ATE227884T1 - Ionenstrahlabtastverfahren und vorrichtung - Google Patents

Ionenstrahlabtastverfahren und vorrichtung

Info

Publication number
ATE227884T1
ATE227884T1 AT87903080T AT87903080T ATE227884T1 AT E227884 T1 ATE227884 T1 AT E227884T1 AT 87903080 T AT87903080 T AT 87903080T AT 87903080 T AT87903080 T AT 87903080T AT E227884 T1 ATE227884 T1 AT E227884T1
Authority
AT
Austria
Prior art keywords
scanned
scanning method
ion beam
ion
beam scanning
Prior art date
Application number
AT87903080T
Other languages
English (en)
Inventor
Donald W Eclipse Ion T Berrian
Robert E Eclipse Ion Tech Kaim
John W Eclipse Ion T Vanderpot
Original Assignee
Varian Semiconductor Equipment
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Semiconductor Equipment filed Critical Varian Semiconductor Equipment
Application granted granted Critical
Publication of ATE227884T1 publication Critical patent/ATE227884T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31701—Ion implantation
    • H01J2237/31703—Dosimetry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT87903080T 1986-04-09 1987-04-08 Ionenstrahlabtastverfahren und vorrichtung ATE227884T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US84978686A 1986-04-09 1986-04-09
US2586087A 1987-03-16 1987-03-16
PCT/US1987/000804 WO1987006391A1 (en) 1986-04-09 1987-04-08 Ion beam scanning method and apparatus

Publications (1)

Publication Number Publication Date
ATE227884T1 true ATE227884T1 (de) 2002-11-15

Family

ID=26700250

Family Applications (1)

Application Number Title Priority Date Filing Date
AT87903080T ATE227884T1 (de) 1986-04-09 1987-04-08 Ionenstrahlabtastverfahren und vorrichtung

Country Status (5)

Country Link
EP (2) EP1253620A3 (de)
JP (2) JP2699170B2 (de)
AT (1) ATE227884T1 (de)
DE (1) DE3752358T2 (de)
WO (1) WO1987006391A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
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US4980562A (en) * 1986-04-09 1990-12-25 Varian Associates, Inc. Method and apparatus for high efficiency scanning in an ion implanter
GB2216714B (en) * 1988-03-11 1992-10-14 Ulvac Corp Ion implanter system
SE463055B (sv) * 1989-02-10 1990-10-01 Scanditronix Ab Anordning foer att bestraala artiklar med elektroner samt magnetisk lins foer avboejning av straalar av laddade partiklar, saerskilt elektroner
JPH077658B2 (ja) * 1989-05-15 1995-01-30 日新電機株式会社 イオン注入装置
JPH0770296B2 (ja) * 1989-05-15 1995-07-31 日新電機株式会社 イオン注入装置
GB9005204D0 (en) * 1990-03-08 1990-05-02 Superion Ltd Apparatus and methods relating to scanning ion beams
US5051600A (en) * 1990-08-17 1991-09-24 Raychem Corporation Particle beam generator
US5311028A (en) * 1990-08-29 1994-05-10 Nissin Electric Co., Ltd. System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
US5132544A (en) * 1990-08-29 1992-07-21 Nissin Electric Company Ltd. System for irradiating a surface with atomic and molecular ions using two dimensional magnetic scanning
KR970002681B1 (ko) * 1990-10-03 1997-03-08 이턴 코오포레이숀 이온비임주입시스템과 그방법 및 이온비임을 편향시키는 정전렌즈
US5091655A (en) * 1991-02-25 1992-02-25 Eaton Corporation Reduced path ion beam implanter
US6423976B1 (en) * 1999-05-28 2002-07-23 Applied Materials, Inc. Ion implanter and a method of implanting ions
CN1256751C (zh) * 2000-05-15 2006-05-17 瓦里安半导体设备联合公司 离子注入机中的高效率扫描
KR100594220B1 (ko) * 2000-08-09 2006-06-30 삼성전자주식회사 이온 주입 장치
AU2001285377A1 (en) * 2000-09-07 2002-03-22 Diamond Semiconductor Group, Inc. Apparatus for magnetically scanning and/or switching a charged-particle beam
US6956223B2 (en) * 2002-04-10 2005-10-18 Applied Materials, Inc. Multi-directional scanning of movable member and ion beam monitoring arrangement therefor
WO2005098909A2 (en) * 2004-04-05 2005-10-20 Axcelis Technologies, Inc. Drive system for scanning a workpiece through an ion beam
US7109499B2 (en) * 2004-11-05 2006-09-19 Varian Semiconductor Equipment Associates, Inc. Apparatus and methods for two-dimensional ion beam profiling
US7078707B1 (en) * 2005-01-04 2006-07-18 Axcelis Technologies, Inc. Ion beam scanning control methods and systems for ion implantation uniformity
JP2007123056A (ja) 2005-10-28 2007-05-17 Matsushita Electric Ind Co Ltd イオン注入装置とそのイオン注入制御方法
JP5085887B2 (ja) * 2006-05-30 2012-11-28 株式会社Ｓｅｎ ビーム処理装置及びビーム処理方法
JP2009055057A (ja) * 2008-10-24 2009-03-12 Panasonic Corp イオン注入装置とそのイオン注入制御方法
US20110272567A1 (en) * 2010-05-05 2011-11-10 Axcelis Technologies, Inc. Throughput Enhancement for Scanned Beam Ion Implanters
JP5767983B2 (ja) * 2012-01-27 2015-08-26 住友重機械イオンテクノロジー株式会社 イオン注入方法及びイオン注入装置
JP5808706B2 (ja) 2012-03-29 2015-11-10 住友重機械イオンテクノロジー株式会社 イオン注入装置及びその制御方法
JP5941377B2 (ja) * 2012-08-31 2016-06-29 住友重機械イオンテクノロジー株式会社 イオン注入方法およびイオン注入装置
JP6195538B2 (ja) 2014-04-25 2017-09-13 住友重機械イオンテクノロジー株式会社 イオン注入方法及びイオン注入装置
US9679745B2 (en) * 2015-10-14 2017-06-13 Varian Semiconductor Equipment Associates, Inc. Controlling an ion beam in a wide beam current operation range
CN112670147A (zh) * 2019-10-15 2021-04-16 北京烁科中科信电子装备有限公司 一种利用多磁极磁棒间距控制的自动调节剂量均一性的方法
US20210398772A1 (en) * 2020-06-17 2021-12-23 Axcelis Technologies, Inc. Tuning apparatus for minimum divergence ion beam

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Publication number Priority date Publication date Assignee Title
US3122631A (en) * 1960-02-05 1964-02-25 Atlas Werke Ag Apparatus for focusing a line type ion beam on a mass spectrometer analyzer
DE1190226B (de) * 1961-12-09 1965-04-01 Akashi Seisakusho Kk Roentgenstrahl-Mikroanalysator
GB1280013A (en) * 1969-09-05 1972-07-05 Atomic Energy Authority Uk Improvements in or relating to apparatus bombarding a target with ions
US3816748A (en) * 1972-04-28 1974-06-11 Alpha Ind Inc Ion accelerator employing crossed-field selector
US4021675A (en) * 1973-02-20 1977-05-03 Hughes Aircraft Company System for controlling ion implantation dosage in electronic materials
JPS5836464B2 (ja) * 1975-09-12 1983-08-09 株式会社島津製作所 シツリヨウブンセキソウチ
JPS53102677A (en) * 1977-02-18 1978-09-07 Hitachi Ltd Ion beam radiating unit
JPS5457862A (en) * 1977-10-17 1979-05-10 Hitachi Ltd Ion-beam irradiation device
NL182924C (nl) * 1978-05-12 1988-06-01 Philips Nv Inrichting voor het implanteren van ionen in een trefplaat.
JPS55124936A (en) * 1979-03-22 1980-09-26 Hitachi Ltd Control method of beam current in ion drive
US4276477A (en) * 1979-09-17 1981-06-30 Varian Associates, Inc. Focusing apparatus for uniform application of charged particle beam
JPS56126918A (en) * 1980-03-11 1981-10-05 Hitachi Ltd Injecting device for ion
JPS57182956A (en) * 1981-05-07 1982-11-11 Hitachi Ltd Ion-implantation device
US4447773A (en) * 1981-06-22 1984-05-08 California Institute Of Technology Ion beam accelerator system
US4433247A (en) * 1981-09-28 1984-02-21 Varian Associates, Inc. Beam sharing method and apparatus for ion implantation
JPS60124344A (ja) * 1983-12-08 1985-07-03 Nec Corp イオン注入装置
US4587433A (en) * 1984-06-27 1986-05-06 Eaton Corporation Dose control apparatus
US4539217A (en) * 1984-06-27 1985-09-03 Eaton Corporation Dose control method
JPH0630237B2 (ja) * 1984-09-10 1994-04-20 株式会社日立製作所 イオン打込み装置
JPS61220264A (ja) * 1985-03-26 1986-09-30 Hitachi Ltd イオン打込装置
JPS61267250A (ja) * 1985-05-20 1986-11-26 Fuji Electric Co Ltd イオン注入装置
EP0287630A4 (de) * 1986-10-08 1989-07-25 Varian Associates Verfahren und vorrichtung zum abtasten mit konstantem einfallswinkel in ionenstrahlsystemen.

Also Published As

Publication number Publication date
EP1253620A3 (de) 2008-05-07
JP3153784B2 (ja) 2001-04-09
EP0263876A4 (en) 1991-10-09
EP0263876B1 (de) 2002-11-13
WO1987006391A1 (en) 1987-10-22
DE3752358D1 (de) 2002-12-19
EP1253620A2 (de) 2002-10-30
DE3752358T2 (de) 2003-03-27
EP0263876A1 (de) 1988-04-20
JP2699170B2 (ja) 1998-01-19
JPH01500310A (ja) 1989-02-02
JPH10116581A (ja) 1998-05-06

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