ATE172795T1 - Apparat zur kontrolle von gedruckten schaltungen - Google Patents

Apparat zur kontrolle von gedruckten schaltungen

Info

Publication number
ATE172795T1
ATE172795T1 AT90470073T AT90470073T ATE172795T1 AT E172795 T1 ATE172795 T1 AT E172795T1 AT 90470073 T AT90470073 T AT 90470073T AT 90470073 T AT90470073 T AT 90470073T AT E172795 T1 ATE172795 T1 AT E172795T1
Authority
AT
Austria
Prior art keywords
light emitting
circuit board
printed circuit
emitting diodes
inspection device
Prior art date
Application number
AT90470073T
Other languages
English (en)
Inventor
Harold Wasserman
Original Assignee
Cimflex Teknowledge Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cimflex Teknowledge Corp filed Critical Cimflex Teknowledge Corp
Application granted granted Critical
Publication of ATE172795T1 publication Critical patent/ATE172795T1/de

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
AT90470073T 1990-02-23 1990-12-27 Apparat zur kontrolle von gedruckten schaltungen ATE172795T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/483,882 US5060065A (en) 1990-02-23 1990-02-23 Apparatus and method for illuminating a printed circuit board for inspection

Publications (1)

Publication Number Publication Date
ATE172795T1 true ATE172795T1 (de) 1998-11-15

Family

ID=23921882

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90470073T ATE172795T1 (de) 1990-02-23 1990-12-27 Apparat zur kontrolle von gedruckten schaltungen

Country Status (7)

Country Link
US (1) US5060065A (de)
EP (1) EP0443289B1 (de)
JP (1) JP3056269B2 (de)
KR (1) KR100294872B1 (de)
AT (1) ATE172795T1 (de)
CA (1) CA2036877C (de)
DE (1) DE69032724T2 (de)

Families Citing this family (97)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03269681A (ja) * 1990-03-19 1991-12-02 Sharp Corp 画像認識装置
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE4222804A1 (de) * 1991-07-10 1993-04-01 Raytheon Co Einrichtung und verfahren zur automatischen visuellen pruefung elektrischer und elektronischer baueinheiten
US5260779A (en) * 1992-02-21 1993-11-09 Control Automation, Inc. Method and apparatus for inspecting a printed circuit board
US5461417A (en) * 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
US5517235A (en) * 1993-11-03 1996-05-14 Control Automation, Inc. Method and apparatus for inspecting printed circuit boards at different magnifications
US5418879A (en) * 1994-04-04 1995-05-23 Chrysler Corporation Distributed light delivery system
US5539485A (en) * 1994-10-31 1996-07-23 White; Timothy P. Illumination device for providing continuous diffuse light on and off an observing axis
US5761540A (en) * 1994-10-31 1998-06-02 Northeast Robotics, Inc. Illumination device with microlouver for illuminating an object with continuous diffuse light
US5604550A (en) * 1994-10-31 1997-02-18 Northeast Robotics, Inc. Illumination device for indirectly illuminating an object with continuous diffuse light
US5764874A (en) * 1994-10-31 1998-06-09 Northeast Robotics, Inc. Imaging system utilizing both diffuse and specular reflection characteristics
US5842060A (en) * 1994-10-31 1998-11-24 Northeast Robotics Llc Illumination device with curved beam splitter for illumination an object with continuous diffuse light
EP0800756B1 (de) * 1994-12-30 1998-09-02 Siemens Aktiengesellschaft Vorrichtung zur lageerkennung der anschlüsse von bauelementen
JP2775411B2 (ja) * 1995-07-25 1998-07-16 名古屋電機工業株式会社 印刷配線板検査装置用の照明装置
US5713661A (en) * 1995-10-23 1998-02-03 Northeast Robotics, Inc. Hockey puck shaped continuous diffuse illumination apparatus and method
US5859924A (en) * 1996-07-12 1999-01-12 Robotic Vision Systems, Inc. Method and system for measuring object features
US6219442B1 (en) 1996-10-08 2001-04-17 International Business Machines Corporation Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof
DE19643017C1 (de) * 1996-10-18 1998-04-23 Innomess Ges Fuer Messtechnik Verfahren für die Ermittlung von optischen Fehlern in großflächigen Scheiben
US6075883A (en) 1996-11-12 2000-06-13 Robotic Vision Systems, Inc. Method and system for imaging an object or pattern
US5760893A (en) * 1996-12-24 1998-06-02 Teradyne, Inc. Method and apparatus for inspecting component placement and solder connection in printed circuit board manufacture
US5862973A (en) * 1997-01-30 1999-01-26 Teradyne, Inc. Method for inspecting solder paste in printed circuit board manufacture
US20030133292A1 (en) 1999-11-18 2003-07-17 Mueller George G. Methods and apparatus for generating and modulating white light illumination conditions
US6624597B2 (en) 1997-08-26 2003-09-23 Color Kinetics, Inc. Systems and methods for providing illumination in machine vision systems
US7038398B1 (en) 1997-08-26 2006-05-02 Color Kinetics, Incorporated Kinetic illumination system and methods
US7598686B2 (en) 1997-12-17 2009-10-06 Philips Solid-State Lighting Solutions, Inc. Organic light emitting diode methods and apparatus
US7740371B1 (en) 1998-03-19 2010-06-22 Charles A. Lemaire Method and apparatus for pulsed L.E.D. illumination for a camera
US6095661A (en) 1998-03-19 2000-08-01 Ppt Vision, Inc. Method and apparatus for an L.E.D. flashlight
US20040114035A1 (en) * 1998-03-24 2004-06-17 Timothy White Focusing panel illumination method and apparatus
US6956963B2 (en) * 1998-07-08 2005-10-18 Ismeca Europe Semiconductor Sa Imaging for a machine-vision system
AU4975399A (en) 1998-07-08 2000-02-01 Lennard H. Bieman Machine vision and semiconductor handling
US7353954B1 (en) 1998-07-08 2008-04-08 Charles A. Lemaire Tray flipper and method for parts inspection
JP3299193B2 (ja) * 1998-08-21 2002-07-08 日本電気株式会社 バンプ検査方法／装置、情報記憶媒体
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
US6273338B1 (en) 1998-09-22 2001-08-14 Timothy White Low cost color-programmable focusing ring light
US6788411B1 (en) 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
EP1222452A1 (de) 1999-10-18 2002-07-17 MV Research Limited Maschinenvision
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
US6509559B1 (en) 2000-06-20 2003-01-21 Ppt Vision, Inc. Binary optical grating and method for generating a moire pattern for 3D imaging
US6486963B1 (en) 2000-06-20 2002-11-26 Ppt Vision, Inc. Precision 3D scanner base and method for measuring manufactured parts
US6501554B1 (en) 2000-06-20 2002-12-31 Ppt Vision, Inc. 3D scanner and method for measuring heights and angles of manufactured parts
US6760471B1 (en) * 2000-06-23 2004-07-06 Teradyne, Inc. Compensation system and related techniques for use in a printed circuit board inspection system
US6850637B1 (en) * 2000-06-28 2005-02-01 Teradyne, Inc. Lighting arrangement for automated optical inspection system
WO2002018913A2 (en) * 2000-09-01 2002-03-07 Color Kinetics Incorporated Systems and methods for providing illumination in machine vision systems
US7042172B2 (en) 2000-09-01 2006-05-09 Color Kinetics Incorporated Systems and methods for providing illumination in machine vision systems
JP3496644B2 (ja) * 2001-01-12 2004-02-16 シーシーエス株式会社 検査用照明装置
JP3433739B2 (ja) * 2001-05-18 2003-08-04 オムロン株式会社 照射装置およびその照射装置を使用した基板検査装置
US7113313B2 (en) * 2001-06-04 2006-09-26 Agilent Technologies, Inc. Dome-shaped apparatus for inspecting a component or a printed circuit board device
FR2829344B1 (fr) * 2001-08-29 2004-10-01 Oreal Dispositif d'acquisition d'au moins une image d'au moins une partie du visage ou de la chevelure d'une personne
JP4155496B2 (ja) * 2002-04-25 2008-09-24 大日本スクリーン製造株式会社 分類支援装置、分類装置およびプログラム
US8171567B1 (en) 2002-09-04 2012-05-01 Tracer Detection Technology Corp. Authentication method and system
TWI258583B (en) * 2003-01-30 2006-07-21 Test Research Inc Device and method for optical detection of printed circuit board
EP1455179A1 (de) * 2003-03-07 2004-09-08 MV Research Limited Maschinenvisionssystem und Verfahren zur Inspektion
US20040184653A1 (en) * 2003-03-20 2004-09-23 Baer Richard L. Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients
US7171037B2 (en) 2003-03-20 2007-01-30 Agilent Technologies, Inc. Optical inspection system and method for displaying imaged objects in greater than two dimensions
JP2004093571A (ja) * 2003-09-26 2004-03-25 Ccs Inc 検査用照明装置
DE602005014755D1 (de) 2004-03-12 2009-07-16 Ingenia Technology Ltd Verfahren und vorrichtungen zur erzeugung authentifizierbarer gegenstände und ihrer nachfolgenden überprüfung
AU2005220385B2 (en) * 2004-03-12 2010-07-15 Ingenia Holdings Limited Authenticity verification methods, products and apparatuses
EP1612569A3 (de) 2004-06-30 2006-02-08 Omron Corporation Verfahren und Vorrichtung zur Substrat-Oberflächeninspektion mittels eines vielfarbigen Lichtdemissionssystems
JP2006047290A (ja) * 2004-06-30 2006-02-16 Omron Corp 基板検査用の画像生成方法、基板検査装置、および基板検査用の照明装置
GB2438424B (en) * 2004-08-13 2008-02-13 Ingenia Technology Ltd Article manufacturing screen
DE102004056698B3 (de) * 2004-11-24 2006-08-17 Stratus Vision Gmbh Inspektionsvorrichtung für ein Substrat, das mindestens eine aufgedruckte Schicht aufweist
TWM276556U (en) * 2005-03-04 2005-10-01 Biotek Technology Corp Improvement of optical system structure for treatment and cosmetology
US7344273B2 (en) 2005-03-22 2008-03-18 Binary Works, Inc. Ring light with user manipulable control
CN101923647B (zh) 2005-12-23 2013-01-09 英根亚控股有限公司 光学鉴别
KR100833717B1 (ko) * 2005-12-26 2008-05-29 (주) 인텍플러스 비전 검사 시스템
SG138491A1 (en) * 2006-06-21 2008-01-28 Generic Power Pte Ltd Method and apparatus for 3-dimensional vision and inspection of ball and like protrusions of electronic components
FR2919396B1 (fr) * 2007-07-27 2010-08-20 Clara Vision Boitier et systeme de prise de vue, notamment pour le controle de qualite de cordon de soudure.
US20110175997A1 (en) * 2008-01-23 2011-07-21 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
KR100956932B1 (ko) * 2008-02-16 2010-05-10 주식회사 에스디티 정제외관검사용 조명장치
CN101960253B (zh) 2008-02-26 2013-05-01 株式会社高永科技 三维形状测量装置及测量方法
WO2009120951A2 (en) * 2008-03-28 2009-10-01 Nordson Corporation Automated conformal coating inspection system and methods of use
AT507018B1 (de) * 2008-07-09 2012-11-15 Profactor Res And Solutions Gmbh Vorrichtung zur prüfung von gegenständen
US7869645B2 (en) * 2008-07-22 2011-01-11 Seiko Epson Corporation Image capture and calibratiion
US8269836B2 (en) * 2008-07-24 2012-09-18 Seiko Epson Corporation Image capture, alignment, and registration
WO2010068331A1 (en) 2008-12-10 2010-06-17 Applied Materials, Inc. Enhanced vision system for screen printing pattern alignment
GB2466311B (en) 2008-12-19 2010-11-03 Ingenia Holdings Self-calibration of a matching algorithm for determining authenticity
GB2466465B (en) * 2008-12-19 2011-02-16 Ingenia Holdings Authentication
DE102008064562A1 (de) * 2008-12-29 2010-07-08 Carl Zeiss Oim Gmbh Vorrichtung zum optischen Inspizieren einer zumindest teilweise glänzenden Oberfläche an einem Gegenstand
US8681211B2 (en) * 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
US8388204B2 (en) * 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
US8872912B2 (en) * 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
US8894259B2 (en) * 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
US8670031B2 (en) * 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
GB2476226B (en) 2009-11-10 2012-03-28 Ingenia Holdings Ltd Optimisation
US20120229663A1 (en) * 2011-03-08 2012-09-13 Spectral Instruments Imaging , Llc Imaging system having primary and auxiliary camera systems
FI125320B (en) 2012-01-05 2015-08-31 Helmee Imaging Oy ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
US9467609B2 (en) 2013-05-10 2016-10-11 Mettler-Toledo, LLC Machine vision inspection systems and methods and aperture covers for use therewith
EP2887055B1 (de) 2013-12-17 2016-05-11 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Verfahren und Vorrichtung zur Detektion sichtbarer Fehler
CA2947720C (en) * 2014-05-05 2019-09-10 Arconic Technologies Llc Apparatus and methods for weld measurement
US10091891B2 (en) * 2014-07-11 2018-10-02 Voltera Inc. Apparatus and method for printing circuitry
JP2017067633A (ja) * 2015-09-30 2017-04-06 キヤノン株式会社 検査装置および物品製造方法
FR3054914B1 (fr) * 2016-08-03 2021-05-21 Vit Procede d'inspection optique d'un objet
DE102017207071A1 (de) 2017-04-27 2018-10-31 Robert Bosch Gmbh Prüfvorrichtung zur optischen Prüfung eines Objekts und Objektprüfungsanordnung
JP7010057B2 (ja) * 2018-02-26 2022-01-26 オムロン株式会社 画像処理システムおよび設定方法
JP7187782B2 (ja) * 2018-03-08 2022-12-13 オムロン株式会社 画像検査装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3916439A (en) * 1974-03-08 1975-10-28 Westinghouse Electric Corp Inspection system employing differential imaging
US4500202A (en) * 1982-05-24 1985-02-19 Itek Corporation Printed circuit board defect detection of detecting maximum line width violations
US4604648A (en) * 1984-10-12 1986-08-05 Kley Victor B Electronic viewing system for integrated circuit packages
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
ATE146334T1 (de) * 1988-02-24 1996-12-15 Control Automation Inc Gerät zur inspektion von gedruckten schaltungen mit bauteilen, die auf der oberfläche montiert sind.
SG66545A1 (en) * 1988-05-09 1999-07-20 Omron Tateisi Electronics Co Apparatus for inspecting printed circuit boards and the like and method of operating the same

Also Published As

Publication number Publication date
EP0443289B1 (de) 1998-10-28
JP3056269B2 (ja) 2000-06-26
CA2036877A1 (en) 1991-08-24
CA2036877C (en) 1999-04-13
KR920000207A (ko) 1992-01-10
US5060065A (en) 1991-10-22
EP0443289A3 (en) 1992-05-06
EP0443289A2 (de) 1991-08-28
DE69032724T2 (de) 1999-07-08
DE69032724D1 (de) 1998-12-03
KR100294872B1 (ko) 2001-09-17
JPH06300702A (ja) 1994-10-28

Similar Documents

Publication Publication Date Title
ATE172795T1 (de) Apparat zur kontrolle von gedruckten schaltungen
DE3882050D1 (de) Verfahren und vorrichtung zur atmungsueberwachung bei einer person.
DE69223505D1 (de) Eingebaute beleuchtungsvorrichtung fur prufung mit laufzeitintegration
DE69128979D1 (de) Vorrichtung zur Änderung der Polarisationsrichtung und Beleuchtungssystem mit polarisiertem Licht mit dieser Vorrichtung und Bildanzeigeeinheit mit dieser Vorrichtung
DE69422499D1 (de) Verfahren und geraet zur beleuchtung und abbildung einer oberflaeche unter verwendung von leuchtdioden
DE69312747D1 (de) Vorrichtung zur Beleuchtung mit polarisiertem Licht und Projektor, der diese Vorrichtung verwendet
GB2020839A (en) Imaging System Producing Positive and Negative Images
DE69418598D1 (de) Verfahren und vorrichtung zur beleuchtung und abbildung einer oberflaeche
DE60309884D1 (de) Verfahren, vorrichtung und gerät zur ablesung von informationen von, zum beispiel, gestapelten jetons
DE3785370D1 (de) Vorrichtung zur lichttransmissionspruefung.
DE60142022D1 (de) Vorrichtung und verfahren zur ausrichtung von riemenscheiben
DE69113537D1 (de) Verfahren und Vorrichtung zur Musterprüfung gedrukter Schaltungsplatten.
ATE247251T1 (de) Beleuchtungsverfahren und vorrichtung
BE884061A (fr) Dispositif de balisage lumineux et son procede de preparation
DE59408020D1 (de) Vorrichtung zur Prüfung von Modulen
AT356191B (de) Anordnung zur erzeugung von bildern gleich- maessiger helligkeit bei bildwiedergabegeraeten
DE3672391D1 (de) Vorrichtung zum funktionstest gedruckter schaltungen.
DE3572399D1 (en) Illumination device for the optical measurement of microbiological objects, especially by image analysis
DE69633713D1 (de) Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen
DE68905384D1 (de) Vorrichtung zur korrelation von lichtintensitaet.
FR2617977B1 (fr) Appareil de test de circuit imprime
IT1108500B (it) Procedimento e dispositivo per il controllo della intensita della luce in un sistema ottico
SE8100525L (sv) Presentationsanordning
DE68923379D1 (de) Beleuchtungsvorrichtung.
DE69030232D1 (de) Graustufenbilderzeugung mittels einer Belichtungsvorrichtung mit mehreren Bildelementen