ATE208911T1 - Abbildungssystem und -verfahren für mikroskopie - Google Patents
Abbildungssystem und -verfahren für mikroskopieInfo
- Publication number
- ATE208911T1 ATE208911T1 AT98914965T AT98914965T ATE208911T1 AT E208911 T1 ATE208911 T1 AT E208911T1 AT 98914965 T AT98914965 T AT 98914965T AT 98914965 T AT98914965 T AT 98914965T AT E208911 T1 ATE208911 T1 AT E208911T1
- Authority
- AT
- Austria
- Prior art keywords
- imaging system
- microscopy imaging
- images
- recorded
- transparent
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Closed-Circuit Television Systems (AREA)
- Eye Examination Apparatus (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9706843.1A GB9706843D0 (en) | 1997-04-04 | 1997-04-04 | Microscopy imaging apparatus and a method thereof |
| GBGB9726485.7A GB9726485D0 (en) | 1997-12-15 | 1997-12-15 | Microscopy imaging apparatus and method |
| PCT/GB1998/000988 WO1998045745A1 (en) | 1997-04-04 | 1998-04-03 | Microscopy imaging apparatus and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE208911T1 true ATE208911T1 (de) | 2001-11-15 |
Family
ID=26311316
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT98914965T ATE208911T1 (de) | 1997-04-04 | 1998-04-03 | Abbildungssystem und -verfahren für mikroskopie |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US6376818B1 (de) |
| EP (1) | EP0972220B1 (de) |
| JP (1) | JP3066874B2 (de) |
| KR (1) | KR100504261B1 (de) |
| AT (1) | ATE208911T1 (de) |
| AU (1) | AU737617B2 (de) |
| DE (1) | DE69802514T2 (de) |
| DK (1) | DK0972220T3 (de) |
| ES (1) | ES2167885T3 (de) |
| GB (1) | GB2338858B (de) |
| WO (1) | WO1998045745A1 (de) |
Families Citing this family (70)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19908883A1 (de) | 1999-03-02 | 2000-09-07 | Rainer Heintzmann | Verfahren zur Erhöhung der Auflösung optischer Abbildung |
| DE19930816A1 (de) * | 1999-07-01 | 2001-01-04 | Zeiss Carl Jena Gmbh | Verfahren und Vorrichtung zur Tiefenselektion von Mikroskopbildern |
| US6731390B2 (en) | 1999-07-01 | 2004-05-04 | Carl Zeiss Jena Gmbh | Process and apparatus for determining surface information using a projected structure with a periodically changing brightness curve |
| JP4429431B2 (ja) * | 1999-10-21 | 2010-03-10 | オリンパス株式会社 | 光学装置 |
| JP2001311874A (ja) * | 2000-04-28 | 2001-11-09 | Yokogawa Electric Corp | 光スキャナ及びこれを用いた断層画像取得装置 |
| DE10038527A1 (de) * | 2000-08-08 | 2002-02-21 | Zeiss Carl Jena Gmbh | Anordnung zur Erhöhung der Tiefendiskriminierung optisch abbildender Systeme |
| EP1184659A1 (de) * | 2000-09-01 | 2002-03-06 | ZAMBON GROUP S.p.A. | Verfahren und Vorrichtung zur automatischen Bestimmung von Pollen |
| US7274446B2 (en) | 2001-04-07 | 2007-09-25 | Carl Zeiss Jena Gmbh | Method and arrangement for the deep resolved optical recording of a sample |
| DE50214827D1 (de) * | 2001-04-07 | 2011-02-10 | Zeiss Carl Microimaging Gmbh | Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe |
| GB0200819D0 (en) * | 2002-01-15 | 2002-03-06 | Cole Polytechnique Federale De | Microscopy imaging apparatus and method for generating an image |
| DE10250568A1 (de) * | 2002-10-28 | 2004-05-13 | Carl Zeiss Jena Gmbh | Verfahren zur Verbesserung der Tiefendiskriminierung optisch abbildender Systeme |
| DE10250567C5 (de) | 2002-10-28 | 2019-09-12 | Carl Zeiss Microscopy Gmbh | Mikroskop mit einem Schieber und Schieber |
| DE10254139A1 (de) * | 2002-11-15 | 2004-05-27 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe |
| GB0301775D0 (en) * | 2003-01-25 | 2003-02-26 | Wilson John E | Device and method for 3Dimaging |
| DE10347389A1 (de) * | 2003-07-03 | 2005-05-19 | Carl Zeiss Jena Gmbh | Anordnung zur Eliminierung von Falschlicht |
| US7139067B2 (en) * | 2003-09-12 | 2006-11-21 | Textron Systems Corporation | Three-dimensional imaging with multiframe blind deconvolution |
| US7319529B2 (en) | 2004-06-17 | 2008-01-15 | Cadent Ltd | Method and apparatus for colour imaging a three-dimensional structure |
| US7115848B1 (en) | 2004-09-29 | 2006-10-03 | Qioptiq Imaging Solutions, Inc. | Methods, systems and computer program products for calibration of microscopy imaging devices |
| DE102004053730B4 (de) * | 2004-11-06 | 2014-04-03 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur Unterdrückung von Falschlicht |
| DE102005046754A1 (de) * | 2005-09-29 | 2007-04-05 | Carl Zeiss Jena Gmbh | Vorrichtung und Verfahren zur tiefenaufgelösten optischen Erfassung einer Probe |
| DE102005046755A1 (de) * | 2005-09-29 | 2007-04-19 | Carl Zeiss Jena Gmbh | Vorrichtung und Verfahren zum Erzeugen eines Bildes eines Objektes |
| DE102006031177A1 (de) | 2006-07-06 | 2008-01-10 | Carl Zeiss Microimaging Gmbh | Verfahren und Vorrichtung zur Erzeugung eines Bildes einer dünnen Schicht eines Objekts |
| DE102007018048A1 (de) | 2007-04-13 | 2008-10-16 | Michael Schwertner | Verfahren und Anordnung zur optischen Abbildung mit Tiefendiskriminierung |
| DE102007023270A1 (de) | 2007-05-18 | 2008-11-20 | Linos Photonics Gmbh & Co. Kg | Funduskamera |
| US8184364B2 (en) * | 2007-05-26 | 2012-05-22 | Zeta Instruments, Inc. | Illuminator for a 3-D optical microscope |
| US7729049B2 (en) * | 2007-05-26 | 2010-06-01 | Zeta Instruments, Inc. | 3-d optical microscope |
| DE102007045897A1 (de) | 2007-09-26 | 2009-04-09 | Carl Zeiss Microimaging Gmbh | Verfahren zur mikroskopischen dreidimensionalen Abbildung einer Probe |
| DE102007047466A1 (de) | 2007-09-28 | 2009-04-02 | Carl Zeiss Microimaging Gmbh | Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe |
| DE102007047460A1 (de) | 2007-09-28 | 2009-04-09 | Carl Zeiss Meditec Ag | Vorrichtung und Verfahren zur Untersuchung des Augenhintergrundes, inbesondere der Photorezeptoren |
| US8537461B2 (en) | 2007-11-26 | 2013-09-17 | Carl Zeiss Microimaging Gmbh | Method and configuration for the optical detection of an illuminated specimen |
| US8089691B2 (en) * | 2007-12-10 | 2012-01-03 | Quorum Technologies Inc. | Projection device for patterned illumination and microscopy |
| US7994485B2 (en) * | 2008-04-08 | 2011-08-09 | Carestream Health, Inc. | Apparatus and method for fluorescence measurements using spatially structured illumination |
| CN101661159B (zh) * | 2008-08-25 | 2011-09-21 | 麦克奥迪实业集团有限公司 | 一种基于二维调制技术的切层图像获取方法 |
| DE102008049886B4 (de) | 2008-09-30 | 2021-11-04 | Carl Zeiss Microscopy Gmbh | Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben |
| DE102009009950A1 (de) | 2009-02-23 | 2010-10-21 | Confovis Gmbh | Anordnung und Verfahren für die Gewinnung von dreidimensionalen Objektdaten |
| GB0907965D0 (en) * | 2009-05-08 | 2009-06-24 | King S College London | Imaging system |
| CN104783757B (zh) | 2009-06-17 | 2018-01-05 | 3形状股份有限公司 | 聚焦扫描设备 |
| EP2327956B1 (de) | 2009-11-20 | 2014-01-22 | Mitutoyo Corporation | Verfahren und Vorrichtung zur Höhenbestimmung bei einer Reihe von räumlichen Positionen auf einer Probe |
| US9389408B2 (en) | 2010-07-23 | 2016-07-12 | Zeta Instruments, Inc. | 3D microscope and methods of measuring patterned substrates |
| EP2437027A3 (de) | 2010-10-03 | 2012-05-30 | Confovis GmbH | Vorrichtung und Verfahren zur dreidimensionalen optischen Abtastung einer Probe |
| US8649024B2 (en) | 2010-12-03 | 2014-02-11 | Zygo Corporation | Non-contact surface characterization using modulated illumination |
| DE102011077236A1 (de) | 2011-06-08 | 2012-12-13 | Carl Zeiss Microlmaging Gmbh | Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung |
| DE102011114500B4 (de) | 2011-09-29 | 2022-05-05 | Fei Company | Mikroskopvorrichtung |
| US8964183B2 (en) * | 2012-05-31 | 2015-02-24 | General Electric Company | Systems and methods for screening of biological samples |
| US20140168402A1 (en) * | 2012-12-13 | 2014-06-19 | Vala Sciences, Inc. | Continuous-Scanning Image Acquisition in Automated Microscopy Using Reflective Autofocus |
| DE102012223128B4 (de) | 2012-12-13 | 2022-09-01 | Carl Zeiss Microscopy Gmbh | Autofokusverfahren für Mikroskop und Mikroskop mit Autofokuseinrichtung |
| JP6104662B2 (ja) * | 2013-03-25 | 2017-03-29 | 株式会社東芝 | 計測装置、方法及びプログラム |
| US9350921B2 (en) | 2013-06-06 | 2016-05-24 | Mitutoyo Corporation | Structured illumination projection with enhanced exposure control |
| JP6305012B2 (ja) * | 2013-10-25 | 2018-04-04 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
| JP6266302B2 (ja) * | 2013-10-25 | 2018-01-24 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
| JP6327830B2 (ja) * | 2013-10-25 | 2018-05-23 | 株式会社キーエンス | 顕微鏡撮像装置、顕微鏡撮像方法および顕微鏡撮像プログラム |
| CA2879598A1 (en) | 2014-01-26 | 2015-07-26 | Matthew S. Muller | Periodic fringe imaging with structured pattern illumination and electronic rolling shutter detection |
| WO2015118120A1 (en) | 2014-02-07 | 2015-08-13 | 3Shape A/S | Detecting tooth shade |
| US9675430B2 (en) | 2014-08-15 | 2017-06-13 | Align Technology, Inc. | Confocal imaging apparatus with curved focal surface |
| WO2016160716A1 (en) * | 2015-03-27 | 2016-10-06 | Syntheslide, LLC | Systems and methods for combining magnified images of a sample |
| WO2016199179A1 (ja) | 2015-06-08 | 2016-12-15 | 株式会社ニコン | 構造化照明顕微鏡システム、方法及びプログラム |
| CN106054380A (zh) * | 2016-07-15 | 2016-10-26 | 中国科学院苏州生物医学工程技术研究所 | 使用fpga加速处理结构光照明光切片荧光图像的方法 |
| DE102016117803A1 (de) | 2016-09-21 | 2018-03-22 | Leica Microsystems Cms Gmbh | Mikroskopbeleuchtungsanordnung zur strukturierten Beleuchtung |
| CN107101982A (zh) * | 2017-03-09 | 2017-08-29 | 深圳先进技术研究院 | 荧光显微装置 |
| DE102017004429B4 (de) | 2017-05-08 | 2019-05-09 | Universität Stuttgart | Verfahren und Anordnung zur robusten, tiefenscannenden/fokussierenden Streifen-Triangulation |
| DE102017004428B4 (de) | 2017-05-08 | 2018-11-29 | Universität Stuttgart | Verfahren und Anordnung zur robusten, tiefenscannenden fokussierenden Streifen-Triangulation mit mehreren Wavelets |
| GB201721451D0 (en) * | 2017-12-20 | 2018-01-31 | Univ Manchester | Apparatus and method for determining spectral information |
| CN108169887B (zh) * | 2017-12-27 | 2020-04-24 | 清华大学 | 3d多焦面结构光快速显微成像系统及方法 |
| CN110186925A (zh) * | 2018-02-22 | 2019-08-30 | 致茂电子(苏州)有限公司 | 检测装置 |
| TWI696820B (zh) * | 2018-02-22 | 2020-06-21 | 致茂電子股份有限公司 | 檢測裝置 |
| EP3857284B1 (de) * | 2018-09-27 | 2023-12-27 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und vorrichtung zur erzeugung und verschiebung einer lichtintensitätsverteilung in einem fokusbereich einer objektivlinse |
| CN111122567B (zh) * | 2018-11-01 | 2022-09-16 | 华中科技大学苏州脑空间信息研究院 | 一种高通量光学层析三维成像系统 |
| DE102019210019B4 (de) * | 2019-07-08 | 2021-06-10 | Trumpf Laser- Und Systemtechnik Gmbh | Optische Apparatur zum Laserschweißen eines Werkstücks, Verfahren zum Laserschweißen eines Werkstücks mittels mehrerer Teilstrahlen sowie Verwendung einer optischen Apparatur zum Laserschweißen |
| DE102019129932B4 (de) * | 2019-11-06 | 2023-12-21 | Technische Universität Braunschweig | Optische Detektionseinrichtung und Verfahren zum Betreiben einer optischen Detektionseinrichtung |
| US12140744B2 (en) * | 2022-07-15 | 2024-11-12 | Nanotronics Imaging, Inc. | Autofocus system and method |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2928548B2 (ja) * | 1989-08-02 | 1999-08-03 | 株式会社日立製作所 | 立体形状検出方法及びその装置 |
| GB9102903D0 (en) | 1991-02-12 | 1991-03-27 | Oxford Sensor Tech | An optical sensor |
| US5513275A (en) * | 1993-01-12 | 1996-04-30 | Board Of Trustees Of The Leland Stanford Junior University | Automated direct patterned wafer inspection |
| WO1996034365A1 (en) * | 1995-04-25 | 1996-10-31 | Cognitens Ltd. | Apparatus and method for recreating and manipulating a 3d object based on a 2d projection thereof |
| US5867604A (en) * | 1995-08-03 | 1999-02-02 | Ben-Levy; Meir | Imaging measurement system |
| JPH11242189A (ja) * | 1997-12-25 | 1999-09-07 | Olympus Optical Co Ltd | 像形成法、像形成装置 |
| US6188478B1 (en) * | 1998-10-21 | 2001-02-13 | Philips Electronics North America Corporation | Method and apparatus for film-thickness measurements |
-
1998
- 1998-04-03 DE DE69802514T patent/DE69802514T2/de not_active Expired - Lifetime
- 1998-04-03 AU AU69264/98A patent/AU737617B2/en not_active Ceased
- 1998-04-03 KR KR10-1999-7009051A patent/KR100504261B1/ko not_active Expired - Fee Related
- 1998-04-03 EP EP98914965A patent/EP0972220B1/de not_active Expired - Lifetime
- 1998-04-03 GB GB9922732A patent/GB2338858B/en not_active Expired - Fee Related
- 1998-04-03 ES ES98914965T patent/ES2167885T3/es not_active Expired - Lifetime
- 1998-04-03 WO PCT/GB1998/000988 patent/WO1998045745A1/en not_active Ceased
- 1998-04-03 JP JP10542491A patent/JP3066874B2/ja not_active Expired - Fee Related
- 1998-04-03 AT AT98914965T patent/ATE208911T1/de not_active IP Right Cessation
- 1998-04-03 DK DK98914965T patent/DK0972220T3/da active
-
1999
- 1999-10-01 US US09/410,614 patent/US6376818B1/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DK0972220T3 (da) | 2002-03-11 |
| WO1998045745A1 (en) | 1998-10-15 |
| EP0972220B1 (de) | 2001-11-14 |
| US6376818B1 (en) | 2002-04-23 |
| KR20010005974A (ko) | 2001-01-15 |
| AU6926498A (en) | 1998-10-30 |
| DE69802514D1 (de) | 2001-12-20 |
| GB2338858A (en) | 1999-12-29 |
| EP0972220A1 (de) | 2000-01-19 |
| GB9922732D0 (en) | 1999-11-24 |
| KR100504261B1 (ko) | 2005-07-27 |
| JP3066874B2 (ja) | 2000-07-17 |
| JP2000506634A (ja) | 2000-05-30 |
| DE69802514T2 (de) | 2002-06-27 |
| AU737617B2 (en) | 2001-08-23 |
| GB2338858B (en) | 2000-12-27 |
| ES2167885T3 (es) | 2002-05-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification | ||
| REN | Ceased due to non-payment of the annual fee |