AT508441A3 - Verfahren zum prüfen einer chipkarte durch simulation von angriffen - Google Patents
Verfahren zum prüfen einer chipkarte durch simulation von angriffen Download PDFInfo
- Publication number
- AT508441A3 AT508441A3 ATA932/2010A AT9322010A AT508441A3 AT 508441 A3 AT508441 A3 AT 508441A3 AT 9322010 A AT9322010 A AT 9322010A AT 508441 A3 AT508441 A3 AT 508441A3
- Authority
- AT
- Austria
- Prior art keywords
- attack
- chip card
- simulated
- operating system
- chip
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Prevention of errors by analysis, debugging or testing of software
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Prevention of errors by analysis, debugging or testing of software
- G06F11/3604—Analysis of software for verifying properties of programs
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/455—Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Software Systems (AREA)
- Computer Security & Cryptography (AREA)
- Debugging And Monitoring (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Storage Device Security (AREA)
Abstract
Verfahren zum Prüfen einer Chipkarte mit Angriffen auf das Betriebssystem oder die Applikationen bei der Herstellung der Chipkarte, wobei ein hardwaremäßiger Angriff auf die Chipkarte dadurch simuliert wird, dass stattdessen mit einer Angriffssoftware (18) in den Programmablauf des Betriebssystems oder der Applikationen über die Schnittstelle (16) eingegriffen wird und gezielt bestimmte Daten entsprechend einem hardwaremäßigen Angriff verändert werden, wobei Betriebssystem oder die Applikationen auf einem durch einen Chip-Simulator (17) simulierten Chip (15) ausgeführt werden, und wobei durch Variation der Anzahl von veränderten Speicher-Bits bzw. Bytes und der geschriebenen Werte unterschiedliche Angriffsparameter, wie insbesondere Fokussierung, Energie, Wellenlänge der eingestrahlten elektromagnetischen Wellen, Angriff durch direkte Kontaktierung mit Micro-Probes, Angriff durch ionisierende Strahlung, simuliert werden.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE200910024768 DE102009024768A1 (de) | 2009-06-13 | 2009-06-13 | Verfahren zum Prüfen einer Chipkarte durch Simulation von Angriffen |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| AT508441A2 AT508441A2 (de) | 2011-01-15 |
| AT508441A3 true AT508441A3 (de) | 2016-01-15 |
| AT508441B1 AT508441B1 (de) | 2016-02-15 |
Family
ID=43122912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ATA932/2010A AT508441B1 (de) | 2009-06-13 | 2010-06-08 | Verfahren zum prüfen einer chipkarte durch simulation von angriffen |
Country Status (2)
| Country | Link |
|---|---|
| AT (1) | AT508441B1 (de) |
| DE (1) | DE102009024768A1 (de) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5671352A (en) * | 1995-07-07 | 1997-09-23 | Sun Microsystems, Inc. | Error injection to a behavioral model |
| US6195765B1 (en) * | 1998-01-05 | 2001-02-27 | Electronic Data Systems Corporation | System and method for testing an application program |
| EP1505399A2 (de) * | 2003-06-24 | 2005-02-09 | Giesecke & Devrient GmbH | Verfahren zum Erzeugen von Testdaten zum Austesten der Funktionsfähigkeit einer datenverarbeitenden Schaltung |
| US20060271822A1 (en) * | 2005-05-26 | 2006-11-30 | Cisco Technology, Inc. | Method and system for quantifying the quality of diagnostic software |
| CN101131670A (zh) * | 2006-08-25 | 2008-02-27 | 上海华虹集成电路有限责任公司 | 双界面智能卡仿真系统 |
-
2009
- 2009-06-13 DE DE200910024768 patent/DE102009024768A1/de not_active Withdrawn
-
2010
- 2010-06-08 AT ATA932/2010A patent/AT508441B1/de not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5671352A (en) * | 1995-07-07 | 1997-09-23 | Sun Microsystems, Inc. | Error injection to a behavioral model |
| US6195765B1 (en) * | 1998-01-05 | 2001-02-27 | Electronic Data Systems Corporation | System and method for testing an application program |
| EP1505399A2 (de) * | 2003-06-24 | 2005-02-09 | Giesecke & Devrient GmbH | Verfahren zum Erzeugen von Testdaten zum Austesten der Funktionsfähigkeit einer datenverarbeitenden Schaltung |
| US20060271822A1 (en) * | 2005-05-26 | 2006-11-30 | Cisco Technology, Inc. | Method and system for quantifying the quality of diagnostic software |
| CN101131670A (zh) * | 2006-08-25 | 2008-02-27 | 上海华虹集成电路有限责任公司 | 双界面智能卡仿真系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| AT508441B1 (de) | 2016-02-15 |
| AT508441A2 (de) | 2011-01-15 |
| DE102009024768A1 (de) | 2010-12-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM01 | Lapse because of not paying annual fees |
Effective date: 20230608 |