ATE240529T1 - Breitband-isolationseinrichtung - Google Patents

Breitband-isolationseinrichtung

Info

Publication number
ATE240529T1
ATE240529T1 AT98960663T AT98960663T ATE240529T1 AT E240529 T1 ATE240529 T1 AT E240529T1 AT 98960663 T AT98960663 T AT 98960663T AT 98960663 T AT98960663 T AT 98960663T AT E240529 T1 ATE240529 T1 AT E240529T1
Authority
AT
Austria
Prior art keywords
optical
transmitter unit
signal
electro
microprocessor
Prior art date
Application number
AT98960663T
Other languages
English (en)
Inventor
Jorge Sanchez
Original Assignee
Ceyx Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ceyx Technologies Inc filed Critical Ceyx Technologies Inc
Application granted granted Critical
Publication of ATE240529T1 publication Critical patent/ATE240529T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Element Separation (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Microwave Amplifiers (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
AT98960663T 1997-12-11 1998-12-03 Breitband-isolationseinrichtung ATE240529T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/988,865 US6028423A (en) 1997-12-11 1997-12-11 Isolation instrument for electrical testing
PCT/US1998/025612 WO1999030172A2 (en) 1997-12-11 1998-12-03 Wideband isolation system

Publications (1)

Publication Number Publication Date
ATE240529T1 true ATE240529T1 (de) 2003-05-15

Family

ID=25534557

Family Applications (1)

Application Number Title Priority Date Filing Date
AT98960663T ATE240529T1 (de) 1997-12-11 1998-12-03 Breitband-isolationseinrichtung

Country Status (6)

Country Link
US (1) US6028423A (de)
EP (1) EP1038185B1 (de)
AT (1) ATE240529T1 (de)
AU (1) AU1621099A (de)
DE (1) DE69814681T2 (de)
WO (1) WO1999030172A2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6446867B1 (en) * 1995-11-22 2002-09-10 Jorge Sanchez Electro-optic interface system and method of operation
US6494370B1 (en) * 1997-12-11 2002-12-17 Ceyx Technologies Electro-optic system controller and method of operation
DE19823587A1 (de) * 1998-05-27 1999-12-02 Alcatel Sa Optische Verbindung sowie Verbindungseinheit zum Austausch von Daten zwischen Geräten
US6219812B1 (en) * 1998-06-11 2001-04-17 Sun Microsystems, Inc. Apparatus and method for interfacing boundary-scan circuitry with DTL output drivers
US6529020B1 (en) 2000-11-15 2003-03-04 Ge Fanuc Automation North America, Inc. Methods and systems for automated emissions measuring
WO2002095599A1 (en) * 2001-05-24 2002-11-28 Ceyx Technologies, Inc. Optical bus arrangement for computer system
EP1470522A4 (de) * 2001-12-27 2005-10-05 Ceyx Technologies Inc Integriertes steuersystem für laseroptik und betriebsverfahren
CA2475850A1 (en) 2003-01-08 2003-07-29 Ceyx Technologies, Inc. Apparatus and method for measurement of dynamic laser signals
US7035167B2 (en) * 2003-09-11 2006-04-25 General Phosphorix Seismic sensor
US7049843B2 (en) * 2004-03-10 2006-05-23 Tektronix, Inc. Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltages
US8244234B2 (en) * 2007-08-01 2012-08-14 Research In Motion Limited System and method of measuring total radiated power from mobile wireless communications device
JP5049887B2 (ja) * 2008-03-05 2012-10-17 株式会社フジクラ 光伝送装置
US20120313655A1 (en) * 2011-06-10 2012-12-13 Associated Research, Inc. Electrical test equipment having switchable intermediate-voltage line- leakage and run test power source
WO2013140630A1 (ja) * 2012-03-23 2013-09-26 三菱電機株式会社 検査装置、検査方法およびプログラム
US9209593B2 (en) * 2013-12-18 2015-12-08 Tektronix, Inc. Method of controlling electro-optical probe gain and sensitivity
CN104007339A (zh) * 2014-05-16 2014-08-27 中国空间技术研究院 一种采用远距离传输方式的光电耦合器电参数在线测试系统及其方法
RU2556033C1 (ru) * 2014-05-29 2015-07-10 Общество с ограниченной ответственностью Научно-производственное предприятие "ЭКРА" Способ автоматического ограничения повышения напряжения высоковольтного оборудования
WO2015185133A1 (en) * 2014-06-04 2015-12-10 Telefonaktiebolaget L M Ericsson (Publ) An optical electrical measurement system, a measurement probe and a method therefor
US10060981B2 (en) * 2014-12-03 2018-08-28 Power ProbeTeK, LLC Diagnostic circuit test device
US10067165B2 (en) 2015-09-04 2018-09-04 Ford Global Technologies, Llc Isolated differential voltage probe for EMI noise source
US10274542B1 (en) * 2018-11-27 2019-04-30 Professional Generator Testers LLC Electrical generator testing appliance
US11630131B2 (en) * 2021-07-14 2023-04-18 The United States Of America As Represented By The Secretary Of The Army Electrically-isolated high-voltage sensor with low power dissipation
CN113917213B (zh) * 2021-09-17 2024-04-12 威凯检测技术有限公司 一种用于核查传导骚扰抗扰度测试系统的电压表
EP4280480B1 (de) * 2022-05-18 2024-12-18 FenztraQ GmbH Vorrichtung, system und verfahren zum testen einer kommunikationsvorrichtung

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Publication number Priority date Publication date Assignee Title
US3346811A (en) * 1964-02-24 1967-10-10 Allis Chalmers Mfg Co Means for sensing conditions in high potential region and for transmitting such intelligence by light means to low potential regions
SE413808B (sv) * 1978-09-22 1980-06-23 Asea Ab Metdon for overforing av metsignaler via en optisk lenk
US4290297A (en) * 1979-05-14 1981-09-22 Rousemount Inc. Optically coupled calibrator for transmitters
US4734873A (en) * 1984-02-02 1988-03-29 Honeywell Inc. Method of digital process variable transmitter calibration and a process variable transmitter system utilizing the same
US4677536A (en) * 1986-03-17 1987-06-30 Tektronix, Inc. AC Current sensing circuit
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
JP3175935B2 (ja) * 1987-09-30 2001-06-11 株式会社東芝 光ファイバ応用センサ
US4939446A (en) * 1988-03-30 1990-07-03 Rogers Wesley A Voltage transmission link for testing EMI susceptibility of a device or circuits
US4875006A (en) * 1988-09-01 1989-10-17 Photon Dynamics, Inc. Ultra-high-speed digital test system using electro-optic signal sampling
US5107202A (en) * 1989-10-23 1992-04-21 Trustees Of Princeton University Fiber optic current monitor for high-voltage applications
US4996478A (en) * 1990-01-05 1991-02-26 Tektronix, Inc. Apparatus for connecting an IC device to a test system
US5181026A (en) * 1990-01-12 1993-01-19 Granville Group, Inc., The Power transmission line monitoring system
US5136237A (en) * 1991-01-29 1992-08-04 Tektronix, Inc. Double insulated floating high voltage test probe
US5414345A (en) * 1991-04-29 1995-05-09 Electronic Development, Inc. Apparatus and method for low cost electromagnetic field susceptibility testing
US5164662A (en) * 1991-07-22 1992-11-17 Westinghouse Electric Corp. Detection of radio frequency emissions
US5311116A (en) * 1992-04-02 1994-05-10 Electronic Development, Inc. Multi-channel electromagnetically transparent voltage waveform monitor link
JPH06222087A (ja) * 1993-01-27 1994-08-12 Hamamatsu Photonics Kk 電圧検出装置
DE19507809C2 (de) * 1995-03-06 1998-05-20 Gunter Dipl Ing Langer Meßverfahren zur Erfassung pulsförmiger Störgrößen
DE29514423U1 (de) * 1995-09-08 1995-11-02 Langer, Gunter, Dipl.-Ing., 01728 Bannewitz EMV-Kompaktsensor

Also Published As

Publication number Publication date
DE69814681D1 (de) 2003-06-18
WO1999030172B1 (en) 1999-11-11
US6028423A (en) 2000-02-22
EP1038185A2 (de) 2000-09-27
WO1999030172A3 (en) 1999-10-07
WO1999030172A2 (en) 1999-06-17
AU1621099A (en) 1999-06-28
EP1038185B1 (de) 2003-05-14
DE69814681T2 (de) 2004-04-01

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Legal Events

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