WO2023193499A1 - 声表面波谐振器及声表面波滤波器 - Google Patents
声表面波谐振器及声表面波滤波器 Download PDFInfo
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- WO2023193499A1 WO2023193499A1 PCT/CN2023/070901 CN2023070901W WO2023193499A1 WO 2023193499 A1 WO2023193499 A1 WO 2023193499A1 CN 2023070901 W CN2023070901 W CN 2023070901W WO 2023193499 A1 WO2023193499 A1 WO 2023193499A1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6489—Compensation of undesirable effects
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
- H03H9/02685—Grating lines having particular arrangements
- H03H9/02763—Left and right side electrically coupled reflectors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02858—Means for compensation or elimination of undesirable effects of wave front distortion
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02992—Details of bus bars, contact pads or other electrical connections for finger electrodes
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14517—Means for weighting
- H03H9/1452—Means for weighting by finger overlap length, apodisation
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14517—Means for weighting
- H03H9/14529—Distributed tap
- H03H9/14532—Series weighting; Transverse weighting
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14538—Formation
- H03H9/14541—Multilayer finger or busbar electrode
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14544—Transducers of particular shape or position
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14544—Transducers of particular shape or position
- H03H9/14591—Vertically-split transducers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/25—Constructional features of resonators using surface acoustic waves
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6406—Filters characterised by a particular frequency characteristic
- H03H9/6413—SAW comb filters
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/46—Filters
- H03H9/64—Filters using surface acoustic waves
- H03H9/6423—Means for obtaining a particular transfer characteristic
- H03H9/643—Means for obtaining a particular transfer characteristic the transfer characteristic being determined by reflective or coupling array characteristics
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Definitions
- Embodiments of the present application relate to the technical field of surface acoustic wave filters, and in particular, to a surface acoustic wave resonator and a surface acoustic wave filter.
- the surface acoustic wave filter is a passive bandpass filter made by utilizing the piezoelectric effect and the physical characteristics of surface acoustic wave propagation. Its function is to filter and delay electrical signals. It has the advantages of small size, stable performance, strong overload capability, small phase distortion, and no need for adjustment. It is widely used in televisions, video recorders, wireless data transmission systems and other fields.
- the surface acoustic wave filter includes a support substrate, a temperature compensation layer and a piezoelectric substrate that are stacked in sequence, and a surface acoustic wave resonator arranged on the piezoelectric substrate.
- the main working principle of the surface acoustic wave resonator is to use the piezoelectric properties of the piezoelectric substrate to input electrical signals to the surface acoustic wave resonator.
- the input electrical signal completes the electrical signal-acoustic signal-electrical signal in the surface acoustic wave resonator. conversion to achieve the goal of filtering unnecessary signals and noise and improving reception quality.
- a temperature compensation layer with an opposite temperature coefficient to the piezoelectric substrate is usually deposited under the piezoelectric substrate.
- the effect requires thinning of the piezoelectric substrate.
- the surface acoustic wave resonator when the thickness of the piezoelectric substrate is close to the wavelength ⁇ of the acoustic wave propagating in the surface acoustic wave resonator (that is, the thickness of the piezoelectric substrate is less than 10 ⁇ ), the surface acoustic wave resonator will generate a transverse resonance mode, and the transverse resonance mode This will cause sharp transmission zeros to appear in the passband of the surface acoustic wave filter, thereby reducing the performance of the surface acoustic wave filter.
- the present application provides an embodiment of a surface acoustic wave resonator and a surface acoustic wave filter to solve the technical problem that the surface acoustic wave resonator generates a transverse resonance mode.
- Embodiments of the present application provide a surface acoustic wave resonator, including an interdigital electrode.
- the interdigital electrode includes a first bus bar and a second bus bar arranged oppositely.
- the first bus bar is connected to a first bus bar along a first direction.
- the second bus bar is connected to a plurality of first false fingers and a plurality of second finger strips alternately arranged along the first direction;
- a plurality of first finger strips correspond to a plurality of first false fingers one by one, the corresponding first finger strips and the first false fingers are located on the same straight line, and the first finger strips and There is a first gap between the first false fingers;
- the plurality of second finger strips correspond to the plurality of second false fingers one by one, the corresponding second finger strips and the second false fingers are located on the same straight line, and the second finger strips and There is a second gap between the second false fingers;
- an end of the first finger bar away from the first bus bar and an end of the second finger bar away from the second bus bar are The distance between one end is a finger aperture, a plurality of first finger apertures and a plurality of second finger apertures form a plurality of finger apertures, and at least some of the finger apertures in the plurality of finger apertures are The apertures of the strips are not equal.
- the surface acoustic wave resonator of the embodiment of the present application changes at least part of the finger apertures in the interdigital electrodes so that at least part of the plurality of finger apertures have different finger apertures.
- the existence of different finger apertures on the surface wave resonator can reduce the lateral resonance mode, thereby achieving the effect of the surface acoustic wave resonator suppressing the lateral resonance mode.
- the first direction is perpendicular to the length direction of the first finger strips, and a plurality of first finger strips and a plurality of second finger strips are alternately arranged along the first direction.
- the apertures of the plurality of finger strips formed by the strips first increase and then decrease or show a wave-like increasing and decreasing trend.
- At least one of the first bus bar and the second bus bar is an n-order fractal structure, and the n-order fractal structure includes 2 n-1 first-order fractals connected in sequence.
- Structure, n is a positive integer;
- the first-order fractal structure includes a connected first connecting bar and a second connecting bar. An end of the first connecting bar away from the second connecting bar and an end of the second connecting bar away from the first connecting bar. A connection line at one end is located between the first bus bar and the second bus bar;
- the angle between the first connecting strip and the first straight line is a first deflection angle
- the angle between the second connecting strip and the first straight line is a second deflection angle
- the first straight line is perpendicular to In the first finger bar, the first deflection angle and the second deflection angle are both acute angles;
- the 2 n-1 first-order fractal structures in the n-order fractal structure form 2 n-1 first deflection angles and 2 n-1 second deflection angles, and among the 2 n-1 first deflection angles
- the angle range of at least part of the first deflection angle is 2°-16°
- the angle range of at least part of the second deflection angles among the 2 n-1 second deflection angles is 2°-16°.
- one of the first bus bar and the second bus bar is the n-order fractal structure, and the other one is a linear structure.
- the first bus bar is the n-order fractal structure
- the second bus bar is the linear structure
- the surface acoustic wave resonator includes two interdigital electrodes in a cascade structure, the two interdigital electrodes share a second bus bar, and each of the two interdigital electrodes includes a first bus bar. strips, and the first bus bars of the two interdigital electrodes are located on both sides of the second bus bar.
- the first bus bar and the second bus bar are both n-order fractal structures, and the first bus bar and the second bus bar are symmetrical along the first center line, so The first centerline is perpendicular to the first finger strip and passes through the center of the interdigital electrode.
- both the first bus bar and the second bus bar have the n-order fractal structure, and multiple connecting bars of the first bus bar and the second bus bar are mutually connected. Corresponds to parallel.
- the lengths of each of the first false fingers are the same, and the lengths of at least some of the first finger strips among the plurality of first finger strips are unequal;
- Each of the second false fingers has the same length, and at least some of the second finger strips among the plurality of second finger strips have unequal lengths.
- it further includes two reflection gratings, the two reflection gratings are arranged at both ends of the interdigital electrode in a direction perpendicular to the first finger strip, and the two reflection gratings There is a space between the grid and the interdigital electrode, and the two reflection grids are used to reflect the acoustic wave signal leaked to both ends of the interdigital electrode back to the interdigital electrode.
- the number of the interdigital electrodes is multiple, the plurality of interdigital electrodes are arranged in series in a direction perpendicular to the first finger bar, and the two reflection gratings are arranged in series along a direction perpendicular to the first finger strip.
- the first finger bar is provided at both ends of a plurality of interdigital electrodes connected in series, and there is a space between the two reflection gratings and the plurality of interdigital electrodes connected in series.
- Embodiments of the present application also provide a surface acoustic wave filter.
- the surface acoustic wave filter includes a support substrate, a temperature compensation layer and a piezoelectric substrate that are stacked in sequence, and a surface acoustic wave filter provided on the piezoelectric substrate.
- a surface acoustic wave resonator, the surface acoustic wave resonator is the surface acoustic wave resonator described in any of the above solutions.
- the beneficial effects of the surface acoustic wave filter in the embodiment of the present application are the same as the beneficial effects of the above-mentioned surface acoustic wave resonator, and will not be described again here.
- the surface acoustic wave resonators and surface acoustic wave filters provided by the present application have Other technical problems that can be solved, other technical features included in the technical solution, and the beneficial effects brought by these technical features will be further described in detail in the specific implementation modes.
- Figure 1 is a schematic structural diagram of several first bus bars and second bus bars of the surface acoustic wave resonator in the embodiment of the present application;
- Figure 2 is a schematic structural diagram of a surface acoustic wave resonator in an embodiment of the present application
- Figure 3 is a test comparison chart between the surface acoustic wave resonator in Figure 2 and the surface acoustic wave resonator with unsuppressed transverse resonance mode;
- Figure 4 is another structural schematic diagram of a surface acoustic wave resonator in an embodiment of the present application.
- Figure 5 is a test comparison chart between the surface acoustic wave resonator in Figure 4 and the surface acoustic wave resonator with unsuppressed transverse resonance mode;
- Figure 6 is another structural schematic diagram of a surface acoustic wave resonator in an embodiment of the present application.
- Figure 7 is a test comparison chart between the surface acoustic wave resonator in Figure 6 and the surface acoustic wave resonator with unsuppressed transverse resonance mode;
- Figure 8 is another structural schematic diagram of a surface acoustic wave resonator in an embodiment of the present application.
- Figure 9 is a schematic structural diagram of a surface acoustic wave resonator with two interdigital electrodes in a cascade structure
- Figure 10 is another structural schematic diagram of a surface acoustic wave resonator with two interdigital electrodes in a cascade structure
- Figure 11 is a schematic structural diagram of a surface acoustic wave resonator formed by two interdigital electrodes connected in series;
- Figure 12 is another structural schematic diagram of a surface acoustic wave resonator in an embodiment of the present application.
- Figure 13 is another structural schematic diagram of a surface acoustic wave resonator with two interdigital electrodes in a cascade structure.
- a temperature compensation layer with an opposite temperature coefficient to the piezoelectric substrate is usually deposited under the piezoelectric substrate.
- the effect requires thinning of the piezoelectric substrate.
- the thickness of the piezoelectric substrate is close to the wavelength ⁇ of the acoustic wave propagating in the surface acoustic wave resonator (that is, the thickness of the piezoelectric substrate is less than 10 ⁇ )
- the surface acoustic wave resonator will excite more complex acoustic wave modes.
- the transverse resonance mode has a significant amplitude between the forward and reverse resonance peaks of the surface acoustic wave resonator.
- the transverse resonance mode close to the forward and reverse resonance peaks will cause surface acoustic wave filtering. Sharp transmission zeros appear in the passband of the filter, thereby reducing the performance of the surface acoustic wave filter.
- embodiments of the present application change at least part of the finger apertures in the interdigital electrodes so that at least part of the plurality of finger apertures have different finger apertures.
- Different finger apertures on the surface acoustic wave resonator have different It is possible to reduce the transverse resonant mode, thereby achieving the effect of the surface acoustic wave resonator suppressing the transverse resonant mode.
- Figure 1 is a schematic structural diagram of the first bus bar and the second bus bar of the surface acoustic wave resonator in the embodiment of the present application
- Figure 2 is a schematic structural diagram of the surface acoustic wave resonator in the embodiment of the present application
- Figure 3 It is a test comparison diagram of the surface acoustic wave resonator in Figure 2 and the surface acoustic wave resonator with unsuppressed transverse resonance mode
- Figure 4 is another structural schematic diagram of the surface acoustic wave resonator in the embodiment of the present application
- Figure 5 is The test comparison diagram between the surface acoustic wave resonator in Figure 4 and the surface acoustic wave resonator with unsuppressed transverse resonance mode
- Figure 6 is another structural schematic diagram of the surface acoustic wave resonator in the embodiment of the present application
- Figure 7 is a diagram Test comparison diagram of the surface acoustic wave resonator in 6 and the surface acoustic
- the surface acoustic wave resonator provided by the embodiment of the present application includes an interdigital electrode 100.
- the interdigital electrode 100 includes a first bus bar 110 and is connected to the first bus bar 110.
- a plurality of first finger strips 111 and a plurality of second false fingers 112 are alternately arranged along the first direction on the first bus bar 110.
- the plurality of first false fingers 121 and the plurality of second finger strips 122 are arranged on the second bus bar 110.
- the bus bars 120 are alternately arranged along the first direction. That is to say, the interdigital electrode 100 includes a first bus bar 110 and a second bus bar 120.
- the first bus bar 110 is connected to a plurality of first finger bars 111 and a plurality of second false fingers alternately arranged along the first direction. 112.
- the second bus bar 120 is connected to a plurality of first false fingers 121 and a plurality of second finger strips 122 that are alternately arranged along the first direction.
- the first bus bar 110 and the second bus bar 120 are arranged oppositely, and one end of the first bus bar 110 is flush with one end of the second bus bar 120, and the other end of the first bus bar 110 is flush with the second bus bar 120. The other end of the bus bar 120 is flush.
- the plurality of first finger strips 111 correspond to the plurality of first false fingers 121 one-to-one, the corresponding first finger strips 111 and the first false fingers 121 are located on the same straight line, and the first finger strips 111 and the first false fingers 121 There is a first gap between them, the plurality of second finger strips 122 correspond to the plurality of second false fingers 112 one by one, the corresponding second finger strips 122 and the second false fingers 112 are located on the same straight line, and the second finger strips There is a second gap between 122 and the second false finger 112 . There is a space between the adjacent first finger strips 111 and the second false fingers 112. As shown in Figure 6, the distance between the first finger strips 111 and the second false fingers 112 is P. Similarly, the first false finger The distance between 121 and the second finger 122 is also P. The distance P between the first finger 111 and the second false finger 112 can determine the resonant frequency of the surface acoustic wave resonator.
- the finger aperture is a, multiple first finger apertures 111 and multiple second finger apertures 122 form multiple finger apertures, and at least some of the multiple finger apertures are finger apertures.
- the existence of different finger apertures on the surface acoustic wave resonator can reduce the lateral resonance mode, thereby achieving the effect of the surface acoustic wave resonator suppressing the lateral resonance mode.
- the first direction is the direction of the x-axis, that is, the first direction is perpendicular to the length direction of the first finger bar 111, and the length direction of the first finger bar 111 is the same as the direction of the y-axis.
- the apertures of the plurality of finger strips formed by a plurality of adjacent first finger strips 111 and a plurality of second finger strips 122 alternately arranged along the first direction first increase and then decrease.
- the trend may be a wave-like increasing or decreasing trend.
- the finger apertures formed by a plurality of adjacent first finger strips 111 and a plurality of second finger strips 122 alternately arranged along the first direction show a trend of first increasing and then decreasing. That is to say, the apertures of multiple fingers arranged sequentially along the first direction first increase and then decrease to achieve weighting of the finger apertures.
- the weighting of the finger apertures in the surface acoustic wave resonator can reduce the lateral Resonant mode, which reduces the resonance of the transverse mode.
- the apertures of a plurality of finger strips arranged sequentially along the first direction show a trend of first increasing and then decreasing.
- the trend of first increasing and then decreasing includes first increasing, then being flat and then decreasing.
- the structure of the surface acoustic wave resonator in Figure 2 can also reduce the transverse resonance mode, that is, reduce the resonance of the transverse mode.
- the apertures of multiple finger strips arranged sequentially along the first direction first increase, then decrease, then increase, and then decrease, that is, they show a wave-shaped increase and decrease trend.
- This structure also achieves Without the weighting of the finger aperture, the weighting of the finger aperture in the surface acoustic wave resonator can reduce the transverse resonance mode, that is, the resonance of the transverse mode can be reduced.
- the apertures of the plurality of finger strips arranged sequentially along the first direction also show a wave-shaped increasing and decreasing trend.
- the embodiment of the present application realizes modulation of the finger aperture of the surface acoustic wave resonator by performing a fractal design on at least one of the first bus bar 110 and the second bus bar 120 , that is, by performing a fractal design on the first bus bar 110
- a fractal design is performed on at least one of the second bus bars 120 to realize that the apertures of the plurality of finger bars arranged sequentially along the first direction first increase and then decrease, or have a wave-shaped increasing and decreasing trend.
- the fractal design method for at least one of the first bus bar 110 and the second bus bar 120 is as follows: as shown in FIG. 1 , at least one of the first bus bar 110 and the second bus bar 120 has an n-order fractal structure,
- the n-order fractal structure includes 2 n-1 first-order fractal structures 113 connected in sequence.
- the first-order fractal structure 113 includes a connected first connecting bar 1131 and a second connecting bar 1132. One end of the first connecting bar 1131 is away from the second connecting bar 1132 and one end of the second connecting bar 1132 is away from the first connecting bar 1131.
- connection line is located between the first bus bar 110 and the second bus bar 120 , that is to say, the opening of the area formed by the cooperation of the first connecting bar 1131 and the second connecting bar 1132 faces the first bus bar 110 and the second bus bar between 120.
- the angle between the first connecting bar 1131 and the first straight line 1133 is the first deflection angle ⁇ 1
- the angle between the second connecting bar 1132 and the first straight line 1133 is the second deflection angle ⁇ 2
- the first straight line 1133 is perpendicular to the first finger bar 111, and the first deflection angle and the second deflection angle are both acute angles. That is to say, the first straight line 1133 is parallel to the direction of the x-axis.
- the 2 n-1 first-order fractal structures 113 in the n-order fractal structure form 2 n-1 first deflection angles and 2 n-1 second deflection angles, that is to say, each first-order structure has a first deflection angle. angle and a second deflection angle, then 2 n- 1 first-order fractal structures 113 have 2 n-1 first deflection angles and 2 n-1 second deflection angles, and 2 n-1 first deflection angles
- the angle range of at least part of the first deflection angles is 2°-16°
- the angle range of at least part of the second deflection angles of the 2 n-1 second deflection angles is 2°-16°
- the angle range is 2°-16°.
- the setting of the first deflection angle of ° and the second deflection angle in the angle range of 2°-16° can deflect the sound wave propagation direction in the surface acoustic wave resonator to the arrangement direction of the first finger strips 111, thereby causing the surface acoustic wave to resonate.
- the sound wave propagation direction in the device tends to the arrangement direction of the first finger bars 111, that is, the sound wave propagation direction in the surface acoustic wave resonator is close to the arrangement direction of the first finger bars 111, which is beneficial to reducing the lateral component of the sound wave.
- the The fractal design of at least one of the first bus bar 110 and the second bus bar 120 can modulate the finger aperture of the surface acoustic wave resonator, which further reduces the lateral resonance mode, thereby realizing the surface acoustic wave resonator to suppress the lateral The effect of resonant modes.
- the direction in which the first finger strips 111 are arranged is the same as the direction in which the x-axis is located.
- the fractal design of at least one of the first bus bar 110 and the second bus bar 120 can form a plurality of first deflection angles in the angle range of 2°-16° and second deflection angles in the angle range of 2°-16°. angle to suppress the generation of the transverse component of the sound wave, thereby reducing the transverse component of the sound wave. It can also modulate the finger aperture of the surface acoustic wave resonator to suppress the resonance of the transverse mode and reduce the transverse resonance mode, thus making The surface acoustic wave resonator in the embodiment of the present application can better suppress the transverse resonant mode. It suppresses the transverse resonant mode in dual modes and can achieve better results.
- the first bus bar 110 and the second bus bar 120 of the surface acoustic wave resonator in Figure 2 are both first-order fractal structures 113, which have a first deflection angle and a second deflection angle.
- the angle range of the first deflection angle is 2°-16°
- the angle range of the second deflection angle is 2°-16°
- the apertures of the plurality of finger strips arranged sequentially along the first direction first increase and then decrease. trend.
- the surface acoustic wave resonator in Figure 2 is tested and compared with the surface acoustic wave resonator whose transverse resonant mode is not suppressed.
- the test comparison chart is shown in Figure 3.
- the solid line part 1 in Figure 3 is the case where the transverse resonant mode is not suppressed.
- the dotted line 2 shows the situation of the surface acoustic wave resonator in Figure 2. Among them, undulating peaks appear in the solid line part 1. These undulating peaks are transverse resonance modes. It can be seen from Figure 3 that the surface acoustic wave resonator in Figure 2 The wave resonator can better suppress the resonance of the transverse mode and reduce the transverse resonance mode, achieving the effect of the surface acoustic wave resonator in suppressing the transverse resonance mode.
- the first bus bar 110 and the second bus bar 120 of the surface acoustic wave resonator in Figure 4 are both second-order fractal structures 114, which have two first deflection angles and two second deflection angles.
- one of the first deflection angles has an angle range of 2°-16°
- the other first deflection angle has an angle range of 0°
- one of the second deflection angles has an angle range of 2°-16°
- the other first deflection angle has an angle range of 2°-16°.
- the angle range of the two deflection angles is 0°
- the apertures of the plurality of finger strips arranged sequentially along the first direction show a trend of first increasing, then remaining flat, and then decreasing.
- the surface acoustic wave resonator in Figure 4 is tested and compared with the surface acoustic wave resonator whose transverse resonant mode is not suppressed.
- the test comparison chart is shown in Figure 5.
- the solid line part 1 in Figure 5 is the case where the transverse resonant mode is not suppressed.
- the dotted line 3 shows the situation of the surface acoustic wave resonator in Figure 4. Among them, undulating peaks appear in the solid line part 1. These undulating peaks are transverse resonance modes.
- the acoustic surface wave resonator in Figure 5 can also better suppress the resonance of the transverse mode and reduce the transverse resonance mode, achieving the effect of the surface acoustic wave resonator in suppressing the transverse resonance mode.
- both the first bus bar 110 and the second bus bar 120 of the surface acoustic wave resonator are second-order fractal structures 114, which have two first deflection angles and two second deflection angles. , and the angle range of the two first deflection angles is 2°-16°, and the angle range of the two second deflection angles is 2°-16°.
- This structure does not have a flatly arranged finger strip aperture in the middle, so its Compared with the surface acoustic wave resonator in Figure 4, it can better suppress the resonance of the transverse mode and reduce the transverse resonance mode.
- the first bus bar 110 and the second bus bar 120 of the surface acoustic wave resonator in Figure 6 are both third-order fractal structures 115, which have four first deflection angles and four second deflection angles.
- the angle range of the four first deflection angles is 2°-16°
- the angle range of the four second deflection angles is 2°-16°
- the apertures of multiple finger strips arranged sequentially along the first direction are in the form of The trend of first increasing, then decreasing, then increasing, and then decreasing is a wave-shaped increasing and decreasing trend.
- the surface acoustic wave resonator in Figure 6 is tested and compared with the surface acoustic wave resonator whose transverse resonant mode is not suppressed.
- the test comparison chart is shown in Figure 7.
- the solid line part 1 in Figure 7 is the case where the transverse resonant mode is not suppressed.
- the dotted line 4 shows the situation of the surface acoustic wave resonator in Figure 6. Among them, undulating peaks appear in the solid line part 1. These undulating peaks are transverse resonance modes. It can be seen from Figure 7 that the acoustic surface wave resonator in Figure 7 The wave resonator can better suppress the resonance of the transverse mode and reduce the transverse resonance mode, achieving the effect of the surface acoustic wave resonator in suppressing the transverse resonance mode.
- one of the first bus bar 110 and the second bus bar 120 has an n-order fractal structure, and the other has a linear structure.
- the first bus bar 110 has a third-order fractal structure 115
- the second bus bar 120 has a linear structure.
- the first bus bar 110 has a first-order fractal structure 113 or a second-order fractal structure 114, etc.
- the structure also has a plurality of first deflection angles ranging from 2° to 16° and a plurality of second deflection angles ranging from 2° to 16°, and a plurality of finger strip apertures arranged sequentially along the first direction.
- first bus bar 110 and the second bus bar 120 is designed in a linear structure to facilitate the cascade connection of the two interdigital electrodes 100 .
- the first bus bar 110 has an n-order fractal structure
- the second bus bar 120 has a linear structure
- the surface acoustic wave resonator includes two interdigital electrodes 100 in a cascade structure, and the two interdigital electrodes 100 share a A second bus bar 120
- each of the two interdigital electrodes 100 includes a first bus bar 110
- the first bus bars 110 of the two interdigital electrodes 100 are located on both sides of the second bus bar 120 .
- the first bus bars 110 of the two interdigital electrodes 100 are located at both ends of the surface acoustic wave resonator along the length direction of the first finger bar 111, and the first bus bars 110 of the two interdigital electrodes 100 are arranged oppositely.
- the two interdigital electrodes 100 share a second bus bar 120 .
- the first bus bar and the second bus bar are n-order fractal structures, and multiple connecting bars of the first bus bar and the second bus bar are correspondingly parallel to each other.
- the first bus bar 110 and the second bus bar 120 are both three-order fractal structures 115.
- the first bus bar 110 and the second bus bar 120 are both connected by eight bus bars.
- the eight bus bars of 110 are parallel to the eight bus bars of the second bus bar 120 from left to right.
- This structure also has a plurality of first deflection angles ranging from 2° to 16°, a plurality of second deflection angles ranging from 2° to 16°, and a plurality of finger apertures arranged sequentially along the first direction.
- the first bus bar 110 and the second bus bar 120 may both be a first-order fractal structure 113 or a second-order fractal structure 114 or the like.
- the design of the first bus bar 110 and the second bus bar 120 as an n-order fractal structure also facilitates the cascade connection of the two interdigital electrodes 100 .
- the surface acoustic wave resonator includes two interdigital electrodes 100 in a cascade structure.
- the two interdigital electrodes 100 share a second bus bar 120, and each of the two interdigital electrodes 100 includes a first bus bar.
- the first bus bar 110 of the two interdigital electrodes 100 is located on both sides of the second bus bar 120 .
- the first bus bars 110 of the two interdigital electrodes 100 are located at both ends of the surface acoustic wave resonator along the length direction of the first finger bar 111, and the first bus bars 110 of the two interdigital electrodes 100 are arranged oppositely.
- the two interdigital electrodes 100 share a second bus bar 120, and the plurality of connection bars of the first bus bar 110 and the second bus bar 120 of the two interdigital electrodes 100 are parallel to each other.
- This structure can also better suppress the resonance of the transverse mode, reduce the transverse resonance mode, and achieve the effect of suppressing the transverse resonance mode of the surface acoustic wave resonator.
- the first bus bar 110 is a first-order fractal structure 113
- the second bus bar 120 is a linear structure
- the surface acoustic wave resonator includes a cascade structure.
- the first bus bar 110 is a third-order fractal structure 115
- the second bus bar 120 is a linear structure
- the surface acoustic wave resonator includes two interdigital electrodes 100 in a cascade structure.
- the two interdigital electrodes 100 share a second bus bar 120.
- the two interdigital electrodes 100 each include a first bus bar 110, and the first bus bars 110 of the two interdigital electrodes 100 are located on both sides of the second bus bar 120. side.
- both the first bus bar 110 and the second bus bar 120 are n-order fractal structures.
- the first bus bar 110 and the second bus bar 120 are symmetrical along the first center line, and the first center line is vertical. on the first finger strip 111 and passes through the center of the interdigital electrode 100 . This structure makes the structure of the surface acoustic wave resonator more regular.
- the lengths of each first false finger 121 are the same, the lengths of at least some of the first finger strips 111 among the plurality of first finger strips 111 are unequal, and the lengths of each second false finger 112 are the same. At least some of the second finger strips 112 have different lengths. That is, the finger aperture is changed by changing the length of the first finger bar 111 and the length of the second finger bar 122, wherein the distance between the first gap and the second gap remains unchanged.
- the surface acoustic wave resonator further includes two reflection gratings 200 .
- the two reflection gratings 200 are along the direction perpendicular to the first finger bar 111 (that is, the direction of the x-axis) or along the first bus bar 110
- the extension direction is set at both ends of the interdigital electrode 100, and there is a space between the two reflection gratings 200 and the interdigital electrode 100.
- the two reflection gratings 200 are used to transmit the acoustic wave signal leaked to both ends of the interdigital electrode 100. Reflected back to the interdigital electrode 100.
- the reflection grating 200 includes a third bus bar and a fourth bus bar disposed oppositely and a grid disposed between the third bus bar and the fourth bus bar.
- the number of interdigital electrodes 100 is multiple, and the plurality of interdigital electrodes 100 are arranged in series in a direction perpendicular to the first finger strip 111 (that is, the direction of the x-axis).
- Two reflective The grid 200 is disposed at both ends of a plurality of interdigital electrodes 100 connected in series along a direction perpendicular to the first finger bar 111 (that is, the direction of the x-axis), and the two reflection grids 200 are connected to a plurality of interdigital electrodes connected in series. There is space between 100 and 100.
- the number of the interdigital electrodes 100 is two.
- the two interdigital electrodes 100 are arranged in series.
- the two reflection gratings 200 are arranged on two electrodes in a direction perpendicular to the first finger bar 111 . There are gaps at both ends of the series-connected interdigital electrodes 100 and between the two reflection gratings 200 and the two series-connected interdigital electrodes 100 .
- Embodiments of the present application also provide a surface acoustic wave filter.
- the surface acoustic wave filter includes a support substrate, a temperature compensation layer and a piezoelectric substrate that are stacked in sequence, and an acoustic surface provided on the piezoelectric substrate.
- Wave resonator that is to say, the surface acoustic wave filter provided by the embodiment of the present application includes a support substrate, a temperature compensation layer, a piezoelectric substrate, and a surface acoustic wave resonator disposed on the piezoelectric substrate.
- the surface acoustic wave resonator is a surface acoustic wave resonator of any of the above solutions
- the piezoelectric substrate is a material with piezoelectric effect
- the temperature coefficient of the temperature compensation layer is opposite to the temperature coefficient of the piezoelectric substrate.
- the piezoelectric substrate is a lithium tantalate substrate.
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- Acoustics & Sound (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
Description
Claims (11)
- 一种声表面波谐振器,其特征在于,包括叉指电极,所述叉指电极包括相对设置的第一汇流条和第二汇流条,所述第一汇流条连接有沿第一方向交替排布的多个第一指条和多个第二假指;所述第二汇流条连接有沿所述第一方向交替排布的多个第一假指和多个第二指条;多个所述第一指条与多个所述第一假指一一对应,相对应的所述第一指条与所述第一假指位于同一直线上,且所述第一指条和所述第一假指之间具有第一间隙;多个所述第二指条与多个所述第二假指一一对应,相对应的所述第二指条与所述第二假指位于同一直线上,且所述第二指条和所述第二假指之间具有第二间隙;在任意相邻的所述第一指条和所述第二指条中,所述第一指条远离所述第一汇流条的一端与所述第二指条远离所述第二汇流条的一端之间的间距为指条孔径,多个所述第一指条和多个所述第二指条形成多个所述指条孔径,且多个所述指条孔径中至少部分所述指条孔径不相等。
- 根据权利要求1所述的声表面波谐振器,其特征在于,所述第一方向与所述第一指条的长度方向垂直,沿所述第一方向交替排布的多个所述第一指条和多个所述第二指条形成的多个所述指条孔径呈先增大后减小的趋势或呈波浪形增减趋势。
- 根据权利要求2所述的声表面波谐振器,其特征在于,所述第一汇流条和所述第二汇流条中的至少一个为n阶分形结构,所述n阶分形结构包括2 n-1个一阶分形结构依次连接形成,n为正整数;所述一阶分形结构包括相连接的第一连接条和第二连接条,所述第一连接条远离所述第二连接条的一端和所述第二连接条远离所述第一连接条的一端的连线位于所述第一汇流条和所述第二汇流条之间;所述第一连接条与第一直线的夹角为第一偏向角,所述第二连接条与所述第一直线的夹角为第二偏向角,所述第一直线垂直于所述第一指条,所述第一偏向角和所述第二偏向角均为锐角;所述n阶分形结构中的2 n-1个一阶分形结构形成2 n-1个第一偏向角和2 n-1个第二偏向角,2 n-1个所述第一偏向角中至少部分所述第一偏向角的角度范围 为2°-16°,2 n-1个所述第二偏向角中至少部分所述第二偏向角的角度范围为2°-16°。
- 根据权利要求3所述的声表面波谐振器,其特征在于,所述第一汇流条和所述第二汇流条中的一个为所述n阶分形结构,另一个为直线型结构。
- 根据权利要求4所述的声表面波谐振器,其特征在于,所述第一汇流条为所述n阶分形结构,所述第二汇流条为所述直线型结构;所述声表面波谐振器包括呈级联结构的两个所述叉指电极,两个所述叉指电极共用一个第二汇流条,两个所述叉指电极各包括一个所述第一汇流条,且两个所述叉指电极的所述第一汇流条位于所述第二汇流条的两侧。
- 根据权利要求3所述的声表面波谐振器,其特征在于,所述第一汇流条和所述第二汇流条均为所述n阶分形结构,所述第一汇流条和所述第二汇流条沿第一中心线对称,所述第一中心线垂直于所述第一指条且经过所述叉指电极的中心。
- 根据权利要求3所述的声表面波谐振器,其特征在于,所述第一汇流条和所述第二汇流条均为所述n阶分形结构,所述第一汇流条和所述第二汇流条的多个连接条相互对应平行。
- 根据权利要求1所述的声表面波谐振器,其特征在于,各所述第一假指的长度相同,多个所述第一指条中至少部分所述第一指条的长度不相等;各所述第二假指的长度相同,多个所述第二指条中至少部分所述第二指条的长度不相等。
- 根据权利要求1所述的声表面波谐振器,其特征在于,还包括两个反射栅,两个所述反射栅沿垂直于所述第一指条的方向设置于所述叉指电极的两端,且两个所述反射栅与所述叉指电极之间均具有间隔空间,两个所述反射栅用于将泄露到叉指电极的两端的声波信号反射回所述叉指电极。
- 根据权利要求9所述的声表面波谐振器,其特征在于,所述叉指电极的数量为多个,多个所述叉指电极沿垂直于所述第一指条的方向依次串联设置,两个所述反射栅沿垂直于所述第一指条的方向设置于多个依次串联的叉指电极的两端,且两个所述反射栅与多个依次串联的叉指电极之间均具有间隔空间。
- 一种声表面波滤波器,其特征在于,包括依次层叠设置的支撑衬底、 温度补偿层和压电衬底,以及设置于所述压电衬底上的声表面波谐振器,所述声表面波谐振器为权利要求1-10任一项所述的声表面波谐振器。
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| US18/852,492 US20250226813A1 (en) | 2022-04-08 | 2023-01-06 | Surface acoustic wave resonator and surface acoustic wave filter |
| EP23784063.2A EP4507195A4 (en) | 2022-04-08 | 2023-01-06 | SURFACE ACOUSTIC WAVE RESONATOR AND SURFACE ACOUSTIC WAVE FILTER |
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| CN202210367887.2A CN114710134A (zh) | 2022-04-08 | 2022-04-08 | 声表面波谐振器及声表面波滤波器 |
| CN202210367887.2 | 2022-04-08 |
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| US (1) | US20250226813A1 (zh) |
| EP (1) | EP4507195A4 (zh) |
| CN (1) | CN114710134A (zh) |
| WO (1) | WO2023193499A1 (zh) |
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| CN119171862A (zh) * | 2024-02-06 | 2024-12-20 | 上海馨欧集成微电有限公司 | 一种声波谐振器、声波滤波器及声波滤波器模组 |
| WO2025156718A1 (zh) * | 2024-01-26 | 2025-07-31 | 华为技术有限公司 | 滤波器、射频芯片及电子设备 |
| WO2026045577A1 (zh) * | 2024-08-28 | 2026-03-05 | 华为技术有限公司 | 声表面波谐振器、滤波器、通信芯片及电子设备 |
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| CN114268296A (zh) * | 2021-12-28 | 2022-04-01 | 深圳飞骧科技股份有限公司 | 一种声表面波滤波器 |
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| CN121173250A (zh) * | 2025-11-21 | 2025-12-19 | 天通瑞宏科技有限公司 | 一种声表面波滤波系统 |
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| CN119171862A (zh) * | 2024-02-06 | 2024-12-20 | 上海馨欧集成微电有限公司 | 一种声波谐振器、声波滤波器及声波滤波器模组 |
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Also Published As
| Publication number | Publication date |
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| CN114710134A (zh) | 2022-07-05 |
| US20250226813A1 (en) | 2025-07-10 |
| EP4507195A1 (en) | 2025-02-12 |
| EP4507195A4 (en) | 2026-04-15 |
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