WO2025030879A1 - 涂布纠偏的方法和装置 - Google Patents

涂布纠偏的方法和装置 Download PDF

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Publication number
WO2025030879A1
WO2025030879A1 PCT/CN2024/084514 CN2024084514W WO2025030879A1 WO 2025030879 A1 WO2025030879 A1 WO 2025030879A1 CN 2024084514 W CN2024084514 W CN 2024084514W WO 2025030879 A1 WO2025030879 A1 WO 2025030879A1
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WIPO (PCT)
Prior art keywords
correction amount
misalignment
misalignment value
target
preset
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PCT/CN2024/084514
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English (en)
French (fr)
Inventor
胡良锦
马林
王晞
徐小伟
石德伟
易婷婷
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Contemporary Amperex Technology Co Ltd
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Contemporary Amperex Technology Co Ltd
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Application filed by Contemporary Amperex Technology Co Ltd filed Critical Contemporary Amperex Technology Co Ltd
Priority to EP24850536.4A priority Critical patent/EP4597597A4/en
Publication of WO2025030879A1 publication Critical patent/WO2025030879A1/zh
Priority to US19/206,850 priority patent/US20250269399A1/en
Anticipated expiration legal-status Critical
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/04—Processes of manufacture in general
    • H01M4/0402—Methods of deposition of the material
    • H01M4/0404—Methods of deposition of the material by coating on electrode collectors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H23/00—Registering, tensioning, smoothing or guiding webs
    • B65H23/02—Registering, tensioning, smoothing or guiding webs transversely
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H23/00—Registering, tensioning, smoothing or guiding webs
    • B65H23/02—Registering, tensioning, smoothing or guiding webs transversely
    • B65H23/032—Controlling transverse register of web
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H26/00—Warning or safety devices, e.g. automatic fault detectors, stop-motions, for web-advancing mechanisms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/04—Processes of manufacture in general
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/04—Processes of manufacture in general
    • H01M4/0402—Methods of deposition of the material
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Definitions

  • the present application relates to the field of battery manufacturing technology, and in particular to a coating deviation correction method and device.
  • the production process of batteries is relatively complex and includes multiple processes, among which the coating process is an important link that cannot be ignored and has a crucial impact on battery performance.
  • the embodiments of the present application provide a coating deviation correction method and device, which can effectively improve the performance of the battery.
  • a method for coating correction comprising: obtaining a plurality of first distances and a plurality of second distances, wherein each of the plurality of first distances is a distance from an edge of a coating area on a first surface of an electrode substrate to a reference edge, each of the plurality of second distances is a distance from an edge of a coating area on a second surface of the electrode substrate to the reference edge, and the plurality of first distances and the plurality of second distances are obtained by sampling multiple times within a sampling period; determining a target correction amount in a coating process according to the plurality of first distances, the plurality of second distances and at least one preset correction amount.
  • the edges of the coating areas on the two corresponding surfaces of the electrode substrate are obtained.
  • the distance to the reference edge can determine the coating misalignment size between the two corresponding surfaces, and then determine the target correction amount in the coating process based on the preset correction amount, so that the target correction amount can be determined with higher efficiency and accuracy. Correction is performed based on the target correction amount so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • the multiple first distances and multiple second distances used to determine the target correction amount are obtained by sampling multiple times within a sampling period, that is, the number of parameters used to determine the target correction amount is large, so that the accuracy of the determined target correction amount can be effectively improved.
  • determining a target correction amount in the coating process based on the multiple first distances, the multiple second distances, and at least one preset correction amount includes: determining multiple initial correction amounts based on each first distance, the second distance corresponding to each first distance, and the at least one preset correction amount; determining the target correction amount based on the multiple initial correction amounts.
  • the above technical solution first determines multiple initial correction amounts based on each first distance, each second distance and at least one preset correction amount, and then determines the target correction amount based on the multiple initial correction amounts. That is, an intermediate parameter is determined in the correction process, and the final target correction amount is determined based on the intermediate parameter, thereby effectively reducing the complexity of the entire process and effectively improving the correction efficiency.
  • determining the target correction amount based on the multiple initial correction amounts includes: determining the target correction amount based on an average value of the multiple initial correction amounts.
  • the above technical solution determines the target deviation correction amount according to the average value of multiple initial deviation correction amounts. It has less computational complexity, is simple to implement, and greatly improves the computational speed.
  • the multiple first distances include a first target distance
  • the multiple second distances include a second target distance
  • the first target distance and the second target distance are distances acquired in the same sampling
  • the multiple initial correction amounts are determined according to each first distance, the second distance corresponding to each first distance, and the at least one preset correction amount, including: determining a first misalignment value set according to the first target distance and the second target distance, the first misalignment value set including a first misalignment value between an edge of a coating area on at least one first surface and an edge of a corresponding coating area on the second surface in the width direction of the pole piece substrate; determining a first initial correction amount among the multiple initial correction amounts according to the first misalignment value and the at least one preset correction amount.
  • the above technical solution according to a first distance among a plurality of first distances and a second distance corresponding thereto
  • the misalignment value between two corresponding surfaces is determined by the distance, which is simple to implement and effectively reduces the complexity of implementation.
  • an initial correction amount in the initial correction amount is determined according to the misalignment value between the two corresponding surfaces and the preset correction amount, so that the initial correction amount can be determined with high efficiency and accuracy.
  • determining the first initial correction amount among the multiple initial correction amounts based on the first misalignment value and the at least one preset correction amount includes: using the at least one preset correction amount to perform initial correction on the first misalignment values in turn to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set being a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of the at least one second misalignment value set is the same as the number of the at least one preset correction amount; determining the first initial correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value.
  • the above technical solution first uses a preset correction amount to perform initial correction on the misalignment value between two corresponding surfaces, and then determines the initial correction amount based on the result of the initial correction, which helps to eliminate inappropriate correction amounts in the preset correction amount, so that the amount of calculation for determining the initial correction amount can be reduced, thereby improving the efficiency of determining the initial correction amount and performing correction.
  • the technical solution adopts closed-loop logic, so as to further improve the accuracy of the initial correction amount.
  • each second misalignment value set in the at least one second misalignment value set includes at least one second misalignment value
  • determining the first initial correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value includes: selecting the second misalignment value with the largest absolute value in each second misalignment value set in the at least one second misalignment value set; determining a second target misalignment value, the second target misalignment value being a misalignment value that is smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, the first target misalignment value being the misalignment value with the largest absolute value in the first misalignment value set; determining the first initial correction amount based on a first preset correction amount in the at least one preset correction amount, the first preset correction amount including the preset correction amount corresponding to the second target misalignment value.
  • the above technical solution selects the deviation value after the initial deviation correction whose absolute value is smaller than the deviation value before correction, and determines the initial deviation correction amount based on the deviation correction amount corresponding to the selected deviation value, that is, abandons the inappropriate deviation correction amount. In this way, not only the probability of deviation becoming worse with correction is reduced, but also the number of appropriate deviation correction amounts selected may be less than that at the beginning. The number of preset correction amounts effectively reduces the time spent on determining the initial correction amount and improves efficiency.
  • determining the first initial correction amount based on a first preset correction amount among the at least one preset correction amount includes: selecting a misalignment value set after initial correction of the first misalignment value using the first preset correction amount in the second misalignment value set to obtain at least one second target misalignment value set; and determining the first initial correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • the above technical solution determines the initial correction amount based on the misalignment value after initial correction of the misalignment value between the two surfaces using a suitable correction amount, which can greatly improve the accuracy of the determined initial correction amount.
  • determining the first initial correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set includes: adding the second misalignment values included in each second target misalignment value set to obtain at least one sum of misalignment values; and determining the first preset correction amount corresponding to the sum of misalignment values with the smallest absolute value in the at least one sum of misalignment values as the first initial correction amount.
  • the above technical scheme determines the preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the sum of the misalignment values as the initial correction amount.
  • the accuracy of the initial correction amount determined in this way is high, and the accuracy of the target correction amount determined based on the initial correction amount is also high, so that the effect after correction based on the target correction amount is better, further improving the performance of the battery.
  • determining the first initial correction amount based on the first preset correction amount among the at least one preset correction amount includes: determining the first preset correction amount as the first initial correction amount.
  • the first preset correction amount is determined as the initial correction amount, which not only greatly reduces the computational complexity but also increases the accuracy of the determined initial correction amount.
  • the method further includes: sending correction information to the correction mechanism, the correction information is used to indicate the target correction amount; receiving response information sent by the correction mechanism, the response information is used to indicate that the correction of the electrode substrate or the coating die head has been completed; in response to the response information, determining each first distance after correction and the corresponding second distance Whether the misalignment value between them is within the preset range.
  • the above technical solution after the correction is completed, determines the correction effect after correction through information interaction with the correction mechanism, which is not only easy to implement, but also can reduce the probability that the misalignment value between the first distance and the corresponding second distance is still not within the preset range due to poor correction effect, thereby leading to poor battery performance.
  • the at least one preset correction amount includes at least one of the following correction amounts: -0.1 mm, 0.1 mm, -0.2 mm, 0.2 mm, -0.3 mm, 0.3 mm, -0.4 mm, 0.4 mm, -0.5 mm, and 0.5 mm.
  • the above technical solution sets at least one preset correction amount to at least one of -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm. While correcting the misalignment of the coated AB surface within the specification range, it also meets the correction accuracy of the correction mechanism and reduces the probability of tape breakage of the electrode substrate.
  • a coating correction device comprising: an acquisition unit, used to acquire a plurality of first distances and a plurality of second distances, wherein each of the plurality of first distances is a distance from an edge of a coating area on a first surface of an electrode substrate to a reference edge, each of the plurality of second distances is a distance from an edge of a coating area on a second surface of the electrode substrate to the reference edge, and the plurality of first distances and the plurality of second distances are obtained by sampling multiple times within a sampling period; a determination unit, used to determine a target correction amount in a coating process according to the plurality of first distances, the plurality of second distances and at least one preset correction amount.
  • the determination unit is specifically used to: determine multiple initial correction amounts based on each first distance, the second distance corresponding to each first distance, and the at least one preset correction amount; determine the target correction amount based on the multiple initial correction amounts.
  • the determining unit is specifically configured to determine the target correction amount according to an average value of the multiple initial correction amounts.
  • the multiple first distances include a first target distance
  • the multiple second distances include a second target distance
  • the first target distance and the second target distance are distances acquired in the same sampling
  • the determination unit is specifically used to: determine a first misalignment value set according to the first target distance and the second target distance, the first misalignment value set including a first misalignment value between an edge of a coating area on at least one of the first surfaces and an edge of a corresponding coating area on the second surface in the width direction of the pole piece substrate; determine a first initial correction value among the multiple initial correction amounts according to the first misalignment value and the at least one preset correction amount. quantity.
