ATE245304T1 - Einzelecke kirkpatrick-baez optische strahlbehandlungsanordnung - Google Patents

Einzelecke kirkpatrick-baez optische strahlbehandlungsanordnung

Info

Publication number
ATE245304T1
ATE245304T1 AT99907116T AT99907116T ATE245304T1 AT E245304 T1 ATE245304 T1 AT E245304T1 AT 99907116 T AT99907116 T AT 99907116T AT 99907116 T AT99907116 T AT 99907116T AT E245304 T1 ATE245304 T1 AT E245304T1
Authority
AT
Austria
Prior art keywords
optical beam
single corner
beam treatment
treatment arrangement
kirkpatrick
Prior art date
Application number
AT99907116T
Other languages
English (en)
Inventor
George Gutman
Licai Jiang
Boris Verman
Original Assignee
Osmic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osmic Inc filed Critical Osmic Inc
Application granted granted Critical
Publication of ATE245304T1 publication Critical patent/ATE245304T1/de

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062—Devices having a multilayer structure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Lenses (AREA)
  • Aerials With Secondary Devices (AREA)
  • Particle Accelerators (AREA)
  • Lasers (AREA)
  • Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
  • Plural Heterocyclic Compounds (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
  • Building Environments (AREA)
AT99907116T 1998-02-19 1999-02-18 Einzelecke kirkpatrick-baez optische strahlbehandlungsanordnung ATE245304T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/026,385 US6041099A (en) 1998-02-19 1998-02-19 Single corner kirkpatrick-baez beam conditioning optic assembly
PCT/US1999/003442 WO1999043009A1 (en) 1998-02-19 1999-02-18 Single corner kirkpatrick-baez beam conditioning optic assembly

Publications (1)

Publication Number Publication Date
ATE245304T1 true ATE245304T1 (de) 2003-08-15

Family

ID=21831545

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99907116T ATE245304T1 (de) 1998-02-19 1999-02-18 Einzelecke kirkpatrick-baez optische strahlbehandlungsanordnung

Country Status (9)

Country Link
US (1) US6041099A (de)
EP (1) EP1060477B1 (de)
JP (1) JP3721305B2 (de)
AT (1) ATE245304T1 (de)
AU (1) AU2685199A (de)
CA (1) CA2321289A1 (de)
CZ (1) CZ301342B6 (de)
DE (1) DE69909599T2 (de)
WO (1) WO1999043009A1 (de)

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US6389100B1 (en) 1999-04-09 2002-05-14 Osmic, Inc. X-ray lens system
US6421417B1 (en) 1999-08-02 2002-07-16 Osmic, Inc. Multilayer optics with adjustable working wavelength
US6330301B1 (en) * 1999-12-17 2001-12-11 Osmic, Inc. Optical scheme for high flux low-background two-dimensional small angle x-ray scattering
US6504902B2 (en) * 2000-04-10 2003-01-07 Rigaku Corporation X-ray optical device and multilayer mirror for small angle scattering system
DE10028970C1 (de) 2000-06-05 2002-01-24 Fraunhofer Ges Forschung Röntgenoptische Anordnung zur Erzeugung einer parallelen Röntgenstrahlung
AU2001287476A1 (en) * 2000-10-02 2002-04-15 Paul Scherrer Institut Method and device for influencing x-radiation
US6493421B2 (en) 2000-10-16 2002-12-10 Advanced X-Ray Technology, Inc. Apparatus and method for generating a high intensity X-ray beam with a selectable shape and wavelength
US6870896B2 (en) 2000-12-28 2005-03-22 Osmic, Inc. Dark-field phase contrast imaging
DE10107914A1 (de) * 2001-02-14 2002-09-05 Fraunhofer Ges Forschung Anordnung für röntgenanalytische Anwendungen
US6804324B2 (en) * 2001-03-01 2004-10-12 Osmo, Inc. X-ray phase contrast imaging using a fabry-perot interferometer concept
EP1397813B1 (de) * 2001-06-01 2008-06-04 Xenocs Hybrides optisches element für röntgenstrahl-anwendungen und zugehöriges verfahren
US6510200B1 (en) 2001-06-29 2003-01-21 Osmic, Inc. Multi-layer structure with variable bandpass for monochromatization and spectroscopy
JP3762665B2 (ja) * 2001-07-03 2006-04-05 株式会社リガク Ｘ線分析装置およびｘ線供給装置
DE10160472B4 (de) * 2001-12-08 2004-06-03 Bruker Axs Gmbh Röntgen-optisches System und Verfahren zur Abbildung einer Strahlungsquelle
DE10162093A1 (de) 2001-12-18 2003-07-10 Bruker Axs Gmbh Röntgen-optisches System mit Blende im Fokus einer Röntgen-Spiegels
US6643353B2 (en) 2002-01-10 2003-11-04 Osmic, Inc. Protective layer for multilayers exposed to x-rays
DE10212410A1 (de) * 2002-03-20 2004-03-04 Siemens Ag Röntgenbandpassfilter
JP3699998B2 (ja) * 2002-03-20 2005-09-28 国立大学法人東北大学 蛍光ｘ線ホログラフィー装置、蛍光ｘ線ホログラフィーおよび局所構造解析方法
DE20320792U1 (de) * 2002-06-19 2005-05-04 Xenocs Optische Anordnung und zugehörige Vorrichtung
FR2841371B1 (fr) * 2002-06-19 2004-10-22 Xenocs Ensemble optique et procede associe
JP3757199B2 (ja) * 2002-09-03 2006-03-22 株式会社リガク Ｘ線小角散乱光学系
JP2004125582A (ja) * 2002-10-02 2004-04-22 Rigaku Corp 分析装置及び分析方法
DE10254026C5 (de) * 2002-11-20 2009-01-29 Incoatec Gmbh Reflektor für Röntgenstrahlung
DE602004003347T2 (de) * 2003-02-28 2007-06-21 Osmic, Inc., Auburn Hills Optische röntgenstrahlungsvorrichtung mit verstellbarer konvergenz
US7280634B2 (en) * 2003-06-13 2007-10-09 Osmic, Inc. Beam conditioning system with sequential optic
WO2004114325A2 (en) * 2003-06-13 2004-12-29 Osmic, Inc. Beam conditioning system
US7139366B1 (en) 2005-05-31 2006-11-21 Osmic, Inc. Two-dimensional small angle x-ray scattering camera
DE102005057700A1 (de) 2005-11-25 2007-06-06 Axo Dresden Gmbh Röntgen-Optisches-Element
DE102006015933B3 (de) * 2006-04-05 2007-10-31 Incoatec Gmbh Vorrichtung und Verfahren zum Justieren eines optischen Elements
JP4278108B2 (ja) 2006-07-07 2009-06-10 株式会社リガク 超小角ｘ線散乱測定装置
JP4814782B2 (ja) * 2006-12-28 2011-11-16 株式会社ジェイテック 位相回復法を用いたｘ線集光方法及びその装置
JP4521573B2 (ja) * 2007-01-10 2010-08-11 大学共同利用機関法人 高エネルギー加速器研究機構 中性子線の反射率曲線測定方法及び測定装置
JP5081556B2 (ja) * 2007-09-28 2012-11-28 株式会社リガク デバイシェラー光学系を備えたｘ線回折測定装置とそのためのｘ線回折測定方法
US7706503B2 (en) * 2007-11-20 2010-04-27 Rigaku Innovative Technologies, Inc. X-ray optic with varying focal points
US7848483B2 (en) * 2008-03-07 2010-12-07 Rigaku Innovative Technologies Magnesium silicide-based multilayer x-ray fluorescence analyzers
WO2009126868A1 (en) 2008-04-11 2009-10-15 Rigaku Innovative Technologies, Inc. X-ray generator with polycapillary optic
DE102008050851B4 (de) 2008-10-08 2010-11-11 Incoatec Gmbh Röntgenanalyseinstrument mit verfahrbarem Aperturfenster
JP5237186B2 (ja) 2009-04-30 2013-07-17 株式会社リガク Ｘ線散乱測定装置およびｘ線散乱測定方法
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US8249220B2 (en) 2009-10-14 2012-08-21 Rigaku Innovative Technologies, Inc. Multiconfiguration X-ray optical system
US8126117B2 (en) * 2010-02-03 2012-02-28 Rigaku Innovative Technologies, Inc. Multi-beam X-ray system
US8406374B2 (en) 2010-06-25 2013-03-26 Rigaku Innovative Technologies, Inc. X-ray optical systems with adjustable convergence and focal spot size
EP2740127B1 (de) 2011-08-06 2017-11-29 Rigaku Innovative Technologies, Inc. Nanoröhrchenbasierte vorrichtung zum lenken von röntgenphotonen und neutronen
WO2013185000A1 (en) 2012-06-08 2013-12-12 Rigaku Innovative Technologies, Inc. X-ray beam system offering 1d and 2d beams
JP6322627B2 (ja) 2012-06-08 2018-05-09 リガク イノベイティブ テクノロジーズ インコーポレイテッド デュアルモード小角散乱カメラ
CN103234987B (zh) * 2013-04-17 2015-06-03 同济大学 一种时间分辨的多色单能x射线成像谱仪
DE102013008486B4 (de) 2013-05-18 2016-07-14 Saxray GmbH Rauscharmes optisches Element zur Detektion von Strahlung mittels Messung elektrischer Signale und Verwendung desselben zur Einstellung einer Reflexionsbedingung
JP6202684B2 (ja) * 2014-06-05 2017-09-27 株式会社リガク Ｘ線回折装置
DE102015224143B3 (de) 2015-12-03 2017-02-23 Incoatec Gmbh Verfahren zur Justage der Primärseite eines Röntgendiffraktometers und zugehöriges Röntgendiffraktometer
JP6857400B2 (ja) * 2018-03-01 2021-04-14 株式会社リガク Ｘ線発生装置、及びｘ線分析装置
KR102621750B1 (ko) * 2019-06-24 2024-01-05 에스엠에스 그룹 게엠베하 다결정 제품의 소재 특성 측정 장치 및 방법
JP7572033B2 (ja) * 2020-10-23 2024-10-23 株式会社リガク 結像型ｘ線顕微鏡
US12436115B2 (en) * 2022-02-25 2025-10-07 Proto Patents Ltd. Transmission X-ray diffraction apparatus and related method

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JPH01263599A (ja) * 1988-04-15 1989-10-20 Nec Corp 半導体製造装置
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JP2921038B2 (ja) * 1990-06-01 1999-07-19 キヤノン株式会社 Ｘ線を用いた観察装置
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US5259013A (en) * 1991-12-17 1993-11-02 The United States Of America As Represented By The Secretary Of Commerce Hard x-ray magnification apparatus and method with submicrometer spatial resolution of images in more than one dimension
DE4407278A1 (de) * 1994-03-04 1995-09-07 Siemens Ag Röntgen-Analysegerät
ATE169769T1 (de) * 1994-05-11 1998-08-15 Univ Colorado Roentgenstrahlungsoptik mit streifendem lichteinfall und sphaerischen spiegeln
US5646976A (en) * 1994-08-01 1997-07-08 Osmic, Inc. Optical element of multilayered thin film for X-rays and neutrons

Also Published As

Publication number Publication date
CZ301342B6 (cs) 2010-01-20
JP2003517568A (ja) 2003-05-27
EP1060477A1 (de) 2000-12-20
EP1060477B1 (de) 2003-07-16
US6041099A (en) 2000-03-21
CZ20003042A3 (en) 2001-05-16
WO1999043009A1 (en) 1999-08-26
JP3721305B2 (ja) 2005-11-30
DE69909599T2 (de) 2004-04-15
CA2321289A1 (en) 1999-08-26
AU2685199A (en) 1999-09-06
DE69909599D1 (de) 2003-08-21

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