ATE147857T1 - Verfahren und vorrichtung zur analyse der teilchengrösse - Google Patents

Verfahren und vorrichtung zur analyse der teilchengrösse

Info

Publication number
ATE147857T1
ATE147857T1 AT90904524T AT90904524T ATE147857T1 AT E147857 T1 ATE147857 T1 AT E147857T1 AT 90904524 T AT90904524 T AT 90904524T AT 90904524 T AT90904524 T AT 90904524T AT E147857 T1 ATE147857 T1 AT E147857T1
Authority
AT
Austria
Prior art keywords
light scattered
optical
angular range
input axis
resolution measurements
Prior art date
Application number
AT90904524T
Other languages
English (en)
Inventor
Steven E Bott
Harry R Mckinley
W Howard Hart
Original Assignee
Coulter Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coulter Electronics filed Critical Coulter Electronics
Application granted granted Critical
Publication of ATE147857T1 publication Critical patent/ATE147857T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G01N2201/0642—Light traps; baffles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AT90904524T 1989-03-03 1990-03-01 Verfahren und vorrichtung zur analyse der teilchengrösse ATE147857T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/319,370 US5056918A (en) 1989-03-03 1989-03-03 Method and apparatus for particle size analysis

Publications (1)

Publication Number Publication Date
ATE147857T1 true ATE147857T1 (de) 1997-02-15

Family

ID=23241963

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90904524T ATE147857T1 (de) 1989-03-03 1990-03-01 Verfahren und vorrichtung zur analyse der teilchengrösse

Country Status (6)

Country Link
US (1) US5056918A (de)
EP (1) EP0416067B1 (de)
JP (1) JP2825644B2 (de)
AT (1) ATE147857T1 (de)
DE (1) DE69029694T2 (de)
WO (1) WO1990010216A1 (de)

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JPH081482Y2 (ja) * 1990-11-17 1996-01-17 株式会社堀場製作所 粒度分布測定装置
JP2863874B2 (ja) * 1990-12-30 1999-03-03 株式会社堀場製作所 粒度分布測定装置
GB2284050B (en) * 1991-02-05 1995-08-02 Marconi Gec Ltd Gaseous suspension particle size measurement
US5282151A (en) * 1991-02-28 1994-01-25 Particle Measuring Systems, Inc. Submicron diameter particle detection utilizing high density array
FR2688308B1 (fr) * 1992-03-04 1994-05-27 Cilas Granulometre a laser.
DE4228388B4 (de) * 1992-08-26 2005-03-03 Sympatec Gmbh System-Partikel-Technik Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen
NL9301446A (nl) * 1993-08-20 1995-03-16 Univ Delft Tech Werkwijze en inrichting voor het meten van vormeigenschappen van deeltjes.
US5576827A (en) * 1994-04-15 1996-11-19 Micromeritics Instrument Corporation Apparatus and method for determining the size distribution of particles by light scattering
US5540494A (en) * 1994-06-03 1996-07-30 Purvis, Jr.; Norman B. Method and apparatus for determining absolute particle size, surface area and volume normalized fluorescence using forward angle light scatter intensity in flow cytometry
US5835211A (en) * 1996-03-28 1998-11-10 Particle Sizing Systems, Inc. Single-particle optical sensor with improved sensitivity and dynamic size range
US6519032B1 (en) * 1998-04-03 2003-02-11 Symyx Technologies, Inc. Fiber optic apparatus and use thereof in combinatorial material science
US6507400B1 (en) 1999-02-27 2003-01-14 Mwi, Inc. Optical system for multi-part differential particle discrimination and an apparatus using the same
US6646742B1 (en) 2000-02-19 2003-11-11 Mwi, Inc. Optical device and method for multi-angle laser light scatter
US6639674B2 (en) * 2000-03-28 2003-10-28 Board Of Regents, The University Of Texas System Methods and apparatus for polarized reflectance spectroscopy
US6859276B2 (en) * 2003-01-24 2005-02-22 Coulter International Corp. Extracted polarization intensity differential scattering for particle characterization
US7142298B2 (en) * 2003-09-29 2006-11-28 Shaw Intellectual Property Holdings, Inc. Particulate monitor
US7365835B2 (en) * 2003-12-02 2008-04-29 California Institute Of Technology Dark-field laser-scattering microscope for analyzing single macromolecules
CN100595564C (zh) 2004-07-30 2010-03-24 百维吉伦特系统有限公司 病原体和粒子检测器系统和方法
EP1907818A4 (de) 2005-07-15 2012-03-14 Biovigilant Systems Inc Pathogen- und partikeldetektorsystem und -verfahren
DE102006019138B4 (de) * 2006-04-21 2021-06-10 Fritsch Gmbh Partikeluntersuchungsgerät mit Vergrößerungsbereich
WO2008005228A2 (en) 2006-06-30 2008-01-10 Omnova Solutions Inc. Coating compositions and related products and methods
EP2522982B1 (de) * 2007-08-15 2015-09-16 Malvern Instruments Limited Weitbereichs-Spektrometer
US8628976B2 (en) 2007-12-03 2014-01-14 Azbil BioVigilant, Inc. Method for the detection of biologic particle contamination
CN102792147B (zh) * 2010-03-10 2015-05-13 贝克曼考尔特公司 在颗粒分析器中产生脉冲参数
JP2013545976A (ja) * 2010-10-25 2013-12-26 株式会社ニコン 装置、光学アセンブリ、物体を検査又は測定する方法、及び構造体を製造する方法
DE102012102363A1 (de) * 2011-08-17 2013-02-21 Technische Universität Darmstadt Verfahren und Vorrichtung zur Bestimmung der Größe eines transparenten Teilchens
DE102013220004A1 (de) 2013-10-02 2015-04-02 Siemens Aktiengesellschaft Vorrichtung und Verfahren zum Bestimmen von Größen von Partikeln in einem Fluid
EP3086155A1 (de) * 2015-04-23 2016-10-26 Fundació Institut de Ciències Fotòniques Bildzytometer zur charakterisierung und quantifizierung von teilchenförmigen proben
US9897524B1 (en) * 2016-05-10 2018-02-20 Microtrac Inc. Method and apparatus for measurement of particle characteristics using light scattering and optical imaging
US10113945B2 (en) * 2016-05-10 2018-10-30 Microtrac Inc. Method and apparatus for combining measurements of particle characteristics using light scattering and optical imaging
US10712251B2 (en) * 2018-01-17 2020-07-14 En'urga, Inc. System for estimating planar drop sizes
DE102018119081A1 (de) * 2018-08-06 2020-02-06 Foshan Sensicfusion Technology Co., Ltd. Ein Verfahren und eine Vorrichtung zum Zählen von Luftpartikeln
CN111678846B (zh) * 2020-06-12 2023-03-07 中国人民解放军战略支援部队航天工程大学 基于米氏散射理论和夫琅禾费衍射理论二维喷雾场测量方法

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DE1802269C3 (de) * 1968-10-10 1979-09-27 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Verfahren zum Messen der Konzentration und/oder Größe von Schwebstoffteilchen
GB1356467A (en) * 1970-11-23 1974-06-12 Talbot J H Analysis and representation of the size shape and orientation characteristics of the components of a system
CH549796A (de) * 1971-03-29 1974-05-31 Sigrist Willy Verfahren zur messung von in einer fluessigkeit suspendierten stoffen und einrichtung zur ausfuehrung des verfahrens.
US3873206A (en) * 1973-10-03 1975-03-25 Leeds & Northrup Co Method for determining a specific characteristic of fluid suspended particles
US4052600A (en) * 1975-01-06 1977-10-04 Leeds & Northrup Company Measurement of statistical parameters of a distribution of suspended particles
US4017186A (en) * 1975-03-05 1977-04-12 Environmental Systems Corporation Electro-optical method and system for in situ measurements of particulate mass density
US4037965A (en) * 1976-03-23 1977-07-26 Leeds & Northrup Company Method and optical means for determining dimensional characteristics of the particle distribution in a collection of particles
US4134679A (en) * 1976-11-05 1979-01-16 Leeds & Northrup Company Determining the volume and the volume distribution of suspended small particles
US4099875A (en) * 1977-02-07 1978-07-11 Sperry Rand Corporation Coaxial multi-detector system and method for measuring the extinction coefficient of an atmospheric scattering medium
US4167335A (en) * 1977-12-16 1979-09-11 Leeds & Northrup Company Apparatus and method for linearizing a volume loading measurement utilizing particle scattering
US4286876A (en) * 1979-01-02 1981-09-01 Coulter Electronics, Inc. Apparatus and method for measuring scattering of light in particle detection systems
US4341471A (en) * 1979-01-02 1982-07-27 Coulter Electronics, Inc. Apparatus and method for measuring the distribution of radiant energy produced in particle investigating systems
US4274741A (en) * 1979-09-26 1981-06-23 Compagnie Industrielle Des Lasers Device for determining the granulometric composition of a mixture of particles by diffraction of light
US4541719A (en) * 1982-07-20 1985-09-17 Wyatt Philip J Method and apparatus for characterizing microparticles and measuring their response to their environment
US4648715A (en) * 1982-09-07 1987-03-10 Langley-Ford Instruments A Division Of Coulter Electronics Of N.E. Electrophoretic light scattering with plural reference beams, apparatus and method
US4595291A (en) * 1982-10-15 1986-06-17 Tokyo Shibaura Denki Kabushiki Kaisha Particle diameter measuring device
US4679939A (en) * 1985-12-23 1987-07-14 The United States Of America As Represented By The Secretary Of The Air Firce In situ small particle diagnostics
US4676641A (en) * 1986-01-08 1987-06-30 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid

Also Published As

Publication number Publication date
EP0416067A1 (de) 1991-03-13
US5056918A (en) 1991-10-15
EP0416067B1 (de) 1997-01-15
DE69029694T2 (de) 1997-07-31
JPH03505130A (ja) 1991-11-07
WO1990010216A1 (en) 1990-09-07
DE69029694D1 (de) 1997-02-27
JP2825644B2 (ja) 1998-11-18
EP0416067A4 (en) 1992-07-01

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