描述和评估。为解决以上问题中的至少一种，本申请实施例提供了一种测试方法，可以实现多量纲的测试评估。
图4和图5分别给出了不同应用场景下的多量纲测试需求。其中，图4为智能港口的应用场景下，需要对终端的包括传输速率、空口时延和译码准确性等多个性能指标(即多个量纲)进行测试。图5为智能监控的应用场景下，需要对终端的包括传输速率、空口时延和译码准确性等多个性能指标(即多个量纲)进行测试。
本申请实施例可以预先根据被测对象(如终端)的应用场景与性能指标之间的第一映射关系，确定目标应用场景下的目标性能指标；然后，根据被测对象(如终端)的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；然后，生成基于所述目标测试参数进 行目标性能指标测量的至少两条测试流程。后续本申请实施例将基于上述至少两条测试流程进行多量纲的测试。
表1提供了上述第一映射关系的一种示例，通过对行业维度进行划分，根据划分的应用场景，筛选关键性能要求，形成应用场景-关键性能的映射表。
Figure PCTCN2021109851-appb-000001
表1
表2提供了上述第二映射关系的一种示例。通过对关键性能指标进行细化，筛选关键测试参数的配置及要求，形成关键性能坐标-关键测试参数的映射表。
Figure PCTCN2021109851-appb-000002
Figure PCTCN2021109851-appb-000003
表2
基于上述两张表，可以最终形成应用场景-关键测试参数的映射表，进而生成针对需要测量的目标应用场景下，确定需要测量的目标性能指标以及每个性能指标对应的目标测试参数，然后生成基于所述目标测试参数进行目标性能指标测量的至少两条测试流程，利用所述测试流程测量其中的一个或多个目标性能指标。
图6和图7给出了本申请实施例的多量纲的测试系统的结构示意图，其中，图6中，通过向被测对象配置一个测试输入量1，测试被测对象的多个测试输出量1～N。图7中，通过向被测对象配置多个测试输入量1～M，测试被测对象的多个测试输出量1～N，这里N和M可以相等或不等。
相比于现有技术的“单输入-单输出”或“多输入-单输出”测试方法，本申请实施例提供的多量纲的测试方法引入了多条测试流程，并通过多条测试流程之间进行互相影响、多次迭代的方式，模拟多维度之间互相影响，将其中一条测试流程的输出作为另一条测试流程的输入，经过若干次迭代、遍历测试，最终输出综合测试结论。
请参照图8，本申请实施例提供的测试方法，包括：
步骤81，向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试 被测对象的不同性能指标。
这里，所述被测对象具体可以是终端、基站或某种系统。每条测试流程用于测试被测对象的不同性能指标。为了便于处理，可以每条测试流程测试一种性能指标。具体的，所述至少两条测试流程可以包括有第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关。
这里，所述相关包括以下至少一种：正相关；负相关；第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。其中，正相关是指第一测试流程测量的性能指标随着第二测试流程测量的性能指标的增大而增大，或者，随着第二测试流程测量的性能指标的减小而减小。负相关是指第一测试流程测量的性能指标随着第二测试流程测量的性能指标的增大而减小，或者，随着第二测试流程测量的性能指标的减小而增大。互为结果是指：第一测试流程的测试结果(如测量得到的性能指标)可以作为第二测试流程的测试参数配置或测试条件，第二测试流程的测试结果也可以作为第一测试流程的测试参数配置或测试条件。
步骤82，根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
通过以上步骤，本申请实施例实现了一种多量纲的测试方法，可以根据测试结果，从多个维度综合描述和评估被测对象。
在上述步骤81中，本申请实施例可以执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
具体的，本申请实施例可以在每轮测试中依次执行所述至少两条测试流程，或者，在每轮测试中并行执行所述至少两条测试流程。下面将针对依次执行所述至少两条测试流程和并行执行所述至少两条测试流程分别进行说明。
在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
A)向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第 二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值。
其中，在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。这里，基于前一轮测试结果的调整值是根据具体的测试参数以及应用场景来确定，其调整方向是相比于调整前的参数值，在调整后的参数值下所述第一性能指标更容易满足所述第一性能指标阈值的要求。
另外，所述第一测试参数具体可以是针对每轮测试的所有测试流程所需要配置的测试参数的集合。
B)根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前测试流程是否通过测试。
这里，在当前测试流程未通过测试时，结束当前轮的测试；在当前测试流程通过测试，且当前测试流程为本轮测试中的最后一个测试流程时，结束当前轮的测试，另外，是否需要继续进行下一轮的测试，可以根据预先制定的测试计划来确定。
这里，在当前测试流程通过测试，且当前测试流程非本轮测试中的最后一个测试流程时，执行当前测试流程的下一个测试流程的测试，通过依次执行上述步骤，可以完成本轮测试中的所有测试流程，或者提前结束本轮测试流程。
在上述步骤82中，在当前轮(本文有时也称作本轮)的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
可选的，在当前轮的测试结束时，若所有测试流程都通过测试，则输出所述被测对象通过测试的测试结果；在当前轮的测试结束时，若存在未通过测试的测试流程，则输出所述被测对象未通过当前轮测试的测试结果。
可选的，在当前轮的测试结束时，还可以输出当前轮中测得的各个性 能指标的测试值。
以上测试方式中，多个测试流程之间依次轮流进行，第一测试流程的测试输出将作为第二测试流程的测试输入，而第二测试流程的测试输出也将作为第一测试流程再次进行迭代测试时的测试输入。
图9以两个测试流程，即仪表测试流程1～2对终端进行测试为例，给出了依次执行至少两条测试流程的示例。其中，T和R分别表示发送和接收。其中，“仪表测试流程1”和“仪表测试流程2”分别对应输出“测试输出量1”和“测试输出量2”，需要综合考虑“测试输出量1”及“测试输出量2”的测试结果才能给出总体“结论”。本文中，测试输出量即是指测试流程测试的性能指标。“仪表测试流程1”与“仪表测试流程2”之间是两个相互制约、相互关联的测试流程，需要进行关联测试，才能够得出有意义的测试结论：“仪表测试流程1”的测试输出是“仪表测试流程2”的测试输入，而“仪表测试流程2”的测试输出也是“仪表测试流程1”的测试输入，这两个测试流程之间紧密相关、相互影响、互为制约。
以“吞吐量-功耗”测试为例：假设“仪表测试流程1”代表了“吞吐量”的测试流程，而“仪表测试流程2”代表了“功耗”的测试流程。终端为了提升吞吐量，可能会带来较大的终端功耗。即，终端吞吐量性能的提升可能会带来终端功耗性能的下降；反之，终端功耗性能的提升也可能会带来终端吞吐量性能的下降。因此，对于这两个相互制约、相互关联的待测量，需要进行并行关联测试，才能够得出有意义的测试结论。
在每轮测试中，先执行仪表测试流程1再执行仪表测试流程2。其中，在S01中，通过仪表向终端发送测试参数1，为终端配置测试参数1，执行仪表测试流程1；在S02中，接收或测量终端的性能指标1，并判断仪表测试流程1是否通过；若不通过时，可以继续后续的S03，通过仪表向终端发送调整后的测试参数1，并再次执行仪表测试流程1；在S04中，接收或测量终端的性能指标1，并判断仪表测试流程1是否通过；若通过，则可以将性能指标1代入到仪表测试流程2中，执行仪表测试流程2。在执行仪表测试流程2时，在S06中，通过仪表向终端发送测试参数2和性能指标1，为终端配置测试参数，执行仪表测试流程2；在S07中，接收或测量终端的性 能指标2，并判断仪表测试流程2是否通过；若不通过，可以继续后续的S08，通过仪表向终端发送调整后的测试参数2，并再次执行仪表测试流程2；在S09中，接收或测量终端的性能指标2，并判断仪表测试流程2是否通过；若通过，则可以在S10通过迭代控制器判断是否继续下一轮测试以及配置或更新下一轮测试中的测试参数，若继续下一轮测试，进入S11并重复以上的类似流程。
下面提供两个更为具体的依次进行测试的示例：
示例一：
假设某一业务需求场景对“吞吐量-功耗”的需求为：上行静态信道TCP吞吐量不低于500Mbps，同时，功耗不高于200mA。
步骤一，进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，在某一测试条件下：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝26dBm时，得出上行静态信道TCP吞吐量为750Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为750Mbps”(-5->)前提下，随即进行“测试流程2”(T 21-S06-S07->R 21，T 22-S08-S09->R 22)：得出此时的功耗为250mA——不满足“功耗不高于200mA”的测试要求；
步骤二，经过迭代控制器(-S10-S11->)，将Pmax_out下调至25dBm，再次进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，再次得出上行静态信道TCP吞吐量为650Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为650Mbps”(-S05->)前提下，再次进行“测试流程2”(T 21-6-7->R 21，T 22-8-9->R 22)：得出此时的功耗为220mA——仍旧不满足“功耗不高于200mA”的测试要求；
步骤三，经过迭代控制器(-S10-S11->)，将Pmax_out下调至24dBm，再次进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，再次得出上行静态信道TCP吞吐量为550Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为550Mbps”(-5->)前提下，再次进行“测试流程2”(T 21-S06-S07->R 21，T 22-S08-S09->R 22)：得出此时的功耗为190mA——满足“功耗不高于200mA”的测试要求；
至此，完成测试，且测试结果为“测试通过(PASS)”。
示例二：
假设某一业务需求场景对“吞吐量-功耗”的需求为：上行静态信道TCP吞吐量不低于500Mbps，同时，功耗不高于200mA。
步骤一，进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，在某一测试条件下：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝26dBm时，得出上行静态信道TCP吞吐量为750Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为750Mbps”(-5->)前提下，随即进行“测试流程2”(T 21-S06-S07->R 21，T 22-S08-S09->R 22)：得出此时的功耗为250mA——不满足“功耗不高于200mA”的测试要求；
步骤二，经过迭代控制器(-S10-S11->)，将Pmax_out下调至25dBm，再次进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，再次得出上行静态信道TCP吞吐量为550Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为550Mbps”(-S05->)前提下，再次进行“测试流程2”(T 21-S06-S07->R 21，T 22-S08-S09->R 22)：得出此时的功耗为220mA——仍旧不满足“功耗不高于200mA”的测试要求；
步骤三，经过迭代控制器(-S10-S11->)，将Pmax_out下调至24dBm，再次进行“测试流程1”(T 11-S01-S02->R 11，T 12-S03-S04->R 12)，再次得出上行静态信道TCP吞吐量为450Mbps——不满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
在上述测试条件及“上行静态信道TCP吞吐量为450Mbps”(-5->)前提下，再次进行“测试流程2”(T 21-S06-S07->R 21，T 22-S08-S09->R 22)： 得出此时的功耗为190mA——满足“功耗不高于200mA”的测试要求；
至此，完成测试，且测试结果为“测试失败(FAIL)”。
下面介绍并行执行所述至少两条测试流程的具体实现。
在每轮测试中并行执行所述至少两条测试流程时：
A)向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后的调整值。
这里，所述第二测试参数具体可以是针对每轮测试的所有测试流程所需要配置的测试参数的集合。
B)根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每条测试流程是否通过测试。
这里，在当前轮中的任一测试流程未通过测试时，结束当前轮的测试；而在当前轮中的所有测试流程都通过测试时，结束当前轮的测试。
进一步的，在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；而在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
进一步的，在当前轮的测试结束时，还可以输出当前轮中测得的各个性能指标的测试值。
例如，基于同样的测试初始配置，多个测试流程同时进行。只有当多个测试流程的测试输出均满足测试指标要求时，测试才可被判定为“测试通过(PASS)”；若经过多次迭代测试，始终无法实现多个测试流程的测试输出均满足测试指标要求，则测试被判定为“测试失败(FAIL)”。
针对同样的一组测试需求，相比于多量纲的依次进行的测试方式，并行进行测试所需的测试时间较短，但是对测试系统的并行处理能力要求更高。
图10以两个测试流程，即仪表测试流程1～2对终端进行测试为例，给出了并行执行至少两条测试流程的示例。其中，T和R分别表示发送和接收。其中，“仪表测试流程1”和“仪表测试流程2”分别对应输出“测试 输出量1”和“测试输出量2”，需要综合考虑“测试输出量1”及“测试输出量2”的测试结果才能给出总体“结论”。
在每轮测试中，并行执行仪表测试流程1和仪表测试流程2。其中，在S21～S22中，通过仪表向终端发送测试参数，为终端配置测试参数1；在S23～S24中并行执行仪表测试流程1和2，并判断仪表测试流程1和2是否通过；若两个测试流程都通过，则可以在S25通过迭代控制器判断是否继续下一轮测试以及配置或更新下一轮测试中的测试参数，若继续下一轮测试，进入S21并重复以上的类似流程；若不通过，则判断是否达到预设的测试轮数，若是，则可以结束测试，否则，可以调整下一轮测试中的测试参数，并继续下一轮测试。
下面提供两个更为具体的并行进行测试的示例：
示例三：
假设某一业务需求场景对“吞吐量-功耗”的需求为：上行静态信道TCP吞吐量不低于500Mbps，同时，功耗不高于200mA。
步骤一，在某一测试条件下对整个测试系统进行配置(T 11-S21-S22->R 21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝26dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为250mA——不满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为750Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
步骤二，经过迭代控制器(-S25->)，将Pmax_out下调至25dBm，
再次对整个测试系统进行配置(T 11-S21-S22->R 21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝25dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为220mA——不满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为650Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
步骤三，经过迭代控制器(-S25->)，将Pmax_out下调至24dBm，
再次对整个测试系统进行配置(T 11-S21-S22->R 21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝24dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为190mA——满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为550Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
至此，完成测试，且测试结果为“测试通过(PASS)”。
示例四：
假设某一业务需求场景对“吞吐量-功耗”的需求为：上行静态信道TCP吞吐量不低于500Mbps，同时，功耗不高于200mA。
步骤一，在某一测试条件下对整个测试系统进行配置(T 11-S21-S22->R 21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝26dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为250mA——不满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为750Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
步骤二，经过迭代控制器(-S25->)，将Pmax_out下调至25dBm，再次对整个测试系统进行配置(T 11-S21-S22->R 21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝25dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为220mA——不满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为550Mbps——满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
步骤三，经过迭代控制器(-S25->)，将Pmax_out下调至24dBm，再次对整个测试系统进行配置(T11-S21-S22->R21)：在UL 256QAM、UL 2*2 MIMO、SA下100MHz全资源分配、SCS＝30KHz、DL/UL 5ms切换周期条件下，Pmax_out＝24dBm时，测试得出(T 21-S23-S24->R 11)：
功耗为190mA——满足“功耗不高于200mA”的测试要求；
上行静态信道TCP吞吐量为450Mbps——不满足“上行静态信道TCP吞吐量不低于500Mbps”的测试要求；
至此，完成测试，且测试结果为“测试失败(FAIL)”。
另外，采用本申请所述的测试方法，也可以对现有终端一致性测试用例的测试流程实现优化，提升测试效率及测试结果反映终端真实性能的可信度。
现有的终端一致性测试用例ACLR(邻道泄漏比)及SEM(频率辐射模板)等，在测试过程中都需要对MPR(最大功率回退)的测试点进行确认，需要在MPR(最大功率回退)测试点满足要求的前提下进行ACLR及SEM等测试例的测试——ACLR及SEM等测试例与MPR测试例之间存在紧密相关性。
由于ACLR、SEM与MPR为各自独立的测试例，为了在测试中体现出上述相关性(保证由同一款终端完成了ACLR/MPR测试例及SEM/MPR测试例)，现有ACLR及SEM测试例在测试过程中都需要对MPR的测试点进行重复测试。
若采用上述多量纲测试方法中的依次进行测试的方式，则可以在同一测试条件下，针对MPR的每一个测试点，都可以依次完成MPR的测试及相应MPR测试点下的ACLR或SEM的测试，从而避免了现有测试中MPR的测试点需要被MPR及ACLR/SEM进行重复测试的现象；
若采用上述多量纲测试方法中的并行进行测试的方式，则可以在同一测试条件下，针对MPR的每一个测试点，都可以同时完成MPR的测试及相应MPR测试点下的ACLR或SEM的测试，不仅可以避免现有测试中MPR的测试点需要被MPR及ACLR/SEM进行重复测试的现象，还可以大幅缩减测试时间；但是由于测试系统需要同时处理MPR及ACLR/SEM，对测试系统的并行处理能力要求较高。
此外，鉴于目前终端测试验证的实际情况：为了提高送测效率、缩短送测时间、获得更好的测试结果，很多终端厂商在送测时会提供多部终端进行并行测试，导致可能出现多个关联指标之间实际上是使用了不同的终端分别通过了测试，无法反映出该终端的真实性能。
例如：使用第一终端进行了第一指标的测试，使用第二终端进行了第二指标的测试，使用第三终端进行了第三指标的测试——虽然这三个指标都分别通过了测试验证，但是却无法验证同一终端可以通过上述全部三个指标的测试。可能出现“测试漏洞”：由于终端的多个测试指标之间存在紧密相关性，终端为了优化第二指标，导致了第一指标的恶化——若使用上述“多量纲测试方法一”或“多量纲测试方法二”，可以保证多个相关指标都是使用同一终端在同一测试条件下通过测试，避免出现使用不同终端或在不同测试条件下分别通过个别测试例却无法通过全部测试例的“测试漏洞”出现。
另外，需要说明的是，本申请实施例的所述测试流程可以包括至少一个测试子流程，这样，在进行多于2条测试流程时，可以采用测试流程嵌套的方式，将上述多于2条的测试流程均作为测试子流程，从而得到多于2条的测试子流程，然后，将这些测试子流程分到2条测试流程下，每个测试流程分别包括至少一个测试子流程，然后按照上文的方式，对所得的2条测试流程进行并行或依次测试，具体测试方式可以参考上文的描述，此处不再赘述。
示例六：
在上述示例一～四中，当分别针对Pmax_out＝26dBm、25dBm、24dBm进行测试时，“测试流程1”或“测试流程2”中还可以包含“Configured Transmitted Power”的测试子流程，即通过设置测试仪表中的一个网络参数Pcmax来控制终端的输出功率分别实现Pmax_out＝26dBm、25dBm、24dBm。
该“Configured Transmitted Power”的测试子流程与“功耗”测试子流程共同构成上述“测试流程1”；该“Configured Transmitted Power”的测试子流程与“上行静态信道TCP吞吐量”测试子流程共同构成上述“测试流程2”
接下来提供一种测试结果的分析方式，可以应用于上述步骤82中。具体的，在上述步骤82中，根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果时，可以将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；将所述多边形的中心点与顶点的连线作为 刻度线，在所述刻度线上标记对应的性能指标的数值；根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
例如，在所述阈值区域全部包含在所述测试值区域内时，获得所述被测对象通过测试的测试结果，否则，获得所述被测对象未通过测试的测试结果。
也就是说，根据多量纲判断依据，形成“判据多边形”。凡是测试输出量落入“判据多边形”区域内的，即可判定为“通过(PASS)”；凡是测试输出量落入“判据多边形”区域外的，即可判定为“未通过(FAIL)”。
图11给出了上述“判据多边形”的一个示例，其中，包括有3个性能指标，分别为速率、时延和可靠性。对于其他诸如体积、辐射等指标，该示例并不关心。以图11中的“eMBB需求”对应于的区域1100为例，根据图11的测试结果，可以看出：
“设备1能力”对应的区域1101无法完全覆盖图11中的“eMBB需求”的区域1100，因此，“设备1”将被判定为“未通过(FAIL)”；
“设备2能力”对应的区域1102能够完全覆盖图11中的“eMBB需求”的区域1100，因此，“设备2”将被判定为“通过(PASS)”。
从上文可以看出，本申请实施例提供的测试方法，可以实现针对不同应用场景的多量纲测试方法，另外，本申请实施例的方法也可以对现有终端一致性测试用例的测试流程实现优化，提升测试效率及测试结果反映终端真实性能的可信度。
以上介绍了本申请实施例的各种方法。下面将进一步提供实施上述方法的装置。
请参照图12，本申请实施例提供了一种测试装置120，包括收发机122和处理器121，其中，
所述收发机122，配置为向被测对象进行测试参数配置；
所述处理器121，配置为执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
可选的，所述处理器121，还配置为执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
可选的，所述处理器121，还配置为在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值；
根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前测试流程是否通过测试。
可选的，在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。
可选的，所述处理器121，还配置为在当前测试流程未通过测试时，结束当前轮的测试；在当前测试流程通过测试，且当前测试流程为本轮测试中的最后一个测试流程时，结束当前轮的测试；在当前测试流程通过测试，且当前测试流程非本轮测试中的最后一个测试流程时，执行当前测试流程的下一个测试流程的测试。
可选的，所述处理器121，还配置为在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
可选的，所述处理器121，还配置为在当前轮的测试结束时，若所有测试流程都通过测试，则输出所述被测对象通过测试的测试结果；在当前轮的测试结束时，若存在未通过测试的测试流程，则输出所述被测对象未通过当前轮测试的测试结果。
可选的，所述处理器121，还配置为在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
可选的，所述处理器121，还配置为在每轮测试中并行执行所述至少两条测试流程时，向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后的调整值；根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每条测试流程是否通过测试。
可选的，所述处理器121，还配置为在当前轮中的任一测试流程未通过测试时，结束当前轮的测试；在当前轮中的所有测试流程都通过测试时，结束当前轮的测试。
可选的，所述处理器121，还配置为在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
可选的，所述处理器121，还配置为在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
可选的，所述至少两条测试流程包括第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关；
其中，所述相关包括以下至少一种：
正相关；
负相关；
第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。
可选的，所述处理器121，还配置为根据被测对象的应用场景与性能指 标之间的第一映射关系，确定目标应用场景下的目标性能指标；根据被测对象的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；生成基于所述目标测试参数进行目标性能指标测量的所述至少两条测试流程。
可选的，所述处理器121，还配置为将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；将所述多边形的中心点与顶点的连线作为刻度线，在所述刻度线上标记对应的性能指标的数值；根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
需要说明的是，该实施例中的装置是与上述图8所示的方法对应的装置，上述各实施例中的实现方式均适用于该装置的实施例中，也能达到相同的技术效果。本申请实施例提供的上述装置，能够实现上述方法实施例所实现的所有方法步骤，且能够达到相同的技术效果，在此不再对本实施例中与方法实施例相同的部分及有益效果进行具体赘述。
请参考图13，本申请实施例提供了测试装置1300的一结构示意图，包括：处理器1301、收发机1302、存储器1303和总线接口，其中：
在本申请实施例中，测试装置1300还包括：存储在存储器上1303并可在处理器1301上运行的程序，所述程序被处理器1301执行时实现如下步骤：
向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；
根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
可理解的，本申请实施例中，所述计算机程序被处理器1301执行时可 实现上述图8所示的测试方法实施例的各个过程，且能达到相同的技术效果，为避免重复，这里不再赘述。
在图13中，总线架构可以包括任意数量的互联的总线和桥，具体由处理器1301代表的一个或多个处理器和存储器1303代表的存储器的各种电路链接在一起。总线架构还可以将诸如外围设备、稳压器和功率管理电路等之类的各种其他电路链接在一起，这些都是本领域所公知的，因此，本文不再对其进行进一步描述。总线接口提供接口。收发机1302可以是多个元件，即包括发送机和接收机，提供用于在传输介质上与各种其他装置通信的单元。
处理器1301负责管理总线架构和通常的处理，存储器1303可以存储处理器1301在执行操作时所使用的数据。
需要说明的是，该实施例中的终端是与上述图8所示的方法对应的终端，上述各实施例中的实现方式均适用于该终端的实施例中，也能达到相同的技术效果。该终端中，收发机1302与存储器1303，以及收发机1302与处理器1301均可以通过总线接口通讯连接，处理器1301的功能也可以由收发机1302实现，收发机1302的功能也可以由处理器1301实现。在此需要说明的是，本申请实施例提供的上述终端，能够实现上述方法实施例所实现的所有方法步骤，且能够达到相同的技术效果，在此不再对本实施例中与方法实施例相同的部分及有益效果进行具体赘述。
在本申请的一些实施例中，还提供了一种计算机可读存储介质，其上存储有程序，该程序被处理器执行时实现以下步骤：
向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；
根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
该程序被处理器执行时能实现上述测试方法中的所有实现方式，且能达到相同的技术效果，为避免重复，此处不再赘述。
本领域普通技术人员可以意识到，结合本文中所公开的实施例描述的 各示例的单元及算法步骤，能够以电子硬件、或者计算机软件和电子硬件的结合来实现。这些功能究竟以硬件还是软件方式来执行，取决于技术方案的特定应用和设计约束条件。专业技术人员可以对每个特定的应用来使用不同方法来实现所描述的功能，但是这种实现不应认为超出本申请的范围。
所属领域的技术人员可以清楚地了解到，为描述的方便和简洁，上述描述的系统、装置和单元的具体工作过程，可以参考前述方法实施例中的对应过程，在此不再赘述。
在本申请所提供的实施例中，应该理解到，所揭露的装置和方法，可以通过其它的方式实现。例如，以上所描述的装置实施例仅仅是示意性的，例如，所述单元的划分，仅仅为一种逻辑功能划分，实际实现时可以有另外的划分方式，例如多个单元或组件可以结合或者可以集成到另一个系统，或一些特征可以忽略，或不执行。另一点，所显示或讨论的相互之间的耦合或直接耦合或通信连接可以是通过一些接口，装置或单元的间接耦合或通信连接，可以是电性，机械或其它的形式。
所述作为分离部件说明的单元可以是或者也可以不是物理上分开的，作为单元显示的部件可以是或者也可以不是物理单元，即可以位于一个地方，或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本申请实施例方案的目的。
另外，在本申请各个实施例中的各功能单元可以集成在一个处理单元中，也可以是各个单元单独物理存在，也可以两个或两个以上单元集成在一个单元中。
所述功能如果以软件功能单元的形式实现并作为独立的产品销售或使用时，可以存储在一个计算机可读取存储介质中。基于这样的理解，本申请的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的部分可以以软件产品的形式体现出来，该计算机软件产品存储在一个存储介质中，包括若干指令用以使得一台计算机设备(可以是个人计算机，服务器，或者网络设备等)执行本申请各个实施例所述的方法的全部或部分步骤。而前述的存储介质包括：U盘、移动硬盘、ROM、RAM、磁碟或者光盘等 各种可以存储程序代码的介质。
以上所述，仅为本申请的具体实施方式，但本申请的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本申请揭露的技术范围内，可轻易想到变化或替换，都应涵盖在本申请的保护范围之内。因此，本申请的保护范围应以权利要求的保护范围为准。

Claims (30)

  1. 一种测试方法，包括：
    向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；
    根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果。
  2. 如权利要求1所述的方法，其中，
    所述向被测对象进行测试参数配置，执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，包括：执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
  3. 如权利要求2所述的方法，其中，在每轮测试中依次执行所述至少两条测试流程，或者，在每轮测试中并行执行所述至少两条测试流程。
  4. 如权利要求3所述的方法，其中，在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
    向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值；
    根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前测试流程是否通过测试。
  5. 如权利要求4所述的方法，其中，
    在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；
    在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。
  6. 如权利要求4所述的方法，其中，还包括：
    在当前测试流程未通过测试时，结束当前轮的测试；
    在当前测试流程通过测试，且当前测试流程为本轮测试中的最后一个测试流程时，结束当前轮的测试；
    在当前测试流程通过测试，且当前测试流程非本轮测试中的最后一个测试流程时，执行当前测试流程的下一个测试流程的测试。
  7. 如权利要求5或6所述的方法，其中，所述在当前测试流程未通过测试时，结束当前轮的测试之后，基于当前轮的测试结果调整第一测试参数的取值，并再次执行下一轮测试流程。
  8. 如权利要求5或6所述的方法，其中，所述在当前测试流程通过测试，结束当前轮的测试之后，判断是否继续下一轮测试，配置或更新下一轮测试中的测试参数，若继续下一轮测试，则进入下一轮测试并重复以上的流程。
  9. 如权利要求6所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
    在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；
    在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
  10. 如权利要求9所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
    在当前轮的测试结束时，若所有测试流程都通过测试，则输出所述被测对象通过测试的测试结果；
    在当前轮的测试结束时，若存在未通过测试的测试流程，则输出所述被测对象未通过当前轮测试的测试结果。
  11. 如权利要求9所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
    在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
  12. 如权利要求3所述的方法，其中，在每轮测试中并行执行所述至少 两条测试流程时，
    向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后的调整值；
    根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每条测试流程是否通过测试。
  13. 如权利要求12所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
    在当前轮中的任一测试流程未通过测试时，结束当前轮的测试；
    在当前轮中的所有测试流程都通过测试时，结束当前轮的测试。
  14. 如权利要求13所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
    在当前轮的测试结束时，若所有测试流程都通过测试，则判断该轮测试通过；
    在当前轮的测试结束时，若存在未通过测试的测试流程，则判断该轮测试未通过。
  15. 如权利要求13所述的方法，其中，所述根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，还包括：
    在当前轮的测试结束时，输出当前轮中测得的各个性能指标的测试值。
  16. 如权利要求1至15任一项所述的方法，其中，
    所述至少两条测试流程包括第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关；
    其中，所述相关包括以下至少一种：
    正相关；
    负相关；
    第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。
  17. 如权利要求1至15任一项所述的方法，其中，还包括：
    根据被测对象的应用场景与性能指标之间的第一映射关系，确定目标应用场景下的目标性能指标；
    根据被测对象的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；
    生成基于所述目标测试参数进行目标性能指标测量的所述至少两条测试流程。
  18. 如权利要求1所述的方法，其中，根据每条测试流程获得的性能指标的测试值，生成所述被测对象的测试结果，包括：
    将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；
    将所述多边形的中心点与顶点的连线作为刻度线，在所述刻度线上标记对应的性能指标的数值；
    根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；
    根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；
    根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
  19. 如权利要求18所述的方法，其中，所述根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果，包括：
    在所述阈值区域全部包含在所述测试值区域内时，获得所述被测对象通过测试的测试结果，否则，获得所述被测对象未通过测试的测试结果。
  20. 一种测试装置，包括收发机和处理器，其中，
    所述收发机，配置为向被测对象进行测试参数配置；
    所述处理器，配置为执行至少两条测试流程，获得其中每条测试流程的性能指标的测试值，其中，每条测试流程用于测试被测对象的不同性能指标；根据每条测试流程获得的性能指标的测试值，生成所述被测对象的 测试结果。
  21. 如权利要求20所述的测试装置，其中，
    所述处理器，还配置为执行至少一轮测试，其中，在每轮测试中，向被测对象进行测试参数配置并设定性能指标阈值。
  22. 如权利要求21所述的测试装置，其中，
    所述处理器，还配置为在每轮测试中依次执行所述至少两条测试流程，或者，在每轮测试中并行执行所述至少两条测试流程。
  23. 如权利要求22所述的测试装置，其中，
    所述处理器，还配置为在每轮测试中依次执行所述至少两条测试流程时，按照预设的测试流程的测试顺序，依次执行每条测试流程，其中，在执行当前测试流程的过程中，包括：
    向被测对象进行第一测试参数配置并设定第一性能指标阈值，在第二性能指标满足第二性能指标阈值的情况下，执行当前测试流程，获得当前测试流程的第一性能指标的测试值；
    根据所述第一性能指标的测试值和所述第一性能指标阈值，判断当前测试流程是否通过测试。
  24. 如权利要求23所述的测试装置，其中，
    在当前测试流程为本轮测试中的首个测试流程时，所述第一测试参数的取值为初始值或基于前一轮测试结果的调整值；
    在当前测试流程不是本轮测试中的首个测试流程时，所述第一测试参数的取值需要使得前一条测试流程测试结束后所述第二性能指标满足第二性能指标阈值，所述第二性能指标为本轮测试中当前测试流程之前的所有测试流程的性能指标的集合。
  25. 如权利要求22所述的测试装置，其中，
    所述处理器，还配置为在每轮测试中并行执行所述至少两条测试流程时，
    向被测对象进行第二测试参数配置并设定各个测试流程对应的性能指标阈值；并行执行所述至少两条测试流程，获得每条测试流程的性能指标的测试值；其中，所述第二测试参数的取值为初始值或前一轮测试结束后 的调整值；
    根据每条测试流程测得的性能指标的测试值和性能指标阈值，判断每条测试流程是否通过测试。
  26. 如权利要求20至25任一项所述的测试装置，其中，
    所述至少两条测试流程包括第一测试流程和第二测试流程，其中，所述第一测试流程测量的性能指标，与第二测试流程测量的性能指标相关；
    其中，所述相关包括以下至少一种：
    正相关；
    负相关；
    第一测试流程测量的性能指标与第二测试流程测量的性能指标互为结果。
  27. 如权利要求20至25任一项所述的测试装置，其中，
    所述处理器，还配置为根据被测对象的应用场景与性能指标之间的第一映射关系，确定目标应用场景下的目标性能指标；根据被测对象的性能指标与测试参数之间的第二映射关系，确定目标性能指标对应的目标测试参数；生成基于所述目标测试参数进行目标性能指标测量的所述至少两条测试流程。
  28. 如权利要求20所述的测试装置，其中，
    所述处理器，还配置为将每条测试流程测试的性能指标作为多边形的顶点，构建一多边形；将所述多边形的中心点与顶点的连线作为刻度线，在所述刻度线上标记对应的性能指标的数值；根据每个性能指标的性能指标阈值，在所述刻度线上确定出对应的阈值点，并依次连接相邻刻度线上的阈值点，生成性能指标阈值对应的阈值区域；根据每条测试流程获得的性能指标的测试值，在所述刻度线上确定出对应的测试值点，并依次连接相邻刻度线上的测试值点，生成性能指标的测试值对应的测试值区域；根据所述阈值区域是否包含在所述测试值区域内，获得所述被测对象是否通过测试的测试结果。
  29. 一种测试装置，包括：处理器、存储器及存储在所述存储器上并可在所述处理器上运行的程序，所述程序被所述处理器执行时实现如权利要 求1至19任一项所述的测试方法的步骤。
  30. 一种计算机可读存储介质，所述计算机可读存储介质上存储有计算机程序，所述计算机程序被处理器执行时实现如权利要求1至19任一项所述的测试方法的步骤。
PCT/CN2021/109851 2020-07-31 2021-07-30 一种测试方法及设备 Ceased WO2022022717A1 (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US18/006,768 US12019529B2 (en) 2020-07-31 2021-07-30 Testing method and testing device
EP21848961.5A EP4191905A4 (en) 2020-07-31 2021-07-30 TEST METHOD AND DEVICE
JP2023506553A JP7515005B2 (ja) 2020-07-31 2021-07-30 検査方法及び機器

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202010757937.9 2020-07-31
CN202010757937.9A CN112511367B (zh) 2020-07-31 2020-07-31 一种测试方法及设备

Publications (1)

Publication Number Publication Date
WO2022022717A1 true WO2022022717A1 (zh) 2022-02-03

Family

ID=74953461

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2021/109851 Ceased WO2022022717A1 (zh) 2020-07-31 2021-07-30 一种测试方法及设备

Country Status (5)

Country Link
US (1) US12019529B2 (zh)
EP (1) EP4191905A4 (zh)
JP (1) JP7515005B2 (zh)
CN (1) CN112511367B (zh)
WO (1) WO2022022717A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115988524A (zh) * 2022-12-26 2023-04-18 深圳创维数字技术有限公司 网络设备兼容性测试方法、装置、设备及存储介质
CN119544109A (zh) * 2024-11-27 2025-02-28 国网山东省电力公司营销服务中心(计量中心) 一种通信模块功耗与性能并行测试方法及系统

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112511367B (zh) * 2020-07-31 2022-11-15 中国移动通信有限公司研究院 一种测试方法及设备
CN112867054A (zh) * 2021-02-07 2021-05-28 中国移动通信有限公司研究院 测试方法、装置、测试系统及存储介质
CN113360353B (zh) * 2021-05-08 2023-01-06 山东英信计算机技术有限公司 一种测试服务器和云平台
CN114185789A (zh) * 2021-12-13 2022-03-15 中国农业银行股份有限公司 一种测试方法、装置、计算机设备及存储介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080010523A1 (en) * 2006-05-12 2008-01-10 Samik Mukherjee Performance Testing Despite Non-Conformance
CN102821211A (zh) * 2011-06-10 2012-12-12 中兴通讯股份有限公司 通信网元自动化测试方法及装置
CN107992401A (zh) * 2017-11-29 2018-05-04 平安科技（深圳）有限公司 性能测试评价方法、装置、终端设备及存储介质
CN112511367A (zh) * 2020-07-31 2021-03-16 中国移动通信有限公司研究院 一种测试方法及设备

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2365733A1 (en) * 2001-12-20 2003-06-20 Ibm Canada Limited-Ibm Canada Limitee Testing measurements
US8402317B1 (en) * 2005-12-22 2013-03-19 The Math Works, Inc. Viewing multi-dimensional metric data from multiple test cases
US7895565B1 (en) * 2006-03-15 2011-02-22 Jp Morgan Chase Bank, N.A. Integrated system and method for validating the functionality and performance of software applications
ATE548665T1 (de) * 2006-12-04 2012-03-15 Ericsson Telefon Ab L M Verfahren und anordnung für erweiterte zellenidentifikation und zellenpositionsbestimmung
US8345047B2 (en) * 2007-05-30 2013-01-01 Deere & Company Method for displaying performance information for one or more vehicles
JP2009212616A (ja) 2008-02-29 2009-09-17 Ad-Sol Nissin Corp 電力線通信ネットワークにおける伝送路環境評価装置
US9152528B2 (en) * 2010-08-27 2015-10-06 Red Hat, Inc. Long term load generator
US10606726B2 (en) * 2013-08-16 2020-03-31 Keysight Technologies Singapore (Sales) Pte. Ltd. Methods, systems and computer readable media for performing benchmark reference testing of data center and network equipment
WO2015176179A1 (en) 2014-05-18 2015-11-26 Zhou Kai Performance testing system and method
US20160004628A1 (en) * 2014-07-07 2016-01-07 Unisys Corporation Parallel test execution framework for multiple web browser testing
CN104239213B (zh) * 2014-09-29 2017-04-12 北京航空航天大学 一种面向航天器自动化测试的并行测试任务两阶段调度方法
US10387295B1 (en) * 2015-05-05 2019-08-20 Amazon Technologies, Inc. Application testing using multiple context-aware threads
US10489278B2 (en) * 2016-05-16 2019-11-26 Jpmorgan Chase Bank, N.A. Method and system for implementing an automation software testing and packaging framework with entitlements
CN108572918A (zh) * 2018-04-13 2018-09-25 平安普惠企业管理有限公司 性能测试方法、装置、计算机设备及存储介质
US10474564B1 (en) * 2019-01-25 2019-11-12 Softesis Inc. Identifying user interface elements using element signatures
US10496532B1 (en) * 2019-08-14 2019-12-03 Capital One Services, Llc Automatically reconfiguring a performance test environment
CN111104309B (zh) * 2019-11-15 2023-09-29 北京航天长征飞行器研究所 一种综合测试流程快速实现方法
US11392486B1 (en) * 2021-07-09 2022-07-19 Morgan Stanley Services Group Inc. Multi-role, multi-user, multi-technology, configuration-driven requirements, coverage and testing automation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080010523A1 (en) * 2006-05-12 2008-01-10 Samik Mukherjee Performance Testing Despite Non-Conformance
CN102821211A (zh) * 2011-06-10 2012-12-12 中兴通讯股份有限公司 通信网元自动化测试方法及装置
CN107992401A (zh) * 2017-11-29 2018-05-04 平安科技（深圳）有限公司 性能测试评价方法、装置、终端设备及存储介质
CN112511367A (zh) * 2020-07-31 2021-03-16 中国移动通信有限公司研究院 一种测试方法及设备

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP4191905A4 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115988524A (zh) * 2022-12-26 2023-04-18 深圳创维数字技术有限公司 网络设备兼容性测试方法、装置、设备及存储介质
CN119544109A (zh) * 2024-11-27 2025-02-28 国网山东省电力公司营销服务中心(计量中心) 一种通信模块功耗与性能并行测试方法及系统

Also Published As

Publication number Publication date
CN112511367B (zh) 2022-11-15
EP4191905A4 (en) 2024-08-28
CN112511367A (zh) 2021-03-16
JP7515005B2 (ja) 2024-07-11
EP4191905A1 (en) 2023-06-07
JP2023537333A (ja) 2023-08-31
US20230259432A1 (en) 2023-08-17
US12019529B2 (en) 2024-06-25

Similar Documents

Publication Publication Date Title
CN112511367B (zh) 一种测试方法及设备
US10454796B2 (en) Cloud based system and method for managing messages regarding cable test device operation
CN104184617B (zh) 互联设备预加重配置方法、装置、系统及网络设备
CN106133537A (zh) 一种fpga功能模块仿真验证方法及其系统
CN115616372A (zh) 故障注入测试方法和系统
CN107786993A (zh) 一种信号测试方法和装置
CN107293330B (zh) 对随机存取存储器ram进行仿真验证的方法和仿真验证系统
CN108075943A (zh) 测试报文构造方法及装置
CN110334385A (zh) 综合能源系统中央控制器的测试方法、装置及设备
CN116737485A (zh) 信号处理方法、系统、装置、计算机设备和存储介质
CN115529258A (zh) 一种快速定位带宽最优值的方法、系统、装置及介质
CN113259983B (zh) 5g切片测试方法、装置、测试系统及存储介质
CN113225760B (zh) 网络测试方法及设备
CN101778015A (zh) 一种微码测试方法和装置
CN111880754B (zh) 打印设备自动测试方法、介质、计算机设备及系统
CN112769642A (zh) 一种服务器pcie链路的测试方法及相关设备
CN104822157A (zh) 短距离电力通信用微功率无线通信协议一致性测试系统
CN111541589B (zh) 对智能终端的扩展模块接口进行测试的方法、装置和设备
KR101648969B1 (ko) 메시지 기반 테스트를 위한 테스트 서버 및 그 방법
CN107659958B (zh) 一种测试路由器最大功率的方法及系统
CN108370335A (zh) 以太网虚拟连接的实时分布的引擎框架
CN113015114B (zh) 完善终端信息库的方法、装置及计算设备
CN115622916B (zh) 网卡测试方法、装置、设备及存储介质
CN114124761B (zh) 用于带宽一致性验证的电子设备、系统、方法和介质
TW201939985A (zh) 電腦系統及其Wi-Fi測試方法

Legal Events

Date Code Title Description
ENP Entry into the national phase

Ref document number: 2023506553

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 2021848961

Country of ref document: EP

ENP Entry into the national phase

Ref document number: 2021848961

Country of ref document: EP

Effective date: 20230228

NENP Non-entry into the national phase

Ref country code: DE