ATE282011T1 - Verfahren zur herstellung eines substrats aus synthetischem quarzglas für eine photomaske - Google Patents

Verfahren zur herstellung eines substrats aus synthetischem quarzglas für eine photomaske

Info

Publication number
ATE282011T1
ATE282011T1 AT00304281T AT00304281T ATE282011T1 AT E282011 T1 ATE282011 T1 AT E282011T1 AT 00304281 T AT00304281 T AT 00304281T AT 00304281 T AT00304281 T AT 00304281T AT E282011 T1 ATE282011 T1 AT E282011T1
Authority
AT
Austria
Prior art keywords
quartz glass
synthetic quartz
glass substrate
photomask
producing
Prior art date
Application number
AT00304281T
Other languages
English (en)
Inventor
Yukio Shibano
Hisatoshi Otsuka
Original Assignee
Shinetsu Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Chemical Co filed Critical Shinetsu Chemical Co
Application granted granted Critical
Publication of ATE282011T1 publication Critical patent/ATE282011T1/de

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/60—Substrates
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00—Other methods of shaping glass
    • C03B19/12—Other methods of shaping glass by liquid-phase reaction processes
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00—Other methods of shaping glass
    • C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1453—Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00—Other methods of shaping glass
    • C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1469—Means for changing or stabilising the shape or form of the shaped article or deposit
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B32/00—Thermal after-treatment of glass products not provided for in groups C03B19/00, C03B25/00 - C03B31/00 or C03B37/00, e.g. crystallisation, eliminating gas inclusions or other impurities; Hot-pressing vitrified, non-porous, shaped glass products
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00—Glass compositions
    • C03C3/04—Glass compositions containing silica
    • C03C3/06—Glass compositions containing silica with more than 90% silica by weight, e.g. quartz
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00—Type of glass produced
    • C03B2201/06—Doped silica-based glasses
    • C03B2201/20—Doped silica-based glasses doped with non-metals other than boron or fluorine
    • C03B2201/23—Doped silica-based glasses doped with non-metals other than boron or fluorine doped with hydroxyl groups
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00—Glass compositions
    • C03C2201/06—Doped silica-based glasses
    • C03C2201/20—Doped silica-based glasses containing non-metals other than boron or halide
    • C03C2201/23—Doped silica-based glasses containing non-metals other than boron or halide containing hydroxyl groups
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2203/00—Production processes
    • C03C2203/20—Wet processes, e.g. sol-gel process
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2203/00—Production processes
    • C03C2203/40—Gas-phase processes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Thermal Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Glass Compositions (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Glass Melting And Manufacturing (AREA)
  • Surface Treatment Of Glass (AREA)
AT00304281T 1999-05-21 2000-05-22 Verfahren zur herstellung eines substrats aus synthetischem quarzglas für eine photomaske ATE282011T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14121399A JP3627907B2 (ja) 1999-05-21 1999-05-21 フォトマスク用合成石英ガラス基板の製造方法

Publications (1)

Publication Number Publication Date
ATE282011T1 true ATE282011T1 (de) 2004-11-15

Family

ID=15286782

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00304281T ATE282011T1 (de) 1999-05-21 2000-05-22 Verfahren zur herstellung eines substrats aus synthetischem quarzglas für eine photomaske

Country Status (5)

Country Link
US (1) US6413682B1 (de)
EP (1) EP1053979B1 (de)
JP (1) JP3627907B2 (de)
AT (1) ATE282011T1 (de)
DE (1) DE60015640T2 (de)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6410192B1 (en) 1999-11-15 2002-06-25 Corning Incorporated Photolithography method, photolithography mask blanks, and method of making
JP4025960B2 (ja) 2001-08-08 2007-12-26 信越化学工業株式会社 角形ホトマスク基板の研磨方法、角形ホトマスク基板、ホトマスクブランクス及びホトマスク
AU2003272195A1 (en) * 2002-04-30 2004-01-06 Hrl Laboratories, Llc Quartz-based nanoresonators and method of fabricating same
US8766745B1 (en) 2007-07-25 2014-07-01 Hrl Laboratories, Llc Quartz-based disk resonator gyro with ultra-thin conductive outer electrodes and method of making same
US7994877B1 (en) 2008-11-10 2011-08-09 Hrl Laboratories, Llc MEMS-based quartz hybrid filters and a method of making the same
JP4941872B2 (ja) * 2003-09-02 2012-05-30 日本電気硝子株式会社 液晶ディスプレイ用透明無アルカリガラス基板
WO2005024474A1 (en) * 2003-09-09 2005-03-17 Carl Zeiss Smt Ag Phase delay element and method for producing a phase delay element
EP1853971B1 (de) * 2005-02-09 2010-10-20 Asahi Glass Company, Limited Maskenrohlinge
JP4692745B2 (ja) * 2005-02-25 2011-06-01 株式会社ニコン マスク基板、フォトマスク、露光方法、露光装置の管理方法、及びデバイス製造方法
US7185695B1 (en) * 2005-09-01 2007-03-06 United Technologies Corporation Investment casting pattern manufacture
JP4675745B2 (ja) 2005-10-25 2011-04-27 株式会社東芝 フォトマスク用基板の選別方法、フォトマスク作製方法及び半導体装置製造方法
GB0605461D0 (en) * 2006-03-17 2006-04-26 Saint Gobain Quartz Plc Manufacture of large articles in synthetic vitreous silica
US7555824B2 (en) 2006-08-09 2009-07-07 Hrl Laboratories, Llc Method for large scale integration of quartz-based devices
JP2008070730A (ja) * 2006-09-15 2008-03-27 Sony Corp マスクブランクス選定方法、複屈折性指標の算出方法、リソグラフィ方法、マスクブランクス選定装置、複屈折性指標算出装置およびそのプログラム
US7884930B2 (en) * 2007-06-14 2011-02-08 Hrl Laboratories, Llc Integrated quartz biological sensor and method
US20100020311A1 (en) * 2007-06-14 2010-01-28 Hrl Laboratories, Llc Integrated quartz biological sensor and method
US10266398B1 (en) 2007-07-25 2019-04-23 Hrl Laboratories, Llc ALD metal coatings for high Q MEMS structures
US8151640B1 (en) 2008-02-05 2012-04-10 Hrl Laboratories, Llc MEMS on-chip inertial navigation system with error correction
US7802356B1 (en) 2008-02-21 2010-09-28 Hrl Laboratories, Llc Method of fabricating an ultra thin quartz resonator component
JP2010070432A (ja) * 2008-09-22 2010-04-02 Sumitomo Electric Ind Ltd 高均質性硝材の加工方法
US8176607B1 (en) 2009-10-08 2012-05-15 Hrl Laboratories, Llc Method of fabricating quartz resonators
JP5587672B2 (ja) * 2010-05-31 2014-09-10 Ｈｏｙａ株式会社 マスクブランク用基板の製造方法、インプリントモールド用マスクブランクの製造方法、及びインプリントモールドの製造方法
US8912711B1 (en) 2010-06-22 2014-12-16 Hrl Laboratories, Llc Thermal stress resistant resonator, and a method for fabricating same
JP5664471B2 (ja) 2010-06-28 2015-02-04 信越化学工業株式会社 半導体用合成石英ガラス基板の製造方法
US9423801B2 (en) 2010-12-22 2016-08-23 Colgate-Palmolive Company Continuous manufacturing system
US9250074B1 (en) 2013-04-12 2016-02-02 Hrl Laboratories, Llc Resonator assembly comprising a silicon resonator and a quartz resonator
US9599470B1 (en) 2013-09-11 2017-03-21 Hrl Laboratories, Llc Dielectric high Q MEMS shell gyroscope structure
US9977097B1 (en) 2014-02-21 2018-05-22 Hrl Laboratories, Llc Micro-scale piezoelectric resonating magnetometer
MY180533A (en) * 2014-03-17 2020-12-01 Shinetsu Chemical Co Methods for working synthetic quartz glass substrate having a mirror-like surface and method for sensing synthetic quartz glass substrate
US9991863B1 (en) 2014-04-08 2018-06-05 Hrl Laboratories, Llc Rounded and curved integrated tethers for quartz resonators
US10308505B1 (en) 2014-08-11 2019-06-04 Hrl Laboratories, Llc Method and apparatus for the monolithic encapsulation of a micro-scale inertial navigation sensor suite
US10031191B1 (en) 2015-01-16 2018-07-24 Hrl Laboratories, Llc Piezoelectric magnetometer capable of sensing a magnetic field in multiple vectors
US10110198B1 (en) 2015-12-17 2018-10-23 Hrl Laboratories, Llc Integrated quartz MEMS tuning fork resonator/oscillator
US10175307B1 (en) 2016-01-15 2019-01-08 Hrl Laboratories, Llc FM demodulation system for quartz MEMS magnetometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08709B2 (ja) 1988-10-12 1996-01-10 信越石英株式会社 光透過体用石英ガラス母材とその製造方法、及び前記母材を用いて形成した光透過体
US5325230A (en) * 1989-06-09 1994-06-28 Shin-Etsu Quartz Products Co., Ltd. Optical members and blanks of synthetic silica glass and method for their production
US5086352A (en) 1989-06-09 1992-02-04 Shin-Etsu Quartz Products Co., Ltd. Optical members and blanks or synthetic silica glass and method for their production
JP3064857B2 (ja) * 1995-03-28 2000-07-12 株式会社ニコン 光リソグラフィー用光学部材および合成石英ガラスの製造方法
JP3274953B2 (ja) 1995-08-18 2002-04-15 住友金属工業株式会社 光学用合成石英ガラス材及びその製造方法、並びに該光学用合成石英ガラス材を用いた合成石英ガラス製品
US6242136B1 (en) * 1999-02-12 2001-06-05 Corning Incorporated Vacuum ultraviolet transmitting silicon oxyfluoride lithography glass

Also Published As

Publication number Publication date
EP1053979B1 (de) 2004-11-10
JP2000330263A (ja) 2000-11-30
JP3627907B2 (ja) 2005-03-09
DE60015640T2 (de) 2005-12-22
US6413682B1 (en) 2002-07-02
DE60015640D1 (de) 2004-12-16
EP1053979A1 (de) 2000-11-22

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