ATE182681T1 - Verfahren und anordnung zur prüfung einer gedruckten leiterplatte - Google Patents

Verfahren und anordnung zur prüfung einer gedruckten leiterplatte

Info

Publication number
ATE182681T1
ATE182681T1 AT93470006T AT93470006T ATE182681T1 AT E182681 T1 ATE182681 T1 AT E182681T1 AT 93470006 T AT93470006 T AT 93470006T AT 93470006 T AT93470006 T AT 93470006T AT E182681 T1 ATE182681 T1 AT E182681T1
Authority
AT
Austria
Prior art keywords
images
processed
acquired
printed circuit
video
Prior art date
Application number
AT93470006T
Other languages
English (en)
Inventor
Harold Wasserman
Original Assignee
Control Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Control Automation Inc filed Critical Control Automation Inc
Application granted granted Critical
Publication of ATE182681T1 publication Critical patent/ATE182681T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Toxicology (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
AT93470006T 1992-02-21 1993-02-19 Verfahren und anordnung zur prüfung einer gedruckten leiterplatte ATE182681T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/839,831 US5260779A (en) 1992-02-21 1992-02-21 Method and apparatus for inspecting a printed circuit board

Publications (1)

Publication Number Publication Date
ATE182681T1 true ATE182681T1 (de) 1999-08-15

Family

ID=25280732

Family Applications (1)

Application Number Title Priority Date Filing Date
AT93470006T ATE182681T1 (de) 1992-02-21 1993-02-19 Verfahren und anordnung zur prüfung einer gedruckten leiterplatte

Country Status (6)

Country Link
US (1) US5260779A (de)
EP (1) EP0557227B1 (de)
JP (1) JP3253397B2 (de)
AT (1) ATE182681T1 (de)
CA (1) CA2089917C (de)
DE (1) DE69325729T2 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5550583A (en) * 1994-10-03 1996-08-27 Lucent Technologies Inc. Inspection apparatus and method
JPH09172299A (ja) * 1995-12-20 1997-06-30 Matsushita Electric Ind Co Ltd 基板認識装置
US5859924A (en) * 1996-07-12 1999-01-12 Robotic Vision Systems, Inc. Method and system for measuring object features
US6219442B1 (en) * 1996-10-08 2001-04-17 International Business Machines Corporation Apparatus and method for measuring distortion of a visible pattern on a substrate by viewing predetermined portions thereof
US6075883A (en) * 1996-11-12 2000-06-13 Robotic Vision Systems, Inc. Method and system for imaging an object or pattern
US5760893A (en) * 1996-12-24 1998-06-02 Teradyne, Inc. Method and apparatus for inspecting component placement and solder connection in printed circuit board manufacture
JP3689213B2 (ja) 1997-01-21 2005-08-31 ローム株式会社 非接触型ｉｃカード
US5862973A (en) * 1997-01-30 1999-01-26 Teradyne, Inc. Method for inspecting solder paste in printed circuit board manufacture
JP3893184B2 (ja) * 1997-03-12 2007-03-14 松下電器産業株式会社 電子部品実装装置
US6084663A (en) * 1997-04-07 2000-07-04 Hewlett-Packard Company Method and an apparatus for inspection of a printed circuit board assembly
US6173071B1 (en) 1997-12-16 2001-01-09 Harold Wasserman Apparatus and method for processing video data in automatic optical inspection
US6941006B1 (en) * 1998-03-05 2005-09-06 Dupont Photomasks, Inc. Method and system for calibrating the scan amplitude of an electron beam lithography instrument
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
US6760471B1 (en) * 2000-06-23 2004-07-06 Teradyne, Inc. Compensation system and related techniques for use in a printed circuit board inspection system
US6930770B2 (en) * 2002-08-08 2005-08-16 Applied Materials, Israel, Ltd. High throughput inspection system and method for generating transmitted and/or reflected images
IL162650A (en) * 2004-06-21 2014-09-30 Camtek Ltd Incorrect unit mapping system for mapping multiple layers of single board and associated method
US20110175997A1 (en) * 2008-01-23 2011-07-21 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
US8872912B2 (en) * 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
US8388204B2 (en) * 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
US8670031B2 (en) * 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
US8681211B2 (en) * 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
US8894259B2 (en) * 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
JP5419761B2 (ja) 2010-03-12 2014-02-19 アズビル株式会社 デバイス制御装置およびｃｐｕ
FR3004881B1 (fr) 2013-04-19 2015-04-17 Kolor Procede de generation d'un flux video de sortie a partir d'un flux video large champ
US10033928B1 (en) 2015-10-29 2018-07-24 Gopro, Inc. Apparatus and methods for rolling shutter compensation for multi-camera systems
CN105352961B (zh) * 2015-11-06 2018-01-30 浙江中烟工业有限责任公司 一种烟支燃烧速率测定方法
CN105352960B (zh) * 2015-11-06 2017-12-29 浙江中烟工业有限责任公司 一种吸烟机烟支燃烧速率测定装置
US9973696B1 (en) 2015-11-23 2018-05-15 Gopro, Inc. Apparatus and methods for image alignment
US9792709B1 (en) 2015-11-23 2017-10-17 Gopro, Inc. Apparatus and methods for image alignment
US9848132B2 (en) * 2015-11-24 2017-12-19 Gopro, Inc. Multi-camera time synchronization
US9973746B2 (en) 2016-02-17 2018-05-15 Gopro, Inc. System and method for presenting and viewing a spherical video segment
US9602795B1 (en) 2016-02-22 2017-03-21 Gopro, Inc. System and method for presenting and viewing a spherical video segment
US10432855B1 (en) 2016-05-20 2019-10-01 Gopro, Inc. Systems and methods for determining key frame moments to construct spherical images
US9934758B1 (en) 2016-09-21 2018-04-03 Gopro, Inc. Systems and methods for simulating adaptation of eyes to changes in lighting conditions
US10268896B1 (en) 2016-10-05 2019-04-23 Gopro, Inc. Systems and methods for determining video highlight based on conveyance positions of video content capture
US10194101B1 (en) 2017-02-22 2019-01-29 Gopro, Inc. Systems and methods for rolling shutter compensation using iterative process
CN113109350A (zh) * 2021-03-23 2021-07-13 深圳中科飞测科技股份有限公司 检测方法、系统、设备及计算机可读存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1438293A (en) * 1972-09-28 1976-06-03 Post Office Television system for transmitting two or more pictures along a common communication channel
US4161000A (en) * 1977-10-28 1979-07-10 Video Systems Research, Inc. High speed television camera control system
JPS63177274A (ja) * 1987-01-17 1988-07-21 Mitsubishi Electric Corp パタ−ン認識装置
US4970597A (en) * 1990-01-22 1990-11-13 The United States Of America As Represented By The Secretary Of The Army Method to image high speed events using a standard video camera
US5060065A (en) * 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection

Also Published As

Publication number Publication date
JP3253397B2 (ja) 2002-02-04
EP0557227B1 (de) 1999-07-28
DE69325729D1 (de) 1999-09-02
DE69325729T2 (de) 2000-03-16
JPH06222011A (ja) 1994-08-12
US5260779A (en) 1993-11-09
EP0557227A3 (en) 1994-08-17
CA2089917C (en) 2003-01-14
EP0557227A2 (de) 1993-08-25
CA2089917A1 (en) 1993-08-22

Similar Documents

Publication Publication Date Title
DE69325729D1 (de) Verfahren und Anordnung zur Prüfung einer gedruckten Leiterplatte
EP0728399A4 (de) Verfahren und vorrichtung zur inspektion von leiterplatten mit verschiedenen vergrösserungen
DE69233207D1 (de) Verfahren und gerät zur bildverarbeitung.
DE69123424D1 (de) Elektronischer Druckprozess zum Drucken zusammengesetzter Bilder
DE69129275D1 (de) Verfahren zum Verarbeiten von Röntgenbilddaten zur Ermittlung von Schweissfehlern
DE69110925D1 (de) Verfahren und Vorrichtung zur Bilderfassung.
GB9223319D0 (en) Method and apparatus for image inspection
DE69429847D1 (de) Bildverarbeitungsgerät und Verfahren zur Erkennung eines eingegebenen Bildes und Fotokopierer, der dasselbe einschliesst
ATE227434T1 (de) Verfahren und vorrichtung zur objektabbildung
DE69132206D1 (de) Verfahren und Gerät zur Bildverarbeitung
DE69232183D1 (de) Verfahren und Gerät zur Bildverarbeitung
DE69130275D1 (de) Verfahren und Gerät zur Bildverarbeitung
DE69131369D1 (de) Gerät und Verfahren zur Bildverarbeitung
DE69127516D1 (de) Verfahren und Gerät zur Bilderzeugung
DE69113537D1 (de) Verfahren und Vorrichtung zur Musterprüfung gedrukter Schaltungsplatten.
DE69114791D1 (de) Verfahren und Anordnung zum Verarbeiten eines Bildsignals.
DE69014354D1 (de) Verfahren und Anordnung zur Bearbeitung der Röntgenstrahlabbildung im Röntgenstrahlgerät.
EP0507485A3 (en) Method and apparatus for processing image corresponding to radiographic pattern
DE68911634D1 (de) Verfahren und Schaltungsanordnung zum Verarbeiten eines Bildsignals.
DE69230392D1 (de) Verfahren und Gerät zur Bildverarbeitung
EP0488206A3 (en) Method of and apparatus for inspecting pattern on printed board
DE69419198D1 (de) Verfahren und Vorrichtung zum Drucken eines verbesserten Bildes
DE69118589D1 (de) Gerät und Verfahren zur Bildverarbeitung
DE69119201D1 (de) Methode und Apparat zur Kontrolle gedruckter Schaltungen
DE69132789D1 (de) Verfahren und Gerät zur Bildverarbeitung