ATE126411T1 - Zweizustands-phasendetektor mit der fähigkeit zur frequenzsteuerung. - Google Patents

Zweizustands-phasendetektor mit der fähigkeit zur frequenzsteuerung.

Info

Publication number
ATE126411T1
ATE126411T1 AT90907725T AT90907725T ATE126411T1 AT E126411 T1 ATE126411 T1 AT E126411T1 AT 90907725 T AT90907725 T AT 90907725T AT 90907725 T AT90907725 T AT 90907725T AT E126411 T1 ATE126411 T1 AT E126411T1
Authority
AT
Austria
Prior art keywords
phase detector
phase
phase difference
input signals
frequency control
Prior art date
Application number
AT90907725T
Other languages
English (en)
Inventor
Frederick L Martin
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Application granted granted Critical
Publication of ATE126411T1 publication Critical patent/ATE126411T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
    • H03D13/00—Circuits for comparing the phase or frequency of two mutually-independent oscillations
    • H03D13/003—Circuits for comparing the phase or frequency of two mutually-independent oscillations in which both oscillations are converted by logic means into pulses which are applied to filtering or integrating means
    • H03D13/004—Circuits for comparing the phase or frequency of two mutually-independent oscillations in which both oscillations are converted by logic means into pulses which are applied to filtering or integrating means the logic means delivering pulses at more than one terminal, e.g. up and down pulses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
    • H03L7/087—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using at least two phase detectors or a frequency and phase detector in the loop

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Manipulation Of Pulses (AREA)
AT90907725T 1989-05-30 1990-05-17 Zweizustands-phasendetektor mit der fähigkeit zur frequenzsteuerung. ATE126411T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/357,912 US4959617A (en) 1989-05-30 1989-05-30 Dual state phase detector having frequency steering capability

Publications (1)

Publication Number Publication Date
ATE126411T1 true ATE126411T1 (de) 1995-08-15

Family

ID=23407541

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90907725T ATE126411T1 (de) 1989-05-30 1990-05-17 Zweizustands-phasendetektor mit der fähigkeit zur frequenzsteuerung.

Country Status (6)

Country Link
US (1) US4959617A (de)
EP (1) EP0474671B1 (de)
JP (1) JP2705309B2 (de)
AT (1) ATE126411T1 (de)
DE (1) DE69021566T2 (de)
WO (1) WO1990015482A1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2522413B2 (ja) * 1989-10-17 1996-08-07 日本電気株式会社 位相周波数比較器
US5084669A (en) * 1990-03-08 1992-01-28 Telefonaktiebolaget L M Ericsson Direct phase digitization
US5644605A (en) * 1990-11-13 1997-07-01 Dallas Semiconductor Corp. Jitter attenuator
US5336939A (en) * 1992-05-08 1994-08-09 Cyrix Corporation Stable internal clock generation for an integrated circuit
US5638410A (en) * 1993-10-14 1997-06-10 Alcatel Network Systems, Inc. Method and system for aligning the phase of high speed clocks in telecommunications systems
US5815016A (en) * 1994-09-02 1998-09-29 Xilinx, Inc. Phase-locked delay loop for clock correction
US5917356A (en) * 1995-09-11 1999-06-29 International Business Machines Corp. Three state phase detector
JP3408030B2 (ja) * 1995-09-21 2003-05-19 日本プレシジョン・サーキッツ株式会社 位相比較器
US5686846A (en) * 1996-06-07 1997-11-11 Hewlett-Packard Company Time duration trigger
JP3467975B2 (ja) * 1996-06-27 2003-11-17 安藤電気株式会社 位相検出回路
SE511145C2 (sv) * 1997-12-23 1999-08-09 Ericsson Telefon Ab L M Metod och anordning för detektering av fasskillnad
US6208181B1 (en) * 1998-01-14 2001-03-27 Intel Corporation Self-compensating phase detector
JP3558869B2 (ja) * 1998-04-30 2004-08-25 富士通株式会社 復調方法及び受信装置
US6137333A (en) * 1999-05-07 2000-10-24 Cypress Semiconductor Corp. Optimal delay controller
KR100346838B1 (ko) * 2000-09-21 2002-08-03 삼성전자 주식회사 Ｐｌｌ 락 검출기회로 및 락 검출방법
EP1211811A1 (de) * 2000-11-28 2002-06-05 Koninklijke Philips Electronics N.V. Schnelle Frequenzvergleichsschaltung
US6973147B2 (en) * 2002-09-04 2005-12-06 Intel Corporation Techniques to adjust a signal sampling point
DE10311049A1 (de) * 2003-03-13 2004-09-23 Rohde & Schwarz Gmbh & Co. Kg Phasen-/Frequenzregelkreis und Phasen-/Frequenz-Komparator hierfür
US7582741B2 (en) * 2004-07-26 2009-09-01 University Of Massachusetts Conditional disruption of dicer1 in cell lines and non-human mammals
US7428284B2 (en) * 2005-03-14 2008-09-23 Micron Technology, Inc. Phase detector and method providing rapid locking of delay-lock loops
US8401140B2 (en) * 2008-09-05 2013-03-19 Freescale Semiconductor, Inc. Phase/frequency detector for a phase-locked loop that samples on both rising and falling edges of a reference signal
KR20170097727A (ko) * 2014-12-19 2017-08-28 레오나르도 엠더블유 리미티드 디지털 위상계 및 위상 검출 방법
KR102359875B1 (ko) * 2014-12-23 2022-02-07 레오나르도 유케이 리미티드 하향 변환 시스템 및 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1130399A (en) * 1978-11-08 1982-08-24 Toshiyuki Ozawa Digital phase comparing apparatus
US4499425A (en) * 1982-08-04 1985-02-12 Honeywell Inc. Phase velocity sign detector for frequency shift key demodulation
JPS601586A (ja) * 1983-06-17 1985-01-07 Toshiba Corp 放射能レベルのサンプリング測定装置
US4594563A (en) * 1984-11-02 1986-06-10 Ampex Corporation Signal comparison circuit and phase-locked-loop using same
CN1007182B (zh) * 1985-04-29 1990-03-14 约翰·弗兰克制造公司 宽量程数字式相位/频率检测器
US4712060A (en) * 1986-08-29 1987-12-08 Board Of Regents The University Of Texas System Sampling average phase meter
US4868513A (en) * 1987-09-11 1989-09-19 Amdahl Corporation Phase-locked loop with redundant reference input

Also Published As

Publication number Publication date
WO1990015482A1 (en) 1990-12-13
DE69021566D1 (de) 1995-09-14
US4959617A (en) 1990-09-25
EP0474671A4 (de) 1992-01-13
EP0474671B1 (de) 1995-08-09
EP0474671A1 (de) 1992-03-18
JP2705309B2 (ja) 1998-01-28
DE69021566T2 (de) 1996-03-21
JPH04506735A (ja) 1992-11-19

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Legal Events

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