ATE144834T1 - Punktprojektions-photoelektronenmikroskop mit hohlnadel - Google Patents

Punktprojektions-photoelektronenmikroskop mit hohlnadel

Info

Publication number: ATE144834T1
Authority: AT; Austria
Prior art keywords: photoconductor; specimen; electrons; imaging; light
Prior art date: 1986-09-11

Application number

AT87906273T

Other languages

English (en)

Inventor

Gregory Hirsch

Original Assignee

Gregory Hirsch

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1986-09-11

Filing date

1987-09-09

Publication date

1996-11-15

1987-09-09 Application filed by Gregory Hirsch filed Critical Gregory Hirsch

1996-11-15 Application granted granted Critical

1996-11-15 Publication of ATE144834T1 publication Critical patent/ATE144834T1/de

Links

238000003384 imaging method Methods 0.000 abstract 4
230000005855 radiation Effects 0.000 abstract 3
OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 abstract 1
230000005684 electric field Effects 0.000 abstract 1
NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 abstract 1

Classifications

- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/285—Emission microscopes, e.g. field-emission microscopes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]

Landscapes

Physics & Mathematics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Spectroscopy & Molecular Physics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)

AT87906273T 1986-09-11 1987-09-09 Punktprojektions-photoelektronenmikroskop mit hohlnadel ATE144834T1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US90635486A	1986-09-11	1986-09-11

Publications (1)

Publication Number	Publication Date
ATE144834T1 true ATE144834T1 (de)	1996-11-15

Family

ID=25422301

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AT87906273T ATE144834T1 (de)	1986-09-11	1987-09-09	Punktprojektions-photoelektronenmikroskop mit hohlnadel

Country Status (5)

Country	Link
EP (1)	EP0322419B1 (de)
JP (1)	JP2707265B2 (de)
AT (1)	ATE144834T1 (de)
DE (1)	DE3751939D1 (de)
WO (1)	WO1988002110A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5316730A (en) *	1992-12-07	1994-05-31	Xylum Corporation	Disposable cartridge for investigating physical properties of blood
WO1998040913A1 (fr) *	1997-03-11	1998-09-17	Mitsubishi Denki Kabushiki Kaisha	Circuit integre a semi-conducteurs dont l'implantation est conçue au niveau des cellules
EP3985381A1 (de) *	2020-10-16	2022-04-20	Universität Wien	Optische nahfeld-elektronenmikroskopie

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
FR1564698A (de) *	1968-02-20	1969-04-25	G Mayer
US3805068A (en) *	1970-12-18	1974-04-16	J Lee	Electron energy analysis
US3869308A (en) *	1973-04-27	1975-03-04	Ppg Industries Inc	Forming size for glass fibers and resulting product
US4087683A (en) *	1975-08-29	1978-05-02	Licentia Patent-Verwaltungs-G.M.B.H.	Image intensifying device
US4096386A (en) *	1977-04-04	1978-06-20	Taylor-Kincaid Company	Light reflecting electrostatic electron lens

1987
- 1987-09-09 AT AT87906273T patent/ATE144834T1/de not_active IP Right Cessation
- 1987-09-09 EP EP87906273A patent/EP0322419B1/de not_active Expired - Lifetime
- 1987-09-09 JP JP62505692A patent/JP2707265B2/ja not_active Expired - Lifetime
- 1987-09-09 DE DE3751939T patent/DE3751939D1/de not_active Expired - Lifetime
- 1987-09-09 WO PCT/US1987/002310 patent/WO1988002110A1/en not_active Ceased

Also Published As

Publication number	Publication date
EP0322419A4 (de)	1990-06-28
DE3751939D1 (de)	1996-12-05
JP2707265B2 (ja)	1998-01-28
EP0322419A1 (de)	1989-07-05
EP0322419B1 (de)	1996-10-30
WO1988002110A1 (en)	1988-03-24
JPH02502049A (ja)	1990-07-05

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Legal Events

Date	Code	Title	Description
1997-04-15	RER	Ceased as to paragraph 5 lit. 3 law introducing patent treaties