ATE105427T1 - Staubgeschuetzter film. - Google Patents

Staubgeschuetzter film.

Info

Publication number
ATE105427T1
ATE105427T1 AT8888307332T AT88307332T ATE105427T1 AT E105427 T1 ATE105427 T1 AT E105427T1 AT 8888307332 T AT8888307332 T AT 8888307332T AT 88307332 T AT88307332 T AT 88307332T AT E105427 T1 ATE105427 T1 AT E105427T1
Authority
AT
Austria
Prior art keywords
mask
pellicle
attached
proof film
film
Prior art date
Application number
AT8888307332T
Other languages
English (en)
Inventor
Kiroaki Nakagawa
Yoichi Takehana
Original Assignee
Mitsui Petrochemical Ind
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Petrochemical Ind, Hitachi Ltd filed Critical Mitsui Petrochemical Ind
Application granted granted Critical
Publication of ATE105427T1 publication Critical patent/ATE105427T1/de

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
    • G03F1/48Protective coatings
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10Methods of surface bonding and/or assembly therefor
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/16Two dimensionally sectional layer
    • Y10T428/161Two dimensionally sectional layer with frame, casing, or perimeter structure

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Moving Of Heads (AREA)
  • Organic Insulating Materials (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Adhesive Tapes (AREA)
AT8888307332T 1987-08-18 1988-08-08 Staubgeschuetzter film. ATE105427T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP20553387A JP2642637B2 (ja) 1987-08-18 1987-08-18 防塵膜
EP88307332A EP0304211B1 (de) 1987-08-18 1988-08-08 Staubgeschützter Film

Publications (1)

Publication Number Publication Date
ATE105427T1 true ATE105427T1 (de) 1994-05-15

Family

ID=16508463

Family Applications (1)

Application Number Title Priority Date Filing Date
AT8888307332T ATE105427T1 (de) 1987-08-18 1988-08-08 Staubgeschuetzter film.

Country Status (9)

Country Link
US (1) US5085899A (de)
EP (1) EP0304211B1 (de)
JP (1) JP2642637B2 (de)
KR (1) KR910008707B1 (de)
AT (1) ATE105427T1 (de)
CA (1) CA1319043C (de)
DE (1) DE3889396T2 (de)
HK (1) HK51695A (de)
MY (1) MY103336A (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2535971B2 (ja) * 1987-11-05 1996-09-18 三井石油化学工業株式会社 ペリクル
JP2714450B2 (ja) * 1989-08-10 1998-02-16 ダイセル化学工業株式会社 防塵膜
JP3037745B2 (ja) * 1990-11-29 2000-05-08 三井化学株式会社 ペリクル構造体
US5254375A (en) * 1991-08-26 1993-10-19 Yen Yung Tsai Apparatus for controllably separating framed working area from remainder of the membrane
US5344677A (en) * 1992-08-27 1994-09-06 Hong Gilbert H Photochemically stable deep ultraviolet pellicles for excimer lasers
JP3027073B2 (ja) * 1993-07-28 2000-03-27 信越化学工業株式会社 ペリクル
TW285721B (de) * 1994-12-27 1996-09-11 Siemens Ag
JP3493090B2 (ja) * 1995-12-15 2004-02-03 信越化学工業株式会社 ペリクル
TW337002B (en) * 1996-11-19 1998-07-21 Mitsui Kagaku Kk Pellicle
DE19808461A1 (de) * 1998-03-02 1999-09-09 Zeiss Carl Fa Retikel mit Kristall-Trägermaterial
US20040032576A1 (en) * 1999-03-26 2004-02-19 Nikon Corporation Exposure method and apparatus
US20050242341A1 (en) * 2003-10-09 2005-11-03 Knudson Christopher T Apparatus and method for supporting a flexible substrate during processing
JP4889510B2 (ja) * 2007-01-16 2012-03-07 信越化学工業株式会社 ペリクルフレーム内面への粘着剤の塗布方法
JP5314631B2 (ja) 2010-04-20 2013-10-16 信越化学工業株式会社 ペリクルフレームの通気孔内壁に粘着剤を塗布する方法
JP2011253176A (ja) * 2010-05-07 2011-12-15 Shin Etsu Chem Co Ltd ペリクル用粘着剤
EP2592123B1 (de) * 2010-07-09 2020-02-19 Mitsui Chemicals, Inc. Abziehschicht und maskenhaftmittel zur verwendung darin
JP5767535B2 (ja) * 2010-09-01 2015-08-19 旭化成イーマテリアルズ株式会社 ペリクル枠体、ペリクル及びペリクル枠体の製造方法
US12158706B2 (en) 2019-07-09 2024-12-03 Asml Netherlands B.V. Lithographic apparatus and method with improved contaminant particle capture

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2165539A (en) * 1937-05-26 1939-07-11 Teletype Corp Package
US2888368A (en) * 1954-12-27 1959-05-26 American Viscose Corp Nitrocellulose type coatings for cellulosic base films
US3082453A (en) * 1959-03-04 1963-03-26 David E Mutchler Adhesive coated cleaning article
US4537813A (en) * 1982-09-27 1985-08-27 At&T Technologies, Inc. Photomask encapsulation
US4482591A (en) * 1983-03-08 1984-11-13 J. T. Baker Chemical Company Polyvinyl butyrate pellicle compositions and pellicles thereof for projection printing
US4476172A (en) * 1983-04-18 1984-10-09 J. T. Baker Chemical Company Pellicle compositions and pellicles thereof for projection printing
US4470508A (en) * 1983-08-19 1984-09-11 Micro Lithography, Inc. Dustfree packaging container and method
WO1985001126A1 (en) * 1983-08-29 1985-03-14 Yen Yung Tsai Method of producing contamination-free pellicles
JPS6057841A (ja) * 1983-09-09 1985-04-03 Hitachi Ltd 異物固定方法及び装置
JPS6075835A (ja) * 1983-10-03 1985-04-30 Hitachi Ltd ペリクル
JPS61209449A (ja) * 1985-03-14 1986-09-17 Asahi Chem Ind Co Ltd 非反射性ペリクル体
US4759990A (en) * 1985-11-27 1988-07-26 Yen Yung Tsai Composite optical element including anti-reflective coating
KR930001191Y1 (ko) * 1986-06-13 1993-03-18 나고야 유까 가부시기가이샤 마스킹재
EP0252574A2 (de) * 1986-07-07 1988-01-13 YEN, Yung-Tsai Verfahren und Vorrichtung zur Herabsetzung von Staubpartikeln auf Photomasken
US4737387A (en) * 1986-07-07 1988-04-12 Yen Yung Tsai Removable pellicle and method

Also Published As

Publication number Publication date
DE3889396T2 (de) 1994-10-06
EP0304211A2 (de) 1989-02-22
CA1319043C (en) 1993-06-15
KR910008707B1 (ko) 1991-10-19
DE3889396D1 (de) 1994-06-09
EP0304211B1 (de) 1994-05-04
EP0304211A3 (en) 1989-11-15
JPS6448062A (en) 1989-02-22
KR890004458A (ko) 1989-04-22
JP2642637B2 (ja) 1997-08-20
US5085899A (en) 1992-02-04
HK51695A (en) 1995-04-13
MY103336A (en) 1993-05-29

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties