AT518338A3 - Halbleiter-Bondungsvorrichtung und zugehörige Techniken - Google Patents
Halbleiter-Bondungsvorrichtung und zugehörige Techniken Download PDFInfo
- Publication number
- AT518338A3 AT518338A3 ATA50144/2017A AT501442017A AT518338A3 AT 518338 A3 AT518338 A3 AT 518338A3 AT 501442017 A AT501442017 A AT 501442017A AT 518338 A3 AT518338 A3 AT 518338A3
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- leveling
- adjustment system
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
- H10P10/12—Bonding of semiconductor wafers or semiconductor substrates to semiconductor wafers or semiconductor substrates
- H10P10/128—Bonding of semiconductor wafers or semiconductor substrates to semiconductor wafers or semiconductor substrates by direct semiconductor to semiconductor bonding
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0428—Apparatus for mechanical treatment or grinding or cutting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W78/00—Detachable holders for supporting packaged chips in operation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
- B65G47/90—Devices for picking-up and depositing articles or materials
- B65G47/91—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/0198—Manufacture or treatment batch processes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07163—Means for mechanical processing, e.g. for planarising, pressing, stamping or drilling
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07332—Compression bonding, e.g. thermocompression bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07336—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
- Y10T156/1089—Methods of surface bonding and/or assembly therefor of discrete laminae to single face of additional lamina
- Y10T156/1092—All laminae planar and face to face
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
- Y10T156/1702—For plural parts or plural areas of single part
- Y10T156/1744—Means bringing discrete articles into assembled relationship
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Wire Bonding (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
Abstract
Es wird eine Halbleiterstruktur-Bondungsvorrichtung offenbart. Die Vorrichtung kann ein Nivellierungseinstellsystem umfassen, das dafür ausgebildet ist, eine Nivellierungseinstellung von oberen und unteren Blockanordnungen der Vorrichtung bereitzustellen. In einigen Fällen kann das Nivellierungseinstellsystem mehrere Gewindepfosten, Differenzgewinde-Einstellbunde und Nivellierhülsen umfassen. In einigen Fällen kann das Nivellierungseinstellsystem des Weiteren mehrere Vorbelastungsfedern umfassen, die dafür ausgebildet sind, eine bestimmte Vorbelastungskapazität und einen bestimmten Einstellungsbereich bereitzustellen. In einigen Fällen kann das Nivellierungseinstellsystem des Weiteren eine Kraftmessdose umfassen, durch die ein Gewindepfosten eingefügt werden kann. In einigen Ausführungsformen kann die obere Blockanordnung des Weiteren eine Reaktionsplatte umfassen, die dafür ausgebildet ist, eine Verformung der oberen Blockanordnung zu reduzieren. In einigen Ausführungsformen kann die obere Blockanordnung des Weiteren eine Wärmeisolierplatte umfassen, die dafür ausgebildet ist, eine nachgebende Auslenkung bereitzustellen, und nach Bedarf von monolithischer oder polylithischer Konstruktion ist.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662299349P | 2016-02-24 | 2016-02-24 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| AT518338A2 AT518338A2 (de) | 2017-09-15 |
| AT518338A3 true AT518338A3 (de) | 2019-05-15 |
| AT518338B1 AT518338B1 (de) | 2019-10-15 |
Family
ID=59630158
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ATA50144/2017A AT518338B1 (de) | 2016-02-24 | 2017-02-23 | Halbleiter-Bondungsvorrichtung und zugehörige Techniken |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US9875917B2 (de) |
| JP (1) | JP6838993B2 (de) |
| KR (1) | KR102249602B1 (de) |
| CN (1) | CN107123611B (de) |
| AT (1) | AT518338B1 (de) |
| DE (1) | DE102017103212B4 (de) |
| TW (1) | TWI701708B (de) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI701708B (zh) * | 2016-02-24 | 2020-08-11 | 德商蘇士微科技印刷術股份有限公司 | 半導體接合設備及相關技術 |
| US11227779B2 (en) * | 2017-09-12 | 2022-01-18 | Asm Technology Singapore Pte Ltd | Apparatus and method for processing a semiconductor device |
| CN108717490B (zh) * | 2018-05-17 | 2022-02-18 | 桂林电子科技大学 | 一种新的膜片弹簧载荷-变形特性计算方法 |
| KR102483443B1 (ko) | 2018-08-14 | 2023-01-04 | 삼성전자주식회사 | 기판 접합 장치 및 이를 구비하는 기판 접합 설비와 이를 이용한 기판의 접합방법 |
| US11721596B2 (en) * | 2018-08-29 | 2023-08-08 | Tokyo Electron Limited | Parameter adjustment method of bonding apparatus and bonding system |
| KR102162682B1 (ko) * | 2019-02-25 | 2020-10-07 | (주)에스텍 | 부싱타입 볼트 체결구조를 갖는 라미네이터-본더 시스템 |
| CN110535027A (zh) * | 2019-09-05 | 2019-12-03 | 西安航空学院 | 用于制造光电子半导体组件的方法和光电子半导体组件 |
| JP7393977B2 (ja) * | 2020-03-02 | 2023-12-07 | 株式会社ディスコ | 微調整ネジおよび加工装置 |
| CN116844992A (zh) * | 2022-03-23 | 2023-10-03 | 上海微电子装备(集团)股份有限公司 | 调平装置、调平方法和键合设备 |
| WO2026104128A1 (en) * | 2024-11-14 | 2026-05-21 | Asml Netherlands B.V. | Method for bonding semiconductor substrates |
Citations (4)
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| US20020062787A1 (en) * | 2000-11-30 | 2002-05-30 | Fujitsu Limited | Apparatus for manufacturing bonded substrate |
| JP2003249425A (ja) * | 2002-02-22 | 2003-09-05 | Toray Eng Co Ltd | 実装方法および装置 |
| WO2007150012A2 (en) * | 2006-06-22 | 2007-12-27 | Suss Microtec, Inc. | Apparatus and method for semiconductor bonding |
| JP2014116540A (ja) * | 2012-12-12 | 2014-06-26 | Nikon Corp | 基板貼合装置、基板貼合方法および基板貼合プログラム |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US5273553A (en) | 1989-08-28 | 1993-12-28 | Kabushiki Kaisha Toshiba | Apparatus for bonding semiconductor substrates |
| US6178361B1 (en) * | 1998-11-20 | 2001-01-23 | Karl Suss America, Inc. | Automatic modular wafer substrate handling device |
| US6917525B2 (en) * | 2001-11-27 | 2005-07-12 | Nanonexus, Inc. | Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| DE10030431A1 (de) | 2000-06-21 | 2002-01-10 | Karl Suess Kg Praez Sgeraete F | Verfahren und Vorrichtung zum Reinigen und/oder Bonden von Substraten |
| US7064055B2 (en) | 2002-12-31 | 2006-06-20 | Massachusetts Institute Of Technology | Method of forming a multi-layer semiconductor structure having a seamless bonding interface |
| JP4245138B2 (ja) * | 2003-03-11 | 2009-03-25 | 富士通株式会社 | 基板貼合せ装置及び基板貼合せ方法 |
| US7118446B2 (en) * | 2003-04-04 | 2006-10-10 | Strasbaugh, A California Corporation | Grinding apparatus and method |
| US7407863B2 (en) | 2003-10-07 | 2008-08-05 | Board Of Trustees Of The University Of Illinois | Adhesive bonding with low temperature grown amorphous or polycrystalline compound semiconductors |
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| JP4725853B2 (ja) * | 2006-06-16 | 2011-07-13 | 新東工業株式会社 | 平行調整機構および該平行調整機構を用いる加圧成型装置、ならびに該加圧成型装置の平行調整法 |
| US8293043B2 (en) * | 2006-07-24 | 2012-10-23 | Asm Assembly Automation Ltd | Automatic level adjustment for die bonder |
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| US9859141B2 (en) * | 2010-04-15 | 2018-01-02 | Suss Microtec Lithography Gmbh | Apparatus and method for aligning and centering wafers |
| US9837295B2 (en) * | 2010-04-15 | 2017-12-05 | Suss Microtec Lithography Gmbh | Apparatus and method for semiconductor wafer leveling, force balancing and contact sensing |
| JP5323867B2 (ja) * | 2011-01-19 | 2013-10-23 | 東京エレクトロン株式会社 | 基板反転装置、基板反転方法、剥離システム、プログラム及びコンピュータ記憶媒体 |
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| US9393669B2 (en) * | 2011-10-21 | 2016-07-19 | Strasbaugh | Systems and methods of processing substrates |
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| DE102015200698A1 (de) * | 2014-01-20 | 2015-07-23 | Süss Microtec Lithography Gmbh | System und Verfahren zum Halten eines Substrats |
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| TWI701708B (zh) * | 2016-02-24 | 2020-08-11 | 德商蘇士微科技印刷術股份有限公司 | 半導體接合設備及相關技術 |
-
2017
- 2017-02-16 TW TW106105124A patent/TWI701708B/zh active
- 2017-02-16 DE DE102017103212.6A patent/DE102017103212B4/de active Active
- 2017-02-22 JP JP2017031163A patent/JP6838993B2/ja active Active
- 2017-02-23 KR KR1020170024193A patent/KR102249602B1/ko active Active
- 2017-02-23 US US15/440,211 patent/US9875917B2/en active Active
- 2017-02-23 AT ATA50144/2017A patent/AT518338B1/de active
- 2017-02-24 CN CN201710111647.5A patent/CN107123611B/zh active Active
- 2017-12-15 US US15/843,628 patent/US10319615B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020062787A1 (en) * | 2000-11-30 | 2002-05-30 | Fujitsu Limited | Apparatus for manufacturing bonded substrate |
| JP2003249425A (ja) * | 2002-02-22 | 2003-09-05 | Toray Eng Co Ltd | 実装方法および装置 |
| WO2007150012A2 (en) * | 2006-06-22 | 2007-12-27 | Suss Microtec, Inc. | Apparatus and method for semiconductor bonding |
| JP2014116540A (ja) * | 2012-12-12 | 2014-06-26 | Nikon Corp | 基板貼合装置、基板貼合方法および基板貼合プログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| AT518338A2 (de) | 2017-09-15 |
| US9875917B2 (en) | 2018-01-23 |
| TWI701708B (zh) | 2020-08-11 |
| KR102249602B1 (ko) | 2021-05-10 |
| DE102017103212A1 (de) | 2017-09-21 |
| KR20170099779A (ko) | 2017-09-01 |
| CN107123611B (zh) | 2021-10-26 |
| TW201742106A (zh) | 2017-12-01 |
| JP2017195362A (ja) | 2017-10-26 |
| US20180108547A1 (en) | 2018-04-19 |
| DE102017103212B4 (de) | 2024-01-25 |
| CN107123611A (zh) | 2017-09-01 |
| US10319615B2 (en) | 2019-06-11 |
| US20170243769A1 (en) | 2017-08-24 |
| JP6838993B2 (ja) | 2021-03-03 |
| AT518338B1 (de) | 2019-10-15 |
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