ATE291744T1 - Kammer und verfahren zur bearbeitung elektronischer geräte und deren anwendung - Google Patents

Kammer und verfahren zur bearbeitung elektronischer geräte und deren anwendung

Info

Publication number
ATE291744T1
ATE291744T1 AT01610005T AT01610005T ATE291744T1 AT E291744 T1 ATE291744 T1 AT E291744T1 AT 01610005 T AT01610005 T AT 01610005T AT 01610005 T AT01610005 T AT 01610005T AT E291744 T1 ATE291744 T1 AT E291744T1
Authority
AT
Austria
Prior art keywords
chamber
electronic devices
application
test
processing electronic
Prior art date
Application number
AT01610005T
Other languages
English (en)
Inventor
Anders Persson
Kent Madsen
Hans Bergstedt
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Application granted granted Critical
Publication of ATE291744T1 publication Critical patent/ATE291744T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/10—Radiation diagrams of antennas
    • G01R29/105—Radiation diagrams of antennas using anechoic chambers; Chambers or open field sites used therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Multi-Process Working Machines And Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Mobile Radio Communication Systems (AREA)
AT01610005T 2001-01-16 2001-01-16 Kammer und verfahren zur bearbeitung elektronischer geräte und deren anwendung ATE291744T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP01610005A EP1223432B1 (de) 2001-01-16 2001-01-16 Kammer und Verfahren zur Bearbeitung elektronischer Geräte und deren Anwendung

Publications (1)

Publication Number Publication Date
ATE291744T1 true ATE291744T1 (de) 2005-04-15

Family

ID=8183510

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01610005T ATE291744T1 (de) 2001-01-16 2001-01-16 Kammer und verfahren zur bearbeitung elektronischer geräte und deren anwendung

Country Status (4)

Country Link
US (1) US20020160717A1 (de)
EP (1) EP1223432B1 (de)
AT (1) ATE291744T1 (de)
DE (1) DE60109567D1 (de)

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Also Published As

Publication number Publication date
EP1223432B1 (de) 2005-03-23
EP1223432A1 (de) 2002-07-17
DE60109567D1 (de) 2005-04-28
US20020160717A1 (en) 2002-10-31

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