ATE239919T1 - Doppelspitzen-prüftstift zum prüfen von leiterplatten - Google Patents

Doppelspitzen-prüftstift zum prüfen von leiterplatten

Info

Publication number
ATE239919T1
ATE239919T1 AT99967766T AT99967766T ATE239919T1 AT E239919 T1 ATE239919 T1 AT E239919T1 AT 99967766 T AT99967766 T AT 99967766T AT 99967766 T AT99967766 T AT 99967766T AT E239919 T1 ATE239919 T1 AT E239919T1
Authority
AT
Austria
Prior art keywords
pin
probe
circuit boards
testing circuit
test pin
Prior art date
Application number
AT99967766T
Other languages
English (en)
Inventor
Brian K Lucas
Brian Stockford
Original Assignee
Proteus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Proteus Corp filed Critical Proteus Corp
Application granted granted Critical
Publication of ATE239919T1 publication Critical patent/ATE239919T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07392—Multiple probes manipulating each probe element or tip individually
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Mechanical Coupling Of Light Guides (AREA)
  • Magnetic Heads (AREA)
AT99967766T 1998-12-30 1999-12-30 Doppelspitzen-prüftstift zum prüfen von leiterplatten ATE239919T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11439298P 1998-12-30 1998-12-30
PCT/US1999/031236 WO2000039595A1 (en) 1998-12-30 1999-12-30 Dual-pin probe for testing circuit boards

Publications (1)

Publication Number Publication Date
ATE239919T1 true ATE239919T1 (de) 2003-05-15

Family

ID=22354916

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99967766T ATE239919T1 (de) 1998-12-30 1999-12-30 Doppelspitzen-prüftstift zum prüfen von leiterplatten

Country Status (6)

Country Link
EP (1) EP1141731B1 (de)
AT (1) ATE239919T1 (de)
AU (1) AU2398800A (de)
CA (1) CA2357012A1 (de)
DE (1) DE69907738D1 (de)
WO (1) WO2000039595A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004015909A1 (en) 2002-08-01 2004-02-19 Nokia Corporation Transmitting interleaved multiple data flows
GB0308550D0 (en) * 2003-04-10 2003-05-21 Barker Colin Improvements to an automatic test machine
WO2015116224A1 (en) * 2014-01-31 2015-08-06 Hewlett-Packard Development Company, L.P. Test probe
CN114527307B (zh) * 2022-02-11 2024-03-22 木王芯(苏州)半导体科技有限公司 一种带有断簧保护特性的三头测试探针

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2605414B1 (fr) * 1986-10-15 1989-05-12 Automatisme Lumiere Commerce I Procede de controle sequentiel automatique d'une carte portant des composants electroniques et dispositif pour la mise en oeuvre de ce procede
EP0290182A1 (de) * 1987-05-06 1988-11-09 Hewlett-Packard Company Passiver Tastkopf für Hochfrequenzmessungen
US5006793A (en) * 1989-06-08 1991-04-09 Cascade Microtech, Inc. High-frequency active probe having replaceable contact needles
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
US5136237A (en) * 1991-01-29 1992-08-04 Tektronix, Inc. Double insulated floating high voltage test probe
US5264788A (en) * 1992-06-12 1993-11-23 Cascade Microtech, Inc. Adjustable strap implemented return line for a probe station
US5994909A (en) * 1997-08-25 1999-11-30 Lucas; Brian K. Robotic twin probe for measurement on printed circuit boards and electrical and electronic assemblies

Also Published As

Publication number Publication date
DE69907738D1 (de) 2003-06-12
WO2000039595A1 (en) 2000-07-06
EP1141731A1 (de) 2001-10-10
AU2398800A (en) 2000-07-31
CA2357012A1 (en) 2000-07-06
EP1141731B1 (de) 2003-05-07

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties