ATE224242T1 - Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen - Google Patents

Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen

Info

Publication number
ATE224242T1
ATE224242T1 AT99911154T AT99911154T ATE224242T1 AT E224242 T1 ATE224242 T1 AT E224242T1 AT 99911154 T AT99911154 T AT 99911154T AT 99911154 T AT99911154 T AT 99911154T AT E224242 T1 ATE224242 T1 AT E224242T1
Authority
AT
Austria
Prior art keywords
integrated circuit
speed
circuit
characterizing
integrated circuits
Prior art date
Application number
AT99911154T
Other languages
English (en)
Inventor
Troy A Manning
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE224242T1 publication Critical patent/ATE224242T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
  • Dram (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
AT99911154T 1998-03-06 1999-03-05 Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen ATE224242T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/036,700 US6212482B1 (en) 1998-03-06 1998-03-06 Circuit and method for specifying performance parameters in integrated circuits
PCT/US1999/004903 WO1999044752A2 (en) 1998-03-06 1999-03-05 Circuit and method for specifying performance parameters in integrated circuits

Publications (1)

Publication Number Publication Date
ATE224242T1 true ATE224242T1 (de) 2002-10-15

Family

ID=21890124

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99911154T ATE224242T1 (de) 1998-03-06 1999-03-05 Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen

Country Status (8)

Country Link
US (2) US6212482B1 (de)
EP (1) EP1060027B1 (de)
JP (1) JP3823026B2 (de)
KR (1) KR100597826B1 (de)
AT (1) ATE224242T1 (de)
AU (1) AU2986499A (de)
DE (1) DE69903005T2 (de)
WO (1) WO1999044752A2 (de)

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Also Published As

Publication number Publication date
US6212482B1 (en) 2001-04-03
WO1999044752A3 (en) 1999-10-21
JP2002505497A (ja) 2002-02-19
WO1999044752A2 (en) 1999-09-10
DE69903005T2 (de) 2003-04-17
US6393378B2 (en) 2002-05-21
JP3823026B2 (ja) 2006-09-20
US20010002461A1 (en) 2001-05-31
EP1060027B1 (de) 2002-09-18
EP1060027A2 (de) 2000-12-20
AU2986499A (en) 1999-09-20
KR20010041678A (ko) 2001-05-25
DE69903005D1 (de) 2002-10-24
KR100597826B1 (ko) 2006-07-10

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