DE50105473D1
(en )
2005-04-07
SAMPLE FOR THE SIMULTANEOUS IMPLEMENTATION OF ELECTROCHEMICAL AND TOPOGRAPHIC CLAY MICROSCOPY
ATE392700T1
(en )
2008-05-15
METHOD FOR PRODUCING A DEVICE FOR PERFORMING SIMULTANEOUS ELECTROCHEMICAL AND TOPOGRAPHIC NEAR-FIELD MICROSCOPY
DE60035250D1
(en )
2007-08-02
Near-field optical probe and scanning near-field optical microscope
DE10196022T1
(en )
2003-03-13
Analysis method for a sample of uneven density and device and system therefor
DE60113471D1
(en )
2006-02-02
Measuring device for a variable of living bodies
DE60027766D1
(en )
2006-06-08
DEVICE AND METHOD FOR REMOVING A BIOLOGICAL SAMPLE
EP1390747A4
(en )
2009-07-08
SYSTEMS AND METHODS FOR COMPUTERIZED ANALYSIS OF CELLS AND TISSUES
AU3510100A
(en )
2000-10-16
Active probe for an atomic force microscope and method of use thereof
AU2001284516A1
(en )
2002-03-26
Confocal point microscope and height measuring method using this
DE60131376D1
(en )
2007-12-27
HOLDER FOR SURGICAL INSTRUMENT
WO2007025013A3
(en )
2007-10-11
Nanoscale optical microscope
AU2001294585A1
(en )
2002-03-26
Fabrication of nanotube microscopy tips
DE69714320D1
(en )
2002-09-05
Atomic force microscope probe, method of manufacturing the probe and atomic force microscope
DE50212968D1
(en )
2008-12-11
MEASURING CELL TO RECORD THE ELECTRICAL POTENTIAL OF A SAMPLE
NO20013655D0
(en )
2001-07-25
Focused sampling probe for formation fluids
DE69824586D1
(en )
2004-07-22
HIGH DENSITY SAMPLES FOR ANALYZING BIOLOGICAL SAMPLES
DE60126936D1
(en )
2007-04-12
MICROCONTACT TEST NEEDLE AND ELECTRIC MEASURING PROBE
DE69632691D1
(en )
2004-07-15
FLAT SCAN TABLE FOR GRID PROBE MICROSCOPY
DE60110495D1
(en )
2005-06-09
Device for forming the opening of a probe and near-field optical microscope with the probe
IL156419A0
(en )
2004-01-04
Sample dimension measuring method and scanning electron microscope
EP1282676A4
(en )
2003-08-13
STAGE HYDROTREATMENT PROCEDURE FOR NAUTH DESULFURATION
DE50102454D1
(en )
2004-07-08
Process for the analysis of gaseous constituents and test kit in particular for carrying out this process
DE50100821D1
(en )
2003-11-27
Microscope for non-contact wide-angle observation
DE60141738D1
(en )
2010-05-20
Measuring instrument and associated voltage regulation system for accessory
ATE290200T1
(en )
2005-03-15
SAMPLE FOR SIMULTANEOUS PERFORMANCE OF ELECTROCHEMICAL AND TOPOGRAPHIC NEAR-FIELD MICROSCOPY