ATA198085A - Pruefvorrichtung zum pruefen an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte - Google Patents

Pruefvorrichtung zum pruefen an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte

Info

Publication number
ATA198085A
ATA198085A AT0198085A AT198085A ATA198085A AT A198085 A ATA198085 A AT A198085A AT 0198085 A AT0198085 A AT 0198085A AT 198085 A AT198085 A AT 198085A AT A198085 A ATA198085 A AT A198085A
Authority
AT
Austria
Prior art keywords
testing
circuit board
electronic circuit
pressure plate
test device
Prior art date
Application number
AT0198085A
Other languages
English (en)
Other versions
AT389175B (de
Original Assignee
Ingun Pruefmittelbau
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ingun Pruefmittelbau filed Critical Ingun Pruefmittelbau
Publication of ATA198085A publication Critical patent/ATA198085A/de
Application granted granted Critical
Publication of AT389175B publication Critical patent/AT389175B/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/082—Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit

Landscapes

  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
AT0198085A 1984-07-10 1985-07-04 Pruefvorrichtung zum pruefen einer an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte AT389175B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8421022 1984-07-10

Publications (2)

Publication Number Publication Date
ATA198085A true ATA198085A (de) 1989-03-15
AT389175B AT389175B (de) 1989-10-25

Family

ID=6768839

Family Applications (1)

Application Number Title Priority Date Filing Date
AT0198085A AT389175B (de) 1984-07-10 1985-07-04 Pruefvorrichtung zum pruefen einer an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte

Country Status (2)

Country Link
AT (1) AT389175B (de)
CH (1) CH669270A5 (de)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2145582A (en) * 1983-08-23 1985-03-27 Fairchild Camera Instr Co Electrical test probe assembly

Also Published As

Publication number Publication date
AT389175B (de) 1989-10-25
CH669270A5 (de) 1989-02-28

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