ATE266187T1 - Einrichtung zur messung und regelung der dicke einer latexschicht - Google Patents

Einrichtung zur messung und regelung der dicke einer latexschicht

Info

Publication number
ATE266187T1
ATE266187T1 AT99961956T AT99961956T ATE266187T1 AT E266187 T1 ATE266187 T1 AT E266187T1 AT 99961956 T AT99961956 T AT 99961956T AT 99961956 T AT99961956 T AT 99961956T AT E266187 T1 ATE266187 T1 AT E266187T1
Authority
AT
Austria
Prior art keywords
measuring
thickness
controlling
coating
latex layer
Prior art date
Application number
AT99961956T
Other languages
English (en)
Inventor
Edward Belotserkovsky
Original Assignee
Honeywell Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Measurex Corp filed Critical Honeywell Measurex Corp
Application granted granted Critical
Publication of ATE266187T1 publication Critical patent/ATE266187T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G17/00—Apparatus for or methods of weighing material of special form or property
    • G01G17/02—Apparatus for or methods of weighing material of special form or property for weighing material of filamentary or sheet form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Battery Electrode And Active Subsutance (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Coating Apparatus (AREA)
  • Spray Control Apparatus (AREA)
AT99961956T 1998-12-15 1999-12-07 Einrichtung zur messung und regelung der dicke einer latexschicht ATE266187T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/211,883 US6183561B1 (en) 1998-12-15 1998-12-15 Coat weight measuring and control apparatus
PCT/US1999/029052 WO2000036368A1 (en) 1998-12-15 1999-12-07 Latex coat thickness measuring and control apparatus

Publications (1)

Publication Number Publication Date
ATE266187T1 true ATE266187T1 (de) 2004-05-15

Family

ID=22788675

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99961956T ATE266187T1 (de) 1998-12-15 1999-12-07 Einrichtung zur messung und regelung der dicke einer latexschicht

Country Status (7)

Country Link
US (1) US6183561B1 (de)
EP (1) EP1149269B1 (de)
JP (1) JP2002532700A (de)
AT (1) ATE266187T1 (de)
CA (1) CA2355621C (de)
DE (1) DE69917076T2 (de)
WO (1) WO2000036368A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3740315B2 (ja) * 1999-03-12 2006-02-01 株式会社日立製作所 Ｘ線センサ信号処理回路及びそれを用いたｘ線ｃｔ装置並びにｘ線センサ信号処理方法
US6859511B2 (en) * 1999-03-12 2005-02-22 Hitachi, Ltd. X-ray sensor signal processor and x-ray computed tomography system using the same
FI115412B (fi) * 2002-04-16 2005-04-29 Metso Automation Oy Menetelmä ja laitteisto paperirainalla olevan päällysteen määrän mittaamiseksi
DE102004003042A1 (de) * 2004-01-20 2005-08-18 Voith Paper Patent Gmbh Flächengewicht der Decklage einer Faserstoffbahn
US20050181118A1 (en) * 2004-02-12 2005-08-18 Janssen Robert A. Method for the precision saturation of substrates in preparation for digital printing, and the substrates produced therefrom
JP2009000884A (ja) * 2007-06-21 2009-01-08 Komori Corp 印刷機の印刷品質管理方法及び装置
US8276465B2 (en) 2010-06-10 2012-10-02 Edward Belotserkovsky Urine flow monitoring device and method
US8314388B2 (en) 2010-12-20 2012-11-20 Honeywell Asca Inc. Single-sided infrared sensor for thickness or weight measurement of products containing a reflective layer
US8975586B2 (en) 2011-06-06 2015-03-10 Honeywell Asca Inc. Diffusing measurement window for near and mid IR multichannel sensor
CN102756481B (zh) * 2012-07-27 2014-09-17 国电联合动力技术(连云港)有限公司 风机叶片用碳纤维大梁的制作方法
US9927366B2 (en) 2015-03-24 2018-03-27 Honeywell Limited Spectroscopic sensor for thickness or weight measurement of thin plastic films
US11879765B2 (en) * 2018-09-26 2024-01-23 Honeywell International Inc. Apparatus for composite sheet weight determinations
CN110906897B (zh) * 2019-12-16 2022-02-01 唐山盈和瑞环保设备有限公司 一种在线钢板防腐涂层质量检验仪
KR102657146B1 (ko) * 2020-04-07 2024-04-11 주식회사 엘지화학 그라비어 코터 테스트 장치 및 그 그라비어 코터
CN111792412B (zh) * 2020-06-29 2022-02-11 华邦古楼新材料有限公司 一种涂布纸自动化重叠检测设备
JP7700449B2 (ja) * 2020-12-25 2025-07-01 富士フイルムビジネスイノベーション株式会社 情報処理装置、プログラムおよび画像形成システム
US20230391571A1 (en) * 2022-06-06 2023-12-07 Honeywell International Inc. Machine Direction Position Profile Measurement in Sheet Manufacturing Systems

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4006358A (en) 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material
US4957770A (en) * 1989-01-27 1990-09-18 Measurex Corporation Coating weight measuring and control apparatus and method
US5338361A (en) 1991-11-04 1994-08-16 Measurex Corporation Multiple coat measurement and control apparatus and method
JPH10142162A (ja) * 1996-11-11 1998-05-29 Konica Corp 塗布層欠陥検査光選択方法、塗布層欠陥検査方法、塗布層欠陥検査装置
AU5990998A (en) * 1997-02-13 1998-09-08 Valmet Automation Inc. Method for measuring the components of a coating on a moving base material
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
JPH11230919A (ja) * 1998-02-18 1999-08-27 Yuasa Corp 電池の電気化学的状態の非破壊分析法
US6179918B1 (en) * 1998-11-20 2001-01-30 Honeywell International Inc. Silicone coat weight measuring and control apparatus

Also Published As

Publication number Publication date
CA2355621A1 (en) 2000-06-22
DE69917076T2 (de) 2005-04-07
EP1149269B1 (de) 2004-05-06
CA2355621C (en) 2008-07-08
DE69917076D1 (de) 2004-06-09
JP2002532700A (ja) 2002-10-02
EP1149269A1 (de) 2001-10-31
US6183561B1 (en) 2001-02-06
WO2000036368A1 (en) 2000-06-22

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Legal Events

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