ATE145729T1 - Inspektionsgerät für gedruckte leiterplatten - Google Patents
Inspektionsgerät für gedruckte leiterplattenInfo
- Publication number
- ATE145729T1 ATE145729T1 AT91108208T AT91108208T ATE145729T1 AT E145729 T1 ATE145729 T1 AT E145729T1 AT 91108208 T AT91108208 T AT 91108208T AT 91108208 T AT91108208 T AT 91108208T AT E145729 T1 ATE145729 T1 AT E145729T1
- Authority
- AT
- Austria
- Prior art keywords
- printed circuit
- inspection
- circuit board
- probes
- circuit boards
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title abstract 11
- 239000000523 sample Substances 0.000 abstract 5
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07392—Multiple probes manipulating each probe element or tip individually
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2134204A JP2772115B2 (ja) | 1990-05-25 | 1990-05-25 | プリント基板もしくは実装基板用データ処理方法及び装置 |
| JP2276371A JPH04152281A (ja) | 1990-10-17 | 1990-10-17 | デュアルプローブヘッド |
| JP2314307A JP2769386B2 (ja) | 1990-11-21 | 1990-11-21 | プリント基板検査装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE145729T1 true ATE145729T1 (de) | 1996-12-15 |
Family
ID=27316846
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT91108208T ATE145729T1 (de) | 1990-05-25 | 1991-05-21 | Inspektionsgerät für gedruckte leiterplatten |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5107206A (de) |
| EP (1) | EP0458280B1 (de) |
| KR (1) | KR0169739B1 (de) |
| AT (1) | ATE145729T1 (de) |
| DE (1) | DE69123290T2 (de) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6828812B2 (en) * | 1991-06-04 | 2004-12-07 | Micron Technology, Inc. | Test apparatus for testing semiconductor dice including substrate with penetration limiting contacts for making electrical connections |
| US5469064A (en) * | 1992-01-14 | 1995-11-21 | Hewlett-Packard Company | Electrical assembly testing using robotic positioning of probes |
| TW227644B (de) * | 1992-12-18 | 1994-08-01 | Tesukon Kk | |
| US5543726A (en) * | 1994-01-03 | 1996-08-06 | International Business Machines Corporation | Open frame gantry probing system |
| DE4414770A1 (de) * | 1994-04-27 | 1995-11-02 | Hubert Driller | Testsystem für bestückte und unbestückte Leiterplatten |
| DE4441347C2 (de) * | 1994-11-21 | 1998-10-29 | Peter Fritzsche | Verfahren zum Prüfen von elektronischen Schaltungen auf Leiterplatten und Vorrichtung zum Durchführen des Verfahrens |
| DE19503329C2 (de) * | 1995-02-02 | 2000-05-18 | Ita Ingb Testaufgaben Gmbh | Testvorrichtung für elektronische Flachbaugruppen |
| US5735173A (en) * | 1995-10-04 | 1998-04-07 | Probot Incorporated | Pivotally linked position control drive system |
| KR0176627B1 (ko) * | 1995-12-30 | 1999-05-15 | 김광호 | 인쇄회로기판의 통전검사용 프로브 장치 |
| USD383683S (en) * | 1996-04-25 | 1997-09-16 | Tokyo Electron Limited | Wafer prober |
| US6259960B1 (en) * | 1996-11-01 | 2001-07-10 | Joel Ltd. | Part-inspecting system |
| DE69809577T2 (de) * | 1997-09-15 | 2003-07-17 | Tellabs Denmark A/S, Ballerup | Verfahren zum regeln von testfühlern in einem testgerät für elektronische, gedruckte schaltungen und testgerät zur durchführung des verfahrens |
| KR100519271B1 (ko) * | 1998-04-15 | 2005-10-06 | 발드윈-저팬 리미티드 | 광센서 |
| WO2001036985A1 (de) * | 1999-11-16 | 2001-05-25 | Connexion Rosenberger Gmbh | Messstation für integrierte schaltkreise auf wafern oder andere elektronische bauelemente sowie bausatz zum zusammenbau derartiger messstationen |
| US6657449B2 (en) * | 2000-12-21 | 2003-12-02 | Hansaem Digitec Co., Ltd. | Test pin unit for PCB test device and feeding device of the same |
| CN1258212C (zh) * | 2001-04-04 | 2006-05-31 | 富士通株式会社 | 半导体器件用连接器装置以及半导体器件的测试方法 |
| DE10314462B4 (de) * | 2003-03-28 | 2007-02-08 | Ina - Drives & Mechatronics Gmbh & Co. Ohg | Anordnung zum Prüfen von elektrischen Leiterplatten |
| US7355418B2 (en) * | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
| US7319335B2 (en) * | 2004-02-12 | 2008-01-15 | Applied Materials, Inc. | Configurable prober for TFT LCD array testing |
| US7355417B1 (en) * | 2005-09-20 | 2008-04-08 | Emc Corporation | Techniques for obtaining electromagnetic data from a circuit board |
| US8860449B2 (en) * | 2011-06-10 | 2014-10-14 | Tektronix, Inc. | Dual probing tip system |
| KR101685461B1 (ko) * | 2011-09-05 | 2016-12-20 | 가부시키가이샤 니혼 마이크로닉스 | 시트상 이차전지의 평가장치 및 평가방법 |
| US9989583B2 (en) * | 2013-03-13 | 2018-06-05 | Xcerra Corporation | Cross-bar unit for a test apparatus for circuit boards, and test apparatus containing the former |
| DE102013102564A1 (de) * | 2013-03-13 | 2014-09-18 | Dtg International Gmbh | Traverseneinheit für eine Prüfvorrichtung für Leiterplatten, sowie Prüfvorrichtung damit |
| TWI586967B (zh) * | 2015-10-27 | 2017-06-11 | Mpi Corp | Probe module |
| DE202016102705U1 (de) * | 2016-05-20 | 2016-06-30 | Bobst Mex Sa | Qualitätskontrollstation mit Kamerakalibrierungssystem für Bogenelement-Verarbeitungsmaschine |
| DE102017102700A1 (de) | 2017-02-10 | 2018-09-13 | Atg Luther & Maelzer Gmbh | Prüfvorrichtung und Verfahren zum Prüfen von Leiterplatten |
| CN110286307B (zh) * | 2018-03-19 | 2022-04-08 | 科磊股份有限公司 | 探针检测系统及用于检测半导体元件的方法 |
| CN118409268B (zh) * | 2024-05-07 | 2024-11-26 | 常熟理工学院 | 一种基于智能制造的智能电表数字化制造平台 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2628428C3 (de) * | 1976-06-24 | 1979-02-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung |
| DE2637878C3 (de) * | 1976-08-23 | 1979-09-27 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Anordnung zum Prüfen der Funktionsfähigkeit einer elektrischen Baugruppe |
| DE2800775A1 (de) * | 1978-01-09 | 1979-07-12 | Luther & Maelzer Gmbh | Verfahrensanordnung und vorrichtung zur aufnahme und funktionsmessueberpruefung von unbestueckten leiterplatten |
| FR2418466A1 (fr) * | 1978-02-24 | 1979-09-21 | Telecommunications Sa | Appareil pour etablir des prises de contact temporaires sur des circuits electriques |
| US4251772A (en) * | 1978-12-26 | 1981-02-17 | Pacific Western Systems Inc. | Probe head for an automatic semiconductive wafer prober |
| US4362991A (en) * | 1980-12-12 | 1982-12-07 | Burroughs Corporation | Integrated circuit test probe assembly |
| JPS5798869A (en) * | 1980-12-12 | 1982-06-19 | Fujitsu Ltd | Checking method for continuity of printed board circuit |
| US4574235A (en) * | 1981-06-05 | 1986-03-04 | Micro Component Technology, Inc. | Transmission line connector and contact set assembly for test site |
| US4471298A (en) * | 1981-12-11 | 1984-09-11 | Cirdyne, Inc. | Apparatus for automatically electrically testing printed circuit boards |
| US4527119A (en) * | 1982-05-17 | 1985-07-02 | Testamatic, Incorporated | High speed, low mass, movable probe and/or instrument positioner, tool and like items suitable for use in a controlled environment chamber |
| US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
| US4523749A (en) * | 1983-03-02 | 1985-06-18 | W. A. Whitney Corp. | Hole forming machine with adjustable work clamps |
| DE3784710D1 (de) * | 1987-05-26 | 1993-04-15 | Ibm Deutschland | Kontaktsonden-anordnung mit feinpositionier-vorrichtung. |
-
1991
- 1991-05-20 US US07/702,858 patent/US5107206A/en not_active Expired - Fee Related
- 1991-05-21 AT AT91108208T patent/ATE145729T1/de not_active IP Right Cessation
- 1991-05-21 DE DE69123290T patent/DE69123290T2/de not_active Expired - Fee Related
- 1991-05-21 EP EP91108208A patent/EP0458280B1/de not_active Expired - Lifetime
- 1991-05-25 KR KR1019910008688A patent/KR0169739B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US5107206A (en) | 1992-04-21 |
| KR0169739B1 (ko) | 1999-03-20 |
| DE69123290D1 (de) | 1997-01-09 |
| EP0458280B1 (de) | 1996-11-27 |
| EP0458280A2 (de) | 1991-11-27 |
| DE69123290T2 (de) | 1997-06-26 |
| EP0458280A3 (en) | 1993-05-26 |
| KR910020451A (ko) | 1991-12-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |