WO2025030880A1 - 涂布纠偏的方法和装置 - Google Patents

涂布纠偏的方法和装置 Download PDF

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Publication number
WO2025030880A1
WO2025030880A1 PCT/CN2024/084518 CN2024084518W WO2025030880A1 WO 2025030880 A1 WO2025030880 A1 WO 2025030880A1 CN 2024084518 W CN2024084518 W CN 2024084518W WO 2025030880 A1 WO2025030880 A1 WO 2025030880A1
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WIPO (PCT)
Prior art keywords
correction amount
misalignment value
misalignment
target
value set
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Pending
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PCT/CN2024/084518
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English (en)
French (fr)
Inventor
胡良锦
马林
王晞
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Contemporary Amperex Technology Co Ltd
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Contemporary Amperex Technology Co Ltd
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Priority to EP24850537.2A priority Critical patent/EP4596474A4/en
Publication of WO2025030880A1 publication Critical patent/WO2025030880A1/zh
Priority to US19/211,995 priority patent/US20250276342A1/en
Anticipated expiration legal-status Critical
Pending legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C21/00—Accessories or implements for use in connection with applying liquids or other fluent materials to surfaces, not provided for in groups B05C1/00 - B05C19/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/04—Processes of manufacture in general
    • H01M4/0402—Methods of deposition of the material
    • H01M4/0404—Methods of deposition of the material by coating on electrode collectors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H23/00—Registering, tensioning, smoothing or guiding webs
    • B65H23/02—Registering, tensioning, smoothing or guiding webs transversely
    • B65H23/032—Controlling transverse register of web
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H26/00—Warning or safety devices, e.g. automatic fault detectors, stop-motions, for web-advancing mechanisms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/04—Construction or manufacture in general
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
    • B05C11/1005—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves responsive to condition of liquid or other fluent material already applied to the surface, e.g. coating thickness, weight or pattern
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2301/00—Handling processes for sheets or webs
    • B65H2301/50—Auxiliary process performed during handling process
    • B65H2301/51—Modifying a characteristic of handled material
    • B65H2301/516—Securing handled material to another material
    • B65H2301/5162—Coating, applying liquid or layer of any material to material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/02—Rulers with scales or marks for direct reading
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Definitions

  • the present application relates to the field of battery manufacturing technology, and in particular to a coating deviation correction method and device.
  • the production process of batteries is relatively complex and includes multiple processes, among which the coating process is an important link that cannot be ignored and has a crucial impact on battery performance.
  • the embodiments of the present application provide a coating deviation correction method and device, which can effectively improve the performance of the battery.
  • a method for coating correction comprising: obtaining a first distance and a second distance, wherein the first distance is the distance from the edge of a coating area on a first surface of an electrode substrate to a reference edge, and the second distance is the distance from the edge of a coating area on a second surface of the electrode substrate to the reference edge; determining a target correction amount during the coating process according to the first distance, the second distance and at least one preset correction amount.
  • the coating misalignment size between the two corresponding surfaces can be determined, and then the target deviation correction amount in the coating process is determined based on the preset deviation correction amount, so that the electrode substrate can be coated with high efficiency and accuracy.
  • the target deviation correction amount is determined by the rate. Based on the target deviation correction amount, deviation correction is performed so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • determining the target correction amount in the coating process based on the first distance, the second distance and the at least one preset correction amount includes: determining a first misalignment value set based on the first distance and the second distance, the first misalignment value set including a first misalignment value between at least one edge of a coating area on the first surface and a corresponding edge of a coating area on the second surface in the width direction of the electrode substrate; determining the target correction amount based on the first misalignment value and the at least one preset correction amount.
  • the above technical solution determines the misalignment value between two corresponding surfaces according to the first distance and the second distance, which is simple to implement and effectively reduces the complexity of implementation. Furthermore, the target correction amount is determined according to the misalignment value between the two corresponding surfaces and the preset correction amount, so that the target correction amount can be determined with high efficiency and accuracy. Correction is performed based on the target correction amount, so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • determining the target correction amount based on the first misalignment value and the at least one preset correction amount includes: using the at least one preset correction amount to perform initial correction on the first misalignment values in turn to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set being a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of the at least one second misalignment value set is the same as the number of the at least one preset correction amount; determining the target correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value.
  • the above technical scheme first uses a preset correction amount to perform initial correction on the misalignment value between two corresponding surfaces, and then determines the final target correction amount based on the result of the initial correction, which helps to eliminate inappropriate correction amounts in the preset correction amounts, thereby reducing the amount of calculation for determining the target correction amount, and thus improving the efficiency of determining the target correction amount and performing correction.
  • each second misalignment value set in the at least one second misalignment value set includes at least one second misalignment value
  • determining the target correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value includes: selecting a second misalignment value with the largest absolute value in each second misalignment value set in the at least one second misalignment value set; determining a second target misalignment value, the second target misalignment value being a misalignment value that is smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, and the first misalignment value being the target correction amount.
  • a target misalignment value is the misalignment value with the largest absolute value in the first misalignment value set; the target correction amount is determined based on a first preset correction amount in the at least one preset correction amount, and the first preset correction amount includes the preset correction amount corresponding to the second target misalignment value.
  • the above technical solution selects the misalignment value after the initial correction whose absolute value is smaller than the misalignment value before correction, and determines the target correction amount based on the correction amount corresponding to the selected misalignment value, that is, abandons the inappropriate correction amount. In this way, not only the probability of more deviation is reduced, but also the number of appropriate correction amounts selected may be less than the number of correction amounts preset at the beginning, which effectively reduces the time spent on determining the target correction amount and improves efficiency.
  • determining the target correction amount based on a first preset correction amount among the at least one preset correction amount includes: selecting a misalignment value set in the second misalignment value set after initial correction of the first misalignment value using the first preset correction amount to obtain at least one second target misalignment value set; and determining the target correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • the above technical solution determines the target correction amount based on the misalignment value after initial correction of the misalignment value between two surfaces using a suitable correction amount, which can greatly improve the accuracy of the determined target correction amount.
  • determining the target correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set includes: adding the second misalignment values included in each second target misalignment value set to obtain at least one sum of misalignment values; and determining the first preset correction amount corresponding to the sum of misalignment values with the smallest absolute value in the at least one sum of misalignment values as the target correction amount.
  • the above technical scheme determines the preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the sum of the misalignment values as the target correction amount.
  • the accuracy of the target correction amount determined in this way is higher, and the effect of correction based on the target correction amount is better, thereby further improving the performance of the battery.
  • determining the target correction amount based on the first preset correction amount among the at least one preset correction amount includes: determining the first preset correction amount as the target correction amount.
  • the first preset correction amount is determined as the target correction amount, which not only greatly reduces the calculation complexity but also has a higher accuracy rate in determining the target correction amount.
  • the at least one preset correction amount includes at least one of the following correction amounts: -0.1 mm, 0.1 mm, -0.2 mm, 0.2 mm, -0.3 mm, 0.3 mm, -0.4 mm, 0.4 mm, -0.5 mm, and 0.5 mm.
  • the above technical solution sets at least one preset correction amount to at least one of -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm. While correcting the misalignment of the coated AB surface within the specification range, it also meets the correction accuracy of the correction mechanism and reduces the probability of tape breakage of the electrode substrate.
  • a coating correction device comprising: an acquisition unit for acquiring a first distance and a second distance, wherein the first distance is the distance from the edge of the coating area on the first surface of the pole piece substrate to a reference edge, and the second distance is the distance from the edge of the coating area on the second surface of the pole piece substrate to the reference edge; a determination unit for determining a target correction amount in the coating process based on the first distance, the second distance and at least one preset correction amount.
  • the determination unit is specifically used to: determine a first misalignment value set based on the first distance and the second distance, the first misalignment value set including a first misalignment value between at least one edge of a coating area on the first surface and a corresponding edge of a coating area on the second surface in the width direction of the pole piece substrate; determine the target correction amount based on the first misalignment value and the at least one preset correction amount.
  • the device also includes: a correction unit, used to use the at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of the at least one second misalignment value set is the same as the number of the at least one preset correction amount; the determination unit is specifically used to: determine the target correction amount based on the at least one second misalignment value set, the at least one preset correction amount and the first misalignment value.
  • a correction unit used to use the at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is
  • each second misalignment value set in the at least one second misalignment value set includes at least one second misalignment value
  • the device further includes: a selection unit, configured to select a second misalignment value having a maximum absolute value in each second misalignment value set in the at least one second misalignment value set; and the determination unit is specifically configured to: determine a second target misalignment value, wherein the second target misalignment value
  • the marked misalignment value is a misalignment value that is smaller than the first target misalignment value among at least one second misalignment value with the largest absolute value, and the first target misalignment value is the misalignment value with the largest absolute value in the first misalignment value set; based on the first preset correction amount among the at least one preset correction amount, the target correction amount is determined, and the first preset correction amount includes the preset correction amount corresponding to the second target misalignment value.
  • the selection unit when there are multiple first preset correction amounts, is specifically used to: select, from the second misalignment value set, a misalignment value set after initial correction of the first misalignment value using the first preset correction amount, to obtain at least one second target misalignment value set; and the determination unit is specifically used to: determine the target correction amount based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • the determination unit is specifically used to: add the second target misalignment values included in each second misalignment value set to obtain the sum of at least one misalignment value; and determine the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the at least one sum of the misalignment values as the target correction amount.
  • the determining unit when the number of the first preset deviation correction amount is one, is specifically configured to: determine the first preset deviation correction amount as the target deviation correction amount.
  • the at least one preset correction amount includes at least one of the following correction amounts: -0.1 mm, 0.1 mm, -0.2 mm, 0.2 mm, -0.3 mm, 0.3 mm, -0.4 mm, 0.4 mm, -0.5 mm, and 0.5 mm.
  • a coating correction device comprising a processor and a memory, wherein the memory is used to store a computer program, and the processor is used to call the computer program to execute the method in the above-mentioned first aspect or its various implementation methods.
  • a computer-readable storage medium for storing a computer program, wherein the computer program enables a computer to execute the method in the above-mentioned first aspect or its various implementations.
  • FIG. 1 is a schematic flow chart of a coating deviation correction method according to an embodiment of the present application.
  • FIG. 2 is a schematic diagram of AB surface coating according to an embodiment of the present application.
  • FIG. 3 is a schematic block diagram of a coating correction device according to an embodiment of the present application.
  • FIG. 4 is a schematic block diagram of a coating deviation correction device according to an embodiment of the present application.
  • batteries can be used as the main power source for electrical devices (such as vehicles, ships or spacecraft, etc.). It should be understood that the battery mentioned in the embodiments of the present application refers to a battery comprising one or more battery cells to provide higher voltage and capacity. A single physical module.
  • the battery can be a power battery.
  • the battery can be a lithium-ion battery, a lithium metal battery, a lead-acid battery, a nickel-cathode battery, a nickel-hydrogen battery, a lithium-sulfur battery, a lithium-air battery or a sodium-ion battery, etc., which is not specifically limited in the embodiments of the present application.
  • the battery in the embodiments of the present application can be a battery cell/battery monomer, or a battery module or a battery pack, which is not specifically limited in the embodiments of the present application.
  • the production process of batteries is relatively complex and includes multiple processes, such as stirring, coating, rolling, die-cutting, winding, injection, and formation.
  • the coating process is an important part that cannot be ignored. Its influence on battery performance is crucial.
  • the stability, uniformity, and size of the coating will affect the final performance of the battery.
  • the size of the coated AB surface Including position size, width size, AB surface misalignment size, etc., all have a great impact on the performance of the battery.
  • the coating result of the electrode may deviate due to factors such as the pressure of the coating die nozzle.
  • the misalignment of the AB surface of the electrode coating area exceeds a certain range, if it is not discovered and corrected in time, it may seriously affect the performance of the battery, and will also seriously increase the scrap rate of the product and increase the manufacturing cost.
  • an embodiment of the present application proposes a method for coating correction, by obtaining a first distance and a second distance, and determining a target correction amount in the coating process according to the first distance, the second distance and at least one preset correction amount, wherein the first distance is the distance from the edge of the coating area on the first surface of the pole piece substrate to the reference edge, and the second distance is the distance from the edge of the coating area on the second surface of the pole piece substrate to the reference edge.
  • the coating misalignment size between the two corresponding surfaces can be determined, and then the target correction amount in the coating process is determined based on the preset correction amount, so that the target correction amount can be determined with higher efficiency and accuracy. Correction is performed based on the target correction amount so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • Fig. 1 shows a schematic flow chart of a coating correction method 100 according to an embodiment of the present application. As shown in Fig. 1 , the method 100 may include at least part of the following contents.
  • S110 Obtain a first distance and a second distance, wherein the first distance is the distance from the edge of the coating area on the first surface of the electrode substrate to the reference edge, and the second distance is the distance from the edge of the coating area on the second surface of the electrode substrate to the reference edge.
  • S120 Determine the coating process according to the first distance, the second distance and at least one preset deviation correction amount. The target correction amount during the process.
  • the coating misalignment size between the two corresponding surfaces can be determined, and then the target correction amount in the coating process is determined based on the preset correction amount, so that the target correction amount can be determined with high efficiency and accuracy. Correction is performed based on the target correction amount, so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • the electrode substrate may include, for example, aluminum foil, and the electrode obtained based on the electrode substrate is a positive electrode.
  • the electrode substrate may include, for example, copper foil, and the electrode obtained based on the electrode substrate is a negative electrode.
  • the coating area is the area where the slurry is coated.
  • the first surface may be one of the surfaces on the electrode substrate where the slurry is coated, and may be the front side of the electrode substrate or the back side of the electrode substrate.
  • the second surface may be a surface on the electrode substrate corresponding to the first surface. For example, if the first surface is the front side of the electrode substrate, the second surface is the back side of the electrode substrate; if the first surface is the back side of the electrode substrate, the second surface is the front side of the electrode substrate.
  • the edge of the coating area may refer to the edge of the coating area along the length direction. It should be understood that the length direction may also be referred to as the longitudinal direction (machine direction, MD) of the pole piece.
  • the slurry can also be called an active material. If the electrode substrate includes aluminum foil, the slurry can include lithium cobalt oxide, lithium iron phosphate, ternary lithium or lithium manganese oxide, etc. If the electrode substrate includes copper foil, the slurry can include carbon or silicon, etc.
  • the reference edge may be an edge of the electrode substrate along the length direction, and the edge may be any one of the two edges or both edges. Alternatively, the reference edge may also be an edge manually set by the user.
  • the first distance and the second distance may be measured manually, such as by using a tape measure to obtain the first distance and the second distance.
  • the first distance and the second distance may be acquired through an imaging device, such as a charge coupled device (CCD) visual system.
  • CCD charge coupled device
  • the first distance and the second distance may be acquired in real time.
  • the first distance and the second distance may be acquired periodically.
  • the first distance and the second distance may be acquired once every 5 mm.
  • the first distance and the second distance may be acquired randomly.
  • the pole piece substrate may be skew-corrected, that is, the target skew-correction amount is the skew-correction amount of the pole piece substrate.
  • the coating die head can be corrected, that is, the target correction amount is the correction of the coating die head. quantity.
  • S120 may specifically include: determining a first misalignment value set according to the first distance and the second distance, and determining a target correction amount according to the first misalignment value and at least one preset correction amount.
  • the first misalignment value set includes a first misalignment value between an edge of a coating area on at least one first surface and an edge of a coating area on a corresponding second surface in a width direction of the electrode substrate.
  • This technical solution determines the misalignment value between two corresponding surfaces based on the first distance and the second distance, which is simple to implement and effectively reduces the complexity of implementation. Furthermore, the target correction amount is determined based on the misalignment value between the two corresponding surfaces and the preset correction amount, so that the target correction amount can be determined with high efficiency and accuracy. Correction is performed based on the target correction amount, so that the coating misalignment size between the two corresponding surfaces can be within the specification range, thereby effectively improving the performance of the battery.
  • the width direction of the electrode substrate can also be called the transverse direction (TD).
  • first distances There may be multiple first distances, and accordingly, there may be multiple second distances. Then, there may be multiple first misalignment values, and the number of first misalignment values is the same as the number of first distances and second distances.
  • the preset correction amount can be determined based on at least one of the following parameters: national standards, company standards, or industry standards, the maximum misalignment of the electrode AB surface coating allowed in the production and manufacturing of batteries, empirical values, and on-site production and manufacturing requirements.
  • the range of the first misalignment value can be between -1mm and 1mm. And if the deviation is corrected too much, the pole piece substrate may be broken. Furthermore, usually in the deviation correction process, the deviation correction accuracy is 0.1mm. Therefore, in an embodiment of the present application, at least one preset deviation correction amount may include at least one of the following deviation correction amounts: -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • the embodiments of the present application do not specifically limit the "+” and "-" in the preset deviation correction amount. If “+” indicates deviation correction along the TD direction toward the first direction, such as deviation correction to the left, then “-” indicates deviation correction along the TD direction in the direction opposite to the first direction, such as deviation correction to the right. If “+” indicates deviation correction along the TD direction in the direction opposite to the first direction, such as deviation correction to the right, then “-” indicates deviation correction along the TD direction toward the first direction, such as deviation correction to the left.
  • the above technical solution sets at least one preset deviation correction amount to at least one of -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm, which can correct the misalignment of the coating AB surface within the specification range while also meeting the requirements of the deviation correction machine.
  • the correction accuracy of the structure is improved and the probability of tape breakage of the electrode substrate is reduced.
  • Figure 2 shows a schematic diagram of AB surface coating. Wherein, Figure 2 shows a one-out-four material, and the first misalignment value includes 4 misalignment values.
  • the coating production line can also include one-out-two materials, one-out-six materials, one-out-eight materials, one-out-ten materials, and one-out-twelve materials.
  • determining a target correction amount according to a first misalignment value and at least one preset correction amount may include: using at least one preset correction amount to sequentially perform initial correction on the first misalignment value to obtain at least one second misalignment value set, wherein each second misalignment value set in the at least one second misalignment value set is a misalignment value set after initial correction on the first misalignment value using the same preset correction amount, and the number of at least one second misalignment value set is the same as the number of at least one preset correction amount. Then, based on at least one second misalignment value set, at least one preset correction amount, and the first misalignment value, the target correction amount is determined.
  • This technical solution first uses a preset correction amount to perform initial correction on the misalignment value between two corresponding surfaces, and then determines the final target correction amount based on the result of the initial correction. This helps to eliminate inappropriate correction amounts from the preset correction amounts, thereby reducing the amount of calculation for determining the target correction amount, and thereby improving the efficiency of determining the target correction amount and performing correction.
  • Each second misalignment value set in the at least one second misalignment value set may include at least one second misalignment value, and the number of the at least one second misalignment value included in each second misalignment value set is the same as the number of the first misalignment values.
  • At least one preset correction amount includes x1, x2, x3, x4, x5, x6, x7, x8, x9 and x10.
  • x1 to perform initial correction on a, b, c and d to obtain the first second misalignment value set, which includes four second misalignment values, namely (a+x1), (b+x1), (c+x1) and (d+x1).
  • determining the target deviation correction amount based on at least one second misalignment value set, at least one preset deviation correction amount, and the first misalignment value may include: selecting the second misalignment value with the largest absolute value in each second misalignment value set in at least one second misalignment value set, and then determining the second target misalignment value, the second target misalignment value being a misalignment value smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, the first target misalignment value being a misalignment value with the largest absolute value in the first misalignment value set. Then, determining the target deviation correction amount based on the first preset deviation correction amount in at least one preset deviation correction amount, the first preset deviation correction amount including the preset deviation correction amount corresponding to the second target misalignment value.
  • the above technical solution selects the misalignment value after the initial correction whose absolute value is smaller than the misalignment value before correction, and determines the target correction amount based on the correction amount corresponding to the selected misalignment value, that is, abandons the inappropriate correction amount. In this way, not only the probability of more deviation after correction is reduced, but also the number of appropriate correction amounts selected may be less than the number of correction amounts preset at the beginning, which effectively reduces the time spent on determining the target correction amount and improves efficiency.
  • h10 max(
  • a misalignment value less than f is selected from h1, h2, h3, ..., h10.
  • the preset correction amounts corresponding to h1, h3, h6, and h8 are x1, x3, x6, and x8, respectively, and x1, x3, x6, and x8 are collectively referred to as the first preset correction amount.
  • the first preset deviation correction amount may be multiple or one.
  • the first preset deviation correction amount may be determined as the target deviation correction amount.
  • the first preset correction amount is determined as the target correction amount, which not only greatly reduces the calculation complexity but also has a higher accuracy rate in determining the target correction amount.
  • a set of misalignment values after initial correction of the first misalignment value using a first preset correction amount is selected to obtain at least one second target misalignment value set, and then a target correction amount is determined based on the second misalignment value included in each second target misalignment value set in the at least one second target misalignment value set.
  • This technical solution determines the target correction amount based on the misalignment value after initial correction of the misalignment value between two surfaces using a suitable correction amount, which can greatly improve the accuracy of the determined target correction amount.
  • the second misalignment values included in each second target misalignment value set can be added to obtain at least one misalignment value sum, and then the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the at least one misalignment value sum can be determined as the target correction amount.
  • the above technical scheme determines the preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the sum of the misalignment values as the target correction amount.
  • the accuracy of the target correction amount determined in this way is higher, and the effect of correction based on the target correction amount is higher, thereby further improving the performance of the battery.
  • the target offset can be determined based on the sum of the four misalignment values.
  • the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value among the sum of the four misalignment values can be determined as the target correction amount. For example, if min(
  • ) y2, the target offset is x3.
  • the sum of each misalignment value in the sum of the four misalignment values may be averaged, and the first preset correction amount corresponding to the average with the smallest absolute value among the averages is the target correction amount.
  • the electrode substrate or coating die head can be adjusted based on the target deviation correction amount so that the AB surface coating misalignment is within the specification range.
  • the first misalignment value set includes 4 first misalignment values
  • the 4 first misalignment values are 0.05mm, 0.2mm, 0.15mm and -0.5mm respectively
  • the preset correction amounts include -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • 10 preset correction amounts are used to correct the four first misalignment values in turn, and the second misalignment value with the largest absolute value is selected from each obtained set of second misalignment values.
  • ) 0.6mm.
  • ) 0.4mm.
  • ) 0.7mm.
  • ) 0.4mm.
  • ) 0.8mm.
  • ) 0.5mm.
  • ) 0.9mm.
  • ) 0.6mm.
  • ) 1mm.
  • ) 0.7mm.
  • the first target misalignment value f max(
  • ) 0.5mm in the first misalignment value set.
  • h1, h3, h5, h7, h8, h9 and h10 are all greater than f, indicating that the preset correction amounts of -0.1mm, -0.2mm, -0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm corresponding to h1, h3, h5, h7, h8, h9 and h10 result in more deviations, and the misalignment size of the AB surface coating after correction is larger than that before correction.
  • the preset correction amounts of -0.1mm, -0.2mm, -0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm corresponding to h1, h3, h5, h7, h8, h9 and h10 are abandoned, and the preset correction amounts of 0.1mm, 0.2mm and 0.3mm corresponding to h2, h4 and h6 meet the requirements.
  • the target correction amount is determined to be 0.1mm.
  • sequence numbers of the above processes do not mean the order of execution.
  • the order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.
  • the coating correction method of the embodiment of the present application is described in detail above, and the coating correction device of the embodiment of the present application will be described below. It should be understood that the coating correction device in the embodiment of the present application can execute the coating correction method in the embodiment of the present application.
  • Fig. 3 shows a schematic block diagram of a coating correction device 300 according to an embodiment of the present application.
  • the coating correction device 300 may include:
  • the acquisition unit 310 is used to acquire a first distance and a second distance, wherein the first distance is the distance from the edge of the coating area on the first surface of the electrode substrate to the reference edge, and the second distance is the distance from the edge of the coating area on the second surface of the electrode substrate to the reference edge.
  • the determination unit 320 is used to determine a target deviation correction amount in the coating process according to the first distance, the second distance and at least one preset deviation correction amount.
  • the determination unit 320 is specifically used to: determine a first misalignment value set based on the first distance and the second distance, the first misalignment value set including a first misalignment value between an edge of a coating area on at least one first surface and an edge of a coating area on a corresponding second surface in the width direction of the electrode substrate; determine a target correction amount based on the first misalignment value and at least one preset correction amount.
  • the coating correction device 300 may further include: a correction unit, used to use at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is initially corrected using the same preset correction amount, and the number of at least one second misalignment value set is the same as the number of at least one preset correction amount; the determination unit 320 is specifically used to: determine the target correction amount based on at least one second misalignment value set, at least one preset correction amount and the first misalignment value.
  • a correction unit used to use at least one preset correction amount to perform initial correction on the first misalignment values in sequence to obtain at least one second misalignment value set, each second misalignment value set in the at least one second misalignment value set is a misalignment value set after the first misalignment value is
  • each second misalignment value set in at least one second misalignment value set includes at least one second misalignment value
  • the coating correction device 300 may also include: a selection unit, used to select the second misalignment value with the largest absolute value in each second misalignment value set in at least one second misalignment value set
  • the determination unit 320 is specifically used to: determine a second target misalignment value, the second target misalignment value is a misalignment value that is smaller than the first target misalignment value in at least one second misalignment value with the largest absolute value, and the first target misalignment value is the misalignment value with the largest absolute value in the first misalignment value set; determine the target correction amount based on a first preset correction amount in at least one preset correction amount, and the first preset correction amount includes a preset correction amount corresponding to the second target misalignment value.
  • the selection unit when the number of first preset correction amounts is multiple, is specifically used to: select, from the second misalignment value set, a misalignment value set after initial correction of the first misalignment value using the first preset correction amount, to obtain at least one second target misalignment value set; the determination unit 320 is specifically used to: determine the target correction amount based on the second misalignment value included in each second target misalignment value set in at least one second target misalignment value set.
  • the determination unit 320 is specifically used to: add the second misalignment values included in each second target misalignment value set to obtain the sum of at least one misalignment value; and determine the first preset correction amount corresponding to the sum of the misalignment values with the smallest absolute value in the sum of at least one misalignment value as the target correction amount.
  • the determination unit 320 is specifically configured to: determine the first preset deviation correction amount as the target deviation correction amount.
  • At least one preset correction amount includes at least one of the following correction amounts: -0.1mm, 0.1mm, -0.2mm, 0.2mm, -0.3mm, 0.3mm, -0.4mm, 0.4mm, -0.5mm and 0.5mm.
  • the coating deviation correction device 300 can implement the corresponding operations in the method 100, and for the sake of brevity, it will not be described in detail here.
  • Fig. 4 is a schematic diagram of the hardware structure of a coating correction device 400 according to an embodiment of the present application.
  • the coating correction device 400 includes a memory 401, a processor 402, a communication interface 403 and a bus 404.
  • the memory 401, the processor 402 and the communication interface 403 are connected to each other through the bus 404.
  • the memory 401 may be a read-only memory (ROM), a static storage device, and a random access memory (RAM).
  • the memory 401 may store a program. When the program stored in the memory 401 is executed by the processor 402, the processor 402 and the communication interface 403 are used to execute each step of the coating correction method of the embodiment of the present application.
  • the processor 402 can adopt a general central processing unit (CPU), a microprocessor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU) or one or more integrated circuits to execute relevant programs to realize the functions required to be performed by the units in the device of the embodiment of the present application, or to execute the coating correction method of the embodiment of the present application.
  • CPU central processing unit
  • ASIC application specific integrated circuit
  • GPU graphics processing unit
  • the processor 402 may also be an integrated circuit chip having the ability to process signals.
  • the integrated logic circuit of hardware or the instruction in software form in 402 is completed.
  • the processor 402 may also be a general-purpose processor, a digital signal processor (DSP), an ASIC, a field programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, or discrete hardware components.
  • DSP digital signal processor
  • FPGA field programmable gate array
  • the methods, steps, and logic diagrams disclosed in the embodiments of the present application may be implemented or executed.
  • the general-purpose processor may be a microprocessor or the processor may be any conventional processor, etc.
  • the steps of the method disclosed in the embodiments of the present application may be directly embodied as being executed by a hardware processor, or may be executed by a combination of hardware and software modules in the processor.
  • the software module may be located in a mature storage medium in the art, such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc.
  • the storage medium is located in the memory 401, and the processor 402 reads the information in the memory 401, and completes the functions required to be performed by the units included in the coating correction device 400 of the embodiment of the present application in combination with its hardware, or executes the coating correction method of the embodiment of the present application.
  • the communication interface 403 uses a transceiver device such as but not limited to a transceiver to achieve communication between the coating correction device 400 and other equipment or a communication network.
  • the bus 404 may include a path for transmitting information between various components of the coating and deflection correction device 400 (eg, the memory 401 , the processor 402 , and the communication interface 403 ).
  • coating correction device 400 only shows a memory, a processor, and a communication interface, in the specific implementation process, those skilled in the art should understand that the coating correction device 400 may also include other devices necessary for normal operation. At the same time, according to specific needs, those skilled in the art should understand that the coating correction device 400 may also include hardware devices for realizing other additional functions. In addition, those skilled in the art should understand that the coating correction device 400 may also only include the devices necessary for realizing the embodiment of the present application, and does not necessarily include all the devices shown in FIG. 4.
  • the embodiments of the present application also provide a computer-readable storage medium for storing a computer program, which is used to execute the methods of the various embodiments of the present application described above.
  • the computer-readable storage medium mentioned above may be a transient computer-readable storage medium or a non-transitory computer-readable storage medium.
  • An embodiment of the present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions.
  • the program instructions When the program instructions are executed by a computer, the computer executes the above-mentioned coating correction method.

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Abstract

一种涂布纠偏的方法，包括：获取第一距离和第二距离，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离；根据第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。该方法能够以较高的效率以及准确率确定目标纠偏量。还公开了一种涂布纠偏的装置，以及一种计算机可读存储介质。

Description

涂布纠偏的方法和装置
相关申请的交叉引用
本申请要求享有于2023年8月7日提交的名称为“涂布纠偏的方法和装置”的中国专利申请202310985460.3的优先权，该申请的全部内容通过引用并入本申请中。
技术领域
本申请涉及电池制造技术领域，特别是涉及一种涂布纠偏的方法和装置。
背景技术
节能减排是汽车产业可持续发展的关键。在这种情况下，电动车辆由于其节能环保的优势成为汽车产业可持续发展的重要组成部分。而对于电动车辆而言，电池技术又是关乎其发展的一项重要因素。
电池的生产工序比较复杂，包含多种工序。其中，例如涂布工序是其中不可忽视的一环，其对电池性能的影响至关重要。
发明内容
本申请实施例提供了一种涂布纠偏的方法和装置，能够有效地提高电池的性能。
第一方面，提供了一种涂布纠偏的方法，所述方法包括：获取第一距离和第二距离，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离；根据所述第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
本申请实施例，通过获取极片基材的两个对应的表面上的涂布区边缘到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确 率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
在一些可能的实现方式中，所述根据所述第一距离、第二距离和所述至少一个预设纠偏量，确定涂布过程中的目标纠偏量，包括：根据所述第一距离和所述第二距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量。
上述技术方案，根据第一距离和第二距离确定两个对应的表面之间的错位值，实现简单，有效降低了实现的复杂度。进一步地，再根据两个对应的表面之间的错位值和预设的纠偏量确定目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
在一些可能的实现方式中，所述根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量，包括：利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量。
上述技术方案，先利用预设的纠偏量对两个对应的表面之间的错位值进行初始纠偏，然后根据初始纠偏的结果确定最终的目标纠偏量，有助于将预设的纠偏量中不合适的纠偏量进行剔除，使得能够减小确定目标纠偏量的计算量，进而能够提高确定目标纠偏量以及进行纠偏的效率。
在一些可能的实现方式中，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量，包括：在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第 一目标错位值为所述第一错位值集合中绝对值最大的错位值；基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
在纠偏的过程中，若利用某个纠偏量对错位值进行纠偏后错位值的绝对比纠偏前的还大，即越纠越偏，那么该纠偏量是不合适。因此，上述技术方案在初始纠偏后的错位值中选择绝对值小于纠偏前的错位值，并基于选择的错位值对应的纠偏量确定目标纠偏量，即放弃不合适的纠偏量，如此，不仅降低了越纠越偏的概率，而且选择的合适的纠偏量的数量可能小于刚开始预设的纠偏量的数量，这样有效减小了确定目标纠偏量的所花费的时间，提高了效率。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为多个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，包括：在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量。
上述技术方案，基于利用合适的纠偏量对两个表面之间的错位值进行初始纠偏后得到的纠偏后的错位值，确定目标纠偏量，能够极大地提高确定的目标纠偏量的准确率。
在一些可能的实现方式中，所述根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量，包括：将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述目标纠偏量。
上述技术方案，根据纠偏后趋近于0的规则，也就是总和越小越好，将错位值之和中绝对值最小的错位值之和对应的预设纠偏量，确定为目标纠偏量，这样确定的目标纠偏量的准确率较高，基于该目标纠偏量进行纠偏后的效果较好，从而进一步提高了电池的性能。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为一个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，包括：将所述第一预设纠偏量确定为所述目标纠偏量。
上述技术方案，在第一预设纠偏量的数量为一个的情况下，将该第一预设纠偏确定为目标纠偏量，不仅极大地减小了运算复杂度，而且确定的目标纠偏量的准确率较高。
在一些可能的实现方式中，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
上述技术方案，将至少一个预设纠偏量设置为-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm中的至少一个，在将涂布AB面的错位能够纠偏至规格范围内的同时，还满足了纠偏机构的纠偏精度，并且减小了极片基材的断带概率。
第二方面，提供了一种涂布纠偏的装置，包括：获取单元，用于获取第一距离和第二距离，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离；确定单元，用于根据所述第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
在一些可能的实现方式中，所述确定单元具体用于：根据所述第一距离和所述第二距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量。
在一些可能的实现方式中，所述装置还包括：纠偏单元，用于利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；所述确定单元具体用于：基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量。
在一些可能的实现方式中，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述装置还包括：选择单元，用于在所述至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值；所述确定单元具体用于：确定第二目标错位值，所述第二目 标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为多个的情况下，所述选择单元具体用于：在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；所述确定单元具体用于：根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量。
在一些可能的实现方式中，所述确定单元具体用于：将所述每个第二错位值集合包括的第二目标错位值进行相加，得到至少一个错位值之和；将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述目标纠偏量。
在一些可能的实现方式中，在所述第一预设纠偏量的数量为一个的情况下，所述确定单元具体用于：将所述第一预设纠偏量确定为所述目标纠偏量。
在一些可能的实现方式中，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
第三方面，提供了一种涂布纠偏的装置，包括处理器和存储器，所述存储器用于存储计算机程序，所述处理器用于调用所述计算机程序，执行上述第一方面或其各实现方式中的方法。
第四方面，提供了一种计算机可读存储介质，用于存储计算机程序，该计算机程序使得计算机执行上述第一方面或其各实现方式中的方法。
附图说明
为了更清楚地说明本申请实施例的技术方案，下面将对本申请实施例中所需要使用的附图作简单地介绍，显而易见地，下面所描述的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据附图获得其他的附图。
在附图中，附图并未按照实际的比例绘制。
图1是本申请实施例的一种涂布纠偏的方法的示意性流程图。
图2是本申请实施例的一种AB面涂布的示意性图。
图3是本申请实施例的涂布纠偏的装置的示意性框图。
图4是本申请实施例的涂布纠偏的装置的示意性框图。
具体实施方式
下面结合附图和实施例对本申请的实施方式作进一步详细描述。以下实施例的详细描述和附图用于示例性地说明本申请的原理，但不能用来限制本申请的范围，即本申请不限于所描述的实施例。
在本申请的描述中，需要说明的是，除非另有说明，“多个”的含义是两个以上；术语“上”、“下”、“左”、“右”、“内”、“外”等指示的方位或位置关系仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”、“第三”等仅用于描述目的，而不能理解为指示或暗示相对重要性。
除非另有定义，本申请所使用的所有的技术和科学术语与属于本申请的技术领域的技术人员通常理解的含义相同；本申请中在申请的说明书中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本申请；本申请的说明书和权利要求书及上述附图说明中的术语“包括”和“具有”以及它们的任何变形，意图在于覆盖不排他的包含。本申请的说明书和权利要求书或上述附图中的术语“第一”、“第二”等是用于区别不同对象，而不是用于描述特定顺序或主次关系。
在本申请中提及“实施例”意味着，结合实施例描述的特定特征、结构或特性可以包含在本申请的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例，也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是，本申请所描述的实施例可以与其它实施例相结合。
随着新能源技术的发展，电池的应用领域越来越广泛。比如电池可作为用电装置(例如车辆、船舶或航天器等)的主要动力源。应理解，本申请实施例所提到的电池是指包括一个或多个电池单体以提供更高的电压和容量 的单一的物理模块。
可选地，电池可以为动力蓄电池。从电池的种类而言，该电池可以是锂离子电池、锂金属电池、铅酸电池、镍隔电池、镍氢电池、锂硫电池、锂空气电池或者钠离子电池等，在本申请实施例中不做具体限定。从电池规模而言，本申请实施例中的电池可以是电芯/电池单体，也可以是电池模组或电池包，在本申请实施例中不做具体限定。
电池的生产工序比较复杂，包含多个工序，如搅拌工序、涂布工序、辊压工序、模切分条工序、卷绕工序、注液工序以及化成工序等。其中，涂布工序是其中不可忽视的一环，其对电池性能的影响至关重要，其涂料的稳定性、均匀性、尺寸等都会影响电池的最终性能。其中，涂布AB面的尺寸。包括位置尺寸、宽度尺寸、AB面错位尺寸等，都对电池的性能有很大的影响。
在涂布过程中，由于涂布模头喷嘴压力等原因，会使极片的涂布结果出现偏差。当极片涂布区AB面错位量超出一定范围，若没有及时发现进行纠偏调整，可能会严重影响电池的性能，也将严重增加产品的废品率，增大制造成本。
基于此，本申请实施例提出了一种涂布纠偏的方法，通过获取第一距离和第二距离，并根据第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离。如此，通过获取极片基材的两个对应的表面上的涂布区边缘到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
图1示出了本申请实施例的一种涂布纠偏的方法100的示意性流程图。如图1所示，方法100可以包括以下内容中的至少部分内容。
S110：获取第一距离和第二距离。其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离。
S120：根据第一距离、第二距离和至少一个预设纠偏量，确定涂布过 程中的目标纠偏量。
本申请实施例，通过获取极片基材的两个对应的表面上的涂布区边缘到基准边的距离，能够确定两个对应的表面之间的涂布错位尺寸，再基于预设的纠偏量确定涂布过程中的目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
其中，极片基材例如可以包括铝箔，基于该极片基材得到的极片为正极极片。或者，极片基材例如可以包括铜箔，基于该极片基材得到的极片为负极极片。
涂布区为涂覆浆料的区域。第一表面可以为极片基材上涂覆浆料的其中一个面，可以是极片基材的正面，也可以是极片基材的反面。第二表面可以为极片基材上与第一表面相对应的一个面。例如，若第一表面为极片基材的正面，则第二表面为极片基材的反面；若第一表面为极片基材的反面，则第二表面为极片基材的正面。
涂布区边缘可以是指涂布区沿长度方向上的边缘。应理解，长度方向也可以称为极片的纵向方向(machine direction，MD)。
浆料也可以称为活性物质。若极片基材包括铝箔，则浆料可以包括钴酸锂、磷酸铁锂、三元锂或锰酸锂等。若极片基材包括铜箔，则浆料可以包括碳或硅等。
基准边可以为极片基材沿长度方向的边缘，该边缘可以为两个边缘的任意一个边缘或者两个边缘。或者，基准边也可以是用户手动设置的边。
可选地，可以人工手动测量，如通过软尺获取到第一距离和第二距离。
或者，可以通过成像装置，例如电荷耦合元件(charge coupled device，CCD)视觉系统获取第一距离和第二距离。如此，能够极大地提高获取第一距离和第二距离的效率并且准确率较高。
可选地，可以实时获取第一距离和第二距离。或者，可以周期性地获取第一距离和第二距离。比如，每间隔5mm获取一次第一距离和第二距离。再或者，可以随机获取第一距离和第二距离。
可选地，可以对极片基材进行纠偏，即目标纠偏量为极片基材的纠偏量。
可选地，可以对涂布模头进行纠偏，即目标纠偏量为涂布模头的纠偏 量。
在一些实施例中，S120具体可以包括：根据第一距离和第二距离，确定第一错位值集合，并根据第一错位值和至少一个预设纠偏量，确定目标纠偏量。其中，第一错位值集合包括在极片基材的宽度方向上，至少一个第一表面上的涂布区边缘与对应的第二表面上的涂布区边缘之间的第一错位值。
该技术方案，根据第一距离和第二距离确定两个对应的表面之间的错位值，实现简单，有效降低了实现的复杂度。进一步地，再根据两个对应的表面之间的错位值和预设的纠偏量确定目标纠偏量，使得能够以较高的效率以及准确率确定目标纠偏量。基于该目标纠偏量进行纠偏，使得两个对应的表面之间的涂布错位尺寸能够在规格范围内，进而有效提高了电池的性能。
其中，极片基材的宽度方向也可以称为横向方向(transverse direction，TD)。
其中，第一距离的数量可以为多个，相应地，第二距离的数量也可以为多个，则第一错位值的数量也可以为多个，且第一错位值的数量与第一距离和第二距离的数量相同。
预设纠偏量可以是基于以下参数中的至少一个参数确定的：国家标准、公司标准、或行业标准、电池的生产制造中所允许的极片AB面涂布的最大错位量、经验值、现场生产制造要求。
通常情况下，在正常生产制造的过程中，第一错位值的范围可以在-1mm至1mm之间。且若纠偏太多，则极片基材可能会出现断带的可能。再者，通常在纠偏过程中，纠偏精度为0.1mm。因此，在本申请实施例中，至少一个预设纠偏量可以包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
需要说明的是，本申请实施例对预设纠偏量中的“+”和“-”没有特别限定。若“+”表示沿TD方向向第一方向纠偏，比如向左纠偏，则“-”表示沿TD方向向与第一方向相反的方向纠偏，比如向右纠偏。若“+”表示沿TD方向向与第一方向相反的方向纠偏，比如向右纠偏，则“-”表示沿TD方向向第一方向纠偏，比如向左纠偏。
上述技术方案，将至少一个预设纠偏量设置为-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm中的至少一个，在将涂布AB面的错位能够纠偏至规格范围内的同时，还满足了纠偏机 构的纠偏精度，并且减小了极片基材的断带概率。
图2示出了AB面涂布的一种示意性图。其中，图2所示的为一出四物料，则第一错位值包括4个错位值。除了一出四物料之外，一般情况下，涂布产线上还可以包括一出二物料、一出六物料、一出八物料、一出十物料以及一出十二物料。
从图2中可以看出，A面上的第一距离分别为AL1、AL2、AL3和AL4，与之对应的B面上的第二距离分别为BL1、BL2、BL3和BL4，则第一错位值集合包括4个第一错位值，分别为a＝AL1-BL1，b＝AL2-BL2，c＝AL3-BL3，c＝AL4-BL4。
进一步地，在本申请实施例中，根据第一错位值和至少一个预设纠偏量，确定目标纠偏量，可以包括：利用至少一个预设纠偏量，依次对第一错位值进行初始纠偏，得到至少一个第二错位值集合，该至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对第一错位值进行初始纠偏后的错位值集合，至少一个第二错位值集合的数量与至少一个预设纠偏量的数量相同。然后，基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定目标纠偏量。
该技术方案，先利用预设的纠偏量对两个对应的表面之间的错位值进行初始纠偏，然后根据初始纠偏的结果确定最终的目标纠偏量，有助于将预设的纠偏量中不合适的纠偏量进行剔除，使得能够减小确定目标纠偏量的计算量，进而能够提高确定目标纠偏量以及进行纠偏的效率。
其中，至少一个第二错位值集合中的每个第二错位值集合可以包括至少一个第二错位值，每个第二错位值集合包括的至少一个第二错位值的数量与第一错位值的数量相同。
举例说明，假设至少一个预设纠偏量包括x1、x2、x3、x4、x5、x6、x7、x8、x9和x10。先利用x1对a、b、c和d进行初始纠偏，得到第一个第二错位值集合，第一个第二错位值集合包括四个第二错位值，即(a+x1)、(b+x1)、(c+x1)以及(d+x1)。之后，利用x2对a、b、c和d进行初始纠偏，得到第二个第二错位值集合，第二个第二错位值集合包括四个第二错位值，即(a+x2)、(b+x2)、(c+x2)以及(d+x2)……最后利用x10对a、b、c和d进行初始纠偏，得到第十个第二错位值集合，第十个第二错位值集合包括四个第二错位值，即(a+x10)、(b+x10)、(c+x10)以及(d+x10)。
进一步地，基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定目标纠偏量，可以包括：在至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值，然后确定第二目标错位值，第二目标错位值为至少一个绝对值最大的第二错位值中小于第一目标错位值的错位值，第一目标错位值为第一错位值集合中绝对值最大的错位值。然后，基于至少一个预设纠偏量中的第一预设纠偏量，确定目标纠偏量，第一预设纠偏量包括第二目标错位值所对应的预设纠偏量。
由于在纠偏的过程中，若利用某个纠偏量对错位值进行纠偏后错位值的绝对比纠偏前的还大，即越纠越偏，那么该纠偏量是不合适。因此，上述技术方案在初始纠偏后的错位值中选择绝对值小于纠偏前的错位值，并基于选择的错位值对应的纠偏量确定目标纠偏量，即放弃不合适的纠偏量，如此，不仅降低了越纠越偏的概率，而且选择的合适的纠偏量的数量可能小于刚开始预设的纠偏量的数量，这样有效减小了确定目标纠偏量的所花费的时间，提高了效率。
继续举例说明，在第一个第二错位值集合中选择绝对值最大的第二错位值，即h1＝max(|a+x1|、|b+x1|、|c+x1|、|d+x1|)，在第二个第二错位值集合中选择绝对值最大的第二错位值，即h2＝max(|a+x2|、|b+x2|、|c+x2|、|d+x2|)……在第十个第二错位值集合中选择绝对值最大的第二错位值，即h10＝max(|a+x10|、|b+x10|、|c+x10|、|d+x10|)。
并在第一错位值集合中选择绝对值最大的错位值，将其定义为第一目标错位值，即第一目标错位值f＝max(|a|、|b|、|c|、|d|)。
然后在h1、h2、h3……h10中选择小于f的错位值。假设h1、h3、h6和h8小于f，则h1、h3、h6和h8对应的预设纠偏量分别为x1、x3、x6和x8，x1、x3、x6和x8统称为第一预设纠偏量。
第一预设纠偏量可以为多个也可以为一个。
在第一预设纠偏量的数量为一个的情况下，可以将第一预设纠偏量确定为目标纠偏量。
上述技术方案，在第一预设纠偏量的数量为一个的情况下，将该第一预设纠偏确定为目标纠偏量，不仅极大地减小了运算复杂度，而且确定的目标纠偏量的准确率较高。
在第一预设纠偏量的数量为多个的情况下，可以在第二错位值集合中， 选择利用第一预设纠偏量对第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合，然后根据至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定目标纠偏量。
该技术方案，基于利用合适的纠偏量对两个表面之间的错位值进行初始纠偏后得到的纠偏后的错位值，确定目标纠偏量，能够极大地提高确定的目标纠偏量的准确率。
再次举例说明，第一个第二目标错位值集合包括利用x1对a、b、c和d进行初始纠偏后得到的错位值，即第一个第二目标错位值集合包括错位值a1、b1、c1和d1，其中，a1＝a+x1，b1＝b+x1，c1＝c+x1，d1＝d+x1。第二个第二目标错位值集合包括利用x3对a、b、c和d进行初始纠偏后得到的错位值，即第二个第二目标错位值集合包括错位值a2、b2、c2和d2，其中，a2＝a+x3，b2＝b+x3，c2＝c+x3，d1＝d+x3。第三个第二目标错位值集合包括利用x6对a、b、c和d进行初始纠偏后得到的错位值，即第三个第第二目标错位值集合包括错位值a3、b3、c3和d3，其中，a3＝a+x6，b3＝b+x6，c3＝c+x6，d3＝d+x6。第四个第二目标错位值集合包括利用x8对a、b、c和d进行初始纠偏后得到的错位值，即第四个第二目标错位值集合包括四个错位值a4、b4、c4和d4，其中，a4＝a+x8，b4＝b+x8，c4＝c+x8，d4＝d+x8。
之后，可以将每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和，再将至少一个错位值之和中绝对值最小的错位值之和所对应的第一预设纠偏量，确定为目标纠偏量。
上述技术方案，根据纠偏后趋近于0的规则，也就是总和越小越好，将错位值之和中绝对值最小的错位值之和对应的预设纠偏量，确定为目标纠偏量，这样确定的目标纠偏量的准确率较高，基于该目标纠偏量进行纠偏后的效果较高，从而进一步提高了电池的性能。
具体而言，将每个第二目标错位值集合中的第二错位值进行相加后，得到4个错位值之和，分别为y1＝a1+b1+c1+d1，y2＝a2+b2+c2+d2，y3＝a3+b3+c3+d3，y4＝a4+b4+c4+d4。
之后，可以根据该4个错位值之和，确定目标偏移量。
作为一种示例，可以将该4个错位值之和中绝对值最小的错位值之和对应的第一预设纠偏量，确定为目标纠偏量。比如，若min(|y1|、|y2|、|y3|、|y4|)＝y2，则目标偏移量为x3。
作为另一种示例，可以对该4个错位值之和中的每个错位值之和求平均，平均数中绝对值最小的平均数对应的第一预设纠偏量为目标纠偏量。
在确定了目标纠偏量后，可以基于该目标纠偏量，对极片基材或者涂布模头进行调整，以使AB面涂布错位在规格范围内。
下面结合具体例子描述本申请实施例的方案。
假设第一错位值集合包括4个第一错位值，该4个第一错位值分别为0.05mm、0.2mm、0.15mm和-0.5mm，预设纠偏量包括-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
首先，利用10个预设纠偏量依次对4个第一错位值做纠偏，并在得到的每个第二错位值集合中选择绝对值最大的第二错位值。
具体而言，利用-0.1mm对4个第一错位值做纠偏后，得到第一个第二错位值集合k1＝(-0.05mm,0.1mm,0.05mm,-0.6mm)，且h1＝max(|-0.05mm|、|0.1mm|、|0.05mm|、|-0.6mm|)＝0.6mm。
利用0.1mm对4个第一错位值做纠偏后，得到第二个第二错位值集合k2＝(0.15mm,0.3mm,0.25mm,-0.4mm)，且h2＝max(|0.15mm|、|0.3mm|、|0.25mm|、|-0.4mm|)＝0.4mm。
利用-0.2mm对4个第一错位值做纠偏后，得到第三个第二错位值集合k3＝(-0.15mm,0mm,-0.05mm,-0.7mm)，且h3＝max(|-0.15mm|、|0mm|、|-0.05mm|、|-0.7mm|)＝0.7mm。
利用0.2mm对4个第一错位值做纠偏后，得到第四个第二错位值集合k4＝(0.25mm,0.4mm,0.35mm,-0.3mm)，且h4＝max(|0.25mm|、|0.4mm|、|0.35mm|、|-0.3mm|)＝0.4mm。
利用-0.3mm对4个第一错位值做纠偏后，得到第五个第二错位值集合k5＝(-0.25mm,-0.1mm,-0.15mm,-0.8mm)，且h5＝max(|-0.25mm|、|-0.1mm|、|-0.15mm|、|-0.8mm|)＝0.8mm。
利用0.3mm对4个第一错位值做纠偏后，得到第六个第二错位值集合k6＝(0.35mm,0.5mm,0.45mm,-0.2mm)，且h6＝max(|0.35mm|、|0.5mm|、|-0.45mm|、|-0.2mm|)＝0.5mm。
利用-0.4mm对4个第一错位值做纠偏后，得到第七个第二错位值集合k7＝(-0.35mm,-0.2mm,-0.25mm,-0.9mm)，且h7＝max(|-0.35mm|、|-0.2mm|、|-0.25mm|、|-0.9mm|)＝0.9mm。
利用0.4mm对4个第一错位值做纠偏后，得到第八个第二错位值集合k8＝(0.45mm,0.6mm,0.55mm,-0.1mm)，且h8＝max(|0.45mm|、|0.6mm|、|0.55mm|、|-0.1mm|)＝0.6mm。
利用-0.5mm对4个第一错位值做纠偏后，得到第九个第二错位值集合k9＝(-0.45mm,-0.3mm,-0.35mm,-1mm)，且h9＝max(|-0.45mm|、|-0.3mm|、|-0.35mm|、|-1mm|)＝1mm。
利用0.5mm对4个第一错位值做纠偏后，得到第十个第二错位值集合k10＝(0.55mm,0.7mm,0.65mm,0mm)，且h10＝max(|-0.55mm|、|0.7mm|、|0.65mm|、|0mm|)＝0.7mm。
其次，确定第一错位值集合中的第一目标错位值f＝max(|0.05mm|、|0.2mm|、|0.15mm|、|-0.5mm|)＝0.5mm。
可以看出，h1、h3、h5、h7，h8、h9以及h10均大于f，表明利用h1、h3、h5、h7，h8、h9以及h10对应的预设纠偏量-0.1mm、-0.2mm、-0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm，进行纠偏的结果是越纠越偏，纠偏后的AB面涂布错位尺寸比纠偏前的更大，因此放弃h1、h3、h5、h7，h8、h9以及h10对应的预设纠偏量-0.1mm、-0.2mm、-0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm，h2、h4和h6对应的预设纠偏量0.1mm、0.2mm和0.3mm满足要求。
利用0.1mm对4个第一错位值做纠偏后得到的第二错位值为0.15mm,0.3mm,0.25mm,-0.4mm，将它们相加得到的和y1＝0.3mm。利用0.2mm对4个第一错位值做纠偏后得到的第二错位值为0.25mm,0.4mm,0.35mm,-0.3mm，将它们相加得到的和y2＝0.7mm。利用0.3mm对4个第一错位值做纠偏后得到的第二错位值为0.35mm,0.5mm,0.45mm,-0.2mm，将它们相加得到的和y3＝1.1mm。
根据纠偏后趋近于0的规则，也就是总和越小越好，最终将目标纠偏量确定为0.1mm。
在本申请实施例中，上述各过程的序号的大小并不意味着执行顺序的先后，各过程的执行顺序应以其功能和内在逻辑确定，而不应对本申请实施例的实施过程构成任何限定。
并且，在不冲突的前提下，本申请描述的各个实施例和/或各个实施例中的技术特征可以任意的相互组合，组合之后得到的技术方案也应落入 本申请的保护范围。
上文详细描述了本申请实施例的涂布纠偏的方法，下面将描述本申请实施例的涂布纠偏的装置。应理解，本申请实施例中的涂布纠偏的装置可以执行本申请实施例中的涂布纠偏的方法。
图3示出了本申请实施例的涂布纠偏的装置300的示意性框图。如图3所示，该涂布纠偏的装置300可以包括：
获取单元310，用于获取第一距离和第二距离，其中，第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，第二距离为极片基材的第二表面上的涂布区边缘到基准边的距离。
确定单元320，用于根据第一距离、第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
可选地，在本申请实施例中，确定单元320具体用于：根据第一距离和第二距离，确定第一错位值集合，第一错位值集合包括在极片基材的宽度方向上，至少一个第一表面上的涂布区边缘与对应的第二表面上的涂布区边缘之间的第一错位值；根据第一错位值和至少一个预设纠偏量，确定目标纠偏量。
可选地，在本申请实施例中，该涂布纠偏的装置300还可以包括：纠偏单元，用于利用至少一个预设纠偏量，依次对第一错位值进行初始纠偏，得到至少一个第二错位值集合，至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对第一错位值进行初始纠偏后的错位值集合，至少一个第二错位值集合的数量与至少一个预设纠偏量的数量相同；确定单元320具体用于：基于至少一个第二错位值集合、至少一个预设纠偏量和第一错位值，确定目标纠偏量。
可选地，在本申请实施例中，至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，该涂布纠偏的装置300还可以包括：选择单元，用于在至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值，确定单元320具体用于：确定第二目标错位值，第二目标错位值为至少一个绝对值最大的第二错位值中小于第一目标错位值的错位值，第一目标错位值为第一错位值集合中绝对值最大的错位值；基于至少一个预设纠偏量中的第一预设纠偏量，确定目标纠偏量，第一预设纠偏量包括第二目标错位值所对应的预设纠偏量。
可选地，在本申请实施例中，在第一预设纠偏量的数量为多个的情况下，选择单元具体用于：在第二错位值集合中，选择利用第一预设纠偏量对第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；确定单元320具体用于：根据至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定目标纠偏量。
可选地，在本申请实施例中，确定单元320具体用于：将每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；将至少一个错位值之和中绝对值最小的错位值之和所对应的第一预设纠偏量，确定为目标纠偏量。
可选地，在本申请实施例中，在第一预设纠偏量的数量为一个的情况下，确定单元320具体用于：将第一预设纠偏量确定为目标纠偏量。
可选地，在本申请实施例中，至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
应理解，该涂布纠偏的装置300可以实现方法100中的相应操作，为了简洁，在此不再赘述。
图4是本申请实施例的涂布纠偏的装置400的硬件结构示意图。该涂布纠偏的装置400包括存储器401、处理器402、通信接口403以及总线404。其中，存储器401、处理器402、通信接口403通过总线404实现彼此之间的通信连接。
存储器401可以是只读存储器(read-only memory，ROM)，静态存储设备和随机存取存储器(random access memory，RAM)。存储器401可以存储程序，当存储器401中存储的程序被处理器402执行时，处理器402和通信接口403用于执行本申请实施例的涂布纠偏的方法的各个步骤。
处理器402可以采用通用的中央处理器(central processing unit，CPU)，微处理器，应用专用集成电路(application specific integrated circuit，ASIC)，图形处理器(graphics processing unit，GPU)或者一个或多个集成电路，用于执行相关程序，以实现本申请实施例的装置中的单元所需执行的功能，或者执行本申请实施例的涂布纠偏的方法。
处理器402还可以是一种集成电路芯片，具有信号的处理能力。在实现过程中，本申请实施例的涂布纠偏的方法的各个步骤可以通过处理器 402中的硬件的集成逻辑电路或者软件形式的指令完成。
上述处理器402还可以是通用处理器、数字信号处理器(digital signal processing，DSP)、ASIC、现成可编程门阵列(field programmable gate array，FPGA)或者其他可编程逻辑器件、分立门或者晶体管逻辑器件、分立硬件组件。可以实现或者执行本申请实施例中的公开的各方法、步骤及逻辑框图。通用处理器可以是微处理器或者该处理器也可以是任何常规的处理器等。结合本申请实施例所公开的方法的步骤可以直接体现为硬件处理器执行完成，或者用处理器中的硬件及软件模块组合执行完成。软件模块可以位于随机存储器，闪存、只读存储器，可编程只读存储器或者电可擦写可编程存储器、寄存器等本领域成熟的存储介质中。该存储介质位于存储器401，处理器402读取存储器401中的信息，结合其硬件完成本申请实施例的涂布纠偏的装置400中包括的单元所需执行的功能，或者执行本申请实施例的涂布纠偏的方法。
通信接口403使用例如但不限于收发器一类的收发装置，来实现涂布纠偏的装置400与其他设备或通信网络之间的通信。
总线404可包括在涂布纠偏的装置400各个部件(例如，存储器401、处理器402、通信接口403)之间传送信息的通路。
应注意，尽管上述涂布纠偏的装置400仅仅示出了存储器、处理器、通信接口，但是在具体实现过程中，本领域的技术人员应当理解，涂布纠偏的装置400还可以包括实现正常运行所必须的其他器件。同时，根据具体需要，本领域的技术人员应当理解，涂布纠偏的装置400还可包括实现其他附加功能的硬件器件。此外，本领域的技术人员应当理解，涂布纠偏的装置400也可仅仅包括实现本申请实施例所必须的器件，而不必包括图4中所示的全部器件。
本申请实施例还提供了一种计算机可读存储介质，用于存储计算机程序，该计算机程序用于执行前述本申请各种实施例的方法。
上述的计算机可读存储介质可以是暂态计算机可读存储介质，也可以是非暂态计算机可读存储介质。
本申请实施例还提供了一种计算机程序产品，该计算机程序产品包括存储在计算机可读存储介质上的计算机程序，该计算机程序包括程序指令，当程序指令被计算机执行时，使计算机执行上述涂布纠偏的方法。
最后应说明的是：以上实施例仅用以说明本申请的技术方案，而非对其限制；尽管参照前述实施例对本申请进行了详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换，但这些修改或者替换，并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围。

Claims (18)

  1. 一种涂布纠偏的方法，其特征在于，所述方法包括：
    获取第一距离和第二距离，其中，所述第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离；
    根据所述第一距离、所述第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
  2. 根据权利要求1所述的方法，其特征在于，所述根据所述第一距离、第二距离和所述至少一个预设纠偏量，确定涂布过程中的目标纠偏量，包括：
    根据所述第一距离和所述第二距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；
    根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量。
  3. 根据权利要求2所述的方法，其特征在于，所述根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量，包括：
    利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；
    基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量。
  4. 根据权利要求3所述的方法，其特征在于，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量，包括：
    在所述至少一个第二错位值集合中的每个第二错位值集合中，选择绝对值最大的第二错位值；
    确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述 第一错位值集合中绝对值最大的错位值；
    基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
  5. 根据权利要求4所述的方法，其特征在于，在所述第一预设纠偏量的数量为多个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，包括：
    在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；
    根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量。
  6. 根据权利要求5所述的方法，其特征在于，所述根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量，包括：
    将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；
    将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述目标纠偏量。
  7. 根据权利要求4所述的方法，其特征在于，在所述第一预设纠偏量的数量为一个的情况下，所述基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，包括：
    将所述第一预设纠偏量确定为所述目标纠偏量。
  8. 根据权利要求1至7中任一项所述的方法，其特征在于，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
  9. 一种涂布纠偏的装置，其特征在于，包括：
    获取单元，用于获取第一距离和第二距离，其中，所述第一距离为极片基材的第一表面上的涂布区边缘到基准边的距离，所述第二距离为所述极片基材的第二表面上的涂布区边缘到所述基准边的距离；
    确定单元，用于根据所述第一距离、所述第二距离和至少一个预设纠偏量，确定涂布过程中的目标纠偏量。
  10. 根据权利要求9所述的装置，其特征在于，所述确定单元具体用于：
    根据所述第一距离和所述第二距离，确定第一错位值集合，所述第一错位值集合包括在所述极片基材的宽度方向上，至少一个所述第一表面上的涂布区边缘与对应的所述第二表面上的涂布区边缘之间的第一错位值；
    根据所述第一错位值和所述至少一个预设纠偏量，确定所述目标纠偏量。
  11. 根据权利要求10所述的装置，其特征在于，所述装置还包括：
    纠偏单元，用于利用所述至少一个预设纠偏量，依次对所述第一错位值进行初始纠偏，得到至少一个第二错位值集合，所述至少一个第二错位值集合中每个第二错位值集合为利用相同的预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，所述至少一个第二错位值集合的数量与所述至少一个预设纠偏量的数量相同；
    所述确定单元具体用于：
    基于所述至少一个第二错位值集合、所述至少一个预设纠偏量和所述第一错位值，确定所述目标纠偏量。
  12. 根据权利要求11所述的装置，其特征在于，所述至少一个第二错位值集合中的每个第二错位值集合包括至少一个第二错位值，所述装置还包括：
    选择单元，用于在所述至少一个第二错位值集合中的每个第二错位值集合中选择绝对值最大的第二错位值；
    所述确定单元具体用于：
    确定第二目标错位值，所述第二目标错位值为至少一个所述绝对值最大的第二错位值中小于第一目标错位值的错位值，所述第一目标错位值为所述第一错位值集合中绝对值最大的错位值；
    基于所述至少一个预设纠偏量中的第一预设纠偏量，确定所述目标纠偏量，所述第一预设纠偏量包括所述第二目标错位值所对应的预设纠偏量。
  13. 根据权利要求12所述的装置，其特征在于，在所述第一预设纠偏量的数量为多个的情况下，所述选择单元具体用于：
    在所述第二错位值集合中，选择利用所述第一预设纠偏量对所述第一错位值进行初始纠偏后的错位值集合，以得到至少一个第二目标错位值集合；
    所述确定单元具体用于：
    根据所述至少一个第二目标错位值集合中每个第二目标错位值集合包括的第二错位值，确定所述目标纠偏量。
  14. 根据权利要求13所述的装置，其特征在于，所述确定单元具体用于：
    将所述每个第二目标错位值集合包括的第二错位值进行相加，得到至少一个错位值之和；
    将所述至少一个错位值之和中绝对值最小的错位值之和所对应的所述第一预设纠偏量，确定为所述目标纠偏量。
  15. 根据权利要求12所述的装置，其特征在于，在所述第一预设纠偏量的数量为一个的情况下，所述确定单元具体用于：
    将所述第一预设纠偏量确定为所述目标纠偏量。
  16. 根据权利要求9至15中任一项所述的装置，其特征在于，所述至少一个预设纠偏量包括以下纠偏量的至少一个：-0.1mm、0.1mm、-0.2mm、0.2mm、-0.3mm、0.3mm、-0.4mm、0.4mm、-0.5mm以及0.5mm。
  17. 一种涂布纠偏的装置，其特征在于，包括：
    存储器，用于存储程序；
    处理器，用于执行所述存储器存储的程序，当所述存储器存储的程序被执行时，所述处理器用于执行根据权利要求1至8中任一项所述的涂布纠偏的方法。
  18. 一种计算机可读存储介质，其特征在于，用于存储计算机程序，所述计算机程序使得计算机执行如权利要求1至8中任一项所述的涂布纠偏的方法。
PCT/CN2024/084518 2023-08-07 2024-03-28 涂布纠偏的方法和装置 Pending WO2025030880A1 (zh)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014078445A (ja) * 2012-10-11 2014-05-01 Eliiy Power Co Ltd 電池用電極シートの製造方法および製造装置
CN111416142A (zh) * 2020-03-31 2020-07-14 广东利元亨智能装备股份有限公司 电芯的纠偏方法、装置、纠偏控制设备和纠偏系统
CN112571154A (zh) * 2019-09-30 2021-03-30 广东利元亨智能装备股份有限公司 带材双边纠偏数据确定方法及双面带材纠偏系统
EP4156359A1 (en) * 2021-02-26 2023-03-29 LG Energy Solution, Ltd. Meandering correction device for electrode and meandering correction method for electrode
WO2023133765A1 (zh) * 2022-01-13 2023-07-20 宁德时代新能源科技股份有限公司 一种极片纠偏方法、装置、设备、存储介质及产品
WO2023141971A1 (zh) * 2022-01-28 2023-08-03 宁德时代新能源科技股份有限公司 一种双面涂布的纠偏方法、装置
CN117312742A (zh) * 2023-09-25 2023-12-29 衢州极电新能源科技有限公司 一种涂布纠偏数据确定方法、装置、电子设备及存储介质

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5766356A (en) * 1995-07-06 1998-06-16 Toray Engineering Co., Ltd. Coating apparatus
JP5565031B2 (ja) * 2010-03-29 2014-08-06 凸版印刷株式会社 両面間欠塗布装置
CN112571155B (zh) * 2019-09-30 2021-08-24 广东利元亨智能装备股份有限公司 带材纠偏数据确定方法、带材纠偏系统以及控制设备
CN214243120U (zh) * 2020-12-02 2021-09-21 江苏时代新能源科技有限公司 一种涂布纠偏装置及涂布系统
CN112916327B (zh) * 2021-05-11 2022-07-15 蜂巢能源科技有限公司 极片涂布控制系统及方法
CN119429818B (zh) * 2023-08-07 2025-10-31 宁德时代新能源科技股份有限公司 涂布纠偏的方法和装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014078445A (ja) * 2012-10-11 2014-05-01 Eliiy Power Co Ltd 電池用電極シートの製造方法および製造装置
CN112571154A (zh) * 2019-09-30 2021-03-30 广东利元亨智能装备股份有限公司 带材双边纠偏数据确定方法及双面带材纠偏系统
CN111416142A (zh) * 2020-03-31 2020-07-14 广东利元亨智能装备股份有限公司 电芯的纠偏方法、装置、纠偏控制设备和纠偏系统
EP4156359A1 (en) * 2021-02-26 2023-03-29 LG Energy Solution, Ltd. Meandering correction device for electrode and meandering correction method for electrode
WO2023133765A1 (zh) * 2022-01-13 2023-07-20 宁德时代新能源科技股份有限公司 一种极片纠偏方法、装置、设备、存储介质及产品
WO2023141971A1 (zh) * 2022-01-28 2023-08-03 宁德时代新能源科技股份有限公司 一种双面涂布的纠偏方法、装置
CN117312742A (zh) * 2023-09-25 2023-12-29 衢州极电新能源科技有限公司 一种涂布纠偏数据确定方法、装置、电子设备及存储介质

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP4596474A4 *

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