WO2024259630A1 - 检测焊接激光的功率的方法和激光焊接系统 - Google Patents

检测焊接激光的功率的方法和激光焊接系统 Download PDF

Info

Publication number
WO2024259630A1
WO2024259630A1 PCT/CN2023/101704 CN2023101704W WO2024259630A1 WO 2024259630 A1 WO2024259630 A1 WO 2024259630A1 CN 2023101704 W CN2023101704 W CN 2023101704W WO 2024259630 A1 WO2024259630 A1 WO 2024259630A1
Authority
WO
WIPO (PCT)
Prior art keywords
power
laser
welding
preset
samples
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2023/101704
Other languages
English (en)
French (fr)
Inventor
景志勇
赵俊
段敏敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Contemporary Amperex Technology Co Ltd
Original Assignee
Contemporary Amperex Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Contemporary Amperex Technology Co Ltd filed Critical Contemporary Amperex Technology Co Ltd
Priority to EP23837542.2A priority Critical patent/EP4506668A4/en
Priority to PCT/CN2023/101704 priority patent/WO2024259630A1/zh
Priority to CN202380060964.2A priority patent/CN119731516B/zh
Priority to US18/537,848 priority patent/US20240424610A1/en
Publication of WO2024259630A1 publication Critical patent/WO2024259630A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/20—Bonding
    • B23K26/21—Bonding by welding
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03—Observing, e.g. monitoring, the workpiece
    • B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70—Auxiliary operations or equipment
    • B23K26/702—Auxiliary equipment
    • B23K26/705—Beam measuring devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by any single one of main groups B23K1/00 - B23K28/00
    • B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by any single one of main groups B23K1/00 - B23K28/00 relating to investigating the properties, e.g. the weldability, of materials
    • B23K31/125—Weld quality monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Definitions

  • the present application relates to the field of laser welding, and in particular to a method for detecting the power of a welding laser and a laser welding system.
  • laser welding is widely used in various industries such as the automotive industry, electronics industry, and biomedicine. As the application scope of laser welding becomes wider and deeper, the requirements for the quality of laser welding are also getting higher and higher.
  • One of the important parameters that determines the quality of laser welding is the power of the laser emitted by the laser during the laser welding process.
  • the present application provides a method for detecting the power of a welding laser and a laser welding system, which can detect the power of the welding laser more accurately.
  • a method for detecting the power of a welding laser comprising obtaining at least one power sample, wherein the power sample is obtained by sampling the power of the welding laser emitted by the laser at every preset time period.
  • the method may also include obtaining a plurality of power samples within a preset power range from the at least one power sample.
  • the method may also include processing the plurality of power samples within the preset power range to obtain a power detection result.
  • processing the multiple power samples within the preset power range may include: averaging the multiple power samples to obtain an average power, wherein the power detection result includes the average power.
  • a power value may be used to reflect the average level of the output power of the laser and indicate the quality of the laser emitted by the laser.
  • processing the plurality of power samples within the preset power range may include: determining at least one of a minimum power and a maximum power of the plurality of power samples, wherein the power The detection result includes at least one of the minimum power and the maximum power.
  • processing the multiple power samples within the preset power range may include: averaging the powers of the multiple power samples except for the at least one of the minimum power and the maximum power to obtain a corrected average power, wherein the power detection result includes the corrected average power.
  • the average power is corrected by removing at least one of the minimum power and the maximum power, for example, power samples with large fluctuations within the preset power range may be excluded, thereby obtaining more accurate average power data.
  • the method further includes obtaining the welding condition performed by the laser based on the position welded by the welding laser; and determining the preset power range based on the welding condition.
  • the preset power range can be flexibly determined based on the situation of the position to be welded by the laser, so that the preset power range conforms to the actual situation.
  • the method further includes: determining a power collection standard value according to the welding working conditions; and determining a lower limit value and an upper limit value of the preset power range respectively for the power collection standard value.
  • the method further includes: determining whether the number of the plurality of power samples within the preset power range meets the data volume requirement; and sending the power detection result in response to the number of the plurality of power samples meeting the data volume requirement.
  • the method further includes: determining whether the number of the plurality of power samples within the preset power range has reached an upper limit of data volume; and in response to the number of the plurality of power samples reaching the upper limit of data volume, stopping sampling the power of the laser for welding emitted by the laser.
  • the method further comprises obtaining the working condition of welding performed by the laser according to the position welded by the welding laser, and determining the upper limit of the data volume according to the working condition of welding.
  • the upper limit of the data volume of the laser sample can be flexibly set according to the working condition of the laser.
  • the method further comprises determining the upper limit of the data volume according to the duration of the laser emitting a laser once and the preset time period, thereby determining the upper limit of the data volume that can cover the entire duration of the laser emitting a laser.
  • the method further comprises determining the upper limit of the data volume according to the duration of the laser emitting a laser, the time when the output power of the laser decreases, and the preset time period.
  • the upper limit of the data volume that can exclude the time when the output power of the laser decreases can be determined.
  • the method further comprises determining the upper limit of the data volume according to the duration of the laser power within the preset power range and the preset time period, thereby determining the upper limit of the data volume that can exclude the ramp-up time and the ramp-down time of the laser output power.
  • the method further includes generating information indicating that the power of the laser exceeds the power threshold in response to a power sample obtained by sampling the power of the laser being greater than a power threshold, wherein the power threshold is greater than or equal to an upper limit of the preset power range.
  • the method further includes obtaining repair welding information indicating that the laser performs repair welding in response to the power samples obtained by sampling the power of the laser within a threshold time period being less than the lower limit of the preset power range, wherein the threshold time period is determined according to the ramp time of the output power of the laser.
  • the method further includes: obtaining at least one power sample, wherein the power sample is obtained by sampling the power of the laser emitted by the laser based on the repair welding information at every preset time period; obtaining multiple repair welding power samples within the preset power range in the at least one repair welding power sample; and processing the multiple repair welding power samples within the preset power range to obtain a repair welding power detection result.
  • the power of the welding laser can be detected during the repair welding process, and the laser power of the repair welding can be monitored.
  • the method may further include: in response to the power samples obtained by sampling the power of the laser within a threshold time period being less than the lower limit of the preset power range, obtaining information indicating that welding performed by the laser has failed, wherein the threshold time period is determined according to the ramp time of the output power of the laser.
  • a laser welding system which includes a laser, a galvanometer, a controller and a host computer.
  • the laser can be configured to emit a laser for welding and include a communication interface.
  • the galvanometer can be configured to receive the laser from the laser and manipulate the laser for welding.
  • the controller may include a communication interface and is configured to be coupled to the communication interface of the laser via a communication line through the communication interface to receive the power of the laser for welding emitted by the laser from the laser.
  • the host computer can be configured to be communicatively coupled to the controller and receive the power detection result from the controller.
  • the controller can be configured to perform some or all of the steps in the above method.
  • the controller receives information about the power of the laser emitted by the laser from the laser through the communication interface and the communication line.
  • the power of the laser emitted by the laser can be conveniently obtained by utilizing the communication interface provided by the laser, and therefore, for example, the convenience of system construction and configuration can be increased, and the cost of the entire system can be controlled.
  • a laser welding system includes a laser, a galvanometer, a galvanometer control unit, a power analog quantity acquisition unit, a controller, and a host computer.
  • the laser can be configured to emit
  • the galvanometer may be configured to receive the laser from the laser.
  • the galvanometer control unit may be configured to control the galvanometer to manipulate the laser for welding.
  • the power analog quantity acquisition unit may be configured to acquire an analog quantity representing the power of the laser for welding emitted by the laser.
  • the controller may be configured to receive an analog quantity representing the power of the laser for welding emitted by the laser from the power analog quantity acquisition unit through a wire, and obtain the power of the laser for welding emitted by the laser according to the analog quantity.
  • the host computer may be configured to be communicatively coupled to the controller and receive the power detection result from the controller.
  • the controller may be configured to perform some or all of the steps in the above method.
  • the controller by receiving the analog quantity representing the power of the laser from the power analog quantity acquisition unit through the wire by the controller and obtaining the power of the laser according to the analog quantity, the time for analog-to-digital conversion and encoding of the laser power and sending the encoded data through the communication interface via the communication line can be saved, thereby improving the processing speed of the system.
  • the analog quantity representing the power of the laser is directly obtained by the controller through the wire, and since the analog quantity has not been processed by other third parties, the reliability and accuracy of the obtained data can be improved.
  • a non-transitory computer-readable storage medium stores instructions, and when the instructions are executed by a processor, some or all of the steps in the above method are executed.
  • a computer program product includes instructions. When the instructions are executed by a processor, part or all of the steps in the above method are executed.
  • FIG1 shows an example graph of laser power during a laser emission
  • FIG2 shows a schematic structural diagram of a laser welding system 100 according to some embodiments of the present application
  • FIG3 shows a schematic structural diagram of a laser welding system 200 according to some other embodiments of the present application.
  • FIG4 shows a flow chart of a method for detecting the power of a welding laser according to some embodiments of the present application
  • FIG5 shows an example graph of laser power in conjunction with a method for detecting power of a welding laser according to an embodiment of the present application
  • FIG6 shows a flow chart of a method for detecting the power of a welding laser according to other embodiments of the present application.
  • FIG7 shows a flow chart of a method for detecting the power of a welding laser according to other embodiments of the present application.
  • FIG8 is a flow chart showing a method for detecting the power of a welding laser according to other embodiments of the present application.
  • FIG9 is a flow chart showing a method for detecting the power of a welding laser according to other embodiments of the present application.
  • FIG. 10 shows a general hardware environment 1000 to which the method of the present application can be applied according to an embodiment of the present application.
  • Laser welding system 100 Laser 110; output optical path 111; optical splitter 112; photoelectric converter 113; communication interface 114; communication line 115; Galvanometer 120; laser output optical fiber 121; communication cable 122; Controller 130; Communication interface 131; Host computer 140; Communication line 141; Laser welding system 200; Laser 210; output optical path 211; optical splitter 212; photoelectric converter 213; Galvanometer 220; laser output optical fiber 221; Controller 230; communication interface 231; input terminal 232; Galvanometer control unit 250; communication cable 251; communication cable 252; Power analog quantity acquisition unit 260; wire 261; output terminal 262; Host computer 240; communication line 241.
  • the term "and/or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships.
  • a and/or B can represent: A exists alone, A and B exist at the same time, and B exists alone.
  • the character "/" in this article generally indicates that the associated objects before and after are in an "or" relationship.
  • the term “plurality” refers to more than two (including two).
  • Figure 1 shows an example graph of the laser power during a laser emission.
  • the horizontal axis of the coordinate axis represents the time of laser emission
  • the vertical axis of the coordinate axis represents the power of the laser.
  • the power of the laser can be sampled in the sampling time period as shown in FIG1.
  • the sampling time period of the laser power can be set to avoid the ramp-up stage T1 and the drop stage T3 of the laser power, so as to sample only the laser power in the stable stage T2.
  • the ideal sampling time period of the laser power can be set to start after the ramp-up stage T1 of the laser power and end before the drop stage T3 of the laser power.
  • the laser power ramp-up phase T1 the stable phase T2, and the decreasing phase T3 may be difficult to determine and may also change due to various factors, it is difficult to accurately set the laser power sampling period and obtain a relatively accurate laser power.
  • the laser power may fluctuate violently even in the stable phase T2.
  • the power samples obtained within the time frame may still include power samples with mutations that deviate from the stable emission power. Analyzing such power samples may result in erroneous laser power detection results.
  • one or more embodiments of the present application provide a method for detecting the power of a welding laser, which applies a preset power range to power samples of laser welding and only obtains power samples within the preset power range during the laser power detection process. By processing the power samples within the preset power range, a more accurate power detection result can be obtained.
  • the method for detecting the power of welding laser disclosed in the embodiment of the present application can be applied to laser welding systems in various industries.
  • the method of the embodiment of the present application can be applied to achieve the effect of obtaining more accurate power detection results.
  • the method for detecting the power of a welding laser disclosed in the embodiment of the present application can be applied to various types of laser welding systems.
  • the laser welding system 100 may include a laser 110, a galvanometer 120, a controller 130 and a host computer 140.
  • the laser 110 is configured to emit a laser for welding.
  • the laser 110 in the embodiment of the present application can be various types of lasers, for example, a carbon dioxide laser, a fiber laser, a YAG laser, a semiconductor laser, etc.
  • the power of the laser output by the laser 110 can be in the range of several hundred watts to several kilowatts.
  • a beam splitter 112 in order to obtain the power of the laser output by the laser 110, for example, can be set in the output optical path 111 of the laser 110.
  • the beam splitter 112 can guide a small part of the laser to the photoelectric converter 113 and the photoelectric converter 113 converts the intensity (i.e., power) of the laser into the amplitude of the electrical signal, thereby obtaining the power of the laser emitted by the laser during the laser welding process.
  • the beam splitter 112 can be, for example, a semi-transparent and semi-reflective mirror, and a small part (e.g., 0.2%-0.5%) of the laser is reflected or transmitted to the photoelectric converter 113 and the rest of the laser is emitted by transmission or reflection.
  • the power of the laser emitted by the laser 110 can be obtained by amplifying the laser power obtained by the photoelectric converter 113 by a corresponding multiple according to the proportion of the laser part reflected by the beam splitter 112 in the total laser power.
  • the photoelectric converter 113 includes, for example, a photomultiplier tube, a photodiode, a photocell, a CCD, and a CMOS.
  • the laser 110 further includes a communication interface 114.
  • the laser 110 can be coupled to the controller 130 via a communication line 115.
  • the communication interface 114 of the laser 110 can be, for example, an Ethernet interface or an industrial Ethernet interface and the communication line 115 can be an Ethernet cable or an industrial Ethernet cable.
  • the laser 110 can receive control commands from the controller 130 and send information to the controller 130.
  • the laser 110 can send information about the power of the laser emitted by the laser 110 to the controller 130 through the communication interface 114.
  • the communication interface and the communication line may include various adapters and circuit systems implemented in software and/or hardware to enable communication between two entities using wired or wireless protocols.
  • the wired protocol is, for example, any one or more of a serial port protocol, a parallel port protocol, an Ethernet protocol, a USB protocol, or other wired communication protocols.
  • the wireless protocol is, for example, any IEEE 802.11 Wi-Fi protocol, a cellular network communication protocol, etc.
  • the galvanometer 120 is configured to receive laser light from the laser 110 and manipulate the laser light for welding.
  • the galvanometer 120 can receive laser light from the laser 110 through, for example, a laser output optical fiber 121.
  • the galvanometer 120 can perform optical processing such as focusing on the laser light from the laser 110 and emit the laser light to the desired welding position by reflection or refraction, thereby welding the welding position.
  • the reflective mirror surface of the galvanometer 120 rotates or translates in one or two dimensions under electrostatic/piezoelectric/electromagnetic drive to adjust the reflection position of the laser light.
  • the galvanometer 120 can also be connected to the communication interface 114 of the laser 110 through a communication cable 122 to receive control signals such as controlling the welding position from the laser 110.
  • the controller 130 can, for example, control the laser 110 and receive information from the laser 110.
  • the controller 130 can be, for example, a PLC, an industrial PC, a microcontroller, a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a programmable chip, etc.
  • the controller 130 includes a communication interface 131 and is configured to be coupled to the laser 110 via the communication line 115 through the communication interface 131.
  • the communication interface 131 can, for example, be an Ethernet interface or an industrial Ethernet interface. Through the communication interface 131, the controller 130 can send control commands to the laser 110 and receive information from the laser 110. In an embodiment of the present application, the controller 130 can receive information about the power of the laser emitted by the laser 110 from the laser 110.
  • the controller 130 can obtain at least one power sample, which is obtained by sampling the power of the laser at every preset time period.
  • the controller 130 can obtain multiple power samples within a preset power range among these at least one power samples.
  • the controller 130 can process the obtained multiple power samples within the preset power range to obtain a power detection result.
  • only power samples within the expected power range can be obtained and power samples outside the expected power range can be excluded, thereby achieving the effect of obtaining a more accurate power detection result.
  • the operations performed by the controller 130 are further explained below with reference to multiple embodiments of the present application.
  • the host computer 140 is configured to be communicatively coupled to the controller 130.
  • the host computer 140 can be connected to the communication interface 131 of the controller 130, and send information to the controller 130 or receive information from the controller 130.
  • the host computer 140 can receive power detection results from the controller 130.
  • the host computer 140 can also communicate with other computing devices (e.g., computers).
  • the host computer 140 is communicatively coupled to the controller 130 and/or the storage device and transmits and receives information to and from these devices.
  • the host computer 140 refers to a device that sends commands to the controller 130 for control and receives information from the controller 130.
  • the host computer 140 can be, for example, an industrial computer, a workstation, a touch screen, etc.
  • the controller 130 receives information about the power of the laser emitted by the laser 110 from the laser 110 through the communication interface and the communication line.
  • the power of the laser emitted by the laser 110 can be conveniently obtained by utilizing the communication interface provided by the laser 110, and thus, for example, the convenience of system construction and configuration can be increased, and the cost of the entire system can be controlled.
  • the beam splitter 112 and the photoelectric converter 113 are shown as being inside the laser 110, those skilled in the art will appreciate that in other embodiments of the present application, one or more of the beam splitter 112 and the photoelectric converter 113 may be outside the laser 110 or at other locations and may be independent components, as long as the beam splitter 112 can guide the laser to the photoelectric converter 113 so that the photoelectric converter 113 can obtain the power of the laser and send it out through the communication interface 114.
  • the laser welding system 200 may include a laser 210, a galvanometer 220, a controller 230, a host computer 240, a galvanometer control unit 250, and a power analog acquisition unit 260.
  • the laser 210 is configured to emit laser light for welding, and may be various types of lasers.
  • a beam splitter 212 and a photoelectric converter 213 for converting the intensity of the laser light into an electrical signal may be provided in the output optical path 211 of the laser 210.
  • the galvanometer 220 is configured to receive laser light from the laser 210 through, for example, a laser output optical fiber 221 and manipulate the laser light for welding.
  • the laser welding system 200 shown in FIG. 3 further includes a galvanometer control unit 250.
  • the galvanometer control unit 250 may be communicatively coupled to the controller 230 via a communication cable 251 to receive a control signal from the control unit 230.
  • the galvanometer control unit 250 is configured to control the galvanometer 220 to manipulate the laser light for welding.
  • the galvanometer control unit 250 may be communicatively coupled to the galvanometer 220 via a communication cable 252, and control the galvanometer 220 to manipulate the laser light for welding according to the control signal received from the control unit 230.
  • the laser welding system 200 shown in FIG. 3 further includes a power analog quantity acquisition unit 260.
  • the power analog quantity acquisition unit 260 is configured to acquire an analog quantity representing the power of the laser used for welding emitted by the laser 210.
  • the power analog quantity acquisition unit 260 can, for example, be coupled to the photoelectric converter 213 and receive an electrical signal representing the power of the laser from the photoelectric converter 213. According to the electrical signal, the power analog quantity acquisition unit 260 can generate an analog quantity representing the power of the laser used for welding emitted by the laser 210.
  • the power analog quantity acquisition unit 260 can send the analog quantity representing the power of the laser used for welding emitted by the laser to the controller 230 via the wire 261.
  • the output terminal 262 of the power analog quantity acquisition unit 260 can be connected to the input terminal 232 of the controller 230 via the wire 261.
  • the controller 230 includes a communication interface 231 and is configured to communicate with the The communication interface 231 is coupled to the galvanometer control unit 250 via the communication line 251. Through the communication interface 231, the controller 230 can send various control commands to the galvanometer control unit 250.
  • the controller 230 includes an input terminal 232, and can receive an analog quantity representing the power of the laser for welding emitted by the laser 210 from the power analog quantity acquisition unit 260 through the input terminal 232 via the wire 261.
  • the controller 230 can obtain the power of the laser for welding emitted by the laser 210 according to the analog quantity.
  • the controller 230 may perform similar operations on the power of the laser emitted by the laser 210 to obtain a power detection result. Thus, only power samples within the expected power range may be obtained and power samples outside the expected power range may be excluded, thereby achieving the effect of obtaining a more accurate power detection result.
  • the operations performed by the controller 230 will be further explained below with reference to multiple embodiments of the present application.
  • the host computer 240 is configured to be communicatively coupled to the controller 230.
  • the host computer 240 can also be communicatively coupled to other computing devices and/or storage devices and send and receive information with these devices.
  • the controller 230 receives the analog quantity representing the power of the laser from the power analog quantity acquisition unit 260 through the wire 261 and obtains the power of the laser according to the analog quantity.
  • the time for analog-to-digital conversion and encoding of the laser power and sending the encoded data through the communication interface via the communication line can be saved, thereby improving the processing speed of the system.
  • the controller 230 directly obtains the analog quantity representing the power of the laser through the wire 261. Since the analog quantity is not processed by other third parties, the reliability and accuracy of the obtained data can be improved.
  • the galvanometer 220 may receive a control signal from the controller 230 similar to the laser welding system 100 shown in FIG. 2 , without providing a galvanometer control unit 250.
  • FIG. 4 shows a flow chart of a method for detecting the power of a welding laser according to some embodiments of the present application
  • FIG. 5 shows an example graph of laser power combined with the method for detecting the power of a welding laser according to an embodiment of the present application.
  • step S410 at least one power sample is obtained, wherein the power sample is obtained by sampling the power of the welding laser emitted by the laser at every preset time period.
  • the horizontal axis of the coordinate axis of the curve graph of FIG5 represents the time of laser emission
  • the vertical axis represents the power of the laser.
  • the laser starts to emit at time zero, and from the start of the laser emission, the power of the laser can be sampled every preset time period T4 to obtain at least one power sample.
  • the reference numerals S1 to S12 in FIG5 represent the power samples obtained, and the time interval between each power sample is T4.
  • power samples S1 to S3 are in the climbing stage T1 of the laser power
  • power samples S3 to S10 are in the stable stage T2 of the laser power
  • power samples S11 to S12 are in the descending stage T2 of the laser power.
  • the controller 130 may receive real-time laser power communication data from the laser 110, and take out those power samples at intervals of a preset time period from the laser power communication data to obtain at least one power sample. In other embodiments of the present application, the controller 130 may command the laser 110 to sample and send the laser power communication data at that time every preset time period, and use the received laser power as at least one power sample.
  • the controller 230 may receive the real-time analog quantity of the laser power from the power analog quantity acquisition unit 260, and take out those analog quantities of the laser power at intervals of a preset time period from the analog quantities, and obtain at least one power sample based on the analog quantity samples taken out. In other embodiments of the present application, the controller 230 may instruct the power analog quantity acquisition unit 260 to sample the laser power at every preset time period and provide the analog quantity of the laser power at that time once through the wire 261, and obtain at least one power sample based on the provided analog quantity.
  • a plurality of power samples within a preset power range are obtained from at least one power sample.
  • the preset power range may be set to a value from power k1 to power k2, wherein power k1 is the lower limit value of the preset power range, and power k2 is the upper limit value of the preset power range.
  • the powers of power samples S1 to S3 in the ramp-up phase T1 of the laser power and power samples S11 and S12 in the drop phase T3 of the laser power are all less than power k1 and are therefore outside the preset power range k1 to k2.
  • step S420 a plurality of power samples S4 , S5 , S7 , S9 and S10 within a preset power range may be obtained.
  • the controllers 130 and 230 may determine whether each power sample obtained by sampling is within a preset power range, and obtain the power samples determined to be "yes" as multiple power samples within the preset power range.
  • step S430 the multiple power samples obtained within the preset power range are processed to obtain a power detection result.
  • the multiple power samples obtained can be processed by the controller 130 and 230 to obtain a power detection result.
  • various processing can be performed on the power samples, and an example of the processing performed on the power samples will be further described below.
  • the power curve of the laser and the number of power samples shown in FIG. 5 are schematic.
  • the power curve of the laser can be determined according to actual conditions, and the number of power samples can be several to several hundred according to the actual time length of the laser emission and the length of the preset time period set.
  • the time length of the laser emission can be 1 second to several seconds
  • the length of the preset time period can be several microseconds to several hundred microseconds.
  • the number of power samples obtained by sampling can be tens to hundreds, and the number of power samples within the preset power range can also be tens to hundreds.
  • step S430 the processing performed on the plurality of acquired power samples in step S430 is described.
  • processing a plurality of power samples within a preset power range may include averaging the plurality of power samples to obtain an average power.
  • the power detection result includes the average power.
  • Average power refers to a value obtained by summing the power values of multiple power samples and dividing the sum by the number of power samples.
  • the controller 130 or 230 can sum the power values of each power sample in the multiple power samples one by one by accumulating, and count the number of power samples to obtain the number of power samples, and divide the sum by the number of power samples to obtain the average power.
  • a power value can be used to reflect the average level of the output power of the laser and indicate the quality of the laser light emitted by the laser.
  • processing multiple power samples within a preset power range may include determining at least one of a minimum power and a maximum power of the multiple power samples.
  • the power detection result may include at least one of the minimum power and the maximum power.
  • the minimum power and maximum power of a power sample refer to the minimum and maximum values of the power of the multiple power samples obtained.
  • a power sample in multiple power samples can be compared with another power sample by the controller 130 or 230, and the smaller power sample of the two can be retained. Afterwards, the controller 130 or 230 compares the smaller power sample with other power samples that have not yet been compared, and retains the smaller power sample of the two. For all power samples within the preset power range, the controller 130 or 230 can determine the minimum power of the multiple power samples obtained. Similarly, by comparing power samples with each other and retaining a larger power sample, the controller 130 or 230 can ultimately determine the maximum power.
  • the controller 130 or 230 may arrange the powers of multiple power samples in order from small to large or from large to small, and determine at least one of the minimum power and the maximum power based on the sequentially arranged power samples.
  • the minimum power of the power sample can be determined, only the maximum power of the power sample can be determined, or both the minimum power and the maximum power of the power sample can be determined.
  • the minimum power and the maximum power of the determined power samples are also within the preset power range.
  • the minimum power and the maximum power of the power samples it is possible to determine, for example, that the power samples are The extreme values, distribution and fluctuations within the preset power range, and the minimum power and maximum power may continue to be used in other processes as described below.
  • processing the plurality of power samples within the preset power range may include averaging the powers in the plurality of power samples except at least one of the minimum power and the maximum power to obtain a corrected average power.
  • the power detection result includes the corrected average power.
  • the power value of each power sample in a plurality of power samples can be summed up one by one by the controller 130 or 230 in a cumulative manner, and the number of power samples is counted to obtain the number of power samples.
  • at least one of the minimum power and the maximum power of the power sample can be determined by the controller 130 or 230.
  • the result of the summation is deducted from at least one of the minimum power and the maximum power by the controller 130 or 230, and the obtained value is divided by the value of deducting 1 (in the case of deducting one of the minimum power and the maximum power) or deducting 2 (in the case of deducting both the minimum power and the maximum power) from the number of power samples, thereby obtaining a corrected average power.
  • the average power is corrected by removing at least one of the minimum power and the maximum power. For example, power samples with large fluctuations within a preset power range (ie, the minimum power and/or the maximum power) may be excluded, thereby obtaining more accurate average power data.
  • the method for detecting the power of a welding laser further includes step 401, in which the working condition of welding performed by the laser is determined according to the position welded by the welding laser.
  • the method may also include step S402, in which a preset power range is determined based on the working condition of welding.
  • the position where the welding laser is welded may refer to the position where the weld is located, that is, the position where the two welded parts intersect.
  • the welded positions may include: pole ear welding, bus welding, shell welding, explosion-proof valve welding, etc. Different welding positions may put forward different requirements for the welding laser.
  • pole ear welding requires the welding depth to penetrate the pole ear and weld the pole ear and the lower electrode together.
  • Shell welding requires the laser to form a continuous and firm weld to connect the two parts of the shell, and the welding laser cannot penetrate the shell to avoid damaging the battery body.
  • the working condition of the laser welding refers to the working condition that the laser is to achieve when the laser is used for welding.
  • the working condition of the laser may include at least one of the following: the power requirement of the welding laser, the duration of the laser emitted by the laser, the repetition frequency of the laser, the number of repetitions of the laser, the power stability of the welding laser, etc. As described above, the working condition of the laser for welding will also be different for different positions welded by the welding laser.
  • the working condition of the laser can be determined according to the position welded by the welding laser.
  • the working condition of the laser can be determined based on the working capacity of the laser itself and the welding requirements such as welding material, welding temperature, weld depth, weld length, etc. obtained from the information of the welding position. For example, for welds with a high melting point of the welding material, a high welding temperature, or a large weld depth, for example, for the outer surface of the battery, the welding material must be welded at a high melting point, a high welding temperature, or a large weld depth. For welding the top seam of the shell, the power requirement of the welding laser may be higher.
  • the preset power range can be determined according to the power requirement of the welding laser, so that the preset power range meets the power requirement of the welding laser.
  • the duration of the laser emitted by the laser may be longer. Due to the working capacity limitations of the laser itself, in order to achieve this duration, it may be necessary to control the emission power of the laser accordingly.
  • the preset power range can be determined according to the duration of the laser emitted by the laser, so that the laser can continuously emit at the power of the preset power range for a corresponding time.
  • the preset power range can be determined according to the repetition frequency and repetition number of the laser emitted by the laser, so that the laser can continuously emit at the power of the preset power range for a corresponding frequency and number of times.
  • the width of the preset power range can also be determined according to the working conditions of the welding performed by the laser. For example, under working conditions where the power stability of the welding laser is not required to be high, such as for the welding of the battery shell, the width of the preset power range can be set to be wider. For example, in the case where the duration of the laser emitted by the laser is long, such as for the welding of the explosion-proof valve of the battery, the width of the preset power range can also be set to be wider in consideration of the fluctuation and attenuation of the laser emission power.
  • the preset power range may be determined in combination with multiple parameters in the working conditions of the laser.
  • the preset power range may be determined in combination with the power requirement of the welding laser and the duration of the laser light emitted by the laser, so that the laser can continuously emit power within the preset power range that meets the power requirement for a corresponding time.
  • the controllers 130 and 230 may determine the working condition of the welding performed by the laser according to the position welded by the welding laser, and determine the preset power range according to the determined working condition. In another embodiment of the present application, the controllers 130 and 230 may determine the preset power range through the above operation according to the user input that reflects the position welded by the welding laser and/or directly reflects the working condition of the laser.
  • the preset power range can be flexibly determined according to the working conditions to be achieved by the laser, so that the preset power range conforms to the actual situation.
  • determining the preset power range based on the working conditions of the welding performed by the laser in step S402 may include determining the power collection standard value based on the working conditions of the welding performed by the laser. Thereafter, in step S402, the lower limit value and the upper limit value of the preset power range may be determined for the power collection standard value, respectively.
  • the power collection standard value refers to a value used as a standard for determining a preset power range.
  • the power collection standard value may be increased by a certain value to determine the upper limit of the preset power range, and the power collection standard value may be decreased by a certain value to determine the lower limit of the preset power range.
  • the power collection standard value may also be determined based on the working conditions of the welding performed by the laser, which will not be described in detail here. In an embodiment of the present application, the power collection standard value may be approximately equal to the power requirement of the welding laser.
  • the values that are increased and decreased from the power collection standard value, respectively, may be different from each other and may be determined according to actual needs.
  • the size of the increased and decreased values may also be determined according to the working conditions of the laser, which will not be described in detail here. State.
  • the process of determining the power collection standard value and the preset power range can be simplified and the setting flexibility can be increased.
  • steps S401 and S402 are optional steps.
  • the method according to the embodiment of the present application may not include steps S401 and S402, and in this case, the default preset power range may be directly used or the preset power range may be input by the user.
  • steps S410, S420, and S430 may be performed sequentially. That is, the controllers 130 and 230 first collect multiple power samples in step S410. After the multiple power samples are collected, the controllers 130 and 230 obtain multiple power samples within a preset power range from the power samples in step S420. Afterwards, the controllers 130 and 230 process the obtained multiple power samples together in step S430.
  • steps S410, S420 and S430 may be interspersed and repeated. That is, the controllers 130 and 230 sample and obtain a power sample in step S410, and then try to obtain a power sample within a preset power range in step S420. At this time, if the power sample collected in step S410 is not within the preset range, the power sample cannot be obtained in step S420. Afterwards, the controllers 130 and 230 process the sample obtained in step S420 in step S430 and obtain an intermediate power detection result. Afterwards, the controllers 130 and 230 return to step S410, continue to sample the power of the laser, and perform steps S420 and S430 on this power sample. Repeating this process, after completing steps S420 and S430 on the last power sample, the controllers 130 and 230 obtain the power detection result.
  • steps S410, S420 and S430 may be partially executed sequentially and the other parts may be repeatedly executed interspersed, which will not be described in detail here.
  • the method for detecting the power of a welding laser may further include step S440, in which a power detection result is sent.
  • the power detection result can be sent from the controllers 130 and 140 to the host computers 140 and 240.
  • the host computers 140 and 240 can store the power detection results, display the power detection results to the user, analyze the power detection results, or send the power detection results to other devices.
  • the power detection results can be sent to the production management system (MES).
  • MES production management system
  • the stored power detection results can be used to trace the specific circumstances of this welding later. For example, when looking for the cause of the welding problem or when studying and improving the welding process, the laser power of this welding can be found from the stored power detection results.
  • By analyzing a power detection result it is possible to check whether there is a problem with the quality of this welding. By analyzing multiple power detection results, the differences between multiple weldings can be compared.
  • the power detection results may also be sent from the controllers 130 and 140 to other computers, servers, and the like.
  • the sent power detection results can be used for analysis to improve the utilization value of the power detection results.
  • step S435 may be included before step S440, in which it is determined whether the number of the plurality of power samples meets the data volume requirement.
  • the power detection result is generated by processing multiple power samples, and when the number of power samples used to generate the power detection result is small, it may indicate that the power detection result is less accurate, less representative, or the corresponding welding time is too short to be recorded, etc. Therefore, a basic data volume requirement can be set for the number of power samples, and only the power detection results that meet the data volume requirement are sent.
  • the data volume requirement can be set according to actual needs. For example, the data volume requirement can be set to 10. In this case, only the power detection results obtained by processing more than 10 power samples are sent out.
  • the data volume requirement can also be set to 50, 100, etc.
  • step S440 when it is determined that the number of power samples corresponding to the power detection result meets the data volume requirement, the method proceeds to step S440, and the power detection result is sent in this step.
  • step S436 when it is determined that the number of power samples corresponding to the power detection result does not meet the data amount requirement, the method proceeds to step S436, and the power detection result is not sent in this step.
  • the number of power detection results sent can be reduced, and sending power detection results that have no value can be avoided.
  • Steps S610, S620 and S630 in Figure 6 correspond to steps S410, S420 and S430 of Figure 4, respectively, and are therefore not described in detail again.
  • step S610 at least one power sample is obtained in step S610, wherein the power sample is obtained by sampling the power of the laser at every preset time period, and a power sample within a preset power range is obtained in step S620.
  • step S625 may also be included, in which it is determined whether the number of multiple power samples within the preset power range reaches the upper limit of the data volume.
  • a data volume upper limit may be set for the number of power samples within the preset power range, and power samples exceeding the data volume upper limit are no longer collected or processed.
  • the data volume upper limit may be set according to actual needs. For example, the data volume upper limit may be set to 300. In this case, when the number of acquired power samples within the preset power range reaches 300, multiple power samples within the preset power range are no longer acquired, thereby avoiding an excessive increase in the number of power samples to be processed by the controllers 130 and 230 .
  • the method returns to step S610 and continues to sample the laser power in this step.
  • step S630 when it is determined that the number of power samples corresponding to the power detection result reaches the upper limit of the data amount, the method proceeds to step S630 and stops sampling the power of the laser light for welding emitted by the laser.
  • the working condition of the welding performed by the laser can be determined according to the position welded by the welding laser, and the upper limit of the data volume can be determined according to the working condition of the welding performed by the laser.
  • a higher upper limit of the data volume can be set under the corresponding working conditions, so as to obtain more data for analysis.
  • a higher upper limit of the data volume can be set under the corresponding working conditions, so as to obtain more comprehensive welding laser power information for the weld.
  • a lower upper limit of the data volume can be set under the corresponding working conditions, so as to avoid damage to the photoelectric converter due to long-term operation.
  • the upper limit of the data volume of the laser sample can be flexibly set according to the working conditions of the laser.
  • the upper limit of the amount of data can be determined based on the duration of the laser emitting a laser once and the preset time period. For example, the duration of the laser emitting a laser once can be divided by the preset time period, and the upper limit of the amount of data can be determined based on the obtained quotient.
  • the quotient obtained by dividing the duration of the laser emitting a laser once by the preset time period represents the maximum number of power samples that can be obtained in the entire laser emission time period.
  • the upper limit of the amount of data of the power samples thus obtained can cover the entire duration of the laser emitting the laser, thereby avoiding data loss.
  • the upper limit of the amount of data that can cover the entire duration of the laser emitting laser light can be determined.
  • the upper limit of the data volume can be determined according to the duration of the laser emitting a laser, the time of the decline of the output power of the laser, and the preset time period. As described with reference to Figures 1 and 5, before the laser emission ends, the power of the laser will experience a decline stage T3, that is, in this stage, it will drop from the power of the stable emission to zero power. The power sample in the decline stage T3 of the laser power may not be within the preset power range and therefore will not be processed in step S630 even if it is sampled in step S610.
  • the upper limit of the data volume can be determined according to the quotient obtained by dividing the difference between the duration of the laser emitting a laser and the decline time of the output power of the laser by the preset time period.
  • the difference obtained by subtracting the decline time of the output power of the laser from the duration of the laser emitting a laser once is the length of time without the decline stage of the laser power.
  • the quotient obtained by dividing the difference obtained in this way by the preset time period represents the maximum number of power samples that can be obtained in the time period of the laser emission after the decline stage T3 is removed.
  • the upper limit of the data volume of the power sample thus obtained can exclude the decline stage T3 of the laser power, reduce the amount of data obtained, and reduce the processing burden and cost.
  • the upper limit of the data amount that can exclude the fall time of the laser output power can be determined.
  • the upper limit of the data volume can be determined according to the duration of the laser power within the preset power range and the preset time period.
  • the laser power will first go through a ramp-up phase T1, that is, during this phase, the power of the laser rises from zero power to the power of the stable emission. rate. Similar to the falling stage T3 of the laser power, the power sample in the ramping stage T1 of the laser power may not be within the preset power range and therefore will not be processed in step S630 even if it is sampled in step S610.
  • the upper limit of the data volume can be determined according to the quotient obtained by dividing the duration of the laser power within the preset power range by the preset time period.
  • the duration of the laser emitting a laser once minus the ramping time and the falling time of the output power of the laser, the difference obtained is the time length of the ramping stage and the falling stage of the laser power removed.
  • the difference obtained in this way can represent the duration of the laser power within the preset power range.
  • the quotient obtained by dividing the difference obtained in this way by the preset time period represents the maximum number of power samples that can be obtained when the laser power is within the preset power range.
  • the upper limit of the data volume of the power sample thus obtained can exclude the ramping stage T1 and the falling stage T3 of the laser power, further reduce the amount of data obtained, and further reduce the processing burden and cost.
  • the upper limit of the data amount that can exclude the ramp-up time and ramp-down time of the laser output power can be determined.
  • the number of multiple power samples within a preset power range may not be set with an upper limit on the amount of data.
  • it may be determined whether to stop sampling the power of the laser emitted by the laser according to whether the emission of one laser is terminated.
  • the power of the laser may be sampled during the entire time period of one laser emission, thereby maximally avoiding sample omission.
  • when the laser emission signal received from the laser stops or when the laser emission end signal is received from the laser it may be considered that one laser emission has stopped and therefore stops sampling the power of the laser emitted by the laser.
  • the time period may, for example, be less than the interval between two laser emissions and greater than the preset time period for laser sampling.
  • an upper limit of the data volume can be set for the number of multiple power samples within a preset power range, and it is also determined whether one emission of the laser has ended.
  • FIG. 7 shows a flow chart of a method for detecting the power of a welding laser according to other embodiments of the present application.
  • At least one power sample is obtained, wherein the power sample is obtained by sampling the power of the laser at every preset time period.
  • the method of the present application may also include step S710, at which it is determined whether the power sample obtained is greater than a power threshold.
  • the power threshold may be greater than or equal to an upper limit value of a preset power range.
  • step S720 if the power sample obtained is greater than the power threshold, information indicating that the power of the laser exceeds the power threshold is generated. Otherwise, at step S730, if the power sample obtained is not greater than the power threshold, information indicating that the power of the laser exceeds the power threshold is not generated.
  • the information generated indicating that the power of the laser exceeds the power threshold can be provided to the user to notify that the power of the laser is too high, thereby reminding the user to check the quality of the welding and take corresponding measures.
  • the information generated indicating that the power of the laser exceeds the power threshold can also be stored for later inspection and tracing.
  • the steps shown in Fig. 7 may be performed after steps S410 and S610 described in Fig. 4 and Fig. 6, and may be performed before steps S420 and S620 described in Fig. 4 and Fig. 6 or performed in parallel with steps S420 and S620.
  • steps S420 and S620 described in Fig. 4 and Fig. 6 the laser samples exceeding the power threshold may not be processed in steps S420 and S620, thereby reducing the processing burden and cost.
  • FIG. 8 shows a flow chart of a method for detecting the power of a welding laser according to other embodiments of the present application.
  • step S410 and S610 described above with reference to FIG. 4 and FIG. 6 at least one power sample is obtained, wherein the power sample is obtained by sampling the power of the laser at every preset time period.
  • the method of the present application may also include step S802, at which it is determined whether the power samples obtained by sampling the power of the laser within the threshold time period are all less than the lower limit of the preset power range.
  • the threshold time period may be determined according to the ramp time of the output power of the laser. In an embodiment of the present application, the threshold time period may be equal to or greater than the ramp time of the output power of the laser.
  • the power of the laser does not reach the lower limit of the preset power range within the time period greater than the ramp stage T1 of the output power, it can be considered that the power of the laser cannot ramp up to the preset power range.
  • the laser may have a fault or the working capacity of the laser itself cannot achieve the output of the preset power range.
  • the emission power of the laser is lower than the lower limit of the preset power, such a laser cannot meet the welding requirements and therefore cannot complete the welding. For example, it may occur that the welding material cannot be melted, the welding depth is too low, and the like.
  • step S804 when the power samples obtained by sampling the power of the laser within the threshold time period are all less than the lower limit of the preset power range, the repair welding information instructing the laser to perform repair welding can be obtained. Otherwise, at step S806, when at least one of the power samples obtained by sampling the power of the laser within the threshold time period is greater than the lower limit of the preset power range, the repair welding information instructing the laser to perform repair welding is not obtained.
  • the repair welding information for instructing the laser to perform repair welding may include, for example, a mark for repair welding, information about the previous welding, and the repair welding energy required for the repair welding.
  • the information about the previous welding may include the welding power and welding duration of the previous welding just performed.
  • the energy required for the repair welding may be based on
  • the power of the repair welding can be determined based on the information of the previous welding. For example, the power of the repair welding can be determined based on the laser power and welding duration of the previous welding.
  • steps S810, S820 and S830 may be performed. Steps S810, S820 and S830 are similar to steps S410, S420 and S430 previously described with reference to FIG. 4 . That is, at step S810, at least one power sample is obtained, and the power sample is obtained by sampling the power of the laser emitted by the laser based on the repair welding information at every preset time period. At step S820, a plurality of repair welding power samples within a preset power range are obtained from at least one repair welding power sample. At step S830, a plurality of repair welding power samples within a preset power range are processed to obtain a repair welding power detection result.
  • the contents described in the present application with reference to the above embodiments can be combined with the embodiment shown in FIG. 8 , and will not be repeated here.
  • the power of the welding laser can be detected during the repair welding process, thereby enabling monitoring of the laser power of the repair welding.
  • steps S802, S804, and S806 shown in FIG. 8 may be performed after steps S410 and S610 described in FIG. 4 and FIG. 6 , and may be performed before steps S420 and S620 described in FIG. 4 and FIG. 6 or performed in parallel with steps S420 and S620.
  • steps S802, S804, and S806 shown in FIG. 8 are performed before steps S420 and S620 described in FIG. 4 and FIG. 6
  • the power sampling of the laser may be stopped, that is, steps S420 and S620 may be stopped, thereby reducing the processing burden and cost.
  • the power sampling of the laser may not be stopped, and the sampled data may be recorded as information about the previous welding.
  • FIG. 9 shows a flow chart of a method for detecting the power of a welding laser according to other embodiments of the present application.
  • the method of FIG. 9 also includes step S902 , and in step S902 , for the power samples obtained, it is determined whether the power samples obtained by sampling the power of the laser within the threshold time period are all less than the lower limit of the preset power range.
  • step S904 when all power samples obtained by sampling the power of the laser within the threshold time period are less than the lower limit of the preset power range, information indicating that the welding performed by the laser has failed can be obtained. Otherwise, at step S906, when at least one of the power samples obtained by sampling the power of the laser within the threshold time period is greater than the lower limit of the preset power range, information indicating that the welding performed by the laser has failed is not obtained.
  • the information indicating the failure of welding performed by the laser may include, for example, indicating that the welding has failed, the quality of the weld is unqualified, the welded item should be scrapped, and instructing the user to check whether the laser is normal.
  • steps S902, S904 and S906 shown in FIG. 9 may also be It is performed after steps S410 and S610 described in FIG. 4 and FIG. 6 , and may be performed before steps S420 and S620 described in FIG. 4 and FIG. 6 or performed in parallel with steps S420 and S620 .
  • FIG. 10 illustrates a general hardware environment 1000 in which the present disclosure may be applied according to an exemplary embodiment of the present disclosure.
  • the computing device 1000 may be any machine configured to perform processing and/or computing, and may be, but is not limited to, a workstation, a server, a desktop computer, a laptop computer, a television, a tablet computer, a personal digital assistant, a smart phone, a portable camera, or any combination thereof.
  • the above method of the present application may be implemented in whole or in part by the computing device 1000 or a similar device or system.
  • the computing device 1000 may include an element that can be connected to the bus 1002 via one or more interfaces or communicate with the bus 1002.
  • the computing device 1000 may include a bus 1002, one or more processors 1004, one or more input devices 1006, and one or more output devices 1008.
  • the one or more processors 1004 may be any type of processor, and may include but is not limited to one or more general-purpose processors and/or one or more special-purpose processors (such as special-purpose processing chips).
  • the input device 1006 may be any type of device that can input information to the computing device, and may include but is not limited to a mouse, keyboard, touch screen, microphone, and/or remote control. According to some embodiments of the present disclosure, the input device 1006 may also include a camera.
  • the output device 1008 may be any type of device that can present information, and may include but is not limited to a display, a speaker, a video/audio output terminal, and/or a printer.
  • the computing device 1000 may also include or be connected to a non-transient storage device 1010, which may be any storage device that is non-transient and can implement a data repository, and may include but is not limited to a disk drive, an optical storage device, a solid-state storage device, a floppy disk, a flexible disk, a hard disk, a tape or any other magnetic medium, a compact disk or any other optical medium, a ROM (read-only memory), a RAM (random access memory), a cache memory and/or any other memory chip or cassette, and/or any other medium from which a computer can read data, instructions and/or code.
  • a non-transient storage device 1010 which may be any storage device that is non-transient and can implement a data repository, and may include but is not limited to a disk drive, an optical
  • the non-transient storage device 1010 may be detachable from an interface.
  • the non-transient storage device 1010 may have data/instructions/code for implementing the above methods and steps.
  • the computing device 1000 may also include a communication device 1012.
  • the communication device 1012 can be any type of device or system capable of communicating with an external device and/or with a network, and can include but is not limited to a modem, a network card, an infrared communication device, wireless communication equipment and/or a chipset such as a BluetoothTM device, an 802.11 device, a WiFi device, a WiMax device, a cellular communication facility, etc.
  • the bus 1002 may include, but is not limited to, an Industry Standard Architecture (ISA) bus, a Micro Channel Architecture (MCA) bus, an Enhanced ISA (EISA) bus, a Video Electronics Standards Association (VESA) local bus, and a Peripheral Component Interconnect (PCI) bus.
  • ISA Industry Standard Architecture
  • MCA Micro Channel Architecture
  • EISA Enhanced ISA
  • VESA Video Electronics Standards Association
  • PCI Peripheral Component Interconnect
  • the computing device 1000 may also include a working memory 1014 , which may be any type of working memory that can store instructions and/or data useful for operation of the processor 1004 , and may include, but is not limited to, random access memory and/or read-only memory devices.
  • working memory 1014 may be any type of working memory that can store instructions and/or data useful for operation of the processor 1004 , and may include, but is not limited to, random access memory and/or read-only memory devices.
  • Software elements may be located in the working memory 1014, including but not limited to an operating system 1016, one or more application programs 1018, drivers, and/or other data and code.
  • the instructions may be included in one or more applications 1018.
  • the executable code or source code of the instructions of the software elements may be stored in a non-transitory computer-readable storage medium (such as the above-mentioned (one or more) storage devices 1010) and may be read into the working memory 1014 where possible compiled and/or installed.
  • the executable code or source code of the instructions of the software elements may also be downloaded from a remote location.
  • Computer software can be stored in a computer-readable storage medium, such as a floppy disk, a hard disk, an optical disk, or a flash memory.
  • Computer software includes a series of instructions that enable a computer (such as a personal computer, a service station, or a network terminal) to run a method according to each embodiment of the present disclosure or a part thereof.
  • the present application also provides a non-volatile computer-readable storage medium on which instructions are stored, and when the instructions are executed by a processor, some or all of the steps in the above method are implemented.
  • the present application also provides a computer program product, which includes instructions, and when the instructions are executed by a processor, some or all of the steps in the above method are executed.
  • the present application provides a method for detecting the power of a welding laser.
  • the method includes obtaining at least one power sample, which is obtained by sampling the power of the welding laser emitted by the laser at every preset time period.
  • the method also includes obtaining multiple power samples within a preset power range from at least one power sample.
  • the method may also include determining the minimum power and maximum power of the multiple power samples, and averaging the multiple power samples to obtain an average power.
  • the power detection result may include the minimum power, the maximum power, and the average power.
  • the method may also include sending the minimum power, the maximum power, and the average power as the power detection result, for example, uploading it to a recording system.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Engineering (AREA)
  • Plasma & Fusion (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Quality & Reliability (AREA)
  • Laser Beam Processing (AREA)

Abstract

一种检测焊接激光的功率的方法，包括获得至少一个功率样本，其中，功率样本为在每隔预设时间段内，对由激光器发射的焊接激光的功率进行采样得到；获取至少一个功率样本中的在预设功率范围内的多个功率样本；对在预设功率范围内的多个功率样本进行处理，以获得功率检测结果。该方法可以提高系统处理速度，提高所获得的数据的可靠性和准确性。还涉及一种激光焊接系统、一种非瞬态计算机可读存储介质以及一种计算机程序产品。

Description

检测焊接激光的功率的方法和激光焊接系统 技术领域
本申请涉及激光焊接领域，具体涉及一种检测焊接激光的功率的方法和激光焊接系统。
背景技术
随着大功率激光的研究进展和激光焊接的应用扩展，激光焊接广泛应用在汽车工业、电子工业和生物医学等多种行业中。随着激光焊接的应用范围越来越广、程度越来越深，对于激光焊接的质量的要求也越来越高。决定激光焊接的质量的重要参数之一是激光焊接过程中由激光器发射的激光的功率。
为了检测激光焊接的质量，需要对焊接激光的功率进行更加准确的检测。
发明内容
本申请鉴于上述问题，本申请提供一种检测焊接激光的功率的方法和激光焊接系统，能够对焊接激光的功率进行更加准确的检测。
根据本申请的一个方面，提供了一种检测焊接激光的功率的方法，包括获得至少一个功率样本，其中，所述功率样本为在每隔预设时间段内，对由激光器发射的焊接激光的功率进行采样得到。本方法还可以包括获取所述至少一个功率样本中的在预设功率范围内的多个功率样本。本方法还可以包括对在所述预设功率范围内的所述多个功率样本进行处理，以获得功率检测结果。
在本申请的实施例的技术方案中，通过在激光功率检测的过程中仅获得在预设功率范围内的功率样本，可以排除预设功率范围外的功率样本的干扰，由此可以获得更加准确的功率检测结果。
在一些实施例中，对在所述预设功率范围内的所述多个功率样本进行处理可以包括：对所述多个功率样本求平均，以获得平均功率，其中，所述功率检测结果包括所述平均功率。通过计算功率样本的平均功率，例如可以通过一个功率的数值反映激光的输出功率的平均水平并指示激光器所发射的激光的质量。
在一些实施例中，对在所述预设功率范围内的所述多个功率样本进行处理可以包括：确定所述多个功率样本的最小功率和最大功率中的至少一个，其中，所述功率 检测结果包括最小功率和最大功率中的所述至少一个。通过确定功率样本的最小功率和最大功率，例如可以确定例如功率样本在预设功率范围内的极值、分布和波动情况，并且最小功率和最大功率可以在如下所述的其他处理中继续被使用。
在一些实施例中，对在所述预设功率范围内的所述多个功率样本进行处理可以包括：对所述多个功率样本中除最小功率和最大功率中的所述至少一个之外的功率求平均，以获得经修正的平均功率，其中，所述功率检测结果包括所述经修正的平均功率。通过去除最小功率和最大功率中的至少一个来对平均功率进行修正，例如可以排除在预设功率范围内发生较大波动的功率样本，从而获得更加准确的平均功率数据。
在一些实施例中，所述方法还包括基于根据所述焊接激光所焊接的位置，得到由所述激光器进行的焊接的工况；根据所述焊接的工况确定所述预设功率范围。通过根据所述焊接激光所焊接的位置，得到由所述激光器进行的焊接的工况并根据焊接的工况来确定预设功率范围，例如可以根据要由激光器焊接的位置的情况来灵活地确定预设功率范围，使得预设功率范围符合实际情况。
在一些实施例中，所述方法还包括：根据所述焊接的工况确定功率采集标准值；和针对所述功率采集标准值分别确定所述预设功率范围的下限值和上限值。通过先确定功率采集标准值再针对功率采集标准值分别确定预设功率范围的下限值和上限值，例如可以简化确定功率采集标准值和预设功率范围的过程，增加设置灵活性。
在一些实施例中，所述方法还包括：判断在所述预设功率范围内的所述多个功率样本的数量是否满足数据量要求；响应于所述多个功率样本的数量满足数据量要求，发送所述功率检测结果。通过响应于多个功率样本的数量满足数据量要求，发送功率检测结果，可以减小所发送的功率检测结果的数量，避免发送没有价值的功率检测结果等。
在一些实施例中，所述方法还包括：判断在所述预设功率范围内的所述多个功率样本的数量是否达到数据量上限；和响应于所述多个功率样本的数量达到数据量上限，停止对由所述激光器发射的用于焊接的激光的功率进行采样。通过对在预设功率范围内的功率样本的数量设置数据量上限，可以避免增加处理负担和处理成本。
在一些实施例中，所述方法还包括根据所述焊接激光所焊接的位置，得到由所述激光器进行的焊接的工况；根据所述焊接的工况确定所述数据量上限。由此，可以根据激光器的工况灵活地设置激光样本的数据量上限。
在一些实施例中，所述方法还包括根据所述激光器发射一次激光的持续时间和所述预设时间段确定所述数据量上限。由此，可以确定能够覆盖激光器发射激光的整个持续时间的数据量上限。
在一些实施例中，所述方法还包括根据所述激光器发射一次激光的持续时间、所述激光器的输出功率的下降时间和所述预设时间段确定所述数据量上限。由此，可以确定能够排除激光器的输出功率的下降时间的数据量上限。
在一些实施例中，所述方法还包括根据所述激光的功率在所述预设功率范围内的持续时间和所述预设时间段确定所述数据量上限。由此，可以确定能够排除激光器的输出功率的爬坡时间和下降时间的数据量上限。
在一些实施例中，所述方法还包括响应于对所述激光的功率进行采样所获得的功率样本大于功率阈值，生成指示所述激光的功率超过功率阈值的信息，所述功率阈值大于或等于所述预设功率范围的上限值。由此，可以发现焊接激光的功率过高的情况，发现并记录的激光焊接的异常情况。
在一些实施例中，所述方法还包括响应于在阈值时间段内对所述激光的功率进行采样所获得的功率样本都小于所述预设功率范围的下限值，获得指示所述激光器进行补焊的补焊信息，其中所述阈值时间段是根据所述激光器的输出功率的爬坡时间确定的。由此，可以发现焊接激光的功率过低的情况，并产生进行补焊的信息。
在一些实施例中，所述方法还包括：获得至少一个功率样本，其中，所述功率样本为在每隔预设时间段内，对由所述激光器基于所述补焊信息发射的激光的功率进行采样得到；获取所述至少一个补焊功率样本中在所述预设功率范围内的多个补焊功率样本；以及对在所述预设功率范围内的多个补焊功率样本进行处理，以获得补焊功率检测结果。由此，可以在补焊过程中检测焊接激光的功率，实现对补焊的激光功率的监视。
在一些实施例中，所述方法还可以包括：响应于在阈值时间段内对所述激光的功率进行采样所获得的功率样本都小于所述预设功率范围的下限值，获得指示由所述激光器进行的焊接失败的信息，其中所述阈值时间段是根据所述激光器的输出功率的爬坡时间确定的。由此，可以发现焊接失败的情况，及时将焊接失败的物品从生产流水线上剔除，停止对该物品进行下一步处理。
根据本申请的另一个方面，提供了一种激光焊接系统，该系统包括激光器、振镜、控制器和上位机。激光器可以被配置为发射用于焊接的激光并且包括通讯接口。振镜可以被配置为从所述激光器接收所述激光并操纵所述激光进行焊接。控制器可以包括通讯接口并且被配置为通过所述通讯接口经由通讯线路耦合到所述激光器的通讯接口，以从所述激光器接收由所述激光器发射的用于焊接的激光的功率。上位机可以被配置为可通信地耦合到所述控制器并从所述控制器接收所述功率检测结果。控制器可以被配置为执行以上方法中的部分或全部步骤。
在本申请实施例的技术方案中，由控制器通过通讯接口和通讯线路从激光器接收关于由激光器发射的激光的功率的信息，可以利用激光器提供的通讯接口方便地获得由激光器发射的激光的功率，并且因此例如可以增加系统构建和配置的便利性，并且可以控制整个系统的成本。
根据本申请的另一个方面，提供了一种激光焊接系统。该系统包括激光器、振镜、振镜控制单元、功率模拟量获取单元、控制器和上位机。激光器可以被配置为发 射用于焊接的激光。振镜可以被配置为从所述激光器接收所述激光。振镜控制单元可以被配置为控制所述振镜来操纵所述激光进行焊接。功率模拟量获取单元可以被配置为获取表示由所述激光器发射的用于焊接的激光的功率的模拟量。控制器可以被配置为通过导线从所述功率模拟量获取单元接收表示由所述激光器发射的用于焊接的激光的功率的模拟量，并且根据所述模拟量获得由所述激光器发射的用于焊接的激光的功率。上位机可以被配置为可通信地耦合到所述控制器并从所述控制器接收所述功率检测结果。控制器可以被配置为执行以上方法中的部分或全部步骤。
在本申请实施例的技术方案中，通过由控制器通过导线从功率模拟量获取单元接收表示激光的功率的模拟量并且根据该模拟量获得激光的功率，可以节约对激光的功率进行模数转换和编码并将经过编码的数据通过通讯接口经由通讯线路发送出去的时间，提高系统的处理速度。此外，由控制器通过导线直接获取表示激光的功率的模拟量，由于该模拟量未经过其他第三方处理，因此可以提高所获得的数据的可靠性和准确性。
根据本申请的另一个方面，提供了一种非瞬态计算机可读存储介质。该非瞬态计算机可读存储介质存储有指令，当所述指令由处理器执行时使得执行以上方法中的部分或全部步骤。
根据本申请的另一个方面，提供了一种计算机程序产品，该计算机程序产品包含指令，当所述指令由处理器执行时使得执行以上方法中的部分或全部步骤。
上述说明仅是本申请技术方案的概述，为了能够更清楚了解本申请的技术手段，而可依照说明书的内容予以实施，并且为了让本申请的上述和其它目的、特征和优点能够更明显易懂，以下特举本申请的具体实施方式。
附图说明
为了通过阅读对下文优选实施方式的详细描述，各种其他的优点和益处对于本领域普通技术人员将变得清楚明了。附图仅用于示出优选实施方式的目的，而并不认为是对本申请的限制。而且在全部附图中，用相同的附图标号表示相同的部件。附图并未按照实际的比例绘制。在附图中：
图1示出了在激光器发射一次激光的过程中的激光功率的示例曲线图；
图2示出了根据本申请一些实施例的激光焊接系统100的结构示意图；
图3示出了根据本申请另外一些实施例的激光焊接系统200的结构示意图；
图4示出了根据本申请的一些实施例的检测焊接激光的功率的方法的流程图；
图5示出了结合根据本申请的实施例的检测焊接激光的功率的方法的激光功率的示例曲线图；
图6示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图；
图7示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图；
图8示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图；
图9示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图；以及
图10示出了根据本申请的实施例的可应用本申请的方法的一般硬件环境1000。
具体实施方式中的附图标号如下：
激光焊接系统100；
激光器110；输出光路111；分光器112；光电转换器113；通讯接口114；通讯线路
115；
振镜120；激光输出光纤121；通信线缆122；
控制器130；通讯接口131；
上位机140；通讯线路141；
激光焊接系统200；
激光器210；输出光路211；分光器212；光电转换器213；
振镜220；激光输出光纤221；
控制器230；通讯接口231；输入接线端子232；
振镜控制单元250；通信线缆251；通信线缆252；
功率模拟量获取单元260；导线261；输出接线端子262；
上位机240；通讯线路241。
具体实施方式
下面结合附图和实施例对本申请的实施方式作进一步详细描述。以下实施例的详细描述和附图用于示例性地说明本申请的原理，但不能用来限制本申请的范围，即本申请不限于所描述的实施例。
下面将结合附图对本申请技术方案的实施例进行详细的描述。以下实施例仅用于更加清楚地说明本申请的技术方案，因此只作为示例，而不能以此来限制本申请的保护范围。
除非另有定义，本文所使用的所有的技术和科学术语与属于本申请的技术 领域的技术人员通常理解的含义相同；本文中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本申请；本申请的说明书和权利要求书及上述附图说明中的术语“包括”和“具有”以及它们的任何变形，意图在于覆盖不排他的包含。
在本文中提及“实施例”意味着，结合实施例描述的特定特征、结构或特性可以包含在本申请的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例，也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是，本文所描述的实施例可以与其它实施例相结合。
在本申请实施例的描述中，术语“和/或”仅仅是一种描述关联对象的关联关系，表示可以存在三种关系，例如A和/或B，可以表示：单独存在A，同时存在A和B，单独存在B这三种情况。另外，本文中字符“/”，一般表示前后关联对象是一种“或”的关系。
在本申请实施例的描述中，术语“多个”指的是两个以上(包括两个)。
在本申请实施例的描述中，除非另有明确的规定和限定，技术术语“安装”、“相连”、“连接”、“固定”、“耦合”等术语应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或成一体；也可以是机械连接，也可以是电连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请实施例中的具体含义。
参照图1，图1示出了在激光器发射一次激光的过程中的激光功率的示例曲线图。如图1所示，坐标轴的横轴表示激光发射的时间，而坐标轴的纵轴表示激光的功率。从图中的功率曲线可以看出，在每一次激光发射刚开始时，激光的功率会先经历爬坡阶段T1，即，在该阶段中从零功率上升到稳定发射的功率。之后激光的功率进入稳定阶段T2，在该阶段中激光功率可以基本稳定。在激光发射结束之前，激光的功率又会经历下降阶段T3，即，在该阶段中从稳定发射的功率下降到零功率。在激光发射的稳定阶段T2中的功率反映了该激光进行焊接的有效功率，并且因此是期望获得的结果。
为了测量在稳定阶段T2内发射的激光的功率，可以在如图1所示的采样时间段内对激光的功率进行采样。具体来说，在测量激光功率的过程中，激光功率的采样时间段可以被设置为避开激光功率的爬坡阶段T1和下降阶段T3，从而仅对稳定阶段T2的激光功率进行采样。例如，理想的激光功率的采样时间段可以被设置为在激光功率的爬坡阶段T1之后开始并且在激光功率的下降阶段T3之前结束。
然而，由于激光功率的爬坡阶段T1、稳定阶段T2和下降阶段T3各自的时间长度可能难以确定并且也可能受到多种因素影响而发生变化，因此难以准确设置激光功率的采样时间段，并且难以获得比较准确的激光功率。此外，如图1所示，激光的功率即使在稳定阶段T2中也有可能会发生剧烈波动，因此在激光功率的采样时间段 内获得的功率样本仍然可能包括偏离稳定发射功率的突变功率样本。对这样的功率样本进行分析，可能会获得错误的激光功率检测结果。
为了获得更加准确的激光功率检测结果，本申请的一个或多个实施例提供了一种检测焊接激光的功率的方法，该方法对激光焊接的功率样本应用了预设功率范围并在激光功率检测的过程中仅获得在该预设功率范围内的功率样本。通过对在该预设功率范围内的功率样本进行处理，可以获得更加准确的功率检测结果。
通过本申请的实施例的技术方案，通过在激光功率检测的过程中仅获得在预设功率范围(例如，包括激光器的稳定发射功率的范围)内的功率样本，可以排除预设功率范围外的功率样本的干扰(例如激光功率的爬坡阶段和下降阶段的功率样本以及偏离稳定发射功率的突变功率样本)，由此可以获得更加准确的功率检测结果。
本申请实施例公开的检测焊接激光的功率的方法可以应用到各种行业的激光焊接系统中。例如，在车辆零件、新能源电池、不锈钢制品、电子产品等行业的激光焊接系统中，都可以应用本申请的实施例的方法，并且实现获得更加准确的功率检测结果的效果。
同样，本申请实施例公开的检测焊接激光的功率的方法可以应用到各种类型的激光焊接系统中。
以下实施例为了方便说明，以本申请的实施例的激光焊接系统100和200为例进行说明。
请参照图2，图2示出了根据本申请一些实施例的激光焊接系统100的结构示意图。如图所示，激光焊接系统100可以包括激光器110、振镜120、控制器130和上位机140。
在本申请的实施例中，激光器110被配置为发射用于焊接的激光。本申请的实施例中的激光器110可以是各种类型的激光器，例如，二氧化碳激光器、光纤激光器、YAG激光器、半导体激光器等。由激光器110输出的激光的功率可以在几百瓦特到几千瓦特的范围内。
在本申请的一些实施例中，为了获得由激光器110输出的激光的功率，例如可以在激光器110的输出光路111中设置分光器112。该分光器112可以将激光的一小部分引导到光电转换器113并由光电转换器113将激光的强度(即，功率)转换为电信号的幅度，由此可以获得激光焊接过程中由激光器发射的激光的功率。在本申请的实施例中，分光器112可以例如是半透半反镜，并且将激光的小部分(例如0.2％-0.5％)反射或透射到光电转换器113并将激光的其余部分通过透射或反射而发射出去。通过将由光电转换器113获得的激光功率按照由分光器112反射的激光部分在全部激光功率中所占的比例放大相应倍数，即可获得由激光器110发射的激光的功率。在本申请的实施例中，光电转换器113包括例如光电倍增管、光电二极管、光电池、CCD和CMOS等。
在本申请的实施例中，激光器110还包括通讯接口114。通过通讯接口114，激光器110可以经由通讯线路115耦合到控制器130。激光器110的通讯接口114例如可以是以太网接口或工业以太网接口并且通讯线路115可以是以太网线或工业以太网线。通过通讯接口114，激光器110可以从控制器130接收控制命令以及向控制器130发送信息。在本申请的实施例中，激光器110可以通过通讯接口114向控制器130发送关于由激光器110发射的激光的功率的信息。
在本申请的实施例中，通信接口和通讯线路可以包括各种适配器以及以软件和/或硬件实现的电路系统，以便能够使用有线或无线协议在两个主体之间进行通信。有线协议例如是串口协议、并口协议、以太网协议、USB协议或其它有线通信协议中的任何一种或多种。无线协议例如是任何IEEE 802.11Wi-Fi协议、蜂窝网络通信协议等。
在本申请的实施例中，振镜120被配置为从激光器110接收激光并操纵激光进行焊接。振镜120可以通过例如激光输出光纤121从激光器110接收激光。振镜120可以对来自激光器110的激光进行例如聚焦等光学处理并通过反射或折射将激光发射到期望的焊接位置，从而对该焊接位置进行焊接。振镜120的反射镜面在静电/压电/电磁驱动下在一维或二维方向上发生旋转或平移，以调整激光的反射位置。振镜120还可以通过通信线缆122连接到激光器110的通讯接口114，以从激光器110接收例如控制焊接位置的控制信号。
在本申请的实施例中，控制器130可以例如对激光器110进行控制以及从激光器110接收信息。控制器130可以是例如PLC、工业PC、微控制器、现场可编程门阵列(FPGA)、专用集成电路(ASIC)、可编程芯片等。控制器130包括通讯接口131并且被配置为通过通讯接口131经由通讯线路115耦合到激光器110。通讯接口131例如可以是以太网接口或工业以太网接口。通过通讯接口131，控制器130可以将控制命令发送给激光器110以及从激光器110接收信息。在本申请的实施例中，控制器130可以从激光器110接收关于由激光器110发射的激光的功率的信息。
在本申请的实施例中，对于由激光器110发射的激光的功率，控制器130可以获得至少一个功率样本，该功率样本为在每隔预设时间段内对激光的功率进行采样得到的。控制器130可以获取这些至少一个功率样本中的在预设功率范围内的多个功率样本。控制器130可以对所获取的在预设功率范围内的多个功率样本进行处理，以获得功率检测结果。由此，可以仅获得在期望功率范围内的功率样本并且排除期望功率范围外的功率样本，从而实现获得更加准确的功率检测结果的效果。控制器130所进行的操作在下文中参照本申请的多个实施例进一步解释。
在本申请的实施例中，上位机140被配置为可通信地耦合到控制器130。例如，通过通讯线路141，上位机140可以连接到控制器130的通讯接口131，并且向控制器130发送信息或从控制器130接收信息。在本申请的实施例中，上位机140可以从控制器130接收功率检测结果。上位机140还可以与其他计算设备(例如，计算 器、服务器、单片机)和/或存储设备可通信地耦合并与这些设备收发信息。上位机140指的是向控制器130发出命令进行控制并从控制器130接收信息的设备。上位机140例如可以是工控机、工作站、触摸屏等。
在本申请的以上实施例中，由控制器130通过通讯接口和通讯线路从激光器110接收关于由激光器110发射的激光的功率的信息，可以利用激光器110提供的通讯接口方便地获得由激光器110发射的激光的功率，并且因此例如可以增加系统构建和配置的便利性，并且可以控制整个系统的成本。
在本申请的上述实施例中，虽然将分光器112和光电转换器113示出为在激光器110内部，但是本领域技术人员可以明白，在本申请的其他实施例中，分光器112和光电转换器113中的一个或多个可以在激光器110外部或其他位置并且可以是独立的组件，只要分光器112能够将激光引导到光电转换器113，使得光电转换器113可以获得激光的功率并将其通过通讯接口114发送出去即可。
接下来，请参照图3，图3示出了根据本申请另外一些实施例的激光焊接系统200的结构示意图。如图所示，激光焊接系统200可以包括激光器210、振镜220、控制器230、上位机240、振镜控制单元250和功率模拟量获取单元260。
与图2中示出的实施例类似，在本申请的实施例中，激光器210被配置为发射用于焊接的激光，并且可以是各种类型的激光器。同样类似地，可以在激光器210的输出光路211中设置分光器212和将激光的强度转换为电信号的光电转换器213。在此不再对这些组件进行重复说明。
与图2中示出的实施例类似，在本申请的实施例中，振镜220被配置为通过例如激光输出光纤221从激光器210接收激光并操纵激光进行焊接。与图2中示出的实施例不同的是，图3中示出的激光焊接系统200还包括振镜控制单元250。振镜控制单元250可以通过通信线缆251与控制器230通信地耦合，以从控制单元230接收控制信号。此外，振镜控制单元250被配置为控制振镜220来操纵激光进行焊接。例如，振镜控制单元250可以通过通信线缆252与振镜220通信地耦合，并根据从控制单元230接收控制信号来控制振镜220操纵激光进行焊接。
与图2中示出的实施例不同的是，图3中示出的激光焊接系统200还包括功率模拟量获取单元260。功率模拟量获取单元260被配置为获取表示由激光器210发射的用于焊接的激光的功率的模拟量。功率模拟量获取单元260例如可以耦合到光电转换器213并且从光电转换器213接收表示激光的功率的电信号。根据该电信号，功率模拟量获取单元260可以生成表示由激光器210发射的用于焊接的激光的功率的模拟量。功率模拟量获取单元260可以经由导线261将表示由激光器发射的用于焊接的激光的功率的模拟量发送给控制器230。例如，功率模拟量获取单元260的输出接线端子262可以经由导线261连接到控制器230的输入接线端子232。
在本申请的实施例中，控制器230包括通讯接口231并且被配置为通过通 讯接口231经由通讯线路251耦合到振镜控制单元250。通过通讯接口231，控制器230可以将各种控制命令发送给振镜控制单元250。
在本申请的实施例中，如上所述，控制器230包括输入接线端子232，并且可以通过输入接线端子232通过导线261从功率模拟量获取单元260接收表示由激光器210发射的用于焊接的激光的功率的模拟量。控制器230可以根据该模拟量获得由激光器210发射的用于焊接的激光的功率。
与图2中示出的实施例类似地，控制器230可以对于由激光器210发射的激光的功率执行类似操作，以获得功率检测结果。由此，可以仅获得在期望功率范围内的功率样本并且排除期望功率范围外的功率样本，从而实现获得更加准确的功率检测结果的效果。控制器230所进行的操作会在下文中参照本申请的多个实施例进一步解释。
与图2中示出的实施例类似地，在本申请的实施例中，上位机240被配置为可通信地耦合到控制器230。上位机240还可以与其他计算设备和/或存储设备可通信地耦合并与这些设备收发信息。
在本申请的以上实施例中，通过由控制器230通过导线261从功率模拟量获取单元260接收表示激光的功率的模拟量并且根据该模拟量获得激光的功率，相比于图2中示出的激光焊接系统100，可以节约对激光的功率进行模数转换和编码并将经过编码的数据通过通讯接口经由通讯线路发送出去的时间，提高系统的处理速度。此外，由控制器230通过导线261直接获取表示激光的功率的模拟量，由于该模拟量未经过其他第三方处理，因此可以提高所获得的数据的可靠性和准确性。
在本申请的上述实施例中，虽然示出了振镜控制单元250并且振镜220从振镜控制单元250接收控制信号，但是本领域技术人员可以明白，在本申请的其他实施例中，振镜220可以与图2所示的激光焊接系统100类似地从控制器230接收控制信号，而不提供振镜控制单元250。
根据本申请的一些实施例，参照图4并进一步参照图5，图4示出了根据本申请的一些实施例的检测焊接激光的功率的方法的流程图，图5示出了结合根据本申请的实施例的检测焊接激光的功率的方法的激光功率的示例曲线图。
如图4所示，在步骤S410中，获得至少一个功率样本，其中，该功率样本为在每隔预设时间段内，对由激光器发射的焊接激光的功率进行采样得到的。参照图5，与图1相同，图5的曲线图的坐标轴的横轴表示激光发射的时间，而坐标轴的纵轴表示激光的功率。如图5所示，激光器在时间为零时开始发射，并且从激光器开始发射起，可以每隔预设时间段T4对激光的功率进行采样以获得至少一个功率样本。图5中的附图标记S1到S12表示所获得的功率样本，并且每个功率样本之间的时间间隔都是T4。从图5中可以看出，功率样本S1到S3处于激光功率的爬坡阶段T1，功率样本S3到S10处于激光功率的稳定阶段T2，而功率样本S11到S12处于激光功率的下降阶 段T3。
结合图2，在本申请的一些实施例中，控制器130可以从激光器110接收实时的激光功率的通讯数据，并将这些激光功率的通讯数据中间隔预设时间段的那些功率样本取出来，以采样获得至少一个功率样本。在本申请的另一些实施例中，控制器130可以命令激光器110每隔预设时间段采样并发送一次当时的激光功率的通讯数据，并将所接收的激光功率作为至少一个功率样本。
结合图3，在本申请的一些实施例中，控制器230可以从功率模拟量获取单元260接收实时的激光功率的模拟量，并将这些激光功率的模拟量中间隔预设时间段的那些模拟量取出来，并根据所取出的模拟量采样获得至少一个功率样本。在本申请的另一些实施例中，控制器230可以命令功率模拟量获取单元260每隔预设时间段采样激光功率并通过导线261提供一次当时的激光功率的模拟量，并根据所提供的模拟量获得至少一个功率样本。
如图4所示，在步骤S420中，获取至少一个功率样本中的在预设功率范围内的多个功率样本。返回到图5，在本申请的实施例中，预设功率范围可以被设置为从功率k1到功率k2的值，其中功率k1为预设功率范围的下限值，而功率k2为预设功率范围的上限值。从图5可以看出，处于激光功率的爬坡阶段T1的功率样本S1到S3以及处于激光功率的下降阶段T3的功率样本S11和S12的功率都小于功率k1并且因此在预设功率范围k1到k2之外。此外，虽然功率样本S4到S10处于激光功率的稳定阶段T2，但是由于激光器的功率波动，功率样本S6的功率大于预设功率范围的上限值k2，而功率样本S8的功率小于预设功率范围的下限值k1。因此，功率样本S6和S8的功率也不在预设功率范围k1到k2内。通过步骤S420，可以获得在预设功率范围内的多个功率样本S4、S5、S7、S9和S10。
在本申请的实施例中，可以由控制器130和230判断采样获得的每个功率样本是否在预设功率范围内，并将被判断为“是”的功率样本获取作为在预设功率范围内的多个功率样本。
如图4所示，在步骤S430中，对所获取的在预设功率范围内的多个功率样本进行处理，以获得功率检测结果。在本申请的实施例中，可以由控制器130和230对所获取的多个功率样本进行处理，以获得功率检测结果。在本申请的实施例中，可以对功率样本进行各种处理，并且在下文中将会进一步说明对功率样本进行的处理的示例。
通过在激光功率检测的过程中仅获得在预设功率范围(反映了激光器的稳定发射功率)内的功率样本，可以仅获得的功率样本S4、S5、S7、S9和S10，并且排除了在预设功率范围外(远离激光器的稳定发射功率)的功率样本S1、S2、S3、S6、S8、S11和S12。对由此获得的功率样本进行处理，可以获得更加准确的功率检测结果。
本领域技术人员可以明白，图5中示出的激光的功率曲线以及功率样本的数量都是示意性的。换言之，激光的功率曲线可以根据实际情况确定，并且根据激光发射的实际时间长度和所设置的预设时间段的长度，功率样本的数量可以是几个到几百个。在本申请的一些实施例中，激光发射的时间长度可以是1秒到若干秒，而预设时间段的长度可以是几微秒到几百微秒。在这种情况下，所采样获得的功率样本的数量可以是几十到几百个，而在预设功率范围内的功率样本的数量也可以是几十到几百个。
接下来，对步骤S430中对所获取的多个功率样本进行的处理进行说明。
根据本申请的一些实施例，对在预设功率范围内的多个功率样本进行处理可以包括对多个功率样本求平均，以获得平均功率。在这种情况下，功率检测结果包括平均功率。
平均功率指的是将多个功率样本的功率值求和并将求和的结果除以功率样本的数量而获得的数值。在本申请的实施例中，可以由控制器130或230通过累加的方式将多个功率样本中每个功率样本的功率值一一求和，同时对功率样本的数量进行计数得到的功率样本的数量，并将求和的结果除以功率样本的数量，得到平均功率。
通过计算功率样本的平均功率，例如可以通过一个功率的数值反映激光的输出功率的平均水平并指示激光器所发射的激光的质量。
根据本申请的一些实施例，对在预设功率范围内的多个功率样本进行处理可以包括确定多个功率样本的最小功率和最大功率中的至少一个。在这种情况下，功率检测结果可以包括最小功率和最大功率中的至少一个。
功率样本的最小功率和最大功率指的是所获取的多个功率样本的功率的最小值和最大值。在本申请的实施例中，可以由控制器130或230将多个功率样本中的一个功率样本与另一个功率样本相比较，并保留二者中较小的功率样本。之后，控制器130或230再将较小的功率样本与其他尚未被拿来进行比较的功率样本相比较，保留二者中较小的功率样本。对于在预设功率范围内的所有功率样本如此反复，控制器130或230可以确定所获取的多个功率样本的最小功率。类似地，通过将功率样本彼此比较并保留较大的功率样本，控制器130或230可以最终确定最大功率。
在本申请的另一个实施例中，可以由控制器130或230将多个功率样本的功率按照由小到大或由大到小的顺序排列，并根据经过顺序排列的功率样本确定最小功率和最大功率中的至少一个。
根据需要，可以仅确定功率样本的最小功率，仅确定功率样本的最大功率，或者确定功率样本的最小功率和最大功率两者。此外，由于所获取的多个功率样本都是在预设功率范围内的，所以所确定的功率样本的最小功率和最大功率也都在预设功率范围内。
通过确定功率样本的最小功率和最大功率，例如可以确定例如功率样本在 预设功率范围内的极值、分布和波动情况，并且最小功率和最大功率可以在如下所述的其他处理中继续被使用。
根据本申请的一些实施例，在已经确定了多个功率样本中除最小功率和最大功率中的至少一个的情况下，对在预设功率范围内的多个功率样本进行处理可以包括对多个功率样本中除最小功率和最大功率中的至少一个之外的功率求平均，以获得经修正的平均功率。在这种情况下，功率检测结果包括经修正的平均功率。
在本申请的实施例中，可以由控制器130或230通过累加的方式将多个功率样本中每个功率样本的功率值一一求和，同时对功率样本的数量进行计数以得到功率样本的数量。另外，可以由控制器130或230确定功率样本的最小功率和最大功率中的至少一个。之后，由控制器130或230将求和的结果减去最小功率和最大功率中的至少一个，并用得到的数值除以从功率样本的数量减去1(在减去最小功率和最大功率中的一个的情况下)或减去2(在减去最小功率和最大功率二者的情况下)的值，由此得到经修正的平均功率。
通过去除最小功率和最大功率中的至少一个来对平均功率进行修正，例如可以排除在预设功率范围内发生较大波动的功率样本(即，最小功率和/或最大功率)，从而获得更加准确的平均功率数据。
在本申请的实施例中，如图4所示，根据本申请的一些实施例的检测焊接激光的功率的方法还包括步骤401，在该步骤了中，根据所述焊接激光所焊接的位置，确定由所述激光器进行的焊接的工况。另外，该方法还可以包括步骤S402，在该步骤中基于焊接的工况确定预设功率范围。
在本申请的实施例中，焊接激光所焊接的位置可以指的是焊缝所在的位置，即，两个被焊接部分相交的位置。对于例如动力电池的激光焊接来说，所焊接的位置可以包括：极耳焊接、总线焊接、外壳焊接、防爆阀焊接等。不同的焊接位置可以对于焊接激光提出不同的要求。例如，极耳焊接要求焊接深度能够穿透极耳并将极耳和下方电极焊接到一起。外壳焊接要求激光能够形成连续和牢固的焊缝，以将外壳的两个部分连接起来，并且焊接激光不能穿透外壳，以免损伤电池体。对于外壳的侧缝焊接和顶缝焊接来说，侧缝焊接要求更长的焊缝长度和焊接时间以及更宽的焊缝宽度，而顶缝焊接可能需要更大的焊接深度。防爆阀焊接要求激光的焊接功率准确并稳定。激光器进行的焊接的工况指的是在使用激光器进行焊接时，激光器所要实现的工作情况。在本申请的实施例中，激光器的工况可以包括以下至少一个：焊接激光的功率要求、由激光器发射的激光的持续时间、激光的重复频率、激光的重复次数、焊接激光的功率稳定性等。如上所述，对于焊接激光所焊接的不同位置，激光器进行焊接的工况也会不同。因此，在本申请的实施例中，激光器的工况可以根据焊接激光所焊接的位置来确定。具体来说，激光器的工况可以根据激光器本身的工作能力以及从焊接位置的信息获得的焊接材料、焊接温度、焊缝深度、焊缝长度等焊接要求来确定。例如，对于焊接材料熔点高、焊接温度高或焊缝深度大的焊缝，例如，对于电池的外 壳的顶缝的焊接，焊接激光的功率要求可能较高。在这种工况下，可以根据焊接激光的功率要求确定预设功率范围，使得预设功率范围满足焊接激光的功率要求。另外，对于焊接长度长的焊缝，例如，对于电池的外壳的侧缝的焊接，由激光器发射的激光的持续时间可能较长。由于激光器本身的工作能力限制，为了达到该持续时间，可能需要相应控制激光器的发射功率。在这种工况下，可以根据由激光器发射的激光的持续时间确定预设功率范围，使得激光器能够以该预设功率范围的功率持续发射达到相应时间。另外，对于激光的重复频率高、重复次数多的工况，例如，对于电池的极耳的焊接，也可能需要相应控制激光器的发射功率。在这种工况下，可以根据由激光器发射的激光的重复频率和重复次数确定预设功率范围，使得激光器能够以该预设功率范围的功率持续发射达相应频率和次数。
在本申请的实施例中，预设功率范围的宽度也可以根据激光器进行的焊接的工况来确定。例如，在对焊接激光的功率稳定性要求不高的工况下，例如对于电池的外壳的焊接，可以将预设功率范围的宽度设置得较宽。例如，在由激光器发射的激光的持续时间较长的情况下，例如对于电池的防爆阀的焊接，考虑到激光器的发射功率的波动和衰减，也可以将预设功率范围的宽度设置得较宽。
此外，在本申请的一些实施例中，可以结合激光器的工况中的多个参数来确定预设功率范围。例如，可以结合焊接激光的功率要求和由激光器发射的激光的持续时间来确定预设功率范围，使得激光器能够以满足功率要求的预设功率范围内的功率持续发射达到相应的时间。
在本申请的实施例中，可以由控制器130和230根据焊接激光所焊接的位置，来确定由激光器进行的焊接的工况，并根据所确定的工况来确定预设功率范围。在本申请的另一个实施例中，控制器130和230可以根据反映了焊接激光所焊接的位置以及/或者直接反映了激光器的工况的用户输入来通过以上操作确定预设功率范围。
通过根据由焊接激光所焊接的位置确定激光器进行的焊接的工况，并进一步确定预设功率范围，例如可以根据要由激光器实现的工作情况来灵活地确定预设功率范围，使得预设功率范围符合实际情况。
在本申请的实施例中，步骤S402中的基于由激光器进行的焊接的工况确定预设功率范围可以包括基于由激光器进行的焊接的工况确定功率采集标准值。之后，在步骤S402中，可以针对功率采集标准值分别确定预设功率范围的下限值和上限值。
功率采集标准值指的是作为用于确定预设功率范围标准的数值。例如，可以将功率采集标准值上浮某一数值来确定预设功率范围的上限值，并且将功率采集标准值下降某一数值来确定预设功率范围的下限值。与上文讨论的内容类似，功率采集标准值也可以基于由激光器进行的焊接的工况来确定，在此不再详细描述。在本申请的实施例中，功率采集标准值可以近似等于焊接激光的功率要求。分别从功率采集标准值上浮和下降的数值可以彼此不同，并且可以根据实际需要确定。此外，如上文所讨论的，上浮和下降的数值的大小也可以根据激光器的工况来确定，在此不再详细描 述。
通过先确定功率采集标准值再针对功率采集标准值分别确定预设功率范围的下限值和上限值，例如可以简化确定功率采集标准值和预设功率范围的过程，增加设置灵活性。
本领域技术人员可以明白，步骤S401和S402是可选的步骤。换言之，根据本申请的实施例的方法可以不包括步骤S401和S402，并且在这种情况下可以直接使用默认的预设功率范围或由用户输入预设功率范围。
在本申请的一些实施例中，步骤S410、S420和S430可以是先后执行的。即，控制器130和230首先在步骤S410中采集多个功率样本。在多个功率样本采集完成之后，控制器130和230在步骤S420中获取这些功率样本中在预设功率范围内的多个功率样本。之后，控制器130和230在步骤S430中对所获取的多个功率样本一同进行处理。
在本申请的另一些实施例中，步骤S410、S420和S430可以是穿插重复执行的。即，控制器130和230在步骤S410中采样获得一个功率样本，之后就在步骤S420中尝试获取在预设功率范围内的一个功率样本。此时，如果在步骤S410中所采集的功率样本不在预设范围内，在步骤S420中就无法获取到功率样本。之后，控制器130和230在步骤S430中对在步骤S420中所获取的这一个样本进行处理，并得到中间功率检测结果。之后，控制器130和230返回到步骤S410，继续对激光的功率进行采样，并对这一个功率样本进行步骤S420和S430的操作。如此重复，在对最后一个功率样本完成步骤S420和S430的操作之后，控制器130和230就得到了功率检测结果。
本领域技术人员可以明白，结合以上两种实施例的描述，步骤S410、S420和S430也可以一部分先后执行，另一部分穿插重复执行，在此不再展开描述。
在本申请的一些实施例中，检测焊接激光的功率的方法还可以包括步骤S440，在该步骤中，发送功率检测结果。
在本申请的实施例中，功率检测结果可以从控制器130和140发送到上位机140和240。上位机140和240可以存储功率检测结果、向用户显示功率检测结果、对功率检测结果进行分析或者将功率检测结果再发送到其他设备。例如，功率检测结果可以被发送给生产管理系统(MES)。所存储的功率检测结果可以供之后追溯这次焊接的具体情况。例如，在查找焊接问题的原因或在研究改进焊接工艺等时，可以从所存储的功率检测结果查找得到这次焊接的激光功率的情况。通过对一个功率检测结果进行分析，可以检查本次焊接的质量是否发生问题。通过对多个功率检测结果进行分析，可以比较多次焊接之间的差异。
在本申请的其他实施例中，功率检测结果也可以从控制器130和140发送给其他计算机、服务器等。
所发送的功率检测结果可以被利用进行分析，提高功率检测结果的利用价值。
在本申请的一些实施例中，在步骤S440之前还可以包括步骤S435，在该步骤中，判断多个功率样本的数量是否满足数据量要求。
功率检测结果是通过对多个功率样本进行处理而产生的，并且当用于产生功率检测结果的功率样本的数量较少时，可能说明该功率检测结果较不准确、不具有代表性或者与其对应的焊接时长太短而不需要记录等。因此，可以对功率样本的数量设置基本的数据量要求，并且仅对满足数据量要求的功率检测结果进行发送。数据量要求可以根据实际需要来设置。例如，数据量要求可以被设置为10个。在这种情况下，只有通过对10个以上的功率样本进行处理而获得的功率检测结果，才被发送出去。数据量要求也可以被设置为50个、100个等。
之后，在判断为与功率检测结果对应的功率样本的数量满足数据量要求时，方法进行到步骤S440，并且在该步骤发送功率检测结果。
另外，在判断为与功率检测结果对应的功率样本的数量不满足数据量要求时，方法进行到步骤S436，并且在该步骤不发送该功率检测结果。
通过响应于多个功率样本的数量满足数据量要求，发送功率检测结果，可以减小所发送的功率检测结果的数量，避免发送没有价值的功率检测结果等。
接下来参照图6，图6示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图。图6中的步骤S610、S620和S630分别对应于图4的步骤S410、S420和S430，并且因此不再详细描述。
在本申请的实施例中，如图6所示，在步骤S610中获得至少一个功率样本，其中，该功率样本为在每隔预设时间段内，对激光的功率进行采样获得的，并且在步骤S620中获取在预设功率范围内的功率样本。之后，还可以包括步骤S625，在该步骤中判断在预设功率范围内的多个功率样本的数量是否达到数据量上限。通过执行步骤S610和步骤S620，所获取的在预设功率范围内的功率样本的数量随着激光发射的时间增加而越来越多。在激光发射的时间较长的情况下，所获取的在预设功率范围内的功率样本的数量可能会过多，并且超出对激光功率进行有效记录和分析所需的数目。数量过多的功率样本可能会不必要地增加控制器130和230的处理负担，增加处理成本。因此，可以对在预设功率范围内的功率样本的数量设置数据量上限，并且对超出数据量上限的功率样本不再进行采集或处理。数据量上限可以根据实际需要来设置。例如，数据量上限可以被设置为300个。在这种情况下，当所获取的在预设功率范围内的功率样本的数量达到300个时，不再获取在预设功率范围内的多个功率样本，从而避免要由控制器130和230处理的功率样本的数量过度增加。
之后，在判断为在预设功率范围内的功率样本的数量未达到数据量上限时，方法返回到步骤S610，并且在该步骤继续对激光功率进行采样。
另外，在判断为与功率检测结果对应的功率样本的数量达到数据量上限时，方法进行到步骤S630并停止对由激光器发射的用于焊接的激光的功率进行采样。
通过对在预设功率范围内的功率样本的数量设置数据量上限，可以避免增加处理负担和处理成本。
在本申请的实施例中，可以根据所述焊接激光所焊接的位置，确定由所述激光器进行的焊接的工况，并且根据由激光器进行的焊接的工况确定该数据量上限。例如，对于功率稳定性要求较低的焊接位置，在对应工况下例如可以设置较高的数据量上限，从而获得更多的数据以进行分析。另外，对于焊接长度长的焊接位置，在对应工况下例如可以设置较高的数据量上限，以获得对于该焊缝更全面的焊接激光功率信息。对于较高发射功率要求的焊接位置，在对应工况下例如可以设置较低的数据量上限，从而例如避免光电转换器长时间工作受到损伤。
由此，可以根据激光器的工况灵活地设置激光样本的数据量上限。
在本申请的实施例中，可以根据激光器发射一次激光的持续时间和预设时间段确定数据量上限。例如，可以将激光器发射一次激光的持续时间除以预设时间段，并根据所获得的商确定数据量上限。激光器发射一次激光的持续时间除以预设时间段而获得的商表示在整个激光发射的时间段中，能够获得的最大的功率样本的数量。由此获得的功率样本的数据量上限可以覆盖激光器发射激光的整个持续时间，从而避免数据丢失。
由此，可以确定能够覆盖激光器发射激光的整个持续时间的数据量上限。
在本申请的实施例中，可以根据激光器发射一次激光的持续时间、激光器的输出功率的下降时间和预设时间段确定数据量上限。如参照图1和图5描述的，在激光发射结束之前，激光的功率有会经历下降阶段T3，即，在该阶段中从稳定发射的功率下降到零功率。在激光功率的下降阶段T3中的功率样本可能会不在预设功率范围内并且因此即使在步骤S610中对其采样也将不会在步骤S630中对其进行处理。在本申请的实施例中，例如可以根据将激光器发射一次激光的持续时间与激光器的输出功率的下降时间之差除以预设时间段而获得的商确定数据量上限。将激光器发射一次激光的持续时间减去激光器的输出功率的下降时间，所获得的差就是去掉激光功率的下降阶段的时间长度。用如此获得的差除以预设时间段而获得的商表示在去掉下降阶段T3之后的激光发射的时间段中，能够获得的最大的功率样本的数量。由此获得的功率样本的数据量上限可以排除掉激光功率的下降阶段T3，减少所获得的数据量，降低处理负担和成本。
由此，可以确定能够排除激光器的输出功率的下降时间的数据量上限。
在本申请的实施例中，可以根据激光的功率在预设功率范围内的持续时间和预设时间段确定数据量上限。如参照图1和图5描述的，在每一次激光发射刚开始时，激光的功率会先经历爬坡阶段T1，即，在该阶段中从零功率上升到稳定发射的功 率。类似于激光功率的下降阶段T3，在激光功率的爬坡阶段T1中的功率样本可能会不在预设功率范围内并且因此即使在步骤S610中对其采样也将不会在步骤S630中对其进行处理。在本申请的实施例中，可以根据将激光的功率在预设功率范围内的持续时间除以预设时间段而获得的商确定数据量上限。将激光器发射一次激光的持续时间减去激光器的输出功率的爬坡时间和下降时间二者，所获得的差就是去掉激光功率的爬坡阶段和下降阶段的时间长度。在本申请的实施例中，如此获得的差可以表示激光的功率在预设功率范围内的持续时间。用如此获得的差除以预设时间段而获得的商表示在激光的功率在预设功率范围中，能够获得的最大的功率样本的数量。由此获得的功率样本的数据量上限可以排除掉激光功率的爬坡阶段T1和下降阶段T3，进一步减少所获得的数据量，进一步降低处理负担和成本。
由此，可以确定能够排除激光器的输出功率的爬坡时间和下降时间的数据量上限。
本领域技术人员可以明白，在本申请的实施例中，可以对在预设功率范围内的多个功率样本的数量不设置数据量上限。例如，在本申请的一些实施例中，可以根据激光的一次发射是否发射结束来确定是否停止对由激光器发射的激光的功率进行采样。由此，可以在一次激光发射的整个时间段中对激光的功率进行采样，从而最大限度地避免样本遗漏。例如，在本申请的一个实施例中，可以在从激光器接收的激光发射信号停止时或者从激光器接收到激光发射结束信号时，认为一次激光发射已经停止并且因此停止对由激光器发射的激光的功率进行采样。例如，在本申请的另一个实施例中，可以在对激光的功率进行采样的结果接近于零达某一时间段之后，认为一次激光发射已经停止并且因此停止对由激光器发射的激光的功率进行采样。该时间段例如可以小于两次激光发射之间的间隔，并且大于对激光采样的预设时间段。
由此，可以避免在激光发射已经停止之后继续对激光的功率进行采样。
此外，本领域技术人员可以明白，在本申请的实施例中，可以对在预设功率范围内的多个功率样本的数量设置数据量上限，同时还确定激光的一次发射是否发射结束。由此，在多个功率样本的数量达到数据量上限和确定激光的一次发射结束这两种情况中的一个得到满足时，即确定停止对由激光器发射的激光的功率进行采样。
由此，可以更加灵活地设置何时停止对激光的功率进行采样。
接下来参照图7，图7示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图。
在以上参照图4和图6描述的步骤S410和S610中，获得至少一个功率样本，其中，该功率样本为在每隔预设时间段内，对激光的功率进行采样得到的。对于所获得的功率样本，本申请的方法还可以包括步骤S710，在该步骤处，判断所获得的功率样本是否大于功率阈值。功率阈值可以大于或等于预设功率范围的上限值。当激光的功率样本大于该功率阈值时，可以认为该激光的功率过高，并且可能会导致焊接 问题。例如，可能会发生焊接深度过大或者激光击穿焊接件的情况。之后，在步骤S720处，在所获得的功率样本大于功率阈值的情况下，生成指示激光的功率超过功率阈值的信息。否则，在步骤S730处，在所获得的功率样本不大于功率阈值的情况下，不生成指示激光的功率超过功率阈值的信息。
所生成的指示激光的功率超过功率阈值的信息可以被提供给用户以通知激光的功率过高，从而提醒用户检查焊接的质量并进行相应处理。另外，所生成的指示激光的功率超过功率阈值的信息也可以被存储以供之后检查和追溯。
由此，可以发现焊接激光的功率过高的情况，发现并记录的激光焊接的异常情况。
图7中示出的步骤可以在图4和图6描述的步骤S410和S610之后执行，并且可以在图4和图6描述的步骤S420和S620之前执行或者与步骤S420和S620并行执行。当图7中示出的步骤在图4和图6描述的步骤S420和S620之前执行时，可以使得超过功率阈值的激光样本不进行步骤S420和S620的处理，从而减轻处理负担和成本。
接下来参照图8，图8示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图。
在以上参照图4和图6描述的步骤S410和S610中，获得至少一个功率样本，其中，该功率样本为在每隔预设时间段内，对激光的功率进行采样得到的。对于所获得的功率样本，本申请的方法还可以包括步骤S802，在该步骤处，判断在阈值时间段内对激光的功率进行采样所获得的功率样本是否都小于预设功率范围的下限值。该阈值时间段可以是根据激光器的输出功率的爬坡时间确定的。在本申请的实施例中，该阈值时间段可以等于或大于激光器的输出功率的爬坡时间。当在大于输出功率的爬坡阶段T1的时间段之内，激光器的功率始终没有达到预设功率范围的下限值的情况下，可以认为激光器的功率无法爬坡达到预设功率范围。例如，激光器可能出现了故障或者激光器本身的工作能力无法实现预设功率范围的输出。在激光的发射功率低于预设功率的下限值的情况下，这样的激光无法达到焊接要求并且因此无法完成本次焊接。例如，可能会发生无法熔化焊接材料、焊接深度过低等情况。
之后，在步骤S804处，当在阈值时间段内对激光的功率进行采样所获得的功率样本都小于预设功率范围的下限值的情况下，可以获得指示激光器进行补焊的补焊信息。否则，在步骤S806处，当在阈值时间段内对激光的功率进行采样所获得的功率样本中的至少一个大于预设功率范围的下限值的情况下，不获得指示激光器进行补焊的补焊信息。
指示激光器进行补焊的补焊信息例如可以包括需要进行补焊的标记、关于前一次焊接的信息、进行补焊所需的补焊能量等。关于前一次焊接的信息可以包括刚进行的前一次焊接的焊接功率、焊接持续时间等信息。进行补焊所需的能量可以根据 关于前一次焊接的信息来确定。例如，可以根据前一次焊接的激光功率、焊接持续时间等来确定补焊的功率，
由此，可以发现焊接激光的功率过低的情况，并产生进行补焊的信息。
在步骤S804之后，在进行补焊期间，可以进行步骤S810、S820和S830。步骤S810、S820和S830与在先参照图4描述的步骤S410、S420和S430类似。即，在步骤S810处，获得至少一个功率样本，该功率样本为在每隔预设时间段内，对由激光器基于补焊信息发射的激光的功率进行采样得到的。在步骤S820处，获取至少一个补焊功率样本中在预设功率范围内的多个补焊功率样本。在步骤S830处，在预设功率范围内的多个补焊功率样本进行处理，以获得补焊功率检测结果。本申请中参照以上实施例描述的内容都可以结合到图8所示的实施例中，并且在此不再进行重复。
由此，可以在补焊过程中检测焊接激光的功率，实现对补焊的激光功率的监视。
与图7中示出的步骤类似，图8中示出的步骤S802、S804和S806可以在图4和图6描述的步骤S410和S610之后执行，并且可以在图4和图6描述的步骤S420和S620之前执行或者与步骤S420和S620并行执行。当图8中示出的步骤S802、S804和S806在图4和图6描述的步骤S420和S620之前执行时，在本申请的一些实施例中，可以停止对激光的功率进行采样，即，停止进行步骤S420和S620，从而减轻处理负担和成本。或者，在本申请的另一些实施例中，可以不停止对激光的功率进行采样，并将所采样的数据记录下来，作为关于前一次焊接的信息。
接下来参照图9，图9示出了根据本申请的另一些实施例的检测焊接激光的功率的方法的流程图。
与图8的方法类似，在图9的方法中还包括步骤S902，并且在步骤S902中对于所获得的功率样本，判断在阈值时间段内对激光的功率进行采样所获得的功率样本是否都小于预设功率范围的下限值。
之后，在步骤S904处，当在阈值时间段内对激光的功率进行采样所获得的功率样本都小于预设功率范围的下限值的情况下，可以获得指示由激光器进行的焊接失败的信息。否则，在步骤S906处，当在阈值时间段内对激光的功率进行采样所获得的功率样本中的至少一个大于预设功率范围的下限值的情况下，不获得指示由激光器进行的焊接失败的信息。
指示由激光器进行的焊接失败的信息例如可以包括指示这次焊接失败、焊缝质量不合格、所焊接的物品应当报废、指示用户检查激光器是否正常等。
由此，可以发现焊接失败的情况，及时将焊接失败的物品从生产流水线上剔除，停止对该物品进行下一步处理。
与图8中示出的步骤类似，图9中示出的步骤S902、S904和S906也可以 在图4和图6描述的步骤S410和S610之后执行，并且可以在图4和图6描述的步骤S420和S620之前执行或者与步骤S420和S620并行执行。
图10示出了根据本公开的示例性实施例的其中可应用本公开的一般硬件环境1000。
参考图10，现在将描述作为可应用于本公开的各方面的硬件设备的示例的计算设备1000。计算设备1000可以是被配置成执行处理和/或计算的任何机器，可以是但不限于工作站、服务器、台式计算机、膝上型计算机、电视机、平板计算机、个人数字助理、智能电话、便携式相机或其任意组合。本申请的以上方法可以整体或至少部分地由计算设备1000或类似的设备或系统来实现。
计算设备1000可以包括能够经由一个或多个接口与总线1002连接或者与总线1002通信的元件。例如，计算设备1000可以包括总线1002、一个或多个处理器1004、一个或多个输入设备1006以及一个或多个输出设备1008。一个或多个处理器1004可以是任何类型的处理器，并且可以包括但不限于一个或多个通用处理器和/或一个或多个专用处理器(诸如专用处理芯片)。输入设备1006可以是能够向计算设备输入信息的任何类型的设备，并且可以包括但不限于鼠标、键盘、触摸屏、麦克风和/或遥控器。根据本公开的一些实施例，输入设备1006还可以包括摄像头。输出设备1008可以是能够呈现信息的任何类型的设备，并且可以包括但不限于显示器、扬声器、视频/音频输出终端和/或打印机。计算设备1000还可以包括非瞬态存储设备1010或与非瞬态存储设备1010连接，非瞬态存储设备1010可以是非瞬态的并且可以实现数据存储库的任何存储设备，并且可以包括但不限于盘驱动器、光学存储设备、固态存储装置、软盘、柔性盘、硬盘、磁带或任何其它磁性介质、紧凑型盘或任何其它光学介质、ROM(只读存储器)、RAM(随机存取存储器)、高速缓存存储器和/或任何其它存储器芯片或盒带、和/或计算机可以从其读取数据、指令和/或代码的任何其它介质。非瞬态存储设备1010可以是可从接口拆卸的。非暂态存储设备1010可以具有用于实现上述方法和步骤的数据/指令/代码。计算设备1000还可以包括通信设备1012。通信设备1012可以是能够与外部装置和/或与网络通信的任何类型的设备或系统，并且可以包括但不限于调制解调器、网络卡、红外通信设备、无线通信装备和/或诸如蓝牙TM设备、802.11设备、WiFi设备、WiMax设备、蜂窝通信设施等的芯片组。
总线1002可以包括但不限于工业标准体系架构(ISA)总线、微通道体系架构(MCA)总线、增强型ISA(EISA)总线、视频电子标准协会(VESA)本地总线和外围组件互连(PCI)总线。
计算设备1000还可以包括工作存储器1014，工作存储器1014可以是可以存储对处理器1004的工作有用的指令和/或数据的任何类型的工作存储器，并且可以包括但不限于随机存取存储器和/或只读存储器设备。
软件要素可以位于工作存储器1014中，包括但不限于操作系统1016、一个或多个应用程序1018、驱动程序和/或其它数据和代码。用于执行上述方法和步骤的指 令可以被包括在一个或多个应用程序1018中。软件要素的指令的可执行代码或源代码可以存储在非瞬态计算机可读存储介质(诸如上述(一个或多个)存储设备1010)中，并且可以在可能编译和/或安装的情况下被读入到工作存储器1014中。软件要素的指令的可执行代码或源代码也可以从远程位置下载。
从上述实施例中，本领域技术人员可以清楚地知晓，可以通过软件及必要的硬件来实现本公开，或者可以通过硬件、固件等来实现本公开。基于这种理解，可以部分地以软件形式来实现本公开的实施例。计算机软件可以存储在计算机的可读存储介质中，比如软盘、硬盘、光盘或闪存中。计算机软件包括使得计算机(例如个人计算机、服务站或网络终端)运行根据本公开的各个实施例的方法或其一部分的一系列指令。
对应地，根据本申请的一些实施例，本申请还提供了一种非瞬态计算机可读存储介质，其上存储有指令，当该指令由处理器执行时实现以上方法中的部分或全部步骤。
对应地，根据本申请的一些实施例，本申请还提供了一种计算机程序产品，其包含指令，当该指令由处理器执行时执行以上方法中的部分或全部步骤。
根据本申请的一些实施例，参见图3至图9，本申请提供了一种检测焊接激光的功率的方法。该方法包括获得至少一个功率样本，该功率样本为在每隔预设时间段内，对由激光器发射的焊接激光的功率进行采样得到。该方法还包括获取至少一个功率样本中的在预设功率范围内的多个功率样本。该方法还可以包括确定多个功率样本的最小功率和最大功率，以及对多个功率样本求平均，以获得平均功率。功率检测结果可以包括最小功率、最大功率和平均功率。该方法还可以包括将最小功率、最大功率和平均功率作为功率检测结果发送出去，例如上传到记录系统。
最后应说明的是：以上各实施例仅用以说明本申请的技术方案，而非对其限制；尽管参照前述各实施例对本申请进行了详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分或者全部技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例技术方案的范围，其均应涵盖在本申请的权利要求和说明书的范围当中。尤其是，只要不存在结构冲突，各个实施例中所提到的各项技术特征均可以任意方式组合起来。本申请并不局限于文中公开的特定实施例，而是包括落入权利要求的范围内的所有技术方案。

Claims (20)

  1. 一种检测焊接激光的功率的方法，其特征在于，所述方法包括：
    获得至少一个功率样本，其中，所述功率样本为在每隔预设时间段内，对由激光器发射的焊接激光的功率进行采样得到；
    获取所述至少一个功率样本中的在预设功率范围内的多个功率样本；和
    对在所述预设功率范围内的所述多个功率样本进行处理，以获得功率检测结果。
  2. 如权利要求1所述的方法，其特征在于，对在所述预设功率范围内的所述多个功率样本进行处理包括：
    确定所述多个功率样本的最小功率和最大功率中的至少一个，其中，所述功率检测结果包括最小功率和最大功率中的所述至少一个。
  3. 如权利要求1或2所述的方法，其特征在于，对在所述预设功率范围内的所述多个功率样本进行处理包括：
    对所述多个功率样本求平均，以获得平均功率，其中，所述功率检测结果包括所述平均功率。
  4. 如权利要求2所述的方法，其特征在于，对在所述预设功率范围内的所述多个功率样本进行处理包括：
    对所述多个功率样本中除最小功率和最大功率中的所述至少一个之外的功率求平均，以获得经修正的平均功率，其中，所述功率检测结果包括所述经修正的平均功率。
  5. 如权利要求1至4中任一项所述的方法，其特征在于，所述方法还包括：
    根据所述焊接激光所焊接的位置，确定由所述激光器进行的焊接的工况；
    根据所述焊接的工况确定所述预设功率范围。
  6. 如权利要求5所述的方法，其特征在于，所述方法还包括：
    根据所述焊接的工况确定功率采集标准值；和
    针对所述功率采集标准值分别确定所述预设功率范围的下限值和上限值。
  7. 如权利要求1至6中任一项所述的方法，其特征在于，所述方法还包括：
    判断在所述预设功率范围内的所述多个功率样本的数量是否满足数据量要求；和
    响应于所述多个功率样本的数量满足数据量要求，发送所述功率检测结果。
  8. 如权利要求1至7中任一项所述的方法，其特征在于，所述方法还包括：
    判断在所述预设功率范围内的所述多个功率样本的数量是否达到数据量上限；和
    响应于所述多个功率样本的数量达到数据量上限，停止对由所述激光器发射的用于焊接的激光的功率进行采样。
  9. 如权利要求8所述的方法，其特征在于，所述方法还包括：
    根据所述焊接激光所焊接的位置，确定由所述激光器进行的焊接的工况；
    根据所述焊接的工况确定所述数据量上限。
  10. 如权利要求8所述的方法，其特征在于，所述方法还包括：
    根据所述激光器发射一次激光的持续时间和所述预设时间段确定所述数据量上限。
  11. 如权利要求8所述的方法，其特征在于，所述方法还包括：
    根据所述激光器发射一次激光的持续时间、所述激光器的输出功率的下降时间和所述预设时间段确定所述数据量上限。
  12. 如权利要求8所述的方法，其特征在于，所述方法还包括：
    根据所述激光的功率在所述预设功率范围内的持续时间和所述预设时间段确定所述数据量上限。
  13. 如权利要求1至12中任一项所述的方法，其特征在于，所述方法还包括：
    响应于对所述激光的功率进行采样所获得的功率样本大于功率阈值，生成指示所述激光的功率超过功率阈值的信息，所述功率阈值大于或等于所述预设功率范围的上限值。
  14. 如权利要求1至13中任一项所述的方法，其特征在于，所述方法还包括：
    响应于在阈值时间段内对所述激光的功率进行采样所获得的功率样本都小于所述预设功率范围的下限值，获得指示所述激光器进行补焊的补焊信息，其中所述阈值时间段是根据所述激光器的输出功率的爬坡时间确定的。
  15. 如权利要求14所述的方法，其特征在于，所述方法还包括：
    获得至少一个补焊功率样本，其中，所述补焊功率样本为在每隔预设时间段内，对由所述激光器基于所述补焊信息发射的激光的功率进行采样得到；
    获取所述至少一个补焊功率样本中在所述预设功率范围内的多个补焊功率样本；和
    对在所述预设功率范围内的多个补焊功率样本进行处理，以获得补焊功率检测结果。
  16. 如权利要求1至13中任一项所述的方法，其特征在于，所述方法还包括：
    响应于在阈值时间段内对所述激光的功率进行采样所获得的功率样本都小于所述预设功率范围的下限值，获得指示由所述激光器进行的焊接失败的信息，其中所述阈值时间段是根据所述激光器的输出功率的爬坡时间确定的。
  17. 一种激光焊接系统，其特征在于，所述系统包括：
    激光器，被配置为发射用于焊接的激光并且包括通讯接口；
    振镜，被配置为从所述激光器接收所述激光并操纵所述激光进行焊接；
    控制器，包括通讯接口并且被配置为通过所述通讯接口经由通讯线路耦合到所述激光器的通讯接口，以从所述激光器接收由所述激光器发射的用于焊接的激光的功率；和
    上位机，被配置为可通信地耦合到所述控制器并从所述控制器接收所述功率检测结果；
    其中，所述控制器被配置为执行如权利要求1-16中任一项所述的方法。
  18. 一种激光焊接系统，其特征在于，所述系统包括：
    激光器，被配置为发射用于焊接的激光；
    振镜，被配置为从所述激光器接收所述激光；
    振镜控制单元，被配置为控制所述振镜来操纵所述激光进行焊接；
    功率模拟量获取单元，被配置为获取表示由所述激光器发射的用于焊接的激光的功率的模拟量；
    控制器，被配置为通过导线从所述功率模拟量获取单元接收表示由所述激光器发射的用于焊接的激光的功率的模拟量，并且根据所述模拟量获得由所述激光器发射的用于焊接的激光的功率；和
    上位机，被配置为可通信地耦合到所述控制器并从所述控制器接收所述功率检测结果；
    其中，所述控制器被配置为执行如权利要求1-16中任一项所述的方法。
  19. 一种非瞬态计算机可读存储介质，其特征在于，存储有指令，当所述指令由处理器执行时使得执行如权利要求1-16中的任一项所述的方法。
  20. 一种计算机程序产品，其特征在于，包含指令，当所述指令由处理器执行时使得执行如权利要求1-16中的任一项所述的方法。
PCT/CN2023/101704 2023-06-21 2023-06-21 检测焊接激光的功率的方法和激光焊接系统 Ceased WO2024259630A1 (zh)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP23837542.2A EP4506668A4 (en) 2023-06-21 2023-06-21 Method for measuring the power of a welding laser and laser welding system
PCT/CN2023/101704 WO2024259630A1 (zh) 2023-06-21 2023-06-21 检测焊接激光的功率的方法和激光焊接系统
CN202380060964.2A CN119731516B (zh) 2023-06-21 2023-06-21 检测焊接激光的功率的方法和激光焊接系统
US18/537,848 US20240424610A1 (en) 2023-06-21 2023-12-13 Method for detecting power of welding laser light and laser welding system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2023/101704 WO2024259630A1 (zh) 2023-06-21 2023-06-21 检测焊接激光的功率的方法和激光焊接系统

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US18/537,848 Continuation US20240424610A1 (en) 2023-06-21 2023-12-13 Method for detecting power of welding laser light and laser welding system

Publications (1)

Publication Number Publication Date
WO2024259630A1 true WO2024259630A1 (zh) 2024-12-26

Family

ID=93928329

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2023/101704 Ceased WO2024259630A1 (zh) 2023-06-21 2023-06-21 检测焊接激光的功率的方法和激光焊接系统

Country Status (4)

Country Link
US (1) US20240424610A1 (zh)
EP (1) EP4506668A4 (zh)
CN (1) CN119731516B (zh)
WO (1) WO2024259630A1 (zh)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150190884A1 (en) * 2014-01-06 2015-07-09 Teledyne Instruments, Inc. Laser-ablation-based material analysis system with a power/energy detector
CN109217102A (zh) * 2018-11-05 2019-01-15 广东水利电力职业技术学院（广东省水利电力技工学校） 一种激光功率监测系统及监测方法
CN109596214A (zh) * 2018-12-29 2019-04-09 浙江理工大学 一种激光器输出功率检测系统及检测方法
CN115824400A (zh) * 2022-07-01 2023-03-21 宁德时代新能源科技股份有限公司 激光功率检测系统、焊接系统和激光焊接工件的检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITTO20020508A1 (it) * 2002-06-14 2003-12-15 Fiat Ricerche Sistema e procedimento per il monitoraggio di saldature laser
CN201680906U (zh) * 2009-11-27 2010-12-22 北京工业大学 一种大功率激光在线数字测试仪器
CN102507000B (zh) * 2011-10-10 2014-01-08 武汉华工激光工程有限责任公司 一种激光焊接机输出激光能量的检测电路
US10101201B2 (en) * 2013-11-13 2018-10-16 Medtronic, Inc. System for continuous laser beam monitoring and analysis
US20170242424A1 (en) * 2016-02-19 2017-08-24 General Electric Company Laser power monitoring in additive manufacturing
CN211708366U (zh) * 2019-09-26 2020-10-20 大族激光科技产业集团股份有限公司 一种半导体激光电源、功率可调的激光器及焊接装置
CN112729774B (zh) * 2020-12-03 2022-06-28 四川知周科技有限责任公司 共光路激光点火及通路损耗检测装置
CN114682940B (zh) * 2022-04-20 2024-10-15 武汉光芯光电技术有限公司 光纤激光焊接机在线监测系统、应用及光纤激光焊接机

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150190884A1 (en) * 2014-01-06 2015-07-09 Teledyne Instruments, Inc. Laser-ablation-based material analysis system with a power/energy detector
CN109217102A (zh) * 2018-11-05 2019-01-15 广东水利电力职业技术学院（广东省水利电力技工学校） 一种激光功率监测系统及监测方法
CN109596214A (zh) * 2018-12-29 2019-04-09 浙江理工大学 一种激光器输出功率检测系统及检测方法
CN115824400A (zh) * 2022-07-01 2023-03-21 宁德时代新能源科技股份有限公司 激光功率检测系统、焊接系统和激光焊接工件的检测方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP4506668A4 *

Also Published As

Publication number Publication date
EP4506668A1 (en) 2025-02-12
EP4506668A4 (en) 2025-05-07
CN119731516A (zh) 2025-03-28
CN119731516B (zh) 2026-03-10
US20240424610A1 (en) 2024-12-26

Similar Documents

Publication Publication Date Title
US9476968B2 (en) System and method for monitoring optical subsystem performance in cloud LIDAR systems
CN115275760B (zh) 一种激光功率稳定装置
CN106352905A (zh) 一种光纤光栅解调系统及解调仪
US20240217028A1 (en) Laser power detection system, welding system, and inspection method for laser welded workpiece
CN110275156B (zh) 激光雷达中雪崩光电二极管的偏置电压标定方法及装置
CN108665453A (zh) 焊点检测方法及装置
CN113465746B (zh) 一种用于工业炉测温的全自动红外测温系统
CN118758585A (zh) 蠕动泵的管内压力检测方法、系统、电子设备及存储介质
EP4506668A1 (en) Method for measuring power of welding laser, and laser welding system
CN111726162A (zh) 光纤断点检测装置及检测系统、以及检测方法
CN118225153A (zh) 光电传感器校准检测方法、装置、光电传感器及存储介质
CN112787714B (zh) 光纤监测方法、设备、系统及存储介质
CN119044718A (zh) 一种半导体测试方法、电子设备、半导体检测系统及介质
CN118746859A (zh) 触发式抗干扰信号的方法、系统、设备及存储介质
CN117870786A (zh) 一种超声波流量计的信号采集方法、系统、设备及可读介质
TWI479119B (zh) Optical measuring device and optical measuring method
CN101344442B (zh) 一种自动校准型分布式光纤测温传感装置及其使用方法
CN117153714B (zh) 焊接键合的检测方法、系统、设备及其介质
CN121411182B (zh) 基于自适应采样的功率源控制方法及系统
CN211824749U (zh) 一种基于人脸识别的测温装置
US11333602B2 (en) Fluid measuring apparatus
CN115524096B (zh) 一种光纤线路衰减测量方法、装置、电子设备及存储介质
CN119309500B (zh) 一种智能键合金丝的长度识别方法及系统
CN116067983B (zh) 一种检测装置及方法
CN120778242A (zh) 应用于杜瓦罐的测温装置及杜瓦罐

Legal Events

Date Code Title Description
ENP Entry into the national phase

Ref document number: 2023837542

Country of ref document: EP

Effective date: 20240118

WWE Wipo information: entry into national phase

Ref document number: 202380060964.2

Country of ref document: CN

WWP Wipo information: published in national office

Ref document number: 202380060964.2

Country of ref document: CN

NENP Non-entry into the national phase

Ref country code: DE