  • the device also includes: a correction unit, used to use the at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of the at least one second misalignment value set is the same as the number of the at least one preset correction amount; the determination unit is specifically used to: determine the first initial correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value.
  • a correction unit used to use the at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value
  • the device also includes: a selection unit, used to select a second misalignment value with the largest absolute value in each second misalignment value set in the at least one second misalignment value set; the determination unit is specifically used to: determine a second target misalignment value, the second target misalignment value is a misalignment value that is smaller than the first target misalignment value in at least one of the second misalignment values with the largest absolute value, the first target misalignment value is the misalignment value with the largest absolute value in the first misalignment value set; determine the first initial correction amount based on a first preset correction amount in the at least one preset correction amount, the first preset correction amount including a preset correction amount corresponding to the second target misalignment value.
  • a selection unit used to select a second misalignment value with the largest absolute value in each second misalignment value set in the at least one second misalignment value set
  • the determination unit is specifically used to: determine a second target misal
  • the selection unit when there are multiple first preset correction amounts, is specifically used to: select, from the second misalignment value set, a misalignment value set after initial correction of the first misalignment value using the first preset correction amount, to obtain at least one second target misalignment value set; and the determination unit is specifically used to: determine the first initial correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • the determination unit is specifically used to: add the second misalignment values included in each second target misalignment value set to obtain at least one sum of misalignment values; and determine the first preset correction amount corresponding to the sum of misalignment values with the smallest absolute value in the at least one sum of misalignment values as the first initial correction amount.
  • the determining unit when the number of the first preset deviation correction amount is one, is specifically configured to: determine the first preset deviation correction amount as the first initial deviation correction amount.
  • the device further includes: a communication unit, configured to send correction information to the correction mechanism, wherein the correction information is used to indicate the target correction amount; the communication unit is further configured to receive response information sent by the correction mechanism, wherein the response information is used to indicate the response to the correction mechanism.
  • the correction of the electrode substrate or the coating die head has been completed; the judgment unit is used to respond to the response information and judge whether the misalignment value between each first distance and the corresponding second distance after the correction is within a preset range.
  • the at least one preset correction amount includes at least one of the following correction amounts: -0.1 mm, 0.1 mm, -0.2 mm, 0.2 mm, -0.3 mm, 0.3 mm, -0.4 mm, 0.4 mm, -0.5 mm, and 0.5 mm.
  • a coating correction device comprising a processor and a memory, wherein the memory is used to store a computer program, and the processor is used to call the computer program to execute the method in the above-mentioned first aspect or its various implementation methods.
  • a computer-readable storage medium for storing a computer program, wherein the computer program enables a computer to execute the method in the above-mentioned first aspect or its various implementations.
  • FIG. 1 is a schematic flow chart of a coating deviation correction method according to an embodiment of the present application.
  • FIG. 2 is a schematic diagram of AB surface coating according to an embodiment of the present application.
  • FIG. 3 is a schematic flow chart of a specific coating deviation correction method according to an embodiment of the present application.
  • FIG. 4 is a schematic block diagram of a coating deviation correction device according to an embodiment of the present application.
  • FIG. 5 is a schematic block diagram of a coating correction device according to an embodiment of the present application.
  • batteries can be used as the main power source for electrical devices (such as vehicles, ships or spacecraft, etc.). It should be understood that the battery mentioned in the embodiments of the present application refers to a single physical module including one or more battery cells to provide higher voltage and capacity.
  • the battery can be a power battery.
  • the battery can be a lithium-ion battery, a lithium metal battery, a lead-acid battery, a nickel-cathode battery, a nickel-hydrogen battery, a lithium-sulfur battery, a lithium-air battery or a sodium-ion battery, etc., which is not specifically limited in the embodiments of the present application.
  • the battery in the embodiments of the present application can be a battery cell/battery monomer, or a battery module or a battery pack, which is not specifically limited in the embodiments of the present application.
  • the production process of batteries is relatively complex and includes multiple processes, such as stirring, coating, rolling, die-cutting, winding, injection, and formation.
  • the coating process is an important part that cannot be ignored. Its influence on battery performance is crucial.
  • the stability, uniformity, and size of the coating will affect the final performance of the battery.
  • the size of the coated AB surface Including position size, width size, AB surface misalignment size, etc., all have a great impact on the performance of the battery.
  • the coating result of the electrode will be Deviation occurs.
  • the misalignment of the AB surface of the electrode coating area exceeds a certain range, if it is not discovered and corrected in time, it may seriously affect the performance of the battery, and will also seriously increase the scrap rate of the product and increase the manufacturing cost.
  • an embodiment of the present application proposes a method for coating correction, by obtaining a first distance and a second distance, and determining a target correction amount in the coating process according to the first distance, the second distance and at least one preset correction amount, wherein the first distance is the distance from the edge of the coating area on the first surface of the pole piece substrate to the reference edge, and the second distance is the distance from the edge of the coating area on the second surface of the pole piece substrate to the reference edge.
  • the coating misalignment size between the two corresponding surfaces can be determined, and then the target correction amount in the coating process is determined based on the preset correction amount, so that the target correction amount can be determined with higher efficiency and accuracy. Correction is performed based on the target correction amount so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • Fig. 1 shows a schematic flow chart of a coating correction method 100 according to an embodiment of the present application. As shown in Fig. 1 , the method 100 may include at least part of the following contents.
  • S110 Acquire multiple first distances and multiple second distances.
  • Each of the multiple first distances is the distance from the edge of the coating area on the first surface of the pole piece substrate to the reference edge
  • each of the multiple second distances is the distance from the edge of the coating area on the second surface of the pole piece substrate to the reference edge, and each first distance and the corresponding second distance are obtained by sampling once within a sampling period.
  • S120 Determine a target deviation correction amount in the coating process according to a plurality of first distances, a plurality of second distances and at least one preset deviation correction amount.
  • the coating misalignment size between the two corresponding surfaces can be determined, and then the target correction amount in the coating process is determined based on the preset correction amount, so that the target correction amount can be determined with higher efficiency and accuracy. Correction is performed based on the target correction amount so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • the multiple first distances and multiple second distances used to determine the target correction amount are obtained by sampling multiple times within a sampling period, that is, the number of parameters used to determine the target correction amount is large, so that the accuracy of the determined target correction amount can be effectively improved.
  • the electrode substrate may include, for example, aluminum foil, and the electrode obtained based on the electrode substrate is a positive electrode.
  • the electrode substrate may include, for example, copper foil, and the electrode obtained based on the electrode substrate is a positive electrode. Negative electrode.
  • the coating area is the area where the slurry is coated.
  • the first surface may be one of the surfaces on the electrode substrate where the slurry is coated, and may be the front side of the electrode substrate or the back side of the electrode substrate.
  • the second surface may be a surface on the electrode substrate corresponding to the first surface. For example, if the first surface is the front side of the electrode substrate, the second surface is the back side of the electrode substrate; if the first surface is the back side of the electrode substrate, the second surface is the front side of the electrode substrate.
  • the edge of the coating area may refer to the edge of the coating area along the length direction. It should be understood that the length direction may also be referred to as the longitudinal direction (machine direction, MD) of the pole piece.
  • the slurry can also be called an active material. If the electrode substrate includes aluminum foil, the slurry can include lithium cobalt oxide, lithium iron phosphate, ternary lithium or lithium manganese oxide, etc. If the electrode substrate includes copper foil, the slurry can include carbon or silicon, etc.
  • the reference edge may be an edge of the electrode substrate along the length direction, and the edge may be any one of the two edges or both edges. Alternatively, the reference edge may also be an edge manually set by the user.
  • manual measurement may be performed, such as obtaining a plurality of first distances and a plurality of second distances by using a tape measure.
  • multiple first distances and multiple second distances can be acquired through an imaging device, such as a charge coupled device (CCD) camera.
  • CCD charge coupled device
  • a first distance and a second distance may be obtained by sampling once, each first distance may include at least one first distance, and each second sub-distance may also include at least one second distance.
  • FIG2 shows a schematic diagram of AB surface coating.
  • FIG2 shows a one-outlet four-material. It should be understood that in addition to one-outlet four-material, in general, the coating production line can also include one-outlet two-material, one-outlet six-material, one-outlet eight-material, one-outlet ten-material and one-outlet twelve-material.
  • the first distance on the A surface includes four sub-distances, namely AL1, AL2, AL3 and AL4, and the corresponding second distance on the B surface includes four second distances, namely BL1, BL2, BL3 and BL4.
  • one sampling period may include multiple frames of pictures.
  • one sampling period may include 20 frames of pictures.
  • S120 may specifically include: determining a plurality of initial deviation correction amounts according to each first distance, a second distance corresponding to each first distance, and at least one preset deviation correction amount, and then A target correction amount is determined based on multiple initial correction amounts.
  • This technical solution first determines multiple initial correction amounts based on each first distance, each second distance and at least one preset correction amount, and then determines the target correction amount based on the multiple initial correction amounts. That is, an intermediate parameter is determined in the correction process, and the final target correction amount is determined based on the intermediate parameter, thereby effectively reducing the complexity of the entire process and effectively improving the correction efficiency.
  • the target deviation correction amount can be determined based on the average value of multiple initial deviation correction amounts.
  • the average value can be rounded off and only the data after the decimal point can be calculated. This technical solution determines the target deviation correction amount based on the average value of multiple initial deviation correction amounts, has a small amount of calculation, is simple to implement, and greatly improves the calculation rate.
  • the target deviation correction amount may be determined based on the deviation correction amount with the largest or smallest absolute value among the multiple initial deviation correction amounts.
  • the multiple first distances may include a first target distance
  • the multiple second distances may include a second target distance
  • the first target distance and the second target distance are distances acquired in the same sampling.
  • determining multiple initial correction amounts according to each first distance, the second distance corresponding to each first distance, and at least one preset correction amount may include: determining a first misalignment value set according to the first target distance and the second target distance, and determining a first initial correction amount among the multiple initial correction amounts according to the first misalignment value and at least one preset correction amount.
  • the first misalignment value set includes a first misalignment value between an edge of a coating area on at least one first surface and an edge of a coating area on a corresponding second surface in the width direction of the pole piece substrate.
  • the technical solution determines the misalignment value between two corresponding surfaces according to a first distance among a plurality of first distances and a second distance corresponding thereto, which is simple to implement and effectively reduces the complexity of implementation. Furthermore, an initial correction amount among the initial correction amounts is determined according to the misalignment value between the two corresponding surfaces and a preset correction amount, so that the initial correction amount can be determined with high efficiency and accuracy.
  • the width direction of the pole piece substrate may also be referred to as a transverse direction (TD).
  • TD transverse direction
  • the number of the first target distances and the number of the second target distances can both be multiple, the number of the first misalignment values can also be multiple, and the number of the first misalignment values is the same as the number of the first distances and the second distances.
