ATE282218T1 - Nahfeldrastermikroskop - Google Patents

Nahfeldrastermikroskop

Info

Publication number
ATE282218T1
ATE282218T1 AT02711015T AT02711015T ATE282218T1 AT E282218 T1 ATE282218 T1 AT E282218T1 AT 02711015 T AT02711015 T AT 02711015T AT 02711015 T AT02711015 T AT 02711015T AT E282218 T1 ATE282218 T1 AT E282218T1
Authority
AT
Austria
Prior art keywords
microscope
probe
near field
scan lines
sample surface
Prior art date
Application number
AT02711015T
Other languages
English (en)
Inventor
Mervyn John Miles
Andrew David Laver Humphris
Jamie Kayne Hobbs
Original Assignee
Univ Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0102953A external-priority patent/GB0102953D0/en
Priority claimed from GB0124948A external-priority patent/GB0124948D0/en
Application filed by Univ Bristol filed Critical Univ Bristol
Application granted granted Critical
Publication of ATE282218T1 publication Critical patent/ATE282218T1/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Saccharide Compounds (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Silicates, Zeolites, And Molecular Sieves (AREA)
  • Lenses (AREA)
AT02711015T 2001-02-06 2002-02-06 Nahfeldrastermikroskop ATE282218T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0102953A GB0102953D0 (en) 2001-02-06 2001-02-06 Imaging system
GB0124948A GB0124948D0 (en) 2001-10-17 2001-10-17 Scanning near-field optical microscope
PCT/GB2002/000512 WO2002063368A1 (en) 2001-02-06 2002-02-06 Scanning near-field optical microscope

Publications (1)

Publication Number Publication Date
ATE282218T1 true ATE282218T1 (de) 2004-11-15

Family

ID=26245693

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02711015T ATE282218T1 (de) 2001-02-06 2002-02-06 Nahfeldrastermikroskop

Country Status (7)

Country Link
EP (1) EP1360538B1 (de)
JP (1) JP4009197B2 (de)
KR (1) KR100829659B1 (de)
AT (1) ATE282218T1 (de)
DE (1) DE60201887T2 (de)
IL (1) IL151949A (de)
WO (1) WO2002063368A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7473887B2 (en) * 2002-07-04 2009-01-06 University Of Bristol Of Senate House Resonant scanning probe microscope
CN100386620C (zh) * 2002-12-16 2008-05-07 吴世法 激励和接收均用隐失光的拉曼散射近场增强方法
KR101195729B1 (ko) 2003-07-15 2012-10-29 더 유니버시티 오브 브리스톨 원자력 현미경용 탐침 및 그 사용 방법
RU2356110C2 (ru) * 2003-07-15 2009-05-20 Юниверсити Оф Бристоль Зонд для атомного силового микроскопа
KR100761059B1 (ko) 2006-09-29 2007-09-21 파크시스템스 주식회사 오버행 샘플 측정이 가능한 주사 탐침 현미경
RU2456622C1 (ru) * 2008-05-12 2012-07-20 Джапан Сайенс Энд Текнолоджи Эйдженси Устройство атомно-силовой микроскопии с динамическим режимом
EP2297546B1 (de) 2008-06-06 2018-09-19 Infinitesima Limited Sondendetektionssystem
SG171994A1 (en) 2008-12-11 2011-07-28 Infinitesima Ltd Dynamic probe detection system
GB0901772D0 (en) 2009-02-04 2009-03-11 Infinitesima Ltd Control system for a scanning probe microscope
US8547426B2 (en) * 2009-06-15 2013-10-01 Identix Incorporated Low settle time micro-scanning system
GB201005252D0 (de) 2010-03-29 2010-05-12 Infinitesima Ltd
SG192224A1 (en) 2011-01-31 2013-09-30 Infinitesima Ltd Adaptive mode scanning probe microscope
GB201117138D0 (en) 2011-10-05 2011-11-16 Infinitesima Ltd Probe mounting system for a scanning probe microscope
GB201313064D0 (en) 2013-07-22 2013-09-04 Infinitesima Ltd Probe Microscope
EP3966554A4 (de) * 2018-11-29 2022-09-07 La Trobe University Verfahren zur identifizierung einer struktur
CN110488043B (zh) * 2019-08-07 2021-05-04 电子科技大学 自由电子激发增强近场信号的扫描近场光学显微镜

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5254854A (en) * 1991-11-04 1993-10-19 At&T Bell Laboratories Scanning microscope comprising force-sensing means and position-sensitive photodetector
DE19531465C2 (de) * 1995-03-30 1997-12-18 Zeiss Carl Jena Gmbh Rastersonde für die optische Nahfeldmikroskopie
JP3249419B2 (ja) * 1997-03-12 2002-01-21 セイコーインスツルメンツ株式会社 走査型近接場光学顕微鏡
US6008489A (en) * 1997-12-03 1999-12-28 Digital Instruments Method for improving the operation of oscillating mode atomic force microscopes
DE19852833A1 (de) * 1998-11-17 2000-05-18 Thomas Stifter Verfahren zur Bestimmung des Abstandes einer Nahfeldsonde von einer zu untersuchenden Probenoberfläche und Nahfeldmikroskop

Also Published As

Publication number Publication date
KR100829659B1 (ko) 2008-05-16
IL151949A (en) 2007-07-24
KR20030003249A (ko) 2003-01-09
IL151949A0 (en) 2003-04-10
WO2002063368A1 (en) 2002-08-15
DE60201887D1 (de) 2004-12-16
WO2002063368A8 (en) 2003-10-16
JP4009197B2 (ja) 2007-11-14
JP2004529326A (ja) 2004-09-24
EP1360538B1 (de) 2004-11-10
EP1360538A1 (de) 2003-11-12
DE60201887T2 (de) 2005-11-10

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