ATE287144T1 - Kalibrierung von isolierten analog-digital- wandlern - Google Patents

Kalibrierung von isolierten analog-digital- wandlern

Info

Publication number
ATE287144T1
ATE287144T1 AT02013901T AT02013901T ATE287144T1 AT E287144 T1 ATE287144 T1 AT E287144T1 AT 02013901 T AT02013901 T AT 02013901T AT 02013901 T AT02013901 T AT 02013901T AT E287144 T1 ATE287144 T1 AT E287144T1
Authority
AT
Austria
Prior art keywords
adcs
gain
relative
isolated
calibration
Prior art date
Application number
AT02013901T
Other languages
English (en)
Inventor
Breejen Frank Den
Original Assignee
Cirrus Logic Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cirrus Logic Inc filed Critical Cirrus Logic Inc
Application granted granted Critical
Publication of ATE287144T1 publication Critical patent/ATE287144T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1028—Calibration at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0827—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of electromagnetic or electrostatic field noise, e.g. preventing crosstalk by shielding or optical isolation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT02013901T 2001-07-12 2002-06-21 Kalibrierung von isolierten analog-digital- wandlern ATE287144T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/902,712 US6445315B1 (en) 2001-07-12 2001-07-12 Calibration of isolated analog-to-digital converters

Publications (1)

Publication Number Publication Date
ATE287144T1 true ATE287144T1 (de) 2005-01-15

Family

ID=25416282

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02013901T ATE287144T1 (de) 2001-07-12 2002-06-21 Kalibrierung von isolierten analog-digital- wandlern

Country Status (4)

Country Link
US (2) US6445315B1 (de)
EP (1) EP1280277B1 (de)
AT (1) ATE287144T1 (de)
DE (1) DE60202557T2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6864814B1 (en) * 2002-06-27 2005-03-08 Qlogic Corporation System and method for improving dynamic range of analog-to digital converters
BRPI0913818A2 (pt) 2008-10-03 2017-03-28 Agrisoma Biosciences Inc método de produção de plantas transgênicas, planta transgênica e método de produção de óleo
US8395418B2 (en) 2010-11-04 2013-03-12 Robert Bosch Gmbh Voltage sensing circuit with reduced susceptibility to gain drift
WO2013038176A2 (en) 2011-09-12 2013-03-21 Metroic Limited Current measurement
GB201120295D0 (en) 2011-11-24 2012-01-04 Metroic Ltd Current measurement apparatus
DE102012223245A1 (de) 2011-12-16 2013-06-20 Lear Corporation Vorrichtung und Verfahren zum Bewerten der Integrität eines Analog-Digital-Wandlers
DE102015111752B4 (de) 2015-07-20 2025-11-13 Infineon Technologies Ag Verfahren zur verwendung in einem messsystem, sowie messsystem, steuerungseinheit und schnittstelle dazu
US11519754B2 (en) * 2020-05-29 2022-12-06 Analog Devices International Unlimited Company Isolation amplifier with reference signal transfer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4335384A (en) * 1980-01-10 1982-06-15 Bunker Ramo Corporation Logarithmic amplifier calibration means
SU1310796A1 (ru) * 1985-10-25 1987-05-15 Научно-исследовательский институт ядерной физики при Томском политехническом институте им.С.М.Кирова Устройство дл ввода информации от аналоговых датчиков
US4894656A (en) * 1988-11-25 1990-01-16 General Electric Company Self-calibrating pipelined subranging analog-to-digital converter
US5030954A (en) * 1990-09-17 1991-07-09 General Electric Company Double rate oversampled interpolative modulators for analog-to-digital conversion
US5172115A (en) * 1991-02-15 1992-12-15 Crystal Semiconductor Corporation Ratiometric A/D converter with non-rationometric error offset
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
KR970005828B1 (ko) * 1993-12-31 1997-04-21 김정덕 파이프 라인 구조의 다단 아날로그/디지탈 변환기
US6239732B1 (en) * 1998-04-13 2001-05-29 Dallas Semiconductor Corporation One-wire device with A-to-D converter
EP1081861A2 (de) * 1999-08-31 2001-03-07 Agilent Technologies Inc. (a Delaware Corporation) System zur Kalibrierung der Verstärkung und Verfahren zur Realisierung von aufeinander abgestimmten A/D-Wandlern
US6369740B1 (en) * 1999-10-22 2002-04-09 Eric J. Swanson Programmable gain preamplifier coupled to an analog to digital converter

Also Published As

Publication number Publication date
EP1280277B1 (de) 2005-01-12
DE60202557D1 (de) 2005-02-17
USRE40106E1 (en) 2008-02-26
US6445315B1 (en) 2002-09-03
DE60202557T2 (de) 2005-12-29
EP1280277A3 (de) 2004-02-18
EP1280277A2 (de) 2003-01-29

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Legal Events

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