  • the preset correction amount can be determined based on at least one of the following parameters: national standards, company standards, or industry standards, the maximum misalignment of the electrode AB surface coating allowed in the production and manufacturing of batteries, empirical values, and on-site production and manufacturing requirements.
  • the range of the first misalignment value can be between -1mm and 1mm. And if the deviation is corrected too much, the pole piece substrate may be broken. Furthermore, usually in the deviation correction process, the deviation correction accuracy is 0.1mm. Therefore, in an embodiment of the present application, at least one preset deviation correction amount may include at least one of the following deviation correction amounts: -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • the embodiments of the present application do not specifically limit the "+” and "-" in the preset deviation correction amount. If “+” indicates deviation correction along the TD direction toward the first direction, such as deviation correction to the left, then “-” indicates deviation correction along the TD direction in the direction opposite to the first direction, such as deviation correction to the right. If “+” indicates deviation correction along the TD direction in the direction opposite to the first direction, such as deviation correction to the right, then “-” indicates deviation correction along the TD direction toward the first direction, such as deviation correction to the left.
  • the above technical solution sets at least one preset correction amount to at least one of -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm. While correcting the misalignment of the coated AB surface within the specification range, it also meets the correction accuracy of the correction mechanism and reduces the probability of tape breakage of the electrode substrate.
  • determining a first initial deviation correction amount among multiple initial deviation correction amounts according to a first deviation value and at least one preset deviation correction amount may include: using at least one preset deviation correction amount to perform initial deviation correction on the first deviation value in sequence to obtain at least one second deviation value set, wherein each second deviation value set in the at least one second deviation value set is a deviation value set after the first deviation value is initially corrected using the same preset deviation correction amount, and the number of at least one second deviation value set is the same as the number of at least one preset deviation correction amount. Then, based on at least one second deviation value set, at least one preset deviation correction amount, and the first deviation value, the first initial deviation correction amount is determined.
  • the technical solution first uses a preset correction amount to perform initial correction on the misalignment value between two corresponding surfaces, and then determines the initial correction amount based on the result of the initial correction, which helps to eliminate inappropriate correction amounts in the preset correction amounts, so that the amount of calculation for determining the initial correction amount can be reduced, thereby improving the efficiency of determining the initial correction amount and performing correction.
  • the technical solution adopts closed-loop logic, so as to further improve the accuracy of the initial correction amount.
  • Each second misalignment value set in the at least one second misalignment value set may include at least one second misalignment value, and the number of the at least one second misalignment value included in each second misalignment value set is the same as the number of the first misalignment values.
  • At least one preset correction amount includes x1, x2, x3, x4, x5, x6, x7, x8, x9 and x10.
  • x1 to perform initial correction on a, b, c and d to obtain the first second misalignment value set, which includes four second misalignment values, namely (a+x1), (b+x1), (c+x1) and (d+x1).
  • determining the first initial correction amount based on at least one second misalignment value set, at least one preset correction amount, and the first misalignment value may include: selecting the second misalignment value with the largest absolute value in each second misalignment value set in at least one second misalignment value set, and then determining the second target misalignment value, the second target misalignment value being a misalignment value smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, the first target misalignment value being a misalignment value with the largest absolute value in the first misalignment value set. Then, determining the first initial correction amount based on the first preset correction amount in at least one preset correction amount, the first preset correction amount including the preset correction amount corresponding to the second target misalignment value.
  • the above technical solution selects the misalignment value after the initial correction whose absolute value is smaller than the misalignment value before correction, and determines the initial correction amount based on the correction amount corresponding to the selected misalignment value, that is, abandons the inappropriate correction amount. In this way, not only the probability of more deviation after correction is reduced, but also the number of appropriate correction amounts selected may be less than the number of correction amounts preset at the beginning, which effectively reduces the time spent on determining the initial correction amount and improves efficiency.
  • h10 max(
  • a misalignment value less than f is selected from h1, h2, h3, ..., h10.
  • the preset correction amounts corresponding to h1, h3, h6, and h8 are x1, x3, x6, and x8, respectively, and x1, x3, x6, and x8 are collectively referred to as the first preset correction amount.
  • the first preset deviation correction amount may be multiple or one.
  • the first preset deviation correction amount may be determined as the first preset deviation correction amount.
  • the first preset correction amount is determined as the initial correction amount, which not only greatly reduces the computational complexity but also increases the accuracy of the determined initial correction amount.
  • a set of misalignment values obtained by initially correcting the first misalignment value using the first preset correction amount can be selected from the second misalignment value set to obtain at least one second target misalignment value set, and then the first initial correction amount can be determined based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • This technical solution determines the initial correction amount based on the misalignment value after initial correction of the misalignment value between two surfaces using a suitable correction amount, which can greatly improve the accuracy of the determined initial correction amount.
  • the fourth second target misalignment value set includes initial correction of a, b, c and d using x8.
  • the second misalignment values included in each second target misalignment value set can be added to obtain at least one misalignment value sum, and then the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the at least one misalignment value sum can be determined as the first initial correction amount.
  • the above technical scheme determines the preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the sum of the misalignment values as the initial correction amount.
  • the accuracy of the initial correction amount determined in this way is high, and the accuracy of the target correction amount determined based on the initial correction amount is also high, so that the effect after correction based on the target correction amount is better, further improving the performance of the battery.
  • the first initial offset may be determined according to the sum of the four misalignment values.
  • the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value among the sum of the four misalignment values can be determined as the first initial correction amount. For example, if min(
  • ) y2, the first initial offset is x3.
  • the sum of each misalignment value in the sum of the four misalignment values may be averaged, and the first preset correction amount corresponding to the average with the smallest absolute value in the averages is the first initial correction amount.
  • the first misalignment value set includes 4 first misalignment values
  • the 4 first misalignment values are 0.05mm, 0.2mm, 0.15mm and -0.5mm respectively
  • the preset correction amounts include -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • 10 preset correction amounts are used to correct the four first misalignment values in turn, and the second misalignment value with the largest absolute value is selected from each obtained set of second misalignment values.
  • ) 0.6mm.
  • ) 0.4mm.
  • ) 0.7mm.
  • ) 0.4mm.
  • ) 0.8mm.
  • ) 0.5mm.
  • ) 0.9mm.
  • ) 0.6mm.
  • ) 1mm.
  • ) 0.7mm.
  • the first target misalignment value f max(
  • ) 0.5mm in the first misalignment value set.
  • h1, h3, h5, h7, h8, h9 and h10 are all greater than f, indicating that based on the preset correction amounts of -0.1mm, -0.2mm, -0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm corresponding to h1, h3, h5, h7, h8, h9 and h10, the result of correction is that the more correction is made, the more deviation there is.
  • the misalignment size of the AB surface coating after correction is larger than that before correction. Therefore, h1, h3, h5, h7, h8, h9 are abandoned.
  • the first initial correction amount is finally determined to be 0.1 mm.
  • a target deviation correction amount may be determined based on the plurality of initial deviation correction amounts.
  • the average value of multiple initial deviation correction amounts can be determined as the target deviation correction amount.
  • the target correction amount may be the product of the intermediate correction amount obtained based on the multiple initial correction amounts and the correction coefficient.
  • correction information may be sent to the correction mechanism, where the correction information is used to indicate a target correction amount.
  • the correction information may include the target correction amount.
  • the correction information may include the target correction amount.
  • the target correction amount and the correction coefficient may be multiplied, and the obtained product may be used to adjust the electrode substrate or the coating die head so that the coating misalignment of the AB surface is within the specification range.
  • the correction information may include the product of the target correction amount and the correction coefficient.
  • the correction mechanism can directly use the received product to correct the electrode substrate or The coating die is adjusted.
  • a response message may be sent, where the response message is used to indicate that the correction of the electrode substrate or the coating die has been completed.
  • a plurality of first distances after deflection correction and a plurality of second distances after deflection correction may be obtained within one sampling period, and then it may be determined whether the misalignment value is within a preset range according to the plurality of first distances after deflection correction and the plurality of second distances after deflection correction.
  • the transmission distance of the pole piece substrate may be L.
  • L may be referred to as a correction period.
  • L may be, for example, a mechanical distance from the correction mechanism to the CCD camera.
  • the communication and interaction with the correction mechanism can be performed by wired or wireless means.
  • the wired communication means may include, for example, a control area network (CAN) communication means and a daisy chain communication means.
  • the wireless communication means may include, for example, Bluetooth communication, wireless fidelity (WIFI) communication, ZigBee communication and other means, which are not limited here.
  • the above technical solution after the correction is completed, determines the correction effect after correction through information interaction with the correction mechanism, which is not only easy to implement, but also can reduce the probability that the misalignment value between the first distance and the corresponding second distance is still not within the preset range due to poor correction effect, thereby leading to poor battery performance.
  • the material in Figure 3 is one out of four materials, and the number of the first distance, the second distance and the first misalignment value are all 4.
  • One sampling period is 20 frames of pictures.
  • step 310 a plurality of first distances and a plurality of second distances are acquired.
  • the multiple first distances and the multiple second distances can be acquired by a CCD camera.
  • step 320 the misalignment value between the first distance and the second distance of the current frame is determined.
  • step 330 an initial correction amount is calculated based on the misalignment value of the current frame.
  • step 340 the initial correction amounts of 20 frames of images are determined continuously.
  • step 350 a target deviation correction amount is determined based on the initial deviation correction amount.
  • the initial correction values of the 20 frames are averaged. If the average value has a decimal point, it is rounded off and only one decimal place is calculated to obtain the intermediate correction value. Then multiply the intermediate correction amount by the correction coefficient to get the target correction amount.
  • step 360 correction information is sent to the correction mechanism, and the correction information includes a target correction amount.
  • step 370 a response message sent by the deviation correction mechanism is received, and the response message is used to indicate that the deviation correction of the electrode substrate or the coating die head has been completed.
  • step 380 the first distance and the second distance after correction of 20 frames of images are collected.
  • step 390 based on the first distances and second distances after correction of the 20 frames of images, it is determined whether the misalignment value between each first distance and the corresponding second distance is within a preset range.
  • step 320 is executed.
  • sequence numbers of the above processes do not mean the order of execution.
  • the order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.
  • the coating correction method of the embodiment of the present application is described in detail above, and the coating correction device of the embodiment of the present application will be described below. It should be understood that the coating correction device in the embodiment of the present application can execute the coating correction method in the embodiment of the present application.
  • Fig. 4 shows a schematic block diagram of a coating deflection correction device 400 according to an embodiment of the present application.
  • the coating deflection correction device 400 may include:
  • the acquisition unit 410 is used to acquire multiple first distances and multiple second distances, wherein each of the multiple first distances is the distance from the edge of the coating area on the first surface of the pole piece substrate to the reference edge, and each of the multiple second distances is the distance from the edge of the coating area on the second surface of the pole piece substrate to the reference edge, and the multiple first distances and the multiple second distances are obtained by sampling multiple times within a sampling period.
  • the determination unit 420 is used to determine a target deviation correction amount in the coating process according to the multiple first distances, the multiple second distances and at least one preset deviation correction amount.
  • the determination unit 420 is specifically used to: determine multiple initial correction amounts according to each first distance, the second distance corresponding to each first distance, and at least one preset correction amount; determine the target correction amount according to the multiple initial correction amounts.
  • the determination unit 420 is specifically configured to determine a target deviation correction amount according to an average value of a plurality of initial deviation correction amounts.
  • multiple first distances include a first target distance
  • multiple second distances include a second target distance
  • the first target distance and the second target distance are distances acquired in the same sampling
  • the determination unit 420 is specifically used to: determine a first misalignment value set based on the first target distance and the second target distance, the first misalignment value set including a first misalignment value between an edge of a coating area on at least one first surface and an edge of a coating area on a corresponding second surface in the width direction of the electrode substrate; determine a first initial correction amount among multiple initial correction amounts based on the first misalignment value and at least one preset correction amount.
  • the coating correction device 400 may further include: a correction unit, used to use at least one preset correction amount to perform initial correction on the first misalignment value in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of at least one second misalignment value set is the same as the number of at least one preset correction amount; the determination unit 420 is specifically used to: determine the first initial correction amount based on at least one second misalignment value set, at least one preset correction amount and the first misalignment value.
  • a correction unit used to use at least one preset correction amount to perform initial correction on the first misalignment value in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value
  • each second misalignment value set in at least one second misalignment value set includes at least one second misalignment value
  • the coating correction device 400 may also include: a selection unit, used to select the second misalignment value with the largest absolute value in each second misalignment value set in at least one second misalignment value set
  • the determination unit 420 is specifically used to: determine a second target misalignment value, the second target misalignment value is a misalignment value that is smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, and the first target misalignment value is the misalignment value with the largest absolute value in the first misalignment value set; determine a first initial correction amount based on a first preset correction amount in at least one preset correction amount, and the first preset correction amount includes a preset correction amount corresponding to the second target misalignment value.
  • the selection unit when there are multiple first preset correction amounts, is specifically used to: select, from the second misalignment value set, a misalignment value set in which the first misalignment value is initially corrected using the first preset correction amount to obtain at least one second target misalignment value set; the determination unit 420 is specifically used to: determine the first initial correction amount based on the second misalignment value included in each second target misalignment value set in at least one second target misalignment value set.
  • the determining unit 420 is specifically configured to: add the second misalignment values included in each second target misalignment value set to obtain a sum of at least one misalignment value; A first preset deviation correction amount corresponding to a sum of misalignment values having a minimum absolute value in at least one sum of misalignment values is determined as a first initial deviation correction amount.
  • the determination unit 420 is specifically configured to: determine the first preset deviation correction amount as the first initial deviation correction amount.
  • the coating correction device 400 also includes: a communication unit, used to send correction information to the correction mechanism, the correction information is used to indicate the target correction amount; the communication unit is also used to receive response information sent by the correction mechanism, the response information is used to indicate that the correction of the electrode substrate or the coating die head has been completed; a judgment unit, used to judge whether the misalignment value between each first distance after correction and the corresponding second distance is within a preset range in response to the response information.
  • At least one preset correction amount includes at least one of the following correction amounts: -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • the coating deviation correction device 400 can implement the corresponding operations in the method 100, and for the sake of brevity, it will not be described here in detail.
  • Fig. 5 is a schematic diagram of the hardware structure of a coating correction device 500 according to an embodiment of the present application.
  • the coating correction device 500 includes a memory 501, a processor 502, a communication interface 503 and a bus 504.
  • the memory 501, the processor 502 and the communication interface 503 are connected to each other through the bus 504.
  • the memory 501 may be a read-only memory (ROM), a static storage device, and a random access memory (RAM).
  • the memory 501 may store a program. When the program stored in the memory 501 is executed by the processor 502, the processor 502 and the communication interface 503 are used to execute the various steps of the coating correction method of the embodiment of the present application.
  • the processor 502 can adopt a general central processing unit (CPU), a microprocessor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU) or one or more integrated circuits to execute relevant programs to realize the functions required to be performed by the units in the device of the embodiment of the present application, or to execute the coating correction method of the embodiment of the present application.
  • CPU central processing unit
  • ASIC application specific integrated circuit
  • GPU graphics processing unit
  • the processor 502 may also be an integrated circuit chip with signal processing capability.
  • each step of the coating correction method of the embodiment of the present application may be completed by an integrated logic circuit of hardware in the processor 502 or by instructions in the form of software.
  • the processor 502 may also be a general purpose processor, a digital signal processor (DSP), or a Signal processing, DSP), ASIC, field programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components.
  • DSP digital signal processor
  • FPGA field programmable gate array
  • the methods, steps and logic block diagrams disclosed in the embodiments of the present application can be implemented or executed.
  • the general processor can be a microprocessor or the processor can also be any conventional processor, etc.
  • the steps of the method disclosed in the embodiments of the present application can be directly embodied as a hardware processor to be executed, or a combination of hardware and software modules in the processor to be executed.
  • the software module can be located in a mature storage medium in the field such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory or an electrically erasable programmable memory, a register, etc.
  • the storage medium is located in the memory 501, and the processor 502 reads the information in the memory 501, and combines its hardware to complete the functions required to be performed by the units included in the coating correction device 500 of the embodiment of the present application, or execute the coating correction method of the embodiment of the present application.
  • the communication interface 503 uses a transceiver device such as but not limited to a transceiver to achieve communication between the coating correction device 500 and other equipment or a communication network.
  • a transceiver device such as but not limited to a transceiver to achieve communication between the coating correction device 500 and other equipment or a communication network.
  • the bus 504 may include a path for transmitting information between various components of the coating and deflection correction device 500 (eg, the memory 501 , the processor 502 , and the communication interface 503 ).
  • coating correction device 500 only shows a memory, a processor, and a communication interface, in the specific implementation process, those skilled in the art should understand that the coating correction device 500 may also include other devices necessary for normal operation. At the same time, according to specific needs, those skilled in the art should understand that the coating correction device 500 may also include hardware devices for realizing other additional functions. In addition, those skilled in the art should understand that the coating correction device 500 may also only include the devices necessary for realizing the embodiments of the present application, and does not necessarily include all the devices shown in FIG. 5.
  • the embodiments of the present application also provide a computer-readable storage medium for storing a computer program, wherein the computer program is used to execute the methods of the various embodiments of the present application described above.
  • the computer-readable storage medium mentioned above may be a transient computer-readable storage medium or a non-transitory computer-readable storage medium.
  • An embodiment of the present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions.
  • the program instructions When the program instructions are executed by a computer, the computer executes the above-mentioned coating correction method.

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Abstract

一种涂布纠偏的方法，包括：获取多个第一距离和多个第二距离，其中，多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，多个第二距离中的每个第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离，多个第一距离和多个第二距离为在一个采样周期内采样多次得到的；根据多个第一距离、多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。该方法能够有效地提高电池的性能。还包括一种涂布纠偏的装置。

Description

涂布纠偏的方法和装置
相关申请的交叉引用
本申请要求享有于2023年8月7日提交的名称为“涂布纠偏的方法和装置”的中国专利申请202310985483.4的优先权，该申请的全部内容通过引用并入本申请中。
技术领域
本申请涉及电池制造技术领域，特别是涉及一种涂布纠偏的方法和装置。
背景技术
节能减排是汽车产业可持续发展的关键。在这种情况下，电动车辆由于其节能环保的优势成为汽车产业可持续发展的重要组成部分。而对于电动车辆而言，电池技术又是关乎其发展的一项重要因素。
电池的生产工序比较复杂，包含多种工序。其中，例如涂布工序是其中不可忽视的一环，其对电池性能的影响至关重要。
发明内容
本申请实施例提供了一种涂布纠偏的方法和装置，能够有效地提高电池的性能。
第一方面，提供了一种涂布纠偏的方法，所述方法包括：获取多个第一距离和多个第二距离，其中，所述多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述多个第二距离中的每个第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离，所述多个第一距离和所述多个第二距离为在一个采样周期内采样多次得到的；根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
本申请实施例，通过获取极片基材的两个对应的表面上的涂布区边缘 到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。进一步地，用于确定目标纠偏量的多个第一距离和多个第二距离是一个采样周期内采样多次得到的，也就是说，用于确定目标纠偏量的参数的数量较多，如此，能够有效提高确定的目标纠偏量的准确率。
在一些可能的实现方式中，所述根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量，包括：根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量；根据所述多个初始纠偏量，确定所述目标纠偏量。
上述技术方案，先根据每个第一距离、每个第二距离以及至少一个预设纠偏量确定多个初始纠偏量，再根据多个初始纠偏量确定目标纠偏量，即在纠偏的过程中确定了一个中间参数，根据中间参数确定了最终的目标纠偏量，从而能够有效降低整个过程的复杂度，进而有效提高了纠偏效率。
在一些可能的实现方式中，所述根据所述多个初始纠偏量，确定所述目标纠偏量，包括：根据所述多个初始纠偏量的平均值，确定所述目标纠偏量。
上述技术方案，根据多个初始纠偏量的平均值，确定目标纠偏量，运算量较少，实现简单，而且极大地提高了运算速率。
在一些可能的实现方式中，所述多个第一距离包括第一目标距离，所述多个第二距离包括第二目标距离，所述第一目标距离和所述第二目标距离为在同一次采样中获取到的距离；所述根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量，包括：根据所述第一目标距离和所述第二目标距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏量。
上述技术方案，根据多个第一距离中一个第一距离和与其对应的第二 距离确定两个对应的表面之间的错位值，实现简单，有效降低了实现的复杂度。进一步地，再根据两个对应的表面之间的错位值和预设的纠偏量确定初始纠偏量中的一个初始纠偏量，使得能够以较高的效率以及准确率确定初始纠偏量。
在一些可能的实现方式中，所述根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏量，包括：利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量。
上述技术方案，先利用预设的纠偏量对两个对应的表面之间的错位值进行初始纠偏，然后根据初始纠偏的结果确定初始纠偏量，有助于将预设的纠偏量中不合适的纠偏量进行剔除，使得能够减小确定初始纠偏量的计算量，进而能够提高确定初始纠偏量以及进行纠偏的效率。此外，该技术方案采用闭环逻辑，从而能够进一步提高初始纠偏量的准确率。
在一些可能的实现方式中，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量，包括：在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
在纠偏的过程中，若利用某个纠偏量对错位值进行纠偏后错位值的绝对比纠偏前的还大，即越纠越偏，那么该纠偏量是不合适。因此，上述技术方案在初始纠偏后的错位值中选择绝对值小于纠偏前的错位值，并基于选择的错位值对应的纠偏量确定初始纠偏量，即放弃不合适的纠偏量，如此，不仅降低了越纠越偏的概率，而且选择的合适的纠偏量的数量可能小于刚开始 预设的纠偏量的数量，这样有效减小了确定初始纠偏量的所花费的时间，提高了效率。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为多个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，包括：在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量。
上述技术方案，基于利用合适的纠偏量对两个表面之间的错位值进行初始纠偏后得到的纠偏后的错位值，确定初始纠偏量，能够极大地提高确定的初始纠偏量的准确率。
在一些可能的实现方式中，所述根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量，包括：将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述第一初始纠偏量。
上述技术方案，根据纠偏后趋近于0的规则，也就是总和越小越好，将错位值之和中绝对值最小的错位值之和对应的预设纠偏量，确定为初始纠偏量，这样确定的初始纠偏量的准确率较高，基于该初始纠偏量确定的目标纠偏量的准确率同样也较高，使得基于该目标纠偏量进行纠偏后的效果较好，进一步提高了电池的性能。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为一个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，包括：将所述第一预设纠偏量确定为所述第一初始纠偏量。
上述技术方案，在第一预设纠偏量的数量为一个的情况下，将该第一预设纠偏确定为初始纠偏量，不仅极大地减小了运算复杂度，而且确定的初始纠偏量的准确率较高。
在一些可能的实现方式中，所述方法还包括：向纠偏机构发送纠偏信息，所述纠偏信息用于指示所述目标纠偏量；接收所述纠偏机构发送的响应信息，所述响应信息用于指示对所述极片基材或涂布模头的纠偏已经结束；响应于所述响应信息，判断纠偏后的所述每个第一距离和对应的所述第二距 离之间的错位值是否在预设范围内。
上述技术方案，在纠偏完成之后，通过和纠偏机构之间的信息交互，判断纠偏后的纠偏效果，不仅便于实现，而且能够降低由于纠偏效果不好而导致的第一距离和对应的第二距离之间的错位值仍然不在预设范围内，进而导致电池性能较差的概率。
在一些可能的实现方式中，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
上述技术方案，将至少一个预设纠偏量设置为-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm中的至少一个，在将涂布AB面的错位能够纠偏至规格范围内的同时，还满足了纠偏机构的纠偏精度，并且减小了极片基材的断带概率。
第二方面，提供了一种涂布纠偏的装置，包括：获取单元，用于获取多个第一距离和多个第二距离，其中，所述多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述多个第二距离中的每个第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离，所述多个第一距离和所述多个第二距离为在一个采样周期内采样多次得到的；确定单元，用于根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
在一些可能的实现方式中，所述确定单元具体用于：根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量；根据所述多个初始纠偏量，确定所述目标纠偏量。
在一些可能的实现方式中，所述确定单元具体用于：根据所述多个初始纠偏量的平均值，确定所述目标纠偏量。
在一些可能的实现方式中，所述多个第一距离包括第一目标距离，所述多个第二距离包括第二目标距离，所述第一目标距离和所述第二目标距离为在同一次采样中获取到的距离；所述确定单元具体用于：根据所述第一目标距离和所述第二目标距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏 量。
在一些可能的实现方式中，所述装置还包括：纠偏单元，用于利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；所述确定单元具体用于：基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量。
在一些可能的实现方式中，所述装置还包括：选择单元，用于在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；所述确定单元具体用于：确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为多个的情况下，所述选择单元具体用于：在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；所述确定单元具体用于：根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量。
在一些可能的实现方式中，所述确定单元具体用于：将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述第一初始纠偏量。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为一个的情况下，所述确定单元具体用于：将所述第一预设纠偏量确定为所述第一初始纠偏量。
在一些可能的实现方式中，所述装置还包括：通信单元，用于向纠偏机构发送纠偏信息，所述纠偏信息用于指示所述目标纠偏量；所述通信单元还用于，接收所述纠偏机构发送的响应信息，所述响应信息用于指示对所述 极片基材或涂布模头的纠偏已经结束；判断单元，用于响应于所述响应信息，判断纠偏后的所述每个第一距离和对应的所述第二距离之间的错位值是否在预设范围内。
在一些可能的实现方式中，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
第三方面，提供了一种涂布纠偏的装置，包括处理器和存储器，所述存储器用于存储计算机程序，所述处理器用于调用所述计算机程序，执行上述第一方面或其各实现方式中的方法。
第四方面，提供了一种计算机可读存储介质，用于存储计算机程序，该计算机程序使得计算机执行上述第一方面或其各实现方式中的方法。
附图说明
为了更清楚地说明本申请实施例的技术方案，下面将对本申请实施例中所需要使用的附图作简单地介绍，显而易见地，下面所描述的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据附图获得其他的附图。
在附图中，附图并未按照实际的比例绘制。
图1是本申请实施例的一种涂布纠偏的方法的示意性流程图。
图2是本申请实施例的一种AB面涂布的示意性图。
图3是本申请实施例的一种具体的涂布纠偏的方法的示意性流程图。
图4是本申请实施例的涂布纠偏的装置的示意性框图。
图5是本申请实施例的涂布纠偏的装置的示意性框图。
具体实施方式
下面结合附图和实施例对本申请的实施方式作进一步详细描述。以下实施例的详细描述和附图用于示例性地说明本申请的原理，但不能用来限制本申请的范围，即本申请不限于所描述的实施例。
在本申请的描述中，需要说明的是，除非另有说明，“多个”的含义是两个以上；术语“上”、“下”、“左”、“右”、“内”、“外”等指示的方位或位置关系仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元 件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”、“第三”等仅用于描述目的，而不能理解为指示或暗示相对重要性。
除非另有定义，本申请所使用的所有的技术和科学术语与属于本申请的技术领域的技术人员通常理解的含义相同；本申请中在申请的说明书中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本申请；本申请的说明书和权利要求书及上述附图说明中的术语“包括”和“具有”以及它们的任何变形，意图在于覆盖不排他的包含。本申请的说明书和权利要求书或上述附图中的术语“第一”、“第二”等是用于区别不同对象，而不是用于描述特定顺序或主次关系。
在本申请中提及“实施例”意味着，结合实施例描述的特定特征、结构或特性可以包含在本申请的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例，也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是，本申请所描述的实施例可以与其它实施例相结合。
随着新能源技术的发展，电池的应用领域越来越广泛。比如电池可作为用电装置(例如车辆、船舶或航天器等)的主要动力源。应理解，本申请实施例所提到的电池是指包括一个或多个电池单体以提供更高的电压和容量的单一的物理模块。
可选地，电池可以为动力蓄电池。从电池的种类而言，该电池可以是锂离子电池、锂金属电池、铅酸电池、镍隔电池、镍氢电池、锂硫电池、锂空气电池或者钠离子电池等，在本申请实施例中不做具体限定。从电池规模而言，本申请实施例中的电池可以是电芯/电池单体，也可以是电池模组或电池包，在本申请实施例中不做具体限定。
电池的生产工序比较复杂，包含多个工序，如搅拌工序、涂布工序、辊压工序、模切分条工序、卷绕工序、注液工序以及化成工序等。其中，涂布工序是其中不可忽视的一环，其对电池性能的影响至关重要，其涂料的稳定性、均匀性、尺寸等都会影响电池的最终性能。其中，涂布AB面的尺寸。包括位置尺寸、宽度尺寸、AB面错位尺寸等，都对电池的性能有很大的影响。
在涂布过程中，由于涂布模头喷嘴压力等原因，会使极片的涂布结果 出现偏差。当极片涂布区AB面错位量超出一定范围，若没有及时发现进行纠偏调整，可能会严重影响电池的性能，也将严重增加产品的废品率，增大制造成本。
基于此，本申请实施例提出了一种涂布纠偏的方法，通过获取第一距离和第二距离，并根据第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离。如此，通过获取极片基材的两个对应的表面上的涂布区边缘到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
图1示出了本申请实施例的一种涂布纠偏的方法100的示意性流程图。如图1所示，方法100可以包括以下内容中的至少部分内容。
S110：获取多个第一距离和多个第二距离。其中，多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，多个第二距离中的每个第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离，所述每个第一距离和对应的第二距离为在一个采样周期内采样一次得到的。
S120：根据多个第一距离、多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
本申请实施例，通过获取极片基材的两个对应的表面上的涂布区边缘到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。进一步地，用于确定目标纠偏量的多个第一距离和多个第二距离是一个采样周期内采样多次得到的，也就是说，用于确定目标纠偏量的参数的数量较多，如此，能够有效提高确定的目标纠偏量的准确率。
其中，极片基材例如可以包括铝箔，基于该极片基材得到的极片为正极极片。或者，极片基材例如可以包括铜箔，基于该极片基材得到的极片为 负极极片。
涂布区为涂覆浆料的区域。第一表面可以为极片基材上涂覆浆料的其中一个面，可以是极片基材的正面，也可以是极片基材的反面。第二表面可以为极片基材上与第一表面相对应的一个面。例如，若第一表面为极片基材的正面，则第二表面为极片基材的反面；若第一表面为极片基材的反面，则第二表面为极片基材的正面。
涂布区边缘可以是指涂布区沿长度方向上的边缘。应理解，长度方向也可以称为极片的纵向方向(machine direction，MD)。
浆料也可以称为活性物质。若极片基材包括铝箔，则浆料可以包括钴酸锂、磷酸铁锂、三元锂或锰酸锂等。若极片基材包括铜箔，则浆料可以包括碳或硅等。
基准边可以为极片基材沿长度方向的边缘，该边缘可以为两个边缘的任意一个边缘或者两个边缘。或者，基准边也可以是用户手动设置的边。
可选地，可以人工手动测量，如通过软尺获取到多个第一距离和多个第二距离。
或者，可以通过成像装置，例如电荷耦合元件(charge coupled device，CCD)相机，获取多个第一距离和多个第二距离。如此，能够极大地提高获取第一距离和第二距离的效率并且准确率较高。
其中，在一个采样周期内，采样一次可以得到一个第一距离和一个第二距离，每个第一距离可以包括至少一个第一距离，每个第二子距离也可以包括至少一个第二距离。
图2示出了AB面涂布的一种示意性图。其中，图2所示的为一出四物料。应理解，除了一出四物料之外，一般情况下，涂布产线上还可以包括一出二物料、一出六物料、一出八物料、一出十物料以及一出十二物料。
从图2中可以看出，A面上的第一距离包括四个第子距离，分别为AL1、AL2、AL3和AL4，与之对应的B面上的第二距离包括四个第二距离，分别为BL1、BL2、BL3和BL4。
可选地，一个采样周期可以包括多帧图片。示例性地，一个采样周期可以包括20帧图片。
在一些实施例中，S120具体可以包括：根据每个第一距离、每个第一距离对应的第二距离，以及至少一个预设纠偏量，确定多个初始纠偏量，再 根据多个初始纠偏量，确定目标纠偏量。
该技术方案，先根据每个第一距离、每个第二距离以及至少一个预设纠偏量确定多个初始纠偏量，再根据多个初始纠偏量确定目标纠偏量，即在纠偏的过程中确定了一个中间参数，根据中间参数确定了最终的目标纠偏量，从而能够有效降低整个过程的复杂度，进而有效提高了纠偏效率。
作为一种示例，可以根据多个初始纠偏量的平均值，确定目标纠偏量。作为示例，考虑到通常情况下纠偏量为0.1的倍数，因此，可以将平均值四舍五入，并只计算出小数点后一位的数据。该技术方案，根据多个初始纠偏量的平均值，确定目标纠偏量，运算量较少，实现简单，而且极大地提高了运算速率。
作为另一种示例，可以根据多个初始纠偏量中绝对值最大或最小的纠偏量，确定目标纠偏量。
下面将详细描述确定初始纠偏量的实现方式。为了便于描述，后文将以多个第一距离中的一个第一距离以及多个第二距离中的一个第二距离为例进行描述。
多个第一距离可以包括第一目标距离，多个第二距离可以包括第二目标距离，第一目标距离和第二目标距离为在同一次采样中获取到的距离。此时，根据每个第一距离、每个第一距离对应的第二距离，以及至少一个预设纠偏量，确定多个初始纠偏量，可以包括：根据第一目标距离和第二目标距离，确定第一错位值集合，并根据第一错位值和至少一个预设纠偏量，确定多个初始纠偏量中的第一初始纠偏量。其中，第一错位值集合包括在极片基材的宽度方向上，至少一个第一表面上的涂布区边缘与对应的第二表面上的涂布区边缘之间的第一错位值。
该技术方案，根据多个第一距离中一个第一距离和与其对应的第二距离确定两个对应的表面之间的错位值，实现简单，有效降低了实现的复杂度。进一步地，再根据两个对应的表面之间的错位值和预设的纠偏量确定初始纠偏量中的一个初始纠偏量，使得能够以较高的效率以及准确率确定初始纠偏量。
其中，极片基材的宽度方向也可以称为横向方向(transverse direction，TD)。
由于第一目标距离的数量和第二目标距离的数量均可以为多个，则第一错位值的数量也可以为多个，且第一错位值的数量与第一距离和第二距离的数量相同。
继续参考图2。从图2中可以看出，A面上的第一目标距离分别为AL1、AL2、AL3和AL4，与之对应的B面上的第二距离分别为BL1、BL2、BL3和BL4，则第一错位值集合包括4个第一错位值，分别为a＝AL1-BL1，b＝AL2-BL2，c＝AL3-BL3，c＝AL4-BL4。
预设纠偏量可以是基于以下参数中的至少一个参数确定的：国家标准、公司标准、或行业标准、电池的生产制造中所允许的极片AB面涂布的最大错位量、经验值、现场生产制造要求。
通常情况下，在正常生产制造的过程中，第一错位值的范围可以在-1mm至1mm之间。且若纠偏太多，则极片基材可能会出现断带的可能。再者，通常在纠偏过程中，纠偏精度为0.1mm。因此，在本申请实施例中，至少一个预设纠偏量可以包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
需要说明的是，本申请实施例对预设纠偏量中的“+”和“-”没有特别限定。若“+”表示沿TD方向向第一方向纠偏，比如向左纠偏，则“-”表示沿TD方向向与第一方向相反的方向纠偏，比如向右纠偏。若“+”表示沿TD方向向与第一方向相反的方向纠偏，比如向右纠偏，则“-”表示沿TD方向向第一方向纠偏，比如向左纠偏。
上述技术方案，将至少一个预设纠偏量设置为-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm中的至少一个，在将涂布AB面的错位能够纠偏至规格范围内的同时，还满足了纠偏机构的纠偏精度，并且减小了极片基材的断带概率。
进一步地，在本申请实施例中，根据第一错位值和至少一个预设纠偏量，确定多个初始纠偏量中的第一初始纠偏量，可以包括：利用至少一个预设纠偏量，依次对第一错位值进行初始纠偏，得到至少一个第二错位值集合，该至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对第一错位值进行初始纠偏后的错位值集合，至少一个第二错位值集合的数量与至少一个预设纠偏量的数量相同。然后，基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定第一初始纠偏量。
该技术方案，先利用预设的纠偏量对两个对应的表面之间的错位值进行初始纠偏，然后根据初始纠偏的结果确定初始纠偏量，有助于将预设的纠偏量中不合适的纠偏量进行剔除，使得能够减小确定初始纠偏量的计算量，进而能够提高确定初始纠偏量以及进行纠偏的效率。此外，该技术方案采用闭环逻辑，从而能够进一步提高初始纠偏量的准确率。
其中，至少一个第二错位值集合中的每个第二错位值集合可以包括至少一个第二错位值，每个第二错位值集合包括的至少一个第二错位值的数量与第一错位值的数量相同。
举例说明，假设至少一个预设纠偏量包括x1、x2、x3、x4、x5、x6、x7、x8、x9和x10。先利用x1对a、b、c和d进行初始纠偏，得到第一个第二错位值集合，第一个第二错位值集合包括四个第二错位值，即(a+x1)、(b+x1)、(c+x1)以及(d+x1)。之后，利用x2对a、b、c和d进行初始纠偏，得到第二个第二错位值集合，第二个第二错位值集合包括四个第二错位值，即(a+x2)、(b+x2)、(c+x2)以及(d+x2)……最后利用x10对a、b、c和d进行初始纠偏，得到第十个第二错位值集合，第十个第二错位值集合包括四个第二错位值，即(a+x10)、(b+x10)、(c+x10)以及(d+x10)。
进一步地，基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定第一初始纠偏量，可以包括：在至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值，然后确定第二目标错位值，第二目标错位值为至少一个绝对值最大的第二错位值中小于第一目标错位值的错位值，第一目标错位值为第一错位值集合中绝对值最大的错位值。然后，基于至少一个预设纠偏量中的第一预设纠偏量，确定第一初始纠偏量，第一预设纠偏量包括第二目标错位值所对应的预设纠偏量。
由于在纠偏的过程中，若利用某个纠偏量对错位值进行纠偏后错位值的绝对比纠偏前的还大，即越纠越偏，那么该纠偏量是不合适。因此，上述技术方案在初始纠偏后的错位值中选择绝对值小于纠偏前的错位值，并基于选择的错位值对应的纠偏量确定初始纠偏量，即放弃不合适的纠偏量，如此，不仅降低了越纠越偏的概率，而且选择的合适的纠偏量的数量可能小于刚开始预设的纠偏量的数量，这样有效减小了确定初始纠偏量的所花费的时间，提高了效率。
继续举例说明，在第一个第二错位值集合中选择绝对值最大的第二错 位值，即h1＝max(|a+x1|、|b+x1|、|c+x1|、|d+x1|)，在第二个第二错位值集合中选择绝对值最大的第二错位值，即h2＝max(|a+x2|、|b+x2|、|c+x2|、|d+x2|)……在第十个第二错位值集合中选择绝对值最大的第二错位值，即h10＝max(|a+x10|、|b+x10|、|c+x10|、|d+x10|)。
并在第一错位值集合中选择绝对值最大的错位值，将其定义为第一目标错位值，即第一目标错位值f＝max(|a|、|b|、|c|、|d|)。
然后在h1、h2、h3……h10中选择小于f的错位值。假设h1、h3、h6和h8小于f，则h1、h3、h6和h8对应的预设纠偏量分别为x1、x3、x6和x8，x1、x3、x6和x8统称为第一预设纠偏量。
第一预设纠偏量可以为多个也可以为一个。
在第一预设纠偏量的数量为一个的情况下，可以将第一预设纠偏量确定为第一预设纠偏量。
上述技术方案，在第一预设纠偏量的数量为一个的情况下，将该第一预设纠偏确定为初始纠偏量，不仅极大地减小了运算复杂度，而且确定的初始纠偏量的准确率较高。
在第一预设纠偏量的数量为多个的情况下，可以在第二错位值集合中，选择利用第一预设纠偏量对第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合，然后根据至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定第一初始纠偏量。
该技术方案，基于利用合适的纠偏量对两个表面之间的错位值进行初始纠偏后得到的纠偏后的错位值，确定初始纠偏量，能够极大地提高确定的初始纠偏量的准确率。
再次举例说明，第一个第二目标错位值集合包括利用x1对a、b、c和d进行初始纠偏后得到的错位值，即第一个第二目标错位值集合包括错位值a1、b1、c1和d1，其中，a1＝a+x1，b1＝b+x1，c1＝c+x1，d1＝d+x1。第二个第二目标错位值集合包括利用x3对a、b、c和d进行初始纠偏后得到的错位值，即第二个第二目标错位值集合包括错位值a2、b2、c2和d2，其中，a2＝a+x3，b2＝b+x3，c2＝c+x3，d1＝d+x3。第三个第二目标错位值集合包括利用x6对a、b、c和d进行初始纠偏后得到的错位值，即第三个第第二目标错位值集合包括错位值a3、b3、c3和d3，其中，a3＝a+x6，b3＝b+x6，c3＝c+x6，d3＝d+x6。第四个第二目标错位值集合包括利用x8对a、b、c和d进行初始 纠偏后得到的错位值，即第四个第二目标错位值集合包括四个错位值a4、b4、c4和d4，其中，a4＝a+x8，b4＝b+x8，c4＝c+x8，d4＝d+x8。
之后，可以将每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和，再将至少一个错位值之和中绝对值最小的错位值之和所对应的第一预设纠偏量，确定为第一初始纠偏量。
上述技术方案，根据纠偏后趋近于0的规则，也就是总和越小越好，将错位值之和中绝对值最小的错位值之和对应的预设纠偏量，确定为初始纠偏量，这样确定的初始纠偏量的准确率较高，基于该初始纠偏量确定的目标纠偏量的准确率同样也较高，使得基于该目标纠偏量进行纠偏后的效果较好，进一步提高了电池的性能。
具体而言，将每个第二目标错位值集合中的第二错位值进行相加后，得到4个错位值之和，分别为y1＝a1+b1+c1+d1，y2＝a2+b2+c2+d2，y3＝a3+b3+c3+d3，y4＝a4+b4+c4+d4。
之后，可以根据该4个错位值之和，确定第一初始偏移量。
作为一种示例，可以将该4个错位值之和中绝对值最小的错位值之和对应的第一预设纠偏量，确定为第一初始纠偏量。比如，若min(|y1|、|y2|、|y3|、|y4|)＝y2，则第一初始偏移量为x3。
作为另一种示例，可以对该4个错位值之和中的每个错位值之和求平均，平均数中绝对值最小的平均数对应的第一预设纠偏量为第一初始纠偏量。
下面结合具体例子描述确定第一初始纠偏量的一种具体实现方式。
假设第一错位值集合包括4个第一错位值，该4个第一错位值分别为0.05mm、0.2mm、0.15mm和-0.5mm，预设纠偏量包括-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
首先，利用10个预设纠偏量依次对4个第一错位值做纠偏，并在得到的每个第二错位值集合中选择绝对值最大的第二错位值。
具体而言，利用-0.1mm对4个第一错位值做纠偏后，得到第一个第二错位值集合k1＝(-0.05mm,0.1mm,0.05mm,-0.6mm)，且h1＝max(|-0.05mm|、|0.1mm|、|0.05mm|、|-0.6mm|)＝0.6mm。
利用0.1mm对4个第一错位值做纠偏后，得到第二个第二错位值集合k2＝(0.15mm,0.3mm,0.25mm,-0.4mm)，且h2＝max(|0.15mm|、|0.3mm|、 |0.25mm|、|-0.4mm|)＝0.4mm。
利用-0.2mm对4个第一错位值做纠偏后，得到第三个第二错位值集合k3＝(-0.15mm,0mm,-0.05mm,-0.7mm)，且h3＝max(|-0.15mm|、|0mm|、|-0.05mm|、|-0.7mm|)＝0.7mm。
利用0.2mm对4个第一错位值做纠偏后，得到第四个第二错位值集合k4＝(0.25mm,0.4mm,0.35mm,-0.3mm)，且h4＝max(|0.25mm|、|0.4mm|、|0.35mm|、|-0.3mm|)＝0.4mm。
利用-0.3mm对4个第一错位值做纠偏后，得到第五个第二错位值集合k5＝(-0.25mm,-0.1mm,-0.15mm,-0.8mm)，且h5＝max(|-0.25mm|、|-0.1mm|、|-0.15mm|、|-0.8mm|)＝0.8mm。
利用0.3mm对4个第一错位值做纠偏后，得到第六个第二错位值集合k6＝(0.35mm,0.5mm,0.45mm,-0.2mm)，且h6＝max(|0.35mm|、|0.5mm|、|-0.45mm|、|-0.2mm|)＝0.5mm。
利用-0.4mm对4个第一错位值做纠偏后，得到第七个第二错位值集合k7＝(-0.35mm,-0.2mm,-0.25mm,-0.9mm)，且h7＝max(|-0.35mm|、|-0.2mm|、|-0.25mm|、|-0.9mm|)＝0.9mm。
利用0.4mm对4个第一错位值做纠偏后，得到第八个第二错位值集合k8＝(0.45mm,0.6mm,0.55mm,-0.1mm)，且h8＝max(|0.45mm|、|0.6mm|、|0.55mm|、|-0.1mm|)＝0.6mm。
利用-0.5mm对4个第一错位值做纠偏后，得到第九个第二错位值集合k9＝(-0.45mm,-0.3mm,-0.35mm,-1mm)，且h9＝max(|-0.45mm|、|-0.3mm|、|-0.35mm|、|-1mm|)＝1mm。
利用0.5mm对4个第一错位值做纠偏后，得到第十个第二错位值集合k10＝(0.55mm,0.7mm,0.65mm,0mm)，且h10＝max(|-0.55mm|、|0.7mm|、|0.65mm|、|0mm|)＝0.7mm。
其次，确定第一错位值集合中的第一目标错位值f＝max(|0.05mm|、|0.2mm|、|0.15mm|、|-0.5mm|)＝0.5mm。
可以看出，h1、h3、h5、h7，h8、h9以及h10均大于f，表明基于h1、h3、h5、h7，h8、h9以及h10对应的预设纠偏量-0.1mm、-0.2mm、-0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm，进行纠偏的结果是越纠越偏，纠偏后的AB面涂布错位尺寸比纠偏前的更大，因此放弃h1、h3、h5、h7，h8、h9 以及h10对应的预设纠偏量-0.1mm、-0.2mm、-0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm，h2、h4和h6对应的预设纠偏量0.1mm、0.2mm和0.3mm满足要求。
利用0.1mm对4个第一错位值做纠偏后得到的第二错位值为0.15mm,0.3mm,0.25mm,-0.4mm，将它们相加得到的和y1＝0.3mm。利用0.2mm对4个第一错位值做纠偏后得到的第二错位值为0.25mm,0.4mm,0.35mm,-0.3mm，将它们相加得到的和y2＝0.7mm。利用0.3mm对4个第一错位值做纠偏后得到的第二错位值为0.35mm,0.5mm,0.45mm,-0.2mm，将它们相加得到的和y3＝1.1mm。
根据纠偏后趋近于0的规则，也就是总和越小越好，最终将第一初始纠偏量确定为0.1mm。
需要说明的是，初始纠偏量中其他的初始纠偏量的确定过程与第一初始纠偏量相同，为了内容的简洁，此处不再赘述。
在确定了多个初始纠偏量后，可以基于该多个初始纠偏量，确定目标纠偏量。
如前文所述，可以将多个初始纠偏量的平均值，确定为目标纠偏量。
或者，考虑到纠偏机构对自身可能会有一个纠偏系数，因此，目标纠偏量可以为基于该多个初始纠偏量得到的中间纠偏量与纠偏系数的乘积。可选地，纠偏系数可以小于1。例如，纠偏系数为0.8，多个初始纠偏量的平均值为0.5mm，则目标纠偏量＝0.5mm*0.8＝0.4mm。
进一步地，可以向纠偏机构发送纠偏信息，该纠偏信息用于指示目标纠偏量。
若纠偏机构未设置纠偏系数，则该纠偏信息可以包括该目标纠偏量。
若纠偏机构设置有该纠偏系数，则该纠偏信息可以包括该目标纠偏量。这样，在纠偏机构接收到目标纠偏量后，可以对目标纠偏量与纠偏系数进行相乘，并利用得到的乘积对极片基材或者涂布模头进行调整，以使AB面涂布错位在规格范围内。
或者，该纠偏信息可以包括该目标纠偏量与纠偏系数的乘积。这样，纠偏机构接收到纠偏信息后，可以直接利用接收到乘积对极片基材或者 涂布模头进行调整。
在纠偏机构对极片基材或者涂布模头调整完之后，可以发送响应信息，该响应信息用于指示对极片基材或涂布模头的纠偏已经结束。
为了确认此次纠偏的效果，接收到该响应信息后，可以判断纠偏后的每个第一距离和对应的第二距离之间的错位值是否在预设范围内。
具体而言，可以再一个采样周期内，获取多个纠偏后的第一距离和多个纠偏后的第二距离，然后根据该多个纠偏后的第一距离和多个纠偏后的第二距离确定错位值是否在预设范围内。
从接收到响应信息到判断完纠偏后的错位值是否在预设范围内，极片基材的传动的距离可以为L。其中，L可以称为纠偏周期。通常情况下，L例如可以为纠偏机构到CCD相机的机械距离。
可选地，可以通过有线或无线方式与纠偏机构进行通信交互。有线通信方式例如可以包括制器局域网(control area network，CAN)通信方式、菊花链(daisy chain)通信方式。无线通信方式例如可以包括蓝牙通信、无线保真(wireless fidelity，WIFI)通信、ZigBee通信等各种方式，在此并不限定。
上述技术方案，在纠偏完成之后，通过和纠偏机构之间的信息交互，判断纠偏后的纠偏效果，不仅便于实现，而且能够降低由于纠偏效果不好而导致的第一距离和对应的第二距离之间的错位值仍然不在预设范围内，进而导致电池性能较差的概率。
为了更清楚地描述本申请实施例，下面结合图3详细描述方法100的一个具体实现过程。其中，图3中的物料为一出四物料，则第一距离、第二距离以及第一错位值的数量均为4。一个采样周期为20帧图片。
在步骤310中，获取多个第一距离和多个第二距离。
其中，该多个第一距离和多个第二距离可以通过CCD相机获取到。
在步骤320中，确定当前帧第一距离和第二距离之间的错位值。
在步骤330中，根据当前帧的错位值，计算得到初始纠偏量。
在步骤340中，连续确定20帧图片的初始纠偏量。
在步骤350中，根据初始纠偏量，确定目标纠偏量。
具体而言，对20帧图片的初始纠偏量取平均值。若平均值有小数点，则将平均值四舍五入，并只计算出小数点后一位数据，得到中间纠偏量， 再将中间纠偏量与纠偏系数相乘，得到目标纠偏量。
在步骤360中，向纠偏机构发送纠偏信息，该纠偏信息包括目标纠偏量。
在步骤370中，接收纠偏机构发送的响应信息，该响应信息用于指示对极片基材或涂布模头的纠偏已经结束。
在步骤380中，采集20帧图片的纠偏后的第一距离和第二距离。
在步骤390中，根据20帧图片的纠偏后的第一距离和第二距离，判断每个第一距离和对应的第二距离之间的错位值是否在预设范围内。
若在预设范围内，表示纠偏效果较好，本次纠偏过程结束。若不在预设范围内，执行步骤320。
在本申请实施例中，上述各过程的序号的大小并不意味着执行顺序的先后，各过程的执行顺序应以其功能和内在逻辑确定，而不应对本申请实施例的实施过程构成任何限定。
并且，在不冲突的前提下，本申请描述的各个实施例和/或各个实施例中的技术特征可以任意的相互组合，组合之后得到的技术方案也应落入本申请的保护范围。
上文详细描述了本申请实施例的涂布纠偏的方法，下面将描述本申请实施例的涂布纠偏的装置。应理解，本申请实施例中的涂布纠偏的装置可以执行本申请实施例中的涂布纠偏的方法。
图4示出了本申请实施例的涂布纠偏的装置400的示意性框图。如图4所示，该涂布纠偏的装置400可以包括：
获取单元410，用于获取多个第一距离和多个第二距离，其中，多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，多个第二距离中的每个第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离，多个第一距离和多个第二距离为在一个采样周期内采样多次得到的。
确定单元420，用于根据多个第一距离、多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
可选地，在本申请实施例中，确定单元420具体用于：根据每个第一距离、每个第一距离对应的第二距离以及至少一个预设纠偏量，确定多个初始纠偏量；根据多个初始纠偏量，确定目标纠偏量。
可选地，在本申请实施例中，确定单元420具体用于：根据多个初始纠偏量的平均值，确定目标纠偏量。
可选地，在本申请实施例中，多个第一距离包括第一目标距离，多个第二距离包括第二目标距离，第一目标距离和第二目标距离为在同一次采样中获取到的距离；确定单元420具体用于：根据第一目标距离和第二目标距离，确定第一错位值集合，第一错位值集合包括在极片基材的宽度方向上，至少一个第一表面上的涂布区边缘与对应的第二表面上的涂布区边缘之间的第一错位值；根据第一错位值和至少一个预设纠偏量，确定多个初始纠偏量中的第一初始纠偏量。
可选地，在本申请实施例中，该涂布纠偏的装置400还可以包括：纠偏单元，用于利用至少一个预设纠偏量，依次对第一错位值进行初始纠偏，得到至少一个第二错位值集合，至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对第一错位值进行初始纠偏后的错位值集合，至少一个第二错位值集合的数量与至少一个预设纠偏量的数量相同；确定单元420具体用于：基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定第一初始纠偏量。
可选地，在本申请实施例中，至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，该涂布纠偏的装置400还可以包括：选择单元，用于在至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值，确定单元420具体用于：确定第二目标错位值，第二目标错位值为至少一个绝对值最大的第二错位值中小于第一目标错位值的错位值，第一目标错位值为第一错位值集合中绝对值最大的错位值；基于至少一个预设纠偏量中的第一预设纠偏量，确定第一初始纠偏量，第一预设纠偏量包括第二目标错位值所对应的预设纠偏量。
可选地，在本申请实施例中，在第一预设纠偏量的数量为多个的情况下，选择单元具体用于：在第二错位值集合中，选择利用第一预设纠偏量对第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；确定单元420具体用于：根据至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定第一初始纠偏量。
可选地，在本申请实施例中，确定单元420具体用于：将每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和； 将至少一个错位值之和中绝对值最小的错位值之和所对应的第一预设纠偏量，确定为第一初始纠偏量。
可选地，在本申请实施例中，在第一预设纠偏量的数量为一个的情况下，确定单元420具体用于：将第一预设纠偏量确定为第一初始纠偏量。
可选地，在本申请实施例中，该涂布纠偏的装置400还包括：通信单元，用于向纠偏机构发送纠偏信息，纠偏信息用于指示目标纠偏量；通信单元还用于，接收纠偏机构发送的响应信息，响应信息用于指示对极片基材或涂布模头的纠偏已经结束；判断单元，用于响应于响应信息，判断纠偏后的每个第一距离和对应的第二距离之间的错位值是否在预设范围内。
可选地，在本申请实施例中，至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
应理解，该涂布纠偏的装置400可以实现方法100中的相应操作，为了简洁，在此不再赘述。
图5是本申请实施例的涂布纠偏的装置500的硬件结构示意图。该涂布纠偏的装置500包括存储器501、处理器502、通信接口503以及总线504。其中，存储器501、处理器502、通信接口503通过总线504实现彼此之间的通信连接。
存储器501可以是只读存储器(read-only memory，ROM)，静态存储设备和随机存取存储器(random access memory，RAM)。存储器501可以存储程序，当存储器501中存储的程序被处理器502执行时，处理器502和通信接口503用于执行本申请实施例的涂布纠偏的方法的各个步骤。
处理器502可以采用通用的中央处理器(central processing unit，CPU)，微处理器，应用专用集成电路(application specific integrated circuit，ASIC)，图形处理器(graphics processing unit，GPU)或者一个或多个集成电路，用于执行相关程序，以实现本申请实施例的装置中的单元所需执行的功能，或者执行本申请实施例的涂布纠偏的方法。
处理器502还可以是一种集成电路芯片，具有信号的处理能力。在实现过程中，本申请实施例的涂布纠偏的方法的各个步骤可以通过处理器502中的硬件的集成逻辑电路或者软件形式的指令完成。
上述处理器502还可以是通用处理器、数字信号处理器(digital  signal processing，DSP)、ASIC、现成可编程门阵列(field programmable gate array，FPGA)或者其他可编程逻辑器件、分立门或者晶体管逻辑器件、分立硬件组件。可以实现或者执行本申请实施例中的公开的各方法、步骤及逻辑框图。通用处理器可以是微处理器或者该处理器也可以是任何常规的处理器等。结合本申请实施例所公开的方法的步骤可以直接体现为硬件处理器执行完成，或者用处理器中的硬件及软件模块组合执行完成。软件模块可以位于随机存储器，闪存、只读存储器，可编程只读存储器或者电可擦写可编程存储器、寄存器等本领域成熟的存储介质中。该存储介质位于存储器501，处理器502读取存储器501中的信息，结合其硬件完成本申请实施例的涂布纠偏的装置500中包括的单元所需执行的功能，或者执行本申请实施例的涂布纠偏的方法。
通信接口503使用例如但不限于收发器一类的收发装置，来实现涂布纠偏的装置500与其他设备或通信网络之间的通信。
总线504可包括在涂布纠偏的装置500各个部件(例如，存储器501、处理器502、通信接口503)之间传送信息的通路。
应注意，尽管上述涂布纠偏的装置500仅仅示出了存储器、处理器、通信接口，但是在具体实现过程中，本领域的技术人员应当理解，涂布纠偏的装置500还可以包括实现正常运行所必须的其他器件。同时，根据具体需要，本领域的技术人员应当理解，涂布纠偏的装置500还可包括实现其他附加功能的硬件器件。此外，本领域的技术人员应当理解，涂布纠偏的装置500也可仅仅包括实现本申请实施例所必须的器件，而不必包括图5中所示的全部器件。
本申请实施例还提供了一种计算机可读存储介质，用于存储计算机程序，该计算机程序用于执行前述本申请各种实施例的方法。
上述的计算机可读存储介质可以是暂态计算机可读存储介质，也可以是非暂态计算机可读存储介质。
本申请实施例还提供了一种计算机程序产品，该计算机程序产品包括存储在计算机可读存储介质上的计算机程序，该计算机程序包括程序指令，当程序指令被计算机执行时，使计算机执行上述涂布纠偏的方法。
最后应说明的是：以上实施例仅用以说明本申请的技术方案，而非对其限制；尽管参照前述实施例对本申请进行了详细的说明，本领域的普 通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换，但这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围。

Claims (24)

  1. 一种涂布纠偏的方法，其特征在于，所述方法包括：
    获取多个第一距离和多个第二距离，其中，所述多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述多个第二距离中的每个第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离，所述多个第一距离和所述多个第二距离为在一个采样周期内采样多次得到的；
    根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
  2. 根据权利要求1所述的方法，其特征在于，所述根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量，包括：
    根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量；
    根据所述多个初始纠偏量，确定所述目标纠偏量。
  3. 根据权利要求2所述的方法，其特征在于，所述根据所述多个初始纠偏量，确定所述目标纠偏量，包括：
    根据所述多个初始纠偏量的平均值，确定所述目标纠偏量。
  4. 根据权利要求2或3所述的方法，其特征在于，所述多个第一距离包括第一目标距离，所述多个第二距离包括第二目标距离，所述第一目标距离和所述第二目标距离为在同一次采样中获取到的距离；
    所述根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量，包括：
    根据所述第一目标距离和所述第二目标距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；
    根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏量。
  5. 根据权利要求4所述的方法，其特征在于，所述根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏量， 包括：
    利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；
    基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量。
  6. 根据权利要求5所述的方法，其特征在于，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量，包括：
    在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；
    确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；
    基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
  7. 根据权利要求6所述的方法，其特征在于，在所述第一预设纠偏量的数量为多个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，包括：
    在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；
    根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量。
  8. 根据权利要求7所述的方法，其特征在于，所述根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量，包括：
    将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；
    将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述第一初始纠偏量。
  9. 根据权利要求6所述的方法，其特征在于，在所述第一预设纠偏量的数量为一个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，包括：
    将所述第一预设纠偏量确定为所述第一初始纠偏量。
  10. 根据权利要求1至9中任一项所述的方法，其特征在于，所述方法还包括：
    向纠偏机构发送纠偏信息，所述纠偏信息用于指示所述目标纠偏量；
    接收所述纠偏机构发送的响应信息，所述响应信息用于指示对所述极片基材或涂布模头的纠偏已经结束；
    响应于所述响应信息，判断纠偏后的所述每个第一距离和对应的所述第二距离之间的错位值是否在预设范围内。
  11. 根据权利要求1至10中任一项所述的方法，其特征在于，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
  12. 一种涂布纠偏的装置，其特征在于，包括：
    获取单元，用于获取多个第一距离和多个第二距离，其中，所述多个第一距离中的每个第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述多个第二距离中的每个第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离，所述多个第一距离和所述多个第二距离为在一个采样周期内采样多次得到的；
    确定单元，用于根据所述多个第一距离、所述多个第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
  13. 根据权利要求12所述的装置，其特征在于，所述确定单元具体用于：
    根据所述每个第一距离、所述每个第一距离对应的所述第二距离以及所述至少一个预设纠偏量，确定多个初始纠偏量；
    根据所述多个初始纠偏量，确定所述目标纠偏量。
  14. 根据权利要求13所述的装置，其特征在于，所述确定单元具体用于：
    根据所述多个初始纠偏量的平均值，确定所述目标纠偏量。
  15. 根据权利要求13或14所述的装置，其特征在于，所述多个第一距 离包括第一目标距离，所述多个第二距离包括第二目标距离，所述第一目标距离和所述第二目标距离为在同一次采样中获取到的距离；
    所述确定单元具体用于：
    根据所述第一目标距离和所述第二目标距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；
    根据所述第一错位值和所述至少一个预设纠偏量，确定所述多个初始纠偏量中的第一初始纠偏量。
  16. 根据权利要求15所述的装置，其特征在于，所述装置还包括：
    纠偏单元，用于利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；
    所述确定单元具体用于：
    基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述第一初始纠偏量。
  17. 根据权利要求16所述的装置，其特征在于，所述装置还包括：
    选择单元，用于在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；
    所述确定单元具体用于：
    确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；
    基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述第一初始纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
  18. 根据权利要求17所述的装置，其特征在于，在所述第一预设纠偏量的数量为多个的情况下，所述选择单元具体用于：
    在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；
    所述确定单元具体用于：
    根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述第一初始纠偏量。
  19. 根据权利要求18所述的装置，其特征在于，所述确定单元具体用于：
    将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；
    将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述第一初始纠偏量。
  20. 根据权利要求17所述的装置，其特征在于，在所述第一预设纠偏量的数量为一个的情况下，所述确定单元具体用于：
    将所述第一预设纠偏量确定为所述第一初始纠偏量。
  21. 根据权利要求12至20中任一项所述的装置，其特征在于，所述装置还包括：
    通信单元，用于向纠偏机构发送纠偏信息，所述纠偏信息用于指示所述目标纠偏量；
    所述通信单元还用于，接收所述纠偏机构发送的响应信息，所述响应信息用于指示对所述极片基材或涂布模头的纠偏已经结束；
    判断单元，用于响应于所述响应信息，判断纠偏后的所述每个第一距离和对应的所述第二距离之间的错位值是否在预设范围内。
  22. 根据权利要求12至21中任一项所述的装置，其特征在于，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
  23. 一种涂布纠偏的装置，其特征在于，包括：
    存储器，用于存储程序；
    处理器，用于执行所述存储器存储的程序，当所述存储器存储的程序被执行时，所述处理器用于执行根据权利要求1至11中任一项所述的涂布纠偏的方法。
  24. 一种计算机可读存储介质，其特征在于，用于存储计算机程序，所述计算机程序使得计算机执行如权利要求1至11中任一项所述的涂布纠偏的方法。
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