ATE138479T1 - Optische messeinrichtung für verschiebung - Google Patents

Optische messeinrichtung für verschiebung

Info

Publication number
ATE138479T1
ATE138479T1 AT92307396T AT92307396T ATE138479T1 AT E138479 T1 ATE138479 T1 AT E138479T1 AT 92307396 T AT92307396 T AT 92307396T AT 92307396 T AT92307396 T AT 92307396T AT E138479 T1 ATE138479 T1 AT E138479T1
Authority
AT
Austria
Prior art keywords
image
fourier
modulating
coherent light
timings
Prior art date
Application number
AT92307396T
Other languages
English (en)
Inventor
Tamiki Takemori
Yuji Kobayashi
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Application granted granted Critical
Publication of ATE138479T1 publication Critical patent/ATE138479T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/64Devices characterised by the determination of the time taken to traverse a fixed distance
    • G01P3/80Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means
    • G01P3/806Devices characterised by the determination of the time taken to traverse a fixed distance using auto-correlation or cross-correlation detection means in devices of the type to be classified in G01P3/68
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G01P3/366Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light by using diffraction of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
AT92307396T 1991-08-12 1992-08-12 Optische messeinrichtung für verschiebung ATE138479T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3226459A JP2538456B2 (ja) 1991-08-12 1991-08-12 光学的変位量測定装置

Publications (1)

Publication Number Publication Date
ATE138479T1 true ATE138479T1 (de) 1996-06-15

Family

ID=16845431

Family Applications (1)

Application Number Title Priority Date Filing Date
AT92307396T ATE138479T1 (de) 1991-08-12 1992-08-12 Optische messeinrichtung für verschiebung

Country Status (5)

Country Link
US (1) US5361131A (de)
EP (1) EP0532182B1 (de)
JP (1) JP2538456B2 (de)
AT (1) ATE138479T1 (de)
DE (1) DE69210923T2 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6454761B1 (en) 1995-01-30 2002-09-24 Philip D. Freedman Laser surgery device and method
DE19527540C2 (de) * 1995-07-27 1998-09-10 Siemens Ag Optischer Korrelator und Verfahren zur Korrelation optischer Signale
US5684588A (en) * 1996-10-04 1997-11-04 United States Of America As Represented By The Secretary Of The Air Force Homodyne and hetrodyne imaging in a light scattering medium
US6303986B1 (en) 1998-07-29 2001-10-16 Silicon Light Machines Method of and apparatus for sealing an hermetic lid to a semiconductor die
US6872984B1 (en) 1998-07-29 2005-03-29 Silicon Light Machines Corporation Method of sealing a hermetic lid to a semiconductor die at an angle
US6728008B1 (en) 1998-09-04 2004-04-27 Kabushiki Kaisha Toshiba Method for diagnosing optical devices installed in image reading apparatus and image forming apparatus
JP3737292B2 (ja) * 1998-10-13 2006-01-18 パイオニア株式会社 光変調装置及び光学的情報処理システム
US6956878B1 (en) 2000-02-07 2005-10-18 Silicon Light Machines Corporation Method and apparatus for reducing laser speckle using polarization averaging
US6323984B1 (en) * 2000-10-11 2001-11-27 Silicon Light Machines Method and apparatus for reducing laser speckle
US6697501B2 (en) * 2000-11-30 2004-02-24 Vansco Electronics Ltd. Method for detecting velocity or displacement of an object over a surface by analyzing images of the surface
US7177081B2 (en) 2001-03-08 2007-02-13 Silicon Light Machines Corporation High contrast grating light valve type device
US6707591B2 (en) 2001-04-10 2004-03-16 Silicon Light Machines Angled illumination for a single order light modulator based projection system
US6865346B1 (en) 2001-06-05 2005-03-08 Silicon Light Machines Corporation Fiber optic transceiver
US6782205B2 (en) 2001-06-25 2004-08-24 Silicon Light Machines Method and apparatus for dynamic equalization in wavelength division multiplexing
US6747781B2 (en) 2001-06-25 2004-06-08 Silicon Light Machines, Inc. Method, apparatus, and diffuser for reducing laser speckle
US6829092B2 (en) 2001-08-15 2004-12-07 Silicon Light Machines, Inc. Blazed grating light valve
US6930364B2 (en) 2001-09-13 2005-08-16 Silicon Light Machines Corporation Microelectronic mechanical system and methods
US6956995B1 (en) 2001-11-09 2005-10-18 Silicon Light Machines Corporation Optical communication arrangement
US6800238B1 (en) 2002-01-15 2004-10-05 Silicon Light Machines, Inc. Method for domain patterning in low coercive field ferroelectrics
US6728023B1 (en) 2002-05-28 2004-04-27 Silicon Light Machines Optical device arrays with optimized image resolution
US6767751B2 (en) 2002-05-28 2004-07-27 Silicon Light Machines, Inc. Integrated driver process flow
US7054515B1 (en) 2002-05-30 2006-05-30 Silicon Light Machines Corporation Diffractive light modulator-based dynamic equalizer with integrated spectral monitor
US6822797B1 (en) 2002-05-31 2004-11-23 Silicon Light Machines, Inc. Light modulator structure for producing high-contrast operation using zero-order light
US6829258B1 (en) 2002-06-26 2004-12-07 Silicon Light Machines, Inc. Rapidly tunable external cavity laser
US6714337B1 (en) 2002-06-28 2004-03-30 Silicon Light Machines Method and device for modulating a light beam and having an improved gamma response
US6908201B2 (en) 2002-06-28 2005-06-21 Silicon Light Machines Corporation Micro-support structures
US6813059B2 (en) 2002-06-28 2004-11-02 Silicon Light Machines, Inc. Reduced formation of asperities in contact micro-structures
US7057795B2 (en) 2002-08-20 2006-06-06 Silicon Light Machines Corporation Micro-structures with individually addressable ribbon pairs
US6801354B1 (en) 2002-08-20 2004-10-05 Silicon Light Machines, Inc. 2-D diffraction grating for substantially eliminating polarization dependent losses
US6712480B1 (en) 2002-09-27 2004-03-30 Silicon Light Machines Controlled curvature of stressed micro-structures
US6928207B1 (en) 2002-12-12 2005-08-09 Silicon Light Machines Corporation Apparatus for selectively blocking WDM channels
US6987600B1 (en) 2002-12-17 2006-01-17 Silicon Light Machines Corporation Arbitrary phase profile for better equalization in dynamic gain equalizer
US7057819B1 (en) 2002-12-17 2006-06-06 Silicon Light Machines Corporation High contrast tilting ribbon blazed grating
US6934070B1 (en) 2002-12-18 2005-08-23 Silicon Light Machines Corporation Chirped optical MEM device
US6927891B1 (en) 2002-12-23 2005-08-09 Silicon Light Machines Corporation Tilt-able grating plane for improved crosstalk in 1×N blaze switches
US7068372B1 (en) 2003-01-28 2006-06-27 Silicon Light Machines Corporation MEMS interferometer-based reconfigurable optical add-and-drop multiplexor
US7286764B1 (en) 2003-02-03 2007-10-23 Silicon Light Machines Corporation Reconfigurable modulator-based optical add-and-drop multiplexer
US6947613B1 (en) 2003-02-11 2005-09-20 Silicon Light Machines Corporation Wavelength selective switch and equalizer
US6922272B1 (en) 2003-02-14 2005-07-26 Silicon Light Machines Corporation Method and apparatus for leveling thermal stress variations in multi-layer MEMS devices
US7391973B1 (en) 2003-02-28 2008-06-24 Silicon Light Machines Corporation Two-stage gain equalizer
US7027202B1 (en) 2003-02-28 2006-04-11 Silicon Light Machines Corp Silicon substrate as a light modulator sacrificial layer
US6829077B1 (en) 2003-02-28 2004-12-07 Silicon Light Machines, Inc. Diffractive light modulator with dynamically rotatable diffraction plane
US6922273B1 (en) 2003-02-28 2005-07-26 Silicon Light Machines Corporation PDL mitigation structure for diffractive MEMS and gratings
US7042611B1 (en) 2003-03-03 2006-05-09 Silicon Light Machines Corporation Pre-deflected bias ribbons
JP4014535B2 (ja) * 2003-04-25 2007-11-28 シャープ株式会社 光学式移動量検出装置及び電子機器及び搬送処理システム
US7282716B2 (en) * 2003-11-10 2007-10-16 Technology Innovations, Llc Digital imaging assembly and methods thereof
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法
TWI402721B (zh) * 2009-12-03 2013-07-21 Chung Shan Inst Of Science 光斑定位方法及光斑定位系統
TWI492622B (zh) * 2011-08-31 2015-07-11 Realtek Semiconductor Corp 網路訊號接收系統與網路訊號接收方法
JP5927837B2 (ja) * 2011-10-20 2016-06-01 株式会社リコー 速度検出装置、移動部材搬送ユニット、及び、画像形成装置
EP2861935B1 (de) * 2012-06-13 2016-02-10 Koninklijke Philips N.V. Bestimmung einer ausbreitungsgeschwindigkeit für eine oberflächenwelle
KR102067763B1 (ko) * 2013-03-13 2020-01-17 삼성전자주식회사 공간 광변조기, 이를 포함한 홀로그래피 영상 표시 장치 및 공간 광변조 방법
WO2017145145A1 (en) * 2016-02-25 2017-08-31 ContinUse Biometrics Ltd. A method and system for monitoring parameters of a moving object
IL278987A (en) * 2019-12-05 2021-06-30 Continuse Biometrics Ltd System and method for passively monitoring a sample
CN114136229B (zh) * 2021-12-01 2023-09-19 上海市计量测试技术研究院 一种一维psd传感器量程拼接的设计方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57187605A (en) * 1981-05-14 1982-11-18 Ricoh Co Ltd Measuring device for optical movement distance
JPS59212773A (ja) * 1983-05-19 1984-12-01 Toshiba Corp 光学的速度検出装置
DE3729648A1 (de) * 1987-09-04 1989-03-16 Deutsche Forsch Luft Raumfahrt Verfahren und vorrichtung zur messung der stroemungsgeschwindigkeit in windkanaelen
US5011278A (en) * 1989-04-25 1991-04-30 Wisconsin Alumni Research Foundation Optical correlator method and apparatus for particle image velocimetry processing
JP2744494B2 (ja) * 1989-12-04 1998-04-28 住友大阪セメント株式会社 スペックル利用測定装置

Also Published As

Publication number Publication date
US5361131A (en) 1994-11-01
DE69210923T2 (de) 1996-11-28
DE69210923D1 (de) 1996-06-27
JPH0642916A (ja) 1994-02-18
EP0532182B1 (de) 1996-05-22
EP0532182A1 (de) 1993-03-17
JP2538456B2 (ja) 1996-09-25

Similar Documents

Publication Publication Date Title
ATE138479T1 (de) Optische messeinrichtung für verschiebung
ATE195189T1 (de) Kompakte vorrichtung um ein bild von der oberflächen topologie von objekten herzustellen und verfahren um die vorrichtung herzustellen
BR9606370A (pt) Dispositivo para á medição da profundidade da banda de rodagem
DE69519563D1 (de) Optische Kopfeinrichtung mit hoher Auflösung
DE69518630D1 (de) Opto-elektronisches skalen-ablese-apparat
DE59302790D1 (de) Vorrichtung zum Applizieren mit Licht
DE69210677D1 (de) Echoabstandmesssystem mit Eichungsvorrichtung
DE3687029D1 (de) Optische messapparate.
KR970023620A (ko) 주사형 투영노광장치
DE69000227D1 (de) Verfahren und vorrichtung zum detektieren und messen einer physikalischen groesse.
DE3764136D1 (de) Verfahren und vorrichtung zum messen des durchmessers eines laenglichen objekts waehrend seiner bewegung.
DE59102890D1 (de) Positionsmesseinrichtung.
FR2697336B1 (fr) Procédé et dispositif de mesure différentielle d'indices de réfraction et utilisation associée.
DE69214340D1 (de) Elektrooptisches Messgerät
ATE159811T1 (de) Längen- oder winkelmesseinrichtung
DE68925212D1 (de) Verfahren und vorrichtung zur determination des oberflächenprofils von diffus-reflektierenden objekten
BE830799A (fr) Procede et dispositif pour tester la puissance optique d'une lentille
RU95122395A (ru) Способ измерения дальности и устройство для его осуществления
EP0506357A3 (de) Optischer Spannungsdetektor
ATE7962T1 (de) Refraktometer mit verwendung des grenzwinkelverfahrens.
SU1631371A1 (ru) Способ исследовани фазовых объектов
SU729439A1 (ru) Способ измерени радиуса кривизны цилиндрической поверхности
SU926531A1 (ru) Фотоэлектрический способ измерени линейных размеров
JPS55140102A (en) Measuring device for flatness of inspected plane glass
SU1578553A1 (ru) Способ измерени фокусного рассто ни объектива

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties